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I. INTRODUCTION
Ferroelectric switching properties have received much
attention since ferroelectric materials were discovered. A
ferroelectric material has spontaneous polarization without external electric field, and the polarization should
be switched in reverse with an electric field. Domain
dynamics have been studied experimentally and theoretically to understand ferroelectric switching properties
[14].
In the last decade, switching properties of ferroelectric
thin film capacitors have been studied intensively for ferroelectric random access memory (FeRAM) applications,
since ultra-fast writing and reading operation is one of
the merits of FeRAM devices [5, 6]. Phenomenological
Landau-Devonshire (LD) theory has been studied well,
to understand the ferroelectric phase transition and size
effects of ferroelectrics [7, 8]. The Landau-Khalatnikov
(LK) equation is a dynamical version of LD theory [9
11].
In this paper, the applicability of the LK equation
for the ferroelectric-switching hysteresis loop and pulseswitching current response is demonstrated. Partial
switching and external stress effects are studied. The
switching dynamics of differently shaped hysteresis loops
are compared.
dP
dG
=
,
dt
dP
(1)
II. SIMULATION
E-mail:
-5-
-6-
Journal of the Korean Physical Society, Vol. 46, No. 1, January 2005
1
1
1
1
G(P,
E) = g0 + g2 P 2 + g4 P 4 + g6 P 6 EP.(2)
2
4
6
2
The parameters g0 , g2 , g4 , and g6 in Eq. (2) have
been decided from the experimental data such as temperature dependent dielectric constants and hysteresis
loop shapes, i.e. Psat and Pr . For the well-known ferroelectric single crystals such as BaTiO3 and PbTiO3 , the
parameters have been reported [2,3].
Equation (1) can be rewritten with Eq. (2) as
dP
1
= E g2 P g4 P 3 g6 P 5 ,
0
dt
2
(3)
G(P,
E) = g0 + g2 P 2 + g4 P 4 + g6 P 6 EP,(4)
2
4
6
2
2. Partial-switching response
On decreasing the operating voltage of an FeRAM device, full switching is hardly obtainable. For full switching, the pulse height should be about 2 or 3 times larger
than the coercive field. However, even with a smaller
electric field, a part of the polarization is switched. The
switching responses with pulses of which the electric
fields are around the coercive field could be simulated
with the LK equation as shown in Figure 3 as an example. The parameters used in this example are g2 = 1,
g4 = 1, and g6 = 1 [14].
Ferroelectric thin film capacitors are inevitably exposed to a variety of stresses in fabrication and device
structure, so that the simulation of external stress effects
in FeRAM devices is essential to optimize the FeRAM
device design, and electromechanical properties of PZT
(5)
III. RESULTS
1. Application of LK equation in ferroelectric
switching
-7-
G(E,
P, ) = g0 + g2 P 2 + g4 P 4 + g6 P 6
2
4
6
1
EP Q012 (12 + 22 )P 2 ,
2
Fig. 4.
(a) Ferroelectric hysteresis loops of a
Pb(Zr0.52 Ti0.48 )O3 thin-film capacitor with and without external stresses. (b) Simulated hysteresis loops with LK equation with external stresses.
(6)
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Journal of the Korean Physical Society, Vol. 46, No. 1, January 2005
g4 (Jm5 /C4 )
2.4 109
2.4 109
2.4 109
g6 (Jm9 /C6 )
4.2 1010 2000
4.2 1010 2000
4.2 1010
500
IV. DISCUSSION
LK simulation is an easy and useful method to understand the switching properties for FeRAM application.
The switching phenomena in various electric fields are
easily obtained and external stress effects are well studied. Since LK simulation is based on a phenomenological
-9-
theory, it has some limits. This phenomenological simulation does not say anything about the microscopic mechanisms of various properties of ferroelectric thin films.
For the long-term reliability issues such as fatigue, retention, and imprint, new coupling terms should be introduced. Pulse-width-dependent ferroelectric properties such as the poling process are hard to treat in this
simulation. To investigate these reliability issues, new
terms such as odd-power polarization P 3 were introduced
[7,10].
V. SUMMARY
Ferroelectric switching properties such as hysteresis
loops and pulse current responses are simulated with the
aid of the LK equation. The LK simulation is proved to
be an easy and useful method to study switching properties of ferroelectrics and to understand FeRAM operation under various conditions. Partial switching and
external stress effects are studied. The relation between
the hysteresis-loop shape and pulse-switching responses
is investigated. The switching responses are well expressed with the conventional KAI model independent
of hysteresis-loop shape.
ACKNOWLEDGMENTS
This work was supported by Grant No. R01-2000-00000029-0 from the Basic Research Program of the Korea
Science and Engineering Foundation.
REFERENCES
[1] T. K. Song, J. Ahn, B. Yang, S. Aggarwal and R.
Ramesh, J. Korean Phys. Soc. 32, S1721 (1998).