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Terrence W. Baird
Hewlett-Packard Company
Dynamic test and measurement nds application in many engineering and scientic disciplines. Although each has evolved uniquely in its types of equipment and methods employed, a degree of commonality exists in the operating principles and performance criteria of the various apparatuses used. Rather than attempting comprehensive treatment of each application or equipment type available, focus will be directed toward this commonality through a discussion of the components of a generalized test system. The generalized model from which the discussion will be developed is as follows. A device is subjected to a specied dynamic environment produced by a test machine. The test machine input and device response motions are measured by transducers, whose signals are conditioned and subsequently analyzed for purposes of data reduction and test machine control. Descriptions will be limited to some commonly used test equipment and instrumentation and their key performance criteria. Although the model described will be used as the basis for this introduction to test equipment, it is the authors intent that the technical content and principles of equipment performance be relevant to any application. The reader is encouraged to research the references and resources cited at the end of the chapter to more fully explore todays dynamic test technology on an application-specic basis.
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FIGURE 19.1 Block diagram of an electrohydraulic shaker. (Source: Harris, C. and Crede, C. 1988. Shock and Vibration Handbook, 3rd ed. McGraw-Hill, New York. Reproduced with permission.)
Figure 19.2 shows an actual system. Availability of large force generation, long displacement stroke, and low-frequency performance are advantages of an electrohydraulic shaker. Electrodynamic (also called electromagnetic) shakers generate force by means of a coil carrying a current ow placed in a magnetic eld, which passes through the coil, causing motion of the coil, moving element, and table assembly (called the armature). The operating principle is not unlike that of a loudspeaker system. Some electrodynamic shakers use a double-ended design, which incorporates both an upper and a lower eld coil, resulting in reduced stray magnetic elds above the table and increased operating efciency. A typical double-ended shaker design is shown in Figure 19.3. Higher frequency performance is a major advantage of an electrodynamic shaker.
FIGURE 19.2 Electrohydraulic shaker system including hydraulic supply, shaker, and digital controller. (Courtesy Lansmont Corp.)
TRUNNION ISOLATION AIR BAGS PEDESTAL BASE LOWER FIELD COIL AIR GAP
FIGURE 19.3 Schematic of double-ended electrodynamic shaker design. (Courtesy Unholtz-Dickie Corp.)
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where A = maximum acceleration, g; F = force rating in pounds-force, lbf; and W = total load, lb, including armature, table, and test specimen weight. Frequency range. Frequency versus amplitude performance is generally specied in a series of performance curves presented for various test loads. Representative ranges for typical generalpurpose shakers are 1 to 500 Hz for electrohydraulic and 10 to 3000 Hz for electrodynamic, depending on test parameters. Waveform quality/harmonic distortion. This will vary by design but should be specied. Magnetic elds. This may be a concern for some applications, in which case it should be specied for electrodynamic shakers. It is not a concern with electrohydraulic shakers. Table or head expander frequency response. The practical frequency range will depend, in part, on the table attached to the shaker. Basic design, mass, damping, and frequency response characteristics should be specied. Test orientation. Consideration should be given to design type if independent vertical and horizontal test capability is desired. For instance, it is relatively common for an electrodynamic shaker to be supported by a base with a trunnion shaft, whereby the entire body can be rotated about its center providing for either vertical or horizontal vibration.
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FIGURE 19.4 Preferred shock pulse waveforms of IEC 68-2-27. (Source: Broch, J. T. 1984. Mechanical Vibration and Shock Measurement, 2nd ed. Bruel and Kjaer, Naerum, Denmark. Reproduced with permission.)
Two types of machines used for shock generation are the free-fall shock machine and the previously described shakers. A typical free-fall shock machine (sometimes called a drop table or drop tester) is shown in Figure 19.5 and is used for generating simple or classical pulse waveforms such as those in Figure 19.4. Operation is straightforward. The shock table, whose orientation and free-fall path are controlled by guide rods, is raised to a desired height and allowed to fall and impact upon a pulse programmer. Brakes are employed to prevent multiple impacts after rebound. Shock pulse velocity change is controlled by drop height. Pulse waveform, resulting peak acceleration, and duration are determined by programmer type. Significant velocity and peak acceleration capabilities are advantages of this type of shock machine. Shakers with appropriate digital controllers are not only capable of producing classical waveforms, but can also be used for applications such as SRS programming or capturing a real-world shock pulse and using it as a control waveform for subsequent shock tests. Shakers have limitations for shock test in terms of available displacement, velocity, and peak acceleration. However, for low-level shocks of light- to medium-weight specimens, test exibility, control, and repeatability are excellent if the test parameters are within the performance limits of the shaker.
FIGURE 19.5 Shock machine and associated instrumentation. (Courtesy MTS Systems Corp.)
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Waveform exibility and programmer design. Table size and weight capacity. Table performance, frequency response, damping, and waveform quality. Potential need for SRS control and waveform synthesis.
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PIEZOELECTRIC ACCELEROMETER WITH ANNULAR SHEAR ELEMENT
Piezoelectric (PE) accelerometers incorporate sensing elements, typically quartz or ceramic crystals, that have the property of producing a charge when mechanically stressed. Specically, when subjected to an acceleration, the PE accelerometer produces a charge proportional to the applied acceleration and is said to be self-generating in that the electrical output is produced without the need for auxiliary power excitation to the accelerometer. Typically, this charge then needs to be converted to a voltage in an external signal conditioner for subsequent analysis or readout. An exception to this rule is the now commonly available PE accelerometer with built-in integrated-circuit signal conditioning. Piezoresistive (PR) accelerometers incorporate a semiconductor material such as a solid state silicon resistor, which serves as a strain-sensing or strain gage element. Arranged in pairs and typically connected electrically in a Wheatstone-bridge circuit, these PR elements exhibit a change in electrical resistance proportional to an applied acceleration. The PR accelerometer is referred to as a passive type accelerometer in that it does require an external power source to operate. The PR accelerometers primary advantage is its ability to measure down to DC or steady-state acceleration, making it particularly suitable to longduration pulses and other low-frequency applications. PE and PR accelerometer designs are shown in Figure 19.6.
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surement situations do exist in which mass loading effects, extreme surface temperatures, rotating structures, or other test conditions preclude the practical use of a contact transducer, such as an accelerometer. In these instances, a noncontact transducer can be employed such as a laser Doppler vibrometer for motion detection where the electro-optical transduction principle is employed.) Amplitude range and linearity. Sensitivity is constant within stated tolerances over a certain amplitude range, beyond which sensitivity is nonlinear. This is usually expressed as a percentage deviation from nominal sensitivity as a function of the applied acceleration. Transverse sensitivity. For a single-axis accelerometer, there is still a small sensitivity to transverse accelerations, which is usually expressed as a percentage of main axis sensitivity. Temperature sensitivity. Percent deviation from the nominal sensitivity is expressed as a function of temperature. Mounting considerations. Although not a characteristic of accelerometer design, the way in which an accelerometer is mounted to the structure for measurement has a signicant inuence on its effective frequency response. Figure 19.7 shows various methods used to mount accelerometers and their effect on frequency response.
Signal Conditioners
It is typical for a signal conditioner to be located in the measurement system between the transducer and the nal readout or recording instruments. Signal conditioners range from simple to sophisticated and can employ internal electronics for signicant signal modication or calculation of related physical quantities. Rather than describe the operating principles of signal conditioners, the following simply lists some of the key functions and available features: 1. 2. 3. 4. 5. 6. 7. Supply excitation voltage to a passive-circuit transducer (e.g., PR accelerometer) Charge conversion to voltage from a PE accelerometer Dial-in accelerometer sensitivity normalization Gain or attenuation control to provide optimum signal-to-noise ratio in the readout instrument Low-pass or high-pass lters Grounding options Internal electronics to perform functions such as single or double integration to obtain velocity or displacement data from acceleration signals
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FIGURE 19.7 Typical accelerometer mounting techniques and relative frequency response characteristics. (Source: Broch, J. T. 1984. Mechanical Vibration and Shock Measurement, 2nd ed. Bruel and Kjaer, Naerum, Denmark. Reproduced with permission of Bruel and Kjaer.) Continued.
Math capabilities, such as integration, differentiation, and multiaxis vector resolution SRS computation 3. Vibration analysis Power/auto spectrum analysis Frequency response and transfer functions Band power, harmonic power, and harmonic distortion measurements Waterfall analysis 4. Programming capabilities to allow user-dened functionality Digital control for vibration testing is generally tailored specically to closed-loop shaker control and would normally contain fewer general analysis capabilities as compared to an independent dedicated FFT analyzer. Functions typically include: 1. 2. 3. 4. 5. 6. Sine or random vibration control Swept-sine on random Narrow band random on random Multiple control and response channels Test control and abort limits Capability of using eld vibration data as shaker input signal
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7. Basic vibration data analysis (e.g., FFT, frequency response) Digital control for shock-testing refers specically to the case of controlling a shaker for shock test generation. Functions typically include: Classical waveform control (e.g., half sine) Direction of shock and multiple shock control Transient capture of real-world shock pulses and subsequent use as shaker control SRS and waveform synthesis, a function allowing the operator to specify a required SRS to the controller, which in turn synthesizes a control waveform resulting in the desired SRS 5. Basic waveform analyses such as single/double integration, vector resolution, FFT, and SRS computation This section has provided a brief introduction to some of the test equipment, capabilities, and performance considerations associated with dynamic test and measurement. The reader is reminded that the examples cited represent only a small sample of what is available and currently in use. More thorough presentation of the concepts introduced and additional discussion on application-specic methods and equipment can be found through the resources provided at the end of the section. 1. 2. 3. 4.
Dening Terms
Frequency response As a transducer characteristic, frequency response is the change of transducer sensitivity as a function of frequency. Normally, an operating frequency range is specied over
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which the sensitivity does not vary more than a stated percentage from the rated sensitivity. More generally, for a mechanical system, frequency response is a ratio of output response to input excitation as a function of frequency. g The acceleration produced by the force of gravity. Acceleration amplitudes are commonly described as multiples of g, where 1 g = 980. 665 cm/sec2 = 386.087 in./sec2 = 32.1739 ft/sec2. Shock response spectrum (SRS) Also called shock spectrum, the SRS is a curve that indicates a theoretical maximum response as a function of pulse duration and responding system natural frequency. The shock spectrum of a waveform is an indication of the shocks damage potential in the frequency domain. Transducer A device that provides a usable output in response to a specied measurand [ANSI/ISA S37.1-1975]. Velocity change The acceleration-time integral or the area under an acceleration-time shock pulse waveform. It is a function of the energy of the shock pulse and can be related to other physical quantities such as equivalent free-fall drop height.
References
ANSI/ISA S37.1-1975. Electrical Transducer Nomenclature and Terminology. American National Standard, Instrument Society of America, Research Triangle Park, NC. Broch, J. T. 1984. Mechanical Vibration and Shock Measurement, 2nd ed. Bruel and Kjaer, Naerum, Denmark. IEC 68-2-27. 1987. Basic Environmental Testing Procedures Part 2: Test-Test Ea: Shock, International Electrotechnical Commission, Geneva, Switzerland. Unholtz, K. 1988. Vibration testing machines. In Shock and Vibration Handbook, 3rd ed., ed. C. M. Harris, p. 2516. McGraw-Hill, New York.
Further Information
Texts Bendat, J. S. and Piersol, A. G. 1971. Random Data: Analysis and Measurement Procedures, WileyInterscience, New York. Gopel, W., Hesse, J., and Zemel, J. N. 1989. Sensors: A Comprehensive Survey, VCH Verlagsgesellschaft MBH, Weinheim, Federal Republic of Germany. Harris, C. M. 1988. Shock and Vibration Handbook, 3rd ed. McGraw-Hill, New York. Norton, H. 1989. Handbook of Transducers, Prentice Hall, Englewood Cliffs, NJ. Ramirez, R. W. 1985. The FFT, Fundamentals and Concepts, Prentice Hall, Englewood Cliffs, NJ. Journals Sound and Vibration, Acoustical Publications, Inc., Bay Village, OH. Journal of the IES, Institute of Environmental Sciences, Mount Prospect, IL. Journal of Sound and Vibration, Academic Press Ltd., London, England. Noise and Vibration Worldwide, IOP Publishing, Bristol, England. The Shock and Vibration Digest, The Vibration Institute, Willowbrook, IL.