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IEEE Guide for Measuring Earth Resistivity, Ground Impedance, and Earth Surface Potentials of a Grounding System
grid with an interconnected shield and neutral systems), such a representation is extremely difficult to
obtain.
Fall-of-Potential Graph
4.5
Impedance (ohms)
4
3.5
3
2.5
2
1.5
1
0.5
0
0
30
60
90
120
Figure 7 Typical impedance versus potential probe spacing for fall-of-potential method
Dr. G. F. Tagg [B58] described a method known as the slope method. In his method, the assumptions
of uniform soil resistivity and representation of the grounding electrode system as an equivalent
hemispherical electrode remained as before. However, his method allowed measuring the probe
distances from a convenient point such as from the edge of a grounding electrode system by introducing
the error distances in the fall-of-potential equation. Dr. Taggs slope method [B58] can be summarized
as follows:
a) Choose a convenient starting point for linear measurements and select a suitable distance for
the CP.
b) Measure resistances R1, R2, and R3 by inserting PPs at 0.2CP, 0.4CP, and 0.6CP distances,
respectively.
c) Calculate the slope-variation coefficient = (R3 R2) / (R2 R1).
d) Look up the value of PPT/CP corresponding to the value in Table 5.
e) Measure the resistance by placing the potential probe at PPT distance.
24
Copyright 2012 IEEE. All rights reserved.
Authorized licensed use limited to: York University. Downloaded on June 25,2014 at 04:38:47 UTC from IEEE Xplore. Restrictions apply.
PPT/CP
PPT/CP
PPT/CP
0.40
0.41
0.42
0.43
0.44
0.45
0.46
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
0.55
0.56
0.57
0.58
0.59
0.60
0.61
0.62
0.63
0.64
0.65
0.66
0.67
0.68
0.69
0.70
0.71
0.72
0.73
0.74
0.75
0.76
0.77
0.78
0.79
0.643
0.642
0.640
0.639
0.637
0.636
0.635
0.633
0.632
0.630
0.629
0.627
0.626
0.624
0.623
0.621
0.620
0.618
0.617
0.615
0.614
0.612
0.610
0.609
0.607
0.606
0.604
0.602
0.601
0.599
0.597
0.596
0.594
0.592
0.591
0.589
0.587
0.585
0.584
0.582
0.80
0.81
0.82
0.83
0.84
0.85
0.86
0.87
0.88
0.89
0.90
0.91
0.92
0.93
0.94
0.95
0.96
0.97
0.98
0.99
1.00
1.01
1.02
1.03
1.04
1.05
1.06
1.07
1.08
1.09
1.10
1.11
1.12
1.13
1.14
1.15
1.16
1.17
1.18
1.19
0.580
0.579
0.577
0.575
0.573
0.571
0.569
0.567
0.566
0.564
0.562
0.560
0.588
0.556
0.554
0.552
0.550
0.548
0.546
0.544
0.542
0.539
0.537
0.535
0.533
0.531
0.528
0.526
0.524
0.522
0.519
0.517
0.514
0.512
0.509
0.507
0.504
0.502
0.499
0.497
1.20
1.21
1.22
1.23
1.24
1.25
1.26
1.27
1.28
1.29
1.30
1.31
1.32
1.33
1.34
1.35
1.36
1.37
1.38
1.39
1.40
1.41
1.42
1.43
1.44
1.45
1.46
1.47
1.48
1.49
1.50
1.51
1.52
1.53
1.54
1.55
1.56
1.57
1.58
1.59
0.494
0.491
0.488
0.486
0.483
0.480
0.477
0.474
0.471
0.468
0.465
0.462
0.458
0.455
0.452
0.448
0.445
0.441
0.438
0.434
0.431
0.427
0.423
0.418
0.414
0.410
0.406
0.401
0.397
0.393
0.389
0.384
0.379
0.374
0.369
0.364
0.358
0.352
0.347
0.341
25
Copyright 2012 IEEE. All rights reserved.
Authorized licensed use limited to: York University. Downloaded on June 25,2014 at 04:38:47 UTC from IEEE Xplore. Restrictions apply.
I
V
p1
p2
d
K=
0.95
0.80
0.60
0.40
0.20
RATIO x/d IN %
80
70
K-0.0
60
-0.20
-0.40
-0.60
-0.80
-0.95
50
10 -4
p2 - p1
K= p p
2 +
1
10 -2
10 0
10 2
10 4
RATIO h/d
26
Copyright 2012 IEEE. All rights reserved.
Authorized licensed use limited to: York University. Downloaded on June 25,2014 at 04:38:47 UTC from IEEE Xplore. Restrictions apply.