LED Standards and Methods of Measurements

LED Lighting Standards &
Methods of Measurements
Jianzhong Jiao, Ph.D.
OSRAM Opto Semiconductors Inc.
Cameron Miller, Ph.D.
National Institute of Standards and Technology
Outline
Part 1 LED lighting standards update
Introduction
LED lighting standards in practice
New standards development update
Methods of long-term projections
Part 2 Methods of measurements for LEDs and SSL
15
15
IES LM-79 SSL products photometry test

IES LM-80 LED lumen maintenance test
IES LM-85 LED photometry test
IES LM-82 LED light engine temperature dependence test
IES LM-84 SSL products lumen maintenance test
IES LM-86 Remote phosphor lumen maintenance test
LED Lighting Standards in Practice

ANSI Standard: ANSI/IES RP-16-2010,
Definitions
Purpose
To establish definitions for solid-state lighting
devices, and their components to insure a
common understanding of the terminology
New definitions added such as LED light engine
16
16

ANSI Standard: ANSI C78.377-2011, SSL
Chromaticity
Purpose
To specify the range of chromaticities recommended
for general lighting with SSL products, as well as to
ensure that the white light chromaticities of the
products can be communicated to consumers (for
indoor lighting).
Clarification
Lighting products outside of color zone poor color
quality
Lighting products meeting this standard color
consistency
The standard does not reflect users visual preference,
acceptability, and adoptability for white color
ANSI standard is not the same as for the Energy Star
requirements
17

IES Document: IES LM-79-08, SSL Photometry
Test
Purpose
To describe the procedures in performing
reproducible measurements of total luminous
flux, electrical power, luminous intensity
distribution, and chromaticity, of SSL products
for illumination purposes, under standard
conditions.
Clarification
There is no pass or
fails criteria for this
document
21

IES Document: IES LM-80-08, LED Lumen
Maintenance Test
Purpose
To provide the methods of the measurement of
lumen maintenance of sources including LED
packages, arrays and modules only
This approved method does not
provide guidance or make any recommendation
regarding predictive estimations or extrapolation for
lumen maintenance beyond the limits of the lumen
maintenance determined from actual
measurements.
22

IES TM-21: LED Lumen Maintenance
Projection
Propose
Provide a calculation tool to interpret the data collected
from LM-80 testing; to provide users with lumen
maintenance life (e.g., L70) projection, or to predict
estimated lumen output values at a given time
duration; to interpolate lumen maintenance behaviors
for the in-situ temperature (different from testing
temperature)
Clarification
There is no pass or fails criteria for this document
23

IES Document: IES LM-82-10, LED Light
Engine Temperature Dependence Test
Purpose
To provide a method that describes the procedures to
be followed and precautions to be observed in
performing reproducible measurements of LED light
engines and integrated LED lamps, at any given
temperature. The measurements include temperature,
total luminous flux, electrical power, and chromaticity.
Luminous Flux (lm)
Luminous Efficacy (lm/W)
900
71
880
70
860
69
840
68
820
67
800
66
780
65
760
64
740
63
37.1C
24
62.1C
70.0C
37.1C
62.1C
70.0C

UL Standard: UL8750-2009, LED Source
Safety
Purpose
These requirements cover LED equipment that is an
integral part of a luminaire or other lighting equipment
and which operates in the visible light spectrum
between 400 700 nm. These requirements also
cover the component parts of light emitting diode
(LED) equipment, including LED drivers, controllers,
arrays, modules, and packages as defined within this
standard.
These lighting products are intended for installation on
branch circuits of 600 V nominal or less in accordance
with the National Electrical Code (NEC), ANSI/NFPA
70, and for connection to isolated (non-utility
connected) power sources such as generators,
batteries, fuel cells, solar cells, and the like.
25

JEDEC Standard: JESD 51-51, LED Thermal
Measurements
Title
Implementation of the Electrical Test Method (Static
Test Method) for the Measurement of Real Thermal
Resistant and Impedance of Light Emitting Diodes with
Exposed Cooling Surface
Scope
This document specifies thermal testing procedures
for power light emitting diodes (power LEDs) and/or
high brightness light emitting diodes (HB LEDs) which
are typically used in the operating regime of the
forward current of 100mA and above and which emit
visible light
This document is applicable for DC driven LEDs only.
26

NEMA Standards
NEMA SSL-1
Electric Drivers for LED Devices, Arrays, or Systems
NEMA SSL-3
High Power LED Binning for General Illumination
NEMA SSL-4
SSL Retrofit Products Suggested Minimum Performance Requirements
NEMA SSL-6
Solid State Lighting for Incandescent Replacement Dimming
NEMA SSL-7A
Phase Cut Dimming for Solid State Lighting: Basic Compatibility
29

NEMA White Papers
NEMA LSD-44
Solid State Lighting The Need for a New Generation of Sockets &
Interconnects
NEMA LSD-45
Recommendations for Solid State Lighting Sub-Assembly Interfaces for
Luminaires
NEMA LSD-49
Solid State Lighting for Incandescent Replacement Best Practices for
Dimming
NEMA LSD-51
Solid State Lighting Definitions for Functional and Decorative Applications
NEMA LSD-55
Outdoor Lighting and Human/Animal Factors: An Industry Opinion
30

NEMA White Papers (cont.)
NEMA LSD-60
The Effects of Dimming on Color and Efficacy of LED Lamps
NEMA LSD-63
Measurement Methods and Performance Variation for Verification Testing of
General Purpose Lamps and Systems
NEMA LSD-68
Remote Phosphor Devices Used in LED Lamps, Engines and Luminaires
31
Outline
Introduction
32

New Standards Development Update

ANSI LED Specification Sheet
Title
Light Emitting Diode Specification Sheet for General Illumination Applications
Background
Datasheets published by LED manufacturers are not consistent, and LED
characteristics measured or disclosed are not standardized
LED users need to have consistent information from LED makers to make fare
comparison
Purpose
To specify the standardized white light emitting diode (LED) package
datasheet, or data reporting format, as the means of communication between
LED package producers and users. The defined contents and format of the
datasheet shall be followed.
Status
Committee balloting
33

ANSI LED Specification Sheet (cont.)
Performance and operational characteristics
Photometric characteristics
Lumen and color maintenance (optional)
Electric characteristics
Thermal characteristics
Physical and electrical connection characteristics

Mechanical characteristics (drawings)
Electrical diagram (optional)
Usage recommendation
34
Assembly
Packaging information
Handling (optional)
Storage (optional)
Order of the content in the datasheet

ANSI LED Specification Sheet (cont.)
Obtaining and reporting data
Method of measurements must be disclosed

Photometric: Applicable standard methods shall be used (LM-85, CIE-127)
Thermal: Applicable standard methods shall be used (JEDS15-51)
Lumen and color maintenance: Applicable standard methods shall be used
(LM-80)
Lumen maintenance projection: Applicable standard methods shall be used
(TM-21)
Electrical: Applicable standard methods shall be used (JEDEC for junction
temperature)
35

ANSI C78.377 SSL Chromaticity Revision
Purpose
To provide SSL industry and design community with options of tighter tolerance
for color variation, and higher color consistency
To extend the specification to cover lower CCT range
Proposal
Based on the defined normal (fixed and flexible) CCTs and associated
tolerances (quadrangles) in the current version of ANSI C78.377, add 4-step
Macadam ellipse based tolerance
Propose both quadrangles and circles as the tolerances
Will not replace the current 7-step Macadam ellipse equivalent specification in
ANSI C78.377
Status
Ah hoc drafting
36

ANSI C78.377 SSL Chromaticity Revision (cont.)
Proposed 4 steps quadrangles
Proposed 4 steps circles
0.56
CIE 1976 (u', v') diagram
0.56
4-step quadrangles
4-step u'v' circles
0.54
0.54
2700 K
2700 K
3000 K
3500 K
0.52
3000 K
3500 K
0.52
4000 K
v'
4000 K
4500 K
0.50
v'
5000 K
5000 K
4-step
MacAdam
ellipses
(ANSI
C78.376)
5700 K
0.48
4-step
quadrangles
4500 K
0.50
6500 K
0.48
4-step
MacAdam
ellipses
(ANSI C78.376)
5700 K
6500 K
0.46
0.46
Illuminant A
D65
Planckian locus
0.44
0.16
0.18
0.20
0.22
u'
37
0.24
0.26
0.28
0.44
0.16
0.18
0.20
0.22
u'
0.24
0.26
0.28

ANSI C78.377 SSL Chromaticity Revision (cont.)
Extend the nominal CCTs to lower CCT range
0.56
2200 K
2500 K
2700 K
0.54
3000 K
3500 K
0.52
4000 K
4500 K
v'
0.50
5000 K
IEC 60081
3, 5, 7-step
MacAdam
ellipses
5700 K
0.486500 K
0.46
D65
Planckian locus
0.44
0.18
0.20
0.22
0.24
u'
38
0.26
0.28
0.30

ANSI LED Driver Test
Title
LED Drivers Method of Measurement
Background
Lack of consistent test method for LED drivers in the industry
Drivers are contributing to the SSL life and reliability
Scope
This standard describes the procedures to be followed and the precautions to
be taken in measuring performance of LED drivers. Deviations from the
procedures given in this standard are permissible for production or other testing
provided that the methods used give the results in substantial agreement with
the method given herein. In case of doubt, reference shall be made to the
specified methods to establish the validity of the results obtained by any
alternate procedure.
Status
Committee balloting
39

ANSI LED Driver Test (cont.)
Operations
Current control and voltage control drivers
v
Open
Circuit
i
maximum
stable
current
minimum
stable
current
Manufacturer
minimum rate
Short circuit
current
Manufacturer
maximu rate
LED driver rate
maximum
stable
voltage
Manufacturer
minimum rate
Manufacturer
maximu rate
LED driver rate
Short circuit
current
LED driver stable operational range
minimum
stable
voltage
Open
Circuit
v
LED driver stable operational range
Measurements
LED driver input: voltage, current, power, power factor, THD%, inrush current
LED (Lamp Load) output: RMS (AC+DC) voltage (& current), maximum peak
and minimum peak voltage (or current), output voltage (or current) ripple,
power, driver efficiency, Tc point temperature, starting time, run-up time
40

ANSI LED Driver Reliability Tests
Title
LED Drivers Reliability (Robustness) Tests
Background
Industry is establishing LED component and SSL system level lumen
maintenance tests and LED reliability test standard, yet driver reliability is
addressed yet
Scope
This standard provides tests and requirements for LED driver hardware and
driver software to ensure reliability of the device. The scope includes LED
drivers that operate from supply sources up to 600V and 60 Hz and DC
applications.
Status
Ah hoc drafting
41

ANSI LED Driver Reliability Tests (cont.)
Failures
Types and acceptance criteria
Proposed tests
Electrical stress
Temperature stress
Vibration stress
Humidity stress
Requirements
42

IES LM-80 LED Lumen Maintenance Test Addendum A
Reduced number of cast temperature to be tested from 3 to 2
Operation of the LED light sources between photometric measurements shall
be at a minimum of two case temperatures, Ts. The case temperature and
drive current should be selected by taking into account the LED light sources
intended applications, the manufacturers recommended operating parameters,
and the eventual use of the testing data. Case temperatures of 55C and 85C
are commonly used for industry testing to support direct product comparisons
of testing results. The drive current may be different for the different case
temperatures. However, performing interpolation per IES TM-21-11 to predict
luminous flux maintenance at temperatures between two case temperatures
requires the same drive current for the two case temperatures. Testing at three
or more temperatures offers more accurate interpolations and a measured
value at an intermediate temperature to cross-check against interpolated
results based on higher and lower case temperatures.
Benefit
Reduce test burden and redundancy.
43

IES TM-21 LED Lumen Maintenance Projection Addendum A
LM-80 data collection and selection
Data collected within a 48 hour window of each 1,000 hour measurement
point, e.g., from 952 hours to 1,048 hours, from 1952 hours to 2,048 hours,
etc. are acceptable for use in product lumen maintenance projections. The
exact time designation shall be used in the projection calculation.
The data collection points used in the projection calculation shall be equally
dispersed in time (to within 48 hours). No two consecutive data collection
intervals after the initial 1,000 hours shall differ by more than 96 hours in length
Temperature data interpolation

For test durations of unequal lengths for a given pair of case temperatures, L70
projections shall not extend beyond 6 times the shorter test duration for 20 or
more samples, or beyond 5.5 times the shorter test duration for 10 to 19
samples. For example, for LM-80-08 data to 10,000 hours at a Ts value of 85C
and to 6,000 hours at a Ts value of 105C, the L70 projections shall not extend
beyond 36,000 hours for 20 or more samples or beyond 33,000 hours for 10 to
19 samples.
44

IES TM-21 LED Lumen Maintenance Projection Addendum A
(cont.)
TM-21 report
The Calculated and Projected Lp(Dk) are removed from Table 1 and Table 2.
These values are set for the purpose of calibrating the calculation tools for the
users. Due to the statistical uncertainty stated in Annex D, the calculated result
in hours beyond reported projection limit set in Section 5.2.5 does not have any
practical value or
meaningfulness.
Benefit
Clarification and
consistency
45

IES LM-84 SSL Lumen Maintenance Test
Title
IES Approved Method for Measuring Luminous Flux and Color Maintenance
LED Lamps, Lighting Engines, and Luminaires
Purpose
To provide the method for measurement of lumen and color maintenance of
LED lamps, light engines, and LED luminaires. To describe the procedures to
obtain uniform and reproducible lumen and color maintenance measurements
under standard operating conditions
It does not cover LED luminaires without a light source. It does not cover the
determination of the performance rating of products, in which individual
variations among the products should be considered
Status
Committee balloting
46

IES TM-28 SSL Lumen Maintenance Projection
Title
Projecting Long-Term Luminous Flux Maintenance for LED Lamps and
Luminaires
Background
LED lighting industry desires to have shorter than 6000 hours test for lamps
and luminaires
Current Energy Star and other specifications allow 3000 hours test results to be
used for prequalification
Purpose
To develop a LED lamp and luminaire level counterpart to TM-21 using the new
LM-80 and LM-84 testing data for projecting long-term lumen maintenance.
Status
Committee balloting
47

IES TM-26 LED Failure Rate Projection
Title
Projecting Rated Life for LED Packages
Scope
This document provides recommendations for projecting catastrophic failure
rate of LED packages. The rated life value is intended to incorporate both
lumen maintenance life and catastrophic failures. This document applies to all
LED packages that are tested per IES LM-80.
Status
Committee balloting
48

IES LM-86 Remote Phosphor Device Lumen Maintenance Test
Title
IES Approved Method for Measuring Luminous Flux and Color Maintenance of
Remote Phosphor Devices
Scope
This document provides the method for measurement of luminous flux and
color maintenance of remote phosphor devices. The method describes the
procedures to be followed and the precautions to be observed in obtaining
uniform and reproducible luminous flux and color maintenance measurements
under standard operating conditions.
This document does not cover the determination of the performance rating of
products, in which individual variations among the products should be
considered. This approved method does not provide guidance or make any
recommendation regarding predictive estimations or extrapolation for luminous
flux or chromaticity maintenance determined from actual photometric
measurements.
Status
Committee balloting
49

IES LM-86 Remote Phosphor Device Lumen Maintenance Test
(cont.)
Test method
Similar to LM-80, with differences for testing remote phosphor devices rather
than LEDs
Test procedure
Control irradiance incident to the remote phosphor (rather than LED driving
current as in LM-80)
Control surface temperature of the remote phosphor (rather than the LED case
temperature as in LM-80)
Measurements
Measure the photometry of the phosphor device with LED pump source
Calculate phosphor conversion efficacy over the time
50

IES LM-87 LED Robustness Tests
Title
Approved Methods of Robustness Tests for LEDs
Scope
This document provides recommendations for LED package robustness tests.
These tests are under the over-stress tests conditions. The test methods are
provided in the JEDEC standards listed in the Normative Reference Section.
Definitions of failure, failure criteria, and LED package specific test conditions
are provided.
Status
Working group drafting
51

IES LM-87 LED Robustness Tests (cont.)
Failure criteria
Robustness tests for all lighting applications
52
High Temperature Operating Life (HTOL) Test

Temperature Cycling (TMCL) Test
Resistance to Soldering Heat (RSH) Test
Wet High Temperature Operating Life (WHTOL) Test
Electrostatic Discharge with Human Body Model (ESD-HBM) Test
Continues Switching Cycles until Failure Test

IES TM-25 LED Ray File Format
Title
Ray-File Standard Format for LEDs and Other Light Sources
Scope
To provide recommendations for standard ray-file format for the LED packages
and other light sources that contains information used as interface with ray
tracing or other optical design and simulation software in lighting applications
Status
To be published
53

IES TM-25 LED Ray File Format (cont.)
Overall format information
Ray file type and extension

File structure
Ray order
Sampling, units and data type
Section on block breakdown
Header source characteristics

Physical characteristics: luminous flux, radiant flux, spectrum data, etc.
Background information: method of ray file creation and the number of rays to
be used
File section geographic and mathematical description for individual ray

Each rays position and direction
Ray strength or energy carried (power)
54

UL8750 LED Source Safety Standard Update
Photo-biological safety for LEDs
UL8750 STP voted to table this topic and not to pursue any actions at present
time, due to:
Disagreement for necessity for the standard
Disagreement for the methods of measurements between ANSI and IEC
standards
Revise LED package testing requirements

Thermal aging test for polymeric materials used in LED packaged (lens, etc.)
Dielectric withstand test
Steady force test
57
Outline
Introduction
61

Methods of Projections
Whats the Purpose of TM-21
A calculation tool
To provide users with lumen maintenance life (e.g., L70) projection with data
collected from LM-80 testing
To predict estimated lumen output values at a given time duration
To interpolate lumen maintenance behaviors for in-situ temperature status
(different from testing temperature)
It does not cover

LED rated life, or failure rate projection
Color change projection
Combined lumen maintenance projection (white combined with colored LEDs,
remote phosphor with blue pumped LEDs, etc.)
Projection for LEDs operating conditions that are not tested per LM-80 (higher
or lower driving current)
It is not a specification
It does not provide performance requirements
It does not give the criteria if a product is good or bad
62
LED Lumen Changes Over Time
Degradation mechanism, phases, and causes
Chip (die) degradation for initial and long-term caused by: temperature, driving
current
Package (LED structure) degradation caused by: temperature, short
wavelength photon radiation
Converter (phosphor) degradation caused by: temperature, driving current,
humidity
63
Development of TM-21
Challenges to make long-term projection with short-term testing data
Studied several possible (9) models that express potential LED physical lumen
decay behaviors using over 40 sets of LM-80 data collected
Study shows many LEDs exhibit some rapid changes over the first 1,000 or
more hours
Statistics of model-fitting using only 6,000 hours of LM-80 data was not
conclusive enough to find a suitable model to represent lumen output
degradation
LED lumen depreciation
trends often change
after 6,000 hours in
one way or another
64
Development of TM-21 (cont.)
More challenges
Natural noise in real data can
falsely indicate decay trends
with the limited 6,000 hours
test duration that the test data
at longer than 6,000 hours
shows is not real.
65
Sample Size
Sample size recommendation
20 samples to project 6 times of test duration
10 to19 samples to project 5.5 times test duration
66
Use of LM-80 Test Data
Luminous flux data collection
LM-80 test of 6,000 hours data
Additional measurements after the initial 1,000 hours at intervals smaller than
1,000 hours are encouraged.
Additional
measurements
beyond 6,000
hours are
encouraged
Longer duration
of test data will
provide the basis
for more accurate
lumen
maintenance
projections
67
Projection Procedure
Normalization & average
Normalize all collected data to a value of 1 (100%) at 0 hours
Average the normalized measured data of all samples
Data used for curve-fit

Data before 1,000 hour reading shall not be used
For curve fit, use the last 5,000 hours of data for test duration 6,000 hours, or
Last 50% of total test duration for test duration > 10,000 hours
Curve-fit
Perform an exponential least squares fit
i(t) = B0 exp( it )
Use the following equations to project the lumen maintenance life
B
ln100
p
Lp =
68
Projection Procedure (cont.)
Adjustment of results
Luminous flux values must not be projected beyond 6 times of the test duration
When calculated L70 > 0 and 6 times of the test duration, reported L70 is the
calculated L70
When calculated L70 > 0 and 6 times of the test duration, reported L70, is
limited to 6 times of the total test duration
When calculated L70 < 0, the reported L70, will be 6 times of the test duration,
and equal to the normalized lumen output at the last measurement point
Notation
Use projected lumen maintenance percentage and number of hours test data
as: Lp(Dk)
Example: L70(6k) > 36,000 hours: 6,000 hours data is used to make projection
of L70 hours
69
Data Interpolation for In-Situ Temperature
Step 1
Obtain 1 and 2 for two temperatures Ts,1 and Ts,2 which were calculated in the
curve-fits, calculate the ratio:
Step 2
Ea ln 1 ln 2
=
1
1
kB
Ts,2 Ts,1
Using the above ratio, plug in Ts,1 to calculate pre-exponential factor A:
Ea
A = 1 exp
k BTs ,1
Obtain decay rate for in-situ temperature case
Ea
i = A exp
k BTs ,i
70
Projection for In-Situ Temperature
Step 3
Calculate B0:
B0 =
B1 B2
Step 4
Using the above result of B0, calculate lumen maintenance life for Lp for in-situ
case temperature Ts,i as:
B
ln100 0
p
Lp =
i
Step 5
Calculate the in-situ luminous flux output at time i(t) for Ts,i as:
i(t) = B0 exp( i t )
71
Limitations of Using Arrhenius Equations in In-Situ Temperature
Projection
Decay rate
Decay rates in both high and lower temperature projection cases 1 and 2
must be positive, no projection for lumen increase over time
If only one decay rate is positive

Use projection Lp value from positive, 1 or 2, as the in-situ lumen
maintenance
If neither 1 nor 2 value is positive

Lp value for Ts,i will be 6 times (or 5.5 times if 10 19 samples are tested) of
test duration, and use the lumen flux value of the lower ones between T,1 and
T,2 at the last measurement point
72
Example
Projection using
LM-80 6,000 hour
data at 55 oC
Projection using
LM-80 6,000 hour
data at 85 oC
73
Example (cont.)
Limit for extrapolation
In-situ temperature is within 2 LM-80 tested temperatures
Lumen Maintenance [%]
100%
90%
80%
55 oC
85 oC
70 oC
70%
0
74
10,000
55 oC data
85 oC data
20,000
30,000
Time [h]
40,000
50,000
60,000
Example (cont.)
Lumen maintenance
projection values
With 6,000 hours data
With in-situ temperature
interpolation
75
Whats the Purpose of TM-28
A calculation tool
To provide users with lumen maintenance life (e.g., L70) projection with data
collected from LM-80 and LM-84 testing
To predict estimated lumen output values at a given time duration
To interpolate lumen maintenance behaviors for in-situ temperature status
(different from testing temperature)
It does not cover

Color change projection
Benefit
This tool can be used for 3000 hours LM-84 data, which is a shorter test
duration needed
76
General Approach
Method 1: Direct extrapolation of LM-84 data
If at least 6000 hours of LM-84 data are available, use a TM-21 like projection
based on the data.
The LM-84 data may be interpolated between ambient temperatures in a TM-21
like manner (i.e. using the Arrhenius equation), as long as the LM-84 data
represent the same product under the same driving conditions at each ambient
temperature.
Method 2: Combined extrapolation of LM-84 data and LM-80 data

At least 3,000 hours but less than 6,000 hours of LM-84 data are available for
the lamps or luminaires tested and at least 6,000 hours of LM-80 data are
available.
The LM-80 data used in this method must contain at least one data set
obtained at the same or higher Ts, as compared to the DUTs Ts value and at
the same or higher forward current, as compared to the forward current value
for the LEDs or modules used in the DUTs.
77
Projection Procedure for Method 2
Normalization & average
Normalize all collected data to a value of 1 (100%) at 0 hours
Average the normalized measured data of all samples
Data selection and use of curve-fit

Ts in LM-80 data is closest or higher than LM-84 Ts, with same or higher
driving current
Perform a least squares curve-fit to the selected LM-80 data set, as described
in IES TM-21
value
Data before 1,000 hour reading shall not be used
a = aLM -84 aLM -80

ln[r (t )] = t + b
78
Projection Procedure for Method 2 (cont.)
Calculation of value
If =0, the LM-84 data are showing the same luminous flux decay rate as the
selected LM-80 data.
If <0, the LM-84 data are showing a slower luminous flux decay rate. In this
case, set to 0 and use b as obtained above for the next section.
If >0, the LM-84 data are showing a faster luminous flux decay rate. In this
case, the latter data need to be corrected for projection
Projection for > 0
B
ln
b
0.7
L70 =
+ a
79
Projection Method 2 Sample Size
Sample size vs. multiplier
For any given sample size of at least, luminous flux values shall not be
projected beyond x times the total test duration (in hours) of LM-84 data
available. The values of x for different sample sizes are listed:
Sample Size
5
6
7
8
9
10
11
12
13 14
15
80
Multiplication Factor x
1.5
2
2.5
3
3.5
4
4.5
5
5.5
6
Example
Data
6,000 hours LM-80 data at Ts temperature of 45 C, 350 mA drive current
4,500 hours LM-84 data at Ts temperature of 36.5 C, 165 mA nominal drive
current.
110%
Sample size
100%
Luminous Flux Maintenance (%)
10 samples
tested per
LM-84.
90%
80%
70%
LM-84 Data
LM-80 Data
Projection
60%
1000
1500
2000
2500
3000
3500
4000
4500
5000
5500
6000
6500
7000
7500
8000
8500
9000
9500
10000
10500
11000
11500
12000
12500
13000
13500
14000
14500
15000
15500
16000
16500
17000
17500
18000
50%
Time (hours)
81
Whats Purpose of TM-26
Background
LED rated life has not been defined
Lumen maintenance life (e.g., L70) does not include LED catastrophic failures,
and it is based on small sample size (e.g., 20) LM-80 test
LED users (luminaire makers, specifiers, etc.) need to know LED component
level reliability
Needs for developing TM-26

LED lighting industry and US need to specify LED lamp or luminare level
reliability
TM-21 projection for LED source level lumen maintenance
It is desired to have standard to project LED source level rated life
It is also desired to have standard to project LED driver rated life
With LED source and driver rated life information, LED lamp or luminaire level
reliability may be projected
82
Whats Purpose of TM-26 (cont.)
It recommends methods of projections
LED manufacturers can provide projection information to LED users
Benefit
Information provided by LED manufacturers can be used in the LED lighting
design and qualification process
83
IES TM-26 Recommended Methods
Define LED rated life
Time duration in hours when Lp is reached (based upon TM-21). In addition,
the accumulated catastrophic failures (in % or ppm) in the same time duration
when Lp in reached (hours).
Projecting catastrophic failures

Early failure period
Intrinsic failure period
Wear-out failure period
84
IES TM-26 Recommended Method 1
Results of failure rate in table format
For defined time period such as Lp, the LEDs failure rate (FIT) can be reported
with numerical results with pfailures per billion operational hours (ppb) values in
a table format. For each corresponding ppb value, the reference current shall
be specified.
FIT (ppb) for reference current vs. junction temperature
IF, DC maximum
IF, DC nominal 2
IF, DC nominal 1
IF, DC minimum
-10 oC
100
40
20
10
25 oC
200
100
40
20
55 oC
400
200
80
40
85 oC
800
400
200
100
Tj,max oC
1000
800
600
400
85 oC
800
Ts,max oC
1000
FIT (ppb) for reference current vs. case temperature

IF, DC
maximum
85
-10 oC
100
25 oC
200
55 oC
400
IES TM-26 Recommended Method 2
Use empirical data model
FIT with acceleration factors
Temperature acceleration factor
Current acceleration factor
Ea
T = exp
kB
1 1

T1 T2
I
I max
I
= ref I T
0.5
0.6
0.7
0.8
0.9
1.1
1.3
1.8
Use failure rate projection model
FIT =
Temperature acceleration factor

Current acceleration factor
ln (T f 1 ) ln (T f 2 )
Ea = k B
1
1
TJ 1 TJ 2
86
Ea
t f = A exp
kB
2 (2r + 2)
C
B +
TJ
2T

S1

109
About Instructors
153
Dr. J. Jiao
Dr. C. Miller
Dr. Jianzhong Jiao is an internationally

recognized expert for lighting products
design, technology development, testing,
standards and regulations. He holds
multiple leadership positions in the lighting
industry. He is the past Chairman of SAE
Lighting Committee, past Chairman of the
NGLIA, past Chairman of the NEMA SSL
Section Technical Committee and an active
member of committees and working groups
in SAE, IES, ANSI, UL, SPIE, IEEE,
JEDEC, SEMI and others. Dr. Jiao is the
SAE Follow, and has received several
industry awards. He currently serves as the
Director of Regulations and Emerging
Technologies at OSRAM Opto
Semiconductors Inc. Dr. Jiao has nine US
Patents, over 30 technical papers,
numerous public talks and magazine
articles.
Dr. Cameron Miller is a well-known

metrologist who obtained his Ph.D. in
Physical Chemistry from Cornell University
(1994). He joined the National Institute of
Standards and Technology in 1996 and in
2003 was appointed the Photometry
Project Leader. His research areas include
all aspects of Photometry, Retroreflection,
Measurement Uncertainty and Vision
Science applied to lighting. Dr. Miller is
active in standards organization and
professional societies, such as IES Testing
Procedure Committee (SSL Committee
Chairman), CIE (USA Div 2 voting),
CIEUSA (Technical VP), ANSI/ISO TAG
(Vice Chairman), ASTM, ISCC, NEMA, and
CORM. He is also an NVLAP assessor for
the Energy Efficient Lighting Program and
the Calibration Program.

LED Standards and Methods of Measurements

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LED Standards and Methods of Measurements

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LED Lighting Standards &

Part 2 Methods of measurements for LEDs and SSL

IES LM-79 SSL products photometry test

LED Lighting Standards in Practice

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LED Lighting Standards in Practice

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IES LM-79 SSL products photometry test

New Standards Development Update

New Standards Development Update

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Method of measurements must be disclosed

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CIE 1976 (u', v') diagram

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4-step u'v' circles

New Standards Development Update

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LED driver rate

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New Standards Development Update

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New Standards Development Update

New Standards Development Update

Temperature data interpolation

New Standards Development Update

New Standards Development Update

New Standards Development Update

New Standards Development Update

New Standards Development Update

New Standards Development Update

New Standards Development Update

New Standards Development Update

High Temperature Operating Life (HTOL) Test

New Standards Development Update

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Ray file type and extension

Header source characteristics

File section geographic and mathematical description for individual ray

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Part 2 Methods of measurements for LEDs and SSL

IES LM-79 SSL products photometry test

It does not cover

Data used for curve-fit

Use the following equations to project the lumen maintenance life

Using the above ratio, plug in Ts,1 to calculate pre-exponential factor A:

If only one decay rate is positive

If neither 1 nor 2 value is positive

Lumen Maintenance [%]

It does not cover