You are on page 1of 3

ro/rl~rl/r~r2/r3

.....

rg]rlo.

As a result of this operation, we have the equality ro = rl = r2 = ... = r~o. Then using
the ratio measure, the unshunted decades of arms R and RI are calibrated for all positions of
switch $3, the results of which are taken into account when making measurements.
After calibration, the ratio box can be used for precision comparisons of resistors with nondecimalmultiple values in the range of i-I0 s ~.
Using the methods and apparatus described above, we can obtain measurement results with
an error on the order of (0.5-1)'10 -6 with temperature regulation of the measuring devices
and standard measures such that temperature variations do not exceed 0.01-0.03~
The methods and apparatus for measurement of nondecimal-multiple resistance values are
constantly being improved.
This work is chiefly aimed at eliminating the need for calibration of the measuring instruments for measuring resistors of any nominal value of from 10 -I
to 109 ~ and reducing measurement errors to (1-2).10 -7 .
LITERATURE CITED
1.
2.
3.
.

5.
6.
7.

K. V. Klitzing, G. Dorda, and M. Pepper, Phys. Rev. Lett., 45, 494 (1980).
M. A. Vernikov et al., Pis'ma Zh. Tekh. Fiz., 8, No. 13, 820 (1982).
T. M. Gushchina, A. M. Teplinskii, and V. P. Shigorin, Methods of Precision Measurement
of the Parameters of Measuring Circuits [in Russian], Mashinostroenie, Moscow (1967).
V. P. Shigorin, Tr. Metrolog. Inst. SSSR, No. 82 (142), 32 (1965).
V. P. Shigorin, Izmer. Tekh., No. 4, 33 (1960).
S. V. Gorbatsevich and V. P. Shigorin, Tr. Metrolog. Inst. SSSR, No. 52 (112), 27 (1961).
V. P. Shigorin and E. S. Pavlenko, USSR Inventor's Certificate No. 415591, Byull. Izobret., No. 6 (1974).

ACTIVE-PROBE MEASUREMENT OF THE ELECTRIC-FIELD STRENGTH OF AN


ELECTROMAGNETIC PULSE
UDC 621.373.5:621.317.7

Yu. I. Buyanov, E. A. Gostishchev,


V. B. Ponomarev, A. V. Samoilik,
and N. I. Yagushkin

In physics experiments, it is often necessary to measure the amplitude of noise and its
spectral composition near a source of electromagnetic radiation, i.e., in the near zone of
a radiation source against the background of a strong desired signal [i]. We shall describe
active wideband probes for measuring the electric-field strength of an electromagnetic pulse
(EMP) in the near zone of a radiation source, formulate requirements for the absence of
frequency distortions of the EMP signal to be controlled, and give expressions for the reduced effective lengths of two types of probes and the results of an experimental check.
The proportionality factor between the electric-field strength of the EMP and the potential difference across the load of the probe we shall call the reduced effective length of
the probe.
We shall consider the properties of a probe in the form of a piece of wire whose
diameters is much smaller than its linear dimension 1. The wire is placed above a metal surface and its lower end is connected through a line (a length of cable) to the load resistance
Zl~ Using traveling-wave superposition, the electric-current distribution along the probe is
expressed as

I Eo(Ocos.~U-~)
l(x)- -f-zl i~ctg(,,~l]o)
where x is the moving coordinate along th~ probe; Eo(t)
field; e is the angle between the vector E and the axis
is the characteristic resistance of a wire of diameter
frequency; and v is the velocity of current propagation

'

is the amplitude of the recording


of the wire; p = 6 0 [ i n ( 2 1 / a )
-- i]
2a and length l; m is the oscillation
along the wire.

Translated from Izmeritel'naya Tekhnika, No. 7, pp. 50-51, July, 1984.

634

0543-1972/84/2707-0634508o50

(1)

9 1984 Plenum Publishing Corporation

k.~f

b
Fig. 1
The load voltage U(t) = I(O)z I and, therefore,

the reduced effective length of the probe

L=(O,Slzl:osO)/[2~-~pctg(~l/v)].
F o r a " s h o r t " p r o b e , f o r w h i c h ~ l / v << 1, c o n s i d e r i n g t h a t w = L r
and v -~ = LC~rC'
and C' a r e t h e r u n n i n g i n d u c t a n c e and c a p a c i t a n c e o f t h e p r o b e ) we h a v e f r o m (2)

(2)
(L'

L=(O,5lz[c~

(3)

where C is the probe capacitance with respect to ground.


It follows from analysis of expression (3) that the equivalent circuit of the probe can
be represented as an emf source connected in series with capacitance C and loaded by the load
impedance z I. To eliminate frequency distortions, the probe load must be capacitive.
This
is easily realized by connecting the probe to the high-impedence input of a cathode follower.
Note that the total capacitance of the load C1 = Cin + Cc, where Cin is the stray capacitance
of the cathode-follower input and C c is the cable capacitance.
With these considerations, we
rewrite expression (3) as

L--(O,5I.,RLCcosO)/[o,RI(C } C I) E 11.
If

T--~

(4)

the reduced effective length will not be a function of the frequency of the received signal:

L=(O,S&osO)](C+Cz)

(5)

E x p r e s s i o n (5) r e l a t e s
the reduced length of the probe to the parameters of the recordi n g circuit and the geometric dimensions of the probe.
Condition (4) essentially coincides
with that obtained in [2] but is more stringent.
If C = 1-5 pF, C 1 = 50 pF, and R l = i 0 6
(then RIC 1 = 50 ~sec), condition (4) is satisfied for most types of industrial noise, for
which the duration of EMP signals does not exceed T; for longer EMP durations, condition (4)
can be satisfied by increasing capacitance C l and resistance R I.
It is sometimes convenient to make the probe in the form of a piece of wire connected
to a cable of length h that is also located in the EMP field.
This design resembles a miniature top-fed antenna [3]. The inner conductor and the inner surface of the braid make up a
two-conductor line, while the outer jacket is a short-circuited line.
Taking condition (4)
into account, the expression for the effective length is written as

L=(h+U2)cosO[C/(C+Cl) ] .

(6)

S i n c e c a p a c i t a n c e C i s a f u n c t i o n o f 1 and u s u a l l y C1 >> C, t h e l o a d v o l t a g e U i s d i r e c t l y
proportional
t o (h + l / 2 ) l .
When h 0 U' % 1 2 / 2 , w h i c h f o l l o w s f r o m ( 5 ) .
F o r an e x p e r i m e n t a l check, it is convenient to use the relation

U/U'=l+2l/h.

(7)

C o n d i t i o n (4) and f o r m u l a s ( 5 ) - ( 7 ) w e r e c h e c k e d e x p e r i m e n t a l l y .
A uniform field E(t)
was created between two plane-parallel plates with a G5-15 pulse generator; the distance between the plates was smaller by a factor of 8-12 than their characteristic dimensions.
The
probe was placed at the center of the plates, where nonuniformity of the field could be ignored.
The signal from the generator was fed through a divider to one of the inputs of an
SI-74 oscilloscope and the signal from the probe was fed through a cathode follower to the
other input.
Oscillograms for EMP durations of l a n d 1 0 ~ s e c a r e shown in Fig. l a a n d b , where
the solid curve shows the sisnal from the generator and the dashed curve indicates the sig-

635

nal from the probe load. The input gains of the


amplitudes were equal.
It can be seen from Fig.
while in b, considerable distortions are noted;
seen from b, is about 15 Hsec. Thus, amplitude
condition (4) is satisfied.

oscilloscope were set so that the signal


la that the pulse shape is not distorted,
the time constant of the probe, as can be
and phase distortions are eliminated when

In the experimental check of formulas (5)-(7), the voltages on the plates and at the
probe output were measured from the oscilloscope screen with an error of 5-7%. Relations
U(t) = f(E) for various I for the first type of probe and relations U/U' = f(21/h) for the
second type were obtained experimentally.
The deviations of the experimental relations from
the calculations do not exceed 5-10%.
These probes were used to determine the electric-field strength of EMP in a spark test
of structural polymer dielectrics, which were electrified with an electron beam. Practice
has shown that these probes can be successfully used for measurements in the near zone of a
radiation source.
The sensitivity of the probes can be increased by increasing their capacitance, for example, by thickening the open end.
Since the inductive reactance of these
probes at radio frequencies up to 200-300 MHz is negligible in comparison with their capacitive reactance, the effect of a variable magnetic field on the probes is also very small.
LITERATURE CITED

2.

Yu. I. Buyanov et al., All-Union Sci. Conf. on Electric Pulse Tech. and Electromagnetic
Processes in Charged Solids [in Russian], Tomsk (1982), p. 148.
Yu. A. Medvedev, B. M. Stepanov, and G. V. Fedorovich, Zh. Tekh. Fiz., No. 8, 1579

3.

M. V. Vershkov, Marine Antennas

l.

(1978).
[in Russian], Sudostroenie,

Leningrad

(1972).

DIGITAL METER FOR SILICON CHARGE-CARRIER LIFETIME


A. I. Safronov

UDC 539.293.011.252:621.3.083.92

Determination of charge-carrier lifetime in semiconductors according to the drop in photoconductivity is one of the most convenient methods from the point of view of automation.
The
lifetime T is defined as the time constant of photoconductivity relaxation [i]. Automatic
measurement of 9 for two levels of the photoconductivity signal that differ by a factor of e
is easily realized but is reliable only when the relaxation process is strictly exponential.
This makes it necessary to design recording circuits that allow the exponential nature of
the relaxation to be monitored simultaneously with lifetime measurement.
The described device automatically measures the "time constant" in two regions of the
photoconductivity-signal drop and calculates the difference between the obtained values.
Th~ test of deviation of the relaxation process from exponential is the ratio of the obtained
difference to one of the measured values of the time constant.
A schematic diagram of the
meter is shown in Fig. i. The device is synchronized with a clock-pulse generatore (CPG),
which uses integrated circuits DI.I (KI55TLI), D2, D3 (two KI55IEI), and D5.1 (KI55M2).
Schmitt trigger DI.I shapes from the pulsating line-frequency voltage (VI, type KDI02), TTLlevel pulses, which, after division by i00 by dividers D2 and D3, trigger a current-pulse generator (IPG), which uses integrated circuit D6 (KI55AGI) and transistors V8 (KT646) and V9
(KT626).
The load of the IPG is a light-emitting diode VIO (ALl07), which illuminates the
semiconductor under study.
The IPG pulses have a duration of 1 ~sec and an amplitude of 1 A.
The photoconductivity pulse from the instrumant transducer goes to a sampling-storage
device (SSD), which contains a linear amplifier (K544UD2B), an analog switch [V2 (KP302B),
V3 (KD512), V4 (KT325), and V5 (KT326)], a storage capacitor C = i000 pF, and a buffer follower A2 (K544UD2B).
The SSD is switched to the storage mode by the trailing edge of the IPG
pulse, storing the amplitude Uo of the photoresponse pulse.
From divider RI-R3, voltages
UI = Uo/e and U2 = Uo/e 2 (e = 2.72) are fed as reference voltages to the "J' inputs of comTranslated from Izmeritel'naya Tekhnika, No. 7, pp. 51-52, July, 1984.

636

0543-1972/84/2707- 0636508,50

9 1984 Plenum Publishing Corporation

You might also like