3-1

TM
File Number 3577.7
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil and Design is a trademark of Intersil Corporation. | Copyright Intersil Corporation 2000
HI1175
8-Bit, 20 MSPS, Flash A/D Converter
The HI1175 is an 8-bit, analog-to-digital converter built in a
1.4m CMOS process. The low power, low differential gain
and phase, high sampling rate, and single 5V supply make
the HI1175 ideal for video and imaging applications.
The adoption of a 2-step ash architecture achieves low
power consumption (60mW) at a maximum conversion
speed of 20 MSPS (Min), 35 MSPS typical with only a 2.5
clock cycle data latency. The HI1175 also features digital
output enable/disable and a built in voltage reference. The
HI1175 can be congured to use the internal reference or an
external reference if higher precision is required.
Features
Resolution . . . . . . . . . . . . . . . . . . . . 8-Bit 0.3 LSB (DNL)
Maximum Sampling Frequency . . . . . . . . . . . . . .20MSPS
Low Power Consumption . . . . . . 60mW (at 20MSPS Typ)
(Reference Current Excluded)
Built-In Sample and Hold Circuit
Built-In Reference Voltage Self Bias Circuit
Three-State TTL Compatible Output
Single +5V Power Supply
Low Input Capacitance. . . . . . . . . . . . . . . . . . . 11pF (Typ)
Reference Impedance . . . . . . . . . . . . . . . . . . . 300 (Typ)
Evaluation Board Available (HI1175-EV)
Low Cost
Direct Replacement for the Sony CXD1175
Applications
Video Digitizing
PC Video Capture
Image Scanners
TV Set Top Boxes
Multimedia
Personal Communication Systems (PCS)
Pinout
HI1175 (SOIC)
TOP VIEW
Ordering Information
PART NUMBER
TEMP.
RANGE (
o
C) PACKAGE
PKG.
NO.
HI1175JCB -40 to 85 24 Ld SOIC M24.2-S
HI1175-EV 25 Evaluation Board
DV
SS
D0 (LSB)
D1
D2
D3
D4
D6
D5
DV
DD
CLK
V
RB
AV
SS
V
IN
AV
DD
V
RBS
V
RT
V
RTS
AV
DD
AV
DD
DV
DD
OE DV
SS
1
2
3
4
5
6
7
8
9
10
11
12
16
17
18
19
20
21
22
23
24
15
14
13
D7 (MSB)
AV
SS
Data Sheet September 2000
3-2
Functional Block Diagram
Typical Application Schematic
LOWER
DATA
LATCHES
UPPER
DATA
LATCHES
LOWER
ENCODER
(4-BIT)
LOWER
ENCODER
(4-BIT)
UPPER
ENCODER
(4-BIT)
LOWER
COMPARATORS
WITH S/H (4-BIT)
UPPER
COMPARATORS
WITH S/H (4-BIT)
REFERENCE VOLTAGE
CLOCK GENERATOR
OE
DV
SS
D0 (LSB)
D1
D2
D3
D4
D5
D6
D7 (MSB)
DV
DD
CLK
11
10
9
8
7
6
5
4
3
2
1
12
LOWER
COMPARATORS
WITH S/H (4-BIT)
24
23
20
21
22
19
14
15
16
17
18
13
DV
SS
V
RB
V
RBS
AV
SS
AV
SS
V
IN
AV
DD
V
RT
V
RTS
AV
DD
AV
DD
DV
DD
0.6V (Typ)
2.6V (Typ)
: Ceramic Chip Capacitor 0.1F.
: Analog GND.
: Digital GND.
NOTE: It is necessary that AV
DD
and DV
DD
pins be driven fromthe same supply. The gain of analog input signal can be changed by adjusting
the ratio of R2 to R1.

D0 (LSB)
D1
D2
D3
D4
D6
D5
CLK
1
2
3
4
5
6
7
8
9
10
11
12
16
17
18
19
20
21
22
23
24
15
14
13
D7 (MSB)
V
IN
+
C9
4.7F
HC04
CLOCK IN
+5V
C10
0.1F
+5V
C12
0.1F
C8

+
C7
4.7F
C11
0.1F
+5V
R12
+
-
CA158A
HI1175
R4
+
-
CA158A
R5
ICL8069
R11
+
-
HA2544
R2
R1
R13
R3
HI1175
3-3
Pin Descriptions and Equivalent Circuits
PIN
NUMBER SYMBOL EQUIVALENT CIRCUIT DESCRIPTION
1 OE When OE = Low, Data is valid.
When OE = High, D0 to D7 pins high impedance.
2, 24 DV
SS
Digital GND.
3-10 D0 to D7 D0 (LSB) to D7 (MSB) Output.
11, 13 DV
DD
Digital +5V.
12 CLK Clock Input.
16 V
RTS
Shorted with V
RT
generates, +2.6V.
17 V
RT
Reference Voltage (Top).
23 V
RB
Reference Voltage (Bottom).
14, 15, 18 AV
DD
Analog +5V.
19 V
IN
Analog Input.
20, 21 AV
SS
Analog GND.
22 V
RBS
Shorted with V
RB
generates +0.6V.
1
DV
DD
DV
SS
D1
12
DV
DD
DV
SS
16
AV
DD
AV
DD
AV
SS
17 23
AV
DD
AV
SS
19
22
AV
SS
HI1175
3-4
Absolute Maximum Ratings Thermal Information
Supply Voltage, V
DD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7V
Reference Voltage, V
RT
, V
RB
. . . . . . . . . . . . . . . . . . . . V
DD
to V
SS
Analog Input Voltage, V
IN
. . . . . . . . . . . . . . . . . . . . . . . V
DD
to V
SS
Digital Input Voltage, CLK . . . . . . . . . . . . . . . . . . . . . . . V
DD
to V
SS
Digital Output Voltage, V
OH
, V
OL
. . . . . . . . . . . . . . . . . . V
DD
to V
SS
Operating Conditions (Note 1)
Temperature Range, T
A
. . . . . . . . . . . . . . . . . . . . . . . -40
o
C to 85
o
C
Supply Voltage
AV
DD
, AV
SS
, DV
DD
, DV
SS
. . . . . . . . . . . . . . . . +4.75V to +5.25V
| DGND-AGND|. . . . . . . . . . . . . . . . . . . . . . . . . . . . 0mV to 100mV
Reference Input Voltage
V
RB
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0V and Above
V
RT
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.8V and Below
Analog Input Range, V
IN
. . . . . . . V
RB
to V
RT
(1.8V
P-P
to 2.8V
P-P
)
Clock Pulse Width
t
PW1
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min)
t
PW0
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min)
Thermal Resistance (Typical, Note 1)
JA
(
o
C/W)
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . 150
o
C
Maximum Storage Temperature Range, T
STG
. . . . . -65
o
C to 150
o
C
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . 300
o
C
(SOIC - Lead Tips Only)
CAUTION: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specication is not implied.
NOTE:
1.
JA
is measured with the component mounted on an evaluation PC board in free air.
Electrical Specications f
C
= 20 MSPS, V
DD
= +5V, V
RB
= 0.5V, V
RT
= 2.5V, T
A
= 25
o
C (Note 1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SYSTEM PERFORMANCE
Offset Voltage - - - -
E
OT
-60 -35 -10 mV
E
OB
0 +15 +45 mV
Integral Non-Linearity, INL f
C
= 20 MSPS, V
IN
= 0.6V to 2.6V - 0.5 1.3 LSB
Differential Non-Linearity, DNL f
C
= 20 MSPS, V
IN
= 0.6V to 2.6V - 0.3 0.5 LSB
DYNAMIC CHARACTERISTICS
Effective Number of Bits, ENOB f
IN
= 1MHz - 7.6 - Bits
Spurious Free Dynamic Range f
IN
= 1MHz - 51 - dB
Signal to Noise Ratio, SINAD f
C
= 20MHz, f
IN
= 1MHz - 46 - dB
f
C
= 20MHz, f
IN
= 3.58MHz - 46 - dB
Maximum Conversion Speed, f
C
V
IN
= 0.6V to 2.6V, f
IN
= 1kHz Ramp 20 35 - MSPS
Minimum Conversion Speed - - 0.5 MSPS
Differential Gain Error, DG NTSC 40 IRE Mod Ramp, f
C
= 14.3 MSPS - 1.0 - %
Differential Phase Error, DP - 0.5 - Degree
Aperture Jitter, t
AJ
- 30 - ps
Sampling Delay, t
DS
- 4 - ns
Data Latency, t
LAT
- - 2.5 Cycles
ANALOG INPUTS
Analog Input Bandwidth (-1dB), BW - 18 - MHz
Analog Input Capacitance, C
IN
V
IN
= 1.5V + 0.07V
RMS
- 11 - pF
RMS Signal
RMS Noise Di storti on +
------------------------------------------------------------------ =
HI1175
3-5
REFERENCE INPUT
Reference Pin Current, I
REF
4.5 6.6 8.7 mA
Reference Resistance (V
RT
to V
RB
),
R
REF
230 300 450
INTERNAL VOLTAGE REFERENCE
Self Bias Mode 1 - - - -
V
RB
Short V
RB
and V
RBS
, Short V
RT
and V
RTS
0.60 0.64 0.68 V
V
RT
- V
RB
1.96 2.09 2.21 V
Self Bias Mode 2, V
RT
V
RB
= AGND, Short V
RT
and V
RTS
2.25 2.39 2.53 V
DIGITAL INPUTS
Digital Input Voltage - - - -
V
IH
4.0 - - V
V
IL
- - 1.0 V
Digital Input Current - - - -
I
IH
V
DD
= Max V
IH
= V
DD
- - 5 A
I
IL
V
IL
= 0V - - 5 A
DIGITAL OUTPUTS
Digital Output Current - - - -
I
OH
OE = V
SS
, V
DD
= Min V
OH
= V
DD
-0.5V -1.1 - - mA
I
OL
V
OL
= 0.4V 3.7 - - mA
Digital Output Current - - - -
I
OZH
OE = V
DD
, V
DD
= Max V
OH
= V
DD
- 0.01 16 A
I
OZL
V
OL
= 0V - 0.01 16 A
TIMING CHARACTERISTICS
Output Data Delay, t
DL
- 18 30 ns
POWER SUPPLY CHARACTERISTIC
Supply Current, I
DD
f
C
= 20 MSPS, NTSC Ramp Wave Input - 12 17 mA
NOTE:
2. Electrical specifications guaranteed only under the stated operating conditions.
Timing Diagrams
FIGURE 1.
Electrical Specications f
C
= 20 MSPS, V
DD
= +5V, V
RB
= 0.5V, V
RT
= 2.5V, T
A
= 25
o
C (Note 1) (Continued)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
PW1
t
PW0
CLOCK
ANALOG INPUT
DATA OUTPUT
N
N - 2 N + 3 N + 4
N - 3 N - 2
N - 1 N N + 1
t
D
= 18ns
: POINT FOR ANALOG SIGNAL SAMPLING
N + 1
HI1175
3-6
FIGURE 2.
Typical Performance Curves
FIGURE 3. SUPPLY CURRENT vs SUPPLY VOLTAGE FIGURE 4. SUPPLY CURRENT AND POWER vs SAMPLING
RATE
Timing Diagrams (Continued)
ANALOG INPUT
EXTERNAL CLOCK
UPPER COMPARATOR BLOCK
UPPER DATA
LOWER REFERENCE VOLTAGE
LOWER COMPARATOR BLOCK A
LOWER DATA A
LOWER COMPARATOR BLOCK B
LOWER DATA B
DIGITAL OUTPUT
V
I
(1) V
I
(2) V
I
(3) V
I
(4)
S (1) C (1) S (2) C (2) S (3) S (4) C (3) C (4)
MD (0) MD (1) MD (2) MD (3)
RV (0) RV (1) RV (2) RV (3)
S (1) C (1) S (3) C (3) H (3) H (1)
LD (-1) LD (1)
H (0) C (0) S (2) H (2) C (2) S (4) H (4)
LD (-2) LD (0) LD (2)
OUT (-2) OUT (-1) OUT (0) OUT (1)
POWER SUPPLY VOLTAGE (V)
I
D
D

(
m
A
)
20
15
10
5
4.0 4.5 5.0 5.5
SAMPLING RATE (MSPS)
20 25 30 35
I
D
D

(
m
A
)
20
15
10
5
15 10 5 0
V
PP
= 5.0V, V
RT
= 2.5V, V
RB
= 0.5V
T
A
= 25
o
C, V
IN
= 2V
P-P
100
50
P
O
W
E
R

D
I
S
S
I
P
A
T
I
O
N

(
m
W
)
HI1175
3-7
FIGURE 5. DIFFERENTIAL NON-LINEARITY vs INPUT
FREQUENCY
FIGURE 6. HI1175JCP SNR vs INPUT FREQUENCY
FIGURE 7. HI1175JCP ENOB vs INPUT FREQUENCY FIGURE 8. HI1175JCP THD vs INPUT FREQUENCY
FIGURE 9. ENOB vs CLOCK FREQUENCY FIGURE 10. INL vs TEMPERATURE
Typical Performance Curves (Continued)
T
A
= 25
o
C, V
RT
= 2.5V, V
RB
= 0.5V
V
DD
= 5.0V, f
C
= 20 MSPS
INPUT FREQUENCY (MHz)
0 2 4 6 8 10
0
0.2
0.6
1.0
1.4
D
I
F
F
E
R
E
N
T
I
A
L

N
O
N
-
L
I
N
E
A
R
I
T
Y

(
L
S
B
)
50
49
48
47
46
45
44
43
42
41
40
0 1 2 3 4 5 6 7 8 9 10 11
INPUT FREQUENCY (MHz)
(
d
B
)
ENCODE 26MHz
ENCODE 31MHz
ENCODE 21MHz
8.00
7.75
7.50
7.25
7.00
6.75
6.50
6.25
5.75
5.25
5.00
0 1 2 3 4 5 6 7 8 9 10 11
INPUT FREQUENCY (MHz)
(
B
I
T
S
)
5.50
6.00
ENCODE 26MHz
ENCODE 31MHz
ENCODE 21MHz
-30
-33
-35
-38
-40
-43
-45
-48
-50
-53
-55
0 1 2 3 4 5 6 7 8 9 10 11
INPUT FREQUENCY (MHz)
(
d
B
)
ENCODE 26MHz
ENCODE 31MHz
ENCODE 21MHz
f
IN
= 1MHz
21 26 31 36
8.00
7.75
7.50
7.25
7.00
6.75
6.50
6.25
5.75
5.25
5.00
5.50
6.00
CLOCK FREQUENCY (MHz)
E
N
O
B

(
B
I
T
S
)
f
IN
= 5MHz
f
IN
= 10MHz
1.0
0.8
0.6
0.4
0.2
0
-0.2
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (
o
C)
I
N
L

(
L
S
B
)
HI1175
3-8
FIGURE 11. DIGITAL OUTPUT VOLTAGE vs TEMPERATURE FIGURE 12. SUPPLY CURRENT vs TEMPERATURE
FIGURE 13. DNL vs TEMPERATURE FIGURE 14. SFDR vs TEMPERATURE
FIGURE 15. THD vs TEMPERATURE FIGURE 16. ENOB vs TEMPERATURE
Typical Performance Curves (Continued)
I
OH
= -3.7mA
I
OH
= 1.1mA
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (
o
C)
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
O
U
T
P
U
T

V
O
L
T
A
G
E

(
V
)
f
C
= 35MHz
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (
o
C)
20
18
16
14
12
10
S
U
P
P
L
Y

C
U
R
R
E
N
T

(
m
A
)
f
C
= 20MHz
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (
o
C)
0.2
0.15
0.1
0.05
0
-0.05
-0.1
-0.15
D
N
L

(
L
S
B
)
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (
o
C)
54
53
52
51
50
49
48
S
F
D
R

(
d
B
)
f
IN
= 1MHz
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (
o
C)
-48
-49
-50
-51
-52
-53
-54
T
H
D

(
d
B
)
f
IN
= 1MHz
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (
o
C)
8.0
7.9
7.8
7.7
7.6
7.5
7.2
E
N
O
B

(
B
I
T
S
)
f
IN
= 1MHz
7.4
7.3
HI1175
3-9
FIGURE 17. V
RT
vs TEMPERATURE FIGURE 18. V
RT
- V
RB
vs TEMPERATURE
FIGURE 19. V
RB
vs TEMPERATURE FIGURE 20. OUTPUT DATA DELAY vs TEMPERATURE
A/D OUTPUT CODE TABLE
INPUT SIGNAL
VOLTAGE STEP
DIGITAL OUTPUT CODE
MSB D6 D5 D4 D3 D2 D1 LSB
V
RT
255 1 1 1 1 1 1 1 1

128 1 0 0 0 0 0 0 0
127 0 1 1 1 1 1 1 1

V
RB
0 0 0 0 0 0 0 0 0
Typical Performance Curves (Continued)
TEMPERATURE (
o
C)
V
R
T
(
V
)
2.5
2.45
2.4
2.35
-15 10 35 60
2.3
85 -40
V
RT
SHORTED TO V
RTS
V
RB
= AGND
TEMPERATURE (
o
C)
V
R
T

-
V
R
B

(
V
)
2.2
2.15
2.1
2.05
-15 10 35 60
2.0
85 -40
V
RB
SHORTED TO V
RBS
V
RT
SHORTED TO V
RTS
TEMPERATURE (
o
C)
V
R
B

(
V
)
0.75
0.7
0.65
0.6
-15 10 35 60
0.55
85 -40
V
RB
SHORTED TO V
RBS
V
RT
SHORTED TO V
RTS
TEMPERATURE (
o
C)
D
A
T
A

D
E
L
A
Y

(
n
s
)
25
20
15
10
-15 10 35 60
0
85 -40
OUTPUT RISING EDGE
5
OUTPUT FALLING EDGE
HI1175
3-10
Detailed Description
The HI1175 is a 2-step A/D converter featuring a 4-bit upper
comparator group and two lower comparator groups of 4 bits
each. The reference voltage can be obtained from the
onboard bias generator or be supplied externally. This ICuses
an offset canceling type comparator that operates
synchronously with an external clock. The operating modes of
the part are input sampling (S), hold (H), and compare (C).
The operation of the part is illustrated in Figure 2. A
reference voltage that is between V
RT
-V
RB
is constantly
applied to the upper 4-bit comparator group. V
I
(1) is
sampled with the falling edge of the rst clock by the upper
comparator block. The lower block A also samples V
I
(1) on
the same edge. The upper comparator block nalizes
comparison data MD(1) with the rising edge of the rst clock.
Simultaneously the reference supply generates a reference
voltage RV(1) that corresponds to the upper results and
applies it to the lower comparator block A. The lower
comparator block nalizes comparison data LD(1) with the
rising edge of the second clock. MD(1) and LD(1) are
combined and output as OUT(1) with the rising edge of the
third clock. There is a 2.5 cycle clock delay from the analog
input sampling point to the corresponding digital output data.
Notice how the lower comparator blocks A and B alternate
generating the lower data in order to increase the overall A/D
sampling rate.
Power, Grounding, and Decoupling
To reduce noise effects, separate the analog and digital
grounds.
In order to avoid latchup at power up, it is necessary that
AV
DD
and DV
DD
be driven from the same supply.
Bypass both the digital and analog V
DD
pins to their
respective grounds with a ceramic 0.1F capacitor close to
the pin.
Analog Input
The input capacitance is small when compared with other
ash type A/D converters. However, it is necessary to drive
the input with an amplier with sufcient bandwidth and drive
capability. In order to prevent parasitic oscillation, it may be
necessary to insert a low value (i.e., 0.24) resistor between
the output of the amplier and the A/D input.
Reference Input
The range of the A/D is set by the voltage between V
RT
and
V
RB
. The internal bias generator will set V
RTS
to 2.6V and
V
RBS
to 0.6V. These can be used as the part reference by
shorting V
RT
and V
RTS
and V
RB
to V
RBS
. The analog input
range of the A/D will now be from 0.6V to 2.6V and is
referred to as Self Bias Mode 1. Self Bias Mode 2 is where
V
RB
is connected to AGND and V
RT
is shorted to V
RTS
. The
analog input range will now be from 0V to 2.4V.
Test Circuits
FIGURE 21. INTEGRAL AND DIFFERENTIAL NON-LINEARITY ERROR AND OFFSET VOLTAGE TEST CIRCUIT
-
V
IN
HI1175
DUT 8
CLK (20MHz)
+
A<B A>B
COMPARATOR
A8
A1
A0
B8
B1
B0
0 1
8
S1
S2
-V
+V
S1 : ON IF A < B
S2 : ON IF A > B
BUFFER
DVM
CONTROLLER
8
TO
111 10
000 00
TO TO
HI1175
3-11
FIGURE 22. MAXIMUM OPERATIONAL SPEED AND DIFFERENTIAL GAIN AND PHASE ERROR TEST CIRCUIT
FIGURE 23. DIGITAL OUTPUT CURRENT TEST CIRCUIT
HA5020 (Single)
HA5022(Dual)
HA5024 (Quad)
HA5013 (Triple)
HI1175 (8-Bit) HSP9501
HSP48901
HSP43881
HSP43168
HI3338 (8-Bit)
HI1171 (8-Bit)
HA5020 (Single)
HSP9501: Programmable Data Buffer
HSP48901: 3 x 3 Image Filter, 30MHz, 8-Bit
HSP43881: Digital Filter, 30MHz, 1-D and 2-D FIR Filters
HSP43168: Dual FIR Filter, 10-Bit, 33MHz/45MHz
CMOS Logic Available in HC, HCT, AC, ACT and FCT.
HA5013: Triple, 125MHz, I
OUT
= 20mA
HA5020: Single, 100MHz, I
OUT
= 30mA, Output Enable/Disable
HA5022: Dual, 125MHz, I
OUT
= 20mA, Output Enable/Disable
HA5024: Quad, 125MHz, I
OUT
= 20mA, Output Enable/Disable
FIGURE 24. 8-BIT SYSTEM COMPONENTS
Test Circuits (Continued)
SIGNAL
SOURCE
NTSC
SG
V
IN 8 8
SCOPE
VECTOR
620
DG
ERROR RATE
SG
(CW)
AMP
HI1175
DUT
ECL
TTL
D/A
10-BIT
-5.2V
CLK
1
2
1
2
HPF COUNTER
DP
620
-5.2V
ECL
TTL
f
C
-40
0
100
IRE
SYNC
BURST
0.6V
2.6V
40 IRE
MODULATION
0.6V
2.6V
f
C
-1kHz
HI20201
V
RT
V
IN
V
RB
CLK
OE
GND
V
DD
0.6V
2.6V
V
OL
I
OL
+
-
V
RT
V
IN
V
RB
CLK
OE
GND
V
DD
0.6V
2.6V
V
OH
I
OH
+
-
HI1175 HI1175
A/D D/A DSP/P
REFERENCE
ICL8069
AMP AMP
HI1175
3-12
Static Performance Denitions
Offset, full scale, and gain all use a measured value of the
internal voltage reference to determine the ideal plus and
minus full scale values. The results are all displayed in LSBs.
Offset Error (E
OB
)
The rst code transition should occur at a level
1
/
2
LSB
above the bottom reference voltage. Offset is dened as the
deviation of the actual code transition from this point. Note
that this is adjustable to zero.
Full Scale Error (E
OT
)
The last code transition should occur for a analog input that
is 1
1
/
2
LSBs below full scale. Full scale error is dened as
the deviation of the actual code transition from this point.
Differential Linearity Error (DNL)
DNL is the worst case deviation of a code width from the
ideal value of 1 LSB. The converter is guaranteed to have no
missing codes.
Integral Linearity Error (INL)
INL is the worst case deviation of a code center from a best
t straight line calculated from the measured data.
Dynamic Performance Denitions
Fast Fourier Transform (FFT) techniques are used to
evaluate the dynamic performance of the HI1175. A low
distortion sine wave is applied to the input, it is sampled, and
the output is stored in RAM. The data is then transformed
into the frequency domain with a 1024 point FFT and
analyzed to evaluate the dynamic performance of the A/D.
The sine wave input to the part is -0.5dB down from fullscale
for all these tests. The distortion numbers are quoted in dBc
(decibels with respect to carrier) and DO NOT include any
correction factors for normalizing to fullscale.
Signal-to-Noise Ratio (SNR)
SNR is the measured RMS signal to RMS noise at a
specied input and sampling frequency. The noise is the
RMS sum of all of the spectral components except the
fundamental and the rst ve harmonics.
Signal-to-Noise + Distortion Ratio (SINAD)
SINAD is the measured RMS signal to RMS sum of all
other spectral components below the Nyquist frequency
excluding DC.
Effective Number Of Bits (ENOB)
The effective number of bits (ENOB) is derived from the
SINAD data. ENOB is calculated from:
ENOB = (SINAD - 1.76 + V
CORR
) / 6.02,
where: V
CORR
= 0.5dB.
Total Harmonic Distortion
This is the ratio of the RMS sum of the rst 5 harmonic
components to the RMS value of the measured input signal.
2nd and 3rd Harmonic Distortion
This is the ratio of the RMS value of the 2nd and 3rd
harmonic component respectively to the RMS value of the
measured input signal.
Spurious Free Dynamic Range (SFDR)
SFDR is the ratio of the fundamental RMS amplitude to the
RMS amplitude of the next largest spur or spectral
component. If the harmonics are buried in the noise oor it is
the largest peak.
Full Power Input Bandwidth
Full power bandwidth is the frequency at which the
amplitude of the digitally reconstructed output has
decreased 3dB below the amplitude of the input sine wave.
The input sine wave has a peak-to-peak amplitude equal to
the reference voltage. The bandwidth given is measured at
the specied sampling frequency.
Timing Denitions
Sampling Delay (t
SD
)
Sampling delay is the time delay between the external
sample command (the falling edge of the clock) and the time
at which the signal is actually sampled. This delay is due to
internal clock path propagation delays.
Aperture Jitter (t
AJ
)
This is the RMS variation in the sampling delay due to
variation of internal clock path delays.
Data Latency (t
LAT
)
After the analog sample is taken, the data on the bus is
available after 2.5 cycles of the clock. This is due to the
architecture of the converter where the data has to ripple
through the stages. This delay is specied as the data
latency. After the data latency time, the data representing
each succeeding sample is output at the following clock
pulse. The digital data lags the analog input by 2.5 cycles.
Output Data Delay (t
D
)
Output Data Delay is the delay time from when the data is
valid (rising clock edge) to when it shows up at the output
bus. This is due to internal delays at the digital output.
HI1175
3-13
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certication.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with-
out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
HI1175