CN3135 PROCESS SAFETY, HEALTH AND ENVIRONMENT

(RELIABILITY ENGINEERING TUTORIAL)

Question 1:
Given the fault tree gates shown in Figure 1 below and the following set of failure
probabilities:
(i)

(ii)

(v)

L1

L1

L2

OR

OR

AND

L1
OR

AND

T
AND

OR

(iv)

OR

AND

(iii)

Figure 1
Component

Failure Probability

0.1

0.2

0.3

0.4

(a) Determine an expression for the probability of the top event in terms of the component
failure probabilities.
(b) Determine the minimal cut sets.
(c) Compute a value for the failure probability of the top event. Use both the expression of
part (a) and the fault tree itself.

Question 1 (SOLUTION):

Question 2:
The storage tank system shown in Figure 2 is used to store process feedstock. Overfilling of
storage tanks is a common problem in the process industries. To prevent overfilling, the
storage tank is equipped with a high-level alarm and a high-level shutdown system. The
high-level shutdown system is connected to a solenoid valve that stops the flow of input
stock.
System
High-level alarm
Operator stops
flow
High-level switch
system

Failures /
demand
0.01
0.1
0.01

Figure 2 Level Control System with Alarm

(a) Develop an event tree for this system using the failure of level indicator as the
initiating event. Given that the level indicator fails 4 times / yr, estimate the number of
overflows expected per year. Use the data in the table provided above.
(b) Develop a fault tree for the top event of storage tank overflows. Use the data in Table
12-1 (from Textbook) to estimate the failure probability of the top event and the
expected number of occurrences per year. Determine the minimal cut sets. What are
the most likely failure modes? Should the design be improved?

Question 2 (SOLUTION):

Reliability (R = e (-mt))
0.549
0.183
0.803
0.183
0.957
0.657
0.183

Probability (P = 1 - R)
0.451
0.817
0.197
0.817
0.043
0.343
0.817
0.853
0.825
0.704
0.838
0.880
0.737

1
2
3
4
5
6
7

Flow control valve

Level measurement
Chart recorder
Level measurement
Alarm
Solenold valve
Level Switch / measurement

Faults/yr (m = -ln(R))
0.6
1.7
0.22
1.7
0.044
0.42
1.7

2&3
4&5
E&F
1&C
6&7
B&D

OR gate (F)
OR gate (E)
AND gate (C)
OR gate (B)
OR gate (D)
AND gate (A)

1.920
1.744
1.218
1.818
2.118
1.335

0.147
0.175
0.296
0.162
0.120
0.263

-ln(R)

R = 1-P

MBTF = 1/m =

0.749

Question 3:
Using the system shown in Figure 3 below, draw the fault tree and determine the failure
characteristics of the top event (vessel pressure exceeds MAWP)

Figure 3 A control system to prevent the pressure from exceeding the MAWP

Question 3 (SOLUTION):

1 Level measurement
2 Controller
3 Pressure Switch
4 Valve
5 Pressure Measurement
6 Controller
7 Pressure Switch
8 Valve
LIC =
PIC =
Probability of top event =
reliability, R of top event =
m of top event =
MTBF =

Faults/yr (m=-LN(R))
1.7
0.29
0.14
0.6
1.41
0.29
0.14
0.6

Reliability (R = e (-mt))
0.183
0.748
0.869
0.549
0.244
0.748
0.869
0.549

Probability (P = 1 - R)
0.817
0.252
0.131
0.451
0.756
0.252
0.131
0.451

2.73
2.44
0.853
0.147
1.919
0.521

0.065
0.087

0.935
0.913

Question 4:
Determine P, R, and the MTBF for the top event of the system shown in Figure 4. Also list
the minimal cut sets.

Figure 4 Determine the failure characteristics of the top event

Question 4 (SOLUTION):

1
2
3
4
5
1&2
3&4
34 & 5
345 & 12

AND gate
OR gate
OR gate
OR gate

Faults/yr (m = -ln(R))
0.25
0.4
0.3
0.4
1

Reliability (R = e (-mt))
0.779
0.670
0.741
0.670
0.368

Probability (P = 1 - R)
0.221
0.330
0.259
0.330
0.632

0.076
0.7
1.7
1.776

0.927
0.497
0.183
0.169

0.073
0.503
0.817
0.831

MBTF = 1/m =

0.563

Question 5:
Using the system shown in Figure 5, draw the fault tree and determine the failure
characteristics of the top event (vessel overflow). In this problem you have human
intervention; that is, when the alarm sounds, someone turns off valve 7.

Figure 5 Control system to prevent vessel overflow

Question 5 (SOLUTION):

1
2
3
4
5
6
7
12
12 & 3 & 7
456
1237 & 456

Chart
Alarm
Level measurement
Solenoid valve
Controller
Level measurement
Hand Valve

Faults/yr (m = -ln(R))
0.22
0.044
1.7
0.42
0.29
1.7
0.13

Reliability (R = e (-mt))
0.803
0.957
0.183
0.657
0.748
0.183
0.878

Probability (P = 1 - R)
0.197
0.043
0.817
0.343
0.252
0.817
0.122

AND gate
OR gate
OR gate
AND gate

0.009
1.839
2.410
1.450

0.991
0.159
0.090
0.235

0.009
0.841
0.910
0.765

MBTF = 1/m =

0.69