MSN510 Imaging Techniques in Materials Science and Nanotechnology
UNAM Institute of Materials Science and Nanotechnology
Bilkent University, 06800 Bilkent Ankara Course Information This course intends to give an introduction to imaging methods in Materials Science and Nanotechnology. Topics covered will include general fundamental concepts in image formation in parallel imaging systems such as optical microscopes and TEM. Sequential imaging systems such as confocal microscopes, scanning probe and electron/ion beam microscopies will be covered. Course includes laboratory work on available equipment. Theoretical descriptions of imaging modes and methods will be accompanied by technical information about the microscopes. Sample preparation techniques will be also be included whenever possible. Theoretical understanding will aim correct interpretation of microscope data. Fundamental limits of techniques will be discussed in detail in order to give the student an understanding of what is possible and what is not readily achievable with the presented techniques. Lecturer:
Aykutlu Dna aykutlu@unam.bilkent.edu.tr Office hours: Mon. 13:40-17:40
Teaching Assistants:
TBA
Course Schedule:
SU-01 Tue. 10:40-12:30, Fri. 9:40-10:30
Lab. Sessions to be organized
Prerequisites:
There are no prerequisites for the course. However, an
understanding of basic optics, basic mechanics, quantum physics and basic electromagnetics will be helpful.
Textbook:
The course will be based on handouts, no required
textbook is chosen.
Homework:
A total of five homeworks, weekly or bi-weekly is
planned. Late homeworks will not be accepted. (20%)
Exams:
One midterm (20%) and one final exam (30%)
Laboratory:
Laboratory sessions and demonstrations (20%)
Attendance:
Required (10%)
Tentative Course syllabus
Week : 1 Introduction, Description of course Organization, Determination of Laboratory Groups Fundamental Concepts in Imaging Optical Microscopy: Geometric Optics and the Lens, the Eye, Telescopes, Microscopes Week : 2 Wave picture of light, Interference , Diffraction, Numerical Aperture, Point spread function, Depth of Focus, Basic Fourier Optics, Concept of Modulation and Contrast Transfer Functions Additional Information: Homework 1: Basic concepts in imaging, point spread function Week : 3 Contrast Mechanisms in widefield optical microscopy: Bright field, Dark Field, DIC, Phase Contrast, Polarization, Staining Additional Information: Laboratory 1: Demonstration of contrast mechanisms in optical light microscopy Week : 4 Confocal microscopy. Sample scanning vs laser scanning: Role of abberations. Labeling. Dynamic techniques, Hyperspectral and Raman Imaging, structured illumination Week : 5 Contemporary topics and advanced optical microscopy: Stochastic methods, PALM, 4PI, STED, RESOLFT Additional Information: Laboratory 2: Confocal Raman and fluorescence Imaging Homework 2: Advanced techniques, deconvolution and stochastic reconstruction Week : 6 Scanning Tunneling Microscopy: Theoretical Descrition of tip-sample tunneling. STM components. Feedback control. Speed. Stability and Drifts. Vacuum and Low temperature STM. Application examples, Scanning Tunneling Spectroscopy and Spectroscopic Imaging. Interpretation of STM data. Week : 7 Atomic Force Microscopy: Basic Machinery, Deflection detection methods, control systems. Harmonic oscillator response. Contact mode AFM. Lateral Force Microscopy. Determination of spring constants Midterm 1 Week : 8 Non-contact and Semi-contact AFM: Basic tip-sample interaction. Force-distance measurements. Spatial resolution. Frequency shifts. Dissipation. Phase contrast. Amplitude-distance scans. Force Modulation Microscopy Additional Information: Laboratory 3: AFM Basics and Tapping mode Imaging. Homework 3: Force-Distance and Amplitude Distance simulations. Week : 9 Tapping mode AFM: Multi-Frequency techniques. Advanced imaging. Week : 10 Non-contact Imaging of long-range forces: Electrostatic force microscopy and Magnetic force microscopy. Kelvin Probe Microscopy.Tip-sample interaction models for electrostatic and magnetic imaging Week : 11 Imaging in Fluids: Dissipation, Q-Control Futher SPM techniques: SHPM, SSETM etc. Week : 12 Scanning Electron Microscopy : SEM Basics of electron optics, resolution in SEM. Contrast Mechanisms. Detectors. STEM. Sample preparation for the SEM,Analytical Methods in SEM Additional Information: Laboratory 4: TEM imaging Demo Week : 13 TEM Imaging: Theoretical Desciption of TEM image formation. Anatomy of the TEM. Sample preparation. Analytical Methods in TEM: EELS, EFTEM Week : 14 Review and Final Exam
Free Electron Lasers 2002: Proceedings of the 24th International Free Electron Laser Conference and the 9th FEL Users Workshop, Argonne, Illinois, U.S.A., September 9-13, 2002