TUD310 Ultrasonic Flaw Detector Instruction Manual = TIME Group Inc. Beijing TIME High Technology Ltd.[er ra Contents ‘Chapter I - Overview 1.1 How to use the instruction manual 1.2 standard delivery and optional accessories: Chapter Il. Technical parameters and performance features of the instrument 2.1Measuring range and measuring error: 2.20peratng environment 2.3Power supply 2.40 verall dimension and weight 2.SPerformance features sesnnennnnnn : son § Chapter IL - Operation 7 1 1 3.1Overview of the instrument 3.20verview of instrument description 4 3.3 Overview of the functional groups 19 3.4 Adjustment of BASE Group: 20 3.5 Adjustment of P/R Group: vn 2 3.6Ajustment of GATE group es 25 3.7 MEMORY a 3.8 Adjustment of CFG (Configure)Group: u 3.9 Adjustment of ANG Group 36 3.10 Adjustment of DAC Group : 38 3.11 Operation about ADV (advanced functions) Groupe a 3.11.1 YMD: ee eee aa 3.11.2 HMS 2 3.11.3 PEAK MEM sh 3.12 DISPLAY: 4B 3.12.1 HAXIS 43 3.12.2 ATEM = a 43 3.123 BATEM “a 3.124 CATEM. “4 3.13 B-SCAN Group “4 3.14 Adjustment of the Special Functions 4s ‘Chapter LV. Calibrating the Instrument and Measuring a 4.1 Calibration ofa Single Crystal Probe reno : 47 42 Calibration of Twin Crystal Probe 49 43 Calibration of Angle Beam Probe: so 4.4 Application of the DAC Curve : vse 4.5 Contents of Measurement sn sn soma 2 (Chapter V. Communication with the Instrument a‘upsio 5.1 Data Communication $4 ‘Chapter VI. Factors Influencing the Inspection Accuracy and the Evaluation of Defects st 6.1 Essential Conditions for Using the Ultrasonic Flaw Detector: “55 6.2 Factors influencing the detection Accuracy: 56 6.3 Method for Defect Evaluation “37 Chapter VII - Maintenance and repairs 9 7.1 Requirement on handling and the working environment 9 7.2 Charging the Battery 9 7.3 Replacing the battery 60 7.4 Troubleshooting 60 7.5 Tips on Safety 0 Appendix: Technical Specifications a Appendix Il: List of Operations 64 Appendix ll: Terms 65Bhat aig rou Chapter I. - Overview ‘This isa portable, industrial, non-destructive ultrasonic flaw detector, which is used to rapidly, and easly inspect ‘work pieces accurately for various defects such as cracks, inclusions and pinhole porosity etc. Further evaluation of these defects can be performed during the testing process. The instrument can be used extensively in many varying fields where materials inspection is required to maintain quality control during manufacturing and production processes, e.g. manufacturing industries, fon & steel industry, metallurgical industry, metalworking, chemical industry, etc. Ultrasonic flaw detectors ate also used extensively in the active safety inspection and service-life ‘evaluation of components in such fields as aerospace, railway transportation and boiler pressure vessels, et, ‘When the ultrasonic wave propagates through the test piece, defects are recognized as a result of the influence ‘on the propagation of the ultrasonic wave based on the acoustic characteristic demonstrated by the defect in the material. Based on this principle, by using ultrasonic waves, one ean detect such defects as eracks, pinholes and inclusions in such media as ferrous metals, non-ferrous metals and composite, etc Fig. 1.1. Basie working principle for ultrasonic detection 1.1 How to use the instruction manual It is necessary to read chapters 1, 2, 3 and 4 of the instruction manual before operating the instrument forthe first time. The descriptions in the chapters fe necessary for the correct operation of the instrument, which will describe all keys and displays on sereen, and explain the operating principle By following the instructions carefully, you can avoid possible instrument failure due to operating errors, and have a better concept ofall the functions ofthe instrument,1,2 standard delivery and optional accessories 1.2.1 standard delivery Nat Qeantiy Main unit Li-ion battery Power adapier USB adapter i 1 Cable for probe rag L Sceaenere | o4 CseveeC PEL MORE REETETE [Fash disk — Angle probe (@9mm MHz) | —___Couplant = Carying case a tion manual i i i 1 1.2.2 optional accessories [USB connecting cable for printer | “Siraight probe (0202.52) Gi connecting cable Dataview software for PC. EPSON C65 printer ‘Standard echo probe BHT-50 Tups10 Chapter II. Technical parameters and performance features of the instrument 2.1 Measuring range and measuring error Range of scanning: 2.5 mm ~9999mm Resolution for scanning: 0.1mm (2.5mm ~100mm) [mm (100 mm ~000mm) Range of gain: 048 -110 6B D-Delay 20s ~ +3405 P-Delay’ Ops ~ 99.995 Sound velocity 1000 mis~ 9999m/s2.2. Operating environment igh Technology Lit supst0 ‘Temperature: -150-S0C Humidity: 20% ~ 90%RH Free from strong magnetic field and corrosion. 2.3 Power supply Libattery4x3.6V 4400mAh 2.4 Overall dimension and weight Overall dimension: 243mm 173 mmX70 mm Weight: 1.50kg 2.5 Performance features (© Measurement displaying modes: type A displaying mode, type B displaying mode; ‘Switch over arbitrarily among three detecting modes: single-probe, dual-probe, and through transmission; (© There are four Rectifying Waves at your selection: positive half-wave, negative half-wave, full wave and radio frequency. © The probe damp will be shifted between 50, 150, 400 through menu selection; © Automatic generation of DAC curves by using the standard test block, with the capability of storing a maximum ‘0F30 points, three adjustable bias curves are generated with the function of Correction, © tis provided with linear reject function, the highest reject is 80%6 ofthe sercen height; thas gate setting and alarm functions. The operator can set the position and width of gate freely on the screen, and can set alarms for maximum and minimum thresholds respectively; Can freeze and unfreeze waveform and detection parameters; ‘Can lock/unlock the system parameters; Measuring of sound path and analyses of echo times; {tis provided with memory function, 32 A seanned images, parameters and DAC curves can be stored in every channel (32 channels in ally; 10 groups of thickness readings can be stored in every channel with 200 thickness readings in every group: Can indicate power state in realtime; Equipped with USB Host port, data in flash disk ean be operated directly via this por. Realtime clock; ‘Two measuring units: metric and English (mm/neh),fname posi (© Printing format: prints reports on thickness and wave amplitude curves through USB connected printer, ‘Communication with PC, to capture measuring data and system configuration parameters for further processing {(e4.to generate reports on detection, printing, et); RS232 communication port and USB 1.1 full speed port are available; Buzzer prompt during operation; ‘Compact, light and easy to operate 32 detecting channels are available with separated detecting parameters and DAC curve setting in every channel Memory of peaks. Equipped with wave envelope display Auto-calibration of probe (2-point cali Auto-gain Manual B scanninging TIME High Technology Lud Tupsio Chapter III. - Operation 3.1 Overview of the instrument 3.1.1 Designation of the instrument's components 6. Functional keys 12. Battery box Fig. 3.1 Outline drawing ofthe instrument 3.1.2 Functional keyboard The keys of the TUD310 are arranged in three groups: Function group, Menu group and Special Function group. There are 6 keys in the Function group, in which Fl, F2, F3, F4, FS are corresponding with the S functional groups on screen, and the key © is used for switching of pages; the Menu group comprises 4 keys: S1, $2, $3, $4, they are used for operating on the corresponding 4 menus in every functional group; and the special function group consists of S keys: on/fT key, full sereen key, extend key, freeze key, printing key, gan step key, dB, dB- and Enter key. Please refer to Fig. 3.2 for an overview of the functional keyboard, refer to appendix I for operation listsere Fig. 32 Funetional keyboard 3.1.3 Power supply alternatives The TUD310 can be operated withthe plug-in power supply (AC, DC adaptor) or battery. The unit will automa ly switch over to the power supplied via the power supply adaptor when connected. The unit will automatical witch over tothe power supplied by the battery pack when the power supply adaptor is switched off. The battery pack will be charged automatically when the TUDSIO is operated using the power supply adaptor 3. 3.1 Supplying power by using AC power supply adaptor Connecting the Instrument Connect TUD310 10 AC power through the special AC adaptor. Note: 1. Ifyou inadvertently disconnect the instrument's power supply by opening the battery compartment ‘or pulling out the power plug, you will have no way of turning off the Instrument under normal conditions. 2. To turn off the instrument correctly, please press the ON/OFF key located on the front panel 2 Supplying power by using the battery ‘When you use the battery to supply power to the instrument, please use the battery type recommended by the manufacture. Installing the batteryThe battery compartment is located at the rear of the instrument. Open the battery compartment cover by removing the four retaining serews with a screwdriver, Place the battery into the compartment, connect the plug of the battery into the socket, and replace the battery compartment cover. Re-fit the serews and tighten with a screwdriver, Indicators for charging Located atthe lower right hand comer of the TUDS310 horizontal scale, are the symbols indicating the status of the battery charge: atonal = [a Fig. 3.3 Battery charge status full Fig. 3.4 Battery charge status half’ Fig. 3.5. Battery charge status low If the “low voltage” symbol is indicated, you must immediately stop operation of the instrument and replace oF charge the battery. Note: Should the instrument be operated in the field it is advisable to have a fully charged replacement battery on hand. (Charging the Li battery. You can charge the Li battery by using an extemal battery charger. However it is recommended to use the power ‘adaptor supplied in the standard kit of the TUD310 when charging the Li battery. Before using the charger, please read the Operation Instructions carefully forthe procedure to follow. The continuous charging time forthe Li (4h) battery is about th~5h. During the charging period the “Rapid Charging” indicator lamp (green) will light up. When the charging eyele has been completed, the “Rapid Charging indicator lamp will go out 3.1.4 Connecting the probe All the ultrasonic probes manufactured by Beijing TIME High Technology Ltd are compatible with the TUD310 flaw detector: When using the TUD310, it is important to ensure thatthe correct probe and eable be selected before Proceeding with the inspection task. Ensure that the working frequency of the selected probe is within the desired range forthe test application. The probe connector for TUDSIO is BNC. ‘The probe is connected to the BNC socket on the right hand side of the instrument easing using the cable selected, When using a single crystal probe either of the two connector sockets, (which are parallel internally), can be used as they have the same function. When using a twin erystal probe (TR-probe - one erystal for sending, and one crystal for receiving) oF two single probes (one for sending, and the other for receiving), take care tht the sending probe is connected to the socket on the right (with ">" mark at the back of instrament casing) and the receiving probe is connected to the socket on the eft (with "<->" mark). This procedure should be followed to ensure that there is no loss of echo or waveform amplitude.Fi ara neg ruose 3.1.5 Switching the instrument on and off 8) Ensure the part to be tested is prepared corectly 1b) Insert the cable connector into the probe connection socket, and gently rotate the locking nut uni itis finger tight ©) Select the desired working power supply as per 3.1.3. 4) Press (©) to tum on the instrument; ©) The instrument will carry out selftest run, Under normal eon ions, when the instrument is tumed on, it will automatically enter into the statu that it was in when it was last turned off. The lst set of instrument parameters will be automatically recalled, but the waveforms will not be displayed Note: Please check the power-monitoring icon atthe lower right hand corner of the display screen to very if ‘the unit is ready for optimum power operation. Fig. 3-3, normal voltage; Fig. 3-4, voliage has dropped; Fig. 3-5, voluge is low, iis necessary 10 replace battery, Ifthe power monitor shows that the voltage i low, I will tum off automatically 2 minutes after the alarm bell sounds. ‘Should the instrument require tobe calibrated please refer to chapter IV; 4) Perform the inspection task '8) Once the inspection task has been completed the instrument can be turned off fh) Should the self-test run fil when the instrument is initially tured on, turn the instrument off and then on again. Should the self-test run fail the second time, you can reset the instrument to the status when fist shipped (refer to 3.14.10),3.1.6 Description of the sereen display Technology Lid Tups1o ‘oste Gate Functional group deplay zone Fig. 3.6 Description ofthe screen disp. 3.1.6.1 Two possible display modes of the TUD310 screen. ‘A-scan in normal mode Fig. 3.7 A-scan in normal mode ‘A-scan in enlarged mode You can activate the enlarge mode by [5H] the gain and selected dB step value will always be displayed onthe sereen. All other functions will be locked.‘Manual B-scanning ‘Memory management jing TIME High Technology Lid Fig. 3.8 A-scan in enlarged mode 44.93°] [a-ScAN ANGLE Fig, 3.9 manual B-scan Root: ‘+ STARTUP. SET CHAN-@88.SET + CHAN-081 SET (CHAN-a82. SET CHAN-883.SET = [MH SEL (CHAN-884.SET Local. CHAN-85.SET » IFoRi CHAN-886..SET CHAN-667 SET (CHAN-@88: SET 1733 ON OFF HAVE THICK EXIT >| Fig, 3.10 memory management Tups10DAC record rupst0 150.1 [RecoRD 3703 om 5? ‘DELETE OFF (auTo-@ OFF sr GATE SAVE | EXIT 9| Fig. 3.11 DAC record/gene 3.1.6.2 Funetion displaying items ‘The functional groups are displayed at the lower part of the screen. The current functional group will be highlighted, and atthe same time, the current function in the current functional group wil also be highlighted. Under ‘enlarged mode, the display of functional groups will disappear. Please refer to fig 3.12. | [iso Fig. 3.12 3.1.6.3 Description of status bar Echo amplitude AH=46.5 Start of range End of range Inthe fig above, echo amplitude H=40.5%, sound path=150,06mm, the Nash disk has been connected with instrumentFig. 3.9. Description of the display field on the screen 3.2. Overview of instrument description 3.2.1 Function of the keys With the key combinations on the TUD310 of function selection and funetion adjustment, you can select the functions of the instrument and adjust the functional values. With the keys of the Special Functional group, you can irectly start the special functions ofthe instrument. The following i the detailed description ofthe functions that can be achieved by pressing different keys FI key 1 [2] F2key [2] F3 key F3 Fikey S z s &)§() By pressing the FI key, users can select the relevant function group listed at the lower part of the screen, at the same time of choosing this group all functions within the group will be displayed on the right of screen, [By pressing the F2 key, users can select the relevant function group listed atthe lower part of screen, Aetals ofthe functions will appear on the right of the screen when a certain function is selected By pressing the F3 key, users ean select the relevant function group listed at the lower part of screen, details of the functions will appear onthe right of the screen when a certain function is selected, By pressing the F4 key, users can select the relevant function group listed atthe lower part of screen, details of the functions will appear on the right ofthe screen when a certain function is selected. By pressing the FS key, users can select the relevant function group listed at the lower part of sereen, Aetails of the functions will appear on the right ofthe screen when a certain function is selected. There are 4 menu keys in all, corresponding with 4 items. By continually pressing these keys users Will get more functions such as submenu, switching between rough and inching adjustment, switching, between storing of ickness and waveform, confirm of deleting, confirm of transducer calibration etc ONIOFF switch By pressing this key you can select the gain step from the following 7 incremental steps available, ic |2.04B, 6.04B, 2.048, 1.04B, 0.54B, 0.248 and OdB; which can then be adjusted to the desired value inGain + By pressing the Gain +, the gain will increase in the set gain step, the adjusting range For gain is 04811088, By pressing the Gain -, the gain will decrease in the set gain step, the adjusting range for gain is 04811048, Ener key “aa | _ Used together with Freeze key for lock of data saved and menu, Please refer to item 3.14.7 ‘This enables you to scan through the pages containing function groups. Fullscreen key (3) Under A-scan mode, by pressing the Enter key, you can shift the display modes for the sereen, and shift between normal and 200m mode, Print key (4) [By pressing the Print key, you can print out the relevant documentation and system parameters, Freeze key (*) ‘During operation, by pressing the Freeze key, you can fieeze the waveform and data displayed on the screen at that time, and by pressing the key again you can retur to real time display. Extend key [By pressing the Extend key, you can increase the width of the waveform covered by the gate, so that you can observe the details ofthe waveform. Hand gear withthe hand gear, you can adjust or decrease incrementally the data ofthe selected function, 3.2.2 Overview of all functions ‘The functions of the TUD31O are included in 3 interfaces which are main interface, memory management imerface and DAC interfae. ‘The main interface include 10 functional groups: BASE, P/R, GATE, MEM, CFG, AGLEY, DAC, ADY, DISP. and BSCAN. Please refer tothe following table Basie adjustment items necessary RANGE, MTLVEL, D-DELAY, P-DELAY far the display range PR DAMP, RECTIFY, FILTER, REJECT, Used for adjustment of Sending DATUM LINE, PROBE TYPE, PRE,2-P CAL. and receiving CATE ‘SELECT, START, WIDTH, THRESH, LOGIC, DETECT, ALARM, AUTO-B0 caer WEWORY FILE SET, SAVE, DELETE, ‘Settings of data storage CONFIGURE GRID. BRIGHT, FILL, BUZZER, Settings of working conditionserectus TANGUAGE, UNIT, PRINTER, CON-PORT Tup3i0 ‘ANGLE ANGLE, X-VALUE, T-VALUE, MTLVEL, PROBE __K-VALUE, PIEZ0 $7 Serre Ee DAC DAC-DISP, DAC-RL, DAC-SL, DAC-EL, CORRECT, DAC-REF, DAC-GEN poets [ADVANCE —YWD (DATE), DIS (TINE), AVG CURVE, PEAK WEN, Advanced setting DISPLAY _H-ANIS, A-ITEM, B-ITEM, C-ITEW Sestings of display BSSCAN Ax [AN,_B=SCAN, BSCAN DIR. Sestings of B sean ‘The DAC interface includes: Record (REC), GATE, SAVE and EXIT. Please refer to the following table: REC RECORD, WEIGHT, DELETE, AUTO-80 Used for recording points: GATE SELECT, START, WIDTH, HEIGHT Gate operation SWVE SAVE Save current operation and exit BIT EXIT Nbandon current operation and exit The memory management interface includes: WAVE, THICK, ROOT and EXIT. Please refer to the following table: WAVE SELECT. NEW, DELETE. (Operations on wave files THICK SELECT, NEW, DELETE, PRINT Deane See Root CECT, MEMORY SEL, FORMAT Nenory eanagonont EXIT EXIT Further special functions can be selected by pressing the Special Function (SF) Keys. Please refer to the following table forthe functions of each SF key ‘Gain ste To adjust the dB. dB To adjust the gain Fullscreen "To switch over in full sereen Zoom To extend the width within the gate Freeze To freeze the waveform Print To print reports Enter Used together with Freeze key for Tosk of data saved and menu, Page up ‘Switch function page 3.2.3 Basic operation You can select a functional group by the key; at same time, you ean modify the parameters ofthis current menu by the hand gear.Boones 32, h Technology Lid rue Selection of functions ‘There are 5 functional groups displayed below wave display zone, which can be selected by the corresponding - key, and the selected one will be highlighted. The four corresponding function items will be displayed in the function isplay zone, which can be selected by the key. 3.2.3.2 Confirm the selection of functions Some of the function menus need to be confirmed to become effective, so users should press the corresponding key to confirm the selection, 3.2.3.3 Coarse and fine adjustment of functio For some functions, coarse and fine adjustment is available. By pressing down the corresponding key, _you can shift between these wo adjusting modes. With the symbol * appearing in front ofthe function item, it means it isin the fine adjustment mode, Following are the functional items with optional coarse and fine adjustment RANGE. VELOCITY. D-DELAY, P-DELAY ‘START, WIDTH, THRESH ANGLE PROBE ANGLE, X-VALUE, T-VALUE, WTLVEL, K-VALUE, PIE DAC DAC-RL; DAC-SL, DAC-EL, CORRECT 3.2.3.4 Example of function operation: Suppose that the function of RANGE in the BASE functional group is currently selected, and you want to select RECTIFY under P/R, what should you do? Firstly select the P/R group by pressing the key , in fact there are 8 items in this group, however only 4 items can be displayed in the function display zone, users need to switch them by pressing the key again, and find the finetion RECTIFY.3.2.4 Important basic settings 1 Selection of language To set the language forthe instrument display Options: Chinese, English Operation procedure: (© By pressing the key the function page is selected, © By pressing the key, the CFG functional group is selected, and by pressing the corresponding ‘ key, the funetional menu for LANGUAGE js selected. Then select the language with hand gear 2 Selection of unit ‘This is to select the unit for detection parameters ofthe instrument. Ifyou select mm, it will display metre units; and if you select inch, then it will use imperial units Options: mm, inch Operation procedure: (© By pressing the key the function page is selected © By pressing the key, the CFG functional group is selected, and by pressing the corresponding ‘ key, the functional menu for UNIT is selected. Then select the unit with hand gear. 3 Setting of screen brightness The sereen brightness can be adjusted by selecting the functional item BRIGHTNESS (functional group CFG), hich offers four options. Note: The brighter the buckground light, the shorter the working duration of the battery. Therefore, when it 4s not necessary to use the background lighting forthe display, itis advised that the lowest setting be used wherever possible. Operation procedure: (© By pressing the key the function page is selected (© By pressing the key, the CPG functional group is selected, and by pressing the key, the functional menu for BRIGHTNESS js selected. Then select the ness with hand gear. 3.2.44 Setting the grid of coordinates ‘The operator can choose the coordinates grid of the display screen by selecting the functional item GRID in(functional group CFG), which has four options. igh Technology Lad rups0 Note: The operator should choose the display grid best suited tothe test application. (Operation procedure ‘© By pressing the key, the function page is selected. (© By pressing the key, the CFG functional group is selected, and by pressing the key, the functional menu for GRID is selected, Then select the proper grid with hand geat. 3.2.4.5 Set A-sean mode ‘The A-scan screen presentation can be set to normal or enlarged mode. In the normal mode, it will display the functional group and function items plus the status field, while in the enlarged mode, it displays only the echo in the measuring area and status field. This is helpful for observing the waveform and measurement criteria. During the scanning process, it is generally et inthe normal mode, Should a defect be detected, the operator may select enlarged ‘mode to observe the echoes much closer. The operator can shift between enlarged and normal modes by pressing the Fullscreen key { 3.2.5 Basic settings prior to detection 3.2.5.1 Basie settings of the base group Before proceeding with the inspection work, the following basic setings for RANGE, MTLVEL, D-DELAY, PADELAY in the BASE group must be set propery. For details please refer to section 3.4 Adjustment of base group. 3.2.5.2 Basie Settings of the P/R group Before proceeding with the inspection work, the following basic setings for DAMP, RECTIFY, FILTEI REJECT, DATUM LINE, PROBE TYPE, PRE, 2-P CAL in the PIR group must be set properly. For details, please refer to section 3.6 Adjustment of the PIR group. 3.3 Overview of the functional groups BASE —enables adjustment of the items necessary for the screen display. PIR — enables adjustment ofthe pulse generator. GATE ~ enables the width and threshold ofthe gates to be se. [MEM ~ enables the captured data to be saved, retrieved and management(CPG — enables the function settings relative with measurement tobe carried out ANG ~ enables both the settings and operation data to be entered when an angle beam probe is used to scan the tes piece. DAC — enables the operator to record and set up the DAC curve ADV -~ enables speci ‘applications to be set up on the unit. DISPLAY ~ used for settings of coordinates grid and the contents displayed in A, B and C zone. B-SCAN — enables B-scan parameters to be set up on the unit 3.4 Adjustment of BASE Group In the BASE functional group, users can adjust and set the functional items relative with the display range, ‘including RANGE, MTLVEL, D-DELAY and P-DELAY. During thedetection, the display range of the sereen is in relation to the dimensions of the work piece and the Probe’s characteristics. The material of work piece will influence the sound velocity of ultrasonic wave ‘transmitted through it, and the characteristics ofthe probe will determine the P-DELAY. ie Note: In order to set the correct sound velocity for the material of the work piece and the P-DELAY, please ‘refer to Chapter 1V Calibration ofthe instrument SSS 3.4.1 Display range (RANGE) This enables the operator to set the required display range forthe correct screen display during the scanning operation. Range: 2.5mm ~ 999mm The range can be adjusted by selecting the functional item RANGE in the functional menu, then by pressing the corresponding key, it will enable you to between coarse and fine adjustment Coarse adjustment: 2.5mm, Smm, 10mm, 20mm, 30mm, 40mm, SOmm, 60mm, 7Omm, $Omm, 90mm, 100mm, 150mm, 200mm, 250mm, 300mm, 350mm, 400mm, 450mm, S00mm, 600mm, 700mm, 800mm, 00mm, 1000mm, 2000mm, 300mm, 400mm, $000mm, 6000mm, 700mm, 800mm, 900mm, 9999mm. Fine adjustment: Imm Operation: © By pressing the key, the BASE functional group is selected, and by pressing the corresponding. 20“Sen ey he nana a RANGE a Then ange with hand gear. 3.4.2 Material velocity (MTLVEL) ‘Operators are able to set the ultrasonic sound velocity according to the material of the work pice. Range: 1,000m/s~9,999m/s or 0.0394in/us ~ 0.3937in/us ‘The sound velocity can be adjusted by selecting the functional item MTLVEL in the functional menu, then by pressing the corresponding key, it will enable you to shift between coarse and fine adjustment. Coarse adjustment: 2,260m/s 0.089 in js Sound velocity of transverse wave in copper 2,730mv/s 0.107 ins Sound velocity of longitudinal wave in organic glass 3,080m/s 0.121 in/us Sound velocity of transverse wave in aluminum 3,230m/s 0.127 in /us Sound velocity of transverse wave in steel 4,700m/s 0.185 ins Sound velocity of longitudinal wave in copper 5,920m/s 0.233 in us Sound velocity of longitudinal wave in stee! 6300ns 0.248 in Jus Sound velocity of longitudinal wave in aluminum Fine adjustment: Step is m/s 00.00 injus Operation: © By pressing the key, the BASE functional group is selected, and by pressing the corresponding Menu key the functional menu for MTLVEL is selected. Then select the proper sound velocity by hand sear. ‘Note: It is very imporiant that the correct sound velocity be entered for the material being tested because the ‘accuracy of the grid lines displayed on the measuring screen of the instrument is calculated based on the sound velocity. 3.4.3 Display delay (D-DELAY) Users are allowed to set the starting point of the inital pulse on the display sereen. The stating point of the initial pulse can be set during the scanning operation via the functional item D-DELAY in the functional menu. Users can adjust the stating position ofthe initial pulse, as well as adjusting the zero point of the inital pulse. ‘This is done to determine ifthe starting point is at the surface of the work piece or slightly subsurface. Ifthe initial pulse has to be started atthe surface ofthe work piece the PADELAY must be set 100 Range:-20ys ~ 3400s ‘Step: the time which ultrasonic wave can go through ina pixel ofthe screen (Operation © By pressing the key, the BASE functional group is selected, and by pressing the key, thefunctional menu for D-DELAY is selected. Then adjust the D-delay by hand gear as demanded 3.4.4. Probe delay (P-DELAY) 11 is very important to set the P-delay value properly before testing, the P-delay is used to compensate for the ‘delay in sound transmission which occurs between the probe erystal and the contact face ofthe work piece. Range: Ous~ 99.99p5 Step: coarse adjustment: Ius fine adjustment: 0.0125ps Operation: © By pressing the key, the BASE functional group is selected, and by pressing the corresponding ‘ key, the functional menu for P~DELAY is selected. Then adjust the P-delay by hand gear. si ig Note: If the P Delay is unknown, please refer to Chapter IV Calibration of the instrument, for the correct set ‘up procedure to follow. $e Eee 3.5 Adjustment of P/R Group In this functional group, itis possible to adjust and set the functional items in relation to the transmitting and receiving of ultrasonic pulses, including DAMP, RECTIFY, FILTER, REJECT, DATUM LINE, PROBE TYPE, PRE, 2-PCAL. 3.5.1 Probe matching (DAMP) This function is for matching the ultrasonic probe with the acoustic impedance of the material being tested by adjusting the damp, so as to improve the amplitude, width and resolution for echo display. Options:500, 1500 and 4000 Operation procedure: © By pressing the key the function page is selected © By pressing the key, the P/R functional group is selected, and by pressing the key, the functional menu for DAMP is selected. The parameters for DAMP can be adjusted by the hand gear. 3.5.2 RECTIFY: ‘There are 4 options available. N.B. - when the DAC curve or B-sean is turned on, RF is ineffective Options: POS Positive half wave NEG Negative half wave FULL Full wave RF Radio frequency 2Operation: ‘© By pressing the key, the function page is selected © By pressing the key, the PIR functional group is selected, and by pressing the key, the anetional menu for RECTIFY is selected. The options for RECTIFY are selected by the hand gear. 3.5.3 Frequency range (FREQUENCY) ‘he frequency selected must correspond to the frequency of the ultrasonic probe type selected for the test application. Three frequency bands ae available, Options: LOW (0.2 MHiz~ 1 MHz) MID (0.SMHz~ 4 MHz) HIGH (2.0 MHz~10MH2) Operation © By pressing the key, the function page is selected (© By pressing the key, the P/R functional group is selected, and by pressing the key, the funetional menu for FREQUENCY is selected. The options for FREQUENCY are sclectod by the hand sear. 4 REJECT This menu is used to reject spurious echoes from the base line of the display, for example, to remove the structural noise propagating from the test piece. This function is used to reject the echoes onthe display whose amplitude is substantially lower than the maximum threshold level set asa percentage of the sereen height, (i.e. percentage a full amplitude) ‘The maximum threshold level (‘e. percentage at fll amplitude) indicates the min. echo height to be displayed, ‘Any echo amplitude lower than the set threshold willbe neglected and recorded as zero amplitude Parameter range:0%-80% Step graduation: 1% ‘Operation procedure: © By pressing the key the function page is selected (© By pressing the key, the P/R functional group is selected, and by pressing the key, the fanctional menu for REJECT is selected, The suppression percentage is then adjusted by the hand gear. 5 DATUM LINE ‘This menu is used to establish a reference point when adjusting the vertical position ofthe displayed echo on the screen, By adjusting the Reetify Reference, operators can move the central line ofthe displayed echo up or down, ‘on the seren. Is positon is equal tothe number of pixels onthe screen. Parameter range: -2-2 Step:Operation: © By pressing the key the function page is selected, . By pressing the key, the P/R functional group is selected, and by pressing the key, the functional menu for DATUM LINE is selected. The reference positon for retifiation is set by the hand ‘gear 3.5.6 PROBE TYPE: Setting up the instrument to match the ultrasonic probe selected. If the selected probe is a single crystal probe, then set it to P/R,ifit isa twin rystal probe, then set itto DUAL, and ifit is through transmission probe, set it to THRU, Options: P/R: Single crystal probe. Use either probe connector. DUAL: Twin rystal probe. One connector ats asa transmitter the other acts asa receiver. The red ‘connector inthis case, is designated as the transmitter. THRU: Two separa probes, typically on opposite sides of the test specimen, one acting as a transmitter and one as a receiver. The red connector in this case, is designated as the transmitter ‘Operation procedure: © By pressing the key, the function page i selected, ‘© By pressing the key, the P/R functional group is selected. and by pressing the key, the functional menu for PROBE TYPE is selected. The parameters for PROBEUDYPE are adjusted by the hand ear, 3.5.7 Pulse Repetition Frequency (PRF) Used to set the pulse repetition frequency Range: 10 ~ 1000Hz ‘Step: coarse adjustment: 20; fine adjustment: 1 ‘© By pressing the key the function page is selected. © By pressing the key, the P/R functional group is selected. and by pressing the key, the functional menu for PRE is selected. The parameters for PRE are adjusted by the hand gear. 8 Calibration of the Probe For the convenience of operators the procedure for determining the probe zero point and the sound veloeity ofthe test material, is part of the standard calibration function built into the instrument. Any additional calibration of the probe can be carried out according to chapter 4 Straight beam probes can be calibrated according to the following method, however angle beam probes intially need to be calibrated on X-VALUE and ANGLE, and then only calibrated according tothe following method. For example, to calibrate a standard single crystal, straight beam probe with a frequency of 2.SMHz, and a uBbc mugs naog us runs diner of 20mm, Tote Hos fe me al ee, we oud Ont ck sald hve thks chan th min. thoes of he epee a te ead et Hk sol ve ws mt ie max hes est ie Amun te poe stearate singe Meeks whos hrs aS and mm eset ten te lowing proce scan ot () Ser sund vlc to mproximay 920m, and sett PDELAY 00 2) Adth g gsnle se; 6) Ads he mesg ingeof the base line on the screen display to read 100mm, eg. 1SOmm. (4) Place the probe on the thin test block (SOmm), and move the start point of gate A to catch the echo. (5) Select the 25RNGAL in group PIR, confirm the thickness to be measured, and the instrament will ‘automatically adjust the gain to increase the amplitude of the largest echo intersecting gate to equal 80% of the sereen height. At the same time, a number will appear inthe probe calibration menu, Adjust this number to make it correspond with the actual S-PATH ofthe test block, which is SOmm. (6) Place the probe on the thick test block (100mm), using an ultrasonic coupling agent, and adjust gate so that the start ofthe gate intersects with the displayed echo, (7) Select the ZEPNGAL in group PIR, confirm the thickness to be measured, and the instrument will automatically adjust the gain to increase the amplitude of the largest echo intersecting gate to equal 80% of the screen height. At the same time, a number will appear in the probe calibration menu, Adjust this number to make it comespond with the actual $-PATH of the test block, which is 100mm, (8) Press the ENTER key to confirm and complete the calibration, The material sound velocity and the P-DELAY value will automatically be set accurately by th instrument "Note: I. The auto-calibration function can also be used Wf only one test block of « known thickness ts ‘available. This is achieved by taking several readings om the test block, at the sane time moving gale Ato intersect each echo in turn and entering the correct thickness value, 2. When calibrating angle beam probes, the value tobe entered is not the thickness ofthe test Block or the depth of the holes, but rather the S-PATH, which is the S value. For the convenience of centering the S value, itis advisable to use the text block V1 R100 and R50 0 obtain the echo value If this tes block is not available the S value may be calculated according to the probe angle and Length of the sound path within the test lock 3.6 Adjustment of GATE group This function is used for the adjustment ofthe gat settings, including Select, Start, Width, Thresh, Logic, Detect, Alarm, Auto-80, Functions ofthe gate during operation ofthe instrument ‘© Tomonitor the presence of defects inthe test piece within the set logic and range. If defects are present the ‘alarm will sound © | Tomeasure the postion and size ofthe echoes produced by the defects. The TUD310 is equipped with a dual-gate function, Gate A and Gate B. Gate A is normally used when testing 25the work piece for defects, and both gates are used during the measuring and calibration of multi-echoes, e., ‘measuring the distance between the surface echo and the first echo when carrying out thickness measurements, E High Technology Lid Tups10 3.6.1 SELECT Iti used to set the current gate Operation: ‘© By pressing the key, the function page is selected. (© By pressing the key, the GATE functional group is selected, and by pressing the key, the functional menu for SELECT is selected. The select is then adjusted by hand gear. 3.6.2 START Wis used to set the tart point of current gate. ‘Step: coarse adjustment: 10 pixels, fine adjustment: | pixel Operating procedure © By pressing the key, the function page is selected. (© By pressing the key, the GATE functional group is selected, and by pressing the key, the functional menu for START is selected. The starting position for Gate A can then be set by pressing the Coder ke. Note: Gate A operates independently from Gate B. Therefore the three gate parameters: Gate Start, Gate Widih and Gate Height can be adjusted separately without influencing each other. 3.6.3 Width of the gates (WIDTH) ‘This functional menu is used t set the gate widths for Gate Steps: coarse adjustment: 10 pixels, fine adjustment: 1 pixel Operating procedure © By pressing the key, the function page is selected. . By pressing the key, the GATE functional group is selected, and by pressing the key, the functional menu for WIDTH is selected. The starting position for Gate A can then be set by pressing the ‘Coder key. 3.6.4 Height of gates (THRESH) This functional menu is used to set the height of gate. Range: 2%-90% Operating procedure 2%jing TIME High Technology Lid Tups10 (© By pressing the key, the function page is selected © By pressing the key, the GATE functional group is selected, and by pressing the key, the functional menu for aTHRESH, is selected. The threshold for Gate A can beset by hand gear 3.6.5 GATE LOGIC ‘This functional menu is used for gate logic. GATE LOGK Gate logic has four options: NONE, POS, NEG, MULTI Options: NONE: gate monitoring is off POS: when the echo amplitude is higher than the preset threshold of the gate, the alarm will sound NEG: when the echo amplitude is lower than the preset threshold of the gate, the alarm will sound MULTI: both gates wil be active. Operation (© By pressing the key, the function page is selected, © By pressing the key, the GATE functional group is selected, and by pressing the key, the functional menu for GATE LOGIC is selected. The gate logic can be adjusted by hand gear 3.6.5 DETECT There are two detecting modes in TUD310, Peak and Flank, when peak is selected, the peak value is recorded in gate, When flank is selected, the recoded values isthe flank value in the start of gate Options: PEAK FLANK, Operation: (© By pressing the key, the function page is selected, © By pressing the key, the GATE functional group is selected, and by pressing the key, the functional menu for DETECT is selected. The detect mode can be adjusted by hand gear. 3.6.7 ALARM Setting of the gate alarm, ‘The alarm is used to give the operator an audible warning of an increase in wave echo amplitude, ota los of ‘wave echo amplitude, depending on the setting of the Gate Logic. Ifthe gate threshold is set at a positive logic, the buzzer will sound as soon as the wave echo amplitude intersects the st threshold level. Ifthe gate threshold is set at a negative logic, the buzzer will sound as soon asthe wave echo amplitude drops below the set threshold level Options: ON - the buzzer is on OFF the buzzer is off Operating procedure: (© By pressing the key, the function page is selected,© By rea he <> oy GATE coal pop seed wb oi he ea, aio esr AUARM ld The ohn ede yh go 3.7 MEMORY This Fnetional menu is used to access the memory section of the instrument for the purpose of recalling, deleting or saving the configured data and detection parameters. I includes such functional menus as FILE'SET, ‘SAVE, DELETE, RECALL, CHANNEL. CHAN SAVE and PRINT. ‘The instrument has a memory capacity for 1024 datasets and detection parameters as well as DAC curves from the A-scan presentation. An additonal 320 sets of thickness readings, (cach set capable of retaining upto 200 thickness readings, this being equivalent to 64000 thickness readings), canbe stored. The dta ses ae further divided into 32 detection channels Nore: When the MEM mode is used o sore waveforms Jrom A-scan presentations the data saved wil be the present waveform including all the detection parameters stored for the inspection task including the DAC curve, This means, when recalling a set of data that has been saved, not only will the current vraveform displayed revert to the waveform display saved, but the current instruments detection ‘Parameters will also revert wo the saved data, 3.7.1 FILE This functional menu is used to select files. The following 3 types of files can be recognized and displayed in TUD310. Wave file: whose suffix is: WAV; Root file: whose suffix is SE ‘Thickness file: whose suffix is THK, Operating procedure: © By pressing the key, the function page is selected © By pressing the key, the MEM functional group is selected, and by pressing the Key, the functional menu for FILE is selected. Then by pressing the key or by hand gear, enter the memory ‘management interface, (for details of memory management interface, please refer to item 3.7.9) Note: the “*” appearing infront of file name means that there is already data saved in this fle. 3.7.2 SAVE This funetional menu is used to save wave, thickness and parameters, The TUD310 will ecoginize the type of ‘current files automatically, and save the data in files secording to that. That means ifthe current file is wave file 2%Foes cng nai ah (WAV), the parameters, current wave displayed and DAC cure (itis on) wil be automatically saved inthe cent le, I'he curent ile Root ile (SET), the parameters will be saved inthe cure fle. the curent file is Thickness file (THK), the thickness vale within gate will be saved in the cuent le Operating procedure © By pressing the key, the function page selected © By pressing the key, the MEM fictional group is selected, and by pressing the key or by hand gear, do the saving. 3.7.3 DELETE This functional menu is used to delete all the data saved in the current file, The deleting is finished Operating procedure: © By pressing the key the Function page is selected, "will disappear when the (© By pressing the key, the MEM functional group is selected, and by pressing the key, the functional menu for' DELETE is selected. Then by pressing the key or by hand gear, do the deleting. 3.7.4 RECALL This functional menu is used to reeall the Root files and Wave files. The Thickness file can not be recalled. ‘When the saved files (Root file or Wave file) are recalled, the current parameters and wave will be replaced by the data saved, and it wil be in frozen state, Operating procedure: © By pressing the key the Function page is selected, (© By pressing the key, the MEM functional group is selected, and by pressing the key, the funetional menu for DELETE is selected. Then by pressing the kev or bv hand gear da the recalling © ino. tis saved inthe file, the menu will always be “OFF. 3.7.5 CHANNEL. ‘When carrying out an inspection, the procedure often calls fr different calibration test pieces and probe types to bbe used. This requites the instrument to be calibrated each time itis changed. To avoid re-calibrating the instrument every time, the TUD 310 is equipped with 32 detecting channels, which can be used to store ard save different data and parameters as required, Range: CHAN-000-CHAN-031 Operating procedure: © By pressing the key, the function page is selectedRo ecneet Tups0 ‘© By pressing the key, the MEM functional group is selected, and by pressing the key, the functional menu for CHANNEL is selected. Then by pressing the key or by hand gear, select the channel. 3.7.6 CHANNEL SAVE This functional menu is used to save the parameters in eurent channel Operating procedure: ‘© By pressing the key, the function page is selected, (© By pressing the key, the MEM functional group is selected, and by pressing the key, the functional menu for CHAN SAVE is selected. Then by pressing the key or by hand gear, save the parameters of curent channel ‘Note: The DAC parameters can not be saved by CHANNEL SAVI ‘can only be saved by saving the wave. 3.7.7 CHANNEL RECALL 11 is used to recall the parameters corresponding to the current channel. After recalling, the current parameters will be replaced by the recalled ones, Operating procedure: ‘© By pressing the key, the funetion page is selected ‘© By pressing the key, the MEM functional group is selected, and by pressing the key, the Functional menu for CHAN RECALL is selected. Then by pressing the key or by hand gear, recall the parameters, 3.7.8 PRINT. tis used to print out the current wave and parameters Operating procedure: © By pressing the key, the function page is selected, ‘© By pressing the key, the MEM functional group is selected, and by pressing the key, the Funetional menu for PRINT is selected. Then by pressing the key or by hand gear. print ‘wave and parameters, 3.7.9 Memory Management Interface The memory management interface is used to manage the file saved in local disk and flash disk (memory stick). Please refer to the following figure. 30Fee nies Tup310 Root: 733 File numbers ~ STARTUPA.SET » eoeetaea ‘cHAN-800. SET = —<—— ‘cHAN-#01: SET eotst Select files Geta SET ee eeseiea| Chiaw-@83,SET en SEL ChAN-204 SET Local ChAN-205, SET - Re] (CHAN-206, SET ChiaN-267. SET ory = (ChHAN-800,SET Fitereview | [SEK se reer go TH 00T IT | eo Tce ear isp ata Sacer] eal File suffix Filesize | There are four functional groups in memory management interface: WAVE, THICK, ROOT and EXIT my : Operations on wave files THICK SELECT, NE, DELETE, PRINT es ae oT SRC _ WRT SEL,_FORNT enory manage et Bur 3.7.9.1 WAVE tis used to manage the files in current channel. Including SELECT, NEW and DELETE, 3.7.9.1. SELECT sed to selet the current fie Operating procedure: © By pressing the key, the WAVE functional group is select functional menu for SELECT is selected (© Select the file name with hand gea 3.7.9.1.2 NEW Iris used o set up a new wave file, Range: 0-31 (in one channel) Operating procedure: ted, and by pressing the key, ‘© By pressing the key, the WAVE functional group is selected, and hy rressing the «Mem hays she functional menu for NEW is selected.Tee erie nous nn © Setupancw wave ley hd pr 3.7.9.1.3 DELETE is used to delete files. Operating procedure: (© By pressing the key, the WAVE functional group is selected, and by pressing the key, the funetional menu for SELECT is selected © Select the file to be delete. '© Press the key o select DELETE, by hand gear or key to do the deleting, 3.7.9.2 THICK, ‘This functional menu is used to manage the thickness files in current channel. Including SELECT, NEW, DELETE and PRINT. 3.7.9.2.1 SELECT. It is used to select the current fie Operating procedure (© By pressing the key, the THICK functional group is selected, and by pressing the key, the functional menu for SELECT is selected (© Select the file name with hand gear, and then confirm the selection by key, 3.7.9.2.2 NEW 1s used 66 setup a new thickness file, Range: 0-9 (in one channel) ‘Operating procedure: (© By pressing the key, the THICK functional group is selected, and by pressing the key, the functional menu for NEW is selected. © Setup a new thickness file by hand gear. 3.7.9.2.3 DELETE Tis used to delete files, Operating procedure © By pressing the key, the THICK functional group {s selected, and by pressing the key, the unetional menu for SELECT is selected, © Select the file to be delete. 2(© Press the key to select DELETE, by hand gear or key todo the deleting 4 PRINT. tis used to print the thickness report. Operating procedure: (© By pressing the key, the THICK functional group is selected, and by pressing the key, the functional menu for selet is selected © Select the fle tobe printed (© Select the PRINT by key, Print out the thickness file by hand gear or key, 3.7.9.3 ROOT This functional menu includes SELECT, MEM SEL and FORMAT Root: 1733 + STARTUP. SET * (CHAN-088.SET (CHAN-@@1. SET a (CHAN-@@2: SET (CHAN-@@3.SET = [MEN SEL ‘CHAN-084. SET Loca. (CHAN-085.SET FORMAT (CHAN-086. SET (CHAN-08?. SET (CHAN-088. SET OFF wave | THICK EO EXIT >| 3.7.9.3.1 SELECT Wis used to selet the curren ile ‘Operating procedure (© By pressing the key, the ROOT functional group is selected, and by pressing the kn tha functional menu for SELECT is selected. (© Select the file name with hand gear and then confirm the selection by key, 3.7.9.3.2 MEM SEL ‘This menu is used to select the memory positon between local disk and lah disk (memory stick). Operating procedure: © By pressing the key, the ROOT functional group is selected, and functional menu for MEM SEL is selected ‘© Switch the memory position by hand gear by pressing the key, theNote: Before locating the memory in flash dish the flash dick should be connected properly (@D appears on ‘the bottomeright corner of screen) 3.7.9.3.3 FORMAT This menu is used to format the local disk. Operating procedure: (© By pressing the key, the ROOT functional group is seleted, and by pressing the key, the functional menu for FORMAT is selected. © Do the format by hand gear or , ‘Note: 1. the format will clear all the local memory in instrument, so before that, please do some backup 10 avoid losing files 2 during the format processing ( displaying “walting"), please do not touch any other keys of the instrument 3.8 Adjustment of CFG (Configure)Group The settings for GRID, BRIGHT, FILL, BUZZER, LANGUAGE, UNIT, PRINTER, COMSPORT are performed in this group, 3.8.1 GRID This function is used to set the grid co-ordinates forthe display: Options: 0-3 Operating procedure ‘© By pressing the key, the fuetion page is selected ‘© By pressing the key, the CFG functional group is selected, and by pressing the key, the {tional menu for GRID, is selected. The grid co-ordinates for the display canbe set by the hand gear 8.2 BRIGHTNESS This function i used to adjust the backlight intensity (BRIGHT Options: 0-3 Operating procedure © By pressing the key, the function page is selected © By Pressing the key, the CFG functional group is selected and by pressing the ey, the RIGHT, selected. The backlight intensity (BRIGHTNESS) ofthe display can then atbbe adjusted by hand gear Tupso 3.8.3 FILL ‘This funetion is used to display the fll factor applied 1 the displayed waveform, Options: ON, OFF Operating procedure: (© By pressing the key, the function page is selected. © By pressing the key, the CFG functional group is selected, and by pressing the key, the functional menu for FILL is selected. The fll fator ean be determined by hand gear. 3.8.4 BUZZER ‘This function is used to activate the buzzer by selecting ON/OFF Options: ON, OFF Operating procedure: © By pressing the key, the function page is selected, © By pressing the key, the CFG functional group is selected, and by pressing the key, the functional menu for BUZZER is selected. The burzer can be activated by hand ge 3.8.5 LANGUAGE ‘This function is used to set the operating language forthe display Gptions: Chinese, English, Swedish Operating procedure: © By pressing the key, the function paye is selected, ‘© By pressing the key, the CFG functional group is selected, and by pressing the key, the functional menu for LANGUAGE, is selected. The language selection ie made by hand gear 3.8.6 UNIT. ‘This function is used to select the unit of measurement for the detection parameters ofthe instrument Sptions: mm, inch Operating procedure: . By pressing the key, the function page is selected . By pressing the key, the CFG functional group is selected. snd ping He en yh bby hand gear, .3.8.7 PRINTER ‘This function is used to set the printer Options: EPSON (the models C63, C6S are available) Operating procedure: (© By pressing the key, the function page is selected © By pressing the key, the CRG functional group is selected, and by pressing the key, the functional menu for PRINTER is selected. The printer selection can then be set by hand gear. 3.8.8 COM-PORT (communication with PC) Selection of com-port Options: USB, Operating procedure © By pressing the key, the function page is selected (© By pressing the key, the CFG functional group is selected, and by pressing the key, the functional menu for COM-PORT is selected. 3.9 Adjustment of ANG Group The Angle Probe group is used for adjusting and setting the parameters necessary for detection when using an angle beam probe. The parameters include ANGLE, T-VALUE, X-VALUE, K-VALUE, MTLVEL and PIEZO SE, 3.9.1 ANGLE (Probe angie) “This function is used to enter the angle ofa probe. Range: 00° ~ 89.0" Step: coarse adjustment: 5°, fine adjustment: 0.1° (Operating procedure: © By pressing the key, the function page is selected. ‘© By presing the key, the ANG functional group is selected, and by pressing the ke, the fanetional menu for ANGLE is selected, The probe angle is then selected by hand ger. 3.9.2 X-VALUE This function is used to set the distance from the probe font face tothe zero point (refer to the figure in item 49) Range: 0.00 mm ~ $0.0 mm ‘Step: coarse adjust 8.1mm fine adjustment: 0.01 mm 36cmt uns Operating procedure: By presing th hy the fncton page seed © pein he <1> ky te ANG futon pou ised, and by etn te 100mm) Fine adjustment: 0.01 mm (<100 mm) 0.1 mm (>100 mm) Operating procedure © By pressing the key, the function page is selected. © By pressing the key, the ANG functional group is selected, and by pressing the key, the functional menu for T-VALUE, is selecied. The test piece thickness is then entered by hand gear 3.9.4 MTLVEL(Material velocity) This functional menu is used to set the Sound velocity forthe material to be tested. ‘When working with angle beam probes, the instrument is also equipped with a sound velocity setting function, Please refer to section 3.4.2 for setting up details, 3.9.8 K-VALUE This function is used to enter the k-value of a probe (K-value taniprobe angel), itis used for some probe with K value but not angles). Range: 0.00 ~ $7.29 ‘Step: coarse adjustment: 1 fine adjustment: 0.01 Operating procedure (© By pressing the key, the function page is selected, © By pressing the key, the ANG functional group is selected, and by pressing the kev, the Ainetional menu for K-VALUE is selected. The probe k value can be adjusted by hand gear 3.9.5 PIEZO SZ (size of crystal) eis used to set the size of crystal Range: 1.0-30.0mm ‘Step: coarse adjustment: Imm fine adjustment: 0.1mm ‘Operating procedure:(eer one © By psig

by fio pgs by peng te Key th ANG ino op eed, an by pening he key, the function page is selected, ‘© By pressing the key, the DAC functional group, is sclcted, and by pressing the key, the functional mens for DAC-DISP is selected. The “ON'OFF option forthe DAC Curve canbe sleted by hand pea 3.10.2 DAC-RL This functional menu is used to set the offset ofthe DAC reject-udging line. Range: -S0dB ~ +5048 ‘Step: coarse adjustment: 1B, fine adjustment: 0.1dB. Operating procedure: . By pressing the key, the function page is selected . By pressing the key, t arene “2 key the DAC fictional group, s Sled, and by pressing the

key, the ‘ejeet-judging line can be set by the hand Byee reer et rupso 3.10.3 DAC-SL ‘This functional menu is used to set the offset ofthe DAC quantifying line. Parameter range: -S0dB ~ +508B Step: course adjustment: 14B, fine adjustment: 0.148, (Operating procedure: (© By pressing the key, the funetion page is selected . By pressing the key, the DAC functional group, is selected, and by pressing the key, the functional menu for DAC-SL is selected. The offset of the DAC quantifying line can be set by the hand sear. 3.10.4 DAC-EL ‘This functional menu is used to set the offset ofthe DAC evaluating line Parameter range: -S0dR ~ +50B, ‘Step: coarse adjustment: 1dB, fine adjustment: 0, 148. (Operating procedure: (© By pressing the key, the function page is selected © By pressing the key, the DAC functional group, is selected, and by pressing the key, the functional menu for DAC-EL is selected. The offset ofthe DAC evaluating line canbe set by the hand gear. 3.10.5 CORRECT. ‘This functional menu is used to set the “CORRECT” Parameter range: -S0dB ~ +504 Step: coarse adjustment; 14B, fine adjustment: 0.148 Operating procedure: the DAC curve (© By pressing the key, the function page is selected. © By Pressing the ke, the DAC functional grou, is selected, and by pressing the key, the functional menu for CORRECT is selected. The correction value canbe set by the hand gear. 3.10.6 DAC-REF ‘hs funetional mena enables the operator to compre the plated DAC curve, toa reference DAC curve, which complics with « standard specification. The term “generar” or “yuan” oten used, mina lating ae fr DAC. After tesa we andards are available and are referred DAC-REF will nly fanetion ithe DAC curve is complete and plotted correct Serie ate Options: GL, RL, SL, EL one and refers to the 9Fins monenetos oun Rap patie ee eaigernicoeee © 8) pring <> Ke DMC ctrl pp eel andy ping en. Ancor Nef DACRE itech ere ae ebay hn a 3.10.7 DAC-GEN Iti used to enter the DAC generating interface. Operating procedure: (© By pressing the key, the funetion page i selected (© By pressing the key, the DAC functional group, is selected, and by pressing the key, the functional menu for DAC-GEN js selected. Now users can get into the DAC generating interface by pressing the key again or by the hand gear 3.10.8 Interface 0f DAC-GEN DAC curve is plotted and generated inthe inert of DAC-GEN moe | 1450.1 * Itincludes two function groups: REC and "i 1 |pecomm GATE, and additional two function key i i 313 SAVE and EXIT a Nene Ga [DELETE OFF 4.16.8.1 REC (record) Ree This group is used to select recording point, 5 faonmests save | EXIT 9 catch recording point, comet / delete recording point and auto-gain, Se Figu includes RECORD, HEIGHT, DELETE ANDRUS fore 3.10.8.1.1 RECORD {wis used to select the current recording point It is display as: current record number / Points. For example, 2 Range: 1~ 32 Operating procedure: © By pressing the key, the fiction , rhumbers of recorded 01 means that the curent recording point is 2, and there is one recorded point inal oup REC is selected. And then select the RECORD by key © Select the curent recording point by the hand gear3.10.8.1.2 HEIGHT tis used to catch the height of the wave in gate and display’the value as recording value. (Operating procedure: (© By pressing the key, the function group REC is selected. And then select the HEIGHT by key . © Catch and record the height value by pressing the key again 3.10.8.1.3 DELETE It is used to delete the curent recording point. during the generation of DAC curve, users ean delete any recording points which is considered wrong or improper. Operating procedure © By pressing the key, the function group REC is selected. And then select the DELETE by key . © Tum the hand gear to tum on the delete funetion, confirm the deleting by pressing the corresponding “ key, of cancel the deleting by pressing any other key. 3.10.8.1.4 AUTO-80% Wis used to adjust the gain automatically to make the height of wave in gate to 80% of sereen. Operating procedure: © By pressing the key, the function group REC is selected. And then select the AUTTOMROM hy kev tur on the auto-80% by tuning the hand gear or pressing the corresponding key, and the instrument will complete the operation and tum it off. . Bring the operation it canbe canceled by pressing the corresponding ke at anytime 3,10.8.2 GATE Wis used to adjust the gate during the generation of DAC curve, the operation proveduue fy die stme wit that in GATE group, 3.10.8.3 SAVE |e used to save the recording results and quit othe main interface Operating procedure: © Do the SAVE by pressing the key ,3.10.8.3 EXIT Iti used to end the operation of DAC and quit to main interface. Operating procedure: Do the EXIT by press key. 3.11 Operation about ADV (advanced functions) Group ‘This functional menu is used for the adjustment and setting ofthe special application function ofthe instrument. includes YMDdate), HMS(time), AVG CURVE, and PEAK MEM 3.11.1 YMD ‘This function sued fo st the date of insirument in he format of Yer -Month~ Day Operating procedure: (© By pressing the key, the function page is selected ‘© Select ADY group by key , and then select the YMID function by pressing the corresponding key, adjust the data with hand gear 3.11.2 HMS This function is used to set the time of instrument in the format of Hour-Minute-second Sperating procedure: ‘© By pressing the key, the function page is selected. © Select ADV group by key , and then select the HMS function by Y pressing the corresponding ‘key, adjust the time with hand gear. 3.11.3 PEAK MEM This function enables users to conveniently establish the flaw Options: ON OFF Operating procedure: © By pressing the key, Peak, and to size the Naw accurately. the function page is selected, Select ADV group by key , and then select the PEAKMEM function by pressing the corresponding ‘key, then turn on or off this function wth hand gear,3.12 DISPLAY 3.12.1 H-AXIS. H-AXIS means the definition of horizontal axis of screen, including “S-PATH", “P-VAL", “DEPTH, and. (Options: S-PATH, P-VAL, DEPTH and__. Operating procedure: © By pressing the key the function page is selected (© Select DISPLAY group by key , and then selet the HEAXIS function by pressing the corresponding, ‘key, then select the H-axis with hand ge ‘There are three displaying zones in the sereen of TUD3IO: A, B and C, (refer to the picture bellow) Six parameters can be clearly displayed in the three zone. They are amplitude % (in percent of fullscreen), amplitude (in pixels), Sepath (sound path), d (depth), P (projection) $2 (of Naw) (for details please refer a item 4.5) height of wave in gat in percent bcheight of wave in gat in pixels ‘+ sound path of wave in gate <4: depth of wave in gate Phot section of ween ae reid [Amn] [are | Comme Options: H, h, S, d, P, SZ, se cae a Opening rosie © Dy eing he, and ton 8 he AEM vn -MENU>key thn elt rms needed whan ye by proasing dhe aniesporniigBm. 3.12.3 B-ITEM ng TIME High Technology Lid Twps10 Options: H,h, Sd, P, SZ. Operating procedure: © By pressing the key, the function page is selected. (© Select DISPLAY group by key key, then select parameters needed with hand gear. 3.12.4 C-ITEM. Options: H,h,$, 4, P, SZ. ‘Operating procedure (© By pressing the key the function page is selected. (© Select DISPLAY group by key , and then select the C2ITEM function by pressing the corresponding key, then selet parameters needed with hand gear, 3.13 B-SCAN Group The B.Scan function is used for areas where it is difficult to detect laws, by displaying the section plane graph ‘data, of the area. The graph shows how the laws are located in the scanning direction ofthe work piece. The 'B-scan function can beset beforehand, and includes A-SCAN, BESCAN and BSCAN DIR. 3.13.1 A-SCAN The option for A-SCAN is accessed through the functional menu. When tut de Asean moae and tne H-scan ‘mode is tamed on the seren wil be divided in two and both modes will be displayed Option: ON/OFF ‘Operating procedure: © By pressing the key, the function page is selected By posing the key, the BSSCAN functional group i selected, and by pressing the key the fanetional menu for A-SCAN is selected. The option for A-SCAN can then be selected hand gear. 3.13.2 BSCAN The option for B-scan mode i eeessed through the functional menu. When the B-scan function is tumed on the scan mode” will be displayed on the seen. When the B-SCAN is turned on, the be invalid Option: ON/OFF words “t “(Operating procedure: (© By pressing the key, the function page is selected, © By pressing the key, the BLSCAN functional group is selected, and by pressing the key, the functional menu for B-SCAN is selected. The option for B-SCAN can then be selected hand gear. 3.13.3 Sean way (SCAN WAY) ‘The “SCAN WAY” function determines the refresh method, “left —> right” and “ight > let, are available, Options: LtoR tol Operating procedure: (© By pressing the key, the function page is selected, (© By pressing the key, the B-SCAN functional group, is selected, and by pressing the key the functional menu for SCAN WAY, is selected. The option for SCAN WAY can then be selected by hand gear, 3.14 Adjustment of the Special Functions {mn order to make the operation ofthe instrument simple forthe user, the instrument panel contains an ad 7 keys, besides the keys used for the selection of the menu-type functional groups. These 7 keys are for the “Special Functions”, which are used more frequently. These include the following, adjustment of Gam ‘Goin, Print Report, Ful-screen Display, Waveform Freeze and Extend. 3.14.1 Gain Step ‘This functional menu is used to select the required gain step from the options below, Options:04B, 0.24, 0.5dB, 1.048, 2.048, 6.048 and 12.048 ‘Operating procedure: © By pressing the Gain Step ‘© key, the gain’ step graduation will change according to the options available, 3.14.2 Gain ‘When the required gain step graduation has been correctly selected ftom the options, the ain can he inevest ‘or decreased by pressing the Gain +/- |_*1 =) key, Parameter range:0dB~1104B, ‘Operating procedure: (© By pressing the Gain +/- 4 ~! Key, the gain willbe adjusted in the gain step selected.3.14.3 Print tis used to print the current detecting parameters and displaying. Operating procedure > © Users can perform the function of printing by pressing the Print] key 3.14.4 Full-sereen This funetional ment is used to switch between full-sereen display and normal display forthe waveform, Operating procedure: © Users can switch between full-screen display and normal display modes by pressing the full-screen“) key. Note: 1. Under full-screen display, only the “Special Functions” of the instrument will be active. All other Sanctions will not be activ. 2. The fullscreen display will not be active when the dB or B-scan mode is active 3.14.5 Freeze This functional menu is used to freeze the waveform, Operating procedure: © ‘The instrument can be switched between freeze and non-freeze by pressing the Freeze] key. © Under the condition Freeze, the prompting icon “*” will appear in the status line. 3.14.6 Extend This funtional menu is used to extend the details ofthe waveform by pressing due ESD key. (Operating procedure: © Intersect the waveform to be observed by activating the gate, press down the EHD Ley, and the extended ‘waveform will be displayed. 3.14.7 Locking the Menus Jn order to avoid changing the current detection parameters by mistake, each funetional menu can be locked, Operating procedure: ‘© Select the functional menu to be locked ‘© To activate the lock function, press down the |! key. This prevents the parameters of this functional ‘menu from being changed 6© To activate the unlock function press down the %)~. key once more, Chapter IV. Calibrating the Instrument and Measuring Prior to carrying out any inspection task, it is necessary that the instrument be calibrated for sound velocity, pitch interval and probe delay, according to the test piece and to conform with the test specifications which ‘might apply to the test application. This inital calibration procedure will ensure that the calculation of the parameters displayed in the status line is relative to the sound velocity and probe delay. The purpose for calibration of the pitch interval, is to ensure that the waveform displayed, isin the proper range of the pitch interval on the screen, enabling the operator to interpret and evaluate the defects more accurately To ensure that the instrument is operated safely and correctly, performed by a qualified ukrasonie technician, is recommended that the calibration, be Examples to illustrate the correct steps to be taken forthe calibration procedure will be discussed further on in ‘his manual 4.1 Calibration of a Single Crystal Probe ‘The calibration procedure to be used will depend on whether the sound velocity for the maesiah, ain ie yn 1A test block. The IW test blk andthe CSK-1 A test block, have the scales for angles and K-Values respectively Sele he applicable scale type fo the probe in use. As ilustrated inthe figure above, the top ofthe IIW test block is used 10 calibrate probe angles from 60 t0 76 degrees. The bottom is used to calibrate probe ances fom 74 tn Aegroes, Similarly the top ofthe CSK- 1 A test block is used to calibrate probes for K2.0, K2.5, and K3,0 ‘The boniom is used fo calibrate probes for K1.0, KI.) Place the probe on the tes block and move it ‘aecording to the Probe angle Figure above, to achieve the maximum echo amplitude. The scale comesponding to the Incidence point isthe probe angle or K-Value, Calibration of the sound velocity. Establish the highest echo as in item 1 above, "ange to make sure the second echo is displayed on the sereen, Switch the the A gate to intersect with the first echo, and adjust the detecting gate mode to double gate, adjust and adjust the B gate to intersoct withthe sevond echo. Aajust the Sound velocity 19 achieve a value of 100 forthe sound path (S). The sound velocity obtained isthe actual sound velocity ‘4. Calibration ofthe probe zero point. Repeat the procedure above, and change the gate mode to plis or minus ‘Adiust the probe zero point to make the value of the sound path (5) return to 100. The zero point value obtained isthe actual zer0 point value Angle beam probes can be calibrated in different ways, not only with standard tet blocks. Calibration can also be ‘aried out using a drilled hole ofa known diameter, Theoretically, the smaller the reference reflector is, the more “eeumic the calibration wil be, however the cllraton process becomes ire iM. When cltbraing using a ”TIME High Techoogy Lid ‘Tupst0 hole as the reference reflector, the probe angle can be determined by calculating the slope, and measuring the depth and the level positon of the hole, after the calibration procedure forthe sound velocity and the probe zero point is complete 4.4 Application of the DAC Curve ‘The DAC curve is used to distinguish reflectors ofthe same size but at different distances. It is common in tet pices, for reflectors of the same size but different distances, to cause changes in the amplitude due to the attenuation of the ‘material and the probe beam spread. The DAC curve compensates forthe attenuation of the material, magnetic field influence, probe beam spread and the surface condition, by means of a graph. Normally, the echo peak points are located on the same DAC curve. Similarly the echoes created by smaller reflectors will be located below the DAC ‘curve, and the larger eches will be above the DAC curve |. Selection of the detecting channel. Select the advanced function group by: pressing the age Iep ain! de function key . Page through the detecting channel numbers, and select a number as the current instrument setting channel, For example, No.1. (Note: only one group of DAC plotting paints can he cued in ‘any one channel, and these are saved automatically.) Should you wish to save the parameter settings a the same time, refer tothe operation “ADV” —®“SAVE" ‘Turning om the DAC curve function, Select the DACI function group by pressing the Page key and the function key . Select the DAC curve funetion through the S1 and the up {down keys. (Ifthe DAC curve funtion cannot be found in the current menu, please shift the function for DAC by pressing the Enter ~ ‘sy othe SI key, and repeat the above steps). The DAC Curve canbe selected by pressing the Coder key Plowing the DAC curve, Select the DACI function group by pussy the Page Key ana the function key “12>. Add the plotting points according to section 3.10.2. When the two plotting points are ished, the PAC curve willbe drawn automaticaly (Note: Pla the pont inthe order of alot te lnget wen w the detecting range, and the echo height ofthe preceding point must not be higher than the previous one, ‘otherwise the DAC curve willbe incorrect) Adjat the offset ofthe three offset carve. Select the DAC2 function group by pressing the Page key and fonction key , Adjust the three offset curves vz. DAC-EL, DAC-SLand DAC-RLtocortet stings, Compensation for surface roughness, Select the DAC2 function group by pressing the Page hey and function key , Adjust the g ‘Correct menu to compensate forthe surface roughness ofthe test piece, for sxample, when S4B i required, simply adjust the enn correct to ~S4B, and then the three DAC curves will be reduced by S48. 6. The DAC curve is completed,Te remem rupsi0 oo The sereen is divided into three areas, I, Il and I. The three curves will be drawn on the screen during the Inspection process, and the operator can determine the flaw characteristics hy the amplitude ofthe echaae 7. Caleulation of the equivalent, To measure the equivalent of flaw echo in agate, select the ADV function ‘group by pressing the Page key and the funetion key , Choose the function VALUEDIS, and then select the DACI function group by pressing the Page key and function key . Choose the funetion of the ‘equivalent standard, and adjust the eq the measuring standard. len standard to enable the corresponding offset curve to become Application during testing Firstly select the group number of the DAC curve ereated above, The DAC curve Will appsar om the screen. If this isnot the case, please check if the DAC eurve ment {8 Set 0 "UN", Ine Parameter settings, including the three DAC offset settings and the gain corrections stored inthis channel can also be reused by “ADV"--> “RECALL”. 4.5 Contents of Measurement To use the instrument for inspection tasks, the operator should carry out the flowing steps ‘St the star ofthe gate, the gate width, the gate threshold and the gate alarm, The contents of measurement are as follows: S- teh interval He ~ Relative value ofthe echo height inthe gate area (relative to the screen height) ‘ie Absolute value (in pixels) ofthe echo height inthe gate range 4- Depth of defect P- Horizontal distanee ofthe defect from the probe's front cdge For a detailed desripton ofthe above parameters, please refer othe following figure.rups1o ing TIME High Tecnology Lad Ajo Probe: Je Where isthe Pitch interval is the depth ofthe defect, isthe thickness ofthe test piece X= is the distance of the probe crystal to the probe’s front edge PIs the horizontal distance ofthe defect fom the probe's front edge; Important requirements before commencing the inspection task. ‘The calibration for sound velocity and P delay should be carried out. The measuring method can be selected as front-edge or peak method, The wave am) fronteedge measuring method, the pitch tude measured isthe maximum echo amplitude within the eate With the terval measured isthe pitch interval atthe front edge ofthe echo within the ‘se (peak of the echo waveform curve), Therefore when the fronted sho amplitude inthe gate is influenced by the gate threshold (height) ‘The measurement ofthe pitch interval can only be carried out when the the operator should select ei ige method is selected, the measurement of the ate is in postion, Before testing commences, the edge method or the peak method for measuring. Then select the single ot dual fe function, Under single gate function, the measurement i he pitch interval at the font edge ofthe echo or the peak imerscting the gat. Under the duel gate function, the measurement isthe itch interval starting fon within the gate A and ending atthe echo intersecting gate 3Chapter V. Communication with the Instrument The instrument is equipped with USB Device and USB Host interfaces, for communication with a PC for data compilation and to control the serial printer for producing test reports. Connect the instrument to the PC's serial port ‘or USB interface, and access the special operation software, Data View, installed on the instrument from the PC. 5.1 Data Communication In this instrument, the USB port is compatible with USB 1,1 full speed (I2Mbis) 5.1.1 Connecting with PC ‘Before starting the instrument, connect one end (with DB9 connector) of the eable (optional) with TUD310 and then start the instrument. Connect the other end (with USB connector) with PC. Run the software Duta View fo TUDIIO fom the PC; and via it, users can transfer the graphs and data Wed in TUDS10 to PC for further editing, storing and ‘management. 5.1.2 Connecting with Printer Before starting the instrument, connect one end ofthe USB cable (optional) with the USB ‘adapter (optional) and Ifthe diameter of the acoustic beam is greater than the length ofthe defect, a comparison must be made ‘between the maximum echo response ofthe defect, nd the maximum echo response ofan ariel dete,6.3.1 Defect edging method The smaller the acoustic beam diameter of the probe is, the more accurate the edge definition is, and therefore the defect length can be determined more accurately. Ifthe acoustic beam diameter is quite large, then the deft length determined could well be different from the actual defect length. I is important therefore, to select a probe which hhasa narrow, concentrated acoustic beam, the defect postion. 6.3.2 Method of displaying and comparing echoes ‘An echo reflected by a natural defect is normally smaller than the echo reflected by an ati ial defect in comparison, (€4, a flat round bottomed hole of the same size). The reason for this is because the surface of a natural defect is ‘rougher, resulting in more ofthe acoustic beam being deflected away from the receiving path of di prude. IFhis faut 's not taken into consideration when evaluating the natural defect, there isa possibility of underestimating the actual size of the defect. Due tothe unevenness ofthe surface ofa defect, e.g a shrink hole ina casting, there willbe excesive scattering of the sound off the surface of defect, with a result that no echo will be generated. In this case, the operator should dopa llemative scanning method in order to analyze the defect, e.g. the bottom-surface echo atenuation method for analysis. ‘When testing large work pisces the amplitude ofthe echo received frm a defect postioned along distance from the Surface, plays an imporant role inthe detection of laws. When selecting a method to compare an artificial defect With that ofa known defect, it should be noted that a ial defects should he evaluated inthe sume way a defects, and that: they may be subjected tothe same “distance changing rule” ‘An ltasonis sound wave will atenuate in any material during propagation. The amount of attenuation is generally ‘ety small, for example, a component made of stel with fine and dense stuctres, may also include many smal articles mide of other materials, However, ifthe acoustic sound wave hs to propagate over along distance through ‘he material it may cause an excessive sound attenuation build-up, (even tf the attenuation coefficient ofthe material is ver low) In this ease the echo ofthe natural defect will appear to be too low. Therefore, operators will ave to estimate what luence the attenuation will have when evaluating the results, and take this factor into wun where necessary, IF the surface ofthe object inspected is rough, part of the incident sound energy wil be scattered on the surface braving an influence on the detection of flaws. The higher the scattering is the smaller the reflection echo will be, ‘hus increasing the margin of error in the evaluation result, Therefore, the surface condition of the object inspected, will have an important influence on the defect echo height. ssFlere mings wos Chapter VII - Maintenance and repairs 7.1 Requirement on handling and the working environment Avoid dropping the instrument and exposing it to severe knocks and bumps. The instrument should not be ‘operated in areas where there is excessive dust, damp, strong magnetic fields, grease and dir, ete. Do not attempt to clean the casing with any type of solvent cleaner. 7:2 Charging the Battery ‘The battery satus symbol onthe LCD seren, isa realtime indivation uf de vuhage Cont UF UNE OAUErY. ‘When the battery voltage isto low, i.e, when the status symbol forthe battery shows (———] onthe LCD sereen, the instrument has to be charged as soon as possible ‘The charging operation canbe carried out withthe instrument on or off, inthe following manner: ‘a-Insert the plug ofthe power adaptor into the charging socket on the instrument 'bConnect the power adapor toa 220V/S0Hz local power supply. Both the charging indicator lamp (red), ‘the rapid charging indicator lamp (green), willbe illuminated, ‘¢-When the rapid charging indicator lamp (green) gocs out, ‘conditions the battery wll be fully charged within + 4.Sh ‘To halt the charging cycle, remove the power adaptor plug from the instrament and he bawery 1s tully charged. Under normal ‘Nowe: 1. The input voltage ofthe power adaptor is 220Y; the ouput voltage is BV DC amd the mae changing ‘current is about 1000 mA. The mas. charging time is about 6h 2: This instrument uses a Liion battery, therefore when the battery symbol for under votre annoare ‘44s important to charge the battery imorously, 4s excessive battery discharge will result in damage 10 the batery + WF the instrument will not bein use for a prolonged period of tine, the battery must be charged at {east once a month to avoid excessive dscharging taking place and damaging the batery. 4 I the battery damaged as a result of excessive discharging, ‘charging indicator lamp does not ituminate), (the battery has mo power and the remove the power adaptor plug from the instrument ‘and wait for about two minutes before plugging itin again. Repeating this process several times wil ‘refresh the condition ofthe battery. 5. The instrument can be operated while charging isin progres ae a 97.3. Replacing the battery rups10 The battery used in the instrument generally has a service life of 3 years. When the battery requires replacing, the procedure detailed below should be followed by the user: 1 Remove the four battery-cover retaining serews atthe back of the instrument casing, and remove the battery cover plate '. Disconnect the battery power plug, and remove the old battery © Insert the new battery and re-connect the battery power plig. ATTENTION: - ENSURE THAT THE CONNECTING PLUG IS POSITIONED CORRECTLY SO AS TO AVOID INCORRECT POSITIONING OF THE POSITIVE AND NEGATIVE CONNECTION TERMINALS. Put in the new battery in place, mount the battery-holding-down plate, insert the power plug into the power socket, tur on power switch to check whether the instrument works normally; €. Tighten four screws atter mount upper and lower cover 7.4 Troubleshooting ‘Should any of the following failures oceur = ‘The Instrument does not tum OFF automatically b, No measurements are displayed, The keys do not function correctly. 4. The readings are not stable. ‘The user shall not endeavor to perform repairs on the instrument, but rather, Care”, fier completing the “Warranty should dispatch the instrument to the Maintenance Dep. of our company in order for the warranty regulations to come into effect. Should you be in a position to supply us with a brief written description of the faut, it would be highly appreciated, 7.5 Tips on Safety ‘The design of the instrument complies with the relative safety standards currently in force, wd the instrument must be operated within the specified extemal ambient conltions, Is recommended tat only trained, qualified operators who are conversant wi bbe allowed to operate the equipment. By adhering to this instruction, safe operation, on the part of the operator. 's guarantee, NB. - before puting the instrument into operation, please ensure that all operators read carefully, the following tips on safetyNote: 1. This instrument is a non-destructive inspection instrument used for the inspection of materials in ‘industry, Under no circumstances should this instrument be used as a medical instrument. 2. The instrument is limited 0 use in a laboratory or an industrial environment, ‘System Power Supply The instrument can be supplied power either with external power adaptor or Li ion battery. When selecting power adaptor and battery, please use the products recommended by us. FFor charging and replacing battery, please follow our operation procedures. ‘system Software ‘Any software is prone to errors occurring during use, however the software for use with this instrument has undergone and passed strict application testing to try and eliminate such error fram oeewrring. ‘Unexpected Faults Should the following abnormal situations occur, it is an indication that there could be a fault with the % Te istrument has suffered obvious mechanical damage (cg serous tears or collision damage, which may hhave occurred during transportation), ‘The instrument keyboard or screen display is abnormal or damaged, ‘The instrument has inadvertently been stored in a corrosive cvivnent,or expose 0 high temperatures or ‘excessive humidity, Fesse switch the instrument OFF, remove the battery if necessry and send the ineramont te « designed service centre for repair oAppendix I: Technical Specifications | Designation Technical Data Range of scanning (mm) ‘Range of scanning (mm) 25 ~ 9999 Steps 255.101 500,50, 70,80,90, 100,150,200, 280,30, 30, 0, 450,00 £600,700,800,900,1000,2000,3000,4000,5000,6000,7000,8000,9000,9999 Adjusting steps: {mm Dedelay (us): 20 = +3400 ‘Steps: -20,-10,0.0, 10, 20, 0,100,150:200,250,300,350,400,450,500, 600, Dadetay (ni) 700,800,900, 1000,15002000.2500 3000,3400. Aajusting steps: 0:1 (-20us ~ 9999s). 1 (1000us ~ 34005) Pedslay: 0.0 = 99.99 Fedele (us) Steps coaeajument:| fn adusment 0.0125 MILVEL: 1000 ~ 9999 MTLVEL (m/s) 7 fixed levels: 2260,2730, 3080,3230.4700,5920,600 | Adjusting steps: 1 PRE (pulse —repatton | 40 frequency) (Hz) Lee) Damp (9) ‘0, 100. 400 Working mode Prequeney range (MHz) Gain adjustment (4B) Suppression Sea Sa a another for sending) transmission (ransmission probe) bare equency 02-1, medium frequency 0.54, high frequency 210, res waps cptional 0-110 Adjusting steps: 0.0, 02, 05, 1, 2 6. 12 (0% ~ 80% of screen height, step 1% Detection reference \ertical linear error Pixel 22, step: Vertical linear error is not more than 3% | Horizontal Tinear error ‘Not more than 2 inthe seanni Allowance of detection sensitivity >eoan Dynamie range >iaas | Alan tegusring ‘Theee modes, i. over threshold, below threshold and auto mode 2 expressed by bold iransvers line, whose stan, width and Regi ae adjusabl Aausting range of start (mm): horizonal pixel 0-208, the doplaed safes have withthe scanning ange Sp: value in mm corresponding oa pixel (relative withthe seaming range) Monitoring door Adjusting range of width (mm): horizontal pixel 4212, the Uaplayed value is Felative withthe scanning ange ‘Step value in mm corresponding oa pixel (relative withthe seaming range) Adjusting range of height 25-90% of vertcal graduation ue Step graduation: 1% Display Display: EL high-righiness graphic ltice 320240 4 levels of brightness are availabe for adjustment Fall seren or localised A-Sean display freze and un-treeze, A-Sean fli : can display freeze, ng Waveform display eee a aks eed Positive haf wave, negative half wave, full wave and radiofrequency aDesignation Technical Data Detection channel 2 Distance-amplitude-defect Peaeted ee >40dB dynamic range, Data logger 1024 A-Scan images (including setting of instrument) £64000 values of thickness (320 sets) Standard communication interface with PC USB 1.1fll speed, USB Device, USB Host Poa | ERIS ere 6Appendix II: List of Operations All functions of the TUD310 are activated by direct triggering of the individual key(s) on the panel or a ‘combination of the keys. The following list shows the applicable icons, names and functions ofthe panel keys ‘ound on the TUDS 10. Icon | Description Description of functions of key 3} | ovin sep To activate st gin sep immediately He) | Gains ‘To increase the gain once the set gain step is activated Gain To decrease the gain once the set gain step is activated dd | | Paseup To change fnctional page er] [ritey “To selest mens of fst group ro |} [rake Tasks mens of fnctina group ra | |estey Toselet mens of unetiona group Ht” Fakey ‘To select menus of a functional group Fa FB | | FSkey To select menus of a functional group Menu key ‘To seleet function options ina functional group } a Power key ‘To switch the instrument ON/OFF Enter key ‘Tecan selon, shit mlpupoe Fons, hi couse an ine | jot Fallesereen key To shift the fullscreen and normal mode < Lo ZB) | riney Tosa ening incon mel | —s Wy % Freeze key ‘To star the waveform-freezing function immediately eal ee ae ee Extend key ‘To extend the display and show detail of waveform 2Appendix III: Terms ‘This appendix lists the terminology used throughout this operating, manual, to explain the principals of ultrasonic techniques used for the non-destructive inspection of components. A good understanding of the exact meaning of these terms will be helpful to ensure the corect use ofthis operating manual, |. Pulse amplitude: voltage amplitude ofa pulse signal. When type A display is used, normally itis the height from ‘ime base line tothe pulse peak. 2 3 4 Pulse length; duration ofa pulse in terms of time or no. of eyeles. «4B: the logarithmic expression of the ratio of two amplitudes or strengths. ‘Sound impedance: rato of sound voltage of acoustic wave toa particle's vibration speed, normally it is expressed by the product of density p times by velocity c ofthe media. ‘5. Matching of sound impedance: coupting of two media equivalent to the sound impedance. ‘Atenuaton: the phenomenon thatthe sound voltage weakens gradually when an ultasonic wave propagates in the media a the propagation distance increases, 7- Tota attenuation: the weakening in sound voltage in special waveform for ultrasonic beams of any shape that is ‘caused jointly by scattering, absorbing and diffuse of acoustic beam, ete as the propacation distance incranene Attenuation coefcien: los of sound voltage in uni distance de to material scatering when the ulrasonis wave 's propagating in media, normally itis expressed by dB/em, 9% Dstc: discontinuity whose size, shape, diection, postion or nature will damage the elective use of a work Piece, or that doesn’t meet the specified acceptance standard, 10 Type A display: a kindof way for expressing information where horzoual base (X axis) 1 used for expressing ‘stance or ime, and the detection which is vertical othe base (Yas is used to express the amplitude 11. Sending pulse: electric pulse added tothe energy exchanger for producing ultrasonic wave {2, Time-bse tine: horizontal scan line expressing time or distance in type A display fuorescent screen 15: Sea the repeated moverent of the same syle from electronic beams tha runs cross the detectors Muorescen sereen, 14 ‘Scan range: Max. pitch interval that ean be displayed onthe time base line ofthe Auorescent sreen s2d: rato of cross axis to corresponding pitch inervat on the fluorescent screen, Delayed scan: a kindof seanning way where the starting part of the time base will not show in type A or B display, 13, 1. ‘orizonta linearity: the extent forthe signal displayed on the time or distance axis ofthe ultrasonic dtector's ‘uorescent screen to be proportional to the signal entered into the receiver (multiple echoes from the caihrated time generator oF from a plate whose thickness is known). Vertical linearity: the extent for the signal displayed on the time or distance axis of the ultrasonic detector’s Auorescentsereen to be proportional to the amplitude of signa entered into the receiver. Dynamic range: with constant gain adjustment, rato of wave height of the max. tothe min. reflection ara that an be identified on the ultrasonic detector Muorescent screen. Its normally expressed by 20. Repeating frequency of pulse: no. of pulses the pulse generator uses for encitin {generate the ultrasonic wave 8 the probe's wafer per second to2 2, 2s 24, 30, i 32 3 3, 35, 36, 0. a8 2», Inspection frequency: frequency of ultrasonic wave used during ultrasonic inspection, Normally itis 0.4 MHz ~1SMHa, Frequency of echo: inverse of time of peak interval obtained by observing when the echo extends on the time Sensitivity: a kind of dimension for the min. ultrasonic signal identifiable that is generated on the ultrasonic detector’s fluorescent sereen, Allowance of sensitivity: difference between the standard and maximum defect detecting sensitivity in terms of ‘certain electric levels in an ultrasonic detection system, Resolution; capability ofan ultrasonic detecting system to distinguish two adjacent detects or certain ste tat are very close to each other in transverse, longitudinal or depth direction, Suppress: a kind of controlling way to reduce or remove signals of low amplitude (el ‘material) so as to highlight the high signal in an ultrasonic detector. Gute: An electronic method for selecting a time range for monitoring the detecting signal or for futher Brocessing, Attenui by dB, SIN ratio: ratio of ultrasonic signal’ ‘expressed by dB, Blockage: a phenomenon oecured in the moment after the receiver receives signal where its sensitivity drops or it fails unit changing quantitatively the signal volage (sound voltage). The attenuated volume is expressed ® amplitude to the maximum background noises amplitude. It is normally ‘the sending pulse or strong pulse Gain: the log form of voltage amplification of the receiving amplifier ofthe ultrasoni lie detector. tis expressed by 4B, Distance-amplitude curve (DAC): a curve plotted according i810 specified condition by three parameters, ic. distance of the known reflector, 42in ofthe detector and sizeof the reflector that generates echo. During the ‘sctual detection, one can estimate the equivalent size of defect from thie curve based om die wieasurea oetect distance and g Coupling ion that transmits acoustic wave between the probe and the inspected par. “es block: sample for determining the feature and the detecting sensitivity ofan ultrasonic detection system, ‘Standard test block: a test block whose material, shape and size, are calibrated by a recognized authoritative body Or institute. I is used for testing the performance and adjusting sensitivity of an ultrasonic law detection unit oF system. ; ‘Comparing test block: the test block used for adjusting the sensitivity of an ultrasonic detection system or for ‘comparing the defect. Generally itis made of material si lar tothe material 1 be tested, Probe: clectie-sound converting component for sending or receiving (or both) ultrasonic energy. This kind of ‘device normally consists of trademark, plug, casing, back lining, piezoelectric component, protective film of wedge, Straight beam probe: probe used for vertical seanning of flaws by generating longitudinal waves, ‘Ansle beam probe: a probe used for angle scanning of laws by generating transverse waves,