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(AFM)
Hemanta Bhattarai
Nov 7 2016
- Optical Microscopy ~1600
-Electron Microscopy ~ 1938 and 1968
-Scanning Tunneling Microscope 1982
-Binning, Geber, Rohrer, Wiebel
-Awarded Nobel Prize
-Atomic Force Microscopy
-Binning, Gerber, Quale -1986
-Used STM
-Wickramsighe et.al -1987
-Used Light lever
-STM
-Basis: tunneling of electron from barrier potential
-Can only be used in the conductive materials
-Hard to study Proteins, Biomolecules, and other non conductive
materials
-AFM
-Basis :Atomic Force
-Can be used for non conductive materials
Hooks Law:
F=-k x
Working Principle
AFM works in principle of Hooks law
F=-k x
Where
F-> Force on spring
K-> spring constant
x-> elongation
In, AFM instead of spring a cantilever is used.
Basic Set Up
Cantilever with a sharp tip
Detector sensor
Sample Stage that controls x,y,z position
Feedback control and loop
Cantilever and Detector sensor
Cantilever and Detector sensor
Cantilever
The effective force constant of cantilever of length L, width b and
thickness h and Youngs modulus E :
Questions ??