Professional Documents
Culture Documents
Judicael Aubry
Pascal Venet
I.
I NTRODUCTION
swell
float
pendular
wheel
SEAREV
power electronic converters
to the
grid
electrical
generator
stator & rotor
IESS
mooring
cable
A. Electrical model
The electrical model chosen to represent a supercapacitor is the series connection of a capacitance C
and resistance ESR (Equivalent Series Resistance). The
temperature dependence of these parameters has not
been considered herein. More complex models exist,
yet this simplified one is sufficient to compute losses
with the level of precision required for a sizing process.
Moreover, these electrical parameters are given in the
manufacturers datasheet.
B. Classical Eyrings Law
The classical aging model for supercapacitors is
Eyrings Law, which yields the lifetime. For our purposes, the lifetime is considered when the capacity C
is reduced by 20 % or the resistance ESR is doubled.
Calendar tests are performed to determine the parameters
of this equation. Voltage and temperature remain constant
over time in these tests.
!
cref c
ref
Tlif e (V, c ) = Tlif e exp ln(2)
0
!
(1)
V ref V
exp ln(2)
V0
where Tlif e is the lifetime in hours, c the case temperature, and V the voltage across the component. 0 and V0
are the respective decreases in temperature and voltage
ref
necessary to double the lifetime. Tlif
e is the lifetime, in
ref
hours, for a case temperature of c (here, the maximum
operating temperature, 65 C) with a voltage of V ref
(here, the rated voltage, 2.7 V).
We deduce from (1) a dynamical aging model which
leads to the same result. The hypothesis introduced at this
time is that degradation speed is solely dependent on V
0
8.7 K
10 K
10 K
8.6 K
V0
100 mV
100 mV
95 mV
87 mV
ref
Tlif
e
1500 h
1550 h
1910 h
1500 h
1450 h
1500 h
Tlif e (2.7 V, 25 C)
Tlif e (0 V, 70 C)
Maxwell datasheets [3]
10 years
4 years
LUSAC [4]
4.3 years*
IMS [5]
RWTH [6]
2.7 years*
16 106 years*
PSI [7]
2.6 years*
42 106 years*
Amp`ere [8]
4.4 years*
260 106 years*
* These values correspond to extrapolations.
lif e
!
(3)
ref
V
V
exp ln(2)
+ K
V0
where K is a dimensionless constant that replaces the
voltage term whenever voltage is low. This adjustment
is arbitrary and must be considered with caution: others
low-voltage experiments are necessary to confirm or
rebut this model.
A total of 23 calendar experiments from [3][9]
have been examined for the purpose of optimizing the
ref
four parameters (Tlif
e , 0 , V0 and K ). Regression is
applied on log(Tlif e ). Results are shown in Table II. The
(4)
(5)
10
Model @70C
Model @65C
Model @50C
Model @30C
Exp. @70C
Exp. @65C
Exp. @50C
Exp. @30C
Lifetime (h)
10
10
10
10
0.5
R2 = 96 %
1.5
2
2.5
Capacitor Voltage (V)
3.5
TABLE II.
III.
7.7 K
89 mV
29.103
1470 h
2.7 V
65 C
5.9 years
3.7 years
90
SoA = 0%
0
V0
K
ref
Tlif
e
V ref
cref
Tlif e (2.7 V, 25 C)
Tlif e (0 V, 70 C)
C/C (%)
Experiments
Model
Conventional aging limits
SoA = 50%
SoA = 100%
80
SoA = 150%
70
40
60
80
100
ESR1/ESR1
(%)
0
B. Thermal model
The self-heating effect is very important because the
degradation rate accelerates exponentially with respect
to temperature. The thermal time constant of the cell
(around 1900 s for the BCAP3000 cell) is considered
herein to be high enough relative to the time cycle
(typically a few tens of seconds) so as to neglect case
temperature variations. In order to determine the case
temperature of the elements, we thus introduce a simple
static thermal model:
c = a + Rthca < ESR I(t)2 >
(6)
(i)
SoA = 0
t=0
C(C0, SoA)
ESR(ESR0, SoA)
ESR
Cycle
definition
200
Exponential model
Experiments
100
50
R2 = 71%
20
40
45
50
55
60
65
70
Relative RMS current IRMS/C0 @(SoA = 50%) (mA/F)
V(t)
(i)
k(i)
Ageing Acceleration
acc
(i)
Aging model
<dSoA/dt>
t = t + SoA / <dSoA/dt>
SoA = SoA + SoA
SoA 1
Tlife = t
(i)
Tlif e
(i)
Tlif e
(7)
lif e
!
ref
V V
(8)
+ K
exp ln(2)
V0
!
IRM S
exp kRM S
C0
where IRM S is an approximation of the RMS current
flowing through the component.
The computation of IRM S involves a three-step procedure: 1) compute the square current (9), then 2) filter it
with a first-order low-pass filter and time constant f ilter
(10), and finally 3) take the root square of the result (11).
x(t) = I(t)2
X(s)
Y (s) =
1 + f ilter s
p
IRM S (t) = y(t)
(9)
(10)
(11)
Component variability.
TABLE III.
0
V0
K
ref
Tlif
e
V ref
ref
kRM S
f ilter
7.7 K
89 mV
29.103
1470 h
2.7 V
65 C
68 s.V1
45 s
3
2
1/5
40
70
/C (mA/F)
RMS
80
IV.
1/3
1/2
0.079. This constraint will be used to size the individual Energy Storage System (ESS), which is controlled
individually.
PProd
Flicker
PGrid constraint
Grid
Production
PSto
Prod
P
Power-Energy
Management
*
PSto
Storage
Sto
(15)
PGrid =
(16)
PGrid
(17)
(18)
0.5
Esto (kWh)
0
1.6
SoA = 0
SoA = 1
1.4
1
2.6
Total (SoA = 0)
Capacitive (SoA = 0)
Total (SoA = 1)
Capacitive (SoA = 1)
2.5
2.4
2.3
2.2
4.1
4.2
4.3
4.4
4.5
4.6
Time (min)
4.7
4.8
4.9
Fig. 8. Power production, grid power, stored energy and ESS voltage
vs. time with the two extreme aging values for an energy rating of
2 kWh - Extracted from a 30-minute simulation
SoA (%)
100
50
PLoss (kW)
0
3.5
3
2.5
2
0.3
0.2
Averaged over an hour
Averaged over 13 years
0.1
0
6
Time (year)
10
(23)
1.2
12
Power (MW)
Production
Grid (SoA = 0)
Grid (SoA = 1)
No aging considered
200
Losses
Replacement
Investment
Insufficient size
2.2 kWh
80 k
100
0
Conventional aging model
200
2.2 kWh
80 k
100
3.1 kWh
87 k
0
Enhanced aging model
200
2.2 kWh
140 k
100
3.1 kWh
90 k
2
3
Energy rating (kWh)
C ONCLUSION
N OMENCLATURE
C
C0
CESS
CESS0
Clif e
ESR
ESR0
ESRESS
ESRESS0
ESto
Hs
I
IESS
IRM S
K
(i)
kacc
kRM S
NCells
NReplace
Number of Energy Storage System replacements during the useful life of the
entire system [-]
Plt
Long-term flicker severity [-]
PGrid
Grid power (after smoothing) [W]
PLoss
Power losses in the Energy Storage System [W]
PP rod
Production power (before smoothing)
[W]
PSto
Stored power in the Energy Storage System [W]
Rthca
Thermal resistance between the case and
the ambient temperature [K.W1 ]
SoA
State-of-Aging: equal to 0 at the beginning and reaches 1 when C = 0.8 C0 or
ESR = 2 ESR0 [-]
Tlif e (V, c ) Lifetime with a terminal voltage of the
capacity V and case temperature c [h]
ref
Reference lifetime for a reference case
Tlif
e
ref
ref , ref ), a
condition Tlif
c
e = Tlif e (V
constant parameter for the aging model
[h]
(i)
Tlif e
Lifetime measured for experiment i [h]
(i)
Tlif e
Estimation thanks to an aging model of
the lifetime for experiment i [h]
Tp
Peak period of a sea-state (8 s here) [s]
V
Capacitive voltage of the cell [V]
V ref
Reference value for V (2.7 V here) [V]
V0
Constant parameter for the aging law [V]
VESS
Capacitive voltage of the cell [V]
VRated
Rated capacitive voltage of the cell
(2.7 V here) [V]
SoA
Aging resolution for the lifetime estimations (1 % here) [-]
0
Constant parameter for the aging law [K]
a
Ambient temperature [C]
c
Case temperature of the cell [C]
cref
Reference value for c (65 C) [C]
f ilter
Time constant of the filter used to compute IRM S (in seconds)
Sto
Time constant of the smoothing filter
applied by the Energy Storage System
with its energy policy (in seconds)
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[1]
[2]
[4]
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
[14]
[15]
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Electronics, IEEE Transactions on, vol. PP.
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[17]
[18]
[19]
[20]
[21]
[22]
[23]
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