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Innovation of

Switched-Capacitor
Voltage Multiplier
Part 1: A brief history

Toru Tanzawa

T
he switched-capacitor (SC) voltage energy sources such as mechanical vibration, electro-
multiplier is becoming one of the most magnetic wave, and temperature gradient. However, its
critical IC blocks for energy harvesting origin was a 10 m-scale particle accelerator generating
in wireless sensor nodes to generate a 1 MV back to 1920s. There have been several innova-
voltage high enough for microwatt sens- tive design techniques to realize integrated SC voltage
image licensed by graphic stock

ing and computing ICs in a nanometer complementary multipliers since the original one. This article overviews
metaloxidesemiconductor (CMOS) from environmental such innovations for the last century and describes how
10 m-scale SC voltage multipliers have been integrated
in microwatt ICs and what technical considerations
are critical for area- and power-efficient design. It also
summarizes how device parameters determine circuit

Digital Object Identifier 10.1109/MSSC.2015.2495678


Date of publication: 21 January 2016


1943-0582/162016IEEE IEEE SOLID-STATE CIRCUITS MAGAZINE W I N T E R 2 0 16 51
Table 1. THE power converter Category. and the SC converter, as shown in
Table 1. The switching converter
dcdc/acdc
is composed of one or more induc-
Switching converter SC tors, one or more capacitors, and
Voltage gain Inductor Capacitor several switching devices. The SC
(VOUT /VIN) Capacitor Switching device convertor is composed of one to
Switching device
many capacitors and one to many
>1 Boost converter Voltage multiplier or charge pump switching devices. The differences
<1 Buck converter Fractional regulator are 1) with or without inductors
and 2) single or many stages. Pres-
ently, the degree of integration is
Table 2. A brief history of the SC voltage multiplier. all components except for inductor
Year Author(s) Topology Experimental Reference for switching converter whereas all
or theoretical components for SC. This is because
1914 Greinacher Doubler Experimental [1] Phys. Zeit. the inductance of an integrated
1923 Marx Parallel to Experimental [2] German patent inductor is much smaller than the
serial value required for generating a high
voltage when the silicon area is lim-
1932 Cockcroft Ladder Experimental [3] Proc. Royal.
Walton Soc. ited. This concentrates on SC volt-
age multipliers or charge pumps.
1958 Kilby Invention of IC [4] U.S. Patent
Table 2 summarizes representa-
1971 Brugler Serialparallel Theoretical [5] JSSC tive two-phase clock SC voltage mul-
1973 Falkner Parallel Theoretical [6] Elec. Lett. tipliers. Grenacher is known as an
1976 Dickson Parallel Experimental [7] JSSC inventor of the so-called SC voltage
1991 Ueno et al. Fibonacci Experimental [8] ISCAS doubler in 1914 [1]. Marx developed
a pulse power generator for the R&D
1995 Cernea 2N Theoretical [9] U.S. Patent
of lightning in 1923 [2]. Cockcroft
and Walton built a voltage multi-
plier for a particle accelerator with
V1 = VIN a dc voltage gain greater than two
0V in 1932 [3]. After Kilby invented the
D2
C IC in 1958 [4], Brugler [5], Falkner
[6], and Dickson [7] have realized
Phase 1 the integration of SC voltage multi-
D1
VIN VOUT plier in ICs. Another direction was
2Q how the number of discrete capaci-
C
V1 = 2VIN tors and switching devices could be
Phase 2 VIN reduced for small form factor and
D2
Q low cost for high power applications.
VIN VOUT_MAX = 2VIN
Other types of circuit topology that
have been developed by Ueno et al.
D1 VOUT
0V [8] and Cernea [9] are also described
in this article.
Figure 1:An SC voltage doubler [1].
Greinacher SC Voltage
performance such as output volt- Part 1, detailing the history of the Doubler (1914) Figure 1
age current and power efficiency. SC voltage multiplier To generate 200-V dc from 110-V
There have been also several design Part 2, fundamentals of charge ac for an ionometer for measuring
innovations in switching circuits pump the intensity of ionizing radiation
to enable to work at extremely low Part 3, state-of-the-art switching in 1914, Greinacher built a voltage
voltages. This article shows state circuits and applications. doubler, using an ac power source,
of the art for switching circuits for one capacitor, and two diodes, as
both dc-dc and ac-dc voltage multi- A Brief History of shown in Figure 1 [1]. There are two
pliers and their applications as well. the SC Voltage Multiplier phases: charging the capacitor from
There will be three parts to this Voltage converters are categorized the power source in phase 1 and dis-
article series: into two groups, the switching converter charging the capacitor to the output

52 W I N T E R 2 0 16 IEEE SOLID-STATE CIRCUITS MAGAZINE


Precharge Phase Discharge Phase
VOUT = 0 V VOUT_PEAK = (N + 1) VIN

R R
G G
VOUT

R R VOUT_PEAK ~ (N + 1) VIN
R RL R RL
G G

R R R R
G G TR TF

R R R Time
G R
G
(c)
+ +
VIN VIN

(a) (b)

Figure 2:A Marx generator [2].

terminal in phase 2. Thus, a maxi- CockcroftWalton (CW) comparison with the input voltage
mum voltage gain of two was real- Ladder (1932) Figure 3 amplitude. (1) The voltage across the
ized. This simple and effective way Cockcroft and Walton needed to first capacitor C1 (i.e., V1) in phase 1
to generate a higher voltage became have a dc voltage gain greater than is equal to VIN . (2) The voltage
the basis of the following innovation. two for a particle accelerator with an across C1 in phase 2 is reduced by
output of up to 1 MV [3]. They used transferred charges, which is 3Q /C,
Marx Generator (1923) Figure 2 ac power, N-capacitors, and (N + 1) from the voltage across C1 in phase 1.
The Marx generator is composed diodes. Figure 3(a) depicts a 2.5-MV (3) The voltage across C2 (i.e., V2)
of N capacitors (Cs) connected in generator [12]. Later, the multiplier in phase 2 is equal to V1 because
parallel to the power supply VIN had been also applied for industrial V1 is given by VIN + (V IN - 3Q/C),
and ground via resistors (Rs) and in applications such as X-ray medical V1 = 2VIN - 3Q/C. (4) The voltage
series to each other via spark gaps equipment and an electron gun for across C2 in phase 1 is reduced
(Gs) as shown in Figure 2 [2]. Ini- a cathode-ray tube [13]. by transferred charges, which is
tially, as shown in Figure 2(a), all the Figure 3(b) shows how the CW 2Q /C, from the voltage across C2 in
capacitors are precharged to VIN . multiplier works in steady state phase 2. (5) The voltage across C3 in
When the first spark gap gets short, using an example of five stages. phase 1 is equal to that across C2
the second and the following spark One arrow represents an amount because both terminals of C3 are
gaps get short one after another. of charges Q , which is output per short to those of C2. (6)(10) In this
As a result, all the capacitors are cycle. In steady state, each diode way, one can calculate the voltage
connected in series to the load, as transfers one Q . In phases 1 and 2, across each capacitor. (11) The out-
shown in Figure 2(b). Because R is the input power needs to transfer put voltage is a sum of the voltage
made much larger than a load R L, three Q s to the multiplier because at the left terminal of C1 and the
the output voltage VOUT can reach it sees three diodes. As a result, the voltages across C1, C3, and C5 in
the maximum of (N + 1) VIN in a total injected charges per cycle are phase 2. Thus, VOUT = 6VIN - 19Q /C.
short time of period. After that, the six Q s. The factor of six is consid- The factor of VIN is six, which is
state gradually returns to its original ered as the number of diodes or the same as the number of diodes,
in a long period due to large R , as the number of capacitors plus one. as shown in Figure 3(b). The factor
shown in Figure 2(c). This technique Thus, in general, Q IN = (N + 1) Q OUT . of Q/C is 19. Now we know that
was originally aimed at research- Figure 3(c) calculates the rela- such a large number results from
ing lightning, but it has been also tionship between the output volt- the fact that the voltage drops in all
applied to generating pulsed X-ray age and current by proceeding from the previous capacitors are added.
for photolithography or feed grain (1) through (11). For simplicity, the As a result, the total voltage drop
preservation and medical care such threshold voltage of the diode is increases more rapidly as the num-
as eye surgery [10], [11]. assumed to be small enough in ber of stages increases. As for a

IEEE SOLID-STATE CIRCUITS MAGAZINE W I N T E R 2 0 16 53


Voltage converters are categorized into diodes in 1971 as shown in Figure 4(a)
[5]. The procedure to derive the
two groups, the switching converter I OUT VOUT equation is much easier
and the SC converter. than the CW. Assuming Q is the
amount of charge to be transferred
to the output terminal, each capaci-
tor loses the same amount of Q in in-
general number of stages, a voltage a multiplier using high-voltage series phase as shown in Figure 4(b).
drop of k th capacitor is propor- devices. You may have to take care Thus, each capacitor needs to be
tional to k 2, and so the total volt- of isolation from ground to prevent charged by Q in in-parallel phase.
age drop is proportional to N 3 [5]. the devices from being broken when Before charging Q , each capacitor
Therefore, the CW multiplier with low-voltage devices are used. voltage should be VIN - Q/C. Thus,
a large number of stages has very VCAP = VIN - Q/C. Consequently, VOUT
large output impedance. Brugler SerialParallel, is calculated as
An advantage of the CW multi- (1971) Figure 4
plier is that voltages across each As the output impedance of the VOUT =VIN +N VCAP = (N + 1) VIN -N Q/C.
capacitor and diode do not exceed CW multiplier increases by a factor (1)
2VIN . This means that the multi- of N 3, the challenge was to reduce
plier can be composed of low-volt- the output impedance. Brugler pro- Thus, the output impedance is propor-
age devices, which implies that the posed serialparallel (SP) configu- tional to N 1, which is much smaller
circuit area can be smaller than ration using switches rather than than that of CW multiplier of N 3 .

V1 V3 V5
0V
C1 C3 C5

VIN C2 C4
Phase 1
VOUT
V2 V4
QIN = 6Q
V1 V3 V5
VIN
Phase 2 C1 C3 C5 QOUT
=Q
0V C2 C4
VOUT
V2 V4
(b)
(5) 2VIN 5Q/C (9) 2VIN 8Q/C
(1) VIN
V1 V3 V5
0V C1 C3 C5

C2 C4
Phase 1 VIN VOUT
V2 V4
(4) 2VIN 5Q/C (8) 2VIN 8Q/C

(2) VIN 3Q/C (6) 2VIN 7Q/C (10) 2VIN 9Q/C

Phase 2 V1 V3 V5
VIN C1 C3 C5
Q

(a) C2 C4
0V VOUT
V2 V4 (11) VOUT = 6VIN 19Q/C
(3) 2VIN 3Q/C (7) 2VIN 7Q/C
(c)

Figure 3:(a) A 2.5-MV generator using CW voltage multiplier [12]. (b) The charge flow of CW voltage multiplier in steady state [3].
(c) A CockcroftWalton voltage multiplier (1932) [3].

54 W I N T E R 2 0 16 IEEE SOLID-STATE CIRCUITS MAGAZINE


What is the voltage across the
diode and capacitor of the SP cell? VIN
As can be seen in Figure 4(a), the V IN N VIN
capacitor voltage in parallel state is
equal to VIN and that in serial state In Parallel VOUT
is lower than VIN by Q/C. There-
fore, the capacitor could be made of GND
a low-voltage device, which enables
the reduction of the capacitor area
with higher capacitance density. VIN
In Series N VIN
On the other hand, the switches
used closely to the output terminal
VOUT
see N times higher than VIN for
GND (N + 1) VIN
both states, resulting in a require-
(a)
ment for high-voltage switching
devices. To integrate voltage mul-
In Parallel In Series
tipliers in ICs, you have to take
the impact of parasitic capacitance VIN N-Caps Q
into consideration.
Q
We know the SP works by chang- VOUT
ing the state alternately. When all VCAP
the capacitors are connected in
parallel with the power supply, VIN
there is no impact of the parasitic 0V VOUT = VIN + N VCAP
VCAP = VIN Q/C = (N + 1)VIN N Q/C
capacitance on the stored amount of (b)
charge in the capacitors. As shown
in Figure 4(c), when the capacitors No Cp w/Cp
Charge Loss qk
are connected in series, if the para- Q Q (q1 + ... + qN) N2
sitic capacitance (C p) is negligibly VIN
qN
small, each capacitor transfers a
same amount of charge Q to the
next capacitor, resulting in output- Q qk k VIN Q (q1 + ... + qN1)
ting Q. However, if the parasitic q2
capacitance is not negligible, the 0V
transferred charge is reduced at
every node. To be worse, the charge Q q1 Q q1
loss at an upper node is larger than
that at a lower node. The k th node Q Q
has a voltage amplitude of k Vin
from the parallel to in-series period. VIN VIN
Thus, the k th capacitor reduces the (c)
charge proportional to k Vin . The
sum of charge loss from the bottom Figure 4:(a) A serial/parallel voltage multiplier [5]. (b) A serial/parallel [5]. (c) A serial/
to the top would be proportional to parallel [5].
N 2 [14], [15]. This means that the
charge loss increases as the voltage
gain increases. As a result, serial Capacitors in Parallel Rather Than in Series with Modern Transistors
connection can lose voltage gain
0V VOUT
significantly.

Falkner Parallel (1973) Figure 5


Falkner showed another voltage CT
multiplier topology with lower 1 2 3 1 2 3
output resistance using parallel CB
configuration with a three-phase
clock as shown in Figure 5 [6]. The Figure 5:Parallel configuration for lower output impedance [6].

IEEE SOLID-STATE CIRCUITS MAGAZINE W I N T E R 2 0 16 55


100 m

VIN VOUT
1
2
(b)
Qq
q Qq
q

q q

Q Q

VIN 0V VIN 0V VIN 0V


Oscillator Multiplier Chain
Clock Drivers Output Limiter (k 1)th k th (k + 1)th (k 1)th k th (k + 1)th
(a) (c)

Figure 6:The first Si verified on-chip voltage multiplier [7].

key point is that each capacitor is


VOUT connected with a next neighbor in
VIN 1 2 1 2 1 parallel in each phase. The num-
ber of switches or diodes are that
2 1 2 1 of capacitors plus one, which is
Load

the same condition as the CW. The


1 2 1 2 bottom plate capacitance is moved
from a high-voltage path to a low-
GND voltage path, therefore it should
(a) have less dependence of parasitic
capacitance on the voltage gain.
Voltage Gain:
N VOUT_MAX/VIN
Dickson First Si Verified On-Chip
1 2 Voltage Multiplier (1976) Figure 6
2 3 In 1976, Dickson theoretically and
3 5 experimentally, for the first time,
4 8 studied an on-chip high-voltage
5 13 generator including a voltage mul-
(b) tiplier, oscillator, clock drivers, and
1VIN 3VIN 3VIN 8VIN VOUT
a limiter as shown in Figure 6(a)
VIN [7]. The diode is made of a MOSFET
1VIN 2VIN 3VIN 5VIN whose gate and drain terminals are
Load

connected, as shown in Figure 6(b).


Phase 1
Dickson used a two-phase clock,
which allowed the clock frequency
GND
as fast as possible. Using a seven-
2VIN 2VIN 5VIN 5VIN stage voltage multiplier, he success-
VIN
fully generated 40 V from the power
1VIN 2VIN 3VIN 5VIN
supply voltage of 15 V.
Load

Phase 2 The effective output impedance


R PMP and the maximum attainable
GND voltage VMAX are calculated as fol-
(c)
lows. When the input terminal is
connected with VIN, VMAX is as high
Figure 7:An SC voltage multiplier with smaller number caps [8]. as (N + 1) VIN when the number of

56 W I N T E R 2 0 16 IEEE SOLID-STATE CIRCUITS MAGAZINE


stages or capacitors is N. It is well In the 1990s, concerns about the SC voltage
known that the effective resistance
of an SC is 1/ (fC ), where f is the multipliers were the reduction in the number of
clock frequency. Thus, a parallel capacitors and switching devices for discrete high-
voltage multiplier with N-stages has
R PMP of N/ (fC). As a result,
power applications.

I OUT = fC ((N + 1) VIN - VOUT) /N.(2)


in parallel. Capacitors and diodes Cernea 2 N (1995) Figure 8
Because the amount of output need to be high-voltage devices. As Another multiplier having a smaller
charges per cycle (Q) is I OUT /f, (2) is the number of stages increases, the number of stages is Cerneas 2N
identical to (1). Thus, an ideal paral- voltage gain increases more rapidly multiplier, as shown in Figure 8(a)
lel voltage multiplier has the exact than the number of stages. Each [9]. When the number of stages con-
same characteristic as an ideal SP stage has one capacitor and three nected between the input and the
multiplier. switches. Theoretically, it is proven output is N, the required number
What about the impact of para- that this topology has the small- of capacitors are 2N because two
sitic capacitance on the Falkner/ est number of stages in two-phase arrays are required to complete the
Dickson parallel voltage multi- clock multipliers [25]. multiplier unlike the other types
plier? The charge supplied from
the power supply is Q indepen-
dent of the capacitor location.
Assuming each capacitor loses q,
every capacitor can transfer Q - q gnd
independently of the capacitor 2 2 2 2
location unlike the SP as shown in 1 1 1 1
Figure 6(c) [14], [15]. Thus, paral- VOUT
lel connection allows the parallel VIN 2 2 2 2 1
multiplier to have many input ter-
minals, resulting in low loss in the
voltage gain. A drawback is that
1 1 1 1 2
capacitor needs to be composed on VIN
high voltage devices. 2 2 2 2

Load
1 1 1 1
Ueno Fibonacci (1991) Figure 7
In the 1990s, concerns about the SC gnd
voltage multipliers were the reduc- (a)
tion in the number of capacitors
and switching devices for discrete gnd
Phase 1
high-power applications. Ueno et
al. proposed, in 1991, a multiplier,
2VIN 4VIN 8VIN 16VIN
as shown in Figure 7(a), whose max-
VIN 1VIN 2VIN 4VIN 8VIN VOUT
imum attainable voltage is given
by the Fibonacci number when
I OUT = 0, as shown in Figure 7(b) gnd
[8]. Each box of Figure 7(a) indi-
gnd Phase 2
cates a switch, and 1 and 2 means
the switch turns on in phase 1 or
2, respectively. In phase 1, an even
1VIN 2VIN 4VIN 8VIN
number of stages are connected VIN
2VIN 4VIN 8VIN 16VIN VOUT
in series with the output termi-
nal and odd number of stages are
connected in parallel to the serial
gnd
one as shown in Figure 7(c). In
(b)
phase 2, the situations are comple-
mentary. Thus, half of the stages
are in series, and the other half are Figure 8:An SC voltage multiplier with smaller number stages [9].

IEEE SOLID-STATE CIRCUITS MAGAZINE W I N T E R 2 0 16 57


Table 3. A Comparison of SC voltage multipliers.
VCAP /VIN VDIO /VIN #Serial Cap # input terminal Impact of C_para
CW Ladder 2 2 N/2 2 +
Brugler SP 1 N N 1 +++
Falkner and Parallel N 2 0 N+1
Dickson
Ueno Fibonacci F(N2) F(N1) N/2 1 ++
N N1 N2
Cernea 2 2 3x2 N 2 +++

required area and resultant power


efficiency of SP, Fibonacci (FIB2),
SP FIB2 2N SP FIB2 2N
and 2 N (2 N) cells are normalized
Relative Power Efficiency

5 1.0
by those of Falkner-Dickson parallel
Relative Circuit Area

4 0.8 cell in Figure 9 [17]. All the capaci-


3 0.6 tors in a cell are assumed to be
uniform except for FIB2, where the
2 0.4
k th stage capacitor size is made
1 0.2 proportional to Fibonacci number of
0 0.0 (N - k) . In a typical CMOS process,
0 2 4 6 8 10 0 2 4 6 8 10 the top and bottom plate parasitic
Voltage Gain Voltage Gain
capacitance can be as large as 10%
(a) (b) of the multiplier capacitor including
the parasitic capacitance of wiring
Figure 9:Multiplier area versus parasitic capacitance [17]. and switching devices. Each multi-
plier is designed to have the same
output current with the same clock
of voltage multipliers. The upper capacitors, but the number of seri- frequency. As seen in Figure 9(a),
side of Figure 8(b) shows a first half ally connected stages is large and the any cell needs larger circuit area
period when I OUT = 0. The upper number of input terminals is small. than the parallel cell for a voltage
stages are connected in series with As a result, the impact of parasitic gain greater than three. The power
the output terminal, whereas the capacitance (C_para) is significant. efficiency in Figure 9(b) has a simi-
lower stages are connected in par- On the other hand, the Falkner and lar trend as does the area. As the
allel with the upper stages. As the Dickson parallel multiplier has less number of multiplier capacitors
number of stages increases by one, impact of parasitic capacitance on needs to be increased, more power
the maximum attainable voltage charge transfer because the number needs to drive the parasitic capaci-
increases by a factor of two in an of serially connected stages is small tance, which results in lower power
ideal case where no parasitic capac- and the number of input terminals efficiency. As a result, the Falkner-
itance is considered. You may con- is large. Ueno Fibonacci/Cernea 2 N Dickson parallel multiplier should
sider the number of stages of the cells can have a fewer number of be selected for integration with
2 N multiplier to be smaller than capacitors than the others, but half respect to area and power.
that of the Fibonacci voltage multi- to all capacitors are connected in Figure 10 shows more evidence
plier. But thats not the case because serial, resulting in a significant loss about the best topology for inte-
the 2 N voltage multiplier needs two in voltage gain due to the high sensi- gration across the voltage gain in
arrays. Capacitors and diodes need tivity of parasitic capacitance. literature. I and D , respectively,
to be high-voltage devices. indicate integrated and discrete.
Best Topology for Integrated Two designs have been realized with
Comparison of Voltage Stress Voltage Multiplier CockcroftWalton cells for earphone
on Devices and Impact To identify the best topology for inte- to have a voltage gain of five with
of Parasitic Capacitance grated voltage multiplier especially no high-voltage devices [18], [19].
Table 3 summarizes the character- whose voltage gain is more than a There have been some designs with
istics of each SC voltage multiplier few, the area and power efficiency SP and Fibonacci cells that have volt-
[15], [16]. The CW and SP multipli- of each topology cell are quantita- age gains higher than five but either
ers can be composed of low-voltage tively compared one another. The has needed discrete capacitors and

58 W I N T E R 2 0 16 IEEE SOLID-STATE CIRCUITS MAGAZINE


electret earphone driver with symmetric
Cockcroft-Walton pumping topology for
[18] Tseng et al. (2007) [22] Harada et al. (1992) in-ear hearing aids, in Proc. IEEE Asian
[19] Tsai et al. (2012) [7] Dickson (1976) Solid-State Circuits Conf., 2012, pp. 4548.
[20] S. Tsukamoto, N. Iizasa, K. Yoshitomi,
[20] Tsukamoto et al. (2013) [23] Oto et al. (1983) R. Pokharel, K. Yoshida, R. Hattori, H.
[21] Karadi et al. (2014) [24] Sawada et al. (1995) Kanaya, and D. Kanemoto, Development
of a rectenna for batteryless electronic
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I Integrated
switched-capacitor DC-DC boost con-
D [21] D Discrete Cap verter providing 16V at 7mA and 70.3%
SP efficiency in 1.1mm3, in IEEE Solid-State
Circuits Conf. Dig. Tech. Paper, 2014, pp.
9293.
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Characteristics analysis of Fibonacci
type SC transformer, IEICE Trans. Fun-
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[23] D. Oto, V. Dham, K. Gudger, M. Reitsma,
G. Gongwer, Y. Hu, J. Olund, H. Jones,
3 5 6 8 12 and S. Nieh, High-voltage regulation
Voltage Gain and process consideration for high-den-
sity 5 V-only E2PROMs, IEEE J. Solid-
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Figure 10:Circuit topology versus voltage gain in literature. Oct. 1983.
[24] K. Sawada, Y. Sugawara, and S. Masui, An
on-chip high-voltage generator circuit
for EEPROMs with a power supply volt-
age below 2 V, in Symp. VLSI Circuits Dig.
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Emergency power supply for small com- [25] M. S. Makowski and D. Maksimovic, Per-
small parasitic capacitance and large puter systems, in Proc. IEEE Int. Conf. formance limits of switched-capacitor
multiplier capacitance. On the other Circuits and Systems, June 1991, pp. DC-DC converters, in Proc. IEEE Power
10651068. Electronics Specialists Conf., June 1995,
hand, there have been many designs [9] R. A. Cernea, Charge pump circuit with pp. 12151221.
with the Falkner-Dickson parallel exponential multiplication, U.S. patent
5,436,587, 25 July 1995.
cell to have voltage gains as high as [10] S. Levy, M. Nikolich, I. Alexeff, M. Radar, M.
over ten (e.g., [24]). The following T. Buttram, and W. J. Sarjeant, Commer- About the Author
cial applications for modulators and pulsed
articles in this series focus on the power technology, in Proc. Conf. Record 12th Toru Tanzawa (toru.tanzawa.jp@
parallel voltage multiplier, which is Power Modulator Symp., 1992, pp. 814. ieee.org) is a distinguished member
[11] J. C. Martin, Nanosecond pulse tech-
called charge pump afterwards. niques, Proc. IEEE, vol. 80, pp. 934945,
of technical staff at Micron Memory
June 1992. Japan, Inc. He received the Ph.D. de-
[12] G. Reinholds and R. Gleyvod, Megawatt
HV DC power supplies, IEEE Trans. Nucl.
gree in electrical engineering from
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[1] H. Greinacher, The ionometer and [13] M. D. Bellar, E. H. Watanabe, and A. C.
its application to the measurement of Mesquita, Analysis of the dynamic and
2002. He has been with Toshiba and
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15, pp. 410415, 1914. Walton cascade rectifiers, IEEE Trans.
[2] E. Marx, Verfahren zur Schlagpr fung Power Electron., vol. 7, pp. 526534,
circuit design of high-density NAND
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Vorrich- tungen, German patent 455,933, [14] T. Tanzawa, On-chip high-voltage gener-
1923.
flash, and RF-CMOS wireless ICs
ator deign, Tutor. IEEE Int. Conf. Circuits
[3] J. D. Cockcroft and E. T. S. Walton, Exper- Syst., May 2012. since 1992. He holds 165 granted
iments with high velocity positive ions. [15] T. Tanzawa, Switched capacitor voltage U.S. patents, has published 37 pa-
(I) Further developments in the method multipliers, in On-Chip High-Voltage
of obtaining high velocity positive ions, Generator Design. New York: Springer, pers in IEEE conferences and jour-
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