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The 19 International Symposium on High Voltage Engineering, Pilsen, Czech Republic, August, 23 28, 2015

PARTIAL DISCHARGES IN TYPICAL DEFECTS OF POWER CABLE


SYSTEMS AT VARIABLE TEST VOLTAGE FREQUENCY
FUNDAMENTAL AND PRACTICAL CONSIDERATIONS
Prof. Dr.-Ing. Daniel Pepper1* and Prof. Dr.-Ing. Ronald Plath2
1
Beuth University of Applied Sciences, Berlin, Germany
2
Technical University of Berlin, Berlin, Germany
*Email: daniel.pepper@beuth-hochschule.de
Abstract: Testing energy cable systems often implies the necessity to drive large
capacitive loads. A test voltage supply that generates testing voltages with service
frequency (50/60 Hz) is then bulky and heavy because of the high demand of reactive
power. In addition, the reactive power is sometimes difficult to obtain, especially under
on-site conditions, where the energy supply for cable test systems is limited.
A common solution is the use of resonant test systems that operate at variable testing
voltage frequency to meet the resonant frequency. Another solution is to significantly
lower the testing voltage frequency e.g. to 0.1 Hz in order to lower the demand of reactive
power as well. In both cases the question arises, how the preferably performed
measurement of partial discharges is influenced by the testing voltage frequency.
In this paper the models and the equivalent circuits for defects that cause partial
discharges are examined on their properties regarding the testing voltage frequency.
Measurements of partial discharges on typical defects of energy cable systems are
presented and compared to the results that may be obtained from the models and
equivalent circuits of these defects. It is shown in theory and from practical
measurements, which parameters of the PD behaviour are influenced and in which way
that influences can be explained from the models. Furthermore the limits of the models
are evaluated.
The paper contributes to a better understanding of the PD behaviour, the modelling of PD
defects and gives answers to the question which kind of testing voltage is suitable for
which kind of testing conditions. The influence of the testing voltage on the PD behaviour
can even support certain testing strategies.

INTRODUCTION

On-site
testing
ensures
a
successful
commissioning as well as reliable operation of
energy cable systems. Since the energy cable
system is mainly a capacitive load for a given test
voltage source, also mainly reactive power is
needed during the testing. The amount of reactive
power can be reduced by selecting a different
testing voltage frequency or shape. Usually the
testing voltage frequency is reduced [1] while the
sinusoidal shape of the testing voltage is still used
(e.g. VLF, 0.1 Hz). Alternatively the shape of the
voltage transition from negative to positive polarity
and vice versa can be changed. One of the
available testing systems uses a fundamental
frequency of 0.1 Hz and a transition with 50 Hz
frequency and cosinusoidal shape (cosinerectangular, CosRect) [2].
The result of any voltage withstand test is either a
failure of the system (breakdown) or no failure (no
breakdown). This test result is unfortunately of
limited use since a local defect within the cable
system may have partial discharges (PD), that do
not lead to breakdown during a plain voltage
withstand test. With existing PD it is only a matter
of time, when the breakdown of the cable will occur

later on in service. A PD defect will only be


detected during a voltage withstand test if a PD
measurement is executed in parallel to the voltage
withstand test.
The question arises, how the PD behaviour of
typical defects is influenced by the testing voltage
shape and frequency. To clarify this matter,
measurements of PD on typical defects were
conducted with variations of the testing voltage
frequency. The measurement results are
furthermore compared to the predicted PD
behaviour of the well known Phillipow equivalent
circuit at the specific testing voltage frequency. The
results that can be obtained by using the Phillipow
equivalent circuit are investigated especially with
regard to the alternative testing voltages
mentioned above.
2

PD MEASUREMENTS

2.1

Measurement setup

The measurement setup consists of a specifically


developed testing voltage source, that is in general
able to produce any testing voltage shape and
frequency in the range of DC to several kHz with a
peak voltage level of 50 kV an a peak output

current of 100 mA [3], [4], [5]. In this paper the


voltage shape is set to sinusoidal voltage for all
measurements.

insulating plate has a diameter of 100 mm and a


thickness of 5 mm. The metallic high voltage
electrode is placed in the centre of the insulating
plate and has a diameter of 20 mm.

The PD measurement circuit is a common setup


according to IEC 60270.
2.2

Test objects

The first defect is a needle-plate configuration in


XLPE
cable
insulation
with
a
strong
inhomogeneous field configuration and therefore
electrical treeing.
The second one is a partly removed outer
conducting layer on an otherwise intact XLPE
cable sample.
The third defect is a surface discharge (Toepler
configuration).
As a well known reference, a needle on high
voltage potential with the needle tip facing in air
with a corona discharge is used.

Figure 3: Configuration for electrical treeing in


XLPE

Figure 1: Partly removed outer conducting layer


The defect in the outer conducting layer has a
diameter of 10 mm and a depth of 2 mm.

Figure 2:
discharge

Toepler

configuration

for

surface

The Toepler configuration consists of a grounded


metal plate with an insulating plate on top of it. The

Figure 4: Example for a recorded electrical tree in


XLPE
The configuration for electrical treeing consists of a
stripped section of a commonly used XLPE
medium voltage cable with a length of 20 mm. All
layers and metallic wires are removed except the
inner semiconducting layer. A metallic high voltage
electrode is placed in the centre of the cable
section to replace the former conductor wires of
the cable. A grounded metallic needle is pushed
straight forward without a rotating movement in the
XLPE material in order to create a strongly
inhomogeneous electrical field inside the XLPE
insulating material. The electrical tree starts to
grow at the tip of the needle and develops towards
the inner semiconducting layer. The distance
between the tip of the needle and the inner
semiconducting layer is 3 mm. The whole
configuration is covered by insulating oil to prevent
a flashover.

Measured parameters

The parameters that are measured and evaluated


are related to the ease of the detection of a PD
defect. Therefore the level of apparent charge and
furthermore the number of PD impulses is
recorded. Since the fundamental frequency of the
testing voltage is varied, the number of PD
impulses is shown related to the number of cycles
of the testing voltage rather than related to the
measuring time.

PD impulses per cycle [n]

2.3

20
15
10

5
0

0,1

10

100

1000

Frequency [Hz]

Measurement results

PD level

25

100
90
80
70
60
50
40
30
20
10
Sinus
0
100
1000

20
15

10
5
0

0,1

PD per cycle

10

PD level

10000

PD level [pC]

PD impulses per cycle [n]

PD per cycle

Figure 7: PD behaviour of electrical treeing in


XLPE

1000
100
10
1

0,1

10

100

100
90
80
70
60
50
40
30
20
10
0
1000

PD level [pC]

The following diagrams show the apparent charge


as well as the number of PD pulses per cycle (or
period) of testing voltage at varied frequencies of
the testing voltage for the PD defects introduced
above.

PD impulses per cycle [n]

2.3

Frequency [Hz]

Frequency [Hz]

Figure 5: PD behaviour of a defective outer


conducting layer of a medium voltage XLPE cable

PD level

1200

10

1000

800

600

400

200

0,1

10

100

PD level [pC]

PD impulses per cycle [n]

PD per cycle

12

0
1000

Frequency [Hz]

Figure 6: PD behaviour of a Toepler configuration


(surface discharge)

Figure 8: PD behaviour of a corona discharge


(electrode on high voltage potential)
The corona discharge is shown here as a well
known reference. For this PD defect the time
between impulses is rather constant. Thus the
number of PD impulses per cycle of testing voltage
decreases with rising testing voltage frequency as
expected. The level of apparent charge stays
constant and is independent of the frequency of
the testing voltage.
The behaviour of the other three defects is different
to the corona discharge but similar to each other.
The number of PD impulses per cycle of testing
voltage remains constant and is independent of
testing voltage frequency as it is the case for the
apparent charge (or PD level).

2.3

Phase resolved pattern for treeing

Please note, that the total number of PD pulses is


different for each phase resolved pattern.
Therefore the one or the other pattern has a
different density and appears thus different to the
viewer. The pattern with the highest total number
of PD pulses is recorded at a testing voltage
frequency of 50 Hz.
In general, the patterns are very similar to each
other. The detected apparent charge is quite
independent on test voltage frequency as well.

0.1 Hz testing voltage frequency

THEORETICAL CONSIDERATIONS

2.3

Equivalent circuit for a PD defect

1 Hz testing voltage frequency

Figure 10: Philippow equivalent circuit for a PD


defect

10 Hz testing voltage frequency

50 Hz testing voltage frequency

500 Hz testing voltage frequency


Figure 9: Phase resolved patterns of electrical
treeing with varied testing voltage frequency

In the Philippow equivalent circuit the testing


voltage is connected to a capacitive divider that
consists of the capacitors C2 and C3. The spark
gap F ignites whenever the ignition voltage is
present at its terminals. The capacitor C3 is then
quickly discharged due to the current in the spark
gap F. If the spark gap turns off due to the current
drop, the capacitor C3 is recharged with the current
flowing through capacitor C2. This current requires
a changing voltage at the terminals capacitor C2.
The total electric charge that is stored in capacitor
C3 is given by the capacitance of C2 and the
voltage change u at the terminals of C2. The time
for this voltage change u is of no influence on the
electric charge that is stored in capacitor C3.
The next PD impulse will occur after a predecessor
if the ignition voltage for spark gap F is present at
the terminals of capacitor C3. This will be the case
if the required charge is stored in capacitor C3. A
specific voltage change u at the terminals of C2 is
required for this process. Since the testing voltage
is the sum of the voltages across C2 and C3, a
subsequent PD impulse will occur after a
preceding PD impulse only after a specific voltage
change of the testing voltage. Again, the time for
this specific voltage change is of no influence for
the PD activity according to the Philippow
equivalent circuit.

Surprisingly the measurement results are in quite


good accordance to the behaviour of the Pilippow
equivalent circuit. So it represents the examined
typical PD defects quite well.
5

CONCLUSION

This paper shows measurements of the PD


behaviour of several typical PD defects of XLPE
insulated
medium
voltage
cables.
The
measurements are conducted with sinusoidal
testing voltage shape and varied frequency in the
range of 0.1 Hz to 500 Hz. The results are
compared to the PD behaviour of the Pilippow
equivalent circuit and are in good accordance to
this PD behaviour.
Important parameters like the level of apparent
charge and the number of PD impulses per cycle
of testing voltage are mainly independent of the
testing voltage frequency. The PD behaviour of the
Philippow equivalent circuit is in essence
dependent of the divider ratio of a capacitive
divider. Capacitive dividers have a divider ratio that
is independent of the voltage or current frequency.
The Philippow equivalent circuit is a quite suitable
analogon to the examined PD defects.
The results may contribute to a further discussion
about the acceptable testing voltage shape and
frequency for on-site testing of energy cables that
represent a large reactive load for the testing
voltage source. According to the obtained
measurements, the testing voltage frequency of a
sinusoidal shaped testing voltage is of minor
influence on the PD behaviour of the typical
defects chosen here for investigation. This gives
the freedom to choose the testing voltage
frequency in relation to other parameters like e.g.
the required reactive load.
Sometimes it can be necessary to record as many
PD events as possible to confirm a measurement
result using a statistical evaluation. Since the
number of PD impulses per cycle of testing voltage
is quite independent of testing voltage frequency,
more PD impulses can be recorded at higher
testing voltage frequencies in a given testing time.
In such cases using a testing voltage source with
variable frequency is of advantage. The frequency
can be chosen in a way that the maximum reactive
power of the testing voltage source is used.
Further results especially on varied testing voltage
shape must be carried out to gain more knowledge
about the PD behaviour and the physical
processes of PD activity. Furthermore, a wider
variety of PD defects must be considered. In this
paper especially XLPE was addressed which
should be expanded to further insulating materials
that are commonly used for energy cable systems.

FUTURE WORK

Investigations will be performed on a wider range


of PD defects, especially on typically defects of
cable accessories. Besides the application of
sinusoidal waveforms it will be of interest to more
deeply investigate the effect of non-sinusoidal
waveforms on PD behaviour, like cosinusoidalrectangular voltage (see INTRODUCTION). This
waveform may serve as a model voltage for
polarity reversals applied e.g. in testing of HVDC
transformers [6]. Though the Philippow equivalent
circuit in itself is practically frequency-invariant,
which was in good accordance with the PD
measurement results presented, there is evidence
for certain limitations of the Philippow model based
on Maxwell-equation-based analysis [7], [7], [7].
Future PD investigation has to take this into
account.
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[2] http://www.sebakmt.com/produkte/elektrizitaet/
kabelpruefung/vlf-pruefgeraete/vlf-cr2860kv.html
[3] D. Pepper, H. Emanuel, C. Steineke, R. Plath,
W. Kalkner: A New High Voltage Dielectric
Test System for Insulation Diagnosis and
Partial Discharge Measurement, Nordic
Insulation Symposium (NordIS), Bergen,
Norway, 1996S
[4] D. Pepper, W. Kalkner: Influence of Test
Voltage Shape and Frequency on PD Activity
of Defects in XLPE-Insulated Medium Voltage
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[5] Pepper, Daniel: Grundlagenuntersuchung zum
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mit variabler Frequenz und Kurvenform. Thesis
Technical University of Berlin, 2003
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HG-Transformatoren, ETG-Fachbericht 99
"Grenzflchen in elektrischen Isolierstoffen,
Hanau, 2005
[7] G. Crichton, A. Karlsson, and A. Pedersen. A:
Theoretical derivation of the transients related
to partial discharges in ellipsoidal voids. In
ISEI. IEEE Int. Symp. on Elect. Insulation,
pages 238241, 6 1988.
[8] A. Pedersen, G. Crichton, and I. McAllister:
The theory and measurement of partial
discharge transients. IEEE Trans. Elect.
Insulation, 26(3):487497, 6 1991.
[9] E. Lemke. A critical review of partial-discharge
models. IEEE Electr. Insul. Mag., 28(6):1116,
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