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MCP1826 MCP1826S
DDPAK-5 TO-220-5 DDPAK-3 TO-220-3
Fixed/Adjustable
1 2 3
1 2 3
1 2 3 4 5
1 2 3 4 5
SOT-223-5 SOT-223-3
6 4
1 2 3 4 5 1 2 3
PWRGD
R1
On 100 kΩ
Off SHDN
1 VOUT = 1.8V @ 1000 mA
VIN = 2.3V to 2.8V VIN VOUT
GND
C1
C2
4.7 µF 1 µF
VADJ
R2
R1 20 kΩ
On 40 kΩ
Off SHDN
1 VOUT = 1.2V @ 1000 mA
VIN = 2.3V to 2.8V VIN VOUT
C1
C2
4.7 µF 1 µF
GND
PMOS
VIN VOUT
Undervoltage
Lock Out
(UVLO)
ISNS Cf Rf
SHDN ADJ/SENSE
+
Driver w/limit
and SHDN EA
Overtemperature
Sensing –
SHDN
VREF
V IN
SHDN Reference
Soft-Start
Comp TDELAY
GND
92% of VREF
PMOS
VIN VOUT
Undervoltage Sense
Lock Out
(UVLO)
ISNS Cf Rf
SHDN
+
Driver w/limit
and SHDN EA
Overtemperature
Sensing –
SHDN
VREF
V IN
SHDN Reference
Soft-Start
Comp TDELAY
GND
92% of VREF
PMOS
VIN VOUT
Undervoltage Sense
Lock Out
(UVLO)
ISNS Cf Rf
SHDN
+
Driver w/limit
and SHDN EA
Overtemperature
Sensing –
SHDN
VREF
V IN
SHDN Reference
Soft-Start
PWRGD
Comp TDELAY
GND
92% of VREF
AC/DC CHARACTERISTICS
Electrical Specifications: Unless otherwise noted, VIN = VOUT(MAX) + VDROPOUT(MAX), Note 1, VR=1.8V for Adjustable Output,
IOUT = 1 mA, CIN = COUT = 4.7 µF (X7R Ceramic), TA = +25°C.
Boldface type applies for junction temperatures, TJ (Note 7) of -40°C to +125°C
Dropout Characteristics
Dropout Voltage VDROPOUT — 250 400 mV Note 5, IOUT = 1000 mA,
VIN(MIN) = 2.3V
Power Good Characteristics
PWRGD Input Voltage Operat- VPWRGD_VIN 1.0 — 6.0 V TA = +25°C
ing Range 1.2 — 6.0 TA = -40°C to +125°C
For VIN < 2.3V, ISINK = 100 µA
PWRGD Threshold Voltage VPWRGD_TH %VOUT Falling Edge
(Referenced to VOUT) 89 92 95 VOUT < 2.5V Fixed,
VOUT = Adj.
90 92 94 VOUT >= 2.5V Fixed
PWRGD Threshold Hysteresis VPWRGD_HYS 1.0 2.0 3.0 %VOUT
PWRGD Output Voltage Low VPWRGD_L — 0.2 0.4 V IPWRGD SINK = 1.2 mA,
ADJ = 0V
PWRGD Leakage PWRGD_LK — 1 — nA VPWRGD = VIN = 6.0V
PWRGD Time Delay TPG — 125 — µs Rising Edge
RPULLUP = 10 kΩ
Detect Threshold to PWRGD TVDET-PWRGD — 200 — µs VOUT = VPWRGD_TH + 20 mV
Active Time Delay to VPWRGD_TH - 20 mV
Shutdown Input
Logic High Input VSHDN-HIGH 45 — — %VIN VIN = 2.3V to 6.0V
Logic Low Input VSHDN-LOW — — 15 %VIN VIN = 2.3V to 6.0V
SHDN Input Leakage Current SHDNILK -0.1 ±0.001 +0.1 µA VIN = 6V, SHDN =VIN,
SHDN = GND
AC Performance
Output Delay From SHDN TOR — 100 — µs SHDN = GND to VIN
VOUT = GND to 95% VR
Output Noise eN — 2.0 — µV/√Hz IOUT = 200 mA, f = 1 kHz,
COUT = 10 µF (X7R Ceramic),
VOUT = 2.5V
Note 1: The minimum VIN must meet two conditions: VIN ≥ 2.3V and VIN ≥ VOUT(MAX) + VDROPOUT(MAX).
2: VR is the nominal regulator output voltage for the fixed cases. VR = 1.2V, 1.8V, etc. VR is the desired set point output
voltage for the adjustable cases. VR = VADJ * ((R1/R2)+1). Figure 4-1.
3: TCVOUT = (VOUT-HIGH – VOUT-LOW) *106 / (VR * ΔTemperature). VOUT-HIGH is the highest voltage measured over the
temperature range. VOUT-LOW is the lowest voltage measured over the temperature range.
4: Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Load regulation is
tested over a load range from 1 mA to the maximum specified output current.
5: Dropout voltage is defined as the input-to-output voltage differential at which the output voltage drops 2% below its
nominal value that was measured with an input voltage of VIN = VOUT(MAX) + VDROPOUT(MAX).
6: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction
temperature and the thermal resistance from junction to air. (i.e., TA, TJ, θJA). Exceeding the maximum allowable power
dissipation will cause the device operating junction temperature to exceed the maximum +150°C rating. Sustained
junction temperatures above 150°C can impact device reliability.
7: The junction temperature is approximated by soaking the device under test at an ambient temperature equal to the
desired junction temperature. The test time is small enough such that the rise in the junction temperature over the
ambient temperature is not significant.
Power Supply Ripple Rejection PSRR — 60 — dB f = 100 Hz, COUT = 4.7 µF,
Ratio IOUT = 100 µA,
VINAC = 100 mV pk-pk,
CIN = 0 µF
Thermal Shutdown Temperature TSD — 150 — °C IOUT = 100 µA, VOUT = 1.8V,
VIN = 2.8V
Thermal Shutdown Hysteresis ΔTSD — 10 — °C IOUT = 100 µA, VOUT = 1.8V,
VIN = 2.8V
Note 1: The minimum VIN must meet two conditions: VIN ≥ 2.3V and VIN ≥ VOUT(MAX) + VDROPOUT(MAX).
2: VR is the nominal regulator output voltage for the fixed cases. VR = 1.2V, 1.8V, etc. VR is the desired set point output
voltage for the adjustable cases. VR = VADJ * ((R1/R2)+1). Figure 4-1.
3: TCVOUT = (VOUT-HIGH – VOUT-LOW) *106 / (VR * ΔTemperature). VOUT-HIGH is the highest voltage measured over the
temperature range. VOUT-LOW is the lowest voltage measured over the temperature range.
4: Load regulation is measured at a constant junction temperature using low duty-cycle pulse testing. Load regulation is
tested over a load range from 1 mA to the maximum specified output current.
5: Dropout voltage is defined as the input-to-output voltage differential at which the output voltage drops 2% below its
nominal value that was measured with an input voltage of VIN = VOUT(MAX) + VDROPOUT(MAX).
6: The maximum allowable power dissipation is a function of ambient temperature, the maximum allowable junction
temperature and the thermal resistance from junction to air. (i.e., TA, TJ, θJA). Exceeding the maximum allowable power
dissipation will cause the device operating junction temperature to exceed the maximum +150°C rating. Sustained
junction temperatures above 150°C can impact device reliability.
7: The junction temperature is approximated by soaking the device under test at an ambient temperature equal to the
desired junction temperature. The test time is small enough such that the rise in the junction temperature over the
ambient temperature is not significant.
TEMPERATURE SPECIFICATIONS
140 0.10
VOUT = 1.2V Adj IOUT = 1 mA VOUT = 1.2V Adj
IOUT = 0 mA 0.09 VIN = 2.3V to 6.0V
Quiescent Current (μA)
90 -45°C 0.04
IOUT = 1000 mA
0.03
80
-45 -20 5 30 55 80 105 130
2 3 4 5 6
Input Voltage (V) Temperature (°C)
FIGURE 2-1: Quiescent Current vs. Input FIGURE 2-4: Line Regulation vs.
Voltage (Adjustable Version). Temperature (Adjustable Version).
180 0.15
IOUT = 1.0 mA to 1000 mA
VOUT = 1.2V Adj
170 VOUT = 3.3V
0.10
Load Regulation (%)
Ground Current (μA)
160
0.05
150 VOUT = 1.8V
VIN = 5.0V
140 0.00
VIN = 3.3V VOUT = 0.8V
VOUT = 5.0V
130
-0.05
120
-0.10
110 VIN = 2.3V
100 -0.15
0 250 500 750 1000 -45 -20 5 30 55 80 105 130
Load Current (mA) Temperature (°C)
FIGURE 2-2: Ground Current vs. Load FIGURE 2-5: Load Regulation vs.
Current (Adjustable Version). Temperature (Adjustable Version).
140 0.411
VOUT = 1.2V Adj VOUT = 1.2V
135 VIN = 6.0V
IOUT = 0 mA IOUT = 1.0 mA
Quiescent Current (μA)
130 0.410
125 VIN = 5.0V
120 VIN = 5.0V 0.409
115
110
105 0.408 VIN = 2.3V
VIN = 5.0V
100 VIN = 4.0V
95 VIN = 3.0V 0.407
90 VIN = 2.3V
85 0.406
-45 -20 5 30 55 80 105 130 -45 -20 5 30 55 80 105 130
Temperature (°C) Temperature (°C)
FIGURE 2-3: Quiescent Current vs. FIGURE 2-6: Adjust Pin Voltage vs.
Junction Temperature (Adjustable Version). Temperature (Adjustable Version).
0.30 150
VOUT = 0.8V
IOUT = 0 mA
FIGURE 2-7: Dropout Voltage vs. Load FIGURE 2-10: Quiescent Current vs. Input
Current (Adjustable Version). Voltage.
0.34 150
IOUT = 1.0A VOUT = 2.5V
140
130 +130°C
0.28 VOUT = 5.0V Adj
120 +90°C
110 +25°C
0.25 0°C
VOUT = 2.5V Adj 100 -45°C
0.22
90
0.19 80
-45 -20 5 30 55 80 105 130 3 3.5 4 4.5 5 5.5 6
Temperature (°C) Input Voltage (V)
FIGURE 2-8: Dropout Voltage vs. FIGURE 2-11: Quiescent Current vs. Input
Temperature (Adjustable Version). Voltage.
170.0000 200
Power Good Time Delay (µS)
FIGURE 2-9: Power Good (PWRGD) FIGURE 2-12: Ground Current vs. Load
Time Delay vs. Temperature. Current.
130 0.040
IOUT = 0 mA VR = 2.5V
125
Quiescent Current (μA)
FIGURE 2-13: Quiescent Current vs. FIGURE 2-16: Line Regulation vs.
Temperature. Temperature.
0.50
VR = 0.8V 0.30
VOUT = 0.8V
0.40 0.20 VIN = 2.3V
0.00 -0.30
-45 -20 5 30 55 80 105 130 -45 -20 5 30 55 80 105 130
Temperature (°C) Temperature (°C)
FIGURE 2-14: ISHDN vs. Temperature. FIGURE 2-17: Load Regulation vs.
Temperature (VOUT < 2.5V Fixed).
0.10 0.00
IOUT = 1 mA VOUT = 0.8V
IOUT = 1 mA to 1000 mA
VIN = 2.3V to 6.0V -0.05
Line Regulation (%/V)
IOUT = 50 mA -0.10
0.06 IOUT = 100 mA -0.15
-0.20
0.04 VOUT = 5.0V
-0.25
IOUT = 1A
0.02 -0.30
IOUT = 500mA
-0.35
0.00 -0.40
-45 -20 5 30 55 80 105 130 -45 -20 5 30 55 80 105 130
Temperature (°C) Temperature (°C)
FIGURE 2-15: Line Regulation vs. FIGURE 2-18: Load Regulation vs.
Temperature. Temperature (VOUT ≥ 2.5V Fixed).
0.30
10.000
VR=0.8V, VIN=2.3V COUT=1 μF ceramic X7R
0.25 CIN=10 μF ceramic
Dropout Voltage (V)
VOUT = 2.5V
0.05
0.00 0.010
0 200 400 600 800 1000 0.01 0.1 1 10 100 1000
Load Current (mA) Frequency (kHz)
FIGURE 2-19: Dropout Voltage vs. Load FIGURE 2-22: Output Noise Voltage
Current. Density vs. Frequency.
0.34 0
IOUT = 1000 mA
0.32 -10
Dropout Voltage (V)
PSRR (dB)
0.28 -30
FIGURE 2-20: Dropout Voltage vs. FIGURE 2-23: Power Supply Ripple
Temperature. Rejection (PSRR) vs. Frequency (Adjustable).
0
2.00
VOUT = 0.8V -10
1.80
Short Circuit Current (A)
1.60 -20
1.40
PSRR (dB)
-30
1.20
1.00 -40 VR=3.3V Fixed
0.80 -50 COUT=22 μF ceramic X7R
0.60 VIN=3.9V
-60 CIN=0 μF
0.40
0.20 -70 IOUT=10 mA
0.00 -80
0 1 2 3 4 5 6 0.01 0.1 1 10 100 1000
Input Voltage (V) Frequency (kHz)
FIGURE 2-21: Short Circuit Current vs. FIGURE 2-24: Power Supply Ripple
Input Voltage. Rejection (PSRR) vs. Frequency.
FIGURE 2-25: 2.5V (Adj.) Startup from VIN. FIGURE 2-28: Dynamic Line Response.
FIGURE 2-26: 2.5V (Adj.) Startup from FIGURE 2-29: Dynamic Load Response
Shutdown. (10 mA to 1000 mA).
FIGURE 2-27: Power Good (PWRGD) FIGURE 2-30: Dynamic Load Response
Timing. (100 mA to 1000 mA).
3.1 Shutdown Control Input (SHDN) 3.5 Power Good Output (PWRGD)
The SHDN input is used to turn the LDO output voltage The PWRGD output is an open-drain output used to
on and off. When the SHDN input is at a logic-high indicate when the LDO output voltage is within 92%
level, the LDO output voltage is enabled. When the (typically) of its nominal regulation value. The PWRGD
SHDN input is pulled to a logic-low level, the LDO threshold has a typical hysteresis value of 2%. The
output voltage is disabled. When the SHDN input is PWRGD output is delayed by 200 µs (typical) from the
pulled low, the PWRGD output also goes low and the time the LDO output is within 92% + 3% (max hystere-
LDO enters a low quiescent current shutdown state sis) of the regulated output value on power-up. This
where the typical quiescent current is 0.1 µA. delay time is internally fixed.
3.2 Input Voltage Supply (VIN) 3.6 Output Voltage Adjust Input (ADJ)
Connect the unregulated or regulated input voltage For adjustable applications, the output voltage is
source to VIN. If the input voltage source is located connected to the ADJ input through a resistor divider
several inches away from the LDO, or the input source that sets the output voltage regulation value. This
is a battery, it is recommended that an input capacitor provides the user the capability to set the output
be used. A typical input capacitance value of 1 µF to voltage to any value they desire within the 0.8V to 5.0V
10 µF should be sufficient for most applications. range of the device.
MCP1826-ADJ
The MCP1826/MCP1826S requires a minimum output
capacitance of 1 µF for output voltage stability. Ceramic
VOUT
capacitors are recommended because of their size,
On R1
cost and environmental robustness qualities.
Off 1 2 3 4 5 C2
SHDN ADJ 1 µF Aluminum-electrolytic and tantalum capacitors can be
VIN
used on the LDO output as well. The Equivalent Series
Resistance (ESR) of the electrolytic output capacitor
C1 R2
4.7 µF GND must be no greater than 1 ohm. The output capacitor
should be located as close to the LDO output as is
practical. Ceramic materials X7R and X5R have low
temperature coefficients and are well within the
FIGURE 4-1: Typical adjustable output acceptable ESR range required. A typical 1 µF X7R
voltage application circuit. 0805 capacitor has an ESR of 50 milli-ohms.
The allowable resistance value range for resistor R2 is Larger LDO output capacitors can be used with the
from 10 kΩ to 200 kΩ. Solving the equation for R1 MCP1826/MCP1826S to improve dynamic
yields the following equation: performance and power supply ripple rejection
performance. A maximum of 22 µF is recommended.
Aluminum-electrolytic capacitors are not recom-
mended for low-temperature applications of ≤ 25°C.
TJ = TJRISE + TA(MAX)
TJ = 30.12°C + 60.0°C
TJ = 90.12°C
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1 2 3 1 2 3
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
XXXXXXXXX MCP1826
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1.0EET^^
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1 2 3 4 5 1 2 3 4 5
Note: In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
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06/25/07