VEO User Guide v1 - 2

Sonatest VEO 16:64 - User Guide
v3.1.3X
Copyright 2010 Sonatest Limited Version 1.2.2010-10-21
Table of Contents
Part I Introduction Part II Disclaimers and Notices 9 10
1 Copyright ................................................................................................................................... 10 2 Warranty ................................................................................................................................... 10 3 Equipment ................................................................................................................................... Directive Conformance 11 4 Risks ................................................................................................................................... and Hazards 11 5 Operator ................................................................................................................................... Requirements 12 6 Operating ................................................................................................................................... Conditions 12
Part III Instrument and Accessories
13
1 Hardware ................................................................................................................................... Overview 13 2 UT................................................................................................................................... Connectors 14 3 PC ................................................................................................................................... Connectors 15 4 Keypad ................................................................................................................................... 16 5 Click ................................................................................................................................... Wheel 18 6 Power ................................................................................................................................... 19 7 Accessories ................................................................................................................................... 20
Part IV Connecting Probes and Powering Up Part V User Interface
21 22
1 Elements ................................................................................................................................... of the Graphical Interface 22 2 Navigating ................................................................................................................................... 25 3 Manipulating ................................................................................................................................... Cursors (Cartesian Cursor, Angular Cursor, Gate, Box, Extractor) 26 4 Selecting ................................................................................................................................... Views and Layouts 26 5 Color ................................................................................................................................... Palettes 28 6 Ruler ................................................................................................................................... and Axis Color Map 29
Part VI Ultrasound Techniques
30
1 Scan ................................................................................................................................... Types 30

Sectorial Scan ......................................................................................................................................................... 30 Linear Scan ......................................................................................................................................................... 30 Mono Scan ......................................................................................................................................................... (Conventional UT) 30 TOFD Scan ......................................................................................................................................................... 30
2 View ................................................................................................................................... definitions 30

A-Scan S-Scan ......................................................................................................................................................... 30 ......................................................................................................................................................... 31
Copyright 2010 Sonatest Limited - 1.2.2010-10-21
Contents
L-Scan ......................................................................................................................................................... 32 B/D-Scan ......................................................................................................................................................... 32 Projected ......................................................................................................................................................... View s 33 TOFD View ......................................................................................................................................................... 33
Part VII Setup and Operation Workflow
35
1 Loading ................................................................................................................................... and Saving 35 2 Defining ................................................................................................................................... Inspection Items 37 3 Loading ................................................................................................................................... the Probe(s) 37 4 Loading ................................................................................................................................... the Wedge(s) 39 5 Defining ................................................................................................................................... the Part Being Inspected 40 6 Positioning ................................................................................................................................... the Probe on the Part 42 7 Setting ................................................................................................................................... Up the Encoder 43 8 Starting ................................................................................................................................... data acquisition 45 9 Adjusting ................................................................................................................................... Gain and Reference Gain 46 10 Adjusting ................................................................................................................................... the Focus 47 11 Adding ................................................................................................................................... or Deleting Cursors 48 12 Making ................................................................................................................................... Measurements with Gates 49 13 Moving ................................................................................................................................... the A-Scan Extractor 50 14 Moving ................................................................................................................................... the Extraction Box 51 15 Customizing ................................................................................................................................... the Measurements Bar 51 16 Taking ................................................................................................................................... Screenshots and Creating Reports 53 17 Setting ................................................................................................................................... up Encoded or Time Based Scan 54 18 Managing ................................................................................................................................... Files 55
Using the ......................................................................................................................................................... Media Brow ser 55
Part VIII Defining Scan Plan Geometry (Cartesian/Axis Reference System)
59
1 Wedge ................................................................................................................................... References 60 2 Group ................................................................................................................................... Reference 60 3 Part ................................................................................................................................... Datum 61
Part IX Calibration Wizards
62
1 Available ................................................................................................................................... Calibrations 62 2 Element ................................................................................................................................... Activation Wizard 64 3 Velocity ................................................................................................................................... and Zero Wizard 66 4 Wedge ................................................................................................................................... Delay Wizard 69 5 Sensitivity/ACG ................................................................................................................................... Wizard 72 6 TCG/DAC/DGS ................................................................................................................................... Wizard 76 7 Encoder ................................................................................................................................... Wizard 86 8 Distance-Amplitude ................................................................................................................................... Curves (DAC) 87
Part X Creating Defect Reports Part XI Data File Analysis Part XII Menus
88 92 94
1 Creating ................................................................................................................................... and Customizing Reports 88
1 Inspection ................................................................................................................................... Menu 94

Probe Qty......................................................................................................................................................... 94 Scan Qty ......................................................................................................................................................... 94 Select Layout ......................................................................................................................................................... 94 Select Measures ......................................................................................................................................................... 95 Report ......................................................................................................................................................... 96 Report Options .................................................................................................................................................. 97 Produce Report ........................................................................................................................................... 97 Report Type ........................................................................................................................................... 97 Cursors Info ........................................................................................................................................... 97 Inspection Info ........................................................................................................................................... 98 Probe Info ........................................................................................................................................... 98 Wedge Info ........................................................................................................................................... 98 Scan Info ........................................................................................................................................... 98 Encoder Info ........................................................................................................................................... 98 DAC Info ........................................................................................................................................... 98 Voltage PA ......................................................................................................................................................... Mono 98 Acquisition ......................................................................................................................................................... Frequency 98 Max Fram e ......................................................................................................................................................... Rate 99 Alarm ......................................................................................................................................................... 99 Lock Setup ......................................................................................................................................................... 99 Short Menu ......................................................................................................................................................... 99 Inspection ......................................................................................................................................................... Identifiers 99
2 Probe ................................................................................................................................... Menu 100

Load Probe ......................................................................................................................................................... 100 Probe Type ......................................................................................................................................................... 100 Probe Identifiers ......................................................................................................................................................... 100 Frequency ......................................................................................................................................................... 101 Pulse Width ......................................................................................................................................................... 101 Connected ......................................................................................................................................................... to (Mono only) 101 First Elem ......................................................................................................................................................... ent Pin # (PA only) 103 Nb Elm t Dim ......................................................................................................................................................... 1 Dim 2 (PA only) 106 Elm t Size......................................................................................................................................................... Dim 1 Dim 2 106 Elm t Offset ......................................................................................................................................................... Dim 1 Dim 2 107 Elm t Pitch ......................................................................................................................................................... Dim 1 Dim 2 (PA only) 108 Elem ent Layout ......................................................................................................................................................... (PA only) 109 Save Probe ......................................................................................................................................................... 113
3 Wedge ................................................................................................................................... Menu 113

Load Wedge ......................................................................................................................................................... 113 Wedge Type ......................................................................................................................................................... 113 Wedge Identifiers ......................................................................................................................................................... 113 Contact Surface ......................................................................................................................................................... 114 Diam eter......................................................................................................................................................... 115 Back Height, ......................................................................................................................................................... Front Height, Height 115 Width, Length ......................................................................................................................................................... 117
Contents
Cut Angle ......................................................................................................................................................... 118 Roof Angle ......................................................................................................................................................... 118 Probe Back ......................................................................................................................................................... Distance, Side Distance 119 Probe Inset ......................................................................................................................................................... 119 Velocity LW ......................................................................................................................................................... 120 Save Wedge ......................................................................................................................................................... 120
4 Part ................................................................................................................................... Menu 120

Material ......................................................................................................................................................... 120 Part Identifiers ......................................................................................................................................................... 121 Thickness ......................................................................................................................................................... 121 Velocity LW ......................................................................................................................................................... SW 121 Cal Block......................................................................................................................................................... Type 122 Cal Block......................................................................................................................................................... Serial 125 Weld Type ......................................................................................................................................................... 125 Weld Root ......................................................................................................................................................... Gap 127 Weld Bevel ......................................................................................................................................................... Width 127 Weld Root ......................................................................................................................................................... Face Left, Right 128 Weld Widths ......................................................................................................................................................... 128 Weld Angles ......................................................................................................................................................... 129 Weld Heights ......................................................................................................................................................... 129
5 Scan ................................................................................................................................... Menu 129

Scan Type ......................................................................................................................................................... 130 Gain ......................................................................................................................................................... 130 Focalisation ......................................................................................................................................................... 131 Focal Distance ......................................................................................................................................................... 132 Resolution ......................................................................................................................................................... 133 Start, Stop ......................................................................................................................................................... Angle (S-Scan) 133 Angle (L-Scan) ......................................................................................................................................................... 133 Num ber of ......................................................................................................................................................... Active Elem ents (L-Scan) 134 Start, Range, ......................................................................................................................................................... Stop Path 134 Delay Offset ......................................................................................................................................................... 134 Lateral Wave ......................................................................................................................................................... Offset (TOFD) 134 Backw all......................................................................................................................................................... Offset (TOFD) 134 Wave Mode ......................................................................................................................................................... 135 Travel Mode ......................................................................................................................................................... 135 PRF ......................................................................................................................................................... 135 Sub-Sam......................................................................................................................................................... pling 136 Sm oothing ......................................................................................................................................................... 136 Averaging ......................................................................................................................................................... (Mono) 136 Filter ......................................................................................................................................................... 137 Signal Rectification ......................................................................................................................................................... 137 IFT Active ......................................................................................................................................................... 137 IFT Gate Start ......................................................................................................................................................... 137 IFT Gate Range ......................................................................................................................................................... 138 IFT Gate Threshold ......................................................................................................................................................... 138 Probe TX, ......................................................................................................................................................... Probe RX 138 First, Last ......................................................................................................................................................... Elm t TX/RX 138 Double Resolution ......................................................................................................................................................... 138 Probe Center ......................................................................................................................................................... Spacing (TOFD) 139 Beam s Qty ......................................................................................................................................................... 139 Sam ples ......................................................................................................................................................... Qty 139 Path Resolution ......................................................................................................................................................... 139 Equivalent ......................................................................................................................................................... Reflector Size 140
Sonatest VEO 16:64 - User Guide 6 Geometry ................................................................................................................................... 140

Probe Scan/Index ......................................................................................................................................................... Offset 140 Probe Rotation ......................................................................................................................................................... 141 Enc Area......................................................................................................................................................... CL Position 141 Enc Area......................................................................................................................................................... CL Offset 141 Enc Area......................................................................................................................................................... Rotation 141
7 Encoding ................................................................................................................................... Menu 141

Encoding......................................................................................................................................................... Setup 141 Encoders ......................................................................................................................................................... Nam e 141 Scan/Index ......................................................................................................................................................... Axis Nam e 141 Scan/Index ......................................................................................................................................................... Encoder Type 141 Scan/Index ......................................................................................................................................................... Encoder Resolution 142 Scan/Index ......................................................................................................................................................... Start Position 142 Scan/Index ......................................................................................................................................................... Distance 142 Scan/Index ......................................................................................................................................................... Stop Position 142 Scan/Index ......................................................................................................................................................... Step 142 Scan/Index ......................................................................................................................................................... Invert Dir 142 Reset Position ......................................................................................................................................................... 143 Data File Size ......................................................................................................................................................... 143 Max Enc Speed ......................................................................................................................................................... 143
8 Calibrate ................................................................................................................................... Menu 143

Velocity Wizard ......................................................................................................................................................... 143 Wedge Delay ......................................................................................................................................................... Wizard 143 Sensitivity/ACG ......................................................................................................................................................... Wizard 143 TCG/DAC/DGS ......................................................................................................................................................... Wizard (Curves) 144 Encoder Wizard ......................................................................................................................................................... 144 Elem ent Check ......................................................................................................................................................... Wizard 144 Clear Calibrations ......................................................................................................................................................... 144
9 Preferences ................................................................................................................................... Menu 144

Media Brow ......................................................................................................................................................... ser 144 Language ......................................................................................................................................................... 144 Unit System ......................................................................................................................................................... 144 Keep Measures ......................................................................................................................................................... 145 Default Palette ......................................................................................................................................................... 145 Date Form ......................................................................................................................................................... at 145 System Date/Tim ......................................................................................................................................................... e 145 UI Color ......................................................................................................................................................... 145 Netw orking ......................................................................................................................................................... 145 VNC Enabled ......................................................................................................................................................... 145 VNC Passw ......................................................................................................................................................... ord 145 Video Out ......................................................................................................................................................... 146 Softw are......................................................................................................................................................... Version 146 Hardw are ......................................................................................................................................................... Version 146 Last Calibration ......................................................................................................................................................... 146 Support Console ......................................................................................................................................................... 146
10 View ................................................................................................................................... Menu 146

View Orientation ......................................................................................................................................................... 146 Add Cursor ......................................................................................................................................................... 146 Top, Bottom ......................................................................................................................................................... , Left, Right Rulers 146 Circular Ruler ......................................................................................................................................................... (S-Scan) 146 Horizontal, ......................................................................................................................................................... Vertical Grid (A-Scan) 146 Envelope......................................................................................................................................................... 147
Contents
Part Overlay ......................................................................................................................................................... 147 Skip Qty ......................................................................................................................................................... 147 View Palette ......................................................................................................................................................... 147 Palette Position ......................................................................................................................................................... 147 Show Measures ......................................................................................................................................................... 147 Show DAC ......................................................................................................................................................... (A-Scan) 147 Show DGS ......................................................................................................................................................... (A-Scan) 147 Depth/Am ......................................................................................................................................................... plitude Mode (Cum ulated view s) 147 View Scrolling ......................................................................................................................................................... Mode (Encoded view s) 148 Fram e Start/Range ......................................................................................................................................................... (Encoded view s) 148 IFT Culling ......................................................................................................................................................... 148
11 Cursor ................................................................................................................................... Menu 148

Nam e ......................................................................................................................................................... 148 Type ......................................................................................................................................................... 148 Focal Law ......................................................................................................................................................... (L-Scan) 148 Angle (S-Scan) ......................................................................................................................................................... 148 Sound Path ......................................................................................................................................................... 148 Depth ......................................................................................................................................................... 148 Level / Threshold ......................................................................................................................................................... 149 Surface Distance ......................................................................................................................................................... 149 Enc Scan......................................................................................................................................................... Axis 149 Enc Index ......................................................................................................................................................... Axis 149 Gate Follow ......................................................................................................................................................... Peak 149 Color ......................................................................................................................................................... 149 Delete Cursor ......................................................................................................................................................... 149
Part XIII Examples
150
1 Example ................................................................................................................................... of Phased Array Setup 150

Load the ......................................................................................................................................................... configuration 150 Modify the ......................................................................................................................................................... configuration 151 Making Measurem ......................................................................................................................................................... ents 152 Record Data ......................................................................................................................................................... 152 Open analysis ......................................................................................................................................................... file 153
2 Example ................................................................................................................................... of Conventional UT Setup 154

Load the ......................................................................................................................................................... configuration 154 Modify the ......................................................................................................................................................... configuration 155 Making Measurem ......................................................................................................................................................... ents 156
3 Example ................................................................................................................................... of TOFD Setup 156

Load the ......................................................................................................................................................... configuration 156 Modify the ......................................................................................................................................................... configuration 157 Record Data ......................................................................................................................................................... 159
Part XIV Maintenance
160
1 Casing ................................................................................................................................... 160 2 Screen ................................................................................................................................... 160 3 Temperature ................................................................................................................................... 160 4 Traveling ................................................................................................................................... 160
Part XV Product Specification
161
Part XVI Troubleshooting and Support
162
1 Troubleshooting ................................................................................................................................... Tips 162 2 Update ................................................................................................................................... Procedure 162 3 Contact ................................................................................................................................... Support 162
Introduction
Introduction
This manual provides information for the Sonatest veo 16:64 device. The information contained herein allows usage of the veo to its full capability in order to take advantage of its numerous and user-friendly features. The user guide has been designed so that people with good knowledge of basic ultrasonic non-destructive testing may understand how to operate the veo. It is crucial that users understand the critical nature of ultrasonic nondestructive testing. Section 2 contains important information on the proper use of this technology.
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Disclaimers and Notices
The following information must be read and understood by users of the veo ultrasonic phased array flaw detector. Failure to follow these instructions can lead to serious errors in test results or damage to the phased array flaw detector. Decisions based on erroneous results can lead to property damage, personal injury or death. Anyone using this instrument should be fully qualified by their organization in the theory and practice of ultrasonic testing, or under the direct supervision of such a person. All statements, technical information and recommendations contained in this manual or any other information supplied by Sonatest in connection with the use, feature and qualification of the veo are based on tests believed to be reliable, but the accuracy or completeness thereof is not guaranteed. Before using the product you should determine its suitability for you intended use based on your knowledge of ultrasonic testing and the characteristic of materials. You bear all risk in connection with the use of the product.
2.1
Copyright
Copyright c 2010 Sonatest Limited All rights reserved. No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form or by any means, electronic, mechanical, photocopying, recording or otherwise, without the prior written permission of Sonatest Limited.
Sonatest Ltd Dickens Road Old Wolverton Milton Keynes MK12 5QQ ENGLAND Tel: +44 1908 316345 Fax +44 1908 321323 www.sonatest.com sales@sonatest.com
Sonatest Inc. 12775 Cogburn San Antonio TEXAS 78249-2239 USA Tel: +1 (210) 697 0335 Fax: +1 (210) 697 0767 sales@sonatestinc.com
2.2
Warranty
Immediately upon receipt of the goods, the buyer is required to check the goods carefully and thoroughly in order to benefit from the warranty; any defect in the product should be immediately reported in writing to Sonatest. We will make good by repair or by the supply of a replacement or by equivalent adjustment of the price at our sole option defects which under proper use appear in the goods within a period of twelve (12) calendar months after the goods have been delivered and which arise solely from faulty design, material or workmanship. Provided always that the goods are carefully packed and promptly returned by you free to our works unless otherwise arranged. Said goods should be covered while in transit to us and must be accompanied by a written statement detailing the precise nature of the fault and the operating conditions under which the fault occurred. The repaired goods will be returned by us free of charge. Save as in this clause hereinbefore expressed we shall not be under any liability in respect of defects in goods delivered or for any injury damage or loss resulting from such defects and our liability under this Clause shall be in lieu of any warranty or condition implied by law as to the quality or fitness for any particular purpose of such goods. You are reminded that all warranties as to merchantability and fitness for purpose are exclude from the contract under which the product and this manual have been supplied to you. The Seller's only obligation in this respect is to replace such quantity of the product proven to be defective. Neither the seller nor the manufacturer shall be liable either in contract or in tort for any direct or indirect loss or
Disclaimers and Notices

damage (whether for lost of profit or otherwise), costs, expenses or other claims for consequential or indirect compensation whatsoever (and whether caused by the negligence of the company, its employees or agents or otherwise).
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2.3
Equipment Directive Conformance
Directive 2004/108/EC (EMC) on Electromagnetic compatibility directive FCC Part 18 Directive 2006/95/EC (LVD) on Safety testing for the Low Voltage Directive Directive 2002/95/EC (ROHS) on Restriction of the use of certain hazardous substances in electrical and electronic equipment Directive 2002/96/EC (WEEE) on Waste Electrical and Electronic Equipment Directive
WARNING!
This is a CLASS A product. In a domestic environment, this product may cause radio interference. In which case the user may be required to take adequate measures. Under some environmental constraints and depending of the type of equipment connected the device, the product could be found not conformant. This product should not be connected to cables greater than three (3) meters in length. If this is necessary, the installation may require further EMC testing to ensure conformity.
The Sonatest veo 16:64 complies with EN 12668-1, Non-destructive testing and verification of ultrasonic examination equipment - Part 1: Instruments. For any question relating to the proper use of this product, please contact the manufacturer.
2.4
Risks and Hazards
The Sonatest veo 16:64 contains a high-energy, precision pulser allowing optimum testing results to be obtained by matching the pulse width to the probe characteristics. This circuitry may be damaged by voltage spikes. It is recommended that the instrument be switched off, or the pulser stopped before changing transducers (probes).
Proper use of the ultrasonic test equipment requires three essential elements: Knowledge of the specific test or inspection and applicable test equipment. Selection of the correct test equipment based on knowledge of the application. Competent training of the instrument operator.
This user guide provides instruction in the basic operation of the veo flaw detector. In addition to the methods included, many other factors can affect the use of this flaw detector. Specific information regarding these factors is beyond the scope of this manual. The user should refer to appropriate textbooks on the subject of ultrasonic testing and thickness gauging for more detailed information.
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2.5
Operator Requirements
Operators must receive adequate training before using the veo. Operators must be trained in general ultrasonic testing procedures and in the set up and performance required by each specific test or inspection. Operators must have experience of and be qualified to use standard ultrasonic phased array flaw detectors equipment. Operators must understand:
Sound wave propagation theory Effects of the velocity of sound in the test material Behaviour of the sound wave at the interface of two different materials Sound wave spread and mode conversion Operation and triggering of gates for C-scan capture Sound beam forming in phased array
More specific information about operator training, qualification, certification and test specifications can be obtained from technical societies, industry groups and government agencies.
2.6
Operating Conditions
If the equipment is used in a manner not specified by the manufacturer, the protection provided by the equipment may be impaired.
Operating temperature: Storage temperature: Maximum relative humidity: IP rating:
-10C to 40C (14F to 104F) -25C to 70C (-13F to 158F) 5 to 95% non-condensing IP65 (splash proof / rain)
Do not operate with fans obstructed. Do not operate under water.
Instrument and Accessories
13
Your new instrument is a state-of-the-art ultrasound imaging device. It was designed to perform phased array imaging using S-scan and L-scan, as well as conventional UT and TOFD based on A-scan. The core of your machine is an embedded computer platform which architecture is optimized for real-time ultrasound imaging and off-line data analysis. Many of the components are industry standards like VGA, USB and Ethernet. This facilitates interfacing with standard computer peripherals. The Graphical User Interface (GUI) is designed to let users accomplish their tasks as efficiently as possible. The interface is designed with simplicity, intuitively and versatility in mind. The following chapter presents this new instrument and its accessories.
3.1
Hardware Overview
It's now time for you to boot your system for the first time. The veo is designed so that the first experience to be as pleasant as possible. Quite obviously, you won't have all the reflexes from start. The interface is such that you'll learn fast. Really fast.
Before starting, verify that your package includes the following:
Make sure that you have the appropriate probes, wedges and encoder for the type of inspection you intend to perform. You may also have purchased the Sonatest veo 16:64 as part of a kit , which includes many accessories required to perform some of the detailed example scenarios described in this document.
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3.2
UT Connectors
The following connectors are featured on the right hand side of the device: 1 TX/RX A (BNC or LEMO) 1 RX A (BNC or LEMO) 1 TX/RX B (BNC or LEMO) 1 RX B (BNC or LEMO) 1 Phased Array (I-PEX) 1 I/O (LEMO) 1 Scan Axis encoder connector 1 Index Axis encoder connector
Note: The Phased Array connector protective cap may be screwed to the back of the device (over CE Markings) while a phased array probe is plugged in.
15
3.3
PC Connectors
The following connectors are featured on the left hand side of the device: 3 USB ports (USB 2.0) 1 Video output (VGA) 1 Ethernet Gigabit (RJ-45)
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3.4
Keypad
Button
Button Nam e CANCEL Click Wheel
USB Keyboard Escape ---
Short Function Description Cancels an ongoing value change and resets to the previous value. Rotate your finger clockw ise and counter clockw ise to scroll through a menu, to increase/decrease a parameter value, to move cursor or zoom in/out in 3D view . Moves from one menu item to another. Changes a parameter value. Moves the selected cursor or gate. Moves from one menu tab to another. Moves the selected cursor or gate. Confirm selection or new value. Activates the menu and allow s menu navigation. Toggles betw een the various view s. Toggles betw een the various cursors of the currently selected view . Also acts as BACKSPACE during text entry. Changes the gain value. Brings focus to the calibration menu. Show s or hides the w eld overlay for the selected view .
UP / DOWN ARROWS LEFT / RIGHT ARROWS OK MENU VIEW CURSOR dB CAL WELD
Arrow s Arrow s Enter M V C D F4 W

LAYOUT ZOOM IN/OUT MAX / MIN EXTRACTOR GATE RANGE F1 / HELP F2 / INFO F3 / SET REF PLAY/PAUSE STOP RECORD SAVE LOAD LED LED ALARM BAT1 / BAT2 ON/OFF L Z X E G A F1 F2 F3 P T R S O ------Access the view layouts. Zooms in or out of the view . Toggling to maximize or minimize the selected view Focuses or toggles betw een extractors Focuses or toggles betw een gates. Changes the range path value. Toggles the display of contextual and full help pages. Displays the cursor information menu. In Wizards, F2 goes back to the previous step or page. Resets the encoders position to the origin. In Wizards, F3 goes forw ard to the next step or page. Starts live ultrasound images, or freezes the acquisition. Stops the live acquisition, or stops the recording. Records ultrasound data in real-time.
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Saves a file. Will display a pop-up to confirm the type of file to save (Setup, Report, Screenshot). Loads a configuration file. Will display a file list to choose from. Lit w hen any of the gates has a threshold detected. Off=Full Charge, Green=Charging, Orange=Low battery Pow ers the instrument on (Hold dow n) or shuts it dow n. Lights up in green w hen the device is ON.
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3.5
Click Wheel
The Sonatest veo 16:64 features an innovative Click Wheel. There are 2 ways to use the Click Wheel.
1. Use your thumb or index finger to touch lightly on the surface around the button, and rotate clockwise or counter-clockwise, without applying pressure. Use this to quickly increase or decrease values, scroll down or up through parameters, move cursors around, etc.
2. Push one of the 4 directional arrows ( ) to perform the same operations with more precision. Increase or decrease values, switch to other menus, scroll through parameters, move cursors around, etc.
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3.6
Power
The instrument can operate from 3 power sources: DC power in Battery 1 Battery 2
To insert batteries, unscrew both battery doors, and insert the 2 batteries. Pull out the AC rubber cap (back of the device) and connect the AC adaptor. The first charge must last at least 6 hours. The unit can be used while charging, however this increase the charging time. To avoid any downtime when you perform an inspection, we can provide you with an external battery charger, or additional battery packs.
Exterial battery charger available w ith veo unit.
The Sonatest veo 16:64 can operate on a single battery. Also, batteries can be replaced during operation (hot swappable), as long as one power source remains connected.
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3.7
Accessories
A wide variety of high-quality Sonatest accessories are available for the veo. Refer to your local Sonatest distributor to find out about: Conventional Transducers Phased Array Transducers (DAAH transducers and adaptors) Wheel Probes Adaptors Cable Splitters Encoders (Quicktrace Micro-Encoders) Multipurpose Scanners TOFD Kit TOFD Scanning Frames TOFD Pre-Amp Test Blocks Batteries Water pumps Custom wedges and more...
Connecting Probes and Powering Up
21
Connecting Probes and Powering Up
Connect your probe in the appropriate connector. To connect phased array probe(s), unscrew the protective cap and place it on the back of the unit (over the CE markings). If you own probes with a different type of connector, Sonatest distributor may provide you with adaptors. With the appropriate splitter, 2 phased array probes may be connected to the Sonatest veo 16:64.
Adaptors for conventional UT probes (mono-element) are also available from your Sonatest supplier (Sonatest veo 16:64 is offered with BNC or Lemo connectors, depending on users preference). The TX/RX connector must be used for pulse-echo (PE) type scans. For Pitch and Catch (PC) setups, use the TX/RX connector as the pulsing (pitch) probe and the RX connector as the receiving (catch) probe.
To power up the device: 1. Press the ON/OFF ( ) key for about 4 seconds until you see a flashing indicator (this delay ensures that the unit does not starts accidentally during shipping and handling). 2. Sonatest veo 16:64 will then start-up. The boot process takes approximately 40 seconds. 3. At the end of the boot process, the Graphical-User Interface (GUI) appears, displaying the following screen:
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5
5.1
User Interface
Elements of the Graphical Interface
Tab Bar
Shows the list of tabs (menus). Tabs are placed in a logical sequence that should be followed when doing a new inspection configuration.
Main Menu
Displays the list of parameters (numerical, text, lists or action buttons) that are in the current tab. The list is scrollable with the UP ARROW and DOWN ARROW keys, or by rotating your finger around the click wheel. The list can contain more than 10 parameters (going up or down reveals new parameters).
Number of Probes/Wedges/Scans
Allows the user to know, at a quick glance, how many probes, wedges or scans are configured in the setup. There are always as many probes as there are wedges, but there can be multiple scans on a single probe, or a scan that uses multiple probes (pitch and catch).
Summary View
Shows a quick summary of the current configuration settings.
User Interface
23
Plan View
Shows the location of probes on the part, as configured in the Geometry menu. Especially useful in multi-probes setups.
Battery Status
Displays various information about the device state, such as the Instrument State, the Time/Date Indicator and the Battery Status Indicator.
Information Bar
Displays a short help message related to the selected parameter in the main menu, or displays error messages.
Help View
Displays more detailed help text related to the selected parameter in the main menu. Can be maximized.
3D View
Show the representation of probes, wedges, scans and part in 3D.
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Views (center area)

The main area of the screen is used to display ultrasonic views (here, 4 views are displayed, a Sectorial Scan, a Linear Scan and 2 A-Scans). The views are the representation of the ultrasonic data captured by probe(s). Press the VIEW key to toggle between each view.
Measurements Bar
Displays various numerical measures extracted from the ultrasonic data. The measures to display can be selected in "Inspection:Select Measures", during PLAY mode. It is displayed only when the VIEW key has been pressed, or when the "Preferences:Keep Measures" option has been enabled.
Calibration Indicators
Gives color coded information about calibrations that were performed. BLACK = not calibrated, GREEN = calibrated, YELLOW = partial calibration, RED = calibration failure.
Instrument State
This area indicates the current inspection state, either Play, Stop, Pause or Record. Shows as "ACQ" when a configuration is loaded for acquisition, and "FILE" when "utdata" file has been loaded for post-analysis. See the " Starting data acquisition" section for more details.
Item Selection
User Interface
25
When multiple probes, wedges or scans are configured, their menus are stacked together. This indicator shows which probe's, wedge's or scan's properties are currently being displayed in the menu.
Scrollbar
Use to scroll with a USB mouse.
View Layout
Shows the current screen layout. The active view is always shown in blue, and the properties of the active view are located in the "View" menu.
Encoder Position
When an encoder is plugged in and configured, the encoder position is shown here, in mm or inches. This value is updated in "PLAY" mode.
View Measures
This area shows various measures automatically selected depending on the context. They can been hidden by using the "View:Show Measures" option to increase the viewable area.
5.2
Navigating
26
1. Press the
key to select the menus tab, then use the click wheel ( key to cancel ongoing changes.
) to navigate. Press
to edit a
parameter. Press the 2. Press the 3. Press the
key to toggle between the different views. key to toggle between the different cursors of the selected view, then use the click wheel (
) to move the current cursor (displayed in blue).
5.3
Manipulating Cursors (Cartesian Cursor, Angular Cursor, Gate, Box, Extractor)
1. In "acquisition mode" (play), press the VIEW key (once or multiple times) to select the appropriate view. 2. Press the key (once or multiple times) to select the appropriate cursor in the current view.
3. Use the click wheel (
) to move the selected cursor.
4. To change "gates" size, press edition mode. Press
, then change size by using the click wheel (
). A square is visible in
to confirm gate width.
Exam ple of gate resizing.
5.4
Selecting Views and Layouts
An important number of views are available, presented in layouts are contextual to your scan setup. Below the list of available views:
View A B C D
Description A-Scan view B-Scan view Use "top view" D-Scan view
User Interface
L S Top End TOFD L-Scan view S-Scan view Top view End View TOFD View
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1. Press LAYOUT (
) to change the view organization.
2. Press
to see the available choices, then use the click wheel (
) to select the appropriate layout.
Note: Only the layouts applicable to you setup (number of scans, type of scan) are available.
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5.5
Color Palettes
Color Gradient
Palette Names 3 level threshold ABF Amplitude Aeronautic
Rainbow Spectrum Greyscale
TOFD Thermal
User Interface
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5.6
View A-scan
Ruler and Axis Color Map

Axis Content Amplitude Sound Path
B-scan
Scan Sound Path
C-scan D-scan
Accomplish by using top view Index Sound Path
L-scan S-scan
Surface Distance Depth
Top
Scan Surface Distance
End
Scan Depth
TOFD
Scan Depth (non-linear)
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6
6.1
Ultrasound Techniques
Scan Types
The "Scan: Type" parameter allows to select amongst Sectorial, Linear, Mono or TOFD scan. Each scan is configured either in Pulse-Echo (PE) mode or Pitch-and-Catch (P&C) mode, except for TOFD scans which always are used in Pitch-and-Catch. Each type of scan is described below.
6.1.1
Sectorial Scan
The sectorial scan, also called azimuthal scan or more commonly S-scan, is a cross-sectional image of the inspected volume. It represents an angular coverage of the volume under the probe.
6.1.2
Linear Scan
The linear scan, commonly called L-scan, is represented on screen as a parallelogram view, directly under the probe or at a specific angle. The L-scan is generated by multiple A-scans at the same transmitted angle, but from different exit points. A small group of elements are activated to generate each beam (focal law), and the group of elements moves along the elements array for each subsequent beam.
The linear scan is also referred as an electronic scan or E-scan.
6.1.3
Mono Scan (Conventional UT)
The mono scan refers to the conventional A-scan representation, using a single reception element. The A-scan is a waveform representing the amplitude of the ultrasound signal as a function of time or distance of propagation. Echoes become apparent as soon as reflectors occur on the travel path of the ultrasound wave front. A reflector may be a defect, such as a crack or component geometry (i.e. weld root).
6.1.4
TOFD Scan
The Time-of-Flight-Diffraction (TOFD) scan involves a pitch-and-catch setup of conventional UT probes where data is generally displayed using a gray-scale B-scan.
6.2
6.2.1
View definitions
A-Scan
The A-scan view is probably the most important ultrasound view. For most cases, it is the source of all other views like B-scan and S-scan. The A-scan is a waveform representing the amplitude of the ultrasound signal as a function of time or distance of propagation. Echoes become apparent as soon as reflectors occur on the travel path of ultrasound wavefront. A reflector may be a defect (i.e. crack) or component geometry (i.e. weld root). For manual inspection, the A-scan is observed by the user until a susceptible echo becomes apparent. Therefore, the probe position is adjusted by the user to peak out the echo. Then, the cursors or gates are adjusted in amplitude and time to depict defect location and size. For automated inspection, it is quite the same thing except the A-scans were all previously recorded. The user browses throughout the data (i.e. S-scan) and suddenly finds an indication (most of the time a red spot because of
31
color palette). He places the extraction cursors on the red spot and the corresponding A-scan appears in the view. The set of cursors are adjusted in the A-scan to make similar measurements such as in manual inspection.
A-scan view
6.2.2
S-Scan
The S-scan view is a powerful tool available when using phased array probes. Indeed, it represents an angular coverage of the volume at a specific probe position. As a convention, it represents beam steering into one tilt plane, most commonly 0 degree (azimuthal plane). More generally, it is the accumulation of color-coded A-scan lines or "pie" sections, placed side-by-side since they represent A-scans acquired at different consecutive angles. Normally, all angles within a S-scan are triggered at once, either from a clock event or a position event within a sequence. The time triggered version is called the free-running S-scan since a S-scan is grabbed N times per second, without respect for the actual position of the probe. Echoes become apparent in the form of a spot or a trace as soon as a reflector occurs on the travel path of ultrasound wavefront. A reflector may be a defect (i.e. crack), but most of the time you get traces from bouncing waves on component geometry (i.e. weld root). The rendering on screen depends on the angular span and resolution. For manual inspection, the free-running S-scan is observed by the user until a susceptible spot becomes apparent. Therefore, the probe position is adjusted by the user to peak out the spot, since some defects have better responses at specific angles. The A-scan may or may not be used to perform the measurements. For semi-automatic or automated inspections, it's pretty much the same thing except the A-scans were all previously recorded, so all the Sscans were recorded. The user browses throughout the data, and suddenly finds an indication (most of the time a red spot because of color palette). Quite often, the user scrolls an extractor cursor on the S-scan to see the corresponding A-scans and the echodynamic of the echo.
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S-scan view
6.2.3
L-Scan
L-scan means linear scan. It presents on screen a parallelogram view at a specific angle. The L-scan is generated by multiple A-scans at the same transmitted angle, but from different exit points. The exit point variation comes from the fact the activation of array elements changes such that a small group of active elements are moving from one beam (focal law) to the other. For example, with a 32-element probe we generate a L-scan where only 8 elements are active at a time. The first beam (focal law) would activate elements 1 to 8, the second law elements 2 to 9, the third law elements 3 to 10, and so on. Of course, the exit point moves accordingly. The number of active elements per law determines the number of laws the L-scan will have. One way to refine the resolution of the L-scan is to use a Vernier pitch, meaning that alternatively N and N-1 active elements are used. Of course, the number of beams (focal laws) will double (almost). For example, the first beam would use elements 1 to 8, the second beam elements 2 to 8, the third beam elements 2 to 9, the fourth beam elements 3 to 9, and so on. Because the effective aperture of each focal law is reduced (i.e. 8 elements instead of 32), the L-scans are known to have less spatial resolution. However, they sometimes overcome problems of wedge noise and they simplify the analysis. After all, the L-scan can be interpreted as an electronic B-scan. Like any other view, the L-scan provides a colored cumulation envelope mode that can be turned on or off.
6.2.4
B/D-Scan
The B-scan is a view generated from the extractor angle from the S-scan. If the extractor angle is changed, a different B-scan will be created. Depending on your probe displacement, the B-scan may be considered as a D-scan. In an encoded inspection, there will be no confusion between the B and D-scan since the system will know for sure the direction taken by the probe, assuming the encoder was correctly configured.
33
The B-scan view is the accumulation of color-coded A-scan lines, placed side-by-side since they represent A-scans acquired at different scanning position. The scanning can be position encoded (most common form), or time encoded. The time encoded version is called the scrolling B-scan since an A-scan is grabbed N times per second, without respect for the actual position of the probe. Echoes become apparent in the form of a spot or a trace as soon as a reflector occurs on the travel path of ultrasound wavefront.
6.2.5
Projected Views
The projected views are a very useful tool allowing you to quickly have a global view of an inspection from three different angles : the top, the side or the end of an inspected component. The resulting view of this kind of projection is a two-dimensional representation of a three-dimensional view. The amplitude peaks encountered in the inspection are projected on the 2D view, so that using the three different projected views will give you a pretty good idea of the inspected component. The projected view can also represent the position of the peak in the projection axis instead of the amplitude of the peak itself. To change the display from amplitude to depth, you just need to modify the Depth/Amplitude Mode option in the View menu. The use of a cartesian box to extract those views is quite useful since it can limit the area to be included in the projection, allowing the user to cut out any noise from the projection. Also, since creating this type of view requires browsing a lot of data, limiting the range of the view will also tend to give a faster rendering.
6.2.6
TOFD View
The TOFD scan involves a pitch-and-catch setup of conventional UT probes where data is generally displayed using a gray-scale B-scan or D-scan. The signal typically starts with the pulse from a wave traveling on the surface of the part, called Lateral Wave. It then can be followed by some diffracted wave pulses from defects, if any. Finally, the specular reflection from the bottom of the part comes back, called the Back-Wall Echo. Hyperbolic cursors are available in this view to measure defects position and length.
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TOFD view
Setup and Operation Workflow
35
The user interface has been designed to match the workflow described below.
7.1
Loading and Saving

key to open one of the provided example configuration files.
1. At any time, press the
2. Press the key to select the left-side menu, then use the click wheel ( appropriate menu item.
) to navigate and select
3. Press the file.
key to select the file list, then use the click wheel (
) to navigate and select the appropriate
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File Extension
Description Contains the entire configuration for an inspection (the probe, the wedge, the type of scan, the position of each cursor, the layout, the color palette to use). Contains everything a .utcfg file contains, plus all the recorded data. Reports created by veo use the PDF file format. Any other PDF file can also be displayed by the veo. Screen captures created by veo use the PNG image standard. (PNG: portable network graphics)
.utcfg .utdata .pdf .png
4. If necessary, press the
key to swap media. Files can be loaded from or saved to the internal solid state
drive ( ), or an external USB drive ( ). The Sonatest veo 16:64 comes with an extensive list of sample configurations stored on the internal solid drive. These files start with "Example_....". They are read only files. Once a file is selected, the "configuration summary" is displayed on the right hand side window.
5. Press
to open the selected file. key on the keypad. Use the keypad like a
6. To save a configuration (utcfg), a screenshot or a report, press the cell phone to enter your filename.
Saving setup, screen capture or report.
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7.2
Defining Inspection Items
The inspection tab is the first step when defining the inspection strategy. This is where the number of scans and probes is specified. This is also where the information relative to the inspection can be written for further reference in reports and examination records. The inspection tab contains items that are common to all scan, like the voltage and the acquisition frequency.
7.3
Loading the Probe(s)
Once the number of probes to be used has been decided, you can load them from the probe database or define them manually. To load a probe, press displayed. on the Load item under the probe tab. The probe database will then be
38
Tip: If you define the probe manually, maximize the help view by pressing the help key database using the Save button at the bottom of the menu. . Save the probe into the
39
7.4
Loading the Wedge(s)
For each probe, a wedge can be associated. It means that probe 1 is automatically linked with Wedge 1, probe 2 with wedge 2, etc. When no wedge is attached to the probe, the wedge Type has to be defined to None. To load a wedge, press on the Load item under the wedge tab. The wedge database will then be displayed.
Tip: If you define the wedge manually, maximize the help view by pressing the help key database using the Save button at the bottom of the menu. . Save the wedge into the
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7.5
Defining the Part Being Inspected
It is in the Part tab that the longitudinal and shear wave velocities are defined. Velocities can be manually entered if they are known or the Velocity Wizard can be used to set them. When performing a shear wave (SW) inspection, the longitudinal wave (LW) velocity can be ignore as you will set the Wave Mode to SW velocity in the Scan tab.
41
The second half of the Part tab is dedicated to the definition of the weld geometry. If there is no weld, the Weld item can simply be set to None. Otherwise, the most representative geometry can be chosen and the parameters adjusted accordingly. Details on geometry type can be found under the Weld Type description. When selecting a specific geometry type, some of the parameters will be grayed. These items are calculated values based on other ones. As per example, the Top Bevel Width is the sum of the Top Left Width and Top Right Width.
42
Tip: Maximize the 3D View while defining the weld geometry.
7.6
Positioning the Probe on the Part
Refer to next section "Defining Scan Plan Geometry".
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7.7
Setting Up the Encoder
To record data based on the encoder position, it is required to setup an encoder. The current software version allows one axis encoding. Two axis will be available in further version.
The encoder has to be plugged into the Scan axis which is identified with a S on the casing.
Go to the Encoding menu and choose Scan Axis only.
For the Quick Trace, the Scan Enc Resol. can be set to 14.40 ticks/mm or 365.8 ticks/in. If unknown, use the Encoder Calibration Wizard.
The Scan Start Pos defines the position from where your acquisition will be starting relative to your reference point. The Scan Distance defines the distance over which data will be collected. The Scan Step defines the distance between each data collection position.
44
The Max Phys. Enc. Speed indicates what will be the maximum scanning speed with the current setup. Increasing the PRF will increase this number.
The encoder position is written in the bottom left corner and is active in Play mode only.
45
7.8
Starting data acquisition
The Sonatest veo 16:64 was designed with user workflow in mind. The device has 3 operation modes: Configuration Acquisition / Recording Analysis
These states are controlled like a common DVD recorder, by using stop ( ), play ( current operation mode is always displayed in the top-right corner of the screen. 1.
) and rec (
).The
After opening a file, the Sonatest veo 16:64 always starts in "configuration mode", also called stop ( mode. Before starting the data acquisition, it is a good practice to review your setup. At any time, you can press the stop ( ) to return to "configuration mode".
2.
In "configuration mode" (stop mode), the Sonatest veo 16:64 displays the following screen:
46
3.
Press the key to select the left-side menu, then use the click wheel ( to edit a parameter. To navigate in the various menus, press the and arrow keys. Press around the OK button, to move up or down in the menu. or
) to navigate. Press
4.
, or rotate your finger
5.
Press the key to toggle between the different views, then use the click wheel ( views (scroll up and down, rotate and zoom the 3D view). Pour gel couplant on the weld sample. Position your probe so that the flat front-face of the probe touches the weld crown.
) to move within
6. 7.
8. 9.
Press
PLAY (
) to change to acquisition mode.
You're ready to start your first phased array inspection with this instrument!
7.9
Adjusting Gain and Reference Gain

) button to set the gain of the current scan.
Simply press the dB (
Tip:
47
If you have multiple scans, you should select the appropriate scan by pressing ) key. Gain can be adjusted separately for each scan.
before pressing the dB (
The reference gain can be set by pressing the "Set Ref Gain" button available just below the Gain item. The Reference Gain is the actual reference level based on reflector responses. The value of the Reference Gain is automatically set to the current Gain when activating the "Set Ref Gain" button. For example, if Ref Gain is initially 0dB and Gain is 10dB, pressing "Set Ref Gain" changes the Ref Gain value to reflect the current Gain, i.e. 10dB.
Gain, Ref Gain and Set Ref Gain item s.
Tip: The offset gain and reference gain are displayed on the top left corner of each scan. In the example below, an offset gain of +25dB has been applied in addition of the reference gain of 10dB. The actual gain is 35dB (25dB + 10dB) in this case. The offset gain can either be positive or negative and is relative to the reference gain. The reference gain is the value displayed in parenthesis. It is always possible to know the actual by looking at the gain item in the scan menu.
Exam ple of offset gain and reference gain displayed on S-scan view .
7.10
Adjusting the Focus
An important parameter to adjust in phased array is the focus. Focusing too far can lead to a lack of resolution. Overfocusing is not good either: the inspection would be fuzzy or you would have blind spots elsewhere. As a rule of thumb, choose a focal distance that is at the end of the area of interest inside the part, depending on your application.
48
1.
Press the
key.
2. 3. 4.
Press the RIGHT ARROW key on the click wheel (
) a few times in order to reach the SCAN tab.
Press the DOWN ARROW key a few times in order to reach the "Focal Dist" parameter in the sidebar. Press the key to modify the value.
5. 6.
Rotate the wheel ( Press the
) to increase or decrease the focusing distance.
key to accept the new value.
7.11
Adding or Deleting Cursors
Cursors can be added or deleted manually to available views:
Adding Cursors
1. In acquisition mode, press the 2. Press key (once or multiple times) to select the appropriate view.
and select the "View" tab.
3. Use the click wheel ( cursors will be available.
) to select "Add Cursor..." item. Depending on the selected view, a choice of various
Here is the list of available cursors: Type Gate Description The gates are used to make flank and peak measurements in a ASCAN views. When the gate is triggered by an echo, the peak amplitude level is displayed, as well as its absolute position in True Depth ( ), Surface Distance ( ) and Sound Path ( ). All Sound Path measurements use the "Scan:Travel Mode", thus measurements can either represent the Full or Half Sound Path in the part (in mm or inches), or the Full or Half Sound Time spent in the part (in s). When the rectification is set to None, the values range from - 100% to 100%. On the other hand, when the rectification is set to Full, the values range from 0 to 100%. Drawing
Quick access key:
49
Extractor
The extractor is used to extract A-SCANs from the L/S-SCAN.
Quick access key: Cartesian Cursor The "cartesian cursors", also called crosshair cursors, are used to make Surface Distance (SD) and Depth measurements in S/L/A-Scan.
Angular Cursor
The "angular cursors" are used to perform Sound Path measurements in S/L-Scan.
Box
The box is used to extract Top/End-Views from the L/S-SCAN.
Quick access key: Hyperbolic Cursor The "hyperbolic cursors" are used to evaluate Surface Distance (SD) and Depth measurements in a TOFD Scan (Time of Flight Diffraction). The TOFD-View is a B-Scan type view with a pitch and catch probe configuration. TOFD-View uses a non-rectified color palette (Black: 100%, White: +100%).
Deleting Cursors
1. In acquisition mode, press the 2. Press the 3. Press key (once or multiple times) to select the appropriate view.
key and select the cursor to be deleted. and select the "Cursor" tab.
) to select "Delete Cursor..." item.
7.12
Making Measurements with Gates
There are various ways to make measurements, but using gates is the most common and precise way to do it:
1. In acquisition mode, press the "gate" (
) key (once or multiple times) to select the appropriate gate.
50
) to move the selected "gate".
3. To change "gates" size, press Tip:
).
Measures shown beside the gate are affected by the "Scan: Travel Mode" parameter. Choose either round-trip or one way measurements, either in distance (mm or in) or time (s). Refer to Customizing the Measurement Bar to know how to make peak or flank measurements using the gates.
7.13
Moving the A-Scan Extractor
Sectorial scan (S-scan) and Linear scan (L-scan) are made of stacked A-scan. It it possible to look at each individual A-scan (focal law) composing them by moving the extractor. The extractor is represented as a dashed line. 1. In acquisition mode, press the "extractor" ( ) key (once or multiple times) to select the appropriate extractor.
) to move the selected "extractor".
Moving the A-scan extractor to select a focal law .
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7.14
Moving the Extraction Box
The extraction box, also refereed as the square box is used to generate Top and End views. 1. In acquisition mode, press the "extractor" ( ) key (once or multiple times) to select the appropriate box.
2. Use the click wheel ( 3. Press
) to select and move the selected "box". again to accept.
to modify the "box" size, then use the click wheel to change dimensions and
Resizing the extraction box.
7.15
Customizing the Measurements Bar
The Measurements Bar is shown at the top of the screen in PLAY mode, when focus is in the views (in PLAY mode, press the preference. button). It can also be shown permanently in PLAY mode by enabling the Keep Measures
52
To select desired measures from available cursors: 1. Press if youre not in PLAY mode.
2. Go to the INSPECTION menu and choose Select Measures.
3. Select one of the Measurement entry (1 through 6), and press
to modify it.
4. Each measure ID is composed of 3 parts; the cursor identifier, the reference point and the type of measurement. As per example, G2 ^ %FSH means the amplitude, in percent, of the peak detected in the second gate. The description of each type of measure follows:
Identifier A C F
Cursor Type Angular/Extractor Cartesian Frame Extractor (encoded views) Gate Hyperbolic (TOFD) IFT Gate (interface)
Ref ^ / Start Stop
Reference Point Peak (or point) Flank First point of a gate
Meas %FSH %REF
Measurement Type Amplitude in Percent Amplitude Reference to the Curve (DAC or DGS) Depth
End point of a gate Sound Path (from exit point) Surface Distance (from wedge reference) iRating Indication Rating (d), as per AWS with a 80% reference.
G H I SQ AB DAC
Square Box Angular Box Distance Amplitude Curve
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7.16
1.
Taking Screenshots and Creating Reports

key and either select "Report" or "Screen Capture".
To produce a screenshot or a report, press the
Saving setup, screen capture or report.
2.
Reports content can be customized by choosing the information to be included in. Go to the Inspection tab and select the "Reports" item.
54
Report options
3.
Screen captures are a picture of what is currently displayed on the screen. Screen capture are saved as PNG files.
7.17
Setting up Encoded or Time Based Scan
There are 2 types of inspection : Manual (Free Running) with time based recording. Encoded (Trig Encoder), where ultrasound pulses are emitted at specific positions provided by the encoder. 1. Press stop ( ) to return in configuration mode.
2. Press the RIGHT ARROW key on the click wheel ( 3. Press 4. Select: to edit the "Encoding Setup" parameter.
) a few times in order to reach the "Encoding" tab

"None" for Manual (Free Running) "Scan Axis Only" for Encoded (Trig Encoder)
55
5. Configure the "Encoding" tab parameters according to your "Encoding Setup" 6. If you selected "Scan Axis Only", connect the encoder in the "S" connector.
7. Press play ( scanner.
) and select appropriate layout. If you selected "Scan Axis Only", try moving your encoder/
8. Use the Encoder Wizard to easily configure your encoder step and granularity. 9. Refer to the Setting Up the Encoder section for additional details.
7.18
7.18.1
Managing Files
Using the Media Browser
The role of the media browser is to allow for local file management and file transfers Although it was made for keypad operation, mouse interaction provides a lot more productivity. The media browser is launched from the "Prefs" (it is only accessible when the device is in configuration/stop mode and with a file already loaded).
56
The following functions can be achieved: Copy (files or folders) Delete (files or folders) Move (files or folders) Create Folders Rename (files or folders)
Navigation Key
key to select the left-side menu, then use the click wheel (
) to navigate and select menu items.
key to select the file list (twice to select the second file list), then use the click wheel ( select the appropriate file.
) to navigate and
key to swap media. If you have an external key plugged in you can select the media displayed internal solid state drive ( ), or an external USB drive ( ).
to open the selected file.
57
File Types
File Extension .utcfg
Description Contains the entire configuration for an inspection (the probe, the wedge, the type of scan, the position of each cursor, the layout, the color palette to use). Contains everything a .utcfg file contains, plus all the recorded data. Reports created by veo use the PDF file format. Any other PDF file can also be displayed by the veo. Screen captures created by veo use the PNG image standard. (PNG: portable network graphics)
.utdata .pdf
.png
To copy files: Highlight the files from a file list using the navigation keys. Press VIEW and toggle to the "COPY TO" button. (or press F1) Press OK. You will be warned if the destination media is lacking space for full transfer. A progress bar will appear in foreground while data is being copied.
To move files: Highlight the files from a file list using the navigation keys.
58
Toggle to the "MOVE TO" button. (or press F2) Press OK. You will be warned if the destination media is lacking space for full transfer. A progress bar will appear in foreground while data is being moved.
To delete files or directories: Highlight the files from a list using the navigation keys. Toggle to the "DELETE" button that shows the arrow pointing towards your destination media. (or press F3) Press OK. You will be prompted to confirm the deletion. A progress bar will eventually show up while data is being deleted. If directories are in the selection, they will be deleted too, including their full content. You will be prompted for confirmation for each directory to delete.
To create a directory: Select the media list where you want to create the directory. Highlight something in the list. Toggle to the "CREATE DIR" button. Press OK. A pop-up will ask you to enter the new directory name. Punctuation and exotic characters will not be accepted.
To enter a directory: Select the media list. Use UP/DOWN keys to highlight the directory. Use RIGHT key to enter the directory. To back out in the parent directory, use LEFT key or go to the ".." file item.
Defining Scan Plan Geometry (Cartesian/Axis Reference System)
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The "Geometry" tab defines the "Scan Plan". The parameters of this menu define the location of each probe/wedge on the part to be scanned. To accurately define a "scan plan", the following information is critical.
As required by many codes, the position of the probe relative to the weld needs to be known and recorded. This is done in the Geometry tab where the probes/wedges positions on the part are defined. The Index and Scan Offset allow you to translate the probe/wedge while the Rotation parameter to rotate it around the reference point.
Tip: Set Rotation to 90 and 270 to have two probes facing each other.
Probes rotated at 90 and 270 degrees relative to the scanning axis.
In a multi-probe scenario, the probes/wedges are defined relative to a Group Reference mark as a green dot on the plan view. The Group Reference point can be positioned anywhere, but a good practice is to position it aligned with the weld center line and the probe/wedge center. Once the "Group Reference ( ) point has been defined, the last step is to properly define the reference system in
relation to the "Part Datum"( ), an arbitrary point on the piece under test. All ultrasonic data collected shall be traceable to this reference point called datum, the (0,0) reference. When possible, it is recommended to superpose the "Group Reference" point and the datum when using simple scan patterns. Otherwise, the items Enc. Area can be use to move the Group Reference.
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8.1
Wedge References
) is different for each type of wedge or probe (when no wedge is used): Reference probe without wedge Reference point on the probe's active surface center Drawing
The "wedge reference" ( Probe Type Phased Array
probe with a flat wedge
Reference point on wedge's contact surface center
probe with an angular wedge
Reference point on center of wedge front edge
Conventional UT probe with or without wedge
Reference point on beam exit point
8.2
Group Reference
An inspection setup can involve multiple probes. These probes are located in reference to a "Group Reference" ( ) point. The Group Reference point can be positioned anywhere on the probe retention system, but a good practice is to position it aligned with the weld center line and the probe/wedge center.
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8.3
Part Datum
Once the "Group Reference" point has been defined, the last step is to properly define the reference system in relation to the "Part Datum"( ), an arbitrary point on the piece under test. All ultrasonic data collected shall be traceable to this reference point called datum, the (0,0) reference. When possible, it is recommended to superpose the "Group Reference" point and the datum when using simple scan patterns. Otherwise, the user can define an offset using the "Encoder:Scan Start Position".
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9
9.1
Calibration Wizards
Available Calibrations
Once the Sonatest veo 16:64 is in "Acquisition Mode" (the "PLAY" button having been pressed), the "Calibration" tab allows access to calibration wizards. The items in this menu are sorted in the order that calibrations should be performed. If you are using a multi-scan setup, each scan must be calibrated independently.
Calibration wizards available from the "Calibration" tab.
Wizard Description and Applicability to each Scan Type

Scan Type Wizard Type Wizard Description Conventional PA UT Element Check Wizard... Velocity and Zero Wizard... Wedge Delay Wizard... Sensitivity/ACG Wizard... Guides you in a step by step fashion to calibrate the probe and find defective elements. Only applicable in Phased Array. Guides you in a step by step fashion to calibrate your material velocity and Zero point. TOFD
Guides you in a step by step fashion to calibrate your Wedge Delay (compensates for w edge w ear).
**
Guides you in a step by step fashion to calibrate your sensitivity (also know n as ACG: Angular Corrected Gain).
Calibration Wizards
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TCG/DAC/DGS Wizard... Encoder Wizard...
Guides you in a step by step fashion to calibrate your TCG, DAC or DGS curves (Time Corrected Gain / Distance Amplitude Correction / Distance Gain Sizing). Guides you in a step by step fashion to calibrate the encoder resolution.
TCG/DAC
* It is not achieved within a wizard, it is done by calibrating the non-linear ruler ("Scan:LW Offset" and "Scan:BW Offset" parameters). ** Not applicable, achieved by "Velocity and Zero Wizard..."
Phased Array, Wedge and Reference Type Applicability

Wedge None Flat Angular
Phased Array Wizard Type
Radius Reference (IIW) Element Check Wizard... SDH Reference (IIW, Navship) SDH Reference (IIW, Navship) Thickness Reference Thickness Reference Notch Reference SDH Reference (IIW, Navship)
Radius Reference (IIW) Velocity and Zero Wizard... SDH Reference (IIW, Navship) Thickness Reference SDH Reference (IIW, Navship) SDH Reference (IIW, Navship) Thickness Reference Notch Reference
Radius Reference (IIW) Wedge Delay Wizard... Not Applicable SDH Reference (IIW, Navship) SDH Reference (IIW, Navship) Thickness Reference Notch Reference
Radius Reference (IIW) Sensitivity/ACG SDH Reference (IIW, Navship) Wizard... Notch Reference SDH Reference (IIW, Navship) SDH Reference (IIW, Navship)
Radius Reference (IIW) TCG/DAC/DGS Wizard... SDH Reference (IIW, Navship) Thickness Reference SDH Reference (IIW, Navship) SDH Reference (IIW, Navship) Thickness Reference Notch Reference
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Conventional UT (Mono), Wedge and Reference Type Applicability

Wedge None Flat Angular
Conventional UT Wizard Type
Element Check Not Applicable Wizard... Not Applicable Not Applicable
Radius Reference (IIW) Velocity and Zero Wizard... SDH Reference (IIW, Navship) Thickness Reference SDH Reference (IIW, Navship) SDH Reference (IIW, Navship) Thickness Reference Notch Reference
Wedge Delay Not Applicable Wizard... Sensitivity/ACG Not Applicable Wizard... Not Applicable Not Applicable Not Applicable Not Applicable
Radius Reference (IIW) TCG/DAC/DGS Wizard... SDH Reference (IIW, Navship) Thickness Reference SDH Reference (IIW, Navship) SDH Reference (IIW, Navship) Thickness Reference Notch Reference
9.2
Element Activation Wizard
The Element Activation Wizard is a single step wizard that quickly ensures that each element of the array is working properly. It is only applicable in Phased Array. The wizard automatically configures a linear scan at 0 degree consisting of one element activated individually and stepped along the array. Elements can be individually activated or deactivated.
Applicability
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Scan Type Conventional PA UT TOFD
Wedge Type
None
Flat
Angular
SDH Reference (IIW, Navship) Thickness Reference
Radius Reference (IIW) SDH Reference (IIW, Navship)
Prior to starting
Verify the following parameters: Probe: Frequency, Pulse Width and Number of Elements
Steps
Step Description and Tips Select the probe. Set your "Gain", "Start Path" and "Range Path" to see an echo response from the reflector. Select each element and deactivate defective or unw anted elements. Press "Accept" (last menu item) or F3 w hen completed.
Step Nam e Element Activation/ Deactivation
Screenshot
Tip A defective element will show up with a very weak response or no signal at all.
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9.3
Velocity and Zero Wizard
In most cases, the first wizard to start with is the Velocity and Zero Wizard. The velocity wizard shall be used when the velocity is unknown. Otherwise, the velocity can be entered manually in the Part tab. The Velocity and Zero wizard calibrate your material velocity and set the probe zero. Applicable in Phased Array and Conventional UT (not applicable for TOFD).
Applicability
Scan Type Conventional PA UT 2 Radius Reference (IIW) * 2 SDH Reference (IIW, Navship) 2 Thickness Reference 2 SDH Reference (IIW, Navship) 2 Thickness Reference 2 Notch Reference 2 SDH Reference (IIW, Navship) TOFD None Flat Angular Wedge Type
* It is not achieved within a wizard, it is done by calibrating the non-linear ruler ("Scan:LW Offset" and "Scan:BW Offset" parameters).
Prior to starting
Verify the following parameters: Inspection: Probe: Wedge: PA Voltage or Mono Voltage Frequency, Pulse Width and Elements All Geometry
Scan: Focalisation, Focal Distance, Wave Mode, PRF, Sub-Sampling, Smoothing, Filter, Signal Rectification, TX and RX Elements
If one of the above parameters is changed after calibration, it will invalidate the calibration. It is important to ensure the velocity is calibrated on a test block of the same material of the part to be inspected.
Steps Step Description and Screenshot Tips
Step Name
Scan Selection Select the Scan to
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calibrate. This step is automatically skipped if the setup has only one scan. Reflectors Selection Select the type of reflectors or references used to calibrate.
Tip: Ideally, choose a block w ith reflectors that require no or little probe movement.
Reflectors Position
According to the selected reflectors, set the distance at w hich they are actually located in the block.
Tip: Choose reflectors that have a greater gap betw een them to obtain more accurate results.
Scan Settings
To improve detection of your reflectors, it is possible to modify scan parameters (angle, path, gain...), only for the w izard duration. Especially make sure that the Range Path is long enough to detect both reflectors.
Tip: Typically, the middle angle is chosen to
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Reflector 1
calibrate the velocity. The gate is automatically positioned by the softw are, but may be adjusted manually if required. Maximize the reflector signal in the gate (w e recommend over 80%, but any peak amplitude w ill be considered).
Tips : The gate can be set w ith the menu parameter or by pressing the "gate" button on the keypad and using click w heel to move freely. Best results w ill be obtained by using reflectors that w ould avoid the need to move the probe betw een reflectors (Thickness or Radius on IIW type 2 block). The w orst case is to use 2 SDH and add couplant before scanning each reflector. Reflector 2 Set gate settings. Maximize the reflector signal in the gate (w e recommend over 80%, but any peak amplitude w ill be considered).
Tip: Properly maximizing the indication is crucial for accurate results.
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Validate Result
The last step of the velocity calibration w izard is to validate the calculated velocity.
If the calculated velocity doesnt correspond to the expected value, go back to the Reflector 1 step.
9.4
Wedge Delay Wizard
The Wedge Delay wizard aims to compensate for the sound path variation in the wedge. The calibration ensures that indications are displayed at the right depth.
Applicability
Scan Type Conventional PA UT Radius Reference (IIW) Not Applicable ** SDH Reference (IIW, Navship) Thickness Reference Notch Reference SDH Reference (IIW, Navship) TOFD None Flat Angular Wedge Type
Prior to Starting
Verify the following parameters: Inspection: Probe: PA Voltage or Mono Voltage Frequency, Pulse Width and Elements
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Wedge:

All Geometry
Scan: Focalisation, Focal Distance, Start Angle, Stop Angle, Wave Mode, PRF, Sub-Sampling, Smoothing, Filter, Signal Rectification, TX and RX Elements
If one of the above parameters is changed after calibration, it will invalidate the calibration.
Steps Step Description and Screenshot Tips
Step Name
Select the Scan to Scan Selection calibrate. This step is automatically skipped if the setup has only one scan. Reference Type Select the appropriate target for the calibration.
To improve detection of Scan Settings your reflectors, it is possible to modify scan parameters (angle, path, gain...), only for the w izard duration.
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Box Position
Configure the box settings to encompass the reflector. (This is the region w here your indication is located in the scan)
Set "Box Start Depth" setting. Set "Box Range Depth" setting.
Tip: The box location can be changed w ith menu parameters or by pressing the "extractor" on the keypad and using click w heel to move it freely. Reference and The reference is the Tolerance targeted sound path or depth of the selected reflector. Represented as a dashed green line.
The tolerance is the acceptable distance deviation from the reference level. A tolerance of 1mm means 1mm. Represented as a continuous green line.
Set "Reference Depth" (controls the dashed green line in the bottom view ) Set "Tolerance Depth" (controls the continuous green line in the bottom view ) Calibration Move your probe back Image 1 and forth to sw ipe your reflector (and only your reflector) in the box. The reflector must pass through all angles. You can press
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"Reset Envelope" if any spurious indications are present. Press "Apply" w hen you have a nice and smooth red curve in the bottom view (see "image 1"). Verify calibration by moving your probe back and forth once again. The red curve should now be w ithin tolerance (see "Image 2"). If it is not w ithin tolerance, you can press "Apply" again to Image 2 re-correct, or press "Reset" and restart from start. Press "Accept" once you are satisfied of the calibration.
Tip: You can check the w edge delay calibration by setting a cursor at the depth of the target and move the probe over the it. The indication should appear at a constant depth follow ing the horizontal cursor for all angles.
9.5
Sensitivity/ACG Wizard
The Sensitivity Wizard aims to compensate for the sound attenuation due to the wedge and the angle variation in the S-scan. The calibration ensures a uniform amplitude response for each focal law for a given reflector. Also known as ACG: Angular Corrected Gain.
Applicability
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Wedge Type
None
Flat
Angular
Radius Reference (IIW) SDH Reference (IIW, Navship) SDH Reference (IIW, Navship) SDH Reference (IIW, Navship)
Notch Reference
Prior Starting
Verify the following parameters: Inspection: Probe: Wedge: PA Voltage or Mono Voltage Frequency, Pulse Width and Element Characteristics All Geometry
Scan: Focalization, Focal Distance, Start Angle, Stop Angle, Wave Mode, PRF, Sub-Sampling, Smoothing, Filter, Signal Rectification, TX and RX Elements
If one of the above parameters is changed after calibration, it will invalidate calibration.
Steps
Step Description and Tips Select the Scan to Scan Selection calibrate. This step is automatically skipped if the setup has only one scan. Step Nam e
Screenshot
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Reference Type
Select the appropriate target for the calibration.
Tip: For an L-scan, a SDH is suitable enough. With S-scans, a radius offers a constant path w hich ensures that the compensation corrects only w edge attenuation and echotransmittance effects. How ever, a SDH is a better target for compensating the effect of beam spread. Scan Settings The same settings than those used for the w edge delay w izard shall be used at this stage.
Box Position
Position the box to encompass the reflector.
Set "Box Start Depth" setting. Set "Box Range Depth" setting.
Tip: Move the probe back and forth and adjust the box accordingly. Make sure that all angles/focal law s have to be covered. The box location can
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75
be changed w ith menu parameters or by pressing the "extractor" on the keypad and using click w heel to move it freely. Reference and The reference is the Tolerance target amplitude level w hile the tolerance is the accepted deviation from the tolerance.
Set "Reference Amplitude" (it controls the dashed green line in the bottom view ). Set "Amplitude Tolerance" (it controls the continuous green line in the bottom view ).
Tip: Set the gain so that the amplitude level is below 100% for every focal law . Calibration Move your probe back Image 1 and forth to sw ipe your reflector (and only your reflector) in the box. The reflector must be sw iped over every scan angle (or focal law s). You can press "Reset Envelope" if you are not satisfied w ith your probe manipulation. Press "Apply" w hen you have a nice, smooth red curve in the bottom view (see "image 1"). Verify the calibration by moving your probe back and forth once Image 2 again. The red curves should now be w ithin tolerance (see "Image 2"). If it is not w ithin tolerance, you can
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press "Apply" again to re-correct, or press "Reset" and restart from start. Press "Accept" once satisfied of the calibration.
Tip: Even if your configuration is out of tolerance, you may press "Accept". The softw are w ill modify the tolerance parameter automatically to make it Image 3 fit (see "Image 3").
9.6 TCG
TCG/DAC/DGS Wizard
The TCG (Time Corrected Gain) wizard aims to equalize the amplitude level of a given reflector size along the sound path.
Applicability
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Wedge Type
None
Flat
Angular
SDH Reference (IIW, Navship) Notch Reference
It is generally recommended to use SDH reference spaced apart from each other, spread over the range over a range of depth representative of the part to be inspected.
Prior to Starting
Verify the following parameters: Inspection: Probe: Wedge: PA Voltage or Mono Voltage Frequency,Pulse Width and Elements Caracterisation All Geometry
Scan: Focalization, Focal Distance, Start Angle, Stop Angle, Start Path, Range Path, Wave Mode, PRF, Sub-Sampling, Smoothing, Filter, Signal Rectification, TX and RX Elements
If one of the above parameters is changed after calibration, it will invalidate calibration.
Steps (TCG)
Step Description and Tips Select the Scan to Scan Selection calibrate. This step is automatically skipped if the setup has only one scan. Step Nam e
Screenshot
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Select curves Select the type of type assessment technique: TCG DAC DGS
TCG: Set Gain References
Select the "angle" of the A-Scan extractor. Set the "Target Amplitude" w hich w ill be the reference level for all TCG points. The "Amplitude Tolerance" is the acceptable deviation from the Target Amplitude. Select the Angle to build the TCG curve. Determine if you can use the follow gate feature. It is useful, but if you encounter unw anted echo in your a-scan you may have to disable the feature to move your gate manually (once you have set "Gate Follow Peak" to "No", it is necessary to press the "gate" button on the keypad to select the gate and move it w ith the click w heel). Set the "gain" to get a signal at the Target Amplitude.
Time Based Correction (Calibrate)
For each reflector: Start w ith the reflector w ith the highest
Image 1
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amplitude. Maximize the Amplitude by moving the probe on the part. Make sure the right signal crosses the gate. Press "Add TCG Point at Gate", to add points. You can press this button as many times as needed to re-adjust existing points. Move the probe to the next reflector, and restart to step 2. Once done w ith all reflectors, press "F3" to end calibration or to select another angle (focal law ) to calibrate
Image 2
Tips: Avoid to add couplant in betw een each reflector (it increases variability of the results) If "Multi-Beam" is enabled, the Sonatest veo 16:64 interpolates TCG amplitude and depth points for focal law s betw een the angles that have been calibrated. This speeds up the calibration process. If the gate doesnt lock on the right peak, the Level can be increased or the Gate Follow Peak disabled.
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Verify Correction
Once all TCG points have been created, you can verify if the amplitude of each reflectors falls w ithin the tolerance. Verify calibration by: Sw eeping each reflector to verify they now have a similar amplitude. Each "Angle" can be verified in this step.
Tips: If a TCG point is out of tolerance you can adjust it by pressing F2 to come back at the previous step and then press Add TCG Point at Gate again. The amplitude w ill be adjusted. Point can also be adjusted manually. Press the "VIEW" key to access the A-scan view . Select a TCG point by pressing "OK". Amplitude correction of this point can be adjusted by using up and dow n arrow s.
DGS
The DGS method (sometimes referred to as AVG) is a theoretical sizing technique which uses attenuation curves to size disk shaped reflector defects in materials. The standard measure of defects is ERS, Equivalent Reflector Size, meaning that the sized defect is equivalent in size to a reference reflector of the specified size.
Applicability
Scan Type PA Conventi TOFD onal Wedge Type None Flat Angular
Flat Bottom Hole (FBH)
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Side Drilled Hole (SDH) Spherical Shaped Hole (SSH) Backw all Echo (BWE)
Side Drilled Hole (SDH) Spherical Shaped Hole (SSH) Backw all Echo (BWE)
Side Drilled Hole (SDH) Spherical Shaped Hole (SSH) Backw all Echo (BWE) Radius
Prior To Starting The probe and inspection system must be correctly calibrated before beginning this wizard.
Verify the following parameters: Inspection: Probe: Wedge: Part: Mono Voltage Frequency Type, Refracted Angle (If Angular), Wedge Velocity LW (If flat or angular) Thickness, Velocity LW, Velocity SW
Scan: Start Path, Range Path, Delay Offset, Wave Mode, PRF, Sub-Sampling, Smoothing, Filter, Signal Rectification, TX and RX Elements
If any of the above parameters are changed after calibration, it will invalidate the calibration.
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Steps ( DGS)
Step Nam e Scan Selection Step Description and Tips Select w hich scan to calibrate.
Screen shot
This step is skipped if the setup has only one scan.
Select Select the type of Curve Type assessment technique: TCG DAC DGS
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Set Probe Parameters
Set the probe Near Field Length (NFL) parameter. This value can usually be found in the probe data sheet. Otherw ise, NFL is calculated using the follow ing equation:
N = (D^2)*f / 4*v
Where N = Near Field Length D = Element Diameter f = Frequency v = Material Sound Velocity
Check the probe frequency and PED (Probe Effective Diameter) are correct. Set Reference Parameters The test block velocity is automatically set to the velocity specified in the Part menu based on the Wave Mode parameter in the Scan menu. It should be checked and adjusted here if necessary.
The Reference Type and Reference Size should be set. Note; if the Reference Type is set to Back Wall the Reference Size parameter is removed.
The Delta Vk parameter should be set if calibrating using an angle probe and a radius reference.
The ERS value
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specifies the size of defect that should be reported as such, is the reporting level. The ERS value can be adjusted during inspection from the Scan menu.
The TB Attenuation parameter can be set to correct for attenuation in the test block.
Collect DGS Move the probe and Reference maximise the signal from Point the chosen reference reflector.
Adjust the gain so that the chosen reference reflector is set to 90% FSH. Note; the reference echo can be betw een 88% and 92%. Press Add DGS Point at Gate.
A message w ill be displayed indicating w hether the reference echo has been accepted.
Note; if the reference echo is not accepted, check the calibration and previous steps to ensure all values are correct.
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Set subDGS curves
Select the number of sub-DGS curves to be displayed.
Select the tolerance for each sub-DGS curve in the chosen units (Percent or dB).
Validation
The calibration is now complete. Press F3 to validate, construct and draw the DGS curve(s).
Selecting Go to the Inspection Measureme menu and select from nts the list of measurements available.
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9.7
Encoder Wizard
Applicability
Prior Starting
Verify the following parameters: Encoder: All Parameters settings (except: "Scan Encoder Resolution")
Steps
Step Description and Tips
Step Nam e
Screenshot
Axis Selection Select the Axis to calibrate. This step is skipped if the setup has a one axis encoder. Axis Move Setup your encoder on a 30cm/12 inches surface. Press "Reset Position". Move your encoder by 30cm/12 inches, as precisely as possible. Press "F3".
Result
The number of ticks/mm (or ticks/inch) is show n.
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9.8
Distance-Amplitude Curves (DAC)
The DAC curve acts as an alarm threshold level for the gate where the level varies to match the attenuation and field characteristics of the transducer and test material combination. When properly established, the DAC curve will provide consistent alarming from discontinuities of equal relative size at different depths in the test piece.
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10
Creating Defect Reports

key. Select "Report" or "Screen Capture" (refer to loading and
To produce a screenshot or a report, press the saving file section).
10.1
Creating and Customizing Reports
The veo is capable of producing defect reports. These report are produced in PDF format (see www.adobe.com to get a free reader).
To produce a report: 1. Press the 2. Select "Report" 3. Select the "media (internal solid state drive or external USB key) by pressing F3 4. Type report file name 5. Press OK key.
Note: The report can be produce from configuration (stop mode) or in acquisition (play mode).
To customize the desired section in the report:
1. Press MENU key 2. Move to INSPECTION tab using the click wheel and select the "Report..." item 3. Press OK 4. Configure as desired the section required for your needs:
Report Type (short or long) Cursor Info (yes or no) Prove Info (yes or no) Wedge Info (yes or no) Scan Info (yes or no) Encoder Info (yes or no) DAC Info (yes or no) DGS Info (yes or no)
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Below an example of the a long menu (with all sections enabled). The short menu would present only the items presented on first page.
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11
Data File Analysis
You can review all recorded files directly on the unit. Press and select your file. Remember that data file have a .utdata extension. Once the file loaded, it will be displayed in stop mode with most items grayed to ensure data integrity.
Tip: If a large amount of files are available, use the filter to only display data file.
By pressing
youll be able to look at the recorded data. There is various ways to look at the data. You can use to access it and then you use the arrows.
the scroll bar located at the bottom of the views. Press
Otherwise, you can choose a layout that includes a view showing the scan axis. Moving the extractor will allow you to look at each recorded point.
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12
Menus
The following section describes in detail each of the sidebar menu parameters.
12.1
Inspection Menu
This menu is where the inspection is defined. The INSPECTION menu is the recommended starting point, since the main inspection settings are located there.
12.1.1
Probe Qty
The total number of probes you are using, counting both phased array and conventional probes. Phased Array You can use up to two (2) phased array probes simultaneously. Conventional You can use up to four (4) conventional probes simultaneously. The instrument allows to plug two (2) probes TX and two (2) probes RX.
The probe tab header always shows the current number of probes.
12.1.2
Scan Qty
The number of simultaneous scans desired, for both phased array and conventional probes. The total number of simultaneous scans cannot exceed three (3). Phased Array You can configure a maximum of two (2) phased array scans. Phased array scans can be sectorial scan (S-scan) or linear scan (L-scan), in pulse-echo (PE) or pitch and catch (P&C) mode. Conventional You can configure up to two (2) conventional scans. Conventional scans can be pulse-echo mono-element (A-scan), pitch and catch mono-element (A-scan) or TOFD scan (Time of Flight Diffraction).
The scan tab header always shows the current number of scans.
12.1.3
Select Layout
Shows the Layout selection menu for real-time views. The layouts available at a given time vary according to the number and the types of scans selected. When these parameters change, an appropriate layout is always selected automatically.
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Figure 1: Exam ple of layout selection w ith a S-scan and a L-scan
12.1.4
Select Measures
Shows a selection of measures to be displayed in the Measurement Bar. Up to six (6) different measurents can be displayed at once. As illustrated below, each cursor and gate is identified with a letter and a numerical identifier. For example, G1^% stands for Gate 1 Peak (^) amplitude in percentage (%).
Figure 2: Exam ple of m easures available
ID A C F G H SQ AB DAC
Cursor Type Angular/Extractor Cartesian Frame Extractor (encoded views) Gate Hyperbolic (TOFD) Square Box Angular Box Distance Amplitude Curve
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Ref ^ / Start Stop

Reference Point Peak (or point) Flank Start point of a gate End point of a gate
Meas %FSH %REF
Measurement Type Amplitude in Percent Amplitude Reference to the Curve (DAC or DGS) Depth (from the part surface) Sound Path (from exit point) Surface Distance (from wedge reference)
iRating
Indication Rating (d), as per AWS with a 80% reference.
The list of available measures varies depending on the cursors and gates currently being displayed.
12.1.5
Report
Pressing the Report button opens the Report Options Tab. From there, report options can be configured, and the report can be generated as a PDF file.
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Figure 3: Report options
12.1.5.1
Report Options
12.1.5.1.1 Produce Report
Generates a report with the settings specified in the report options tab.
12.1.5.1.2 Report Type
Either Short or Long. The Short report only generates the very first page of the report, while the Long report is spread on multiple pages and contains a plethora of information.
12.1.5.1.3 Cursors Info
Insert cursor positions details in the Report.
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12.1.5.1.4 Inspection Info
Insert Inspection details in the report.

12.1.5.1.5 Probe Info
Insert Probe configuration details in the report.

12.1.5.1.6 Wedge Info
Insert Wedge configuration details in the report.

12.1.5.1.7 Scan Info
Insert Scan information details in the report.

12.1.5.1.8 Encoder Info
Insert Encoder configuration details in the report.

12.1.5.1.9 DAC Info
Insert DAC (Distance Amplitude Curve) details in the report (if DACs are enabled).
12.1.6
Voltage PA Mono
To set the voltage of the Phased Array (PA) pulsers or Mono Element pulsers. All phased array channels use the same high-voltage generator, therefore the same voltage is applied to all phased array scans. The same rule applies for mono-element channels, only one voltage can be used at a time. Voltage PA Ranges from 50 to 100 Volts and can be modified by steps of 10 Volts. A negative square-wave pulser is used. Voltage Mono Ranges from 100 to 400 Volts and can be modified by steps of 10 Volts. A negative square-wave pulser is used. A higher voltage value allows deeper sound penetration into the material but increases power consumption and reduces battery life. It is important to make sure that the transducer being used supports the applied voltage. We encourage you to read the transducer data sheet before using a voltage higher than 100V.
12.1.7
Acquisition Frequency
The acquisition frequency for phased array and conventional UT scans. The device samples the ultrasound echo signals at up to 100 MHz for phased array and up to 200MHz for conventional UT. This parameter applies to all scans. Therefore, with a 200MHz configuration, only conventional UT scans can be used. Possible values are 50MHz, 100MHz and 200MHz (for conventional UT only). Changing the Acquisition Frequency value affects the number of samples acquired for one waveform (A-scan). For example, changing from 50 MHz to 100 MHz will double the number of samples acquired. To record scans with long beam paths, use sub-sampling to limit the amount of data transferred or to respect the maximum number of
Menus
samples allowed.
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As a rule of thumb, the acquisition frequency must be at least four (4) times greater than the nominal frequency of the probe. For example, an Acquisition Frequency of 50MHz is appropriate for a probe with a nominal frequency centered at 5MHz.
12.1.8
Max Frame Rate
To limit the frame rate to a certain maximal threshold. It means that the number of frames displayed on the screen will not exceed that threshold. A frame is defined as one unique image displayed by the device. One frame includes all views displayed on the screen. Therefore, a Maximum Frame Rate of 25Hz means that a maximum of 25 images are generated every second. Note that this is independent of the acquisition rate.
12.1.9
Alarm
To select the condition triggering the alarm indicator (external LED on the unit case).
12.1.10 Lock Setup

The Lock Setup feature will grey out most parameters, thus preventing unintentional changes to the configuration file. Parameters used in a daily inspection routine, such the Gain, the Calibration Wizards, the Report creator and some preferences, are kept unlocked. At any time the setup can be unlocked by toggling Lock Setup from Yes to No.
12.1.11 Short Menu

When the Short Menu option is enabled, the number of available parameters is reduced to its minimum. This feature aims to simplify device operation by keeping only the most important parameters displayed in the user interface. The hidden parameters are automatically set by the unit. This option can be useful during training sessions.
12.1.12 Inspection Identifiers

To qualify and differentiate your files and reports, we recommend entry of the following information: Job/Customer Site Operator Name Qualification Procedure Reference Couplant Name
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This information must generally be included in the examination records, as per the inspection code.
12.2
Probe Menu
The PROBE menu controls the parameters of a connected probe. In multi-probe setups, you will have multiple PROBE menus, one for each probe.
12.2.1
Load Probe
To load a predefined Probe configuration from the probe database.
12.2.2
Probe Type
The type of probe plugged to the instrument. You can select amongst 1D linear phased array probes, square monoelement probes and round (circular) mono-element probes.
12.2.3
Probe Identifiers
To qualify and differentiate your files and reports, we recommend entry of the following information: Manufacturer name; Model number; Serial number. This information can be taken from the probe specifications document, or it can sometimes be found engraved on the probe casing itself. Example of SONATEST probe specifications document.
Figure 4 Probe specifications docum ent
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12.2.4
Frequency
The nominal frequency of the probe plugged to the instrument. It is the frequency at which the probe should be operated. The probe frequency is usually written on the probe case itself, and the value is in MHz (Mega Hertz).
Changing the probe frequency will define a new Pulse Width value. The default value of the Pulse Width (PW) is PW = 1000/2f where "f" is the nominal frequency in MHz and PW the pulse width in ns (nanoseconds). The Pulse Width value can still be adjusted afterwards.
12.2.5
Pulse Width
The pulse width calculation is based on the probe frequency. The pulse width is the duration of the pulse on transmission. The equation to calculate the pulse width is: 1000 _____ = TX pulse width 2f "f" being the probe frequency in MHz (megahertz). The result of the equation is in ns (nanoseconds).
Figure 5:Exam ple of pulse w idth for a negative square pulse
For a phased array probe, we recommend using the default value, which is automatically calculated using the formula shown above.
12.2.6
Connected to (Mono only)
This parameter allows to select the physical connector your probe is plugged to. For example, one would select Ch A TX/RX when using a pulse-echo technique with a mono element probe plugged to the TX/RX connector of channel A. With phased array probes, the connector cannot be changed.
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Connector Name PA Ch A TX/RX

Description
Phased Array connector for Pulse-Echo and/or Pitch & Catch setups using phased array probe(s) Channel A connector. Complete transmitter-receiver for Pulse-Echo, Pitch & Catch and TOFD setups using mono-element probe.
Ch A RX
Channel A connector. Receiver only, used for Pitch & Catch and TOFD setups using mono-element probe.
Ch B TX/RX
Channel B connector. Complete transmitter-receiver for Pulse-Echo, Pitch & Catch and TOFD setups using mono-element probe.
Ch B RX
Channel B connector. Receiver only, used for Pitch & Catch and TOFD setups using mono-element probe.
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12.2.7
First Element Pin # (PA only)
To specify to which pin of the phased array connector is connected the element #1 of your phased array probe. This parameter is only available if at least two phased array probes are used. By default, the element #1 is connected to the channel #1 of the PA connector when only one phased array probe is used. You may need to change this parameter if you use Y-splitter, a Dual adaptor cable, or one of the other possible configurations described below. Since the Sonatest veo 16:64 has 16 active channels, it means that only pins 1 through 16 are linked to pulserreceiver circuits. This is why we use the term "channels 1 to 16" instead of "pins 1 to 16". Many different connectivity schemes can be used and are presented here.
ONE PROBE, ONE CONNECTOR The most typical usage is to connect a single probe that has only one connector. Elements 1 to 16 are connected to channels 1 to 16. First Element Pin # must therefore be set to 1 (default).
Figure 6 Type 1 DAAH Adaptor, Single Socket - Hypertronics
TWO PROBES, ONE CONNECTOR USING DUAL SOCKET DAAH ADAPTOR OR EUROPEAN PROBES In this scenario, two probes are linked to a single connector. This is the case with a Dual Socket DAAH Adaptor, where one PA connector can be connected to two DAAH heads. On each DAAH connector, the connectivity pattern is specified on the housing, as shown in the image below. For example, if channels 1 to 44 are connected with elements 1 to 44 of the first DAAH head and channels 45 to 88 are connected to elements 1 to 44 of the second DAAH head, then the First Element Pin# is set to 1 for Probe 1 and set to 45 for Probe 2. However, only pins 45 through 64 would be available for usage on a 16:64 device, corresponding to elements 1 to 20 of the second probe.
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Figure 7 Exam ple of pattern connectivity for a Type 1 DAAH Dual Adaptor
Figure 8 Type 1 Dual Socket DAAH Adaptor
Pitch-and-catch search units with an embedded wedge also feature one connector linking two probes. The search unit features two arrays, one for pulsing (TX) and one for receiving (RX), and both are sharing the same connector at the end. Also, they most likely share the same tubing or multi-coax cable. In that case, the channels are split into two banks: pulsing and receiving. Usually, pulsing elements 1 to 8 are connected to channels 1 to 8, and receiving elements 1 to 8 are connected to channels 9 to 16. Thus, First Element Pin # would be set to 1 for the pulsing elements (probe 1) and set to 9 for the receiving elements (probe 2).
TWO PROBES, TWO CONNECTORS, USING Y-SPLITTER As with the last scheme, a search unit may include two arrays: one for pulsing and one for receiving. They are sometimes identified by a TX(pulsing) cable and a RX(receiving) cable. Probes from Germany (IntelligeNDT, IZfP, BAM, etc.) may feature the letter S for "Sende" (TX) and the letter E for "Empfnger" (RX). Since the Sonatest veo 16:64
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has only one PA connector, a Y-splitter adaptor is required. The Y-splitter has two I-PEX plug connectors in order to accept two probes, and merges the signals into one receptacle connector plugged in the Sonatest veo 16:64. Similarly to the preceding example, the Y-splitter connectivity pattern must be known for proper operation.
CUSTOM CONNECTIVITY In order to use different connectivity patterns from the ones described in this document, it is strongly recommended to contact Sonatest since it may cause severe damage to the instrument.
NOTE ABOUT THE PHASED ARRAY CONNECTOR The Sonatest veo 16:64 features a minidock plug from I-PEX to connect phased array probes. This connector has a total of 160 pins. Custom probe adaptors are also available for other types of connectors such as Hypertronics, TCZIF, ITT Cannon DL5, etc. Contact Sonatest for details.
Figure 9 Minidock Receptacle
When using more than one probe, the probe tab header always shows the current number of probes. Make sure to properly configure the different parameters for each probe. When using two probes, you will most likely use two scans in pulse-echo mode, or a single scan in Pitch and Catch mode. Make sure the scan parameters are also configured accordingly.
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12.2.8
Nb Elmt Dim1 Dim2 (PA only)
These parameters refer to the number of elements disposed along dimension 1 (X-axis) or dimension 2 (Y-axis).
Figure 10: Nb Elm t Dim 1 and Dim 2
DIMENSION 1 DIMENSION 2
Dimension 1 and 2 refer to the two axes of the probe surface. For a linear (1D) or a 2D matrix probe, dimension 1 is preferred for the X axis, and dimension 2 for the Y axis. Other manufacturers refer to these as primary and secondary axis. We avoid using the X and Y terms because when the probe is rotated (i.e. 90 degrees), the elements along the 1st dimension will be aligned with another axis (i.e. Y). Using dimension 1 and 2 is less confusing.
12.2.9
Elmt Size Dim1 Dim2
These parameters refer to the size of individual elements along a dimension, either dimension 1 (X-axis) or dimension 2 (Y-axis). For round probes, the Diameter parameter replaces both dimension 1 and dimension 2.
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Figure 11: Elem ent Size Dim ension 1 and Elem ent Size Dim ension 2
12.2.10 Elmt Offset Dim1 Dim2

These parameters refer to the distance between the corner of the first element and the edge of the probe housing. These measures can usually be found in the manufacturer specification sheet.
Figure 12: Elem ent Offset Dim ension 1 and Elem ent Offset Dim ension 2
Along dimension 1 (X-axis): Element Offset Dim 1
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Along dimension 2 (Y-axis): Element Offset Dim 2 The first element is not located at the start of the epoxy (protective layer usually black). To locate the first element more precisely, we suggest the following formula if this information is not specified by the probe manufacturer. Please refer to the images below to identify each variable. For a 1D linear array probe Elmt Offset Dim 1 = (L - (number of elements Dim 1 * Elmt Pitch Dim 1)) / 2. Where L is the length of the probe casing. Elmt Offset Dim 2 = (Width of the probe - Elmt Size Dim 2) / 2. For a 2D linear array probe Elmt Offset Dim 2 = (Width of the probe - (number of elements Dim 2 * Elmt Pitch Dim 2)) / 2.
Figure 13: Length and Width of the probe
These parameters will change the representation in 3D View and may infer a misalignment of the probe and the wedge, or other distortion in positioning.
12.2.11 Elmt Pitch Dim1 Dim2 (PA only)

This parameter refers to the center-to-center distance from one element to the next, for either dimension 1 or dimension 2. The Element Pitch is usually engraved on the probe casing; otherwise refer to the probe specification sheet.
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Figure 14: Elem ent Pitch Dim ension 1 and Dim ension 2
1. Large values are unlikely because of the necessary wavelengths in NDE, and because of the beam deflection capabilities we want to maximize in phased array. 2. The pitch between elements affects the position of the center of each element, and therefore the focal laws will be affected.
12.2.12 Element Layout (PA only)

Element Layout refers to the position of element # 1 when attached to a wedge. Element #1 is the element where the first delay is triggered and its position is usually engraved on the probe casing. The available element layouts for 1D and 2D probes are listed below. For 1D array probe LR RR Left Row Right Row
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For 2D array probe BL ROW BR ROW TL ROW TR ROW BL COL BR COL TL COL TR COL Bottom Left Row Bottom Right Row Top Left Row Top Right Row Bottom Left Column Bottom Right Column Top Left Column Top Right Column
The proper Element Layout can be identified by looking at the probe from the reference point marked on the wedge by the element number one. The wedge front needs to be on the right hand side. Then, the top and bottom along with column and row arrangement can be identified.
Elem ent Layout Reference
1D Linear Array
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Left Row
Right Row
2D Matrix Array
Bottom Left Row
Bottom Right Row
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Top Left Row
Bottom Left Colum n
Top Left Colum n
Bottom Left Colum n
Bottom Right Colum n
Top Left Colum n
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12.2.13 Save Probe

To save the current Probe configuration in the probe database.
12.3
Wedge Menu
The WEDGE menu controls the parameters for the refracting wedge, in case you're using one. You will have multiple WEDGE menus, one for each probe you're using in your setup.
12.3.1
Load Wedge
To load a predefined Wedge configuration from the wedge database.
12.3.2
Wedge Type
The type of wedge used, if any. Choice is either Angular or Flat wedge. When no wedge is used, select "None".
Figure 15: Exam ple of angular w edge
Figure 16: Exam ple of flat w edge
12.3.3
Wedge Identifiers
To qualify and differentiate your files and reports, we recommend entry of the following information: Manufacturer name; Model number; Serial number.
This information can be taken from the probe or wedge specifications document, or is sometimes engraved on the wedge itself.
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12.3.4
Contact Surface
To select the proper wedge contact surface. If not a planar contact surface, various contoured shape are available for a curved surfaces such as pipes, tubes, nozzles, axles, billets, etc.
Planar
Axial Concave
Circumferential Concave
Axial Convex
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Circumference Convex
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12.3.5
Diameter
Refers to the wedge curvature diameter when a curved Contact Surface is selected.
Figure 17: Exam ple of w edge diam eter
The wedge must be contoured to the part diameter for an optimal coupling.
12.3.6
Back Height, Front Height, Height
These parameters define the back and front height of an angular wedge or the height of a flat wedge. The Back Height parameter is crucial in the exit points calculation. If you are using a special wedge, like a Snail wedge, you need to measure the Front Height where the slope stop.
With a flat wedge or a delay line, only the Height value is required.
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Figure 18: Back and front height for a standard w edge
Figure 19: Back and front height for a snail w edge
Figure 20: Height for a flat w edge or delay line
Make sure you select the proper wedge type before setting the height.
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12.3.7
Width, Length
Define the area of the wedge in contact with the inspection surface. If you are using a special wedge, like a snail wedge or a wedge with extra parts, you have to exclude these parts when you measure those values. See example below, the red part is not included in the length measurement.
Figure 21: Exam ple of w edge w idth and length
Figure 22: Exam ple of snail w edge w idth and length m easurem ent. Red part is excluded
Length value is crucial for the exit points calculation
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12.3.8
Cut Angle
Refers to the angle of the wedge. Unlike for conventional UT, where the refracted angle is usually used, phased array use the actual wedge angle.
Figure 23: Cut angle
12.3.9
Roof Angle
Refers to a complementary roof angle of the wedge. Wedges with roof angle are usually used with pitch-and-catch setups.
Figure 24: Roof Angle
Roof Angle is always measured from the lower corner. When a Roof Angle exists, the Back Height is measured from the same corner. Roof angles are rarely higher than 30.
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12.3.10 Probe Back Distance, Side Distance

Refer to the distance between the corner of the probe housing and the edge of the wedge.
Figure 25: Exam ple of Probe Back Distance and Probe Side Distance on an angle w edge.
Probe Back Distance is crucial for the exit points calculation
12.3.11 Probe Inset

Refers to the distance the transducer is recessed into the wedge. It is the actual depth of the hole inside the wedge.
Figure 26: Probe Inset
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12.3.12 Velocity LW
To set the longitudinal wave velocity in the wedge. The instrument uses this value in order to calculate the proper wedge refraction and delays. This information can be taken from the probe or wedge specifications document, often can be found engraved on the wedge itself or can be measured.
The following table is given as a reference. Material LW Velocity (mm/s) Water Rexolite (Cross linked polystyrene) Lucite Plexiglass Polystyrene Glycerine Source: - NDT Resource Center website - Port Plastics website 1.48 2.33 2.68 2.76 2.67 1.92 LW Velocity (in/s) 0.0583 0.0929 0.1055 0.1087 0.1051 0.0756
We STRONGLY recommend to measure the velocity of the materials you intend to use, both for the wedge and the part. The resulting delay laws are highly dependent on these velocities. Within a tolerance of 5%, your acoustic results should not be affected much.
12.3.13 Save Wedge

To save the current Wedge configuration in the wedge database.
12.4
Part Menu
The PART menu controls the parameters of the part you're inspecting.
12.4.1
Material
To select the type of material being inspected. When a material is selected from the list, its longitudinal and shear wave velocity are automatically set (when using one of the predefined materials). However, the default velocities can be adjusted manually or by using the Velocity Wizard to match your component more precisely.
If a custom material name is entered in the list, you will need to specify that material velocity manually.
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12.4.2
Part Identifiers
To qualify and differentiate your files and reports, we recommend entry of the following information: Component Name or Type Serial Number Location Reference This information must usually be included in the examination records.
12.4.3
Thickness
Defines the thickness of the component being inspected and displayed in the 3D view.
Figure 27: Thickness
When performing TOFD inspections, the thickness value is used to adjust the ruler properly. A wrong thickness value can lead to false measurements.
12.4.4
Velocity LW SW
The sound velocity of the material being inspected. A default value is attributed according to the selected material, but this value can be changed by overwriting it manually or by using the velocity calibration wizard. Material Longitudinal Velocity in/s mm/s Shear Velocity in/s mm/s
Aluminum AL 1100-0 AL 2014 AL 2024-T4 AL 2117-T4 Berylium Brass Bronze Cadmium Copper Glass (plate) Glycerine
0.249 0.250 0.249 0.014 0.256 0.508 0.173 0.139 0.109 0.183 0.227 0.076
6.32 6.35 6.32 6.38 6.50 12.90 4.39 3.53 2.77 4.66 5.77 1.93
0.123 0.122 0.121 0.124 0.123 0.35 0.083 0.088 0.059 0.089 0.135 -
3.13 3.10 3.07 3.16 3.12 8.88 2.12 2.23 1.50 2.26 3.43 -
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Gold Inconel Iron Iron, cast Lead Magnesium Nickel Silver Steel, 302 Steel, 347 Steel, 410 Steel, 1020 Steel, 1095 Titanium Zinc Zirconium

0.128 0.229 0.232 0.138 0.085 0.230 0.222 0.142 0.223 0.226 0.212 0.232 0.232 0.239 0.164 0.183 3.25 5.82 5.89 3.50 2.16 5.84 5.64 4.62 5.66 5.74 5.39 5.89 5.90 6.07 4.17 4.65 0.047 0.119 0.127 0.087 0.028 0.12 0.117 0.063 0.123 0.122 0.118 0.128 0.126 0.130 0.095 0.087 1.19 3.02 3.23 2.20 0.70 3.05 2.97 1.59 3.12 3.09 2.99 3.24 3.19 3.31 2.41 2.22
12.4.5
Cal Block Type
The calibration block used. It is not mandatory to use one of the predefined blocks, simply define a new one if it is not available in the list.
IIW-Type 1*
IIW-Type 2
Mini IIW-2
DC
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SC
DS
DSC
4-Step
5-Step
10-Step
Tipsy Step
Mini Resolution
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V1/5 (A2)
V2 (A4)
30 FBH Resolution Block
ASTM E317, Hori. & Verti. Lin.
ASTM E317, Resolution
AWS Resolution
Type MAB Mini Angle Beam
Navships Test
IOW Beam Profile
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*Images provided courtesy of PH Tool Reference Standards
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12.4.6
Cal Block Serial
The calibration block serial number.
12.4.7
Weld Type
The weld geometry being inspected. Single V: Left and Right side of weld are identical
Figure 28: Exam ple of single V w eld. Left and right side are identical.
Single V Asymmetric: Left and Right side of weld can be different.
Figure 29: Exam ple of single V w eld. Left and right side are different
Double V: Left and Right side of weld are identical. Bottom and top are different.
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Figure 30: Exam ple of double V w eld. Left and right side are identical. Bottom and top can be different.
Double V Asymmetric: Left and Right side of weld can be different. Bottom and top are different.
Figure 31: Exam ple of asym etrical double V w eld. Left and Right side of can be different. Bottom and top are different
Double V Mirror: Left and Right side of weld are identical. Bottom and top are identical.
Figure 32: Exam ple of double V m irror w eld. Left and right side are identical. Bottom and top can are identical.
Double V Mirror Asymmetric: Left and Right side of weld can be different. Bottom and top are identical.
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Figure 33: Exam ple of asym etric m irror double V w eld. Left and right side are different. Bottom and top are identical.
12.4.8
Weld Root Gap
The root gap distance of the weld.
Figure 34: Exam ple of root gap dim ension
12.4.9
Weld Bevel Width
A read only parameter indicating the total width of the top of the weld, and the bottom of the weld respectively.
Figure 35: Exam ple of root face height in a w eld
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12.4.10 Weld Root Face Left, Right

A read only parameter indicating the height of the root face on each side of the weld.
Figure 36: Exam ple of root face height in a w eld
12.4.11 Weld Widths

The width of the weld measured from the weld center.
Figure 37: Exam ple of w eld w idth m easurem ent
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12.4.12 Weld Angles

The bevel angles of the weld according to its geometry.
Figure 38: Exam ple of bevel angles on a w eld
12.4.13 Weld Heights

A read only parameter indicating the height at which the bevel starts inside the weld. The height is measured from top and bottom following the weld geometry.
Figure 39: Exam ple of bevel height m easurem ent
12.5
Scan Menu
The SCAN menu controls the parameters for the scan to be achieved. It's essentially controlling what ultrasound you want to generate and how the Data Acquisition (DAQ) will be performed.
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12.5.1
Scan Type
Allows to select among Sectorial, Linear, Mono or TOFD scan. Each scan is configured either in Pulse-Echo (PE) mode or Pitch-and-Catch (P&C) mode, except for TOFD scans which always are used in Pitch-and-Catch. Each type of scan is described below:
SECTORIAL SCAN The sectorial scan, also called azimuthal scan or more commonly S-scan, is a cross-sectional image of the inspected volume. It represents an angular coverage of the volume under the probe.
LINEAR SCAN The linear scan, commonly called L-scan, is represented on screen as a parallelogram view, directly under the probe or at a specific angle. The L-scan is generated by multiple A-scans at the same transmitted angle, but from different exit points. A small group of elements are activated to generate each beam (focal law), and the group of elements moves along the elements array for each subsequent beam.
MONO SCAN The mono scan refers to the conventional A-scan representation, using a single reception element. The A-scan is a waveform representing the amplitude of the ultrasound signal as a function of time or distance of propagation. Echoes become apparent as soon as reflectors occur on the travel path of the ultrasound wavefront. A reflector may be a defect, such as a crack, but most of the time you get echoes from bouncing waves on component geometry (i.e. weld root).
TOFD SCAN The Time-of-Flight-Diffraction (TOFD) scan involves a pitch-and-catch setup of conventional UT probes where data is generally displayed using a gray-scale B-scan.
When selecting Pitch and Catch mode, don't forget to define the TX (transmission) and RX (reception) probe with the Probe TX and Probe RX parameters. Because of the number of elements on phased array probes, it is also possible to do pitch and catch on a single probe by setting correctly the First and last active elements for TX and RX parameters.
12.5.2
Gain
The Gain parameter controls the actual gain, in decibels (dB), applied to the receivers. The Reference Gain is the actual reference level based on reflector responses. The value of the Reference Gain is automatically set to the current Gain when activating the "Set Ref Gain" button. For example, if Ref Gain is initially 0dB and Gain is 10dB, pressing "Set Ref Gain" changes the Ref Gain value to reflect the current Gain, i.e. 10dB.
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12.5.3
Focalisation
You can choose between three (3) types of focalisation. These define how the theoretical focal point will be moving, from one beam to another. For sectorial scanning, you can choose between Constant Path, Constant Depth or Constant Offset focalisations.
Constant PATH is always good to start with, to give a first try on your component;
Figure 40: Exam ple of constant path focalisation
Constant DEPTH is practical when you're tracking for defects in a cladding or at the internal diameter of a largediameter component;
Figure 41: Exam ple of constant depth focalisation
Constant OFFSET is useful for scanning the side-wall or center of a weld in an AWS or API code context.
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Figure 42: Exam ple of constant offset focalisation
In linear scanning, the only focalisation type available is Constant Depth focusing.
Figure 43: Exam ple of constant depth focalisation w ith a L-scan
In a LINEAR scan, a given number of elements are activated over the full array. With each new beam, an element is deactivated and another one is activated. This type of scan is also known as electronic scanning. The scanning always occurs at a constant angle and at a constant focal depth.
12.5.4
Focal Distance
The distance at which the focal point should be positioned, relative to a certain reference. Depending on your scan focalisation type, this parameter will be referenced as:
an ultrasound path relative to the index point, if it's a constant path scan.
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12.5.5
Resolution
Defines the angular step between each beam in the S-scan. An angular resolution of 0.5 means 0.5 separate each beam. The RESOLUTION will affect the size of the scans. Therefore, it will also affect acquisition speed, power consumption and recording file sizes.
12.5.6
Start, Stop Angle (S-Scan)
The Start Angle and Stop Angle define the pie shape of your S-scan. You can determine the shape by entering values from -90 to +90. For example, if the start angle is -45 and the stop angle +45, you will get a 90-degree scan pie.
The angles supplied are theoretical angles. When the resulting beams (focal laws) are programmed in a phased array system, the effective angles might be altered because of system delay resolution or velocity variation. The Start and Stop Angle will affect the size of the scans. Therefore, it will also affect the acquisition speed, the power consumption and the total size of the analysis file.
12.5.7
Angle (L-Scan)
The Angle defines the direction of focusing of your L-scan. It changes the shape of the parallelogram. The delays for each focal law will be adjusted to steer the resulting angle for each set of active elements.
The angles supplied are theoretical angles. When the resulting beams (focal laws) are programmed in a phased array system, the effective angles might be altered because of system delay resolution or velocity variation. Steering the Angle too far away from the 0 degree mark will result in weaker signals.
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12.5.8
Number of Active Elements (L-Scan)
This parameter refers to the number of active elements used when sweeping over the full array of a Linear scan (Lscan). The number of active elements used to form the ultrasound beam is also referred as the active aperture. The active aperture is then less than the full probe aperture, defined by the surface populated by all elements. A balance must be struck by applying the following rule of thumb: - Using more active elements creates a smaller focal spot and shorter depth of focus; - Using less active elements creates a longer but wider depth of focus. The Sonatest veo 16:64 can go up to 16 active elements for high volume resolutions that precisely map and size flaws, especially in conjunction with the SONATEST Wheel Probe. This parameter automatically affects how many beams will be created in the L-scan. The formula to calculate the number of beams is: - Nb of BEAMS = Nb of Elmts - Nb of Active Elmt + 1 For example, it could be: 32 elements - 8 active elements + 1 = 25 beams Using DOUBLE RESOLUTION will generate twice more beams with the half index point shift.
12.5.9
Start, Range, Stop Path
The Start Path and Range Path parameters define your sampling window. It tells the system when to start sampling your A-scans and for how long, for all beams in the scan. The Stop Path is a read-only parameter indicating where the acquisition path actually ends (simply the sum of Start Path and Range). Hence, a Start Path of 10mm with a Range of 60mm results in a Stop Path of 70mm. The Start Path and Range Path value can be represented either as a time (microseconds) or as a distance (millimeters or inches), depending on the Travel Mode selection. If the Travel Mode is "Full Path" or "Half Path", the value is displayed in mm or in. If the Travel Mode is "Full Time" or "Half Time", the value is displayed in microseconds.
12.5.10 Delay Offset

Additional delay added to the delay line for fine-grained adjustments.
12.5.11 Lateral Wave Offset (TOFD)

The offset, in s, from the start of the scan to the position of the lateral wave. This offset is always positive. Changing this parameters will move the green visual indicator in the associated A-scan. Both offsets are used to correct the position of the TOFD depth ruler.
12.5.12 Backwall Offset (TOFD)

The offset, in s, from the end of the scan to the position of the back wall. This offset is always negative. Changing this parameters will move the green visual indicator in the associated A-scan. Both offsets are used to correct the position of the TOFD depth ruler.
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12.5.13 Wave Mode

Specifies which wave mode will be generated in the inspected material: longitudinal waves (LW) or shear/transverse waves (SW). Selecting the proper wave mode is required in order to calculate the proper refraction, attenuation and delays. The velocity used by this scan will be the LW Velocity or SW Velocity that was entered in the PART menu.
12.5.14 Travel Mode

This parameter refers to the ultrasonic wave travel mode. It affects all measurements made for this scan. The possible types of measurements are:
Full Path: Round-trip distance (mm or in) Half Path: One-way distance (mm or in) Full Time: Round-trip time (s) Half Time: One-way time (s)
The travel mode changes how the Start Path and Range Path values are measured. When the Travel Mode is Full Path or Half Path, the Path values will be measured as a distance. When the Travel Mode is Full Time or Half Time, the Path values will be measured as a time delay. To switch between millimeters and inches, change the global Unit System parameter in Preferences.
12.5.15 PRF
The pulse repetition frequency (PRF) is also called the firing rate. It refers to the number of pulses transmitted per unit of time, in Hz. The PRF is adjusted according the number of ultrasound beams (focal laws) in order to get the smoothest A-scan and S-scan rendering possible. In other words, the PRF determines how often the system triggers high-voltage on all 16 channels, and it also defines how often the system samples the signals on each 16 channels. To avoid ghost echoes, the echo from one pulse must be received before the next pulse is emitted. This condition is met when: PRF < 1 / [(start path + range) * sub-sampling]
The Sonatest veo 16:64 can operate at a PRF of up to 20 000 Hz in phased-array, and up to 10 000 Hz in conventional. The device can display a full sectorial scan (S-scan) at up to 60 Hz on the screen.
The PRF is limited by the "Inspection:Frame Rate" in non-encoded inspections. Use the lowest possible PRF as often as you can since it saves power and lowers the occurrence of
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acoustic phantom echoes caused by the part geometry.
12.5.16 Sub-Sampling
You can use sub-sampling in order to reduce the size of your scans, hence reducing the resulting file size. When the sub-sampling is activated, the software keeps the most significant sample in a certain ratio of samples, while rejecting the least significant ones. For example, a ratio of 1:4 means 1 sample is kept for every 4 samples acquired. The chosen sample always is the one with the maximal amplitude. The possible ratio values are: 1:1 1:2 1:4 1:8 1:16 1:32 1:64 1:128
12.5.17 Smoothing
The smoothing allows you to pre-filter the signal with a low-pass filter during signal processing. Smoothing, like filtering, affects the A-scan signals and all the imaging. Therefore, one may be careful when selecting the proper smoothing mode. Typically, the smoothing will affect the dead zone, meaning that each echo signal will decay down to zero after some period of time. You should make sure that shallow echo signals such as tip diffraction and corner reflection are discernable enough for your sizing requirements. The use of a filter will affect raw data during a recording.
12.5.18 Averaging (Mono)

Allows to improve the signal-to-noise ratio of a conventional A-scan by selecting one of seven levels of averaging. Hence, for an averaging value of 1:4, the unit will acquire four times a given sample, sum the values of this sample and divide the sum by four. The resultant value will be displayed in real-time.
High averaging values can significantly slow down the acquisition speed, since the entire acquisition is performed multiple times. For instance, an averaging value of 1:4 require the unit to acquire the same beam four times before displaying it, resulting in a longer processing time and higher power consumption per resulting beam.
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12.5.19 Filter
Select amongst the list of band-pass filters
FILTERING ISSUES Using filters has pros and cons. They provide a smoother signal variation because they clean some background noise from the A-scan signals, but the drawback is that they can eliminate weak signals related to defects. Therefore, they must be used with caution. The recommended value when starting a new applications is "Automatic", which lets the Sonatest veo 16:64 select the proper frequency band according to the probe frequency. Otherwise, the Sonatest veo 16:64 provides several band-pass filters. It is recommended to select the proper filter very early in your application setup process, and to leave that parameter constant for all subsequent inspections of the same nature to have comparable data.
Filters affect the amplitude of the received signal. It is then necessary to select the appropriate filter before performing any calibration.
12.5.20 Signal Rectification

The Rectification changes the signal display of the A-scan. The most common setups use either the Full Wave (fully rectified signal) or RF Waveform (complete sinusoidal wave) modes. The Rectification parameter has an impact on the full screen height (FSH) display. If the rectification is Full, the amplitude will vary from 0 to 100 % FSH. If the rectification is None, the amplitude will vary from -100 to 100 % FSH.
- None: Non-rectified waveform (RF waveform) - Unipolar +: Positive half-wave rectification - Unipolar -: Negative half-wave rectification - Full: Fully rectified waveform
Rectification alters both displayed and recorded signals. No smoothing can be applied when the rectification is set to None (RF Waveform), Unipolar+ or Unipolar-.
12.5.21 IFT Active

Enables part interface triggering for this scan.
12.5.22 IFT Gate Start

Delay after the acquisition start, where the device should search for interface of the part. Also controllable through the IFT gate in the A-Scan.
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12.5.23 IFT Gate Range

Lapse of time to search for the part interface. Also controllable through the IFT gate in the A-Scan.
12.5.24 IFT Gate Threshold

Threshold, in %FSH, to consider for the interface trigger. Also controllable through the IFT gate in the A-Scan.
12.5.25 Probe TX, Probe RX

Identifies the probe used for transmission (TX) and the probe used in reception (RX) for the scan. In Pulse-Echo mode, the same probe is used for both transmission and reception, while typical Pitch-and-Catch and Through Transmission setups involve two (2) probes.
12.5.26 First, Last Elmt TX/RX

These parameters tell the device what elements to activate to perform the scan. For both TX an RX probes, you need to set the first and the last element to be activated. All the elements in that range will be activated. The first element position is the reference for all the parameters affecting the focal laws.
In Pitch & Catch and Through Transmission modes, the maximum number of active elements in TX or RX cannot exceed eight elements.
12.5.27 Double Resolution

In the case of a LINEAR scan, you can choose to have use a doubled resolution. Enabling DOUBLE RESOLUTION will result in twice the number of beams (minus 1). This should provide you with a better lateral resolution of reflectors. The double resolution works as following: 1. The NB ACTIVE ELMT parameter determines a given number of activated elements over the full array for the first beam (i.e. 8 elements).
2. For the second beam (focal law), one element is deactivated; 7 elements are now activated (note that this beam has 1/8th less acoustic energy).
3. For the following beam, the next element is activated; 8 elements are now activated. And so on...
The formula to calculate the number of beams with a double resolution is: (Nb of Elmt - Nb of Active Elmt + 1) x 2 For example, it could be: (32 elements - 8 active elements + 1) x 2 = 50 beams
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12.5.28 Probe Center Spacing (TOFD)

In TOFD, tells the distance between the beam exit point of each probe (PCS). This is a result of the chosen Geometry:Index Offset parameters of each probe.
12.5.29 Beams Qty

This parameter is read-only and shows the number of beams forming the scan (S-scan or L-scan). For a sectorial scan (S-scan), the number of beams can be modified through the ANGULAR RESOLUTION, START ANGLE or STOP ANGLE. For a linear scan (L-scan), the number of beams is a result of the FIRST ELEMENT RX, LAST ELEMENT RX, NB ACTIVE ELMT and DOUBLE RESOLUTION. A phased array beam is just like any other ultrasound beam. It has a near field, a focal spot, a focal length, and a certain width. It can eventually feature side-lobes or grating lobes because of the periodicity of the array or because of elements being too large for the wavelength. A phased array instrument like the Sonatest veo 16:64 can generate a lot of beams sequentially, thanks to its ultrafast beamformer (the unit that "forms the beams"). The beamformer needs a lot of parameters in order to form each beam. We call this set of parameters a focal law. And in order to generate a scan constituted of many beams, the beamformer needs just as many focal laws. NOTE: Whenever you see this expression, you can imagine "beam parameter set". Remember that a focal law doesn't necessarily mean an angle, because in the context of a L-scan, all beams use the same angle, but centered at another index point. For simplicity, Sonatest sometimes uses the expression BEAM instead of focal law. Each beam includes a set of time delays that we call the delay law, which is calculated to focus the acoustic energy at the requested angle and focal point.
12.5.30 Samples Qty

The number of measurement points of the A-Scan. This quantity depends on the Start Path, the Stop Path, the Acquisition Frequency and the Sub-sampling values. The resulting number of samples is recalculated when changing the parameters. For example, if we change the Acquisition Frequency from 100 MHz (2.5 ns) to 50 MHz (5 ns), the number of samples changes (half as much in this case). The Sonatest veo 16:64 samples the ultrasound echo signals at up to 100 MHz for Phase Array and up to 200MHz for conventional UT. Therefore, the achievable delay resolution is 2.5 ns, which is adequate for probes up to about 13 or 15 MHz. For recording long metal-path scans, use sub-sampling to limit the amount of data transferred and to respect the maximum number of samples allowed. This parameter is read-only.
12.5.31 Path Resolution

A read-only parameter indicating the number of sample per millimeter or per inches. The Path Resolution is basically the Sample Qty divided by the sound path length. It is a quick way to determine if the proper acquisition frequency and sub-sampling value have been properly selected.
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12.5.32 Equivalent Reflector Size

The ERS (Equivalent Reflector Size) is shown when a DGS calibration has been performed. It allows specification of the size of defects that should be reported, such that a signal at 0 dB relative to the DGS curve will be sized equal to this ERS value. It can be adjusted within limits specified by the current DGS setup and will cause a recalculation of the DGS curve. ERS is sometimes referred to as the Registration Level.
12.6
Geometry
GEOMETRY parameters are used to specify how probes are positioned in relation to each other, and where the group of probes is located on the part to inspect
12.6.1
Probe Scan/Index Offset
The distance between the group reference point and the wedge/probe reference along the scan or index axis.
Figure 44: Exam ple Scan and Index Offset
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12.6.2
Probe Rotation
Orientation of the probe relative to the scan axis.
12.6.3
Enc Area CL Position
Offset of the Encoding Area from the part datum, in the direction of the center line.
12.6.4
Enc Area CL Offset
Offset of the Encoding Area from the part datum, away from the center line.
12.6.5
Enc Area Rotation
Rotation applied to the Encoding Area. This parameter rotates both the Scan Axis and the Index Axis clockwise.
12.7
Encoding Menu
The ENCODING menu controls the parameters for each connected encoder and specifies for the recording sequence and area.
12.7.1
Encoding Setup
To select the kind of encoder setup being used. An encoding setup can be performed on the scan axis (one axis) or on both scan and index axes (two axes).
12.7.2
Encoders Name
Tto identify the encoders being used. Encoders are generally identified by manufacturer or model name.
12.7.3
Scan/Index Axis Name
To specify a custom axis name to make your file more understandable.
12.7.4
Scan/Index Encoder Type
The type of encoder used for each axis. TheSonatest veo 16:64 supports quadrature encoders and also offers a manual entry mode. Both modes are described below. Quadrature encoder This type of encoder uses two output channels (A and B) to sense the position. Each channel corresponds to one track within the encoder. Both tracks are 90 degrees out of phase. The leading track will determine the direction of the encoder (clockwise or counter-clockwise). The number of pulses and the relative phases of both channels provide enough information to track both the position and the direction of rotation.
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Manual
This mode is available when a one axis encoder (scan axis only) is used. The increment on the index axis direction is performed manually using a button.
12.7.5
Scan/Index Encoder Resolution
To set the encoder resolution specific to each axis. The encoder resolution is defined by the number of ticks triggered per millimeter (or inch). The encoder resolution is usually specified in the encoder specification sheet.
12.7.6
Scan/Index Start Position
Define the position from where the data recording starts. The scan and Index Start Position are referenced to the datum, which is the (0,0) reference point on the part.
12.7.7
Scan/Index Distance
Represents the distance, relative to the start position, over which data will be acquired while moving the probe over the inspected part. Along with the Index and Scan Start Positions, it defines the encoding area.
12.7.8
Scan/Index Stop Position
Read only parameters indicating the position, relative to the Scan and/or Index Start Position, where the encoding area ends and data stops being acquired.
12.7.9
Scan/Index Step
Allow to define the distance between each acquired point on an axis. It is the acquisition resolution of that axis. For example, if the Scan Step is set at 1 millimeter, the unit will acquire a new scan every 1 millimeter. The scan step and index step directly affect the final data file size and the scanning speed. If you experience issues with the data file size being too large or the scanning speed being sluggish, you can increase the Step value, or revisit one of the following settings: Using Sub-Sampling Using a lower Acquisition Frequency or PRF Reducing the Range Path Increasing the Angular Resolution (which reduces the number of beams) Reducing the Index and/or Scan Distance Increasing the Index and/or Scan Step
12.7.10 Scan/Index Invert Dir

The Invert Direction parameters indicate if the encoder count should be reversed on the scan or index axis. When this parameter is enabled, the position given by that encoder will be considered as positive when the encoder reports a negative position, and vice-versa.
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12.7.11 Reset Position

Reset the position of the encoders to the origin.
12.7.12 Data File Size

A read only parameter indicating the expected file size according to your current settings. File size can be reduced by
Using the Sub-Sampling Using a lower Acquisition Frequency and PRF Reducing the Range Path Increasing the angular Resolution (which reduces the number of beams)
For an encoded setup Reducing the Index and/or Scan Distance Increasing the Index and/or Scan Step
12.7.13 Max Enc Speed

Evaluation of the maximal encoding speed based on the physical limitation when working at 100% duty cycle.
12.8
Calibrate Menu
The CALIBRATE menu contains all calibrations that can be performed by the device. Most calibrations can only be performed in acquisition (PLAY) mode.
12.8.1
Velocity Wizard
Helps to determine the material velocity, by using 2 reflectors. See the "Wizards" section of the manual for details.
12.8.2
Wedge Delay Wizard
Adjusts the delay incurred by the wedge degradation. See the "Wizards" section of the manual for details.
12.8.3
Sensitivity/ACG Wizard
Calibrates and normalizes the sensitivity of each beam (focal law) of a Phased Array scan. See the "Wizards" section of the manual for details.
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12.8.4
TCG/DAC/DGS Wizard (Curves)
Calibrates various kinds of curves to display in the A-Scan. TCG: Time-Corrected Gain. The device increases or reduces the gain progressively to correct the attenuation in the material and/or the effect of focussing. DAC: Distance-Amplitude Curves. The device displays curves to indicate the level at which indications need to be considered by the inspector, by using detections from reflectors. These curves work like detection gates, but are curves to compensate for the attenuation in the material and/or the effect of focussing. DGS: Distance-Gain-Size Curves. The device displays curves to indicate the level at which indications need to be considered by the inspector, by using empirical values. These curves work like detection gates, but compensate for the attenuation in the material. See the "Wizards" section of the manual for details.
12.8.5
Encoder Wizard
Guided detection of the encoder resolution. Use when the encoder specification is not available. See the "Wizards" section of the manual for details.
12.8.6
Element Check Wizard
Checks the sensitivity of each individual element of a phased array probe. See the "Wizards" section of the manual for details.
12.8.7
Clear Calibrations
Resets to zero one or all calibrations that were performed for the current configuration file.
12.9
Preferences Menu
The PREFERENCES menu is where global device settings are located.
12.9.1
Media Browser
Enter the file management media browser to copy and move configurations, recordings and report files.
12.9.2
Language
The language used by the device.
12.9.3
Unit System
Changes the representation of measures taken by the device. Either Metric (millimeters) or Imperial (inches).
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12.9.4
Keep Measures
Locks the measurements display in PLAY mode. When Enabled, measures are always displayed in the top area of the screen when views are displayed. When Disabled, the measurements panel is replaced by the menu tabs when focus is inside the menu, i.e. after pressing MENU or when editing parameters. Press VIEW or CURSOR to show measures.
12.9.5
Default Palette
The default palette used when creating new views, i.e. when switching layouts. (TOFD views are always greyscale.)
12.9.6
Date Format
The preferred Date Format used in the Unit Status Indicator and in Reports.
12.9.7
System Date/Time
Shows a popup window to specify a new system date and time.
12.9.8
UI Color
Select a bright or dark theme for the user interface for indoor or outdoor use .
12.9.9
Networking
To connect your device to a network, the following parameters are available: DHCP IP Address Net Mask MAC Address (read-only)
In some networking environments, using DHCP is often the easiest options. However, some enterprise networks require manual configuration or special authorizations to access the network. Please contact your local IT administrator if you wish to connect this device to the network.
12.9.10 VNC Enabled

Enables remote desktop access through the network.
12.9.11 VNC Password

Changes the password used for the remote desktop access.
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12.9.12 Video Out

To enable the video output, the device must be booted with the external screen or projector already plugged in.
12.9.13 Software Version

Displays the version number of the last software update.
12.9.14 Hardware Version

Internal hardware module revisions.
12.9.15 Last Calibration

Date of the last device calibration performed by SONATEST.
12.9.16 Support Console

Displays advanced support options. Use as directed by one of our support agents.
12.10 View Menu

The VIEW menu contains settings to manage the current view display features. The current view is the one indicated in BLUE in the lower-left corner of the display. Press to toggle between views.
12.10.1 View Orientation

Controls the display orientation of the view, i.e. whether the view is flipped or not.
12.10.2 Add Cursor

Shows a pop-up window to select the new type of cursor to add in the current view.
12.10.3 Top, Bottom, Left, Right Rulers

Enables the display of individual rulers in the current view.
12.10.4 Circular Ruler (S-Scan)

In the sectorial scan, displays markers for each angle.
12.10.5 Horizontal, Vertical Grid (A-Scan)

In the A-Scan, enables a grid display.
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12.10.6 Envelope
In Envelope mode, the highest signal is kept over a period of time. To reset the envelope, simply disable and reenable the envelope option.
12.10.7 Part Overlay

Available in some views, it enables the display of a thickness overlay, as well as the weld display, as configured in the Part menu.
12.10.8 Skip Qty

The maximum number of reflections (part skips) to display in the view.
12.10.9 View Palette

The color palette used to represent the amplitude or the depth in views.
12.10.10 Palette Position

Position of the color palette ruler. Select "None" to hide the palette ruler.
12.10.11 Show Measures

Enables the display of various cursor measurement overlays in the view area. Disable to increase the viewable area.
12.10.12 Show DAC (A-Scan)

Shows or hides the DAC Curve in the A-Scan view. Only available if a DAC curve was created by using the DAC wizard.
12.10.13 Show DGS (A-Scan)

Shows or hides the DGS Curve in the A-Scan view. Only available if a DGS curve was created by using the DGS wizard.
12.10.14 Depth/Amplitude Mode (Cumulated views)

In TOP or END views, chooses the extraction mode of the ultrasound data, i.e. what the color palette represents. In "Amplitude" mode, an envelope of all frames is created, from the selected point of view (TOP, END). The color represents the highest sample encountered in the area. In "Depth" mode, the color represents the distance, or depth, of the highest peak sample in the area, from the selected point of view (TOP, END). The highest palette values then represent the farthest or deepest distance from our point of view.
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12.10.15 View Scrolling Mode (Encoded views)

Choose the scrolling mode of the view, either Stacking or Smooth.
12.10.16 Frame Start/Range (Encoded views)

When zooming into encoded views, this represents the beginning frame number and the number of frames being displayed.
12.10.17 IFT Culling

Keep only the samples past the IFT gate (Interface Triggering).
12.11 Cursor Menu

Displays the position and other properties of the current gate or cursors. Only available in acquisition or analysis mode (PLAY). It can quickly be accessed by pressing the F2 / INFO key.
12.11.1 Name
Unique identifier of the current cursor or gate.
12.11.2 Type
Type of cursor. See section Adding Cursors in the Quick Start Guide for a detailed description of each type of cursor.
12.11.3 Focal Law (L-Scan)

For angular cursors in the L-Scan, specifies the index of the selected focal law (starting at 1).
12.11.4 Angle (S-Scan)

For angular cursors in the S-Scan, specifies the selected angle, in degrees.
12.11.5 Sound Path

Distance, in mm, inches or s, from the probe exit point to the cursor position. It can represent the full distance (round-trip) or half distance, depending on the selected "Scan:Travel Mode" setting.
12.11.6 Depth
True depth, in mm or inches, of the cursor from the part surface.
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12.11.7 Level / Threshold

Amplitude level of the gate alarm, in % FSH. When a Top or End view is extracted from a box cursor, this parameter also controls the threshold under which samples are ignored, which helps reduce noise.
12.11.8 Surface Distance

Horizontal distance, on the surface, starting from the wedge reference point ( section for details. ). See the Wedge References
12.11.9 Enc Scan Axis

In encoded views, position of the cursor on the Scan Encoder axis.
12.11.10 Enc Index Axis

In encoded views, position of the cursor on the Index Encoder axis.
12.11.11 Gate Follow Peak

The gate automatically centers itself on the peak. When the gate does not detect a peak in its range, it automatically moves towards the highest peak in the A-Scan.
12.11.12 Color
Color of the cursor or gate.
12.11.13 Delete Cursor

Deletes the current cursor from the view. Some cursors can't be deleted, especially if a view is extracted from it (ex: angular extractor). To add a cursor, use the ADD CURSOR button of the View menu.
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13
13.1
Examples
Example of Phased Array Setup
The example presented in this section guides you in a step by step fashion to create a "Phased Array" setup, proceed with calibration, inspect and gather data, analyze your data and make your measurements. This scenario starts with a pre-configured example configuration file, which minimizes the number of parameters to modify, it is also possible to start from any type of setup and reconfigure parameters. This is a simplified workflow, it does not show you all the veo capabilities.
13.1.1
Load the configuration

), then load ( ).
1. Press stop (
2. This demo usese a Type 1 "PE-5.0M32E0.8P" probe with a "T1-35W0D" wedge. 3. At this time, you should have this screen in front of you:
4. If the selected drive is not the internal drive (
), press the
key to swap media.
5. Press the key to select the file list, then use the click wheel ( "Example_T1_ PE-5.0M32E0.8P_T1-35W0D-REXO.utcfg". 6. Press to open the selected file.
) to navigate and select the
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* If you do not have this probe and wedge, select a setup that looks similar to your probe and wedge, review all parameters in probe and wedge menu to ensure your setup is relevant (or use the "Probe:Load..." and "Wedge: Load..." to load your probe and wedge from the database).
13.1.2
Modify the configuration
1. With the example file that you just opened, parameters of the "Inspection", "Probe" and "Wedge" menus do not need to be modified. To navigate in the various menus, press the and arrow keys. Press or , or rotate your finger around the OK button, to move up or down in the menu. Press 2. Review parameters of the "Part" menu, the most important being : Part: SW Velocity Part: LW Velocity Part: Thickness Part: Weld (type) 3. Press PLAY ( ) to change to acquisition mode. to edit a parameter.
4. Review the parameters in "Scan" menu, the most important being : Scan: dB (Gain)
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Scan: Focal Dist Scan: Start Angle Scan: Stop Angle Scan: Start Path Scan: Range Path 5. To setup an encoder see section: "Setting up an Encoder" (optional). 6. To perform calibrations, move to "Calibration" Tab and select the appropriate wizard (optional).
13.1.3
Making Measurements
1. Move your probe so that a reflector goes through the extractor (maximize the reflector amplitude in the A-Scan). 2. Press PAUSE ( 3. Press the "gate" ( ) to freeze your screen. ) key once to select the "Gate 1".
) to move the selected "gate".
5. To change the "gate" size, press
).
13.1.4
Record Data
1. Position your probe at its start position. 2. Press REC ( ).
3. Move your probe towards the end of your part, while applying constant pressure with the couplant. 4. Press stop ( ).
5. Edit the file name by using phone style editing. 6. Press to accept filename and save the file.
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13.1.5
Open analysis file

), you will see this screen appear:
1. Press load (
), press the
key to swap media.
3. Use the click wheel ( 4. Press
) to navigate and select the file you just saved (with the extension *.utdata).
to open the selected file. ) to change to analysis mode. ) to change the view organization.
5. Press PLAY ( 6. Press LAYOUT (
7. Press
to see the available choices, then use the click wheel (
) to select the appropriate layout.
8. Press the
to select frame position, use the click wheel ( ), select "Report", then press
) to change frame. twice.
9. To create a report, press save (
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13.2
Example of Conventional UT Setup
The example presented in this section guides you through a step by step fashion to create a "Conventional UT" setup, proceed with calibration, inspect and make your measurements. This scenario starts with a pre-configured example configuration file, which minimizes the number of parameters to modify, it is also possible to start from any type of setup and reconfigure parameters. This is a simplified workflow, it does not show you all the veo capabilities.
13.2.1

), then load ( ).
1. Press stop (
2. At this time, you will be presented with this screen:
), press the
key to swap media.
4. Press the key to select the file list, then use the click wheel ( "Example_Conventional_Pulse_Echo.utcfg" file.
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5. Press
13.2.2
1. With the example file that you just opened, parameters of the "Inspection" menu do not need to be modified. To navigate in the various menus, press the and arrow keys. Press or , or rotate your finger around the OK button, to move up or down in the menu. Press to edit a parameter.
2. Review the parameters of the "Probe" menu, the most important being : Probe: Type Probe: Frequency Probe: Connected to Probe: Elmt Diameter 3. Review the parameters of the "Wedge" menu, the most important being : Wedge: Type Wedge: Wave Mode (the refracted angle is given for SW or LW) Wedge: Refracted Angle 4. Review the parameters of the "Part" menu, the most important being : Part: SW Velocity Part: LW Velocity Part: Thickness 5. Press PLAY ( ) to change to acquisition mode.
6. Review the parameters of the "Scan" menu, the most important being : Scan: dB (Gain) Scan: Start Path Scan: Range Path
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Scan: Delay Offset
13.2.3
Making Measurements
1. Move your probe until you can see a deflector. Maximize the reflector amplitude in the A-Scan. 2. Press PAUSE ( 3. Press the "gate" ( ) to change freeze your screen. ) key once to select "Gate 1".
) to move the selected gate.
5. To change the gate size, press
, then change its size by using the click wheel (
).
13.3
Example of TOFD Setup
The example presented in this section guides you in a step by step fashion to create a "TOFD" setup, proceed with calibration, inspect and gather data, analyze your data and make your measurements. This scenario starts with a pre-configured example configuration file, which minimizes the number of parameters to modify, it is also possible to start from any type of setup and reconfigure parameters. This is a simplified workflow, it does not show you all the veo capabilities.
13.3.1
1. 2.

Press
stop (
), then load (
).
At this time, you will see this screen:
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157
3.
If the selected drive is not the internal drive (
), press the
key to swap media.
4.
Press the key to select the file list, then use the click wheel ( "Example_TOFD_5.0_Phoenix_ISL_60.utcfg".
5.
Press
13.3.2
1. With the example file that you just opened, parameters of the "Inspection" menu do not need to be modified. To navigate in the various menus, press the and arrow keys. Press or , or rotate your finger around the OK button, to move up or down in the menu. Press to edit a parameter.
2. Review the parameters of the "Probe" menu, the most important being (or use the "Probe:Load..." to load your probe and wedge from the database): Probe: Type Probe: Frequency Probe: Connected to Probe: Elmt Diameter 3. Review the parameters of the "Wedge" menu, the most important being (or use the "Wedge:Load..." to load your wedge from the database): Wedge: Type Wedge: Wave Mode (the refracted angle is given for SW or LW) Wedge: Refracted Angle 4. Review the parameters of the "Part" menu, the most important being:
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Part: SW Velocity Part: LW Velocity Part: Thickness 5. Review the parameters of the "Geometry " menu (PCS will be computed from information gathered at this step): Geometry: W1 and W2 Index Offset (W1 stands for "Wedge 1") Geometry: W1 and W2Scan Offset (W1 stands for "Wedge 1") Geometry: W1 and W2Rotation (W1 stands for "Wedge 1") 6. Review the parameters of the "Encoder" menu, if you intend on using an encoder : Encoder: Encoding Setup Encoder: Scan Encoder type (the type of encode your have) Encoder: Scan Start Pos (the start position ) Encoder: Scan Distance Encoder: Scan Step 7. Press PLAY ( 8. Press the ) to change to acquisition mode. and to reset your encoder position.
9. Review the parameters of the "Scan " menu, the most important being : Scan: dB (Gain) Scan: Start Path Scan: Range Path 10.To setup an encoder see section: "Setting up an Encoder" (optional). 11.To position the TOFD ruler properly on the Lateral Wave and Back Wall of the part, adjust these parameters : Scan: Ruler LW Pos. Scan: Ruler BW Pos.
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159
13.3.3
Record Data
1. Position your probe at its start position. 2. Press REC ( ).
3. Move your probe towards the end of your part, while applying constant pressure with the couplant. 4. Press stop ( ).
5. Edit the file name by using phone style editing. 6. Press to accept the file name.
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14
14.1
Maintenance
Casing
Do not put the Sonatest veo 16:64 near a source of electromagnetic noise, which could disrupt data acquisition. If you have carpets in your workplace, be careful about electrostatic shocks. Clean the Sonatest veo 16:64 often to make sure that oils, dust or couplant do not damage the unit. To avoid damage to the surface of the instrument, do not use any abrasive or chemical cleaning agents. Avoid dusty places. Protect the unit from adverse weather conditions.
14.2
Screen
The Sonatest veo 16:64 screen is a high-brightness color LCD screen with a resolution of 1024x600 pixels.
To wash the screen, use a clean, lint-free cloth. Do not use an abrasive cloth or brush. Do not use a sharp object (pen, pencil) to point flaws or details on the screen. Do not store or leave the unit where the LCD display will be exposed to direct sunlight for long periods of time.
14.3
Temperature
Avoid putting the instrument near a heat source. Never block the fans at the back of the instrument. Always allow air flow between the instrument and its surroundings. Never lay flat the instrument on a soft surface to avoid blocking the air flow. The operating temperature of the Sonatest veo 16:64 is from -10C to 40C (14F to 104F). Recommended storage temperature is -25C to 70C (-13F to 158F).
14.4
Traveling
Make sure the instrument does not suffer from excessive shocks or impacts while traveling. Make sure the battery is charged when you travel abroad with the Sonatest veo 16:64. Some airport administrations will ask you to boot-up the instrument in front of them, so make sure to have a battery or the power adaptor handy. Never travel with the Sonatest veo 16:64 with a probe connected on it. Make sure unplug every external peripheral when traveling with the Sonatest veo 16:64. Make sure that the proper voltage is supported in the country you to work with the Sonatest veo 16:64.
Product Specification
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15
Product Specification
162
16
16.1
Troubleshooting and Support

Troubleshooting Tips
Q1 - The Sonatest veo 16:64 unit does not start when pressing the POWER button. Hold the POWER button for 4 seconds for the unit to start. This delay prevents accidental boot-ups during transport. Make sure that a charged battery is in the device, or that the power cord is connected.
Q2 - The Sonatest veo 16:64 appears to have "frozen". How do I shut down the device? In the rare event that an emergency shutdown is required, hold the POWER button for 5 seconds to hard-shutdown the device. Do not do this in normal situations, since this shutdown method might result in data file loss.
Q3 - When the unit is turned off, the BAT1 or BAT2 LED remain solid green. What does this means? The battery is charging.
16.2
Update Procedure
The internal software of the Sonatest veo 16:64 can be updated as now versions become available. The new software can be loaded onto a USB key for update. Refer to the instructions provided with the new software for details.
16.3
Contact Support
Please contact your local distributor for additional support or training.
Visit our website or e-mail us at: www.sonatest.com sales@sonatest.com
Troubleshooting and Support

United Kingdom (Head Office) Sonatest Ltd Dickens Road Old Wolverton Milton Keynes MK12 5QQ United Kingdom
163
Tel: Fax:
+44 (0)1908 316345 +44 (0)1908 321323
United States Sonatest Inc 12775 Cogburn San Antonio, TX 78249 USA
Tel: Fax:
+1 (210) 697-0335 +1 (210) 697-0767
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VEO User Guide v1 - 2

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VEO User Guide v1 - 2

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Sonatest VEO 16:64 - User Guide

Copyright 2010 Sonatest Limited Version 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide

Part III Instrument and Accessories

Part IV Connecting Probes and Powering Up Part V User Interface

Part VI Ultrasound Techniques

1 Scan ................................................................................................................................... Types 30

2 View ................................................................................................................................... definitions 30

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Part VII Setup and Operation Workflow

Part VIII Defining Scan Plan Geometry (Cartesian/Axis Reference System)

Part IX Calibration Wizards

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide

1 Creating ................................................................................................................................... and Customizing Reports 88

1 Inspection ................................................................................................................................... Menu 94

2 Probe ................................................................................................................................... Menu 100

3 Wedge ................................................................................................................................... Menu 113

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

4 Part ................................................................................................................................... Menu 120

5 Scan ................................................................................................................................... Menu 129

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide 6 Geometry ................................................................................................................................... 140

7 Encoding ................................................................................................................................... Menu 141

8 Calibrate ................................................................................................................................... Menu 143

9 Preferences ................................................................................................................................... Menu 144

10 View ................................................................................................................................... Menu 146

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

11 Cursor ................................................................................................................................... Menu 148

Part XIII Examples

1 Example ................................................................................................................................... of Phased Array Setup 150

2 Example ................................................................................................................................... of Conventional UT Setup 154

3 Example ................................................................................................................................... of TOFD Setup 156

Part XIV Maintenance

Part XV Product Specification

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide

Part XVI Troubleshooting and Support

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide

Disclaimers and Notices

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Disclaimers and Notices

Equipment Directive Conformance

Risks and Hazards

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide

Operating temperature: Storage temperature: Maximum relative humidity: IP rating:

Do not operate with fans obstructed. Do not operate under water.

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Instrument and Accessories

Instrument and Accessories

Before starting, verify that your package includes the following:

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Instrument and Accessories

Copyright 2010 Sonatest Limited - 1.2.2010-10-21

Sonatest VEO 16:64 - User Guide

Button Nam e CANCEL Click Wheel

USB Keyboard Escape ---