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Introduction
Progress in technology and an increasing knowledge of modern kinetic plant phenotyping
are opening up new perspectives on the measurement and understanding of plant development. Particularly advanced, non-destructive imaging in combination with specific
plant sensors and appropriate modelling of the resulting data provides the best options
for gaining sufficient knowledge in optimally targeted breeding, even for complex kinetic
phenotype traits such as stress resistance and tolerance.
For a better understanding of how plant phenotypes are expressed in relation to genetic
and environmental conditions, it becomes increasingly important to state that a phenotype is quite a complex functional network, represented by a large set of quantitative
parameters. These include, besides genetics, all morphological and growth patterns,
depending on time and development, as well as specific reactions towards short- and
long-term environmental conditions, particularly stressors like nutrient deficiency, water
logging, pests, extreme temperatures or drought.
To gain such an understanding, it is important to grow larger numbers of plants under
individually well-controlled conditions. In any case, a comprehensive and non-destructive
measurement of each individual plant over a prolonged time span is absolutely essential.
To be able to separate factors that finally lead to a certain phenotype or measurement
value, the use of appropriate data models is extremely important.
The following paragraphs will highlight some aspects of test design, measurement and
model requirements for plant heat imaging with LemnaTec scanalyzer3D conveyor systems.
on additional environmental conditions such as air humidity and wind speed. Both factors
can show massive fluctuations, both in the field and in greenhouses with air ventilation
and evaporative cooling.
As a result, it becomes obvious that leaf temperature is the integrative result of several
influencing factors. While some of these factors can be controlled, many others must be
assessed and normalised by appropriate statistical and imaging approaches.
Fig. 1: Dynamics of temperature change in a banana plant (over a time span of 300 s),
after reducing light intensity from sunlight to dim light. Increase in yellow colour signifies
that the plant is warming up due to reduced evaporation. The green stem of the plant
reacts much more slowly because of its high heat capacity.
Fig. 2: Model graph for a moving average mean temperature of a sequence of plants,
including the local outliers. It becomes obvious that the sequence of the plants is decisive, not the absolute values.
Again, it is a scientific problem to prove that the concept of using car parts for the normalisation of leaf temperature is successful, and it needs to be checked against larger real
datasets. Infrared imaging under high-throughput conditions that will produce reliable
data/phenotypic parameters is a new field, going far beyond depicting two plants with
different leaf temperatures at the same point in time on one image. Lastly, this is a question of appropriate data modeling of heat exchange processes.
Conclusion
Optimised combinations of phenotyping hardware, imaging and sensor technology,
together with extensively enhanced test designs and sound data processing in models and
advanced statistics form the best basis for any high-throughput or high-content plant
phenotyping. This is valid for imaging in general, but even more important for highly dynamic processes such as heat imaging.
The whole domain of high-throughput heat imaging especially under fluctuating conditions that really integrate the dynamics of leaf temperature changes, and not just as a
snapshot of interesting plants on one image is a relatively new area of research. Having
the appropriate technical measurement structures with the LemnaTec scanalyzer3D imaging and the MovingField conveyors will provide the best opportunity to develop this field
of research further, in a scientifically valuable way.
For further information, please contact
Matthias Eberius
LemnaTec GmbH
Pascalstr. 59
52076 Aachen, Germany
Tel. +49 2408 9383 000
Fax +49 2408 9383 300
matthias.eberius@lemnatec.com