Professional Documents
Culture Documents
Francesco Iannuzzo
I.
INTRODUCTION
A. Open-circuit Failure
IGBT open-circuit failure can happen after external
disconnection due to vibration, as well as bond wires lift-off or
rupture due to high short-circuit current. It may lead to
pulsating current, output current/voltage distortion, and result
in secondary failure of other components after some time.
Open-circuit can also be due to absence of gate drive signal.
The common reasons could be the damage of components in
drivers and the disconnection between driver board and IGBTs.
B. Short-circuit Failure
IGBT short-circuit failure modes can be classified with
respect to time-sequence as shown in Fig. 2 [13]. IGBT short
circuit during turn-on can be caused by high gate voltage and
external failure. Failure during on-state may be caused by static
latch-up or the rapid increase of intrinsic temperature caused by
second breakdown, as well as by energy shocks. Failure during
turn-off can be caused by dynamic latch-up and high voltage
breakdown. Failure during off-state may be due to thermal
runaway phenomenon. The detailed failure mechanisms will be
illustrated in the next section.
III.
IE
Rs
Ccb
IC
IG
NPN
parasitic
BJT
MOSFET
C
Fig. 3. The equivalent circuit of IGBT [21].
TABLE I.
Failure
Mechanisms
High voltage
breakdown
Latch-up
Second
breakdown
Energy
shocks
Failure
Location
Thermal
Behavior
At the edge
of active
area
Overheating on
few peripheral
cells at first, and
then spreads to
the whole chip
Active area
Overheating on a
stable subset of
cells of the
device
Emitter
regions
Emitter
regions
Al
metallization
layer, bond
wires lift-off
Local
overheating of
Al metallization
layer after 104
cycles
A. Device Redundancy
Contrary to modules, press-pack IGBTs intrinsically short
after a catastrophic failure, due to the absence of bond wires
and direct connection between die and metal contacts [45].
This feature can be profitably used for series redundancy,
where several devices work as a single-switch. Nowadays it is
widely used in traction, high power drives and power
transmission systems [46,47]. However, for the sake of
completeness, it should be pointed out that failed press-pack
IGBTs could be open-circuit after some time, due to the
interaction of molten aluminum (Al), molybdenum (Mo) and Si
leading to various intermetallics, following with poor
conductivity as open-circuit [48].
IV.
FAULT-TOLERANT CIRCUITS
TABLE II.
Fault-tolerant Design
Short-circuit
a
c
Open-circuit
Bypass Switches
CHBM/MMC
Four-leg Converter
Five-leg Converter
Fig. 5. Typical bypass switches redundant circuit [51].
Six-leg Converter
Matrix Converter
T-type Converter
Improved Boost Converter
HBALSC
a.
Maintain Operation with Normal Output; No fault-tolerant ability; Maintain Operation with Degraded
Output
C. State-redundant Converter
Some circuits have inherent redundant ability, such as the
sparse matrix converter [66-68], and T-type three-level
converter [69], which can handle open-circuit failure of
switches. Moreover, researchers also proposed modifications to
traditional converters to obtain fault-tolerant ability, such as an
improved three-level boost converter for photovoltaic
applications [70], an H-bridge DC-DC converter with auxiliary
leg and selector cells (HBALSC) [71].
A summary of fault-tolerant circuits performance with
respect to power switches failure is presented in Table II. It is
worth mentioning that short-circuit failure is more difficult to
handle than open circuit, and it usually needs very short
detection times.
V.
CONCLUSIONS
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