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2. Extrinsic Semiconductor
Intrinsic Semiconductor
A semiconductor in which charge carriers are created only by increasing
temperature is known as an intrinsic semiconductor.
Expression for density of electrons in the conduction band
The number of electrons per unit volume in the conduction band at an
equilibrium temperature is called density (concentration) of electrons.
Let dn be the number of electrons in the conduction band in the energy
interval dE between E and E+dE in the conduction band at any
temperature T.
dn= Z(E) F(E) dE
WhereZ(E) dE is the density of energy states in the energy interval dE and
F(E) is the probability of occupation of an electron in the energy state E.
If Ec is the bottom of the conduction band, then the density of electrons in
n
Z ( E ) F ( E )dE
Ec
4
( 2m ) 3 / 2 E 1/ 2 dE can be written as
3
h
Now, Z ( E ) dE
Z ( E )dE
4
( 2me *) 3 / 2 E 1 / 2 dE , where m* is the effective mass of electron.
3
h
Z ( E )dE
And
4
(2me *)3 / 2 ( E Ec )1 / 2 dE
3
h
F (E)
1
E EF
E E
E E F =exp-- (
) =exp ( F
)
1 exp(
)
kT
kT
kT
4
( 2me *) 3 / 2 ( E E c )1 / 2 exp(
Ec
EF E
)dE
kT
4
E E
( 2me *)3 / 2 ( E Ec )1/ 2 exp( F
)dE
3
h
kT
Ec
4
E
E
( 2me *)3 / 2 exp( F ) ( E Ec )1/ 2 exp(
)dE
3
h
kT Ec
kT
E x
EF
4
3/ 2
n 3 ( 2me *) exp(
) x 1 / 2 exp ( c
)dE
h
kT 0
kT
4
E Ec
x
( 2me *) 3 / 2 exp( F
) x1/ 2 exp ( )dE
3
h
kT
kT
0
By gamma function
1/ 2
x
3/ 2
x exp ( )dE ( kT )
kT
2
1/ 2
1/ 2
4
E F Ec
3/ 2
3/ 2
n 3 ( 2me *) exp(
)( kT )
h
kT
2
n 2(
2me * kT 3 / 2
E Ec
) exp( F
)
2
h
kT
Ev
Z ( E )[1 F ( E )]dE
Now, Z ( E )dE
4
( 2m ) 3 / 2 E 1 / 2 dE can be written as
h3
Z ( E )dE
4
( 2mh *)3 / 2 E 1/ 2 dE , where m* is the effective mass of
h3
hole.
Since Ev is the top of the valence band
Z ( E )dE
[1 F ( E )] 1
And
4
( 2mh *)3 / 2 ( Ev E )1/ 2 dE
3
h
Ev
1
E EF
E E F = exp(
)
1 exp(
)
kT
kT
E EF
)dE
kT
v
4
E EF
3/ 2
(
2
m
*)
( E v E )1 / 2 exp(
)dE
h
3
h
kT
4
EF v
E
p 3 (2mh *) 3 / 2 exp(
) ( E v E )1 / 2 exp( )dE
h
kT
kT
E x
4
E
( 2mh *) 3 / 2 exp( F ) x 1 / 2 exp( v
)dE
3
h
kT 0
kT
E EF
4
x
( 2mh *) 3 / 2 exp( v
) x 1 / 2 exp(
)dE
3
h
kT
kT
0
By gamma function
x 1 / 2 exp (
x
1/ 2
)dE ( kT ) 3 / 2
kT
2
1/2
4
Ev E F
3/2
3/2
(2
m
*)
exp(
)(
kT
)
h
h3
kT
2
p 2(
E EF
2 mh * kT 3/2
) exp( v
)
2
h
kT
2 me * kT 3/2
E Ec
2 mh * kT 3/2
E EF
) exp( F
).2(
) exp( v
)
2
2
h
kT
h
kT
3
E Ec
2 kT
=> ni 2 4
( me * mh *) 3/2 exp( v
)
2
kT
h
ni 2 2(
3/2
E Ec
2 kT
( me * mh *)3/4 exp( v
)
2
2kT
h
3/2
E
2 kT
( me * mh *)3/4 exp( g ) , where E g Ec Ev band gap
2
h
2kT
=> ni 2
ni 2
2 me * kT 3/2
E Ec
2 mh * kT 3/2
E EF
) exp( F
) = 2(
) exp( v
) [1]
2
2
h
kT
h
kT
3/2
3/2
Eg
mh *
2 kT
3/4
ni 2
( me * mh *) exp(
)=
[2]
2
2kT
h
me *
m *
2 E F ( Ev Ec ) 3
log h
kT
kT
2
me *
i.e., 2(
=>
=>
=>
EF
m *
( Ev Ec ) 3kT
log h [3]
2
4
me *
EF
Ev Ec
2
Extrinsic Semiconductors
n 2(
2 m*e kT
h
)3/2 exp(
E F EC
) [1]
kT
Ed E F
)
kT
2(
2 m*e kT
h
) 3/2 exp(
E EF
E F EC
) [3]
) = N d exp( d
kT
kT
2 me * kT 3/2
E F EC
E EF
) -( d
) = log N d log 2(
)
kT
kT
h2
2 E F ( Ed EC ) kT log
EF
Nd
2 me * kT 3/2
2(
)
h2
( Ed EC ) kT
Nd
log
2 me * kT 3/2 [4]
2
2
2(
)
h2
EF
( Ed EC )
2
At 0 K, Fermi level lies exactly at the middle of the donor level E d and the
bottom of the conduction band Ec as shown in fig. Now, substituting E F
from equation [4] in equation [1] ,
1
Nd
log
EF EC
E d Ec
3/2
exp(
) = exp{(
)+2
}[5]
2 me * kT
2
kT
2kT
2
h
1/2
d
E EC
log
)+
= exp{( d
2 me * kT 3/2 1/2 }
2kT
[2(
) ]
2
N d 1/2
Ed EC
)
=[ exp(
2 me * kT 3/2 1/2 ]
[2(
) ]
2kT
h2
n 2
2 me * kT
h2
3/2
N d 1/2
E EC
2 me * kT 3/2 1/2 exp d
[6]
[2(
) ]
2kT
2
h
2 me * kT
h2
n (2 N d )1/2
3/4
Ed E
C
exp
[7]
2kT
Fig 1
p 2(
2 mh*kT 3/2
E EF
) exp( v
) [1]
2
h
kT
EF Ea
)
kT
At low temperatures, the no. of ionized acceptor impurities= no. of holes in the
valence band [2]
2(
2 m*h kT
h
) 3/2 exp(
E F Ea [3]
Ev E F =
)
) N a exp(
kT
kT
Na
Ev Ea 2 E F log
2 mh * kT 3/2
)
2(
)
kT
h2
EF
( Ev Ea ) kT
Na
log
2 mh * kT 3/2 [4]
2
2
2(
)
h2
Fig 2
EF
( Ev Ea )
2
N a1/2
Ev E F
Ev Ea
log
exp(
) = exp{(
)+
2 mh * kT 3/2 1/2 }
[2(
) ]
kT
2kT
h2
1/2
Na
E v Ea
=[ exp(
) 2 mh * kT 3/2 1/2 ]
[2(
) ]
kT
2
h
p 2
2 mh * kT
h2
3/2
N a1/2
E Ea
2 mh * kT 3/2 1/2 exp v
[6]
[2(
)
]
2
kT
h2
3/4
2 mh * kT
Ev E a
p (2 N a )
exp
h2
2kT
1/2
[7]
2.
3.
4.
5.
6.
7.
The
semiconductors
in
which
the
The
semiconductors
in
which
the
maximum of
maximum
the valence band coincides with the
of the valence band does not coincide
minimum
with the minimum of the conduction band
of the conduction band for the same value
for
of
the same value of the propagation
the propagation constant K is known asconstant
a
K is known as a indirect band gap
direct
semiconductor.
band gap semiconductor .
In these semiconductors the electron-hole
In these semiconductors the electronrecombination takes place directly from hole recombination does not take place
conduction band to valence band.
directly from conduction band to valence
band but via a trap centre in the forbidden
band.
Life time of the charge carriers is less due
Life time of the charge carriers is more
to
due to
direct recombinations.
indirect recombinations.
Current amplification is less
Current amplification is more
Light is produced due to recombinations.Heat is produced due to recombinations.
They are used for making LEDs, Laser
They are used in the manufacture of
diodes, ICs
diodes, transistors, amplifiers etc.
etc.
8.
The
elemental
semiconductors
like
Germanium and Silicon are best examples
for these
type of semiconductors.
Equation of continuity
The fundamental relation governing the rate of change of charge as a
function of both distance and time in a semiconductor is known as
equation of continuity which interprets the physical law of conservation of
charge in a material.
Fig 3
Let us consider the infinitesimal volume element of area A and length dx as
shown in fig 3. Let p be the average hole concentration within this volume. If p
is the mean life time of the holes, then holes lost/ sec/unit volume due to
recombination is (p/ p).
Now rate of change of charge within the volume= e A dx (p/ p) [1]
If g is the thermal rate of generation of electron-hole pairs, then the rate of
increase of charge within the volume= e A dx g [2]
If J(x) is the current density of the current entering and J(x+dx) is the current
density of the leaving current, then the rate of loss of charge due to the flow of
charge carriers = dJ. A [3]
Due to the above three effects, the hole density changes with time.
dp
[4]
dt
p
dp
dp
eAdxg
eAdx
dJ . A , where J peE h eD p [5]
dt
dx
p
e Adx
Under thermal equilibrium, the hole density attains a constant value po, when
there is no external field dJ =0 and (dp/dt)=0, then the equation becomes
po
[6]
p
Equation[6] indicates that the rate of generation of holes is equal to the rate
of loss due to recombination under thermal equilibrium conditions.
From [4], [5] and [6]
d 2 p
dp po p
d ( pE )
Dp
h
. This is called equation of continuity of
2
dt
p
dx
dx
charge.
Hall Effect
When a conductor (metal or semiconductor) carrying current is placed in a
transverse magnetic field, an electric field is produced inside the
conductor in a direction normal to both the current and the magnetic field.
This phenomenon is known as Hall Effect and the generated voltage is
called Hall voltage.
v
EH
BJ x
ne
Jx
e [6]
n
[7]
EH RH J x B [8]
RH
1
ne
[9]
Equation [9] represents hall coefficient and the positive sign indicates that
the hall field is developed in the positive y direction.
If the breadth of the sample is b and the voltage developed is VH, then
Hall voltage
VH EH b
VH RH J x Bb
From eqn[8],
bt
=> V R I x Bb =>
H
H
bt
VH RH
Ix
B
t
1
eRH