Professional Documents
Culture Documents
DATA BOOK
1st EDITION
JUNE 1988
USE IN LIFE SUPPORT MUST BE EXPRESSLY AUTHORIZED
SGS-THOMSON PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF SGS-THOMSON
Microelectronics. As used herein:
- Life support devices or systems are devices or systems 2 - A critical component is any component of a life support
which, are intended for surgical implant into the body device or system whose failure to perform can be
to support or sustain life, and whose failure to perform, reasonably expected to cause the failure of the life sup-
when properly used in accordance with instructions for port device or system, or to affect its safety or effec-
use provided in the labeling, can be reasonably expect- tiveness.
ed to result in a significant injury to the user.
2
TABLE OF CONTENTS
INTRODUCTION. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
General information............................................. 7
Technology overview............................................ 8
Selection guide by part number. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 9
Selection guide by voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 14
Selection guide by package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 19
Cross reference................................................ 27
Alphabetical list of symbols. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 33
Rating systems for electronic devices. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 35
Handling of power plastic transistors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 36
Accessories and mounting instruction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 39
Electrostatic discharge protection (handling precautions). . . . . . . . . . . . . . .. 49
TECHNICAL NOTES........................................... 51
An introduction to POWER MOS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 53
Evolution of POWER MOS transistors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 57
POWER MOS in switching - an evaluation method and a practical example. 63
Study of a model for POWER MOSFET gate-charge. . . . . . . . . . . . . . . . . .. 75
Comparison of POWER MOS and bipolar power transistors. . . . . . . . . . . .. 85
A brief look at static dVldt in POWER MOSFETs ................ , . . . . .. 89
High density POWER MOSFETs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .. 95
High voltage transistors with POWER MOS emitter switching ............ 107
A wide range input DC-DC power converter ........................... 113
200KHz 15W push pull DC-DC converter ............................. 121
Drive circuit for an electric fuel cut-off valve .......................... 127
Novel protection & gate drivers for MOSFETs used in bridge-leg configurations 131
High voltage POWER MOSFET STHV1 02 ........................... 137
An introduction to HIMOS ........................................ 143
An economic motor drive with very few components. . . . . . . . . . . . . . . . . . . 149
Inproved POWER MOS ruggedness in unclamped inductive switching .... 153
3
INTRODUCTION
5
GENERAL INFORMATION
POWER MOS devices are made using well proven for applications in industrial, automotive, compu-
SGS-THOMSON technology. POWER MOS tech- ter, telecommunication, professional, and consu-
nology stands, with equal stature, firmly alongsi- mer equipment.
de the company's POWER BIPOLAR technologies.
This DATABOOK has been produced to comple- Selection guides are provided in the following pa-
ment the advances in silicon technology and iso- ges to facilitate rapid identification of the most sui-
lated packaging. table device for the intended use.
MAIN FEATURES:
INTERNAL SCHEMATIC
ULTRA FAST SWITCHING
DIAGRAM
EASY DRIVE
VERY LOW STORAGE TIME
LOW SWITCHING LOSSES
NO SECONDARY BREAKDOWN
Standard structure
r J
5-8319
'="=DRAIN
POWER MOS is a technology used to produce po- POWER MOS devices are available in a low volta-
wer devices featuring easy drive and high switching ge group, 50-250 volts Voss and high voltage ran-
speed_ ge 250 to 1000 volt Voss. Devices with a
POWER MOS transistors are produced using a maximum drain current of 52 A per chip are cur-
DMOS structure where the channel is obtained by rently available. When used in a pulse mode,
lateral diffusion_ The surface has a two tier struc- loss max =:: 4 X loss or more.
ture; the lower level is the polysilicon gate, and the Applications are in the field of power control and
upper level is the source metallization_ The struc- include, DC-DC converters, switching power sup-
ture is self-aligning as the polysilicon holes are used plies, actuator drivers, motor control, robotics etc.
as a mask for the P - well and the N + source dif- The latest development in POWER MOS techno-
fusion_ The MOS channel is created by the diffe- logy has generated high density cell structures
rence in lateral diffusion of the two impurity which for the same surface area increase the cur-
distributions. rent density of these devices. High density POWER
The resulting accuracy of this process controls the MOS devices are designed for breakdown volta-
channel length to :::;; 1_5 microns and the use of ges up to 1OOV, which is the maximum voltage whe-
a polycrystalline gate maintains a high stability of re increasing the cell density can give real
threshold voltage . advantages in current capability (or RDSon).
8
.------------ ~ ~~~~m~vT:~~~~ --------------
SELECTION GUIDE BY PART NUMBER
------------------------~~~~~~~::~n------------------------9
SELECTION GUIDE BY PART NUMBER
------------------------~~~~~~&T:9~------------------------
10
SELECTION GUIDE BY PART NUMBER
IRF741 350 0.55 5.20 TO-220 10.00 125 4.00 1600 319
IRF741FI 350 0.55 5.20 ISOWATT220 5.50 40 4.00 1600 319
IRF742 400 0.80 5.20 TO-220 8.30 125 4.00 1600 319
IRF742FI 400 0.80 5.20 ISOWATT220 4.50 40 4.00 1600 319
IRF743 350 0.80 5.20 TO-220 8.30 125 4.00 1600 319
IRF743FI 350 0.80 5.20 ISOWATT220 4.50 40 4.00 1600 319
IRF820 500 3.00 1.40 TO-220 2.50 50 1.00 400 325
IRF820FI 500 3.00 1.40 ISOWATT220 2.00 30 1.00 400 325
IRF821 450 3.00 1.40 TO-220 2.50 50 1.00 400 325
IRF821FI 450 3.00 1.40 ISOWATT220 2.00 30 1.00 400 325
IRF822 500 4.00 1.40 TO-220 2.20 50 1.00 400 325
IRF822FI 500 4.00 1.40 ISOWATT220 1.50 30 1.00 400 325
IRF823 450 4.00 1.40 TO-220 2.20 50 1.00 400 325
IRF823FI 450 4.00 1.40 ISOWATT220 1.50 30 1.00 400 325
IRF830 500 1.50 2.50 TO-220 4.50 74 2.70 800 331
IRF830FI 500 1.50 2.50 ISOWATT220 3.00 35 2.70 800 331
IRF831 450 1.50 2.50 TO-220 4.50 74 2.70 800 331
IRF831FI 450 1.50 2.50 ISOWATT220 3.00 35 2.70 800 331
IRF832 500 2.00 2.50 TO-220 4.00 74 2.70 800 331
IRF832FI 500 2.00 2.50 ISOWATT220 2.50 35 2.70 800 331
IRF833 450 2.00 2.50 TO-220 4.00 74 2.70 800 331
IRF833FI 450 2.00 2.50 ISOWATT220 2.50 35 2.70 800 331
IRF840 500 0.85 4.40 TO-220 8.00 125 4.90 1600 337
IRF840FI 500 0.85 4.40 ISOWATT220 4.50 40 4.90 1600 337
IRF841 450 0.85 4.40 TO-220 8.00 125 4.90 1600 337
IRF841FI 450 0.85 4.40 ISOWATT220 4.50 40 4.90 1600 337
IRF842 500 1.10 4.40 TO-220 7.00 125 4.90 1600 337
IRF842FI 500 1.10 4.40 ISOWATT220 4.00 40 4.90 1600 337
IRF843 450 1.10 4.40 TO-220 7.00 125 4.90 1600 337
IRF843FI 450 1.10 4.40 ISOWATT220 4.00 40 4.90 1600 337
IRFP150 100 0.055 22.00 TO-218 40.00 150 13.00 3000 343
IRFP150FI 100 0.055 22.00 ISOWATT218 26.00 65 13.00 3000 343
IRFP151 60 0.055 22.00 TO-218 40.00 150 13.00 3000 343
IRFP151FI 60 0.055 22.00 ISOWATT218 26.00 65 13.00 3000 343
IRFP152 100 0.08 22.00 TO-218 34.00 150 13.00 3000 343
IRFP152FI 100 0.08 22.00 ISOWATT218 21.00 65 13.00 3000 343
IRFP153 60 0.08 22.00 TO-218 34.00 150 13.00 3000 343
IRFP153FI 60 0.08 22.00 ISOWATT218 21.00 65 13.00 3000 343
IRFP350FI 400 0.30 8.00 ISOWATT218 10.00 70 8.00 3000 349
IRFP450 500 0.40 7.20 TO-218 14.00 180 8.70 3000 355
IRFP450FI 500 0.40 7.20 ISOWATT218 9.00 70 8.70 3000 355
IRFP451 450 0.40 7.20 TO-218 14.00 180 8.70 3000 355
IRFP451FI 450 0.40 7.20 ISOWATT218 9.00 70 8.70 3000 355
IRFP452 500 0.50 7.20 TO-218 12.00 180 8.70 3000 355
IRFP452FI 500 0.50 7.20 ISOWATT218 8.00 70 8.70 3000 355
IRFP453 450 0.50 7.20 TO-218 12.00 180 8.70 3000 355
IRFP453FI 450 0.50 7.20 ISOWATT218 8.00 70 8.70 3000 355
IRFZ20 50 0.10 9.00 TO-220 15.00 40 5.00 850 361
IRFZ20FI 50 0.10 9.00 ISOWATT220 12.50 30 5.00 850 361
IRFZ22 50 0.12 9.00 TO-220 14.00 40 5.00 850 361
IRFZ22FI 50 0.12 9.00 ISOWATT220 12.00 30 5.00 850 361
IRFZ40 50 0.028 29.00 TO-220 35.00 125 17.00 3000 367
IRFZ42 50 0.035 29.00 TO-220 35.00 125 17.00 3000 367
MTH6N60FI 600 1.20 3.00 ISOWATT218 3.50 40 2.00 1800 373
MTH40N06 60 0.028 20.00 TO-218 40.00 150 10.00 5000 379
MTH40N06FI 60 0.028 20.00 ISOWATI218 26.00 65 10.00 5000 379
MTP3N60 600 2.50 1.50 TO-220 3.00 75 1.50 1000 385
MTP3N60FI 600 2.50 1.50 ISOWATT220 2.50 35 1.50 1000 385
MTP6N60 600 1.20 3.00 TO-220 6.00 125 2.00 1800 391
MTP15N05L 50 0.15 7.50 TO-220 15.00 75 5.00 900 397
MTP15N05LFI 50 0.15 7.50 ISOWATT220 10.00 30 5.00 900 397
MTP15N06L 60 0.15 7.50 TO-220 15.00 75 5.00 900 397
MTP15N06LFI 60 0.15 7.50 ISOWATT220 10.00 30 5.00 900 397
MTP3055A 60 0.15 6.00 TO-220 12.00 40 4.50 500 403
MTP3055AFI 60 0.15 6.00 ISOWATT220 10.00 30 4.50 500 403
SGS30MA050D1 500 0.20 15.00 TO-240 30.00 - 400 15.00 9100 409
SGS35MA050D1 500 0.16 17.50 TO-240 35.00 400 15.00 12000 415
SGS1 OOMA01 OD1 100 0.014 50.00 TO-240 120.00 400 20.00 11200 421
SGS150MA010D1 100 0.009 75.00 TO-240 150.00 400 20.00 14000 427
SGSP201 100 1.40 1.20 SOT-82 2.50 18 0.50 125 433
SGSP222 50 0.13 5.00 SOT-82 10.00 50 3.00 550 439
SGSP230 450 3.00 1.20 SOT-82 2.50 50 0.80 450 445
SGSP239 500 8.50 0.60 SOT-82 1.20 40 0.65 300 451
SGSP301 100 1.40 1.20 TO-220 2.50 18 0.50 125 457
SGSP311 100 0.30 5.50 TO-220 11.00 75 2.00 480 463
SGSP316 250 1.20 2.50 TO-220 5.00 75 1.50 500 469
SGSP317 200 0.75 3.00 TO-220 6.00 75 1.50 500 469
SGSP319 500 3.80 1.40 TO-220 2.80 75 0.80 380 475
SGSP321 60 0.13 8.00 TO-220 16.00 75 3.00 550 481
SGSP322 50 0.13 8.00 TO-220 16.00 75 3.00 550 481
SGSP330 450 3.00 1.50 TO-220 3.00 75 0.80 450 487
SGSP341 400 20.00 0.30 TO-220 0.60 18 0.10 105 493
SGSP351 100 0.60 3.00 TO-220 6.00 50 1.00 250 499
SGSP358 50 0.30 3.50 TO-220 7.00 50 1.50 270 505
SGSP361 100 0.15 9.00 TO-220 18.00 100 4.50 1200 511
SGSP362 80 0.10 11.00 TO-220 22.00 100 4.50 1200 511
SGSP363 250 0.45 5.00 TO-220 10.00 100 3.00 1200 517
SGSP364 450 1.50 2.50 TO-220 5.00 100 3.00 1000 523
SGSP367 200 0.33 6.00 TO-220 12.00 100 3.00 1200 517
SGSP369 500 1.50 2.50 TO-220 5.00 100 3.00 1000 523
------------------------~~~~~~g~:~~------------------------
12
SELECTION GUIDE BY PART NUMBER
HIMOS (IGBT)
13
SELECTION GUIDE BY VOLTAGE
------------------------~~~~~~g~:~~
14
------------------------
SELECTION GUIDE BY VOLTAGE
100 0.077 17.00 TO-3 IRF140 28.00 125 8.70 1600 261
100 0.077 17.00 TO-220 IRF540 28.00 125 8.70 1600 295
100 0.077 17.00 ISOWATT220 IRF540FI 15.00 40 8.70 1600 295
100 0.075 15.00 TO-218 SGSP471 30.00 150 9.00 2200 541
100 0.055 20.00 TO-3 IRF150 40.00 150 9.00 3000 267
100 0.055 22.00 TO-218 IRFP150 40.00 150 13.00 3000 343
100 0.055 22.00 ISOWATT218 IRFP150FI 26.00 65 13.00 3000 343
100 0.014 50.00 TO-240 SGS100MA010D1 120.00 400 20.00 11200 421
100 0.009 75.00 TO-240 SGS150MA010D1 150.00 400 20.00 14000 427
150 1.20 2.50 TO-220 IRF623 4.00 40 1.30 600 301
150 1.20 2.50 ISOWATT220 IRF623FI 3.50 30 1.30 600 301
150 0.80 2.50 TO-220 IRF621 5.00 40 1.30 600 301
150 0.80 2.50 ISOWATT220 IRF621FI 4.00 30 1.30 600 301
200 1.20 2.50 TO-220 IRF622 4.00 40 1.30 600 301
200 1.20 2.50 ISOWATT220 IRF622FI 3.50 30 1.30 600 301
200 0.80 2.50 TO-220 IRF620 5.00 40 1.30 600 301
200 0.80 2.50 ISOWATT220 IRF620FI 4.00 30 1.30 600 301
200 0.75 3.00 TO-220 SGSP317 6.00 75 1.50 500 469
200 0.40 4.50 TO-220 BUZ32 9.50 75 2.20 2000 195
200 0.33 6.00 TO-220 SGSP367 12.00 100 3.00 1200 517
200 0.17 10.00 TO-218 SGSP477 20.00 150 8.00 2200 553
200 0.17 10.00 TO-3 SGSP577 20.00 150 8.00 2200 583
250 1.20 2.50 TO-220 SGSP316 5.00 75 1.50 500 469
250 0.45 5.00 TO-220 SGSP363 10.00 100 3.00 1200 517
350 2.50 1.80 TO-220 IRF723 2.80 50 1.00 600 307
350 2.50 1.80 ISOWATT220 IRF723FI 2.00 30 1.00 600 307
350 1.80 1.80 TO-220 IRF721 3.30 50 1.00 600 307
350 1.80 1.80 ISOWATT220 IRF721FI 2.50 30 1.00 600 307
350 1.50 3.00 TO-220 IRF733 4.50 74 2.90 800 313
350 1.50 3.00 ISOWATT220 IRF733FI 3.00 35 2.90 800 313
350 1.00 3.00 TO-220 IRF731 5.50 74 2.90 800 313
350 1.00 3.00 ISOWATT220 IRF731FI 3.50 35 2.90 800 313
350 0.80 5.20 TO-220 IRF743 8.30 125 4.00 1600 319
350 0.80 5.20 ISOWATT220 IRF743FI 4.50 40 4.00 1600 319
350 0.55 5.20 TO-220 IRF741 10.00 125 4.00 1600 319
350 0.55 5.20 ISOWATT220 IRF741FI 5.50 40 4.00 1600 319
400 20.00 0.30 TO-220 SGSP341 0.60 18 0.10 105 493
400 2.50 1.50 TO-220 BUZ76A 2.60 40 0.80 500 249
400 2.50 1.80 TO-220 IRF722 2.80 50 1.00 600 307
400 2.50 1.80 ISOWATT220 IRF722FI 2.00 30 1.00 600 307
400 1.80 1.50 TO-220 BUZ76 3.00 40 0.80 500 245
400 1.80 1.80 TO-220 IRF720 3.30 50 1.00 600 307
400 1.80 1.80 ISOWATT220 IRF720FI 2.50 30 1.00 600 307
400 1.50 2.50 TO-220 BUZ60B 4.50 75 1.70 2000 219
400 1.50 3.00 TO-220 IRF732 4.50 74 2.90 800 313
16
SELECTION GUIDE BY VOLTAGE
------------ ~ ~~~~m~m:~~Jl------------ 17
SELECTION GUIDE BY VOLTAGE
HIMOS (IGBT)
80T-82
, ~
OPTION
80T-194
TO-220
,
ROS(on) (3 gfs Ciss
V(BR)OSS 10 lo(max) Ptot
(max) Type min max Page
(V) (A) (A) (W)
(0) (mho) (pF)
TO-220 (continueed)
ROS(on) @ 9fs C iss
V(BR)OSS 10 lo(max) Ptot
(max) Type min max Page
(V) (A) (A) (W)
(0) (mho) (pF)
50 0.028 29.00 IRFZ40 35.00 125 17.00 3000 367
50 0.023 30.00 STVHD90 52.00 125 30.00 3000 621
60 0.15 7.50 MTP15N06L 15.00 75 5.00 900 397
60 0.15 6.00 MTP3055A 12.00 40 4.50 500 403
60 0.15 7.50 STLT20 15.00 75 5.00 480 611
60 0.13 8.00 SGSP321 16.00 75 3.00 550 481
60 0.08 12.50 STLT30 25.00 100 9.00 1200 617
60 0.06 14.00 SGSP381 28.00 100 5.00 1400 529
60 0.04 15.00 BUZ11S2 30.00 75 4.00 2000 177
80 0.36 5.60 IRF523 8.00 60 2.70 600 285
80 0.27 5.60 IRF521 9.20 60 2.70 600 285
80 0.23 8.30 IRF533 12.00 79 5.10 800 291
80 0.16 8.30 IRF531 14.00 79 5.10 800 291
80 0.10 17.00 IRF543 25.00 125 8.70 1600 295
80 0.10 11.00 SGSP362 22.00 100 4.50 1200 511
80 0.077 17.00 IRF541 28.00 125 8.70 1600 295
100 1.40 1.20 SGSP301 2.50 18 0.50 125 457
100 0.60 3.00 SGSP351 6.00 50 1.00 250 499
100 0.36 5.60 IRF522 8.00 60 2.70 600 285
100 0.30 5.50 SGSP311 11.00 75 2.00 480 463
100 0.27 5.60 IRF520 9.20 60 2.70 600 285
100 0.25 5.00 BUZ72A 9.00 40 2.70 600 233
100 0.23 8.30 IRF532 12.00 79 5.10 800 291
100 0.20 6.00 BUZ20 12.00 75 2.70 2000 183
100 0.16 8.30 IRF530 14.00 79 5.10 800 291
100 0.15 9.00 SGSP361 18.00 100 4.50 1200 511
100 0.10 9.00 BUZ21 19.00 75 4.00 2000 187
100 0.10 17.00 IRF542 25.00 125 8.70 1600 295
100 0.077 17.00 IRF540 28.00 125 8.70 1600 295
150 1.20- 2.50 IRF623 4.00 40 1.30 600 301
150 0.80 2.50 IRF621 5.00 40 1.30 600 301
200 1.20 2.50 IRF622 4.00 40 1.30 600 301
200 0.80 2.50 IRF620 5.00 40 1.30 600 301
200 0.75 3.00 SGSP317 6.00 75 1.50 500 469
200 0.40 4.50 BUZ32 9.50 75 2.20 2000 195
200 0.33 6.00 SGSP367 12.00 100 3.00 1200 517
250 1.20 2.50 SGSP316 5.00 75 1.50 500 469
250 0.45 5.00 SGSP363 10.00 100 3.00 1200 517
350 2.50 1.80 IRF723 2.80 50 1.00 600 307
350 1.80 1.80 IRF721 3.30 50 1.00 600 307
350 1.50 3.00 IRF733 4.50 74 2.90 800 313
350 1.00 3.00 IRF731 5.50 74 2.90 800 313
350 0.80 5.20 IRF743 8.30 125 4.00 1600 319
350 0.55 5.20 IRF741 10.00 125 4.00 1600 319
400 20.00 0.30 SGSP341 0.60 18 0.10 105 493
------------------------~~~~~~&~:~~------------------------
20
SELECTION GUIDE BY PACKAGE
TO-220 (continueed)
ROS(on) @ gfs Ciss
V(BR)OSS 10 lo(max) Ptot
(max) Type min max Page
(V) (A) (A) (W)
(0) (mho) (pF)
400 2.50 1.50 BUZ76A 2.60 40 O.SO 500 249
400 2.50 1.S0 IRF722 2.S0 50 1.00 600 307
400 1.S0 1.50 BUZ76 3.00 40 O.SO 500 245
400 1.S0 1.S0 IRF720 3.30 50 1.00 600 307
400 1.50 2.50 BUZ60B 4.50 75 1.70 2000 219
400 1.50 3.00 IRF732 4.50 74 2.90 SOO 313
400 1.00 2.50 BUZ60 5.50 75 1.70 2000 215
400 1.00 3.00 IRF730 5.50 74 2.90 SOO 313
400 O.SO 5.20 IRF742 S.30 125 4.00 1600 319
400 0.55 5.20 IRF740 10.00 125 4.00 1600 319
450 4.00 1.40 IRFS23 2.20 50 1.00 400 325
450 3.00 1.40 IRFS21 2.50 50 1.00 400 325
450 3.00 1.50 SGSP330 3.00 75 O.SO 450 4S7
450 2.00 2.50 IRFS33 4.00 74 2.70 SOO 331
450 1.50 2.50 IRFS31 4.50 74 2.70 SOO 331
450 1.50 2.50 SGSP364 5.00 100 3.00 1000 523
450 1.10 4.40 IRFS43 7.00 125 4.90 1600 337
450 0.S5 4.40 IRFS41 8.00 125 4.90 1600 337
500 4.00 1.20 BUZ74A 2.00 40 O.SO 500 241
500 4.00 1.40 IRFS22 2.20 50 1.00 400 325
500 3.S0 1.40 SGSP319 2.S0 75 O.SO 3S0 475
500 3.00 1.20 BUZ74 2.40 40 O.SO 500 237
500 3.00 1.40 IRFS20 2.50 50 1.00 400 325
500 2.00 2.50 BUZ42 4.00 75 1.50 2000 203
500 2.00 2.50 IRFS32 4.00 74 2.70 SOO 331
500 1.50 2.50 BUZ41A 4.50 75 1.50 2000 199
500 1.50 2.50 IRFS30 4.50 74 2.70 SOO 331
500 1.50 2.50 SGSP369 5.00 100 3.00 1000 523
500 1.10 4.40 IRFS42 7.00 125 4.90 1600 337
500 0.S5 4.40 IRFS40 S.OO 125 4.90 1600 337
600 2.50 1.50 MTP3N60 3.00 75 1.50 1000 385
600 1.20 3.00 MTP6N60 6.00 125 2.00 1S00 391
ISOWATT220
ISOWATT220 (continueed)
RoS(on) C5 10 Ptot gfs Ciss
V(BR)OSS 10(max) max
(max) Type min Page
(V) (A) (A) (W)
(n) (mho) (pF)
TO-218
51
-:r1,. SGS-THOMSON
[ij]~((;;rnl@[gll,l~((;;'jj'rnl@[RJJ~((;;f)
23
SELECTION GUIDE BY PACKAGE
TO-218 (continueed)
ROS(on) @ gfs Ciss
V(BR)OSS 10 10(max) Ptot
(max) Type min max Page
(V) (A) (A) (W)
(0) (mho) (pF)
100 0.08 22.00 IRFP152 34.00 150 13.00 3000 343
100 0.075 15.00 SGSP471 30.00 150 9.00 2200 541
100 0.055 22.00 IRFP150 40.00 150 13.00 3000 343
200 0.17 10.00 SGSP477 20.00 150 8.00 2200 553
400 0.55 5.00 SGSP475 10.00 150 6.00 2100 547
450 0.70 4.50 SGSP474 9.00 150 6.00 2100 547
450 0.50 7.20 IRFP453 12.00 150 8.70 3000 355
450 0.40 7.20 IRFP451 14.00 150 8.70 3000 355
500 0.80 5.50 BUZ354 8.00 125 2.70 4900 257
500 0.70 4.50 SGSP479 9.00 150 5.00 1900 559
500 '0.60 5.50 BUZ353 9.50 125 2.70 4900 253
500 0.50 7.20 IRFP452 12.00 150 8.70 3000 355
500 0.40 7.20 IRFP450 14.00 150 8.70 3000 355
800 2.00 2:00 STHV82 5.50 125 . 2.00 1000 601
1000 3.50 2.00 STHV102 4.20 125 2.00 1200 607
ISOWATT218
51 SCiS-1HOMSON
~l, Ii(j]Ornl@rnl1rn'ii'rnl@[RI]O~
24
SELECTION GUIDE BY PACKAGE
TO-240
100 0.016 50.00 SGS1 00MA01 001 120.00 400 20.00 11200 421
100 0.009 75.00 SGS150MA01001 150.00 400 20.00 14000 427
500 0.20 15.00 SGS30MA05001 30.00 400 15.00 9100 409
500 0.16 17.50 SGS35MA05001 35.00 400 15.00 12000 415
TO-3
~
ROS(on) @ gfs Ciss
V(BR)OSS 10 10(max) Ptot
(max) Type min max Page
(V) (A) (A) (W)
(0) (mho) (pF)
TO-3 (continueed)
Ros(on) C3 10 Ptot g1s Ciss
V(BR)OSS (max) Type 10(max) min max Page
(V) (A) (A) (W)
(0) (mho) (pF)
TO-220 (HIMOS)
ISOWATT220 (HIMOS)
51 SCiS-THOMSON
~1,. ~O~OO@rnlbrn~'D'OO@IKIlO~~
26
CROSS REFERENCE
------------------------~~~~~~~::~~------------------------
27
CROSS REFERENCE
------------------------~~~~~~g~:~~------------------------
28
CROSS REFERENCE
------------ ~ ~~~~m?1r~:~~Jl------------
29
CROSS REFERENCE
30
CROSS REFERENCE
----------------------------~~~~~~?~~:~~~~ ----------------------------33
ALPHABETICAL LIST OF SYMBOLS
VGS Gate-source-voltage
VGS (th) Gate threshold voltage
V SD Source-drain diode forward on voltage
VClamp Drain clamping voltage
Vi Input voltage of a specified circuit
Frequency
gf5 Forward trasconductance
td (off) Turn-off delay time
td (on) Turn-on delay time
tf Fall time
ton Turn-on time
tr Rise time
trr Reverse recovery time
----------------------------~~~~~~?vT:~~~----------------------------
34
RATING SYSTEMS FOR ELECTRONIC DEVICES
A. DEFINITIONS OF TERMS USED tions with respect to supply voltage variation, equip-
a. Electronic device. An electronic tube or val- ment component variation, equipment control adju-
ve, transistor or other semiconductor device. stment, load variations, Signal variation,
Note: This definition excludes inductors, capa- environmental conditions, and variation in charac-
citors, resistors and similar components. teristics of the device under consideration and of all
other electronic devices in the equipment.
b. Characteristic. A characteristic is an inherent
and measurable property of a device. Such a
property may be electrical, mechanical, ther-
mal, hydraulic, electro-magnetic, or nuclear and C. DESIGN - MAXIMUM RATING SYSTEM
can be expressed as a value for stated or re- Design-maximum ratings are limiting values of ope-
cognized conditions. A characteristic may al- rating and environmental conditions applicable to a
so be a set of related values, usually shown in bogey electronic device of a specified type as defi-
graphical form. ned by its published data, and should not be excee-
c. Bogey electronic device. An electronic devi- ded under the worst probable conditions.
ce whose characteristics have the published no- These values are chosen by the device manufacturer
minal values for the type. A bogey electronic to provide acceptable serviceability of the device, ta-
device for any particular application can be ob- king responsibility for the effects of changes in ope-
tained by considering only those characteristics rating conditions due to variations in the
which are directly related to the application. characteristics of the electronic device under con-
d. Rating. A value which establishes either a li- sideration.
miting capability or a limiting condition for an The equipment manufacturer should design so that,
electronic device. It is determinate for specified initially and throughout life, no design-maximum va-
values of environment and operation, and may lue for the intended service is exceeded with a bo-
be stated in any suitable terms. gey device under the worst probable operating con-
Note: Limiting conditions may be either maxi- ditions with respect to supply-voltage variation equip-
ma or minima. ment, component variation, variation in characteri-
stics of all other devices in the equipment, equipment
e. Rating system. The set of principles upon control adjustment, load variation, signal variation
which ratings are established and which deter- and environmental conditions.
mines their interpretation.
Note: The rating system indicates the division
of responsibility between the device manufac-
turer and the circuit designer, with the object D. DESIGN - CENTRE RATING SYSTEM
of ensuring that the working conditions do not
Design-centre ratings are limiting values of opera-
exceed the ratings.
ting and environmental conditions applicable to a bo-
gey electronic device of a specified type as defined
by its published data, and should not be exceeded
B. ABSOLUTE MAXIMUM RATING SYSTEM under normal conditions.
These values are chosen by the device manufactu-
Absolute maximum ratings are limiting values of ope- rer to provide acceptable serviceability of the devi-
rating and environmental conditions applicable to ce in average applications, taking responsibilty for
any electronic device of a specified type as defined normal changes in operating conditions due to ra-
by its published data, which should not be exceeded ted supply-voltage variation, equipment component
under the worst probable conditions. variation, equipment control adjustment, load varia-
These values are chosen by the device manufactu- tion, Signal variation, environmental conditions, and
rer to provide acceptable serviceability of the devi- variations in the characteristics of all electronic
ce, taking no responsibility for equipment varia- devices.
tions, environmental variations, and the effects of The equipment manufacturer should design so that,
changes in operating conditions due to variations in initially, no design-centre value for the intended ser-
the characteristcs of the device under consideration vice is exceeded with a bogey electronic device in
and of all other electronic devices in the equipment. equipment operating at the stated normal supply-
The equipment manufacturer should design so that, voltage.
initially and throughout life, no absolute maximum
value for the intended service is exceeded with any The Absolute Maximum Rating System is commonly
device under the worst probable operating condi- used for semiconductor devices.
----------------------------~~~~~~~~~ ----------------------------
35
HANDLING OF POWER PLASTIC TRANSISTORS
PRECAUTIONS FOR PHYSICAL HANDLING OF 1.3. The leads should not be bent at an angle of
POWER PLASTIC TRANSISTOR [TO-220, more than 90 and they must be bent only
ISOWATT220, TO-218 (SOT-93), ISOWATT218, once (fig. 3b).
TO-126 (SOT-32), SOT-82, SOT-194] 1.4. The leads must never be bent laterally (fig.
3c).
When mounting power transistors certain precau-
tions must be taken in operations such as bending 1.5. Check that the tool used to cut or form the
of leads, mounting of heatsink, soldering and re- leads does not damage them or ruin their sur-
moval of flux residue. If these operations are not face finish.
carried out correctly, the device can be damaged
or reliability compromised. 2. Mounting on printed circuit
During mounting operations be careful not to
1. Bending and cutting leads apply stress to the power transistor.
The bending or cutting of the leads requires 2.1. Adhere strictly to the pin spacing of the tran-
the following precautions:
sistor to avoid forcing the leads.
1.1. When bending the leads they must be clam- 2.2. Leave a suitable space between printed cir-
ped tightly between the package and the ben-
cuit and transistor, if necessary use a spacer.
ding point to avoid strain on the package (in
particular in the area where the leads enter 2.3. When fixing the device to the printed circuit
the resin) (fig. 1). This also applies to cutting do not put mechanical stress on the transi-
the leads (fig. 2). stor. For this purpose the device should be
soldered to the printed circuit board after the
1.2. The leads must be bent at a minimum distan- transistor has been fixed to the heatsink and
ce of 3 mm from the package (fig. 3a). the heatsink to the printed circuit board.
Plas.Iic
Package m
t Lead forming or cutling
mechanism
_II.j
Spaced? W
A0039 Clamp mechanism
~I
a b c
s - ~6JO S-S631
TJ 260C. solderong bath TJ 350C soldering bath I
Exposed to air Exposed to air
('C) ('C)
:
150 150
100 100
50
50lder h 260'C
1.5mm:
'
I
50
----------------------------~~~~~~?vT:~~~ ----------------------------37
HANDLING OF POWER PLASTIC TRANSISTORS
Fig. 6 - Contact thermal resistance vs. insulator 5.2. If selfthreading screws are used there must be
thickness. an outlet for the material that is deformed du-
ring formation of the thread. The diameter 0
1 (fig. 7) must be large enough to avoid distor-
tion of the tab during tightening. For this pur-
pose it may be useful to insert a washer or use
of the type shown in fig. 8 where the pressure
on the tab is distributed on a much larger sur-
face. Sometimes when the hole in the heatsink
is formed with a punch, around the hole or hol-
low there may be a ring which is lower than the
heatsink surface.
This is dangerous because it may lead to distor-
tion of the tab as mentioned before.
5.3. A very serious problem is that ofthe rigidity bet-
ween heatsink, device and printed circuit
0.05 0.10 0.15 Th(mm)
board. Once the device and the heatsink are
5. Heatsink problems mechanically connected, and the heatsink is
fixed to the apparatus frame, the device and the
The most important aspect from the point of PCB are bound together by the leads ofthe de-
view of reliability of a power transistor is that the vices. A solution of this type is extremely dan-
heatsink should be dimensioned to keep the T j gerous.
of the device as low as possible. From the me-
chanical point of view, however, the heatsink Fig. 8 - Suggested screw
must be realized so that it does not damage the
T
device.
5.1. The planarity of the contact su rface between
device and heatsink must be <25p.m for
TO-220, ISOWATI220, TO-218, ISOWATT218,
TO-126 (SOT-32), SOT-82, SOT-194.
, .. oo~o
I
WRONG RIGHT
TO-3
ACCESSORY MECH.
ASSEMBLY NUMBER MATERIAL DATA
TYPE Q.ty Page
CHEESE HEAD
NOT AVAILABLE FROM
SCREWS
SGSTHOMSON
SLOTTED
MICA
CDA 3126 A' MICA 46
WASHER
INSULATING
CDA 3155 A NYLON 47
BUSHES
HEXAGON
NUTS
NOT AVAILABLE FROM
SGSTHOMSON
@ SOLDER LUG
NOT AVAILABLE FROM
SGSTHOMSON
TO-218 (SOT-93)
"
~
ACCESSORY MECH.
ASSEMBLY NUMBER MATERIAL DATA
TYPE Q.ty Page
CHEESE HEAD
NOT AVAILABLE FROM
SCREWS
SG5-THOMSON
SLOTTED
MICA
COA 3154 MICA 47
WASHER
INSULATING
COA 3155 C NYLON 47
BUSHES
G~
NOT AVAILABLE FROM
SOLDER LUG
SGSTHOMSON
ISOWATT218
ACCESSORY MECH.
ASSEMBLY NUMBER MATERIAL DATA
TYPE Q.ty Page
CHEESE HEAD
NOT AVAILABLE FROM
SCREWS
SGS-THOMSON
SLOTIED
TO220
ACCESSORY MECH.
ASSEMBLY NUMBER MATERIAL DATA
TYPE Q.ty Page
CDA 3163 48
INSULATING
CDA 3155 B NYLON 47
BUSHES
TO-220
ACCESSORY MECH.
ASSEMBLY NUMBER MATERIAL DATA
TYPE Q.ty Page
CHEESE HEAD
NOT AVAILABLE FROM
SCREWS
SGSTHOMSON
SLOTIED
INSULATING
CDA 3155 B NYLON 47
BUSHES
MICA
CDA 3159 MICA 48
WASHER
ISOWATT220
CHEESE HEAD
NOT AVAILABLE FROM
SCREWS 1 SGSTHOMSON
SLOTIED
I/ HEXAGON
NUTS
1
NOT AVAILABLE FROM
SGSTHOMSON
---------------------------~~~~~~~~:~g
44
---------------------------
ACCESSORIES AND MOUNTING INSTRUCTIONS
ACCESSORY MECH.
ASSEMBLY NUMBER MATERIAL
TYPE Q.ty DATA
"- SPRING
CLIP
1 NOT AVAILABLE FROM
SGSTHOMSON
r
MICA 1 SOT194 SGSTHOMSON MICA
WASHER
TO220: CDA3159 48
TO218: CDA3154 47
ISOWATT220, ISOWATT218
ACCESSORY MECH.
ASSEMBLY NUMBER MATERIAL
TYPE Q.ty DATA
45
ACCESSORIES AND MOUNTING INSTRUCTIONS
CDA 3126A
42
0-"""'/2
CDA 31268
42
------------------------~~~~~~&~:9:------------------------
46
ACCESSORIES AND MOUNTING INSTRUCTIONS
CDA 3154
25
0.05
[---- ~
W~- A-00L.2
CDA 3155
-ll
l$:~
jlRx~~ ~
A - 0024/2
Suffix Package a b c d e
A TO-3 6.40 to 6.60 3.00 to 3.10 4.00 to 4.05 1.1 max 1.55 to 1.65
B TO-220 5.30 to 5.50 3.00 to 3.10 3.83 to 3.88 0.60 to 0.65 1.70 to 1.80
C SOT-93 6.40 to 6.60 3.00 to 3.10 4.00 to 4.05 1.3 to 1.4 2.7 to 2.9
Material: Nylon Dimensions: mm
CDA 3159
R:2
-1-
N
~
22 1::
A-002SI3
0.05
MATERIAL
MICA
CDA 3163
I
~
=wffi JL-8-I
~ 1.6
A-OO 23/3
48
ELECTROSTATIC DISCHARGE PROTECTION (handling precautions)
Fig. 1
OXIDE LAYER GATE
/
DRAIN SOURCE
s- 8320
This happens mostly because a charged conduc- Here are the basic static control protection rules:
tor, typically a person, is rapidly discharged through A - Handle all components in a static-safe work
the device.
area.
There will be no net charge on any portion of the
B - Transport all components in static shielding
MOS structure when the induced high field exceeds
containers.
the breakdown voltage of the MOS capacitor we
may have a self-healing break-down, degradation To comply with the rules the following procedures
or catastrophic failure. must be set up.
The failure hazard is not limited to the gate region 1 - Static control wrist strap (from a qualified sour-
but it could occur wherever two conductive areas ce) used and connected properly.
are separated by a thin insulator.
2 - Each table top must be protected with a con-
POWER MOS devices can generally be conside-
ductive mat, properly grounded.
red less ESD sensitive than MOS I/Cs.
The input capacitance of a POWER MOS device 3 - Extensive use of conductive floor mats.
is typically 10 to 200 times larger, and the gate oxi- 4 - Static control shoe straps, wearing typically in-
de thickness is similar in size to that of the largest sulating footwear, such as with crepe or thick
MOS I/Cs used. rubber soles.
As a result, it is common practice not to consider
5 - Ionized air blowers are a necessary part of the
the ESD as dangerous for POWER MOS, but this
is not alway true, even though they are less sensi- protective system, to neutralize static charges
tive than MOS I/Cs on conductive items.
6 - Use only the grounded tip variety of soldering
HANDLING iron.
SGS-THOMSON has chosen a no-compromise 7 - Single components, tubes, printed circuit cards
strategy in the MOS ESD protection. From the wa- should always be contained in static shield-
fer level to the shipping of finished units, each work ing bags; keep our parts in the original bags
station and processing of the parts is guaranteed. up to the very last moment on the production
This is achieved through total adoption of shielding line.
and grounding media. Our final shipping of the
parts is performed in antistatic tubes, bags or bo- a - If bigger containers (tote box) are used for in-
xes. The suppliers greatest efforts are in vain if the . plant transport of devices or PC boards they
end user does not provide the same level of pro- must be electrically conductive, like the carbon
tection and care in application. loaded ones.
9 - All tools, persons, testing machines, which be applied before and removed after input si-
could contact device leads must be conducti- gnals; insertion and removal from sockets
ve and grounded. should be done with no power applied.
10 -Avoid using high dielectric materials (like po- 12 -Filtration, noise suppression, slow voltage sur-
lystyrene) for sub-assembly construction, sto- ges should be guaranteed on the supply lines.
ring and transportation.
13 -Any open (floating) input pin is a potential ha-
11 - Follow a proper power supply sequence in te- zard to your circuit: ground or short them to
sting and application. Supply voltage should Voo whenever possible.
51
TECHNICAL NOTE
A POWER MOS transistor is a power transistor pro- WHAT DOES POWER MOS MEAN?
duced with MOS, and not the usual bipolar tech-
nology. Fig. 1 shows that the device is totally implemen-
ted on the chip surface. In other words both the
Special characteristics are high switching speeds
on and off states are implemented in a horizontal
and easy driving. This introductory note describes
plane:
the essential points of the MOS structure when
used for power devices. the ON STATE i.e. the residual resistance when
in the on state corresponds to conduction on
WHAT DOES MOS MEAN? the top surface of the silicon
It means that the essential part (the silicon chip) the OFF STATE i.e. the depletion region of one
of the device is made up of three layers: of the two PN junctions, with its resistivity and
one conductive layer (M for metal) that is the length, gives the device its voltage rating.
control (drive) electrode With the present technology the "on the surface"
one isolating layer (0 for oxide) that prevents approach allows the production of MOS transistors
any current flow from the drive electrode to the that can handle tens of volts and milliamperes (as
other two electrodes, but does not block the in MOS microprocessors or in MOS memories). A
electric field power transistor must be able to handle no less
one semiconductor layer (S for semiconductor) than a few amperes at voltages of 50-100V or hi-
which switches on or off depending on the elec- gher. The approach of several devices "on the sur-
trical field imposed on it by the control electro- face" connected in parallel is unsuitable due to
de through the opening in the P zone of a problems of excessive connections, as each cell
conductive channel between the two zones. would have three terminals.
5-793 &
1/3
53
The best solution is to exploit the semiconductor Fig. 2 - V-Groove structure
both vertically as well horizontally. The paralleling
VMOS
of one of the two N doped regions of all the ele-
SOURCE GATE
mentary structures in parallel occurs on the bot-
tom face of the semiconductor.
At the same time, the PN junction that implements
the off performance (its length corresponds to the
voltage rating of the device) can be positioned ver-
tically, and so avoiding the waste of horizontal spa-
ce. the channel must be short (1 to 2 microns) to
obtain characteristics of practical interest. DRAIN
DRAIN
op
f~
Source
~
Intermedlote
OAyde
~on
GJot~ot.
~
~
,o;n
Body
Ga/~ w. -Diode
Source
The vertical double diffused MOS silicon gate tech- Fig. 1 - Evo/ution of POWER MOS devices
nology represents the final evolution of the deve-
lopment of a process to obtain POWER MOS VMOS
DRAIN
STRUCTURE
In the VDMOS silicon gate structure the best fea-
tures of earlier technologies and design are com-
bined with new fabrication techniques to achieve
much better performance. The VDMOS silicon gate
structure needs a more sophisticated technology,
very similar to that of the VLSI. 5-8406
DRAIN
1/6
57
VDMOS (fig. 2) is a two level structure where the stributions. The use of double diffusion achieves
lower level is the gate made of doped polycrystal- very short channels (~1.5p.).
line silicon and the upper level is the source me- With the VDMOS silicon gate structure the resul-
tallization. ting increase in packing density directly reduces
the cost and improves the performance of the de-
It is a self aligned structure since the polysilicon
vice. In fact the use of a polycrystalline gate redu-
holes are the mask for the P- well and N + source
ces the possibility of sodium ion contamination in
diffusion. the gate oxide (with high stability of threshold vol-
In this way MOS channel regions are obtained by tage VGS(th). Also the full surface source metalli-
difference in lateral diffusion of the two impurity di- zation allows a better heat dissipation.
EPITAXIAL N -
ELECTRON
CURRENT
FLOW LINES
DRAIN METAL
L (channel) - 1.75p.
t (gate ex) - 830 A
t (gate poly) - 3330 A
t (ox~poly-As) - 2500 A
t (p-vapox) - 9580 A
Xj (source) - 0.50 p.
Xj (body) - 2.58 p.
SOURCE
5-B173
s
5- 6172 DRAIN
CHANNEL
REGION
r - - --,
Ti5r
I
L
t
I
+- t __ .J
I I
:I [IN:
I
~
Li'I- -
;
I
-i.J
I
1
II I I
"
I I I I I I I I SOURCE
ELECTRODE
I
.....,..+---'1-1-......
SOURCE CHANNEL
REGION
50.10
ROS(on)' for a given chip area and the breakdown S
voltage. z
~
ON RESISTANCE
The vertical power DMOS consists of a large num- RAce
RCH
...
Accumulated Contact ResIstance
Channel RU'lIl1nce
ber of cells inteconnected in parallel on a single REP, ...
RJFET ...
Ep,tlllt,al Layer AUISIance
Junction FET ResIstance
XCELL-20(,um)
a)
RAce .. Accumulated Contact ResIstance
RCH ... Channel ResIstance
REPI .. Ep,ta)<llll Layer Aes'U3nce
RJFET'" Jvnction FETResistance
~
:;
z
o
cr
RJFET
INTERCELL DISTANCE
b)
I PASSIVATIO N
~~===-.L.!... 1
OXIDE
DRAIN ,..ETAL
5-S177
Fig. 9 - Computer simulation of the equipotential lines of the Edge of a high voltage POWER MOS device
Fig. 10
GATE
GATE OXIDE
P+
s- 8316 2 3 4 5 Deplh(,um)
SWITCHING PHASE
In practical working conditions three main phases
can be distingushed: f1
On state
When the device is on and the channel open, the
dissipated power is:
\
p(on) = VOS (on) X 10
V IJ ~ ~ r--
p(on) = VCE (sat) X Ic for bipolar transistors
It can be reduced optimising the technology (me-
tal back, epitaxial thickness) and the design (cell
dimensions and layout). t: 100 ns/div, P: 200W/div, Vg = 10V, Rg = 250.
Off state
Q. THE EFFICIENCY FACTOR
When the devices is off and the drain is at the sup- The performance of POWER MOS device can the-
ply voltage, the power dissipation is: refore be rated as the ratio between the total po-
wer in switching-on and off and the energy
Poff = Voo X loss
dissipated per cycle. It can be expressed as:
Poff = V cc X ICEX for bipolar transistors
Pt
"TRANSITIONS' , Q=~~~~~-
Eon + Eoff + Ep
During switching the dissipated power instant by Where:
instant is: Eon -is the energy lost in the turning-on and on
phases
1112
63
Eoff -is the energy lost in the turning-off and off 2) A more pronounced effect comes from the fact
phases that the voltage across CGO' when the gate sour-
Ep - is the energy lost in driving the circuit. ce voltage rises from zero to its final value, Vos
The quantity Q is a frequency and is an index of the must go down from Voo to VOS(on)' In particular
maximum frequency at which the device can most CGO is seen as a higher equivalent capacitan-
efficiently operate, considering Pt as the maximum ce during the drain "on" transitions. The input
power that the device can dissipate in practical wor- must be fed a charge:
king conditions.
Q =CGo(Voo-VOS(on)
To fully understand this equation a brief analysis of
switching phenomena is essential. As previously to account for the voltage variation across CGo,
mentioned, POWER MOS do not make use of mi- This happens when the gate voltage reaches
nority carriers for conduction. The recombination VGs(th), the threshold voltage, and the drain vol-
of these minority carriers is a switching speed limi- tage starts falling. It is not until the required char-
tation.ln POWER MOS devices the majority carrier ge Q is provided that V GS can increase. This is
flow is simply controlled by the gate voltage and the- called the Miller Effect. For a while the equiva-
refore its switching speed is limited only by the time lent input capacitance appears infinite and VGO
needed to charge and discharge the parasitic input absorbs the whole input current.
capacitances. Consequently the switching beha- From the momentVos reaches VOS(on) the input
viour is a function only of the ability of the driving equivalent capacitance is:
circuit to charge and discharge some hundreds of
picofarads. This is why POWER MOS can switch Ceq = CGS + CGo(low voltage)
so fast - in the range of tens of nanoseconds. and the transition of the output is completed.
INPUT VGS increases again, tending towards Vi'
POWER MOS devices behave quite differently from These two phenomena become apparent when
bipolar power devices, as far as the driving energy looking at the gate charge versus gate source
is concerned. POWER MOS require driving power voltage diagram in the data sheets.
during the charge and the discharge phases of the The diagram for SGSP471 in fig. 4 can be taken
input capacitances. Fig. 3 shows a POWER MOS as an example.
driven by a voltage generator with an internal resi- A true capacitor would appear as a straight line star-
stance Ri and an open circuit voltage Vi' where RL ting from the origin. In fact the first segment corre-
is the load. sponds to an equivalent capacitance:
Fig. 3 - POWER MOS equivalent circuit.
Ceq = CGS + CGO (high voltage)
<-t.
r-.r,-=-
/ r717
,,,Cos 10 f - - t--
VDs-~g~ IV
SOV
__ J r7/ r7
5-8123
17 r7/
1/V/ 10 =4.5A
Tease = 25C f--
/ [7~
The input capacitance Ciss = CGS + CGO during the
switching cycle is not constant for two reasons. II
1) CGO can be seen as the capacitance between
the gate electrode and the drain, where the die- J
lectric is the depleted drain layer. The drain epi- I
layer is fixed, but its depleted part varies accor-
ding to Vos. The higher Vos, the thicker the de-
I
II
pleted layer and consequently the lower the
associated capacitance. 20 40 60 eo Q(ne)
I
I
L ___ _
5-8125
~
____ ~90.1.
vi :
INPUT
10/. [
I
I
I
[
Vo :
[
5 - 8126 I
I
I I
Fig. 9 shows a possible implementation that avoids 5- 6059 td(off) tf
steady state dissipation in the driver.
The NPN transistor, Q1, only conducts at the be-
ginning of the on phase when charging the input Turn on delay time
capacitances. Conversely the PNP transistor, Q2, Turn on delay time (td(on) in fig. 11) represents the
only conducts at the beginning of the off phase time necessary for VGS to reach the threshold Ie
PARASITIC CAPACITANCES
DURING SWITCHING CYCLES
s- 8131
As already mentioned the switching of a POWER
MOS device consists fundamentally in the loading Fig. 13b - Capacitance values as a function of Vos
and unloading of the input capacitor. . G- 5696
C
(pF )
Fig. 12a - Turn-on
5-8129
800
I' VGS=O
t=IMHz
700 \
~l\.
05
~ :/ 600
1\ 1 500
\ ~" .........
V~ 400
II \ ............. t-- Ciss
A- " b-...
'0
I
lJ
I \, 300
200
~
"'-........
r-- 1"---10-
-
r-- ~s_
Crss -
-1--
100
t = 50 ns/div 10 15 20 25 30 35 40 VOS(V)
67
Obviously the smaller the value of RLC iss the Fig. 14 - Time measurement td, t" and tr as func-
faster VGS reaches its final value, and switches the tions of 10 . (SGSP311)
device. To minimize this time constant the user G-5897
- Ir -I- -I"'"
I
-- I-- I
i
there is a delay in the increase of the value of VGS I ..
since the capacitor, as long as it is not charged to j I I
/1 i
Y ~'4
Fig. 15 - Time measurements td, t,and tras func-
TURNr
TURN OFF
tions of the drain voltage for a low voltage
I POWER MOS. (SGSP311)
5-8132
GS898
t: O.5J.ls/div, I: O.1A/div, V: 10V/div I
(n5 )
10 =7A
75
f-+--Id
Variations in the supply voltage Voo influence the-
se effects: the higher the supply voltage the grea-
ter the charge and therefore the t f and driving 1.,;"'-
.... 1-"""
..... 1-"""
--
50
energy required (see fig. 8 in the section OUTPUT). -r- ~If
Figs. 14, 15, 16 and 17 show the switching time wa-
veform as a function of both the supply voltage VDO
and the load current 10 , for two devices with diffe-
rent voltages and die sizes.
25
.1"'" Ir
1-- -- -~
100
......
If' ~::::; F--
....... .... 1--'-
r-~ ....
..........
50 , FAST
Ir
DIODE
I
10 10 (A)
Ie = 5A
100
TURN - ON
75 .... _r-
A detailed explanation of the turn-on phenomena
, i' ...... 1""" in a POWER MOS device when the load is inducti-
ve is given by Fig. 19 and 20.
50
1/
If
1/ ./ ""
~
V
Ir
25
l'
I' Fig. 19 - Current and voltage waveforms during
turn-on
S-l' 34
~
I
I
I
I '\
II
\
'a~
\.~
- 5-8137
8
800
~
'\ \
)1 \ I 0
~
600
1/ ]J \
J
1/ I
I
J L
400
I I I~
~
I
J
~\j,s
200 / j
~
~
1/
10 15 20 Vi
TURN-OFF
i
J.
.~
ta I tb I
I
The effect of parasitic inductances Lo and Ls and
of the diode connections respectively on Vos and t: 50ns/div, V:40V/div, 1:1.2A/div, Rg = 250,
10 are shown in Fig. 24. Vg = 10V
freewheeling diode D. In Fig. 28, 29, and 30 the curves of Eon are shown
for three different devices. Each curve is characte-
ENERGY IN SWITCHING rized by different values of T.
From the energy point of view there are four distinct
phases, each contributing in a different way to the Fig. 28 - On state energy values as a function of the
total dissipated energy per cycle. They are: drain current for SGSP301
G-5902
1) ON-STATE E 1
10,us r---rc-
(~J )
2) OFF-STATE .;
3) Transition ON-OFF ., ".
4) Transition OFF-ON
// l,us
10
The ON-STATE
..... 0.5,us-
In the ON-STATE, when the channel is completely II" 1/
....
open, POWER MOS devices have a minimun I' / '" ..,""
RoS(on) which is temperature dependent. L/ ~".
The Power dissipation at a given instant is obtained
from the equation:.
PO(ON-STATE) = ROS(on)(Tj) x 102 v
II
= ROS(on) x [1 + a(Tr2SoC)] x 102
1
where a = 8 X 10-3o C- , a positive coefficient.
0.5 1.5 2.5 10 (A)
400
300
OFF-STATE
When the device is switched off the Vos voltage is \
equal to Voo (see Fig. 25). Only the leakage current 200 \
loss flows through the device. The energy con-
I
sumption during this period is given by: 1\
100
to...
Eo = Voo X loss X toff r-~Ioo.
where:
SGSP475
ETOT = total energy dissipated per cycle
Eon = energy dissipated during the on-state
_ .. 1--,...
written as:
Fig. 1 - IG - VG waveforms
r\
Ig
\
\ f'....
~
r- J
,
Vg
V ~
1/9
75
and the maximum current available in the genera- THEORETICAL ANALYSIS OF THE GATE
tor. If the current in the gate, IG' is constant and CHARGE
small enough, the switching time can be increa- To get a better understanding of the phenomena
sed to a level where the voltage and the current which occur during switching it is useful to refer
waveforms are free from the parasitic effects cau- to the model of the POWER MOSFET shown in fi-
sed by the stray inductances that are usually as- gure 3. The fig. 3a shows a cross section of a sin-
sociated with high frequency power switching. gle cell illustrating the parasitic capacitances.
In this way it is possible to isolate the influence of
These capacitances correspond to the capacitan-
the external factors and analyse just the internal
ces quoted in the POWER MOS databook as
parameters.
follows:
The measurement is made as shown in the circuit
in figure 2. C iss = C1 + (C2 . C4)/(C2 + C4) +
+ (C3 . CS)/(C3 + CS)
Fig. 2 - Test circuit
C rss = (C3 . CS)/(C3 + CS)
Coss = (C3 . C5)/(C3 + C5) + C6
If we take into account the actual test conditions
(VGS = 0, f = 1MHz, VDS = 25V) the above equa-
o tions are well approximated as follows:
C iss= C1 + C2 + CS
C rss= CS
Coss = CS + C6
This approximation is correct since C2 < < C4 and
CS< <C3.
During the switching phase the value of these ca-
pacitances change as a fuction of VGS and this ap-
proximation no longer holds.
Fig. 3 - Simplified cross section of a POWER MOSFET cell (a) and its electrical equivalent (b).
Fig.3a
Referring to figure 4 and 5 and distinguishing the and the (;apacitances CGS and CGO are respecti-
load line during turn-on we can identify the follo- vely equal to Ciss and Crss measured with Vos =
wing phases: Voo
o --+ 1: the gate voltage reaches VTH by charging
0: the device is off (10 = I leakage, Vos = Voo) CGS from (C1 + C2 + C5) to (C1 + C4 + C5).
~
I
1
I
I
~
I
I
J.QL
!
Vx M:-
Vds (volts)
V In / GM
v
V
II VTH
GS
Vns
[D
i\ Vx
~
-- V
nSAT
VnS(ON)
(1+ (4+ ( 3
(GS
./
( (1+ (4+ (5
V (1+ (l (5
(3
(Gn
../
! (5
o1 2 3 4 5
The total increase, is due to modulation of the de- reaches its final value. In this phase the device ex-
pletion layer between the body and drain close to hibits typical pentode characteristics (see figure 4)
the channel. This is caused by the small drain cur- with Vos constant.
rent flowing when the gate voltage is near to VTH . During this phase, modulation of the depeletion zo-
The variation is about 10%. ne is due solely to the increasing drain current.
1 -+ 2: in this phase CGS and CGO are almost con- Figure 6a shows how the current flux spreads in-
stant. Vos is clamped to Voo by the diode until los side the drain.
\
\.
--....
I \
/ \
mAIN
Fig. 6b - Depletion layer and current distribution for a POWER MOSFET in the linear region
mAIN
----------------------------~~~~~~~v~:~~~~ ___________________________5_/9
79
The gate voltage, starting from the VTH , reaches This phenomenon, known as the Miller effect, has
the value VG = VTH + loIG M, where GM is the lar- a specific action on the gate voltage. As charge is
ge signal transconductance. supplied to the gate, the voltage remains constant,
The variation of the gate voltage slope, due to the the capacitance appearing to be infinite during this
the high current density under the gate region in phase. Also Vos has two different slopes; first the-
the N zone is in reality much less pronounced than re is little variation in CS, therefore of both CGS
that shown in figure S. and CGO, and second, the variation in CS is very
high.
The actual increase of the capacitance, both du-
ring the first and second phase, due to this modu- The variation of CS as a function of Vos is typical
lation effect, happens gradually and is more evident of a MOSFET structure. The only difference is due
near the threshold voltage. to the fact that modulation of the depletion zone
Since, in these two phases, the average increase is caused not only by the voltage but also by late-
of the capacitance has been evaluated as about ral injection of the charges coming from the
10%, the charge supplied to the gate can be ap- channel.
proximated using the following equation: At the end of this transition CGO will have the va-
01 + 02 = 1.1 . C iss (VTH + lo/G M) lue of C3 and consequently C GS the value (C1 +
2 -+ 4: during this phase the drain voltage decrea- C4 + C3).
ses, with consequent modulation of the depletion The drain voltage, on the slope, is indicated as Vx ,
zone and increase in capacitance of CS. in figure 4.
Figs. 7a) and 7b) - VG 10 Vos waveforms for Figs. 8a) and 8b) - VG 10 Vos waveforms for
SGSP362 SGSP369
SGSP362 at SOV SA SGSP369 at IOOV 2A
I I
I D: 5A/DIV [D: 2A/DIV
I - - f--
j j
\: I
i vi '\ VDS : 20V/DIV
V
v DS : lOY/DIY
I I
\1 i: / J[G: C~NSTANT \ /~G: CONSTANT
! / "\
I
/ Ii (\
r
VG: 2V/DIV
1,1 \1i I VG: 2V/DI)
I
't-- i I j :"- t--
T: S US/DIY Q: 7 NC/DIV
T: 5 US/DIY Q: 7NC/DIV
7a} 8al
SGSP362 at SOV SA SGSP369 at IOOV 2A
I
[D: SAlD,IV 1 II
1/ \I I
I
!
[D: 2A/DI1
\ I ! i \ VDS : 2V/DIY
VDS : 2V/DIV \ I
' i
i
I
YI \ /
J
\: V [G: CONSTANT
~ /[G: CONSTANT
/!
I \. j f "-
VG: 2v/DI,vl \ VG: 2V/DIY/
I I
j '--
T: SUS/DIY Q: 7 N(lDIv T: SUS/DIY Q: 7NC/DIY
7b) 8b)
80
Physically this point indicates the transition from mance of the device.
a highly charged P zone to simple depletion of the
MOSFET capacitor that exists between the deep Fig. 9 - Gate charge curves as a fuction on
and Voo
'0
body cells. We can state:
Vx = V TH + VTH-epi + (R epi ID) Vg(volts)
Figure 7a/7b and 8a/8b show test measurements 10
carried out on both low and high voltage POWER
MOSFET devices.
At the end of this phase V DS has reached V D sat.
This is illustrated in figure 5 and figure 6b.
The charge supplied to the gate is:
03 = 1.1 . C rss . (V DD - V x)
04 = C3 . (VX - VD sat)
Where 03 and 04 are the transitions across pha-
se 3 and phase 4 respectively.
The coefficient introduced in the formula for 03 is
derived as follows: V DS ' starting at VDD reaches
10 20 30 40 50 60
V x ; Crss undergoes a slight variation (as described Q(nC)
earlier). This variation has been evaluated as about
10% to 15%.
Fig. 10 - Gate charge curves a as function Gr and GM
4 --+ 5: as soon as the Miller effect finishes, the gate
Vg (volts)
voltage can increase again and reach its final va-
lue. The rate of this increase is controlled by CGS
where CGS = C1 + (C4 + dC4) + C3, a constant 10
0.10
0.00
0.08
0.04
0.02
0.00
It is highly predictable that in the near future PO- POWER MOS and bipolar transistors. In addition
WER MOS will, in many applications, gradually re- to their inherent high switching speed resulting from
place power bipolar devices due to the numerous the lack of minority carrier injection during opera-
advantages they offer. tion, POWER MOS with their insulated gates re-
Table 1 lists the principal differences between quire negligible input gate-drive current. Other
MOS BIPOLAR
Majority-carrier device Minority-carrier device
No charge-storage effects Charge stored in the base and collector
High switching speeds less temperature sensiti- Low switching speed temperature sensitive
ve than bipolar devices
Drift current (fast process) Diffusion current (slow process)
Voltage driven Current driven
Purely capacitive input impedance; no dc current Low input impedance; dc current required
required
Simple drive circuitry Complex drive circuitry (resulting from high base-
current requirements)
Predominatly negative temperature coefficient on Positive temperature coefficient of collector
resistance current
No Thermal runaway Thermal runaway
Devices can be paralleled with some precautions Devices cannot be easily paralleled because of
V SE matching problems and local current con-
centration
Less susceptible to seepnd breakdown Susceptible to second breakdown
Square-law I-V characteristics at low current; li- Exponential I-V characteristcs
near I-V features at high current
Greater linear operating and fewer harmonics More intermodulation and cross-modulation
products
High-on resistance and, therefore, larger conduc- Low on-resistance (low saturation voltage) becau-
tion loss se of conductivity modulation of high resistivity
drift region
Drain current proportional to channel width Collector current approximately proportional to
emitter stripe length and area
Low transconductance High transconductance
High breakdown voltage as the result of a lightly High breakdown voltage as the result of a lightly
doped region of a channel-drain blocking junction doped region of a base collector blocking junction
1/4
85
advantages are related to the negative tempera- Fig. 1 - ETOr versus frequency (kKz)
ture coefficient of their current, which prevents the G-5888
formation of thermal instabilities and makes the pa- IIIIII
ralleling of devices much more reliable. In contrast, ) II 111111
bipolar transistors require ballasting or careful de- d =80". _ . -
d =50", _ _ r-
'-
vice matching to prevent thermal runway.
Only in high voltage cases is POWER MOS on-
resistance higher than in bipolar transistors.
soo \
.1
~
\
\
. d = 20", _ _ _ r-
\
300
\
"
"-I'
r-.... MOS
I- ...
PERFORMANCE COMPARISON 100
At this point a comparison between POWER MOS
and bipolar devices can be made in order to eva-
luate their switching speeds which give an indica- 10
3
f (KHz)
tion of the energy consumption during transitions,
and their different values of VOS(on) and VCEsat re- '7;g.2
lated to energy consumption during the on state.
G-5889
The two devices used in the comparison are: f
(KHz )
SGSP565: POWER MOS; 400V; 6A
RRO (on) = 10
80 MOS
SGSD00036: BIPOLAR; 400V; 6A (very fast ~
switching) ~
~
60
VooN cc = 200V 1/
1/
~
IL = 5A (average value) ~
40
~ BIPOLAR
Since the input losses were neglected the bipolar ~
devices have an advantages in this comparison.
ETOT (the energy losses per cycle) as a function 20
~
of the operation frequency, for different values of ~
the duty cycle can be seen in fig. 1. For a bipolar ~
_2/_4 _ _ _ _ _ _ _ _ _ _ _ _ _
86
~ ~~~~m~v~:J?~ --------------
Fig. 3 = 81O- 3 C 1). The effect of a increase in RDS (on)
p
G- 5890 is greater than the variation in VGS (th)' As a result
(W) POWER MOS devices are thermally stable. The dif-
ference in behaviour of the two devices is even mo-
re exaggerated when dealing with paralleled chips.
BIPOLAR Two comparisons between bipolar and
SGS-THOMSON POWER MOS devices have
200 been made.
MOS
The first deals with the behaviour of single chips
IJ I
in SOT-93 (TO-218) package.
100
THERMAL LIMIT
- +- -- -IPr-
j
- The SGS POWER MOS used in this test is the
i/ SGSP475 (400V, 12A, 0,550).
/
V i.-' The power bipolar device used in the BUV48 (400A,
V 10A).
~
The parameter used to measure the thermal un-
balance of the devices is the variation of the ther-
f (KHz)
mal resistance Rthj-case due to an external power
pulse.
devices exhibit when they are subjected to exter-
nal power pulses. In fact an increase of Rthj-case implies a decrease
of the active area of the chip and therefore a disu-
The intrinsic mechanism which could lead to ther-
niformity in the spreading of the heat, with a crea-
mal runway in bipolar and in a POWER MOS devi-
tion of hot spot and thermal and electrical
ce, are as follows.
unbalancing. The devices have been tested under
In a bipolar an external power pulse results in an several conditions, with respect to the power dis-
increase in the junction temperature (Tj). sipation and the voltage across them (V DS for
This causes the collector current to increase and SGSP471, VCE for BUV48). The results are shown
this consequently further increases Tj. This posi- in Fig. 4 and Fig. 5).
tive feedback is compensated only by the base SGSP475 shows optimum thermal stability under
widening effect at high currents (that is a higher all conditions while bipolars, with VCE = 45Vand
recombination of the minority carriers). At high vol- P> 45W, show a degrading of the thermal perfor-
tages the base widening effect is not present so mances.
that any hot spots lead to thermal runaway. The best electrical and thermal performance of the
These phenomena, if not controlled, could seriou- SGS-THOMSON POWER MOS are confirmed by
sly damage a bipolar device. the thermal maps which show a uniform distribu-
A power pulse in a POWER MOS device would tion of heat under different working conditions (Fig.
cause: 6 and 7).
1) an increase in temperature of the device Fig. 4 - Variation of Rthj-case VS. P (POWER MOS)
2) a decrease in the threshold voltage SGSP475 SOT-93
VGS (th) = VGS (th) (25C) x (1 - ex [(Tj - 25C)] R h i-e (K/W) r - - - - - -_ _ _ _ _ _ _...::.S .....;-8::.;:0=-,89
t
VOS .75V -
where alpha is a positive coefficient of temperatu- 1.0 VOS .SOV .
re (ex = 2.10- 3 .). VOS
VOS
=30V
.15V
---
_.-
O.B
- -- - --...- -- devices in multiple chips mounted in a parallel con-
figuration.
The SGS-THOMSON POWER MOS device under
test was:
0.6
SGS30MA050D1 :four POWER MOS chips paral-
leled in TO-240 a package lOmax
0.4 '---+--f----+_+--+----+----+_+--+----.J
= 30A, Voss = 500V,
15 30 45 60 75 90 105 120 P( W) Ros (on) = 0.2500
VOSS5V -
"os =45 V .
VOS=3SV ----
0.5 V0 5 1SV -_-
O. 2 '----+---+--~>----+-----I---I----+----'
VCE = 2 0 V -
VCE =15 V - ---
0.5
0.4
0.3
INTRODUCTION
The normal safe operating area of POWER The explanation of the measurement circuit
MOSFETS may be insufficient when used in very describes the difficulty in attaining the value of
fast switching circuits, such as those required in destructive dV /dt.
SMPS push-pull applications. When there is a high
slew rate between the drain and the source of a
POWER MOSFET, it may go into breakdown at a
voltage less than its breakdown voltage, V(BR) DSS'
due to the spurious turn on of its parasitic bipolar
transistor. This in turn could damage its internal STATIC dV/dt TURN-ON
structure or cause a malfunction of the circuitry. Figures 1 and 2 show the simplified equivalent
circuit for a POWER MOSFET when a high slew
The critical values of dV /dt may vary with the rate exists between the drain and the source.
operating conditions of the POWER MOSFET POWER MOSFETS initially in the off state, conduct
device used; when it is under stress and completely in two different ways due to dV /dt:
inactive, (static dV/dt) or when its intrinsic diode
is conducting (dynamic dV/dt). This note discusses - by spurious turn-on of the POWER MOSFET
the safe operating conditions for POWER MOSFET - by spurious turn-on of the parastatic bipolar
transistors that experience static dV /dt stress. transistor.
N+
p+
DRAIN
N"
R body
1/6
89
Figure 3 shows the equivalent circuit for positioned between the gate and source (driving
conduction by spurious turn-on of the POWER impedance), creates a voltage pulse. If this voltage
MOSFET. Figure 4 shows current waveforms reaches the threshold voltage the POWER MOSFET
generated by a fast voltage variation across the switches on. This type of switching thrives on a
POWER MOSFET capacitance. The current pulse high input impedance, Zgs, but is not normally
passing through the external impedance (Zgs), destructive.
Fig. 3 - Equivalent circuit for conduction by spu- Fig. 4 - Equivalent waveforms for the fast voltage
rious turn-on of POWER MOSFETS variation across the POWER MOSFET ca-
pacitances.
CURRENT
CURRENT PULSE
CAUSED BY dV /d t
The equivalent circuit for conduction by spurious more than the breakdown voltage of the parasitic
turn-on of the parasitic transistor, is shown in transistor, avalanche breakdown occurs. If the
figure 5. A current pulse passes through the current, 10 , is not limited externally the device
capacitance CoBand the body. If the voltage drop may be destroyed. Unlike the first mechanism the
across the body resistance rises above O.65V, the critical value of dV Idt depends only on the
body source junction is polarized, this produces structure of the device (R body ' COB and the
current injection in the base of the parasitic resistance between the base and the emitter of the
transistor which consequently turns on. If Vos is parasitic transistor).
CURRENT PULSE
R body
~n n- II II~
_u P1JJD
I
I I
I:
I I I
I
I
I
:
l
I
n ~! n i ! .
~ Ll.lJ UlJ -.---J
DRIVE PUl:E. WAVEFORM ~
Fig. 6b - Test circuit for POWER MOSFETs stres- The dV/dt stress occurs when, for example, P2
sed by static dVldt turns on and the source of P, decreases from the
voltage V D to zero with a speed equal to the
switching speed of P2 .
I I I I I I I I
NO LOAD LIMIT OF MEASUREMENT CIRCUIT
100V/n 5
dV/dt ~AX ~N ;HE ~.U.~. -
j...- ~ jr-
./ ~ ~i"'"
~
lV/ns
100 200 300 400 500
V(a')DSS VD (V)
Fig. 8 - Turn-on of the parasitic transistor on Photo 2 - Drain current and voltage waveforms for
SGSP221 SGSP478
JOV
40V
THE DRAIN
40 50 t(nsl
CONCLUSION
It has been seen that a POWER MOSFET stressed destructive values of dVos/dt are difficult to attain
by a very fast s.lew rate can cause malfunction in in practical applications, since they exist when
t~e circuit or even destroy the device because of: switching times are in the order of 5ns.
- stray turn-on of the POWER MOSFET itself The stray turn-on of POWER MOSFET can occur
at lower values of dVos/dt. These values depend
- turn-on of the POWER MOSFET parasitic tran- on the values of impedance between the gate and
sistor. source. This type of conduction does not damage
the POWER MOSFET but increases losses in swit-
The critical value of dVos/dt at the turn-on of the ching. This can be avoided by:
parasitic bipolar transistor does not depend on the
external circuit, but on the structure of the POWER - Limiting the switching speed
MOSFET. SGS-THOMSON POWER MOSFETs
resist dV Idt stress due to optimization of their - Driving the POWER MOSFET with a low input
design (resistance between base and- emitter of the impedance.
bipolar transistor reduced to a minimum). The
Top Passivation
Source Aluminium
Intermediate Oxide
Polysilicon Gate
Gate Oxide
N+Substrate
NfSubstrate
Back Metallization
1/11
95
Fig. 2 - Resistive elements in SGS POWER MOSFETS structure
The on-resistance of a POWER MOSFET is made with a 100V and 500V breakdown voltage respec-
up of four separate terms: tively.
It can clearly be seen that there is an optimum cell
RON = RCH + RACC + RJFET + REP1
sapcing of about 12 Jlm for low voltage devices and
where: RON = device on-resistance 30Jlm for high voltage. Moreover, in high voltage
RCH = channel resistance devices the resistance of the drain epitaxial layer
RACC = resistance of accumulated region is the most significant of the four terms. The most
RJFET = junction FET resistance effective way of obtaing a lower RON is to make
REP1 = drain epitaxial layer resistance the higher V(BR) DSS compatible with the drain re-
sistivity. SGS-Thomson uses an edge termination
RCH ' RACC ' and RJF depend primarily on the lay- structure that gives a breakdown voltage near the
out of the device. REP1 depends on the structure theoretical value.
of the drain.
For low voltage devices RON can be reduced by
Figures 3a and 3b show the relationship between varying the channel and/or accumulation resi-
the on resistance and the cell spacing for devices stance.
_2/_1_1_________________________ ~~~~~~~~:~~n----------------------------
96
Fig. 3 - Influence of the inter-cell spacing on the RDS (on) elements
Fig. 3a - Low voltage case V(BR) DSS = 100V Fig. 3b - High voltage V (BR) DSS = 500V
GU-1278 GU -1277
0.05
-------------- ~ 5~~~~m~1r~@~ol1--------------
SO 3/11
97
Fig. 4 - Ros (on) vs. breakdown voltage
Ron x area
(ohm cm 2 )
10-1
5
10 3
V(BR) DSS (V)
Photo 1 - SEM photo of high density POWER Photo 2 - SEM photo of standard POWER
MOSFET - 1.33 million cells in-2 MOSFET - 550K cells in-2
Jij Ilnll ~l
- -- ~
- r-- - r-
= 1
1
]rc 1 r-
1.0.
~HD
0.5
As predicted, the increase in efficiency, as the cell breakdown and 21 % at 130V breakdown compa-
density increases, becomes less as the breakdown red to standard POWER MOSFET devices. Figu-
voltage increases. This is due to the increase in re 8 shows the decrease in chip efficiency whith
the resistance on the drain (R EPI)' The chip area the increase in voltage.
for high density devices is reduced by 25% at 70V
30
25
20
15
10
V(BRlOSS
_6/_1_1_________________________ ~~~~~~~~~:~~~~----------------------------
100
the switching time. The total energy required by be varied by optimizing its design.
the gate for switching depends on various parame- Using the electical configuration shown in fig. 9 it
ters, which are mainly electrical (supply voltage, is possible to examine the device gate charge.
drain current, gate voltage) or structural (reverse Fig. 10 shows the comparison between the gate
capacitance, gate thereshold voltage, transcon- charge curves of devices with the same static cha-
ductance). racteristics but with different cell densities.
The electrical parameters are external and depend The total gate charge for high density types is about
on the type of application. The structural parame- half that of standard POWER MOSFETS.
ters, instead, depend on the device itself and can
+Voo
12
High Density
10 Power MOSFET
170x 170mils2
Std Power o
>
MOSFET
180x220mils2 ~
Vdd = 40 Volt
Id= 15 Amp
10 20 30 40 50 60 70 80 90 100
Q (nC)
-
/
I ~~ Gate charge curve
----Vgs
Vds
V Vth
GU-1287
Gm/Cr.ss =18DxnDmils2
e=156x156mlls2
" " '~
(mho/pFl D.14 A = 170. x 170. mi Is 2 HD
* = 250. x 250. mils 2 - COMPETITION
0. .12
0..10.
0..0.0.
e
*
'"
0..0.8
0..0.4 *
0..0.2
0.0.0.
100. 20.0.
! I
30.0.
I I
40.0.
! I
SOD
!
,j
_8/_1_1 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?::~~lt ______________
102
It is obvious that for a given driving circuit resistan- perimeter of the channel, i.e. by increasing the cell
ce, the sw.itching times and the cross-over energy density.
losses are strongly defined by the gate charge cur- CRSS can be decreased by reducing the overlap
ves. The most significant parameter for switching area between the gate and drain, that is by redu-
performance is Crss . cing the distance between each cell.
The drive energy, (Ep = J VG (0) . do), is repre-
sented by the area under the curve. The switching Both these actions lead to an increase in the cell
time and consequently the energy dissipated at density.
cross-over, is related to the width of the flat sec- Fig. 12 shows the value of K (for equal areas) as
tion of the gate charge curve. From this it can be a function of the breakdown voltage, V (SR) oss, for
deduced that the optimum device must have a low POWER MOSFET devices produced by both stan-
CRSS and a high GM . By introducing a second me- dard and high density technology.
rit coefficient K = GM/C RSS ' the efficiency of the
Thermal measurements on both standards and
device in dynamic working conditions can be cal-
high density POWER MOSFET were made using
culated.
the circuit in Fig. 13.
In order to increase the merit factor K, is necessa-
ry to increase the transconductance and decrea- The circuit is designed around an emitter switching
se the reverse capacitance. The best way to configuration working at 100KHz with 50% duty cy-
improve the transconductance is to increase the cle and 10 = 10A.
The power dissipation of the POWER MOSFETS over point of the switching waveforms for the de-
devices were approx 8W for BUZ11 and 6W for vices causes the difference in power dissipated.
high density BUZ11. The power dissipation de- Considering that the junction to ambient, thermal
pends on two factors: resistance Rthj.amb, with heatsink, is 13CIW, the
devices reach a working junction temperature of
Pon - state loss = I i . Ron(T) . d
104C + T(amb) and 78C + T(ambient) respective-
Pcrossover loss = f . J Vd . Id . dt . ly. Under conditions where T amb = 50C the stan-
dard device is operates outside the maximum
The on-state power dissipation is the same for both thermal ratings while the high density device re-
devices. The second term, depending on the cross- mains within the thermal safe operating area.
5 -
-17~-I-
--II--r-+-fJ--t--+-+-+-+--HI-+-+-+-l---I
I---- --I---- --t-----l -----L -L--t--+-+--+--I
~~':~~_I~;I,"-3~_tl_0_Vr-+-++_+----l
10 20 30 40 50 60 D.g(nCI
The combination of a high voltage bipolar and a As we have seen, the forward base current IS1 is
low voltage Power MOS is preferable due to the fixed by the external circuitry:
high switching speed and the low driving energy Vss - VSEsat - VOSon
of the combined power switch. IS1 = ---------
Rs
The base of the high voltage bipolar device is dri-
The collector current instead depends on the load,
ven by a constant voltage source. The energy dis-
and in general, varies with the time.
sipated to drive the high voltage bipolar device
The turn-on and turn-off phases can be analysed
depends on the losses that the forward bias cur-
separately.
rent IS1 generates in the resistance in series with
Rs, IS1 . Rs . t. This power dissipation can only be
reduced by using high gain transistors or dar- TURN-OFF
lingtons. When the driving signal to the Power MOS is low
(See fig. 1) the drain current is interrupted and the emitter cur-
1/5
107
rent of the high voltage bipolar falls to zero. The tial way from the usual case of the base drive.
emitter reaches the base voltage and will not car-
ry any more current. As a result the collector cur- Photo 2 - Base and col/ector current at turn-on
rent can only flow through the base, becoming a
reverse base current that depletes the base to col-
lector junction. This reverse base current 'B2' from
the moment when the emitter current disappears,
coincides with the collector current. See photo 1.
The stored charge isremoved in a typically very
violent, and consquently rapid manner.
TURN-ON
When the Power MOS is the on state, the bipolar
device also starts conducting. The dynamic beha-
viour (See Photo 2) does not differ in any substan- 5S111
Ie
Fig.3b
BASE BASE 5-6117
\ . 02:
-SGSD00035 for current up to 10A
Low voltage POWER MOS
I ' I'
I' ....... i II ! (BVoss = 50V)
II -SGSP352 for currents up to 5A
r-. 1 III J
r- .... 10. I -SGSP322 for currents over 5A
I II I 03: High voltage, low current POWER MOS
200 1000 600 V(BR) oss < = 450V)
Fig. 5b - How reverse bias safe operating area Control
changes for: IC: UC3842
i) slow turn-off DZ2: Zener diode 2W/20V
ii) fast turn-off D1: 25V diode, with Ie peak rating as high
G-5892
as 10A for 500ns
IC~4-~1_r+~r+-~r+-r~-r~~
(A)~4-~+4-r+~-r+~r+-r~-r~~ C6: Electrolytic capacitor, 100ILF, 25V.
It ab~orbs possible variations of VBB .
15 R3: Resistor setting the forward bias base
\
\ current of the darlington:
12 R3= VCE - VBEsat-VOSon-RyIO
\ IB1
Its power rating must exceed R3 . IB2 . t
(in practice 3W)
R7: Shunt resistor to sense the switch cur-
- l"'-- rent. The over current Is max protection
,.,. ON , SLOWER'" J ""-l ...... is set according to
_ _ OFF ~ TURNOFF r'J.. - .... 1.1
1V
200 400 600 800 VCE (v) R7=
ISmax
A POSSIBLE APPLICATION C4,R6: RC network, filtering the disturbances
induced by the switching transients on
A possible application of the "emitter switching"
the ISmax protection input.
configuration is shown in Figure 6, where a swit-
ching power supply operating in a "flyback" mo- C3,R5: RC network, setting the switching fre-
de has been implemented. quency and the maximum duty cycle,
according to the UC3842 data sheet.
The basic criteria used in choosing the value of the
teharge = 0.55 Rs C3
circuit elements are given below. The purpose of
tdischarge =
the study was to demonstrate the feasibility and to
evaluate the advantages. Exact circuit element va- = Rs X C3 In [(6.3 Rs - 2.7)/(6.3 Rs - 4)]
lues can be further optimized, especially in the case f = 1/(te + t d)
A ----+--i---i
SU-14.84
118
113
Table 1 - Power Supply Specifications
-2/-8--------------------------~~~~~~~vT:~~~ --------~------------------
114
The design starts with a calculation of the maxi- Fig. 3 shows the mean current value (Imean) in the
mum duty cycle, Ll, and the maximum on time primary inductance during the on state. It can be
Ton max' Fig. 2. calculated as follows using the minimum input
voltage:
With Vee min = 48V, Vreset = 45V, T = 12.5lts Pmax T
(80KHz). Imean = - - - - - - - - - - -
The maximum duty cycle is; 11 Vee min Ton max
SUl~85
Np = .,j LlAI (from manufactures data book)
Eqn. 6
Np = .,j 100 . 103 nH/140nH = 27 turns
Fig. 3 - Current waveform in the primary inductance
The minimum air gap with working flux density
Ip B = 250mT is:
I . Np . Ito
g = _ _ _ _ _ _ _ = 2.7 rnA
B
Ito = 12.56 . 10-7 Hm-1 (permeability of free space)
4/8
---------------------------~~~~~~?vT:~~~~
116
---------------------------
The power dissipated in this resistor is: loop line regulation.
With Ton = 6lts @ 48V we have:
P = 1/2 Ld . 12 . f = 16W
Due to non-linear effects the power dissipated is dV Vp-Vvalley 4.2-0.5
0.616V/lts
about 100W. (dt) min 6 6
....
The divider R3, R4, is set to provide 3.9 volts
at pin 8. With V1N (min) = 46V, R3 = S07K and 1'00..
R4 = 17K. With C3 = 47nF the soft start time .....
40
is about 6ms. ....
The feed forward function provides a variable .....
- slope ramp waveform on pin 10 which is one (2IT C7,R16l .......
20
of the inputs to the PWM comparator. The ramp f--20db=R16
.....
is proportional to the DC input voltage; in this r-
f-- R1S// R14 ....
way the pulse width is immediately reduced
I I I
when the input voltage rises. The result will be 1K 10K lOOK 1M
a constant volt - second product delivered to operatl ngfrequency
the transformer primary resulting in good open-
Photo 1 -Ie, VCE' on bipolar switch (lc=SA/div, Photo 3 - Turn-on, bipolar switch (lc = 5A/div,
VCE =SOV/div) VCE = 50V/div)
FU-l013 FU-IOI5
Ie
Va 200mV/div
Fig. 6 and fig. shows the line regulation and the
Photo 5 - Storage time bipolar switch (Ia
load regulation (VIN = 70V) respectively. The line
5A/div, Ie = 5A/div) regulation is O.03%/V with an overall variation of
FU-l017 1.1 % and the load regulation is O.17%/A with an
;;;;;;;;;;;;;;nWflj U tees overall variation of 2.9% over the operating range.
II
;0 ... . .. .... .... .... .... ""~."" .n
II Fig. No.8 shows the efficiency of the DC-DC con-
'
. IS
",,m verter at V 1N = 70V. At full load (lout = 25A) the
1; '
~ ~ .... ~
o efficiency is 75% and the power losses on the cir-
cuit are about 100W. The power losses are divi-
r ded approximately as follows: (Table 4)
.',1
r- I
~, ~ ~~. Table 4
- III i ~ ~
IS>
ci -
Vl
.... IS>
-lIS>
0"';
>.
Va 200mV/div
e 2 ~ G 8 e
1 12 14 16 18 20 22 24 26 e 2 4 G 8 10 12 14 1G 18 20 22 24 26
Ioul AMPS Ioul AM PS
1/6
121
density and bonding on the active area. internal soft-start, pulse by pulse shut-down and
The PWM controller is the linear integrated circuit adjustable dead time control.
SGS3S2SA, with dual source/sink output drivers, Table 1 shows the power supply specifications.
TABLE 1
Fig. 1
+12V R9
GND
CIRCUIT DESCRIPTION When Tr2 is on and Tr3 is off, diodes D2, D3 con-
The DC input is chopped at a high frequency duct and diodes D1, D4 are off. When Tr3 is on and
(200KHz). This high switching frequency allows the Tr2 is off diodes D1, D4 conduct and diodes D2,
use of a very small transformer. D3 are off.
Due to the push-pull configuration of the converter The snubber formed by CS, R17 is used to clamp
the POWER MOS devices, the transformer and the the voltage spikes on Tr2 and Tr3 drains. With a
diodes work at the frequency of 100KHz (photo 1, leakage inductance Ld = O.Sp.H, a primary current
2); the output filters and the oscillator of PWM con- Ip = 2.8A@ VIN MIN and maximum load and an allo-
troller work at a frequency of 200 KHz (photo 3). wable voltage spikes Vp = 30V we can calculate
_2/_6 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m~1rT:~~I1--------------
122
C5 as follows: tion of the voltages. In this way when the load is
very different in the two outputs (+ 6Vmax load;
= 1.SnF - 6V min load or viceversa) the indirectly regula-
Eq. 1 ted output ( - 6V) has a very stable output voltage
The PWM controller SGS352A has the two drive (see fig. 2).
outputs in totem-pole configuration in order to dri- The efficiency is excellent: 70% over a wide ran-
ve the POWER MOS. The feedback signal for the ge (Fig. 3).
PWM is directly connected to pin (inverted input
of error amplifier) from + 6V output by the resisti- The transient response is very fast: about 50ms.
ve divider R4-R1. The maximum current protection Photo 4 shows the transient response of load re-
was sensed by Tr1, R9, RS and is connected to pin gulation due to a load variation from 1OOmA to 1.3A
10 (shut-down). and from 1.3A to 100 rnA ( + 6V output).
The magnetic coupling of the series inductance in Fig. 4 shows the P.C. board (track layout) and the
the output filter is very important for good regula component positions.
Fig. 2
v (-6) out vs. I (+8) out.
co
...!..
>
O.BO
1(+6)0
Fig. 3
EFFICIENCY (%)
u.
u.
'w
P(W)
Capacitors
C1 100J-tF
C2 1nF
C3 1J-tF
C4 10nF
c
C5 1.SnF
C6 2.2J-tF
C7 10nF
CS 2.7nF
C9 10nF
C10 220p,F
o C11 220p,F
C12 - 330nF
C13 330nF
Transistors
Photo 2 - Tr3 waveforms (VG= 10Vldiv, Vds=
20Vldiv, Id= 1Aldiv.) TR1 2N2907
TR2, TR3 IRFZ20
Diodes
01,02,
o
03,04 BYW2929-100
ICs
11 SGS3525A
Transformers
T1 core TOMITA EE 25 x 6.5
2E6 Material
o
T2 core cylindrical 30 x 20mm
-6/-6--------------___________ ~~~~~~?v~:a~~---------------------------
126
APPLICATION NOTE
Fig. 1 - IG - VG waveforms
1N4148
03
01 BUZ11
1N4148
7
9 16 R5
4,5,12,13
SU-14.73
1/3
127
duration of the peak, the peak current level and hol- gulate ILs . During the regulation 02 and 02 recircu-
ding current level are fixed by external components. late the Ls current with a slow di/dt. A fast transition
The power stage consists of two BUZ11 POWER from Ipull to Ihold is ensured by the action of the zener
MOS transistors and one BYV52PI-50 high current diode 03 turning on 03. At Ihold the L5832 starts to
fast recovery diode. The component list is given regulate ILS again. 02 gate is driven by the bootstrap
in table 1.
circuit C3, OS, R2 and C2. 01 ensures that 02 is off
CIRCUIT BEHAVIOUR when the current decreases from Ipull to Ihold ' The fi-
The operating waveforms are shown in figure 2. gures 4 and 5 show the circuit behaviour. Figure 5
03 energises the inductive load Ls. When the cur- has a faster time-base than figure 4 this enable it to
rent through Ls reaches IpulI' the L5832 starts to re- show the PWM control of solenoid or coil current.
Pin 10 ---------~.
IN~~T 1
CURRENT --~,------~I'------------------------~----~
ton toff
(I L ) I --:-)J,.~
Ip --r----- - t -
Coil I LS ------i.~
~ ~ -~- -11- ~I I- . .
1
DRlVlNgN - - - - - _ _11-':,1 _ _ _----;
02 _ _ _c--_ _---..
CONDIT~~; 1-: . ~~ :;
I I I I 1I I II I
DRIVING ~Q.O rnA I II I I I I
CONDITION
03------~~
OFF
s- 595 Ol~ t
pin 8
SU-1501
Figure4 FigureS
GU-12bZ GU-12b3
, ~ 20~S ~ V" ~ b
10mV
l\
I=5A/div
\,
J=5A/div
1\
\
1=0
~'"' ~
1n S
j
- 1=0
1/6
131
The turn-off speed of the POWER MOSFET in this 2 - Gate drive parasitic inductance can cause oscil-
configuration has no restrictions. Thus a fast turn- lations with the MOSFET input capacitance.
off is desirable to reduce turn-off losses. As the rate This problem becomes more pronounced when
of change of current is limited, radio frequency in- connecting devices in parallel.
terference (RFI) and electromagnetic interference 3 - There should be sufficient gate to source vol-
(EMI) are reduced. tage for the transistor to be fully conducting.
An asymmetrical bridge-leg, illustrated in figure 1b;
can be used to limit di/dt during a short-circuit con- Fig. 2 - Gate drive circuits
dition thus providing sufficient time to switch-off the a) Isolated gate drive with controllable switching times
appropriate power devices. The inductors limit the
rate of rise of output current. They also limit the +12V
free-wheeling current through the internal parasi-
tic diodes of the MOSFETs. Adding external free-
wheel diodes and inductors increases reliability at
the cost of increased complexity. The inductors re-
duce RFI and EMI as the rate of change of current
is limited.
: t~- -,~-~_r-oo
L.", ___ .J
Ie,
The configuration illustrated in figure 1c has Schott-
ky "blocking" diodes to prevent current going
through the MOSFET internal parasitic diodes. S(-0328
Schottky diodes are often used since conduction
losses are kept to a minimum. b) Simple gate drive for N-Channel MOSFETS in parallel
Bridge configurations shown in figure 1band 1c
+12V
are considered for high frequency switching appli-
cations. The advantage of the asymmetrical bridge-
leg configuration over the bridge configurations in
figures 1a and 1c is that the bridge-leg is capable
of withstanding simultaneous conduction of the two
devices in the bridge-leg since there are series in-
ductors which reduce the dl/dt under this condi-
tion. Hence the short-circuit detection loop time is
not so critical and the devices are not stressed with
high dl/dt and high pulse currents.
The choice of the bridge configuration depends on
the technical specification of the application. For
example, if the technical specification for a specific
application can be met by using the configuration
shown in figure 1a, then this configuration should c) Gate drive with Vos (on) control for short-circuit
be used as costs are lower than with the other two protection
configurations shown in figures 1band 1c. +12V
:T
Vos (on) monitoring permits the detection of short-
circuit conditions which lead to device failure. The
device can be switched off before the drain cur-
rent reaches a value in excess of the peak pulse
current capability of the MOSFET. This form of pro-
'-CHANNEL
DRIVE "OSFEl .J
tection is very effective with MOSFETs as they can
sustain a pulse current in excess of three times the
nominal continuous current. Figure 2c illustrates
a gate drive which incorporates Vos (on) monitoring
and linear operating mode detection for the MO- LOGIW~
SFET in the case of short-circuit conditions. When
the MOSFET is turned on the on-state voltage of
SIGNAL .1 S[-0330
the device (V OS(on)) is compared with a fixed refe-
rence voltage. At turn-on, VOS(on) monitoring is in- c) Floating supply isolated gate drive.
hibited for a period of approximately 400ns in order H.V.DL
to allow the MOSFET to turn-on fully. After this pe-
riod, if Vos (on) becomes greater than the referen-
ce value, the device is latched-off until the control
signal is turned-off and turned-on again. FLOATING
SUPPLY
ISDLATET
GATE
DRIVE
"HIGH-SIDE" SWITCH GATE DRIVES
The top transistor in a bridge-leg requires a "high-
side" gate drive circuit with respect to the bridge LOGIC
SIGNAL
ground. Three possible gate drive concepts are
S[-0331
shown in figure 3:
a) The "bootstrap" drive, requiring logic signal
Bootstrap supplies are particularly well suited fo
isolation, but no auxiliary floating supply.
POWER MOSFET gate drives which require low
b) The level shifting drive. power consumption. Figure 4 illustrates two boot-
c) The floating gate drive with optically coupled strap supply techniques. Bootstrap supplies limit
isolators, pulse transformers or DC to DC chop- transistor duty cycle since they require a minimum
per circuit with transformer isolation. transistor off time during which they are refreshed.
--------------- ~~~~~~?v~:~~n--------------3-ffi
133
Supply efficiency and maximum duty-cycle are pa- Fig. 4 - Bootstrap supply techniques
rameters which govern the design of the bootstrap. a) Conventional bootstrap with additional capaci-
Figure 4a illustrates a conventional bootstrap with tor C1.
an additional capacitor, C1 , which improves the ma- H.V.O.C.
ximum duty cycle as the supply is refreshed even
during transistor on time by this capacitor. Figure
4b illustrates a high efficiency bootstrap supply
which uses a small MOSFET, 01, for requlation.
In this design a low power bootstrap drives the gate
of 01.
The level shifting gate drive, (figure 3b), requires (,
a high voltage p-channel MOSFET which drives the
n-channel power device. The p-channel MOSFET BOOTSTRAP
is switched using a resistor divider network. No floa- SUPPL Y
ting supplies are required. A power supply of 12V, S[-0332
referenced to the high voltage d.c., is used to pro-
vide positive gate source voltage for n-channel PO-
WER MOSFET. This circuit eliminates the need for b) High efficiency bootstrap.
logic signal isolation and a floating supply. The di-
sadvantage of this circuit is the high cost of the p- H.v.O.C.
channel drive MOSFET.
Figure 3c illustrates a floating gate drive with a floa-
ting supply. This drive is the most expensive out
of the three shown in figure 3. However, the floa-
ting supply need only have a low output power, sin-
ce MOSFETs are voltage controlled devices. The
advantages of this drive are its high efficiency and
unrestricted transistor duty-cycle.
S[-0333
Fig 5 - Isolated CMOS drive with Vos control for short-circuit protection.
+12V
R,
~~_:~~~~~-+--r-----~
SC-0334
OJ VI
..........
r-.
-- -
ge of the short-circuit current due to the saturation
of this inductor is illustrated in figure 6a and 6b.
Figure 6a illustrates the POWER MOSFET drain
to source voltage, Vos, and the drain current, 10 ,
when a bridge-leg output to high voltage supply rail
.. t short-circuit occurs. Figure 6b illustrates an output
to output short-circuit of two bridge-legs.
b) Output to output short circuit Another protection technique uses the "current mir-
ror concept", (1). An image of drain current is ob-
S[ 0341
tained by having a small MOSFET, (integral or
discrete), in parallel with the main power MOSFET
- AA
'v., as illustrated in figure 7.
..,....,. II
/ r---...... ~
---r- N 1000
....... o
Voltage proportional
R to drain current
.. t
SC-0335
PROTECTION
Power electronic circuits such as bridge-legs are
often required to have protection against output to Figure 8 illustrates a floating gate drive which uti-
output short-circuit, over-temperature, simulta- lizes a pulse transformer for transmitting simulta-
neous conduction of devices in series in a bridge- neously the MOSFET on-signal together and the
leg and output to high voltage supply or ground rail gate to source capacitance charging current. The
short-circuit. These power stages are generally part current mirror technique is used to provide short-
of an expensive system such as a machine-tool or circuit and over-load current protection. The pul-
a robot motor drive. Thus the additional cost of pro- se transformer operates at an oscillating frequen-
tection circuitry is commercially acceptable. A com- cyof 1 MHz when a turn-on control signal is present.
Figure 8: Pulse transformer gate drive with current mirror protection for an SGSP477.
+12V
LS
ON
t
REFERENCES:
FuyG.
Time scale: 5p,slolV -10: 5A/01V - Vos: 100VIoIV Current-mirror FETs cut costs and sensing losses EDN Sep-
Control signal: 5VIoIV - VGS: 5 VIOl V tember 4 th, 1986
INTRODUCTION
This note deals with the basic characteristics and thickness and consequently a much improved
the possible applications of STHV102 POWER RDS(~n) compared with existing high voltage,
MOSFET transistor, rated at 1000 V,4A. POWER MOSFETs .
A completely new configuration for the edge The edge structure designed for this class of device
structure has been designed in order to obtain a is shown in figure 1a - 1 b (See page 2).
high breakdown device with characteristics of high
reliability. The advantages offered by the static and It is planar, having a graded impurity concentration
dynamic characteristics of this device are in the silicon combined with a metal field plate on
demonstrated by two applications. the surface.
1/6
137
Fig. 1a - Cross section of the new graded edge structure
t
P-VAPOX
I
THERMAL-OXIDE
p-
P
p+
Fig. 1b - Electric field diagram illustrating the low surface electric field
(--- p
J' '" , ,,
[:C~~
100 nil 1411 I{;O )(Hl :H'H3 :lJD :HII ::IbO
0151flllCE {f1ICR011S>
Fig. 2 - Graph showing the effect on drain source Photo 3 - Drain current and voltage waveforms
leakage current, loss of 1000hrs HTRB with Tease = BOC
testing
V
til
OJ
OJ
l/:
.
/.
~
ro =
=
1~102
OJ :;{
0 0
0
E-=
ro Vl 0
0
OJ
.-J
Vl
CJ
/
/
/
102
lOSS (nA) t=Ohr
Leakage current before test
139
APPLICA TIONS
The STHV 102 is ideally suited to applications An analysis of the waveforms gives us a better
where high drain voltage, high switching speeds appreciation of the advantages of this device:
and low drive energy are needed. Typically in high
frequency switch mode power supplies and in high a) The high drain voltage capability permits
resolution horizontal deflection circuits. minimum snubbing even when the transformer
exhibits a high leakage inductance (Photo 3).
The low value of its input capacitance - a direct
result of the optimised edge structure, allows the b) The high working frequency shrinks the
component to be used in high frequency transformer size and the filter circuit dimensions.
applications, with very low switching and driving Photo 5 shows the sniall amount of charge needed
losses. to turn off the device (120nC), implying that the
STHV102 can be easily used also at higher
1. A 150W 100kHz FL YBACK SMPS frequencies.
Figure 3 shows the SMPS electrical circuit and the A high performance with a conversion efficiency
photos 3, 4 and 4 show current and voltage of 87% at 150W has been achieved with this
waveforms for the POWER MOSFET. device.
Fig. 3 - Isolated fly-back Switch Mode Power Supply using a high voltage STHV102 Power MOSFET
D3
R4
E ~ (11 +f c~ :aVA
110/220V 04
A[
O-___._--l'
Frequency : 100kHz
The importance of using high voltage POWER The use of advanced graphic monitors and the
MOSFETs in SMPS designs is also illustrated'by experimentation on telecast systems has resulted
the reduced size and cost of other components and in the Use of complex horizontal defelction circuits
in lower power dissipation in the snubber network. and the requirement for fast and reliable high
By comparing similar flyback circuits using a power voltage power transistors.
darlington in one and a POWER MOSFET in the
other, as the switching element, shows the STHV 102 represents a good solution, in fact, it
following savings. brings together the speed of POWER MOSFET
devices and a high voltage breakdown (1000 V).
In viewofthis, its application in a 64Khz horizontal
Darlington POWER deflection circuit has been studied.
MOSFET
Figure 4 shows the electrical circuit.
Switching frequency 30kHz 100kHz
Photo 6 illustrates the drain current and the drain-
Transformer volume 23.3 cm 3 6.5 cm 3
source voltage waveforms.
Filter capacitor 10,OOOfJF 3000P. F
Snubber capacitor 1800pF 250pF
The "negative" region of the drain current is that
Snubber losses 7W 3W
which flows in the internal source-drain diode of
Relativecost of device 1 4
Q 1. The fly-back voltage reaches 920V. During
operation at Tc-80oC the device dissipates only
5,5W while generating a 64 KHz, 5A peak-to-peak
deflection coil current.
GND
R1 47 ohm 1/4 W
R2 100
R3 10 " "
R4 680 K "
C1 15 pF "
C2 470 uF 40 V
01 STHV102
02 2N2222
03 2N2907
IC1 TDAB140
L 250 uH
cf 3.3 nF 1500 V
VDO 120 V
VBB 12 V
AN INTRODUCTION TO HIMOS
115
143
Fig. 1c and 1d - Two electrical models for the HI- The presence of the P+ N junction in the drain pro-
MOS structure. duces an offset in the output characteristics of
O.6V-O.8V. This diode exhibits a reverse breakdown
o voltage in the range 30V-70V, see Photograph 5.
E
(
Photo 1 - V(BR) DSS = 100V SGSP361
B
s
SC-031B
S S(-0319
1c 1d
2a 2b
S[-0321
____________________________ ~~~~~~?V~:~~~~---------------------------3-/5
145
tance and an inversion of the gate polarity, with, in figure 6 and confirms the correlation between
respect to the drain voltage occurs as Vos rises tfall and the PNP transistor gain. The lifetime of the
above the gate potential. Vos increases to a ma- minority carriers in the N- region versus tfall is
ximum value with a rate controlled by the driver cir- shown in figure 7.
cuit. These two phases, I and II, are dependent on
the MaS behaviour as the base collector junction Fig. 5 - Variation of t fall with Vds
of the PNP transistor is reverse biased. The last GC0884
region, which defines t fall , can be divided into two Id=10 A
parts. The first part is the MaS turn-off and is very O.BO
Vg =10 V
fast. The second is slow and starts when the MaS Rg=100 ohm
channel is closed and the PNP transistor has an L=1BO }JH
T(=25 C
open base. This terminates turn-off by recombina- 0.70
tion of excess carriers. The first part of the fall ti- /
me can therefore be controlled by the gate drive
circuit. The second part is dependent on the PNP Vi 0.60 ....... /
transistor lifetime and gain. 2-
/
V
Photo 6 - HIMOS turn-on wave form 0.50 /'"
0.4 0
Vds =400V
1.BO Id=10A
Vg=10V
L=1BO}JH
1.60
Rg=100ohm
1.40
./V
Vi 1.20
Fig. 4 HIMOS turn-off showing three turn-off regions
2- V
~ 1.00 ,........- - L
VII /
..- MOSFET Turn Off O.BO L
/""
i (t) V (t)
0.60
Off
20 40 60 BO 100 120 140
T (C)
Figure 5 shows how t fall varies with Vos As Vos Is = [anpn Iell [1 - (anpn + apnp)l
increases so the gain of the PNP transistor increa- where apnp and anpn are the gains of the transi-
ses. This is due to the reduction of the base thick- stor structures and II is the recombination current.
ness caused by increasing the depletion region. The device enters into a regenerative loop and it
The dependence of t fall on temperature is shown fails when apnp + anpn ~ 1. In order to redu-
u[-0886
Rg-100 ohm
Rg=100 ohm 2 L=1BO )JH
1.BO L=1BO}JH - - --1---1---1--+--+----1
1
T=25 O( ,
1.60 i----r-----r---I'--j--- - ~-- -t7- ,
6
'10 2
~ 1. 00 I---t----t---t-------T//-+--+-+---+---I-------l
100 2 '6' 101 2 '6 2 'Vos(Vl
o.BO t----t----+--v---t----t--j--+-t----t------l
0.60 +---+----+-+---+--+--!--I--I----+-------1
Fig. 10 - Test circuit HIMOS reverse bias safe ope-
rating area
o 50 100 150 200 250 300 350 400 450 500
LIFETIME (nsec)
r---r----- - -f--+--+--f---
70 t----C--+--t--+--j--i--- - - r - - - - Vds =400V
Vg =15V
(I I
f----l---+---t--t--t-+--l---+-+-+-+-I L= 25 OuH
60 Rg=100 ohm
50
r-------'\
['..,
vd ,.,
~ 40 i".
"-
f---t-+----I--+-~_+~-f---j-~--I----- S[-0322
~30 r--....
20f---t-+~--+---j-~-+-+--I--+-~~--I-'-f--~
...... -=-=
CONCLUSION
10 f---t-+--I--+---j-~-+-+-+- -,----r--- HIMOS devices are a natural development of PO-
WER MOSFET transistors for use in high voltage
applications in the range of 500V -1000V. They pre-
20 40 60 BO 100 120 140 160 sent the user with high current devices which ha-
Tj tC)
ve low Vos (on) typical of bipolar devices and the
simplicity of drive typical of POWER MOSFETs.
Ilatch decreasing with temperature, figure 7, or with Increasing the latch - up current and reducing the
increasing Vos is correlated to the gain variations lifetime of the minority has opened up new field for
they cause in the two parasitic transistors. Exter HIMOS.
(1
220V
A( 15nF
TR2 R4
R1 10.n. D( MOTOR
56K 2N2222
R5
18k R6
13K
R8 (9
47.n. 10nF 02
UC3842 R7 STHI10N50
1K BYT03400
R10
P1
C3 DZ1 (4 22K R9 (6 (7
(5 R11 R2 R3
18V 10nF 100K 220pF 15nF 1nF 18K 0.22n 390.0.
2.2uF
1/4
149
The PWM controller IC used is STUC3842. It is a The motor speed is controlled by the error voltage
popular, economic eight pin IC widely used for off- which is variable from OV to + 5V, and is applied
line and DC to DC converters. STUC3842 provi- to pin 2 of the IC by means of R9. This voltage sets
des the features necessary to implement fixed fre- a constant current level at which the IC interrupts,
quency current mode control scheme with a pulse by pulse, the current in the power switch: the
minimal external parts count. PWM control is therefore a "current mode" type.
Internally implemented circuits include under vol- The HIMOS switch used is STH110N50, for higher
tage lockout featuring start-up current less than power motors STHI20N50 can be used simply by
1rnA, a precision reference, logic to insure latched changing resistors R2 and R6 and free-wheeling
operation, a PWM comparator which provides cur- diode 01. Figures 2 and 3 show respectively the
rent limit control and a totem pole output stage. It output characteristics of STHI10N50 and
can directly drive the gate of the 500V 10A HIMOS STHI20N50 devices.
switch STH110N50. The choice of this IC and its An important part of the circuit is the snubber con-
current mode working matches the requirements sisting of R3, C9, 02. This accomplishes two
of economy and simplicity of this application. functions:
a) it provides power for the UC3842 using the char-
Fig. 2 - STHI10N50 output characteristics ge current of C9 during the STHI1 ON50 turn-off;
(I step = 6V) infact the IC requires about 20 rnA DC as sup-
ply current and cannot be biased simply through
resistor R1 which should be 10Kohm 10W. In-
stead, using this active snubber, R1 can be set
to a value of 56Kohm 2W in order to apply the
start up power to the UC3842.
b) it reduces the energy dissipated in the power
switch during turn-off; consequently a smaller
heatsink can be used for STHI1 ON50 giving ad-
ditional cost reduction.
To insure a continuous power supply to the IC,
using the active snubber C9, R3, 02, it is neces-
sary that the capacitor C9 must be completely di-
scharged before turn-off. Because C9 is discharged
by means of R3 during the ON phase of the power
switch, there is a limit to the minimum ON time
which cannot be less than 8 J-ts, consequently the
minimum duty-cycle is 6%.
Considering a peak current.lp = 4A, a fall time t f =
Fig. 3 - STHI20N50 output characteristics
1.5 p,s and the minimum ON time of 8 p,s, the va-
(I step = 6V)
lues of the snubber components are calculated as
follows:
C9 = (Ipt f)/2Vcc = 10 nF
R3 = Ton (min/2. C9 =4000hm
The power dissipated across R3 is:
P = 1/2 C9 . V2 . f = 3W
The adoption of this snubber does not affect the
efficiency of the circuit during normal operation be-
cause its power dissipation is very low and it has
the additional benefit of using this energy to sup-
ply the IC so reducing the dissipation in the power
switch. The extra cost is negligible with respect to
the cost of a transformer for supplying the low vol-
tage power to the IC.
The network of Tr2 and R6 adds a fraction of the
ramp oscillator voltage to the "current sense" si-
-
. ~
.... . ... .... ~ ... .... .... ....
.. ~
....
2
.-
306 U
~
ft. ...,;
'
~
~ (~u 11 20 10Q'
10
.... ....
~fJ . ... ~... . ... .... ....
~~~ ~
Fig. 5 - STHI10N50 turn-off without snubber Id=
1Aldiv, Vds= 50Vldiv, Vg = 5Vldiv
-
rt'" ~ .~ ~ :.::
~~
~ ~
.. ~
.. :g....... .... .... .... .... .... .... ....
-
II)
r ~
... . ... .... ~
.... .... ~
1110
'0
IJI." ... . ... .... ....
:'J
""""""","'"
~I~
o.u 5 ~U .. 20
rJ ~~ Figure 7 shows the behaviour in the case of a bloc-
~ ~~ ked rotor and with the current control set at the ma-
10 ximum 4A. This condition was simulated, as worst
0"1. ... .... .... .... ~
~ ... ... .... .... ~ .... case, with and inductance of 300uH and a resistan-
ce of 1 0: the current does not exceed 6A. The over-
OmU 5 ~U :,[ 20 ns current of 2A, with respect the control current of
4A, is due to the delay introduced by the network
-
with improved performance in terms of unclamped
iI ::J
inductive switching at high current values. This has
lead to the production of a new class of POWER
----.~
:- 11= V(BRIOSS
MOSFET device that operates reliably in applica- III _. - - III I
Vpp
tion circuits even when accidental overvoltages IOFF
may occur at high current, caused as a result of
n
... ~1= Vee
the high switching speed of POWER MOSFETs I
USEFUL PARAMETERS IN POWER MOSFET Fig. 1 - Typical circuit where breakdown can oc-
RUGGEDNESS cur during turn-off
1/3
153
lar transistor occurs, the whole current is focused abruptly, and as a consequence, the critical cur-
into a few cells destroying them. At increased tem- rent decreases so that, if critical current becomes
perature, this phenomenon happens at lower cur- less than the discharge current the device fails.
rent values because the parasitic bipolar transistor Therefore it is possible to dissipate high inductive
threshold voltage decreases. energy at a low current.
1 - V(BRIOSS
UMAli~ N"
N'
DRAIN METAL
6t= L 6 1/6 V
.- I
100UH and duty cycle ~ 1%, loff = O.7x
Inominal (A)
CONCLUSION
Usually an application circuit is designed in a way
that avoids avalanche breakdown under normal
0.8
Guaranteed for operating conditions, for example using fast exter-
0.6 . SGSThomson nal clamping circuits. Occasional overvoltages, ho-
POWER MOSFETs TEST (OND L=100)JH wever, can stress the devices and create avalanche
0.4
b~1% breakdown conditions. New SGS-Thomson PO-
0.2 V[[=10% VIBRIOSS
WER MOSFETs release circuit designers from this
OL-__~____- L____~_ _~~_ _~~ type of constraint.
25 50
157
BUZ10
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
ADVANCE DATA
159
BUZ10
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
163
BUZ10A
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
GU1390
~ )
10",
'\
~
~
"-
"1
! i'\1OLl .
60
1'\ ,
10 1
V:'" i'
i
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i I
50
40
- -1 - - -
lms '\
",-, 30
j'\
"'- I'
,
.~
10~ 20
1O!mr
~ oj 10
'\
10 i'--
10 50 100
Io{A ) 20V_ )
9V 1II /'" 10
16
BV f, rl V 20
-I-- 1--""'-
12
1/"'/ TCiise::: 2SO (
15
1 ......... 1--
VI SV c-- - 1 /
/'
i I-- 10 II
, 1/ /
/ II VDS =2SV
III 4V
I
VDs =25V
V ... / 10 20 30 40 50 Io{A)
0.20
6
Vos=10V ,..
2
vI-' ./
0.15 ~
,..V'V
L I-' 40V
8
VGS =10V / /
0.10
Y ,/ /
0.0 5r- - -+- VGS -20V
,- 4
V
10 20 30 40 50 lolAI 150 T,I'[I 12 16 20 (lglnCl
50 100
r~
V
IO=10A
I 4 0.5
10 15 20 25 30 35 VoslVI -50 50 100 150 TPCI -80 -40 40 80 120 TJ I C
10o~/.m-B-M"C-!
S ~ H-+-
4/4
166
BUZ11
BUZ11 FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
167
BUZ11 - BUZ11 FI
OFF
ON
DYNAMIC
SWITCHING
Fa,02 ;:;;; 40
~
10:~.-.E;"IIII ~
"'~~\k.~n-
1,\
'~I
0
= '\.
~
R'~~
:~=== ~GLE
20
~~~
LSE T J T l- I
f-- --+-+-++H++---1~'-d-'>I'Oms
1111 II 10
1-+-+++I++I---+-~l.2!'OOm
DC
, I"!II! I I
1111 i I
1,\
10 4
10 3 10 2 10' 10 50 100 Tcase l CI
O
tplsl
lolAI
YGs =20Y III
50
10yfh Prl- 9Y
rill I i--- BY e-r- 7Y 15 Yos =25Y I-f---Hl-+++++++-+-+-l 15 f-t-+-++++++++-++-t+-t-+-ll-:b~
40 il [l /~
II V Tcas l!=25(
20
/I
,fl /
/ /'
- 6Y
10
IV ........ 1- 5Y
Il/"
IV 4Y
IV
5 YoslYI 10 15 lolAI
35 t---II---I---t---t---+-+-t-tl---l~~----
)--t---t-t-+-+-+-+--j-~--+-~--- 15
30r-+-+-+-+-+-+-+-+-+-+-~~ Vos=10V
/ V
~ /"
- . _..
VGs =10V 40V
25 10
~
,/
20V
20
10 \
) - - _._---
15
f-- -- c--- -_.
\
1 lo=45A
10
t---.--
/ 20
0 10 20 30 40 50 lolAI 50 100 T[([l 40
\ . . . . . . 1"'--.. L
2000
~--t--I-- --~l--
'-... lo=lmA
r-- Crss I--+--+-:"""'-I---\--- - c------
0.5
/
TJ =1500[-; If--- TJ =25[
I
II 1.6
0.4 0.8 1.2 VsolVI
_4/_5 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?1r~:J?CG~
170
BUZ11 - BUZ11 FI
ISOWATT DATA
/
Pto1 1W )
6"05
V 50
__ __ _ _ 2.5us
III ~
6"~ l- v 40
Zth=KRthJ-C
~
~ s=*
1~
.... 100s
I I
1msFf
10-
0"0.0
V
JLrL 30
"" ........
10msL
100ms
6"0~
/J;r r- -tJ 20 i"--
",
1:~1111~f'..!1.
AM T
10 1''-;;-0_~----'---LL..L.c.w-,-_~-'---JL-JI..J...!..W1
~
~fr[I[~TII
10
""
, '10
'
" 'VosIV)
2
10 tpls)
" o
o 25 50 75 100 125 Teas.IOC)
HIGH CURRENT
ULTRA FAST SWITCHING
VERY LOW ON-LOSSES
LOW DRIVE ENERGY FOR EASY DRIVE
INDUSTRIAL APPLICATIONS:
AUTOMOTIVE POWER ACTUATORS
,
MOTOR CONTROLS TO-220
N - channel enhancement mode POWER MOS field
effect transistor. Easy drive and very fast switching
times make this POWER MOS transistor ideal for
high speed switching applications. INTERNAL SCHEMATIC
Typical uses include power actuator driving, mo- DIAGRAM
tor drive including brushless motors, hydraulic ac-
tuators and many other uses in automotive
applications. It also finds use in DC/DC converters
and uninteruptible power supplies.
173
BUZ11A
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
_2/_4_ _ _ _ _ _ _ _ _ _ _ _ _
174
~ ~~~~m~1J~:~~~ --------------
BUZ11A
CthJ-C Ptot lW I
IK/WI
70
'\
60 '\
t:;; \.
D=0.5 50
--~
""11 I-""" 40 '\
~~ ~ I '\
10'.m=g'mll ~GE ~tfl~f
~PD~
ile 30
20
'\
r\.
10- 2
IIII
IIIIIIII
f=OO'f- J Tl
IIIIIIII IIIIIIII
t
10 ,-- \:~
-~
10 3 10' 10' 10
10' 10' 50 100 Tcasel"CI
tplsl
lolAI lolAI I
VGS =20V 10V
50 I
I V 20
Vos=25V I
16
40 / BV
/ J /1'" 15 12
J / I . . . .V
10
30
~ ........ 7V
I 1/
flV /'
20
II /
10 , lilY 6V
J.~v
5V /
I
/ Vos=25V
IV 4V ./
5 VoslVI 10 15 20 lolAI
FIl~~~II~~[[Il~~~IIjj~~
(lpF I
\ Inorml ~
ROSI.nl
160 o 1\ Tcase=2S0(
f=1MHz 1.1 -++"1.-+-+++-1-++-++-1 Vos=VGS
~ vDS=ov lo=lmA 1.5 H--HI-+H-HI-++++f+-IA+J.--+.-j
'\.,
\ 1\"\ . . . . . r-- -
120 0
(rss
80 0
\
i'-
,,~ --r-- r- -
(oss
40 0
r--
-- r-- ~~
0.7 LL...L....l-L.L.L--LJL.L...L....l-LLl..--L.l-.L.L.LJ
-50 50
20 30 40 VoslVI -50 50 100
_4/_4 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?tr~:J?~~
176
BUZ11S2
BUZ11S2FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
BUZ11S2 60 V 0.04 {1 30 A
BUZ11S2FI 60 V 0.04 {1 20 A
177
BUZ11 S2 - BUZ11 S2FI
OFF
ON
DYNAMIC
SWITCHING
10
lOOms '\
10' "'10'
100 '--:---:--L..L..L~.J-'-;------,----,-,-u.::.:0[.Ll.J111
"VosIV)
50 100
"-
Teasel [)
lolA)
VGs =20V III / lolA) r-+--t-+-t-+-+-+++-H-+-++-+-+-t-+-lrl
50
10Vlf-J Pif- 9V
II I-- BV >-- -7V 15 VoS=25V I-+-Hl-H--H--H--H-H 15 H--t-++--+-+++++++-++-+-+-I--:I-I
40 II 'J /fo"'"
I, /) / Tcase::::: 2SO (
20
11/
1'/ /'
/
I
,..-
- 6V
H--l-h!'-t-f-Hf-H-HVos=25V
10 IV
I~V -- 5V
IV
V 4V
5 VosIV) 10 15 lolA)
20
Vos=10V
/ V
0 ~ /' 40V
~/
20V
20r-t-t-r-r-+-+-+-+-+-+-~4 10 1\
\ 5 /
lo=45A
151--t-t-+--+--+--+-+-+-+-+-+-~
/
50 100 TC ('C) 20 40
.......1"--- /
1\ ..........
r-. [iss 8 .......
1.0
V VGS = 10V
----
~'\ --
100~
"" --- -
""""-.,
..............
~
~rss
r--
O. 6
4
Vos=VGS
lo=lmA
0.5
/,/ lo=15A
/
TJ=150oC-, VI I--- T =25C J
I
I I
0.4 0.8 1.2 1.6 VSO(V)
180
BUZ11 S2 - BUZ11 S2FI
ISOWATT DATA
/ GC-04IS
6~0.5
50
2.5ps II ~
10ps ~ ~ ~ 40
zth = KR thj ~ c
~
~
....
lOOp
IH1 V s=-Jt
JLrl 30
J'.,
lost ~ i'-...
.......
f'. 1OOm5
~~
IA
--tJ II 20
i'.
t-...
100~~ I i'.
Itm~uTI
~
f:::l::j:j: 0.(. OPERATION
~ 10
10-1 '---.......L.---'-L.L.l-LLL'--.......L.--'-L..LJIu.IJJJ
III 2 I o
'" I'-..
100 ' 101 'Vo;IVI o 25 50 75 100 125 Teas.loCI
183
BUZ20
THERMAL DATA
OFF
ON
ENERGY TEST
DYNAMIC
SWITCHING
lthJ-Cll~IIII'I~1
(KiWi ~
PtotIWII-+-+-.:t-+-+-t-l--+-H-+-H-I---H
70 t-t--I-J'l.,+-t-t---+-I--
60 t-t--I--/--I-"-'I,.-+--+-II--t--+---II--t--I--/--I--I
I
50 t-t--I--/--I--J-P<l--+--+-+-+--+-+-+-+-I
t-t--t--/--I--J-t----f"cl-+-+-+---j--. -- I-~
40t-+-t-t-+-+-t-l-~,H-+-~+~--H
'\+-- --1-1---
t-+-+-I-+-+-f-+--j~,<+-
30 t-t--I-t-t---J--/--I--J-+-'!.,,+-i-+-+-+-t
10~~_
~ Cr-
10 t-t--J--/--I--+--+-+-+-+-t-+-+---I''-+-
,\-1--1
\
50 100 Tease lOCI
lolAI
v ..... I BV
lolA I
15
gf,I51
v Gs =20vl / /
I 10
10V- 'r-f-{ TC<lse=25(
VOS=25V I
II if
20
'II ,., 7V 10 lL
I f/J
,,,I /
/ 1
10
1/1 6V
/ I Vos=25V
r//
f/
I,.,
IV
5V /
4V ./
4. VoslVI 12 16 20 lolAI
0.12
15
Vos=20V v;,V
VGs =10V
V
0.1 0
V 0
// V 80V
--
/'" ///
0.08
i--'~
5 /
0.0 6
_f- 20V
j lo=18A
0.0 4
II
10 20 30 40 50 lo(AI 50 100 150 Te (0(1 20 40
1.2K
,\ lo=1mA
800 \\
\ I\.
"-
-- [iss
1.0
0.9
1.0
lo=6A
VGs =10V
\ "' 0.5
-
400 .........
r-- - f -
"'- .........
Loss
Crss
0.8
A
V,V
TJ =1500( j'25(
I
I I Vso(VI
187
BUZ21
THERMAL DATA
OFF
ON
ENERGY TEST
DYNAMIC
SWITCHING
lthJ-('I~lfllll~1
IK/W) ~
Ptot lW)
70
GU 1390
0 1"-
I\.
0
~f-f-
40
"\
0 1"- ~~
(-(-
~I-~
"-
20
10
50 100
"II\.
Teasel ()
f,.. 5V J I
I
Iv.. 4V
./ 1
4 VosIV) 16 24 lolA)
/
Vos=20V
~V
0.11
/ / 20Y // /80V
0.09
..... v
/
v
10
'iV
0.07 V 5 /
-f--~
/
0.05
/
20 40 60 80 100 IDIAI 20 40
50 100 150 T, lOCI
'-... Ciss
1.0 1.0
1\
600 \ 0.9
lo=9A
\ "' ~
--
C"". 0.5
VGs =10V
'-... ern
I--
- 0.6
A
~
TJ=150C /1 25C
101
I
1/ I VsDIVI
4/4
190
~ ~~~~m?1J~:~~~ --------------
BUZ25
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
191
BUZ25
THERMAL DATA
OFF
ON
ENERGY TEST
DYNAMIC
SWITCHING
U-162
ZthJ-C'I~I~111111
)
f=
IK/WI
1,\
0
\
'\
0
f--
10- 2
10 \
IIIIIIIII10 4 10
I I I I10 2
11111111
10' 10 0
\
l 50 100 Tcasel'C)
tplsl
lolA I
r--
__ ~_ Vw,20V7 v:: /9'VS; lolA I
I
g'slS I
30
I~ ~ V 15 12
---- ~~ /' T[ase=25(
,----- I I
20
@V
//1' >--
6V
10 il
VOS,25V
10 jV/,
~/ 5V
/
/
VOS=25V
IF 4V
/
VoslVI B VGSIVI 10 20 30 40 lolA)
5
.2
VGs =10V ,
Vos=20V
~V
I 0 ~V 80V
I V
J ~
.1
"'" VVGS~20VII--- 5 /
I--
'"
-~ 1--- / lo=28.5A
/
20 40 60 80 100 lolAI 20 40
50 100 150 Te lOCI
400 \
'I---. tn
r- r--- 0.61----t--t---I-_+_-f----+-\---+~ 0.5
I-""
.... V
VGS =10V
I o
5 10 15 20 25 30 35 40 VOS IVI -40 40 80 120 TJ I CI
"p'
/
A
lj=150 c I;jV
lj =25C
I
I
"KI O
o 0.4
I I 0.8 1.2 1.6 VSOIVI
G~
INTERNAL SCHEMATIC
N - channel enhancement mode POWER MOS field DIAGRAM
effect transistor. Easy drive and very fast switch-
ing times make this POWER MOS transistor ideal
for high speed switching applications.
Typical uses include robotcs, laser diode drives,
UPS, SMPS, DC/DC, DC switch for telecomms and
electric vehicle drives. 5
195
BUZ32
THERMAL DATA
OFF
ON
ENERGY TEST
DYNAMIC
SWITCHING
LthJ-[ Ptot lW I
II.'~
lL '2f
IKIWI
70 , I-f- c--
'- 60
'\
V lOt ::;;; \.
10;
" ,~J;;:
10
0=0.5
= ~ 50
--
D=1I !;;;o 40
"' lmj 1~ ~ 30
f-- r-f-
'\
1'\
... 1- c---
c-;;,~ po~
10:
1'Pj r\
~t~~r02
10ms
20
SI G E pULj~f
100m 0,,0.01
DC 1-'1 T J T I- t
I ILililliL.L 10
,-- - r-- --~,\I-
10' I 10"' Illjj~ 1 11111111 111111111
10
68
101
6B
102 VOS'IVI
10
'
10' 10' 10' 10' 10
tplsl 50 100 Teasel [I
GC-0662
lolAI lolAI
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12 16 20 24 VoslVI 10 15 lolAI
3/4
197
BUZ32
0.8
VGs =10V
/
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1.0 2.0
-4/-4--______________________~~~~~~~?uT:~~~ ____________________________
198
BUZ41A
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
199
BUZ41A
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
200
BUZ41A
lOlA) ,U-169
ZthJ--C
Ptot ) ~-h-I-++--t--+-_t___l--+-+-+-t---+--+--i
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_4/_4_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?lI't:~~~~
202
BUZ42
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
"
EASY DRIVE - FOR REDUCED COST AND
SIZE
INDUSTRIAL APPLICATIONS:
SWITCHING POWER SUPPLIES
MOTOR CONTROLS TO-220
203
BUZ42
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
ZthJ-C F IW
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206
BUZ45
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
I
TYPE Voss ROS(on) 10
BUZ45 500 V 0.6 0 9.6 A
I
HIGH VOLTAGE - FOR OFF-LINE SMPS
ULTRA FAST SWITCHING FOR OPERATION
AT<100KHz
EASY DRIVE - FOR REDUCED COST AND
SIZE
INDUSTRIAL APPLICATIONS:
SWITCH MODE POWER SUPPLIES
MOTOR CONTROLS TO-3
207
BUZ45
THERMAL DATA
OFF
ON
DYNAMIC
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-.
100
0
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-------------- ~ ~~~~m~1J~:~~I1--------------3-/4
209
BUZ45
lo=14.4A Vos=100V
15
10 /~ 400V
VGs=IOV
1/:/
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10 20 30 lolAI 50 100 150 Tc lOCI 40 80
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1 I
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211
BUZ45A
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
_2/_4____________________~----~~~~~~~V~:~~~~ ____________________________
212
BUZ45A
lOlA) GU-1621
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(K/W)
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4/4
214
BUZ60
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
215
BUZ60
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
_2/_4_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m~::9Al--------------
216
BUZ60
GC-17141 GU 1390
ZthJ-[
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0.4 2
5 10 15 20 25 30 35 40 VOSIVI -50 50 100 -40 40 80
219
BUZ60B
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
l -- ZthJ-C
(KIWI
Ptot lWI
70 -C-- f-f-f-
I,
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_4/_4_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m~:9lt
222
BUZ71
BUZ71FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
,
VERY FAST SWITCHING
LOW DRIVE ENERGY FOR EASY DRIVE,
REDUCED SIZE AND COST
HIGH PULSED CURRENT - 56A FOR POWER
APPLICATIONS
INDUSTRIAL APPLICATIONS:
POWER ACTUATORS
TO-220 ISOWATT 220
N - channel enhancement mode POWER MOS field
effect transistors. Easy drive and very fast switch-
ing times make these POWER MOS transistors
ideal for high speed switching circuits in applica- INTERNAL SCHEMATIC
tions such as power actuator driving, motor drive DIAGRAM
including brushless motors, robotics, actuators and
many other uses in automotive control applications.
They also find use in DCIDC converters and unin-
terruptible power supplies.
223
BUZ71 - BUZ71 FI
OFF
ON
DYNAMIC
SWITCHING
_2/_5__________________________ ~~~~~~~~:~~----------------------------
224
BUZ71 - BUZ71 FI
lolA
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225
BUZ71 - BUZ71 FI
0.10
VGS=10V V \ V
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10 20 30 40 50 lolA) 50 100 12 16
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V
1
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,
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ISOWATT DATA
:~~ ~.
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D.C. OPERATION
10ms
100ms
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r.....
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229
BUZ71A
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
I 0,1 PO~
1'Pj 0 r\.
11111111
TTl- ' I- "-
llf'
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105
II I I
10'
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tp(S)
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VGs=7V
10V 6V --- c-----
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Vos=25V
V 10 20 30 40 50 Io(A)
Vas (V)
---------------------------- ~~~~~~~V~:~~n---------------------------3-/4
231
BUZ71A
I'-. 0
......
0.25
r-.... lo=18A
10 16
0.20 ./
I'... Vos=10V / V
i". 12
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0.15
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0.1 0
VGs=10V V 1\ V
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-
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10 20 30 40 50 lolAI 12 16
50 100
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1 4 0.5
10 15 20 25 30 35 VoslVI -50 50 100 -80 -40 40 80 120 TJ I ()
I
'I/-- e-__TT =1500(
=25(
J
,
4 VsolVI
_4/_4__________________________ ~~~~~~~:~~
232
BUZ72A
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
233
BUZ72A
THERMAL DATA
OFF
ON
ENERGY TEST
DYNAMIC
SWITCHING
_2/_4 _ _ _ _ _ _ _ _ _ _ _ _ _
234
~ ~~~~m?1T~:~~~~ --------------
BUZ72A
ZthJ-e _ _ _
(KIWI
I I-::
40
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Vos=25V
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237
BUZ74
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
238
BUZ74
ZthJ_C _ _ _
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10' If~=150C
I
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VsDIV)
241
BUZ74A
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
'I
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l.5s
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L ~
4
/ 1.0 I--++-t-t--t-++-l--+-+-+~+-++-t-t--t-H sf
3
/ 0.5 H-+-t-+-+-+--t-H-+-++-H:+--t-+-+-+-+ 1
2
,.;'
V
10 12 14 lolAi -50 100 150 Tc I'CI 10 20
I
f--I, _j-T"~--==2i'_5'_-"[+--_t_____+-t_+___+____1
100 L---'---'---L-----L--'_.L.----'-------'------'-_"------'
o VsolVI
4/4
244
BUZ76
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
245
BUZ76
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
Z'hJ-C_,,_
IK/WI
Thermal impedance
II f-::
Ptot lWl
0
Derating curve
100~.S
~
D=0.1
0
0,0.05 i>"""
~~2
10-,0,0.01
I 0
SIN EP
I'..
I'\.
0 I'...
'" I'...
50 100
"
iliA) lolA I I
VGs =20V t-----
W 6V
If/ T",,=2S0[
Vos=25V 1
) s.sv 1
VI,-"" _ _ f-""
-I--
I sv vI',
/
2
t ,r
1/1
4.5V
/
4Vf- r---
/ /
V v
12 16 VoslVI 5 lolAI
JI
1/ 1'0.
I'
-+-- /~
/ VGs :20V
"- 10 -
Vos:80V/
'i'
~ I' r--~'i' 320V
~'/" I'
..... ~~
"\
~
ri-- fU
\ /
\
V 10
10 lolAI 50 100 150 20
Te I'()
O. 8
......... 1'-.
.......... ,
..........
1.0
V
/
\ , I--- r--- lo:1mA
Vos:VGS
V VGs: 1OV
-
200 O. 6 0.6 10 :1.5A - -
\ ........ ~ L' )
t-- (rss
4 0.2
10 20 30 40 VOS IVI -50 50 100 -40 40 80
101
TJ:1500(~
IrJ
II
/11-- r- TJ:25(
100
o
I 4 VsolVI
249
BUZ76A
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
10'
~~~.
-r-
~ 1~~
~s
IK/W
10
'I
0 0 : 0.5 ~
~
0
0=0
lolA I IDCA )
VGs :20V t----
VI" 6V
10Vt-# -L./'"
+- VDs :25V
4
11/ Tcase=2S0(
Vos:2SV I
3
) 5.5V
1
vi""" -- -
!VV'
"=~
I 5V
--f----
2
It /
V
T
j 4.5V
/ V
/I 4Vf-- f-- / L
IT
~
12 16 VoslVI 5 lolA)
. . . r-+- (rss
4 L
10 20 30 40 VOS IVI -50 50 100 0.2 '----::'40:--'---"--'---.,.4 O--'...--:'60:---'--T-'-J-::1:-'[1
f,/~
10
, TJ =150'[-
II
III-- I-- TJ=25'[
100
o
I 4 VsolVI
4/4
252
~ ~~~~m?::J?n --------------
..r=-= SGS-THOMSON
~L [R'li]DOO@~OJ~uOO@~D~ BUZ353
N - CHANNEL ENHANCEMENT MODE
POWER MaS TRANSISTOR
253
BUZ353
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
) GU-1621
ZthJ- ( Ptot lW )
IK/W)
140
~~ , y,9
~s
r- f-+-k.
~, ....
120
1~
~s
~ ~ 100 ""
~s
I
0
"ill" 80 "I'-.I'.,
~' 1
1i
S
,- ~ 60
" I'-.
i
10
,"S o,~ po~ ,'pr 40 "\
10 11111
0 (-
1 M 111111 I T J ,I.... ' 20
I"\.
.'\
, II 10.
1
10
\
1\][1
10 4 10 3 10 10' 100
I'-.
' tpls) 50 100
GC-0641 - 37
lolA) lolA) )
VGs =20V If t-- 10V
15 I
16
li- t - 8V
6V
I 14
(" J 12
12 W 5V t-- t-- 10
10
t-
I ,.
,
II
J Tcase=2S0[
4V
I
II
I
Vos=25V
II
/
Vos=2SV --
I( II
/
10 20 30 40 VosIV) 10 12 lolA)
lo=14.4A Vos=100V
15
10
VGS=IOV
/t::/ 400V
....-:V
V
VGs =20V 10
/ /
::::: .....
.-::;..-- /: /'
./
O. 5
I
/
V 40 80
10 20 30 lolA) 50 100 150 TelC)
6
VGS =10V 1-++-+-+-11-++-++-1
Ii 2
- - lo=5.5A
-
-r--.
(lSI -r-r--
8 I-
\\
...
1\ 4 VOs=VGS
lo=lmA
\1\..
1'-. ....... - (01$
".i 60 VoslVl
0
-50 50 100 -50 50 100
I."
1J.r- r- T =150'C
1-- Tj=25'C
1 I
0.5 10 15 2.0 2.5 3.0 VsoIV)
_4/_4__________________________ ~~~~~~:~----------------------------
256
BUZ354
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
257
BUZ354
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
GU-1621
ZthJ-C Ptot lW )
(KiWi
14 0
1'. IIIr 120
- .... ""\
~J~ i~:,
~~<;
"' 00
10
100
"-
r-..
"-
'\
0
:-.... IiII"" I"-
~, 11~~
10 V ,
~
i-'""
~ o,~Po~
0
'" '\
10ms
60~~
~ r-
J do-
40
"I'
'"
T t
20
'\
III
'"
2
1
10- 105 10' 10 l 10 2 10
'
10
tplsl 50 100
Ii" I 12
g 10
12 5V- - 10
.... -'- --
,
II
j Tcase=2S0[
4V
II
/
/
Vos=25V
1/
/
Vos=25V f--
I
I( V II
10 20 30 40 VoslVI 10 12 lolA)
1o=14.4A Vos=100V
15
0
Vns=IOV
L ~ 400V
/./
V
Vns =20V 10 / V
.-::;f/ ~V
5 ... :::::f'"" //
f
/
V
10 20 30 lolA) 50 100 150 Tc (OC) 40 80
H-+-t-+-t-11o=5A t-+-H-+-iH-+-t+-t-l
1 2
I -I--_
r,.. -r-r-- . . . r-. t-
o. 8
-r-.
1\
O. 4 Vos=VGS
lo=lmA
\i\..
1'-.-1- c,..
I'm
20 60 VDSIVI -50 50 100 -50 50 100
;,'/
H- r- T =150 o C
- I - Tj=25C
,
1 I0.5 1.0 1.5 2.0 2.5 3.0 VsoIVI
INTERNAL SCHEMATIC
DIAGRAM
N - channel enhancement mode POWER MOS field
effect transistors. Easy drive and very fast switch-
ing times make these POWER MOS transistors
ideal for high speed switching applications. Appli-
cations include DCIDC converters, UPS, battery
chargers, secondary regulators, servo control, pow- 5
er audio amplifiers and robotics.
261
IRF 140 - 141 - 142 - 143
THERMAL DATA
OFF
ON **
DYNAMIC
SWITCHING
_2/_5__________________________ ~~~~~~~~~~----------------------------
262
IRF 140 - 141 - 142 - 143
U-1 1 GU-1593
)
Ptot lW )
140
120 r---r-...
10 2~F~/1 .-
~4(::f*~v~
~~
_. 10'
&l'1 :;.;
100
"" , ......
",
IRFl4()/l 80
1 17
1i213
ftt " 1.,
II
&'1"1 /: 60
10
-=O( OPERATION
10"' f:S#
I ~
~
Zt~ = KR
s=-Jt
j-c
40 "\.
"I\..
1Omsf--
SINGLE PULSE JlIL 20
~'11'
lOOms I
2
111111
~ 6 8 10' 1
I~~~tq~ DC
10.2
10 5
JllJll~
10' 10' 10 2 10 ' 10' 20 40 60 80 100 120
"\.
Tcase I [)
tpls)
.j-
-00
lolA ) lolA
VGS =10V ~ V 9Y8V lolA ) 9V
!-8V l[ VOS>ID(onlxROSlonlmax I
0
Tcase=25( V/ '/ VGs =10,
f-- - r--I-- II
h V -~ -
0 40
7V
TJ=-SSO[ - HI' V
0 ///V/ 0 30
TJ=2S0[ - J-j I
~/ TJ=12S0[, - IJlV
~I"
- 'I
6V 6V
0 0 20
Ill' l'f/
10
~V sv 10 10 I
~~
SV
'f/
IF 4V 4V
~
VosIV) 10 20 30 40 VosIV) VGsIV)
3/5
263
IRF 140 - 141 - 142 - 143
16
I
/
//V
- TiT -
T J =25C
ROSlon)
(nl
24
I
i'--
......... ...... ~
12 h I I 2
VGs =10V' 18
r-...... ~ IRF140 141
,IL
8
I
/
/!--
I I
rf- c--
1 J
1
I
/
/ 1o=28A 400 \
r-.....
-r-r-
trss
- t--
I-+--~-+~~+-~-+---l-
0.85 1--+--+--+-t--lVGs=O
lo=250pA
f-_ .._-- 1----
J O. 75 L--"-....L-L-.-J'----'--~___L--'_"--'
20 40 5 10 15 20 25 30 35 40 VOS(YI -40 40 80 120 TJ (OCI
2.01--+--+--+-+-t-+--+--t-I--i
v
V -'
A
/""
1.5 r--'--+-+--+--+-/--+/---..I~+-+---l
.... -
lj=150C
V/'
1.0 I--t---l--::;;I.""'~./' -- L
..,...../' II lj =25(
I-"" I
0_ 5 I-+--+--t----i!--t--t--t I
I,
0.4 0.8 1.2 1.6 VSolYl
L Ec
VARY t TO OBTAIN
r
REO.UIRlD PEAK tOUT
Voo
ADJUST RL
PULSE TO OBTAIN
:GENERATOR
................. . SPECIFIED 10
Vos
12V = O.2pF SOKQ
OUT
:
~ ...... .' .......... .
1.5mA
FL -Vos
S(-0246
CURRENT
SAMPLING
RESISTOR
S(-0244
267
IRF 150 - 151 - 152 - 153
THERMAL DATA
OFF
,,<BR) oss Drain-source 10= 250 pA VGs= 0
breakdown voltage for IRF150/lRF152 100 V
for IRF15111RF153 60 V
ON **
ENERGY TEST
DYNAMIC
SWITCHING
Ptot(W)
- i"'\.
140
120 ~
F"~~ =;: '\
10'~<f>
: ~ lOps _
10_11
100
'\
4 REtSOf
, 10Dps
2~7
80
lm'r-
60 '\
10:
'" 10m' '= 40
20
~
r\.
r\.
10' 10. 10 20 40 60 80 100 120 Tcase (O[)
' tp(s)
lolA I
-
VGs =10V
flH BV 6V ..----r lolA) It~
BV
I
VI
16
9V -h'If- 7VV 25
VOS>IOlonlxRO Imax/,
W
/!IJ V Tcase=2S0(
11
12 VI / 30 V
7V 20
HI
lfl/
IJY
rJ V ,,-/
v ....... -
5V
20 '/'
6V
15
10
" '/
U
TJ =125 C
TJ =25[- 1 - -
9 - V V
4V
I/i
rl
TJ ,-5rC
1-'----
'" ~//
4V
0.4 O.B 12 16 VOSIVI 10 20 30 40 VoslVI 1 2 3 4 5 6 7 B 9 10 VGSIVI
I
I
0.0 6
0.0 2
V
~ f--
./
f.--- V
/ VGs =20V
vr
o
'0-,
10 20 30 40 IOIAI 40 80 120 lolAI 25 50 75 100 125 T(as/C
V
~ 1600 \ \ r-
\ "'I'..
- Ciss
0.95
V
.......... V
.,./
/
/ lo=50A 800
" i'-. ~
. . . . 1'-- Crss
r- -
0.85
0.75
2B 56 84 10 20 30 40 V051VI -40 40 80 120 TJ 1[1
L V(SA) DSS
VARY t TO OBTAIN
REO.UIRED PEAK IL OUT
r
Vos - - - - i
,,
,,
,
,-------
SC-0338
S<;'0339
Voo
ADJUST RL
PULSE TO OBTAIN
!GENERATOR
................. . SPECIFIED 10
Vos
12V = O.2pF 50KQ
OUT
!-........ ....... ..
,. ~
t5mA
rL -Vos
S[-0246 CURRENT
SAMPLING
RESISTOR
S[-0244
273
IRF350
THERMAL DATA
OFF
ON **
DYNAMIC
SWITCHING
s=.Jt
J<R th)-C
40 "'\
OC ~:~i f-'
p- - ~
'\.
10-1 III S'I"I' '!lit' ii:J'"", 20
I\.
100 2 I, 6 8101 2 4 68102 2 "Vos(Vl 10"10'S 10'4 10 3 10' 10' 10
tpls) 20 40 60 80 100 120 Tease lOCI
,
GC-0491
lolA I lolA I
VGs =10V
/. ~V rI/
8
Tcase=25( ~
//
5V
20 It--I---t--+-+-+-+--t---I--+-+-f---I
6V 15 hr,
!J ,/ 16 ft--l---t--t-+-+-+--+-+-+-+---l---I
Ii
6
// V T
1zH---t-t-+-+'-'-' 'l'-'-se=:::.;Z:....50,+C -+-+-+-1 0
1/// Vos>IOlonjxROSlonl W
J,V 4.5V
5V TJ=125 0C_!J
2 ~V 5
TJ=2~/L
1--1f---1--+-+-+-+--1 4.5V 1 - - - -
J 3.5V 4V
TJ=-55C
If t
50 100 150
4V
200 250 VoslVI
VP
VoslVI
16
V .... TJ=25C
0.6
16
....... r---...
/V -I---I- ~OC
f- VGs=10V J t'--..
/ /V ,/"
"",
0.5
12
12
IV V /
II/
rJ ~
V
._.- I~ -- O. 4
VGs =20V
"'" "'"
I~ ....
JlL VOs>IO(on)x ROS(on)max.
Ih V \
~~+-~- ---I~
3
If/- t--- ~
f--
...... ~ o
10 20 30 40 50 60 ID(AI 25 50 75 100
10 15 20 lOlA)
"'
800 ID=250pA
I
10
r-- r--
20
Coss
Crss
30
- 40
-
VOS
0.75
-40 40 80
2.2
1.8 J--J--J--
VGs =10V / 10 2 ~~
ID=5A
Iv
4 V
V ~=150"c VI
0 / 101 ~ TJ =25"(
1./
...... V
6 ....
I
O. 2 100 III
-40 40 4 VSD(V)
-4/-5--------------------------~~~~~~~vT:9~~ ----------------------------
276
IRF350
VARY t TO OBTAIN
REO.UIREO PEAK IL OUT
VDS ----t
,,
,,
,
E,=O.5 BVoss ,-------
Ec=O.75 BVoss
S(-0243
S(-0242
PULSE
!GENERATOR
................. . 12V
!
~....... ............ .
1.5mA
s-L --C==1--<...-t_J---o -Vos
S(-0246 CURRENT
SAMPLING
RESISTOR
S(-0244
---------------
ru SGS-1HOMSON
'JI,. IR\iIfl~IRl~IL~~'D'IRllR!lfl~~ ---------------
5/5
277
ru SGS-THOMSON
~1m [I0iJDOO@~[L~uOO@~D~
IRF 450 - 451
IRF 452 - 453
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
279
IRF 450 - 451 - 452 - 453
THERMAL DATA
OFF
ON **
10(on) On-state drain current Vos > 10 (on) X ROS(on) max VGs =10 V
for IRF450llRF451 13 A
for IRF452/1RF453 11 A
DYNAMIC
gfs ** Forward Vos > 10 j\n) x Ros (on) max 8.7 mho
transcond uctance 10= 7.2
Ciss Input capacitance 3000 pF
Coss Output capacitance Vos= 25 V f= 1 MHz 600 pF
Crss Reverse transfer VGs= 0 200 pF
capacitance
SWITCHING
u- ,
'DCAi Ptot lW)
140
- I\.
.~.;z
"' ". '\
I." "' 120
..
01 10 '\
100
~ 80
'\
I- ~
'ERAli
r-
O~
l
r'\. III 10-1
01
l--- ;....
60 '\
.r==
,~
TC=2SC .~ 11111
Zfh=KRthJ:C-:
S=4f- 40 i'\..
JUL
I-
'I-
TJ=lS0C
RthJ(=O.83KJW
StNGlEPUlSE
I.F451
-&00.01
G(-049t
,
lolA ) lolA )
V6s =10V /, /6v W
// 201t-t-IH--+--+-+--+--+-+-++---l
6V hrJ
Tcase=2SQ( If/ 5V 15
16tt-t-It-I-+--+-+-+-+-+------+--l-----l
!J V
6
;,'1 ;' 0
IJ
IV VDS > Iolonl,ROSIGn ,W
1// 4.5V
5V TJ=125O(_/~
~ ,/ 5
TJ=2~L
TJ =-55(
j 3.5V 4V
4_5V -1--1--
I I
VosIV) so 100 150
4V
281
IRF 450 - 451 - 452 - 453
/ !-- TJ =2SC
16 2 ...........
12 /
//
./ ~
--r--- ~c
/-
6
VGs =10V I
........., ...........
.................
I'-.... IRF450.4S1
IV V / 9
I'--- .................
1/V
5
VI VGs =20V IRF4S2.4S3
'" i"-.
/1/ I/Y ~
,,
, ...........
10 "'~ ~ 160
o\
0.95
V
.//
~~ \
\
I 800 "- ........1'--- 0.85
/ 10=nA "'- ...... Coss
II r-. r-- Crss roo- 0.75
28 56 84 10 20 30 -40 40 80 120 TJ (CI
112 Qg(nCi 40 VOS
2.2
~
18
VGS =10V. V 10 2 ~
16s dSA
1.4
/
~=150WI
,
10
/
/ 10
-'" TJ =2St
6 V
1""- II
2 10 0 /I
4 Vso(VI
-40 40 80 120 160 TJ to
_4/_5_ _ _ _ _ _ _ _ _ _ _ _ ID'l
J, '"
SGS-mOMSON
li(lio(C;rJ\liOJl~Il~(C;'jj'ffiliOJ~U(C;~
_ _ _ _ _ _ _ _ _ _ __
282
IRF 450 - 451 - 452 - 453
E[
VARY t TO OBTAIN
r
REQ.UIRl1h PEAK IL OUT
VDS ----+
,,
, ,'\
Voo
ADJUST RL
PULSE TO OBTAIN
GENERATOR .
:.................. SPE[IFIED 10
VDS 12V
OUT
!...... .- .............. .
1.5mA
rL --[==}--<~_.J--O -Vos
S[-0246
CURRENT
SAMPLING
RESISTOR
S[-0244
285
IRF 520/FI - 521/FI - 522/FI - 523/FI
OFF
ON **
VGS (th) Gate threshold voltage Vos= VGS 10= 250 p,A 2 4 V
ENERGY TEST
DYNAMIC
gfs ** Forward Vos > 10 jfn) x Ros (on) max 2.7 mho
transconductance 10= 5.6
Ciss Input capacitance 600 pF
Coss Output capacitance Vos= 25 V f= 1 MHz 400 pF
Crss Reverse transfer VGs= 0 100 pF
capacitance
SWITCHING
, ~ 35 \
I ./ 30 I\.
I
25 I\.
\
20
r- 15 \
:=r-
Zth=KRthj-c
~ -- r- k!f \.
~IA'I+!tIl--+H+tttIl-+++.J1.fL 10
GU-1351
I 8V ___ lo(A ID(A I
VGs =10V ~ v/ I- ~ I 10V,/'V GS =9V 8V Tcase=2S0( '1
8
9V---t ~ V '--'-- 12
W 16
VDS>ID (ani x RDS (onlmax.
II
~ V/ ~J..-'" 6V L, 7V
TJ = 125( ....... 'I V
hV
W, ~
~ ,
V
it 6V 12
TJ = 25( .........
TJ =-5S'(
WfY
VI
4
,1~ /f..-- 5V 6 I /;V
I~ ~ I 5V W
V
2/J
W Tcase=2S0(
3 J
._- -- ~
II-f-" I 4V
10 20
4V
30
~~
Vos(VI 40 Vos(VI 8 VGS(VI
/ LV T)2S'(
VGs =10V/ I ........ I"" IRFS20/521
I-- /
'"
/VGs =20V
'/
!J V ------ 4
JV IRFS221523 " "\
,II
VDS>ID(onIXRDS (ani max. 0.2
- ~~ '~
,,
~
20 30
o
12 16 I D (A) 10 Io(AI 25 50 75 100 125 T( ('[1
(rss
0.8S I--+--+--+--+--+---I-f--+-+---l
V 12 16 Q g (nC) 10 20 30
0.15 L--L----L---L-L----L-----1_L--L--L--.J
40 VDS (V) -40 40 80 120 TJ ('CI
_4/_6 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?::~~Jl--------------
288
IRF 520/FI . 521/FI . 522/FI' 523/FI
1.5
1/ "
r-- V
V
/
1.0 / r---
VGS"10V-
/ r---
V IO=10A
",
0.5
-80 -40 40 80 120 TJ ( ()
L VIBR) DSS
r
VARY t TO OBTAIN
REO.UIR~'o PEAK IL DUT
VGs = 1 0 V ! n
VDS -----+
~-I
'\
'\
'\
'\
'\
,-------
SC-0338
SC-0339
Voo
ADJUST RL
PULSE TO OBTAIN
p~.~s~A.I~.~ .... SPECIFIED 10
VDS 12V
OUT
!.... ............. .
~
1.5mA
SL
S(-0246
S[-0244
lOmax'"
RthJ- C RthC-HS RthHS-amb
~
ISOWATT DATA
-042/1
)
---= 5~O.5
10~, i--
..... .... 11111 50
11111111 ---
100~sF
4fr II""""
1111111
'Zth::KRthj-c
40
r-
:j; ~ S:: -it
30
1ms
1= JlJL I'
~
~
6=0.05 -
m'E
6=0.01
6=0.01
-
- ~!
--t-J 20
""
!Q.o~
DC r-
SINliUEPULSE
I i:i 1111111111
tp(s)
o
o 25 50 75 100
'"
125
r-....
Tea .. 1
61tJ
----------------------------~~~~~~~V~:~~~ ----------------------------
( 290
IRF 530/FI-531/FI
IRF 532/FI-533/FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
PRELIMINARY DATA
291
IRF 530/FI - 5311FI - 532/FI - 533/FI
OFF
ON **
VGS (th) Gate threshold voltage Vos = VGS 10= 250 p,A 2 4 V
lo(on) On-state drain current V os > 10 (on) X ROS(on) max VGs =10 V
for IRF530/531/530FI/531 FI 14 A
for IRF532/533/532FI/533FI 12 A
DYNAMIC
gfs ** Forward Vos > 10 ~n) x Ros (on) max 5.1 mho
transconductance 10= 8.3
SWITCHING
295
IRF 540/FI - 541/FI - 542/FI - 543/FI
OFF
ON **
DYNAMIC
SWITCHING
-_. ~ 140
:~-
1- ---, -
'--c--
8=0.5
II ~
r-- 120
-;"\,
,.-- - r ',-
~
-1-
~.
10:~-S~c -:--=~ 100
~~~~
--I"- 101Jsf------
I-
~ ",-
,
- ~- 1 &=0.1 80
,~= "\'..
/ 1\ 1m, &:0.05 60
10~
,_.
_tf"
~
Zth::KRfhj-c
S=-!t r- 40 "'"
(OPERATION
lOmsr
lolA I
VGS =10V v:: /9yav I 9V
-BV
lolA
)1 VoS>IO(onlxROS(onlmax / '/
~~
- II / - -
VGs =10\
TCClse=2S0(
40 f----,--
f!1- -
0 0
7"v
~V TJ=-SSoC - H il /
0 1//vi-" 0 30
TJ=2SoC - J.J /
~ /' TJ=12SoC - fl-/.V
0
~V 6V
0
6V
20
fj
1// I.--- '/ V
10
Ifh/ SV 10
SV 10 !
1J.v." '(
p 4V 4V
~~
VoslVI 10 20 30 40 VoslVI
----------------------------~~~~~~~v~:9~ ___________________________3_/6
297
IRF 540/FI - 541/FI - 542/FI - 543/FI
16
)
/
V/ ,.-
- TtI:-
TJ=25C
ROSlon)
1(\)
lolA)
24 ~
i"'-- ...... ~
!J I 1 2
VGs =10V , 18
f".. ~ IRF540/541
12
Bf
1/
..-
I
rT
I
I~
II
I
v 12
IRF542/543
"" ~
~
~
JI
/
Vos> IO{anlXROS(onlmax I-----
1
f-r::: I--f.-'
_,X VV GS =20 t -
\
.1
I I
20 40 60 80 100 lolA) 25 50 75 100 125 TeIOC)
10 20 30 40 lolA)
M ~
\ I --I----- - ~I__+-+_-+_-+_:J;~F-I---l
Vos=50V
\ r- Ciss ..-,/
~
1200 1.05 1--+_. +--+--+V--l".....~.r=--+--1---1--
10 I .-I---+-,/-h..-9---+--- 1---- ~ .-
~ ~s=80V.IRF540.542
800 \ I 0.95 /~ --+--+--+--I--t-,)-
[f- ~
1'...... ~oss
I lo=2BA 400 ~
..........
T: r--
irss
--- 0.851---I--+--+--+--IVGs=0
lo=250~A
-- I--+--+--+---I---r- --- -- ---
L-. - )._.
II I 0.75 _L4-0-'--'--'--4...L--'-B"-0---'----'12'-0-LTJ~(OC)
0
20 40 60 5 10 15 20 25 30 35 40 VOS IV)
2,0 1--+--+-+-+--t--1-r--t---lr-l ~
V ./
/""
A
1,5 ) - -j-l---+--+--1V~jL-+---t--I 1j=150'C ~V
.. - y . . . . . I--r---
1.01-1- 7,/"+--+--+--+--+--+---
./ II 1j =25C
VGs =10V
-
I
OL-L-~-L-L~~L-L-~~-~
-40 40 80 120 TJ IC)
10 0
0.4
II 0.8 1.2 1.6 VSOIV)
_4/_6 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?:~~~~~
298
IRF 540/FI - 5411FI - 542/FI - 543/FI
Ec
r
VARY t TO OBTAIN
REO.UIRlO PEAK IL OUT
VGS = 1 0 V ! n
Vos - - - - t
.' ,,
~J ,. "" , ,,
",_ _---J
IL ---- - - _
E,=O.5 BVDSS ,-------
EC=O.75 BVDSS
5(-0243
S(-0242
PULSE
!~~.~~~.~1~.~.... 12V
~
........., ......... .
1.5mA~
5(-0246
CURRENT
SAMPLlN(j
RESISTOR
5(-0244
ISOWATT DATA
GC-0420/t GC-0416
)
."0.5
50
.~
II
- .....:
" Zth=KRthj-c
40
f'..
~ "'" ~ 6=.Jf-
= JLfL 30
"-
6~
&"0.0
f'=:
=
==
=--tJ 20
r--...
""-
/ 6"0.01
SINGLEPULSf 10
"'" "
/ t'-...
10-2 11111111 o i'-
10- 4 10- 3 10- 2 10-1 10 Ip(s)
o 25 50 75 100 125 Teas.(OC
G~
INTERNAL SCHEMATIC
e SWITCHING MODE POWER SUPPLIES DIAGRAM
e DC SWITCH
e ROBOTCS
N -channel enhancement mode POWER MaS field effect tran-
sistors. Easy drive and very fast switching times make these
POWER MaS transistors ideal for high speed switching ap-
plications. Typical uses are in telecommunications, robotics, 5
switching power supplies and as a DC switch.
ABSOLUTE MAXIMUM RATINGS IRF
TO-220 620 621 622 623
ISOWATT220 620FI 621FI 622FI 623FI
VOS * Drain-source voltage (V GS = 0) 200 150 200 150 V
VOGR * Drain-gate voltage (RGS = 20 KO) 200 150 200 150 V
VGS Gate-source voltage 20 V
10M (e) Drain current (pulsed) 20 20 16 16 A
620 621 622 623
10 Drain current (cont.) at Tc = 25C 5 5 4 4 A
10 Drain current (cont.) at Tc = 100C 3 3 2.5 2.5 A
620FI 621FI 622FI 623FI
Drain current (cont.) at Tc= 25C 4 4 3.5 3.5 A
Drain current (cont.) at Tc= 100C 2.5 2.5 2 2 A
TO-220 ISOWATT220
Ptot Total dissipation at Tc <25C 40 30 W
Derating factor 0.32 0.24 W/oC
T stg Storage temperature -55 to 150 C
T Max. operating junction temperature 150 C
* T = 25C to 125C
(.) Repetitive Rating: Pulse width limited by max junction temperature.
See note on ISOWATT220 on this datasheet.
Introduced in 1988 week 44
301
IRF 620/FI - 621/FI - 622/FI - 623/FI
OFF
,,<SR) oss Drain-source 10= 250 p,A VGs= 0
breakdown voltage for IRF620/622/620FI/622FI 200 V
for IRF621/623/621 FI/623FI 150 V
ON **
ENERGY TEST
DYNAMIC
gfs ** Forward Vos > 10 ~n) x Ros (on) max 1.3 mho
transconductance 10= 2.5
C iss Input capacitance 600 pF
Coss Output capacitance Vos= 25 V f= 1 MHz 300 pF
Crss Reverse transfer VGs= 0 80 pF
capacitance
SWITCHING
''--_1-_
, IRF620/1
I- itF6~/3 ;;(1-> 40
- - '-1--
IRF620/1 ' 10~s Zfh=KRfhj_c
30
S = l.
10"~~ ~
IRF622/3
100~s
,"- ROSlon)LlMIT I'~ 1"\ 1:
lms 20
~
i'..
10ms
i'..
10'1
IRF62113
lOOms
01.
IRF620/2
10
~
, ~
100 ~
2 6 8
101 2 "6 8
10 2 2 "Vos(V)
so 100
303
IRF 620/FI - 621/FI - 622/FI - 623/FI
G-864
lolA)
10V
III
V!VGS =6V Vos> IO(onlxROS(onlmax HI--t-I-+--t--+-t--i
~
II TJ=25[ 6V
II v
If 5V
IV ~~:::~2~;~( _~r=R-IH-HC+-++--H---1
/I 5V Tcase=12SoC-
I 4V I--- I---
II 4V
8 VosIV) J 4 5
20 40 60 80 VosIV)
+-+-I--t-+-+-+-!~_Jl_~~I-I-+-+-+4 JD~250 A
15 r--- - --f---+--+--1-+4 ::f~~, 1---,--+-
Vos=40V"
~~ 1000
I---+-I-+-+-+--+---H T,_=2SoC - -~r--
1\-+-I-+4r+-+
0
vos=100j
Vi 160V
'I)
5 / -- 0.9 t-+-f-t-l-H--+-t-+-t-+-t-I-+-t--+-I-I-H
/ lo=6A
/
10 20 20 40 60 VosfVI 50 TJiOCI
20 f--+-I_+-!---+--!--+--'----H--7f~-/'I'-+-+-++
1.S f-t-f-t-f-t-f-t-f-t-~I'+-I--+-I--+-I-t-I
100
I
0.5 1.S
VIBR) DSS
VARY t TO OBTAIN
r
REO.UIRED PEAK IL DUT
Vos ----+
" ,,
"" ,,
", " ,
IL ---- - - ---~ ,-------
SC-0338
SC-0339
Voo +Vos
ADJUST RL CURRENT
PULSE TO OBTAIN REGULATOR D
GENERATOR
f
SPECIFIED 10
Vos
12V = O.2pF 50KQ G
DUT
!...
~ '" ............. .
1.5mA
..JL
S(-0246
S(-0244
ISOWATT DATA
IOIAI:~!IEIII~11
I
~F620F1/1FI 50
10" ~--I/-:;=-:dFI--H:lIf.---::!;j
.... c-intt:!i.rc--+"----'-,0~+S++t+H
~ IRF620FI/1F
40
30
i""'-
20 t'--
111
10"1 1
IRF620FI12FI
IRF621FI/3FI
10
"-
"r--,.
t'--
o ........
o 25 50 75 100 125 Teas.loe
307
IRF 720/FI - 721/FI - 722/FI - 723/FI
OFF
ON **
VGS (th) Gate threshold voltage Vos = VGS 10= 250 p,A 2 4 V
DYNAMIC
gfs ** Forward Vos > 10 j\n) x Ros (on) max 1.0 mho
transconductance 10= 1.8
Ciss Input capacitance 600 pF
Coss Output capacitance Vos= 25 V f= 1 MHz 200 pF
Crss Reverse transfer VGs= 0 40 pF
capacitance
SWITCHING
10" IR~2~1
IRF72213
: IRF720/1
-.-5 ~
10~s
35
30
25
" I'\.
r'\.
, IRF7221;'~'\
100:~~\o~
" lOOps
20
\\
lms
'\
10-;
W-'
D.C. OPERATION
IRF72012
IRF72113
111111
15
10
'\. , r'\.
2
100
66 1 68
10 10 ' Vos,V) 20 40 60 80 100 120 Tcase 1C)
'olA) 'olA )
VGS =10V/ 6V
/ VI- 6V
Vos >IOonlxROSlonlmax.
I
~ Tcase=25(
/I
j 5.5V
III
I .~'"
5.5V V
5V~
J
r----- TJ =125C /J
It 1+-+--+-+--+-+---1 5V
TJ =25C i"--f..!.'1
1
4.5V
4.5V
TJ=-55C i'-.0
/I 4V~ f-- ~
~ty
l.'iV
12 16 VosIV) 100 200 Vos,V) 5 VGsIV)
1-''''''''
....-;::V"
I'l -['.. ...............
IRF722,723 ......... ....... ,
If
tV
S lOlA) 10 lolAI
o
25 50 75 100
I' ~
,,~
125 Tc IO [}
,
~~ \ ./'
/ \ \.
--
200 0.85 VGs=O - r-
/ \ ......... lo=250~A
lo=3.3A
~
/ [rss
0.75
12 16o.glnC) 10 20 30 40 VOSIV) -40 40 80 120 TJ I [}
0.2
I
10
o
I 4 VSOIV)
-40 40 80 TJ I'C)
_4/_6 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m~::J?~~
310
IRF 720/FI - 721/FI - 722/FI - 723/FI
VARY t TO OBTAIN
REO.UIR~h PEAK IL OUT
VGS = 1 0 V ! n
Vos - - -.....
,,
~J ,,
,
E,=0.5 BVoss '.... _-----
E(=0.75 BVoss
S(-0243
5(-0242
Voo
ADJUST RL CURRENT
PULSE TO OBTAIN REGULATOR 0
f-GENERATOR
................ . SPECIFIED 10
Vos
12V = 0.2pF 50KQ
OUT
!
.....................
1.5mA
rL
S(-0246 CURRENT CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
5(-0244
ISOWATT DATA
50
40
10
" I'-.. ,
I'-
o I'-..
a 25 50 75
313
IRF 730/FI - 731/FI - 732/FI - 733/FI
OFF
ON **
10(on) On-state drain current Vos > 10 (on) X RoS(on) max VGS = 10 V
for IRF730/731/730FII731 FI 5.5 A
for IRF732/733/732FII733FI 4.5 A
DYNAMIC
gfs ** Forward Vos > 10 }fn) x Ros (on) max 2.9 mho
transconductance 10= 3.0
Cjss Input capacitance 800 pF
Coss Output capacitance Vos= 25 V f= 1 MHz 300 pF
Crss Reverse transfer VGs= 0 80 pF
capacitance
SWITCHING
'ion
J
,S::O.l
~
l,...-
~~
50
40
'\
,
10~ _ _'~~I
~
/ ~ oe O~ERATION
"
'-:-OS;
~~':
SINGLE PULSE
111111111
zth =KRthj ~ (
-11JL
-tJ
6=*
f-
f-
f-
30
20
10
"'" '\
II IIIII~I II
'"
IRF731,3~
IRF730,2
2 111111111
68
10 2 'Vos'(V} 20 40 60 80 100 120 Tease 10
lOlA}
~~+-+_+_-jI/~~~I__---
lolAI l--- VGs =10V
I
t--t--t---+---t--- r- ---- ---1----
6 l--- - - T",.=25'[ f-+-+-i-+'-t--+--l-i
t--+-+--t--t--tlt--+--- -f--- - -
4.5V 3 ---~- -- --f----"
t-- lj =-55"[-
-,-,-tttt-+--t--t---t--+---J
4V
t--~t- ! Vos>IOI:}xROSIOn}~
- --
I 1 I
- - --'-' - I
3/6
315
IRF 730/FI - 7311FI - 732/FI - 733/FI
-
6 25'C
/V ~ II r- t--
~V I - 125'C / v l - t-- l"- t-!! F730, 731
4
I. V/
V 1 1// r-- r-.c- r-.... '-1-
~b:::: vi--'"
2l IRF732,733
""'" ~~,,~
III >--- f------
~
IO(A) 10 15 20 25 lo(A)
o
25 50 75 100
-
\ ........ t- Coss
/ Crss
0.75
16 24 QglnCl 5 10 15 20 25 30 35 40 VOS (V) -40 40 80 120 TJ lOCI
.0 /
l/ VGS =1111
I TJ =25'C
V 10 =2.0A
I
...V
.2 100 III
-40 40 80 o "so (V)
L E[
VARY t TO OBTAIN
REO.UIRED PEAK IL OUT
r
VGs = 1 0 V r - n
Vos---'"
,,
~J \ ,
E1=0.5 BVoss ,-------
Ec=O.7S BVoss
S[-0243
S[-0242
Voo
ADJUST RL
PULSE TO OBTAIN
!GENERATOR
................. .. SPECIFIED 10
12V
Vos
OUT
!
~ . . . . . . . . . . . . . . . . . . e'
1.smA
FL r-t-~r-f--o -Vos
S[-0246 CURRENT CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
S[-0244
ISOWATT DATA
-421/
6"0.5
". 50
II ~
6~ f- ". 40 1----
~
Zth=KRthj-c
~ f-
rrir 'I ~
0=* 30
i"'-
~ ~ JlIL - 1--- ~, f---- -- f--- I---f---
6:0~
.... M
cA }r
-tJ 20
-." ~
..... ,
~T~
r-+-
"-
~rtI~I~TII
10 I 1--
I ' - "k
o J"...
10-2 tpls)
a 25 50 75 100 125 Teas.IOC)
318
IRF 740/FI-741/FI
IRF 742/FI-743/FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
319
IRF 740/FI - 741/FI - 742/FI - 743/FI
OFF
ON **
10(on) On-state drain current Vos > 10 (on) X ROS(on) max VGS = 10 V
for IRF740/741/740FI/741FI 10 A
for IRF742/743/742FI/743FI 8.3 A
DYNAMIC
gfs ** Forward
transconductance
lf
Vos > 10 n) x Ros (on) max
10= 5.2
4.0 mho
SWITCHING
_2/_6__________________________ ~~~~~~~v~:~~~----------------------------
320
IRF 740/FI - 741/FI - 742/FI - 743/FI
.,0.5
~ 140
-
120 -~
--
II ~
11 100
",
.dJ ~ so
"'\..
",
1 &=0.
&,0.05
L lth:KRthj-c
s=.!t t-
60
",
-"! CSE JUL t-
1iJi
t- 40
20 "," ~-
2 1111" 1111 ~
20 40 60 SO 100 120 Tease I C)
Gu 1290
lOlA ) lOlA )
10V- '{f-YGS; 9V Tease; 25C
)
II/V
20
Tease; 25'C
20
JJ'-SV 7V
20
TJ;-55'C~
~/ /
VGS; 10V
t-- I TJ;25,c-.QI
, J 6V
15
I
10
~ P'
~
~~
--- 10
I
10
VOS>IOlon)X ROSlon)maxJ
If
~, I III
,..... 5Vf- 5V
l(f
/ 4V 4V ~~
S VOS IV) 20 40 60 SO VOSIV)
,"
TJ=-55'C r-- -
./
........ r-..., IRF740,741
r-- -
J
TJ=25'C
0.8 L VGS= 20V
","
f/ TJ =125'C - - /' IRF742,743'
,
f/
bv
04
1- ------
o
~
,,
~
/
\, \
...... ~
/ lo=10A 400
-'~s.J
0.85 t---j--I---t---t----j-.,-+--t---+--
/
20 40 60 G.gln() 5
...... 1'-0..
10
~
15 20 25 30 35
-r-
40
-
VOS (VI
0.75
-40
- - 1-- - -t---+---+--+--+\,-- --r--
40 80 120 TJ ('CI
II
o 10 0
-40 40 80 120 TJ I CJ 4 VOS (VI
_4/_6__________________________ ~~~~~~gv~:~~----------------------------
322
IRF 740/FI - 741/FI - 742/FI . 743/FI
L Ec
VARY t TO OBTAIN
r
REO.UIRD PEAK IL OUT
VGs = 1 0 V ! n
VDS - - - - i
,,
~J , ,,
E,=0.5 BVoss '... _-----
E(=0.75 BVoss
S(-0243
S(-0242
Voo
ADJUST RL
PULSE TO OBTAIN
GENERATOR .
:.................. SPECIFIED 10
12V
Ves
OUT
i
*. . . . . . . . . . . . . ~ ...
1.5mA
.JL -Yes
S(-0246
CURRENT
SAMPLING
RESISTOR
S(-0244
ISOWATT DATA
'"0.5
.,. 50
II ~
~ I- Ir' 40 .......,
Zth = KR thj ~C
k!t
::~
I-'"
1!;pr
6~ h
f:= -..flJl... 30 " i'..
, / i f=
10~ -t-J .......,
,~~,~
_ 20
"-
10 "
" I
"'- .......,
a
tpls) a 25 50 75 100 125 Teas.loe
_6/_6__________________________ ~~~~~~?uT:~~~~----------------------------
324
IRF 820/FI-821/FI
IRF 822/FI-823/FI
N - CHANNEL ENHANCEMENT MO'DE
POWER MOS TRANSISTORS
325
IRF 820/FI - 8211FI - 822/FI - 823/FI
OFF
V(BR) oss Drain-source 10= 250 p,A VGs= 0
breakdown voltage for IRF820/822/820FI/822FI 500 V
for IRF821/823/821 FI/823FI 450 V
ON **
VGS (th) Gate threshold voltage Vos = VGS 10= 250 p,A 2 4 V
lo(on) On-state drain current Vos > 10 (on) X ROS(on) max VGS = 10 V
for IRF820/821/820FI/821 FI 2.5 A
for IRF822/823/821 FII823FI 2.2 A
DYNAMIC
gfs ** Forward Vos > 10 ~n) x Ros (on) max 1.0 mho
transconductance 10 = 1.4
C iss Input capacitance 400 pF
Coss Output capacitance Vos= 25 V f = 1 MHz 150 pF
Crss Reverse transfer VGs= 0 40 pF
capacitance
SWITCHING
I r...-- 0
- r- ..- - 1 - -
-r- )--- -)---
0
10"~~E"lmll
Eo,o I
D.C: OPERATI N
10ms
li<~;0 l' - k!f=
Zth=KRthj-"c-
0
"-
10':~'I~ffll!II'00Ims ""'.,.-!.l"oIFI-ttttt-++.+tttIIt---+H JUL I'\..
G-0497
lolA) lOlA )
"
VGs=10V. --:::; lolAi 10VA VGs=7V
6.5V
~
s.sv TJ =12S 0
-..J
V' S.5V [ ___
lVV TJ = 2S
0
(-.......1Jj
I sv SV TJ=SSO(----lJ..
JV 4.5\r--- 4.5V
J.~J
4V ~
12 16 VosIV, 8 VGS IV)
so 100 1S0 200 VosIV)
327
IRF 820/FI - 821/FI - 822/FI - 823/FI
. /V ./
---
i-"""
6
I r-.... ~
'h
/' l./ V
~ 10-
T)=125C
- 5
/ 1.2
IRF822,823 "~
~,
,rt/ ! "\:
,/J
4 '0 (A)
2
,,-
/
10 12 14 lo(AI
0.6
o
25 50 75 100 125
1,\
TC ( ()
/ lo=2.5A
':::,.,.
II 0.75
-40 40 80 120 TJ nl
12 16 (lglnC) 20 30 40 Vos(V)
1.4
/
v 10' If~=150OC
V
1.0
I
6 V I TJ =25'C
. . . .v
2 10'
-40 40 80 120 T) (O() o Vso(VI
4/6
328
IRF 820/FI - 821/FI - 822/FI - 823/FI
VARY t TO OBTAIN
REClUIRED PEAK It. DUT
VGS = 1 0 V ! n
Vos - - -....
,,
~-I \
\
,
E,=O.5 BVoss ,-------
Ec=O.75 BVoss
S[-0243
S[-0242
PULSE
GENERATOR
f 12V
!
~. -................ .
1.5mA
FL
S(-0246 CURRENT CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
S[-0244
ISOWATT DATA
- 14
IIAI:~II~III~II
}
1= --- t--- f-
50
10~s
40
I 100~
30
........
1O-;~lmlll~IIEIi'..lm:;~m
~ '1 10ms 20
" ""'- ........
10
1---f-H-ttti+t-+--+++t-tIRF820FI/2Flp ill f'..
I III IRF821FI/3FI 11111
o l'....
1O-~'---=-OO----:'~'LLl.L; ----'-,----'--'-,.L1,L"---:02---:-'---'---!-",'-!--',.UJSVos(Vl
':-'-'-'0-;-"""1
o 25 50 75 100 125 Tcos.loe
331
IRF 830/FI - 8311FI - 832/FI - 833/FI
OFF
V(BR) oss Drain-source 10= 250 itA VGs= 0
breakdown voltage for IRF830/832/830FI/832FI 500 V
for IRF831 1833/831 FI/833FI 450 V
ON **
VGS (th) Gate threshold voltage Vos= VGS 10= 250 itA 2 4 V
DYNAMIC
gfs ** Forward Vos > 10 j\n) x Ros (on) max 2.7 mho
transconductance 10= 2.5
Ciss Input capacitance 800 pF
Coss Output capacitance Vos= 25 V f= 1 MHz 200 pF
Crss Reverse transfer VGs= 0 60 pF
capacitance
SWITCHING
_2/_6 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m~::~~Al--------------
332
IRF 830/FI - 8311FI - 832/FI - 833/FI
II
Jr.I"
60 r'\.
'\
..J..J. I- ....-:
50 I\.
J I-
~ "\
'i ~
40
~~.~ Zth=KRfhj-c
30
'\
r-
SINGLE PULSE 0=* f-
r-
20 I\.
.JlJL
IIIIIIII \.
-tj r-. 10
V
I' 4.S\
/ ./ 4.5V -TJ:12SoC _ _ .
-
/ V 25C
V V 125C
11/ V VGs =17
1// / f20V
1// / II
/JI V/
I~ VOs>iO(onlxROS(onlmax. V
./
III
II I-- r-"
10 15 20 lolAI
4 lolAI
20 1600
T(ase = 25C
VGS=OV- l - t -
f=1MHz __
t- t-
1.15
_ .....
5 120o 1.05
V
Vos=100V
Vos=250V ~V LV
0
Vos=400V k%;V 800 l' Cissc-- 0.95
........ V
~ 1\ V
5
/0 400
1\
.... 0.85
VGs=O
~ f"...
lo=250~A
/ lo=4.5A ~ Coss
t--
V ~ 0.7 5
16 24 32 Qgln() 10 20 30 40 VOS IVI -40 40 80 120 TJ ICI
1.8 f-- -
VGS = 10V
IO=2.5A
/ ~ T;-150C
./
I /
I 1/
/
1.4 l -
I /
/ 10'
r!J-150C
/J
1.0 t - - f-
1/
0.6 V I
I " TJ=25 C
V
0.2
/
10
o
III 4 VsolVI
-40 40 80 TJ lOCI
4/6
334
IRF 830/FI - 8311FI - 832/FI - 833/FI
Ec
VARY t TO OBTAIN
r
REO.UIR~b PEAK IL OUT
~J
\
\
\ ,,
E,=O.5 BVoss ,-------
Ec=O.75 BVoss
S[-0243
S[-0242
PULSE
GENERATOR .
:.................. 12V
f
.....................
1.5mA
J"L
S[-0246 (URRENT
CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
S[-0244
ISOWATT DATA
(j[-1}42V1
PtotlW)
&.0.5
50
II ~
~ r- ,.,
,., ~
Zth::KRthj-c
40
_6/_6______________ ~~~~~~?V~:~~~---------------
336
IRF 840/FI-841/FI
IRF 842/FI-843/FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
G~
e SWITCHING POWER SUPPLIES INTERNAL SCHEMATIC
e MOTOR CONTROLS DIAGRAM
N - channel enhancement mode POWER MOS field
effect transistors. Easy drive and very fast switch-
ing times make these POWER MOS transistors
ideal for high speed switching applications.
337
IRF 840/FI - 841/FI - 842/FI - 843/FI
OFF
V(BR) oss Drain-source 10= 250 pA VGs= 0
breakdown voltage for IRF840/842/840FI/842FI 500 V
for IRF841/843/841 FI/843FI 450 V
ON **
10(on) On-state drain current V os > 10 (on) X ROS(on) max VGs =10 V
for IRF840/841/840FI/841 FI 8 A
for IRF842/843/842FI/843FI 7 A
DYNAMIC
gfs ** Forward Vos > 10 ~n) x Ros (on) max 4.9 mho
transconductance 10= 4.4
Ciss Input capacitance 1600 pF
Coss Output capacitance Vos= 25 V f = 1 MHz 350 pF
Crss Reverse transfer VGs= 0 150 pF
capacitance
SWITCHING
0:0.5
~ 140
",
t--
II ~ 120 /--'"
t:/'(. I' 11
1~1=IRF8401 f-
100
6-IRF84
1 W
&=0.1
,.....
~ 80 " ",
/1 ,
lIuMIII'11
6=0.05
ffJ O(OPERAlIOH- -, 60
~TC'2S'(
-t'" Zth:KRthj-c
f-
~
s=-- I- 40 "-
1,6=TJ=150(
4 --RthJC= 1.0K/W
-SINGLE PULSE
Nl PlSE JUL l-
-t-J 20 ",
10-1 11'111 2 II 11,,,,,''1,111
10- 1 10
'r--.
10 0 ' . , '101 ' 20 40 60 80 100 120 Tcase 1C)
tp Is)
'olA ) )
'olA ) VGS ;10V
I~ ~
VGs ;10V
9V
-" ~,
16
,
9V
~~ J~ 16
JII
,
1---
8V
lV ~ 5V I Tcase=2S0( Vos>IO{on)xROS{onlmax. '/
6V
~ 12
j
1/
,rI
Tcase=2S0( 5V
8 8
/ J
2 ~
4 /J TJ;-55C
V 4V 4V TJ;125C~ VIl .- TJ;25C
/
8 Vos'V)
lAV
20 40 60 80 VDsIV)
6
1
TJ=l55'C- f - - r--
30
2. 5
----r-
r---..
r--. f".
........
lRF840, 841
2.0
VGS=10V)r'
V VGS=20V-
~
lj = 25'C IRF842,~3"""'" ........... r-...
6. 4 1.5 /
~ T J25'C V I"t\.
I
1.0
f---- ~
3. 2 /."",.
If I
1
5
o
1\ ,
12 16 10 (A) 10 15 20 2S 30 35 10 (AI 25 50 75 100 125 Tease!"()
/ .#
/
/
1.5 /'
V
.....v IJ =150'[
. . . .V VGs=IOV 100
F ;;<
I,
J =25 C
0.5
V lo=4.5A
I
1
o
-40 0 40 VSO(VI
4/6
340
IRF 840/FI - 841/FI - 842/FI - 843/FI
VARY t TO OBTAIN
RECWIRED PEAK IL OUT
Vos - - - . ;
\
\
\
\
,
E,=0.5 BVoss ,-------
E(=0.75 BVoss
S[-0243
S[-0242
Voo
ADJUST RL
PULSE TO OBTAIN
fq~~f:~~l~.~.... SPECIFIED 10
12V
Vos
OUT
!
...................
1.5mA
1L- -Vos
S[-0246
CURRENT
SAMPLING
RESISTOR
S[-0244
ISOWATT DATA
G-040/t GC- I
IDIA')~~IEIIIIII
)
9
:IF84 FI(1FI
6~O.5
'~RFs~FiiiFl P? ': 50
10\~'(.~< 10p' II
: IRF840fl/1fl ~ f- ~ 40
Zth;:KRthj-c
s=-Jt """-
~
f-"'
1~ 30
"-
10m?
6=0,0 JLrL i'...
OOm
6-0.0
6
-t;J 20 ~
10-;~IIIIIIII"llmll~
.........
IRF840FI12F I-l-t
III
7'
7U
1
PULSE
II
10
o
"-
\'...
f'-......
2
-:,----'--',--'-c,u.;,U,10
10- 1070
I
: -'10"2- : -,---'--:-,u..:-,'-:-"sVosIVl
IRF841FI13F
1-----:--'--'--!--',-!-L,
2'--,
tpls)
o 25 50 75 100 125 Teaselo
343
IRFP 150/FI - 151/FI - 152/FI - 153/FI
OFF
V(BR) oss Drain-source 10= 250 p,A VGs= 0
breakdown voltage for IRFP150/152/150FI/152FI 100 V
for IRFP1511153/151 FI/153FI 60 V
ON **
ENERGY TEST
DYNAMIC
SWITCHING
2 IRj'S,) 1m, r- 0
'\
60
40 I\.
20 I\.
'\.
20 40 60 80 100 120 T(ase (OC)
GU-1S01
lolA I lolA I
VGs =10V
~1It 8V 6V~ tt~ 8V
I
III
1-- W
V
16
9V ~ VI-- 7V/
.0
9V VGs =10V 25
VOS>IOlonIXRO lariinaxl
I/A V Tcase=2S0( Tcase;;;25(
II
j~
~ 7V 20
12 r-- i-~ -- 30
,r
III
r--
IV
5 fI
!J
1/ VV -- !---- 20
/
6V
10 III - TJ=125C
TJ=25C
--
/' flL
+iIIYV -- 4V IV 1--1--
!----
10 II, 'j TJ 1'-5rC
,
V I j VGs =20V r'I.\
1// VOS>IO(onlxROSlonlmax 0.0 6
./ vr '\~
10 20 30 40
I
I
lolAI
0.0 2 --
,./
40
- 80
V
120 lolAi
o
25 50 75 100 125 Tease(C
I VGs=OV
/ lo=50A
800 r\.
, i'-
-- ~ ~
0.85
lo=210~A
1/ 10
......
20
[rss
30
0.75
28 56 84 40 VoslVI -40 40 80 120 TJnl
/
J=l~O- 'I
//'
1.0
,/ -""11
10'
--
..,/ TJ= 5[
VGs =10V
6 --
-- -
lo=20A I
2
I
-40 40 80 4 V50 (V)
L VIBR) DSS
VARY t TO OBTAIN
REClUIREO PEAK IL OUT
VDS ----+
'\
'\
,
'\
'\
,-------
SC-0338
SC-0339
Voo +Vos
ADJUST RL
PULSE TO OBTAIN
fq~!,!~~~~9.~.... SPECIFIED 10
12V
Vos
OUT
!
..... ............ .
."
1.5mA
IL --C==J---4H._J--o - Vos
5[-0246 CURRENT CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
5[-0244
Tj - Tc Fig. 1
Po= - - - - -
Rth
from this lOmax for the POWER MOS can be cal- RthJ- C RthC-HS RthHS-amb
culated:
~
IOmax~
ISOWATT DATA
C-041
)
70
60
50
40
30
100~~.~tMI~.
20
1'\
or=: DC F
10
'\
f---f-++++H+ :~:~~~:;I~;;III+I++If---j-++--I++H- 1'\
o 1'\
o 20 40 60 80 100 120 140 Tcaselo
_6/_6_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~mg::~~Jl--------------
348
IRFP350FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
349
IRFP350FI
THERMAL DATA
OFF
ON **
10 (on) On-state drain current Vos > 10 (on) X Ros (on) max' V GS = 10 V 10 A
DYNAMIC
SWITCHING
350
IRFP350FI
6(-0445 -0681
::: ~
)
0.5
~
0.0.2 f-- 100
10 2
~ I-
:== 0,</,->0
10"1
0.05 IE ~ 80
10\
,-- v..~S\O~'\
I" 1OO~s
6.0.02
I.;
;:::
==Zt h::KRthJc
b =..!..
't'
60
:"
1~~~ ~ &'0.'01 Jl.D- "-
V f'
0
10 : "
10ms
10Q~
10"2 SINGLE PULSE
iiJ 40
i'-...
10- 3
10- 4 10-3 W2 10-1
II 100 Ipls)
20
50 100
""- "-
t"--
TeaseIO[)
G(-0493
,
G[-0491
lolA ) lolA )
1/ V6v
VGs =10V
r/f
8
/V 20H-H-+-+-+-+-+--+--+-+-+----i iYl
Tcase=2S0[ V 5V
6V 5
It' v 16 H-i--+-+-+-+--+--+-+-+--I-+---<
6
v J,V 1211--1---f-+-+-+-T'-",,~se::.;=2;:-5-"+[-+-+-+--1 0
Ii
W:V Vos>IOlonjxROSfonJ W
JV 4.5V
5V TJ.125 0 [_/i
~V 5
TJ=2~h
J TJ.-55[
,
2 4.5V 1--1--1--
3.5V 4V
IF 4V V$
VosIV! 50 100 150 200 250 VosIV)
12
IV /'
/
/V
/ ' ~V-
V"'-
--- TJ=25C
0C
0.5 VGs =10V
/
I
16
12
-- ............
.........
1[/
~V 0.4
II VGs =20V " 1'- "
Ih "\
4 11 VOS>IOlon)X ROS lon)max
hV
IL 3 \
..... ~ o
10 20 30 40 50 60 lolA) 25 50 15 100
10 15 20 lolA)
"" ""
Ciss
v,;
v,; V 0.95
/'
160 0
lo=1BA f-~f-
/'
/,~
1, \
I 800 "'- 0.85 VGs=O - - r--
I
"' lo=250pA
--
...........
II ............ Coss
.......
20 40 60 BO 100 120 UglnC) 10
r-
20
Crss
30 40
- Vos
0.15
-40 40 BO 120 TJ 1C)
2.2
?'
1.B - - I - - VGs =10V / 10 2 ~
lo=5A
/
1.4 V
/' 'TJ=150"[ VI
1.0
V
10
, . lj =25"[
0.6 .... V
" I
0.2 10 0 1/
-40 40 o 4 VsoIV)
L E(
VARY t TO OBTAIN
REO.UIRED PEAK IL DUT
r
VGS = 1 0 V ! n vDS - - -....
,,
~-I ,,
,
E,=O.5 BVoss ,-------
Ec=O.75 BVoss
S(-0243
S(-0242
Voo +Vos
ADJUST RL
PULSE TO OBTAIN
GENERATOR SPECIFIED 10 SAME TYPE
f Vos
12V AS OUT
DUT
!...... .. ......... .
.". ~
1.5mA OUT
~
S(-0246 CURRENT
CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
S(-0244
Tj - Tc Fig. 1
Po= - - - - -
Rth
from this lOmax for the POWER MaS can be cal- RthJ- C RthC-HS RthHS-amb
culated:
~
lOmax';;
_6/_6____________________~----~~~~~~~V~:~~~
354
____________________________
r.=-= SGS-THOMSON IRFP 450/FI-451/FI
~ .,L ~OOO@[g[L[~uOO@~O~ IRFP 452/FI-453/FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
355
IRFP 450/FI - 451/FI - 452/FI - 453/FI
OFF
"<SR) OSS Drain-source 10= 250 p,A VGs= 0
breakdown voltage for IRFP450/452/450FI/452FI 500 V
for IRFP4511453/451 FI/453FI 450 V
ON **
VGS (th) Gate threshold voltage Vos= VGS 10= 250 p,A 2 4 V
DYNAMIC
gfs ** Forward
transcond uctance
lf
Vos> 10 n) x Ros (on) max 9.3 mho
10= 7.9
C jss Input capacitance 3000 pF
Coss Output capacitance Vos= 25 V f= 1 MHz 600 pF
Crss Reverse transfer VGs= 0 200 pF
capacitance
SWITCHING
f= 200
"...
160 I"-
Zth= KRthj-
.=1R r-
,r- 120 '" "- "
1:
JUL ~
80
,10ms
10~ I"-. ~
OC
-tJ r- 40
'" ~
10-
IRFP45012-
IRFP45113-
mt 10-~0-5
11111111 IIIIIII10- \'-.,
10- 4 10- 3 10- 2 1 tpls)
100 68
101 6 '102 6 'VosIV) 25 50 75 100 TeaseIO[)
GL-0491 (-0493
,
lolA ) lolA I
VGS =10V
lI- /6v 'II
r----- IV 20f-H--t~---+--+--+--+-+-+-+-H
6V
h'f
Tcas e:=2S0( If/ 5V 5
6
/; V 16 H-t---t-+-+--+--+--+-+-+---I-J------l
J./ V 5
121I-1---t-+-+--+-T",,,\,,,-se----=;=2c-=-+[-+-+--+--1 a 11
1/// VOS>IOlonlxROSlonl ,W
J.~ 4_5V
5V TJ=125[-/h
~ /" 5
Tj=2~/L
l~ 3.5V 4V
4.5V I--~i-- TJ=-55[
357
IRFP 450/FI - 451/FI - 452/FI - 453/FI
16 V""" TJ=25"c
16
/'" I- ,...- -:;;':5[ 6
I ...............
12 / / ---:::
Lk(V
",..1-" VGs =lOV
/
12
...... - r-.....
..........
r-..... r-.....
IRFP450,451
f/ V
5
VI i'-l"
/1/
III Vos >IOlon)X ROS(on)max. 4
I~V
VGs =20V
IRFP452,453
""k"-r-0
r-.....
I~V
~ ~
j--.
10 15
-H- 20 10(A)
o3
o
.-.~
10 20 30 40 50 60 IO(A)
o
25 50 75 100
~
"
L
0 9/
800
o \
, \ ['... 0.85
/'
-
lo=13A
1/
28 56 84 112 Qg(n[) 10
.........
20
[rss 1'--'-
30
- 0.75
-40 40 80 120 TJ (OCI
40 VOS
2.2
18
VGS =10V. ,/
10 1 ~~
16s J5A
,/
14 ~=150"c (I
/
10 / 101 h 1) =25C
/
6
I ......
V I
2
10 0 /I
-40 40 80 120 160 TJ (C)
o 4 vsolVI
358
IRFP 450/FI - 451/FI - 452/FI 453/FI
L E(
VARY t TO OBTAIN
REClUIRltb PEAK IL OUT
r
Vos - - - - t
,,
,,
,
E1=0.5 BVDSS ,-------
Ec=O.75 BVDSS
5(-0243
5(-0242
PULSE
f-GENERATOR
................ . 12V
i
.......................
1.5mA
FL
5(-0246 CURRENT
SAMPLING
RESISTOR
5(-0244
Tj - Tc Fig. 1
Po= - - - - -
Rth
ISOWATT DATA
100
80
60
"
40 '" " ..........
100~111'11~i'lm'0ims
!= 100m ......
10- 1
c----t---HTttttt-+++1IRFP4S0FII:FI
100 2
I II
' 6 810' 2
IRFP4S1FI/lFI
'6 8
102 2 4
~
UC
6 BVDS(V)
20
50
'"
100
......
b.,
361
IRFZ20/FI - IRFZ22/FI
OFF
ON **
DYNAMIC
SWITCHING
VGs= 0
Vso ** Forward on voltage for IRFZ20/lRFZ20FI Iso= 15 A 1.5 V
for IRFZ22/1RFZ221F Iso= 14 A 1.4 V
trr Reverse recovery Tj = 150C 100 ns
time
Orr Reverse recovered Iso= 15 A dildt = 100 Np,s 0.4 p,C
charge
Pulsed: Pulse duration ~ 300 P.s, duty cycle ~ 1.5%
(e) Repetitive Rating: Pulse width limited by max junction temperature
See note on ISOWATI220 in this datasheet
)
rRFZ20 Ptot lW )
rRFZ22 10}J$
50
"- 'W(
IRFZ22
FF ~ 40
r---r-
I-- .-I ~
o~
:"
ms
---- kif-
f-
f-
20
"-l'...
~
f-
~
"
TC'2S'C
TJ.1s0C - ..nD-
r---
I--
RthJC=3.12K/W
SINGLE PULSE IGl !E-
III~IIIII -:
10
"
"
I
1 11111111 W2
10- 5 10-4 10- 3 10-2 10-1 10 0 25 50 75 100 125 Tease IO()
tpls)
~- v
;S( 1
11'/ Tcase=25(
20 ,1/1 " TJ =-55C
f-f-
Ii~ '-"
12 6V TJ =25C
If 5V- I--- 15 f 10
'
TJ =125C
f-f-
8 ~ ..-
5V
I / 10
4 11 "
V 4V 4V
1/. . . . II Vas> IOlonJxROS(onlmax
100
VosIV) 10 20 30 40 50 VosIV) o
-----------------------------~~~~~~~v~:~~~ ___________________________3_/6
363
IRFZ20FI - IRFZ22/FI
--
1--1- 'T:25C 20
0.25
/..- -I-I-- T =125C
~~-
// I--t-
0.20 15
-- ~ -...; :::;:.. to-.. IRFZ2
,
(/ 0.15 ~
II 10
VGs =10V V
IRFZ22
~
~
0.10
y '/
VOS>10(onlXROSlonlmax
iD=20A I J---+--+---+_.+--+--+---+-+--+---(
1 100 c,.ss
0.85
V 10 15 D.,(nCI 10
r--
15 20
I
25 30 35 VDS(V)
0.75 L..-...L----'-----'-_'--..L----'-_--'-_'--..L--'
-40 40 80 120 TJ (OC)
l'
1.5 / ~
'/
V
10' rtf- - TJ =-55C
TJ =25~
./ T =150C
1.0 /
/ VGS=10V
1-----
V IO=10A
V
0.5 0
-80 -40 40 80 120 1J (0C) 4 VSD (V)
VARY t TO OBTAIN
REO.UIRED PEAK IL OUT
Vos - - -.....
,, -
,,
,
E,=O.S BVoss \ .. _-----
Ec=O.75 BVoss
5(-0243
5C-0242
Voo +Vos
ADJUST RL CURRENT
PULSE TO OBTAIN REGULATOR 0
GENERATOR .
:.................. SPECIFIED 10
Vos
12V = O.2pF SOKQ G SAME TYPE
AS OUT
OUT S
! 0
.......... ,. ........ ,.
1.5mA OUT
..11.-.. S 10
-Vos
5C-0246 CURRENT CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
5(-0244
ISOWATT DATA
lolA) 0[0432/1
)
GCwQ414
: IRFZ20Ft
~]~tiffitti ~*~
10~s
50
, 1,6 1
1
111111'<-~-~1
,
10',
IRFZ10Fl
IRFZ11Fl
, IIi" 40
30
.........
20
r-....
~
10 '1--. i'-
o l"--.
a 25 50 75 100 125 Teas.'
367
IRFZ40 - IRFZ42
THERMAL DATA
OFF
ON **
lo(on) On-state drain Vos > 10 (on) X ROS(on) max VGs =10V 35 A
current
DYNAMIC
SWITCHING
VGs= 0
VSD ** Forward on voltage for IRFZ40 Iso= 51 A 2.5 V
for IRFZ42 Iso= 46 A 2.2 V
lOlA) u-
)
.,0.5 125
,~,~
'"'"
'4
10 2fRFirf
-=..b
il - :r
-
100
lO)JS
''ri.-t
~"FZ401'
,
100s
1m,
kJJ
11):0.1 ~ 75
o};:l:~ION ,r---
I'"
I
10'2 II .~~.OS
so --- --
~
Zth::KRthj-c
10m"s -
'"'"
&=-!f- -
'I-- I{~:-
~
100ms
PlS' .JlIL - 25
SINGLE III :
GU-1462
lOlA ) )
Te~se= ~5C
)
160
Tcase= 25C
VGS=10Y
//
160
I
VGS =10V
,,"""
9V
I-- VOS>IO (on)x ROS(on)max.
,
:;:.
-
120 ~
120
/" V //
-
8V
J
/ /"..,- /1
80
/V
8V 80
/ 10 ' II
. IJ - 10
40 ~ ?V ...... 7V
40 If"
7V
TJ =25C
A ~ ,....,""" 6V
5V-
~.
6V TJ --55C
~~ 4V
5V
10 I
4 VOS (V) 10 20 30 40 VOSIV) o 2 4 6 8 10 12 14 16 VGS IV)
Iv
./ TJ= 2~0(- -
TJ= 12S C
o
r-- 35
30
VGr~ c-- r--
40
30
" "-
~
IRFZ40
20
IRFZ4~
IIv"" I .-AI
r; 25
- VGS= 20'y
20 - 1 - - - - "'\
10
VOS
1
I
20
15 - -
10
I--V --
I
---
10
o
~
~
, --
--
40 80 120 lOlA} o 25 50 75 100 125 150 175 lolAI 25 50 75 100 125 150 Tcnl
VGS[V I
voltage
!
C[pF I
Tcase=2S0(
f=1MHz
(j[-0523
V[SRIOSS
[norml
voltage vs temperature
Vos=40V lda V
----:----- - - --_._---
10 \ 1.1 --4-4-+-+-+--+-+-+--+---j...4"'--1
~ V ...,.,.,,,,,."
2000
\ .........
"""- (iss
1.0 .--- -,-I---Y4.---"'--+--+--+-+-+--1
/ lo=64A
\ ~ _ .. - -- ___pL V
I----I-+-+--t--t--i-
/
II
1000
"i'...
.............
"""- ~rss
~ r--!--- 0.9 I-! "---I-I--=:J-
-.1- -1-'- -----'-1--
20 40 60 (1,[n[1
1
0.8 L--L--L--L--L--L--L--.L-.L-.L-J......-'--'
-80 -40 40 80
10 15 20 25 30 35 Vos[VI
1.50
I
V 10' /~~
/
1/ //
1.0 V TJ=150'[~V
Tr 25'[
'j TJ _55'[
/ VGS =10V 101
0.5
10 0
0.4
II I 0.8 1.2 1.6
-100 -50 50 2.0 Vso[VI
100 TJ I C)
Ec
Vas - - - - t
,,
,,
,
E,=O.5 BVoss ,-------
Ec=O.75 BVoss
5(-0243
5(-0242
Voo +Vos
ADJUST RL
PULSE TO OBTAIN
GENERATOR .
:.................. SPECIFIED 10
12V
Vos
OUT
!
..... .- ........... ,.
1.5mA
5L
5C-0246 CURRENT CURRENT
SAMPLING SAMPLING
RESISTOR RESISTOR
5(-0244
373
MTH6N60FI
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
GC-0420/f GC-0416
lo{AI
: I
,.
'=0.5
, ,--
~~~
50
a~
:== 4<::)r$~
-'" 10~s
100~s .~
II
- ~
40
"" ""
Zth=KRtnJ-c
',L , lms I 1~
I--"
~ S=-1f
= .J1..fL 30
10msF 6~ f=; ~
=-tJ
O.c. OPERATION
lOOms 6=0.0 20
"" ~
:
III
V
V
6=0.01
SINGLE PULSE 10 " "'-
IIIIIII
, os
IIIII 2 11111111 '-
Ip{sl
o
o 25 50 75 100
""
125 Teos.loCI
(j(-OS07 GC-050S
lo{A I lo{A I
~
lolA I V =10V
Gs
9V I~ V6V /11
~
, ~~ ~r
VGs =10V
9V 16 16
t-
8V
7V ~ ~~ I Tcase=2S0[ VoS>IOlonlxROS(onlmax. U
6V
~ 12 2
2 ~
j
l/ " Tcase=2S0(
,
I
J SV
8
4 A/-T =-5S
J
0
(
V 4V 4V TJ =12S 0 ( --t
VIL 1.-- TJ =2S
0
(
V lA V
8 Vos{VI 20 40 60 80 Vos{VI
~
\ Vos;100V,
Vos=250V
9.6 \
TJ"-55[- c-- -
5
2.0
YGS=10Y 7 YGS;20Y-
0
Vos;400V
~
6.4
TJ" 25"[
1.5
/'/ {f
If' T J25[
lO
./ ~
3. 2 I.",... I ~ 5 / lo;8A
r I 0.5
II
\
12 16 10 (A) 10 15 20 25 30 35 10 (A) 20 40 60 (lg(n[)
V
VGS"IOV
lo;4.5A
== ;;0 J ;25 C
0.5
I
1
o
-40 o 40 80 VSO(V)
376
MTH6N60FI
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1'
vI ',
10'/. 1
I
1
Voo
3.3
~F
I
Pulse width ~ 100 J1.s
Duty cycle ~ 2%
SC-0008/1
:. - 6059 'd(off) 'f
Vee
1.8KIl
::CJ:: (-.~,~-'----'
..
PW
...i
PW adjusted to obtain required VG
Tj - Tc Fig. 1
Po= - - - - -
Rth
from this lOmax for the POWER MOS can be cal- RthJ- C RthC-HS RthHS-amb
culated:
~
lOmax';;;
379
MTH40N06 - MTH40N06FI
OFF
loss Zero gate voltage Vos = Max Rating x 0.85 250 p,A
drain current (VGS = 0) Vos = Max Rating x 0.85 Tc= 100C 1000 p,A
ON *
ENERGY TEST
DYNAMIC
SWITCHING
6=0.S
ISO
10',
r-- - ~
,;)f'
~~~\~~
12'" ..- ~--"
~
\\
- 1,...00
"
~
120 '" '\
,"-
\
~
--
1~ i'-
.;'
"- 0
1m, S:o.O
" "
r-.., ....
Zth=KRth/-c
""","-"-
S =..!2.
~ 10ms 8=0.0 1:
60
lOOms / JLfL
oe\\
S=O.OI
SINGLE PULSE
0
i'-
~
,
II
VosIV)
10- 2
10- 5 10-4
11111111111
10-3
1111
10-2 10-1 Ipls)
,"-
IIIAIS 0
10V/ 8VV~;::" lilA I f-8V 10V
./ L ~~
...- H+--f-+-Jf-+---Ir-I Tcue =2S0( I-+-H-'r-Ir-Ir+-ir-l
0 H+--I-+-I-Hr-I tp=300~' I-+-I-+-r-Ir-Ir-Ir-Ir-I
TclU =2S0( V V/ ,/ i 7V 30 t-t-+-+"VC-=-:!;2S;t++t+-t-+-1I11+1-I-+-++f-l
0
-
tp=300ps
/ ~V ...- l-
.51
7V
~ ~ Vfo"'"
-
20 t-t-t-t-+++++t+-t-H1r+-I-+-+-+-f-l
0
J~ ~ 6V
~V / '
. ~ !% ~
S'V
0
~~ V 5V
~ V...4.SV
-------------- ~ ~~~~m~::J?Al----------'-'.--'-----'-'--'--3-/6
381
MTH40N06 - MTH40N06FI
IO~40A
24 f---r--t--'---t--t---,f--+- r - I-- 15
---
TUH =-5S o C
0.028
/
Vos=20V"
~/
Vu=tOV
/ 10
g VZ 30V
-- 0.027
~'V'/
2SC
V 60V
12 'I / 125(
.... v
0.026 5 1
V 1
0.02 5'
1
1/
10 20 30 40 ~1A1 40 80
10 20 30 40 50 ~IAI
--- -
I /
150 0
o \
"- '-..
r--
~ ---~vLc _ ,_
90 0
60 0
0
'\
..........
"'-
~
--
-
Ie.
c,..
.....
t--
:--
0.8 f--+--+--+--+-+---t-l--+--+--l 0. 95 r---t7'/'--t /-r-I---I--+--+--+--+--l
30 0
0
10 20 40 VDSIVI -50 50 -50 100
, / ....",1' I
0.7
,. J
0.6
II
50 " 50 100 150 TO
,1CI 0.4 0.8 1.2 1.6 2.4 2.8 VsolVI
4/6
382
~ ~~~~m~::~~~~ --------------
MTH40N06 - MTH40N06FI
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r-
----~90.1.
vI ,
,
10", I
I
I 90".1
Voo
3.3
r
~F
I I
5-6059 td (off) If
S(-0008/1
Pulse width ~ 100 p,s
Duty cycle ~ 2%
V(BRlDS5
Voo
10 2200
~F
3.3
}IF J ,;
,; ,,
VI_I1- I ,;
1<:..-_ _ _- - ' L_
u
I
SC-0316
Pw
5(-0317
1.8Kll
:CJ: C~~,--c==r--t
PW ! 1Kfl.
....
PW adjusted to obtain required VG
Tj - Tc Fig. 1
Po= - - - - -
Rth
from this lOmax for the POWER MOS can be cal- RthJ- C RthC-HS RthHS-amb
culated:
~
IOmax~
ISOWATT DATA
) GC-0417
70
I 1111
60
102,
f-t- -} '-1- 100~s
50
~<}~<!jo
, , 40
10ms
30
101 lOOms
20
10 "-
I"
o I"
o 20 40 60 80 100 120 140 Tcos
_6/_6 _ _ _ _ _ _ _ _ _ _ _ _ _
384
~ ~~~~m~\JT:~~~ --------------
MTP3N60
MTP3N60FI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
PRELIMINARY OAT A
385
MTP3N60 - MTP3N60FI
OFF
ON
DYNAMIC
SWITCHING
'~
cr ..... ~
so
40
'\
'"1'\
100~s
I
1ms ~;oo
~O1
Zfh=KRthjc -
30
-.
SJNGLEPUlSE
S:"* -
- 20
10ms J1JL
o.c. OPERATION
11111111 I
103
100ms
VDsIV) 2
III ilill
11111111 ~ll
10
20 40 60 80 100
" '\.
120 Tease I'CI
IDIAI VGS=10V/
/ lolAI t--VGS-10V s.OV
lOlA
) VOS>IOlonlxROSlonlm ax I
Tcase=2S0[
/V sV
~
V 4.5,
/ 4.0V
4.0V
/VV I
f/ ~
VoslVI 100 200 VoslVI 1 2 3 4 5 6 7 8 VGS IVI
/ /"" 25'( 20
/ V .- 125'C
II V VGS~17 15
II J / hov Vos~100V
Vos~250V k% V
1// / If Vos~400V k;%V
/XI I!/
10
gv
III VOs>IOlonIXROSlonlm". V L:~
/I
4 lolAI
-f-
- L./
10 15 20 lolA)
V
/
16 24
lo~4.5A
32 Qgln()
VV -~
f~1MHz_
t-- t--
1200 1.00 H--HH-+-t--P'kt--H-t-H--HH-+-H 1.05
L
V
BOO l' Ciss 0.92 1-+-H-t-H--HH-t-t+N--H-t-+-+-1 0.95 .... V
1\ V
\
400 VGS~O
..... 0.B4 H--H-t-M-t-H-t-t-t-t-+-H-t-+-+-1 0.8 5
~ ~ ~[oss
lo~250~A
~ 0.7 5
10 20 30 40 VOSIVI -40 40 80 120 TJ I'C)
-
ROSlon) ISO IA )
Inorml It Tr 2S'(
1.8 t-- -
VGS~10V
IO~2.5A
/ ./
TJ ~150'(
/ 1/
/
1.4
/ 10'
TJ~150'(
II
1.0 /
/ I
If'.
TJ=25 (
0.6 V I
0.2
/
V III
-40 40 BO TJ n) 4 VsolVI
4/6
388
------------,.-- ~ ~~~~m~1r~:~~~ --------------
MTP3N60 - MTP3N60FI
Switching times test circuit for resistive load Switching time waveforms for resistive load
____ ~90.'.
vi :
: ;10".
.:- 1
I
I
Voo I
3.3 1
~F
I
-Vo :
I !
1.8Ktl
389
MTP3N60 - MTP3N60FI
ISOWATT DATA
........ 50
~ Ii ~
:~ <J::.<::>~~(.;;-
J=
r-- luI's
~ -..... ..... 40
, ~
Zth=KRthj-c
:
/
1001'S
lms lrrtr "" 6=-Jt
30
i'
~ JUL '-..
10ms[ S:o~
--tJ .........
.
1 D.C. OPERA liON
lOOms 1,.ooo'.Y!'
l..ooo'Yi'
~
S~O.OI
20
10
" ~
11111 1111
rfmMTI " ~
111111 11111111 II 10- 2 o
a
468 '1 468
10 4 10 3 10 2 10 1
100 tpls) 25 50 75 100 125 Teas.lo
391
MTP6N6.0
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
W-i~
- 6:0.5
1'\
-
f~ I, ,
1 II 120 -" "\
== 4-~q9 10~s 11 - 100 "-
100~s
V lms
0
'"""
/ 10m~ .
0
"- I'\.
I-
lOOms 0
"t'-..
O.c.
II
OPERATION
II~II
10' 10'
t VoslVI
0
20 40 60 80 100 120
"J"....
TcaSe I Cl
lolAI
~
, lolA I V =10V
Gs
9V
~0 ~,.
:~~
lolAI
J II
-
VGs =10V
9V
8V
7V ~ fSv - 16
I Tcase=25(
16
VoS>IO(on)xROStonlmax 1/
6V~
12
I 2
I
J
/
~
TCClse=2S0(
,
I
I SV
8
fj f-TJ=-55(
2 4
'/ 4V 4V TJ=125(~ 1ft ~TJ,2S0(
V (hI'
8 VoslVI 20 40 60 80 VoslVI
- _____________ ~ ~~~~m~::~~Jl--------------3-/5
393
MTP6N60
-
0.84 0.85
~ ............ Cos s
....... Crss
0.76 0.75
5 10 15 20 25 30 35 40 45 VOSIV) -50 50 100 -40 40 80 120 T) ("C)
/ -'
/ L
1.5 /'
V
LV
~
1) JI5O"C
V VGs=IOV
::== ) =25"C
,/ lo=4.5A
0.5
1
o
-40 D 40 VSO(V)
394
MTP6N60
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90.1'
vI ',
101. I
I
I
Yoo
3.3
~F
I
Pulse width ~ 100 ps
Duty cycle ~ 2%
5C-0008/l
5- 6059 td (off) If
1.8Kfl
:CJ::: (..r~,-C=:J---L
PW i 1Kn.
....
PW adjusted to obtain required VG
397
MTP1SNOSLIFI - MTP1SN06L1FI
OFF
~BR) oss Drain-source 10= 1 mA VGS= 0
breakdown voltage for MTP15N06L1FI 60 V
for MTP15N05L1FI 50 V
ON **
DYNAMIC
SWITCHING
K~_ Ptot lW )
-
S=}~
~:i I, 10~sr-
70
" l\.
10', 1- i'
100~s
60
50
'\
I\.
1ms - '\
40
~~_ERATION
T(=25'(
10ms'-
30 '\
20 '\
MTP15N05L 10 "- '\
I
MTP15N06L l\.
20 40 60 80 100 120 Tease lOCI
lolA) H-:+++++-+-H---+rH-:+-+-+++-+---H
f--JFJf-+-+-+-+--+-++++-+-J.---H-H3Y
YosIY) 16 lolA)
____________________________ ~~~~~~~~:~~~---------------------------3-/6
399
MTP1SNOSLlFI - MTP1SN06L/FI
I (rss I-t-t-
l2 1.15
~ i-- ,/
.......... ........................ 1.5
0 '-.... lOS
/
..........
"'- ........... . . . v- V
............
8 I'-.. 0.95
V VGs=O
/
Vos=VGS
........... lo=250pA 1.0 /
)--- r-- lo=1mA V VGs =5V
lo=7.5A I- --
O. 6 0.85 /
,;'
I
4 0.75 0.5
-50 50 100 150 TpCI -40 40 80 120 TJ (OCI -80 -40 40 80 120 TJ I ()
,
I
10' rtL- - TJ =_55C
TJ =25(
TJ =150C
0
10 0 4 VSO (V)
-4/-6------____________________ ~~~~~~~ITT:~~~'
400
____________________________
MTP15N05L1FI - MTP15N06L1FI
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'J"
VI '
,
10"/. 1
I
1
Voo
3.3
~F
Voo
1.8KO
:CJ: C.....~,----r-~-----'
PW i
.....
PW adjusted to obtain required V G
ISOWATT DATA
50
40
Zth:KRthjc
&: -tt
i"'-.
O.L OPERATION " -
",-' I'-
1m+
10m,
lOOms
10-1
mm,=&j 30
20
.........
f'-.
MTP15N05LFI- III
10 " "I--..
f'-.
MTP15N06LFI-
~ III o r-.....
'10
' VosIV} W' 100 tpls} o 25 50 75 100 125 Teas.loC
6/6
------------ ~ ~~~~m?1JT:~~~ --------------
402
MTP3055A
MTP3055AFI
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
G~
speed switching circuit in applications such as po- INTERNAL SCHEMATIC
wer actuator driving, motor drive including bru- DIAGRAM
shless motors, robotics, actuators lamp driving,
series regulator and many other uses in industrial
control applications. They also find use in DCIDC
converters and uninterruptible power supplies.
403
MTP3055A - MTP3055AFI
OFF
ON *
DYNAMIC
SWITCHING
&~O .",...
r - ,.... 'Y 1- o~ 60
10' 1::=1= b~
1'.
I
~ .,.
~ r-
50
LjJJ""
6 i==t=l= -.;~
~~~
f------ 00,
r--
f------
',
lOT' 10~
ct ~
r--..
"'-
'*
[p~ .0 ph=KRthj-
~
........
..'
o.t OPERATION -~ I-
&~ . - - &~ r- r-....
t:;;; - - JLrL r- " r-....
~NG E
-
RB I-
20
10
......
.....
iI
......
, I
""
10-2 I11111
a
10-5 10-2 10-' 10 a 50 100 Tease (O()
Ip(sl
1r
Io(AI 20V_ IO(A)
r-VGs=7V
10V 6V I-- t= TJ =-55[
16 :~ / III /'
/,y
/I 10
.--1--
I rI /'
lA~ b- TJ=-55[ V .---1--- r--T -125[
T =25[
12
IIJV
rJ)
T( .. ~e=25(
IJ~ I'--r----- TJ=25[
TJ =125[
1-1- 8
/ /V
.t~V
--I--
- 5V,-- f------ 10' c-I- 6
t f'/
,v ...
1/ 4 II
L
III 4V 2
Vos> 10(onl xROSlonlmax
VoS>IO(on)xROS(on)max
100
II
Vasty) o 10 20 30 40 50 la(A)
-----------------
51
'JI,.
SGS-THOMSON
~U[;Iiil(Q)~Ib~~"U'OO(Q)II(I]U~~
_ _ _ _ _ _ _ _ _ _ _3_/6
405
MTP3055A - MTP3055AFI
600 1\\
)--'--
lo=12A f=1MHz
0.25
I\, ' Vus=OV
16 I
Vos=25V 500
0.20 'l./ t.. I
!,-, ~ \"
-
4BV [.
12 400
35"./.~ \.
0.15
~ I
~t:7 300
'\
0.10
Vus=10V V /.'// 200
" --L
[O<S
/ V I
~- L " r-..
00 51--
f--
-l- Vus=20V
V
100
-- (rss
1.
I
10 20 30 40 50 lolAI 12 16 10 15 20 25 30 35 VosIV)
1.21--I--+---+-----i--1-+--+--+-+-----I 1.15
I..-
1/
10)--- -~---+-----+----+--I-
- -.................... 1.05 ...- ,.,.... 1.5
V
--
-
---I--~-~~-r~~t--+--_r-~
........... b-.,
v'- /
V V
O.B --)--- -.. --L-I---t-I---
.......... c--l- ~........
-+......... 0.95 ~ Vus=O
lo=250)lA /
Vos=Vus ~ 1.0 --'
- - , - lo=1mA j----t--r-t-t-----t--1 V VGS=10V
f---
/ IO=10A
0.6---
- 1---
1- -- 0.85
/
i
0.4 0.75 0.5
-50 50 100 150 TJIO[) -40 40 80 -80 -40 40 80 120 TJ ( [)
I
1ft-- -TT =25[
=150
J
0
[
4 VsoIV)
4/6
406
MTP3055A - MTP3055AFI
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1'
vi :
10". -I
I
1
Voo I
3.3 1
~F
I
-Vo :
I I
5-6059 td(ott) If
Pulse width ~ 100 p,s S(-0008/l
Duty cycle ~ 2%
Vee
12V
1KA
1.8KO
:CJ:: ~_o+~,-C::::::J--L
PW i 1Kn
--
PW adjusted to obtain required VG
~ ~~~~mgr'~:~~a;~ ______________5_/6
407
MTP3055A - MTP3055AFI
ISOWATl DATA
GC-0414
~- I
6"0.5 -
iI'" 50
101, F- 1
-
"-, ;. ~ """. / Zth=KRthj-c
40
:~~J'
I-- 04:"" 100~sl-+-l-'f-thlfli<,,:--b<++'IoI-t-tti
~ ~ &=-Jt
30
J1IL ........
m
~~~s rr--1=r=f1'ltlt--J-xf---M-1-ItHl ~
~
I-- /
-tJ
'=0.05 i-
111111 --
2
'"
0 O '=0.02 ~, 20
6=0.01
10 MC
SI~PULSE
IIIIIII II 10
b-.
........ ,
I"-.
2 !IIIIIIII o
o 25 50 75 100 125
b.,
TeaseloCI
409
SGS30MA050D1
THERMAL DATA
OFF
ON*
DYNAMIC
SWITCHING
INDUCTIVE LOAD
td (on) Turn-on time Voo= 250 V 10= 15 A 120 ns
(di/dt)on Turn-on current slope Ri= 50 n Vi = 10 V 100 A/p,s
td (off) Turn-off delay time 1.5 p,s
tf Fall time 300 ns
t= 15=1
IIIII
.... "" 15=0.5 /" 400 H-t-k:++++-HI-I-t++-t-++++-H
102 r-..:- ,.i..
:~
,I---
0~'\
'Q,.~"\O~
..... "-
100ps - 15=0.2
/1 Ith, KRthJ-c
Irl
Ii 300 H--H-++-PoI:-H-+-\--t-+-+-+++-+-t-l
10
'
:
,/ r-- " 10-1
S =.!.2.
1: ffi ,
~
--.JlJL -+ u, , 200 H--H-+++-+-+-I'-f'IoJ-t-++++-t-t-t-l
10 0
: ' O.c. OPERATrON
I' O.ls
w' 6 6
rill
rllill
1111 lUI~1 I 10- 2
IIIJIII 10-1
lu'
tp(s)
10 0 10 102 Vos(V) 25 50 75 100 125 TJ(O[)
'
84
IO(A) lo(A) 91,(5)
I I I '1/1
60 f-t- T =2S0[
J
VGs =10V
I? ...... ~~ 50
"
'I
25
TJ=-55( [----
~
~,.... 5.5V
40 I 20 we
I Vos=25V
1/ / ......
[---:--
I
40
v.; ...... 5V 30
I 15
,/ ...- 125[
~' I
I
A ~
,.... 4.5V 20
Tj=125{ 1/1 10 V
20 i# I
25[ )JL Vos=25V
I,J
V 4V t- 10
VI _55[
I 1I11
~ lSV A/V
10 12 Vos(V) 10 20 30 40 50 lo(A)
-50 50 100
80
60
40
20 125[ rj ~ 25[
_4/_5_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m~::~~lt
Ai')
SGS30MA050D1
Test circuit for inductive load switching and diode Diode reverse recovery time waveform
reverse recovery times
ISO
r A
A
iFA5T DIODE
2SQ
LB Vee
- )
3.3 1000
jJF JlF
S(-0162
S(-0163
Voo
lKA
:Cl- CO+~,---C=:J--t
PW l lKn
....
PW adjusted to obtain required VG
413
,.~ SGS-1HOMSON
~L [K'll]DOO@rn:[!J~uOO@~D~ SGS35MA050D1
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR MODULE
415
SGS35MA050D1
THERMAL DATA
OFF
ON*
DYNAMIC
SWITCHING
lolAi
: == 8-,
F'" 8-05
400 H--t--k:++++++-H+-t+-t-+-l-l-H
,~
11I1 . .-<; -- U-
!~ ~ 0~
I - ~~;J~\.o~
8=0.2
I
..... 300 J-t-+-+++--+*+++-++-++-t-+-t-+-H
I .....
,,"t.-I 'ms /V Zth=KRthj-c
8 = l.
I
: ,Om 1:
.....
'OOms JUL 200 J-t-+-+++++++--N+-++-t-+-t-+-H
,0'
: OL OPERATION
~
/ SING LE PULSE
iiJ 100 J-t-t-++-++++++++-+--r-cl+-t-+-t-j
i
IIIIIII I IIIIIII
,, ,IIIII
, I
, "
w' tplsl
25 50 75 ,00 125 T,IO[I
,0' VosIV:
lolA) lolA)
6V fl I
VGs =1OV/h 65V TJ=-55'(- II I
50 50 1--1-- 25'( 40
I( 1
40
J 55V 40
1'125'(
32 lJ=-55'( r--r--
/1/ 25'( r---
fj TJ=25'( ,/
30 30 24 125'( r-r---
h 5V V Vi--""
20
ltV 20
Vos=25V
16
IIY I
'V l I '/ I
,0 ~/ 45V
10 III 1/11 Yos=25V
II f/, Ilf I
IV 4V IJI/ ru I
12 ,6 20 VosIV) 10 20 30 40 50 lolA)
____________________________ ~~~~~~?V~:~~~---------------------------3-/5
417
SGS35MA050D1
1/ 6000 1-IIt-+-t-l--+-+-H:+.L..J.---LH-+-t-l--+-+-I
15 0
V
7
v I
1/
13 0
1/ I
V
IL I Vos=250V
lo=35A t--t--- t--
2000 H'\k1-+H-I-H-+-I-"l-t-++-i-+-I---I--j
v II (05S
0
20 40 60 lolAI 100 200 300 400 IlglnCJ 20 40 60 80 YoslVI
H-+-l--+-.,j.<q-+-1I-+-++-Iy Gs =10V
0.5 H-+--I4-+-++-1I-+-+-I--Ilo=17.5A
0.8 H-+-t---t--H-+-t-+t-++-1I-+-+'I.ri-f----H
-50 50 100
60
60
40
20
TJ=125[
~~ 1'='25[
4/5
418
SGS35MA050D1
Test circuit for inductive load switching and diode Diode reverse recovery time waveform
reverse recovery times
ISO
A
r"
d
A
G ~0 HOS DIODE i FA:>r DIODE
2SQ
S a La
Vee Vee
3.3 1000
jJF jJI'
SC-0162
SC-016J
Voo
::CJ: C~:,--t:==r---t
PW
...! IKfi
____________________________ ~~~~~~~~~~~---------------------------5-/5
419
SGS100MA010D1
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR MODULE
421
SGS1 00MA01 001
THERMAL DATA
OFF
ON*
DYNAMIC
SWITCHING
422
SGS1 00MA01 001
IO(A)
= 0-1
Zlh;:KRthJ-c
lmsr- / i
b =..!.2.
1::
'\ I
1'\ 10ms ~ 200 f-+-f-+-+-++-+++-N--+++++-+-+-i--j
10'
IIII
IIII
IIII
IIII
I
I
ilill[ I 10-'
1111I11
W, tp(sl
!
lo(A)
-. IO(A) -.
VGs =10V TJ=25'[
I '/
TJ=-~;:~~ 1J,1f
200
B.5V 160
, 71 60 t-t----t---t-+---t---t-+---t---t-+-t-----t-+-t-----H
160 JY 8V
{/ 7.5V 120 Il' 125'[
~/ 7V Vos=25V
120
'/
lL
6.5V
80 II
80
V/
6V
5.5V
!J v
40 1'/ 5V 40
iff
~/ 4V 4.5V #,
v.I '/
5 Vos(V) 40 80 120 lo(A)
8 VGs(VI
I 8000
12 Vos=50V 1........ --- [iss
lo=100A ./
- 10
6000
,\ TJ=25[
f=lMHz r----
~--+-+-+-I--+-+-+-I TJ=25[ - - c - I -
~-++-+-I--+-+-+-I VGs =10V --r---I--
4000 \ VGs=OV
\~ (oss
I \
II
II
I
200 0
'I--. Crss
1.5 H--H-+-H--I-+-+-H-+-+---MH--I-+-H
0.9 H--H-+-+-+-H-+-H-N+-iH--I-+-H
0.9 f-b-H-+-+-++-+-+-+-++-+-+-+-++-++-i 1.0 H-+-+---t--H-i7Iq--H---H----t--t-++-+-+-l
0.8 H-+-+-+-1-++-++-I-++-++-I---+,,<-+-H
0.8 L.L--'-'---'---L..L..L.J.--'---L..L--'-'---'---L..L..L..L--L.J
-50 50 100 -50 50 100
",::
TJ=1500[
i1"'~ ""25[
10'
I
vGs=o
/
10' / II
o 0.5 1.S VsoIV)
_4/_5 _ _ _ _ _ _ _ _ _ _ _ _ _
424
~ ~~~~m?::~~~~ --------------
SGS100MA010D1
Test circuit for inductive load switching and diode Diode reverse recovery time waveform
reverse recovery times
IsO
r A
~:- La
A
iFA~T DIODE
2SQ
Vee
3.3 -1000
/IF JIF
5(-0162
5(-0163
Voo
::CJ: Cot:,-C=r--t
PW
...i lKn.
427
SGS150MA01001
THERMAL DATA
OFF
ON*
DYNAMIC
SWITCHING
lolAI GC-0816
:P.~ = 5_1
.;J'
~~'*;.
100ps
- 5_0.5
...i-
400 H-t-k+++-t-Hr-+t-+++++-H-H
V- " 5=0.2
Zth:KRthJ-c
300 H-r+++-t>II:+-+-+-,f-+--r+++++-H
1ms /t'
s=lZ
-C
"- I
"- 10ms
JUL 200 H-+++++-++-t--p..H-t-+++++-H
10'
GC-0848
IDIAI lolAI 9.,15 I
TJ"25'[ I 'j ~
VGs =10V I
250 ----'" b 9V 1--1--i-- B.5V I--1--1-- 200
TJ =-55[ JJ j I
I
l-
200 V BV I
25[ ,flY 60
TJ =-55'[1-
r 7.5V 150
Vos=25V rtj I-"'" 2S0[
/J,
150
-r""
iy
7vI
6.5V
100 f 125'[
40
/'/
/
/
I-"'" 125'[ --
100 L 6V I
j II.
/'/ 5.5V
/1 20 IV Vos=25V
I.r" 5vI 50
50
""..-
v
4.5V
4V
VJ
V 11/,'
10 VDslVI 40 80 120 lolAI
3/5
429
SGS150MA010D1
I
I 2000 H-++-+-f-i"'-kl:+-1H-++-+-1H-++-+-1
I
100 200 lolAI 100 200 JOO 400 G.glnCl 10 20 JO 40 VoslVI
1.5 H--HTf-++-+-+--,f-++-+---vF+++--H
0.9 H-++-I-f-+++-+-H--M-I-H-+-l----H
0.9 f--b.f-t+-1-+t++-1-+t++-1++-++--i 1.0 H-+-++f-+-br4--f-++-++f--I-+-+--H
0.8 f-++++-1-+t++-1-+t++-1-PH+-1
-50 50 100
.::.
~
TJ =150'[ lI':L 25'[
10 2 1/1/
II
VGs=O
IL
II
I
10 1
0.5 1.5 VsolVI
_4/_5_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?::~~CG~
430
SGS150MA01001
Test circuit for inductive load switching and diode Diode reverse recovery time waveform
reverse recovery times
ISO
Vee
S(-0161
Voo
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
I K- _ _ I
lO~sf-
,, 20
d~
$"
I
r-...
10ms
lOOms
D[ I '" ~
10- 2 10-' tp lsi
o
o 25 50 75 100 125
'"
T,... (O[)
'0 '0
(A) (A)
Vos .zsv L-+---+-++-1-+-t-It---,l-++--+-i
80"sPULSE TESTt--+-++-t-b~--+-i---H
/. Tc ,S"""C++-+--H-++++-+-1H
H-+-+++++--H-+-'f-H'f-!=:=;:.:=15.C
--55-<:
H--t-tJM7't-+--t--+-H-++++++6V 6V
SV
4'1
____________________________ ~~~~;~?~:~n---------------------------3-/5
435
SGSP201
H-+-+-+-+-+-H-++-++-+-++-I-SSOC '0=2.54
16 Tcase =2SC
./
1.2 H--l-I-l-+-+--HH-+-+-+-H-+-:IA--H-I 12
20Y
1/ ../
VOSc50V
1-Il-+A-+-+-+-H-++-++-+-++-I,2S oC
SOY
V V/
10
1.0 to H-+-+-+-+-+-I-7I"++-1-+-+-+-+-I-++-1-1
1\ (iss
H-+-+-+:..t<+-+-I-++-+-l-lVGS=O
H-+--l>+-+-+-+-H-+-+-l-lb=250jlA
0.83 0.9 1++---1-1-+++-1++---1-1-+++-+-++-+-1
(05$
2.0 H--HH-++-+-+-+-H++-+-+-t-+-H-i
VGS=O
436
SGSP201
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1'
vi :
10'1. I
I
I
VDD I
3.3 I
~F
I
-Vo :
I I
5 - 6059 'd (off) 'f
Pulse width ~ 100 /1-S SC-0008/l
Duty cycle ~ 2%
V _
D
2200 3.3
JAF JAF VOO
-----,
,,
I
SC-0310
Voo
lK.n.
1.8Kll
::CJ: (_.-!~,-t::=.JI---L
PW ! lKD.
....
PW adjusted to obtain required VG
5/5
SGSP222
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
439
SGSP222
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
_2/_5_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~;m~::9Jl--------------
440
SGSP222
lolA )
J
10~s
50
0f1-"""
<i-';'>~.'-' " ... 100~s
I" "'-
100_~ 40
I"
~
lms
....
~ ....
10ms
10_1o=0.ill!1--": ~
7;.h
i--""0",,=0!!l'.2Af-I-"-bI-~~~rl+tltI\ Z~h: J
-C
30
"1"'-
""I"
100m
20
DC
-ttJ 10
1
I
I 11111111111
o
"- ':\
10 2 10 tp Is)
VosIV) ' o 25 50 75
(~I I-++:Vo.l...s=--!c2s::!v--+-I-++-++-+-+--t-+ll-cII-".:y."-H
16 ~ Tca..=2S'C Ic':-:+-+-r-+-+-+++-l 16 1-++-80-t-"-rSPU---r-1lSE-t-TEr-STt+++-=t-=tl:lI~,,+-V'-l+--i+1
8O",PUlSE TEST:"'++++-J.,,"v-H
8
12 fV-+++-i--+-+-++++-+-+-r-+-+-+++-l
6V 10 1-++-++-++I-++-++-JjrH-I-t-H-t-H
5V
441
SGSP222
IpFI \I VGs=O
VIBRlOSS
Inorm)
H-+-+-+--I-+-H--I--H-t-t-+-t-I-t-t-t-I
H-+-+-+--I-+-H--I--H-t-t-+-t-I-t-t-t-I
,U f ='MHz
H-++-H-+++-H--l VOS=VGS
700 1\ 115 IO=250~A
600
'1\.
500
\ 1\'i'-...... --- 1.0 H-++-+--I-+--f"lkl-+-+-+--I-+-H--I-t-H 10 H--\--l--l-++--b-f"4--+-t-t-+-++-H-H-I
\ \ --r-. f-- Ciss
300
"r---... 0.9 H-+-+-+++-+-H-+-t--t-i VGS =0
"- i
I-- r-
~ 0.85 H-+-+-+-t-+-H--I--+-+-+-t-+--t-1-....t-t-H H-+-+-+++-+-t-++-t--t-i IO=250~A
crss)
1
1.5
/ I J.jII
V I I I I Y!
TC~".io~1 Ifzsc
-I- -,-- VGS=O
r-f-- - -
1--1-- - _ . - -- -
V' 0
V
10 10
I
VGs =10V'
V ---- lo=8A - -
1--1-- , - - _.-
0.5
2
Switching times test circuit for resistive load Switching time waveforms for resistive load
v f , ____ ~,90.1.
10,. ,I
I
Vee ,
3.3 I
~F
I
-yo :
5-6059 td (off) tf
Pulse width ::;; 100 p,s S(-0008/1
Vcl.amp
Vo_
2200 3.3
}JF }JF Voo
-----,
I
I
I - _ _ _--J
" L ______ __ .
SC-0311
SC-0310
Voo
1.8~Jl
::CJ: (;.-t,-C::::::r--L
PW i lKn.
....
PW adjusted to obtain required VG
443
SGSP230
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
445
SGSP230
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
_2/_5 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~mg1JT:~~ll--------------
446
SGSP230
P'o,IW)
50
IIII
"'-,"-
40
"'-
30
'" "
20
10
'"1"'-,"-
~
IIIIIII~ II
10 2 10 1 tp Is) o
o 25 50 75 100 125
I"
Tc... (C)
'oIA)
11 ~~
'oIA) lolA)
VGs -10V
VGS=1~
Ji'
~ /"
Tcase=2S0( -/---
1/ Tcase=2S0( 5.5V Vos=25V
U
L
I
'[
5.5V
I
I ~,...
~/
~
- 5V
/J.
III
rl
I 5V
b 4.5V TJ =125(
- '//1
1
4.5V
Y- I I/f- TT =-55(
=25(
J
J r--r--
/' I/,
4V
L..- 4V /- //
'I o ~~
80 160 240 VosIV) 12 16 VosIV) 2
VGs'=10V
2S"C
V
-
125"C
10 . Ves .90V 1-++-+-+-......97'n.I"+-t-l
'/ 225V 1-++-i--!7~"'bo'F-++-t-l
- 20V
360 V f-+-HA-:oI44-1H-+-t-l
0.6 l 0.9
40 20 30 40 VOS IV) -50 50 -50 50 100 T)I'C1
J I
3.0 I I
VGs =10Y ~
2.5 lo=1.5A vGso
~25"C
Tcase .-150C
I'
2.0 10
1.5
1/1' ""
1/""
1.0
_f-
.... II/
0.5
I
-50 50 o 0.4 0.8 1.2 1.6' 2 2.4 2.8 3.2 .SOIV)
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'I'
vi :
10'1. I
I
I
Vee I
3.3 I
~F
I
-Vo :
5- 6059 Id(off) If
Pulse width ~ 100 p's SC-0008/l
Duty cycle ~ 2%
Vo_
SC0310
1.8Kll
"""'"
PW adjusted to obtain required VG
,
HIGH SPEED SWITCHING APPLICATIONS
ULTRA FAST SWITCHING
EASY DRIVE FOR REDUCED COST AND SIZE
INDUSTRIAL APPLICATIONS:
SWITCHING MODE POWER SUPPLIES
451
SGSP239
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
G(-0581
lolA I
- - 10~s
0~~' , II
50
~..(:J7\O~'i. "
~~
w;~~~ ~
,/
I
"..
5V
Tcase= zsc
1.6
- )---
T)=-55(
TJ =25(
--1;---/ TJ=125(
1.2
,,
/~ ~ I
0.8 IA :r 45V I 4.SV
r
08 0.8
l. ~-.
~~ 11
ll-
... 4V r-- -
If
0.4
0.' ,4 Vos=25V
l/' ~
to 20 30 40 50 60 70 eo Vosw)
V ~
2 -- -
~V ----
r V TJ=125'( 20V /
6 ---. lo=1.2A
t /
If
0.4 0.8 12
+- 1--1--
1.6 lolAI
2
o 0.4 0.8 1.2
i
1.6
--
lolAI
V
12 16
I
~~;;~l H--+-+-+--+--+-+-+-t-I--+-+-+--H-i
3.0 H4-++-H.....L...L.H4-++-H_i
1-+--+-+-t-I---IVGS =10V t-+-+-+-+--I-+--l
2.5 lo=1.5A
2.0 H--+-+-+--+--+-+-+-t-I--+-+--+::;.!"'-t-i
1.5 H-+-++-H-+++7Ii"'T-++-H_i
1.0 H-+-+-+I----b'H--+-+-+---H-+-t-i
I
0.5 I-""II--~I---++-H-++H--+-+-+-H_i
w' LL..L.J...L.LL.JLl...L.LJ......LJ.....L.l....l...L.L.L.J
o 0.4 0.8 1.2 1.6 VsolVI
-50 50
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'J.
vI ',
10'/. I
I
I
Vee
3.3
pF
I
Pulse width :::;: 100 J,Ls
Duty cycle ,::; 2%
5(-0008/1
5- 6059 td (oft) tf
Vo_
voo
----,
I
I
I -_ _ _---oJ
" L. ____ ____ _
SC-0311
Voo
lKA
D.U.T.
1.8~O
::CJ: (_.;,---I-'---'
.
PW
...i S(-0305
457
SGSP301
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
) )
,, 10pst-
20
p~ I
$"
/
~9
?' \
1\
\ lOOpS
~"""ltI~~tHlf---l+f-HIlIIZ~h: ~hJ-'
16
12
'" '" "
lms t- C
r--.
10ms
lOOms "'-
DC [
WI tp Is)
o
o 25 50 75 100 125 '"'"T""IOC)
10 y '0 '0
(AI (AI
(AI =!80"'PULSE TEST ~ VGs'OVf-++e""v+-t-i Vos .25V 1--+--4+t-HffI-;H++-H
80,.,.PUL5E TE5Tf-+++--v--hH-A-I-I-+-I
1-+-+++++-t--+--lH--IH-I'F=;:as:. 250C
--55"<:
H--t---+;~+-+-+--H-+-+++++'6V 6V
5V
RfAj"Ii-++I-t-++++-++I-t-++-f-+-++I---I
>-++-+--+--I-++-l-++-+-+-I--+-H-SS'( IO=2.SA
1.4 f-+-H-t-H-f-t-+-H-t-H-f-j---'--'-1-j 16 'case=2S-C -
/
I--ti't--f-+-+-+-HH-+-+-+-H T".. =2S'( ~ 20V
1/ ./
1.2 H-+-+-+-+-+-+-I-+-H-+-++-+-Y-t--H-i 12
VOS 50V
Ht---I-7'!-+-+-+-HH-+-+-+-H--H 12S'(
BOV ~ [LV
10
.L7 ~v
,1-0 H--H-t-H-f-f-+--;.1<q-H-f-t-+.rM---I
0.5 1I-I1f+-+--+--I-++-lf--j VDS=2S v
I-I+-+-+--+-+-+-I-f--j 80., PULSE TEST V-
1
0.6 LL-L-J---'-..L.L-L.....L...!--'-1L..L..L.L-L....L...L-'-1LJ /
~IAI lo(A) 4 a. (nC)
0.66 L...L-'-L..L-'---'-L.....L...L-'-L..L-'---'--'-..L....L-'-'-
VoS(V}
-50 50 100
lc_-25'C-
I0
i-++I-t-++---bf++I---I
VGS =10V lSO'C_ I)r-- ~~~ .-f-f-
1.5 H--H--f-'T-=l,.2,A+++-f-t-+.7H-t-++-t-i 10
1. 0 1-++-+-++-+-hI"'-l-+-1-++-+-+-I-+-H-i .,
0.5 L...L-'-L..L-'---'-L.....L...L-'-L..L-'---'-L.....L....L-'-'--'
J~
-50 50 100 "sO (V)
4/5
460
SGSP301
Switching times test circuit for resistive load Switching time waveforms for resistive load
'
~ ____ ~90.'.
vi :
10'. I
I
I .
VDD I
3.3 I
~F
I
-Vo :
5 - 6059 td (off) tf
Pulse width ~ 100 p,s $(-0008/1
Duty cycle ~ 2%
V _
D
---,
Voo
I
I
I -_ _ _--oJ L ____ ____ _
"
SC-0311
Vee
lKA
1.8Ktl
:CJ: Cot~,-C:::::J--{
PW i lKn
.....
PW adjusted to obtain required VG
463
SGSP311
THERMAL DATA
OFF
ON (*)
ENERGY TEST
DYNAMIC
SWITCHING
_2/_5_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m~1J~:~~Jl--------------
464
SGSP311
6=0.5
80
t-- 1\
Zth:KrHh}_c 60 1\
S = J..
~
10ms ~.l: 40
'\
'\
10, ~~II~Mlll~oo~mS~11
~ F OC
20 1'\
tpls)
o o 40 80
I~
110
~
m=
f-H
V ~ h~ $
16
7V
trr 17 8V
Tease .. 25-C LL
80,.,. PULSE TEST t--if-+-++-!-j'case .Z5~
10 H-+-++-!_i 80 ,.,sPUlSE TESTt+++d-t--+-1
.t
~ 6V
V
1t++-++-!-t-t-t-+++-+--+-1r-+-1 SV
4V
465
SGSP311
/'
Tcase =-5S-C
VOS=20V
SOy
./
f"../ / /
,/
12
25'C 0.6 80V I"Z' VV
~t':v
/1"""''''-
Iii 0.4
V 12s'C J VGs =10V
I
/I ....... 1""'"
I
1/ ..... V
--
I
20V 10=16A
I 0.2
I--
rl I
I
16 24 10iAI 12 16 20 24 (lgln[)
I 2 3 4 5 6 1 8 9 10 '0 (A)
500
~ 1.0 I-+-+--I-t-++-Pild--t-t-t-H--+-I-+++--I 1.0 I-++-+-+-++-hr<+-+-+-+-+-++-I-+++--I
400
,\ ....... Ciss -
300
\ ......... ,..... 1 0.84 I---I-+--I-+-+++-IH""+-+-+-H-~..q-++--I 0.9 1-++-+-+-++-+-1-++-+-+-+-++-1-+-++--1
200
100
.........
5 10
- 15 20 25 30 35
Coss
crss
40
f--
VOS ( V)
VJ~
VGS,O
1.5 f-++--l-+H-I-I-++-f---YH+--l-++-H
1.0 H""+-t-t--bt'''t-H""-t-t-t-H--+-I-t-++--I
Tr1 ~ti.~ "C
4/5
466
SGSP311
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r
----~90.J.
vi :
a
101. I
I
I
I
Pulse width ~ 100 p,s
Duty cycle ~ 2%
5(-0008/1
5-6059 Id (otf) If
Y(BRIOS5
10M
10 _ / .... 1
Voo
"
10 2200 3.3 .... ,
VI_TL
!IF }IF
: ,,"
" -_ _ _- - I
,
L _
u
I
S(-0316
Pw
5(-0317
1K.n.
1.8Kll
::CJ: ~;~,-C::::J---{
PW ! 1Kn.
.....
PW adjusted to obtain required VG
469
SGSP316 - SGSP317
THERMAL DATA
OFF
ON (*)
ENERGY TEST
DYNAMIC
_2/_6__________________________
470
~~~~~~~V~:~~~ ____________ ~--------------
SGSP316 - SGSP317
SWITCHING
)
J
-SGSP31J
v~1<
80
JU
~c:;-o~ /
,
.... SGSP316
I-- r-..
10', ,=='=
SGSP31J 10s Zth::KIHhJ-c 60 f\.
SGSP316
100~s S =..!.E.. ~
" I
10-'m~ ~ 1:
'\
,
SGSP316-
SGSP317~
~mt
lOOms
tpls)
20
o
o 40 80
'"f\.
120
f\.
~IAI 'OV
V s,6V
Tcase=-55(
Tcase=2SoC-
Vw V SV Tcase=12SoC-
VGs=4.SV
VGs=4V ~
l.5 4 4.5 VoslVI 20 30 Vos(Vj 3 4 5 VGs(VI
0.5 1.S 2 2.5 l
ROSlon }
In) I / '/
V ,2SV 1.0
/ Vos=40V
V05=100
-I--
t-i V.
VGs =20V Vos=160
/ V //
0.8
V
10V / / '/
f-++-t-+-t-+--t-i-t--t--+--i T".. '-SSoC 0.6
V J /,
__ i.o::::: V ./
~V
0.4
I ~,6A
Tc.,,:25(
f-- -
0.2 I
II
II
~IA} 12 16 20 lolA) 20 QlnC}
472
SGSP316 - SGSP317
(I,Fl I I
voltage vs temperature
vGS(lh!r-r----,-,---r-~---,-,~~~rr---,-,~~
(norm) H----M-+--l-++-l-+-+-++--H--+--+-+--+_+_
voltage vs temperature
- f--t---f- - +-1---+-++-+-+-+-+--1
j-- +-
I",r-H-H-
500 I" I~ -+-+-t-+-+~H--1
0.9 H----1LI-f--f--I-+--I--+-I----+-I---l-+--I-l-+-I-----1----.j
rJRl':f- , Co
ISOIAlmm*mmJm~
ROS[on) r-r-,,--,r-r-'--'-'--r-T--,--rr,,----'!'OT-'T--!,
(norm 1H-+-+--+-t-+-I-t-t--t-+~H-+-+_h~
1.5 I-t-+-+-+-I-t--H-+--I-t-------I-t-+-+-I-+-H
I
05 Ves lVI
50
v:r
Switching time waveforms for resistive load
I
101.
901.1
. - - __ ~,90.1.
--- - - -
I
I
90'1.
VOO I I
3.3 I
~F
I
-vo :
5 - 6 059 td (off) tf
Pulse width ~ 100 /Ls S(-0008/1
Duty cycle ~ 2%
V(BRIOSS
vo-
--,
Voo
I
/
,-
,,
I"'--_
/ _ _--'L _____ _
S[-0316
1.8KI1
:CJ: (-~:,--C::J--{
PW i lKn
.....
PW adjusted to obtain required VG
474
SGSP319
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
475
SGSP319
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
-4
lolA
1 I
6=0.5
80
I--
101,
Zth.::KRthJ_c
"""" '\.
r---
,fi:-
'J' , S =...!..e.
60
I\.
10-lm~ ~
r--- ~<}oi!;f. IOS
"\
, lml I 1:
40
'\
10~
" ms
"\
20
o.c OPERA TION---'>
10ms
100m
"\
1 IIIIIII 10-2 10- 1 tplsl
o
o 40 80 120
'\.
160 T""IO[)
, 'VosIV)
I 5V
1
5V T) =SsoC-.....,/..J
-~
TJ=-6SoC 8
./
V ....... I--- I-- 6
f Vos=2S0V
~V
~V
~~~
V VV
-
TJ =12SoC
- S
/ 10
Vos=400V
/.?}
I~
/ /
/ /
/# 3
/
lo=2.5A
I( 2 /
4 10 (A)
10 12 14 lolAI 12 16 o.g (nC)
18 /
/
4
0 ./
/ I
6
./
1/
2 100 L--J..-LJ
, _ _..L--L-----'------'_ _-'---"-----'-----'
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90.'.
vI ,
,
a
10,. I
I
I
Voo
-.J UV j 3.3
~F
I
Pulse width ~ 100 p's
Duty cycle ~ 2%
SC-0008/1
5 - 6 059 td (off) If
Vo_
2200 3.3
/-IF /-IF VOD
----..,
I
I
I
IIL-_ _ _--J L_ - - ___ __ .
SC-0311
SC-0310
1.8KO
G~
high speed switching applications. Uses include
DIAGRAM
motor speed control, low voltage DCIDC conver-
ters and solenoid driving.
481
SGSP321 - SGSP322
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
2/5
--------------
Gil
'J, '"
SGS-THOMSON - - - - - - - - - - - - - -
~OrGIlD[gI!,I~rG'D'IJ\lIi(i]OrG~
482
SGSP321 - SGSP322
80
- r-.
Zth=KRthJC
s: ...!E..
60 "-
\.
10-lm~ ~ 1:
40
\.
'\ -- - - r--
Ml.mIIII
lOOms --
0 OC
10 20 "\
1--+--t-++t-ttH~~~~iii H:f-HtH-t-++t-tHt1 r"\
LL
1O-;LOO-.L....L...J.,.L,W.lli10-,_,-.L.L,ll,ll..1 02---'-,....L..,LLl.l,-':-"'Vos (V)
Ip(s)
o
o 40 80 120
"- 160 T",,(oC)
(5)
(~) t-t-+vo s_"""'_2s="v--+-t-t-++++-+-I-H'l-lrfi--l/-t-t
..L
80 LSE S
g,
Te.i'S.-5S-C 16 H--+-t-I'--t-,PU,-r-'E,S'++tt-t'-:::lv-l,,+"'++-t;:j
~SC
125-
12 fM--++++-+-t-t-++++-H-+t-t--t-+-1
10 f-+++++--+-f-++++-nIH-1I-t-H--++--i
80 PULSE TEST
5
6V
1 2 3 4 5 6 7 8 9 10 J0 (A )
30 VOS (Vl 2 3 4 5 6 7 8 9 VGs(V)
C~ , Hf--tF.i
I--f,r--"....
as
Jlavb+-+-t-t-t-t--+-tI-+t-+--t-1
I
16
1
I
1
~
l-+-Hf-I-+-I-H Tcilse=25"C
1-+-H-I+JH-I-H80~. PULSE TEST
~S'20:~
3SV
SOY
., 1 I
0.09 LL-'-J-L-L...L-L-LL-"-:-,---'---L..L~LL~ I I
o 10 20 30 lolA)
a 10 12 14 '6 Q CnCI
11\.
600
500
\~ r--... 1.0 I-+-H-+H---pt-d--H-t-H-t-H-++-l
400
\ \ -t-- t-- Ciss
. . . . t--...
300 0.9 M-t-I-+-t-t-t-t-t--t-HH VGS=O
"- t- r- ~ 0.85 I-+-H+H-t-H--H-t-H~i'-i-++-l 10 250pA
200
1"- +-- crs~
'DO
0.8 tttlEEBE~
-50 50 100 TJI'CJ
10 f-f-+-+-+-f-cV.v:-I-t-+--+-+-Ir+--f--+-I 10 J
I---+v--J-""VI-+-++-I-t-+-+-I ~~~~OV t - -
0.5 H-+-+-+-H+-+-H-+-+-+-I4--l 2
1
-25 25 50 75 100 TJloCJ
4/5
484
SGSP321 - SGSP322
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r
----~90.J.
vi :
10,. :
I
Vee I
3.3 I
~F
I
-Vo :
td(off) 'f
Pulse width ~ 100 p's 5C-0008/1
Duty cycle ~ 2%
Vo_
VOD
-----,
,
I
I
K--_ _ _~ L ________ .
SC0311
Voo
1.8KO
~ Co+~,-c=r--{
PW i 1Kfl
.....
PW adjusted to obtain required VG
- - - - - - - - - - - ill
] ,.,
SCiS-1HOMSON .l\iJUlQ:ffil@[gIL[gIQ:'ii'ffil@IKIlUIQ:~
5/5
485
SGSP330
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
487
SGSP330
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
lolA I
J
6=0.5
80
-
......
" "-
-"
.:s,p Zth; KRthJ-c 60
1--- ~~if , .10s
S = J.2. 1\
III '\
.... 40
10~
1', liYm
1m'
'\
1
'Om~
l~ooms
OC
10
o
'"'" "-
o 40 80 110
lotAI
II
/
I
VGs =10V
Tcase=25( f-+-
lotAI
Tcase=2S0(
~
~V
VGS =l,.
~
S.sV - lolAI
Vos=2sV
1"
U
/I
s.5V
~V
~ SV
fl
4 I
~.., Jj
sV
I
;1 4.5V TJ=11s0( ~
VII
I
4.5V
.&~ I VI- TJ=-ssO(
TJ=2S0(
I-- -
IL VI. I
4V
,Lv 4V /. l'l'
7 o ~~
80 160 240 VostVI 12 16 VostVI 2
H-+-l-++++-H-+-l-IH Tcase=-SSC
VGs =10V
2S"C
12S"C V 10 . VOs90V H--H+~~bt"'-H-i
V 225V H--H-t:.H"'l7H-+i-i
360V H--t-.j"'"l-:~"'t-H-+i-i
I-I-' 20V
0.6 ~ 0.9
40 20 40 VOS IV) -50 50 -50 50
J. ~25"C
Teas .-150C VGS=O
2.0 H-+-++-H-+-+Hf-+-+--+v7l"'T-i to
V
1.5 1----I-+-+-+-+-+-+-+-c-l-:::7l",,+-++-H---I
1.0 1----I-+-+--+i,.;--b>1'/"'-j--+---t--I-+-++-t-+---1
~I
0.5 i"""fl--=+f--+-+-+-+-++--t--I-+-++-t-t---l
I
j 1
-50 50 o 0.4 0.8 1.2 1.6' 2 2.4 2.8 3.2 VSO I v)
4/5
490
SGSP330
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r
----~90.1.
vI ,,
10'1. I
I
I
Vee
3.3
~F
I
Pulse width ~ 100 p,s
Duty cycle ~ 2%
5C-0008/l
5-6059 Id(ot!) If
Vo_
10M
10 ~
---"
vDD ,," Voo
----, "
IlIL... "
I " _ _ _........ L __ ______ .
Sc..0311
Voo
lKA
1.8KO
::CJ: ~_.:,----I"-'---'
.
PW i
.....
PW adjusted to obtain required VG
493
SGSP341
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
-2/-5--------------------------~~~~~~gv~:9n
494
----------------------------
SGSP341
-0 G(-0745 GC-OS45
lolA) )
20
III
v~~
~:::: q..<:>'l
.~ -"
,
101'5
100)ls
8-0.5
8=0
;::: ~
~
~
~
'!"'"
==
16
12
'" '" ""
(, IIIII
""" c-
Zth=KRthJ_c
"
~ o =..!.E.
0=0.
,/ ~ lms II 1...- 1:
1
ID
IAl
IJ
'c.an c26 C
a sPULSE TES1
YGSdOIl.
-'-
0
(Al
'casf'125-C
II' /
ay
VOS=25V
25'(
-55'(
t-- 'cHV
0.9
o.e
IJjJ
O.ll-t--t++++++++2l~'1-+-+-","i...
SY..,j
0.1
~
sv
0.&
o.s
til 6yt I
0.'
O.l
s.SY IJ
0.2 \~i= //1
,.sv
0.1
~ 1/
20 lO 40 Vos IV)
6 VGS(YI
_____________________________ ~~~~~~~V~:~~~---------------------------3-/5
495
SGSP341
LI
l/ ./
50
p. 0.85 I--+--t-lt---t--H-+-t--t--t-t---t---t--t-+-N-----t--IH
\\ [t-- r- Coss
Crs5
t--
30 .. 50
2.0
1.5
to II
III
0.5
.. 50 50
496
SGSP341
Switching times test circuit for resistive load Switching time waveforms for resistive load
'f
----~90.1.
vi :
a
-.J Uv; 3.3
Voo
I
I
I
10'1. I
I
pF
I
-Vo :
Vo_
SC-031 0
Voo
lKA
1.8KO
::CJ: C.t-~,-C::J--{
PW
...i lKfl.
499
SGSP351
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
IDIAI I
50
2 f-- f---l-J~ 10~s f"-
'J
"'
10,
:~
'=== ~<:::)q.o~ 100~s
&-0.5
40
"1"-"-
/
r"
lmsr-
10ms
6-~
6=0.1
~
. . .J
1 V Zlh=KRthJ-c
& = J.E.
Jl.JL
1:
30
20
I" "-
""-
, lOOms
~
o.et- ~ ~:~~~
I ~ r 6=0.01 -t-J 10
I 2
SINGLE PULSEI
10-4 10-3 10-2
11111111 I
10-' tp lsi
o
o 25 50 75
"" ~
I ~55'C
915
(5)
'0=7.5A
~
Tcals.!25~t- 0.61-+-l-~-+-+-I-++-l-1-+-H-+-++-+-1- 16
Tcase =25C
II V I I
I 125'c V05=20V-
./
I V 0.5 H--J--jl+-H-i-H-l-f-+-H-+-++--H SOV
I I; VOS= 25V
80V:-:::>
~~
./~ ~
8O~s PULSE TEST
V
) -.....:
II
OJ f-+-H-i"'H-i-+-b~f-++-I-++-t-+-H
f7
II
0.2 LL-LJ---L-LJ.-LLl..-LJL.L..L..l-'-.L..L-'-:-LJ III
10 (A)
o 12 16 lolAI 8 a (nC)
J.t.-+--i--+---1f--+--+--+-+_.- .-
200 \'r-...
\
\ ~ ......... ~
0.9 H--H-I-H-l-H--H-+--H~H-+i-l 0.9 f-++-I-i-H-l-H--H-+-H-l-H--H-l
100 \
Cos s
C rss
0.8 -50
L-L-..L....l-'-.L...L-'-L-L-..L....l-'-.L...L-'-L-L-..L....l-l
50 100 TJI'C) 0.8 ti_i50t:Jti50t:JTiJlj'C)j
20 40 1/ (II)
05
1.3 H-i-i-++-t-+-H--H-i-M-l-I+-H-I
1.2 H-i-i-++-t-+-H--H7'f-H-l-I+-H-I
II
III1
0.7 H-+-+-+-+-+-l-I+-H-i-t-l--J--j-+.-+-+-I
50 3 VSO (V)
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r
----~90.I,
vI '
,
10'1, I
I
I
Voo
3.3
~F
I
Pulse width :::;; 100 p,s
Duty cycle :::;; 2%
S(-0008/1
5 - 6 059
I I
td(off) 'f
VOD
---,
I
I
I
SC0311
Voo
1KA
1.8KO
::CJ: C....~,--I"-'--..J
PW
...i
PW adjusted to obtain required VG
515
503
SGSP358
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
505
SGSP358
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
GC-0746
I
:::: s=
6=0.2
.....,.
I L 1/ Zth=KRfhJ-c
so
40
30
!'"
I"
"I'"
It:
6=0.1
f2
U.
~ S0.05
b =..!..2.
JlJL
1:
20
'" '"I'"
~ 1"\
r
6=002
6=0.01 --ttJ 10
" 1"'-
I"
10-2
SINGLE PULSEI IIIIIIII I o
10-5 10-4 Wl W2 10-1 tplsl o 25 50 75 100 125 Tca .. I[J
ric-om
~(A J
ill V
~IA J
VGs =10V 9V 8V T<... =-55'~
TCUt =2S 0 (
;' V I /12S'C
1.6 IXI
V//
/1---""""
-
7V
I-- f--
7.1
~~~-r-r-+-+-+-~-~~
I BV
VDs=2SV
/1/
II
125C
507
SGSP358
T(81=-55 o. 6
-
,/1'"""
2S0 (r-- -
V 0.4
1/ / 12SO C
~ 20V 1/
/IV
,
0.2
1/11
~-
-...,. v1 I
II
I /
2.4 4.8 7.2 9.6 ~IA) 10 Qln(
12 16 20 24 lolAI
vGs=ov
400 TUst =2S 0 [
f=1MHz 1.1 f-+-H-t-+-++-f-+-H-t-+-++I7f-H-l
300
\\
Li"'-. r-
200
~
:--
--- - (iss
100
'"
'\. r- i--
-- (on 0.9 f-+-H-t-+-++-t-+-H-++-+--1-H--H-l
-"""""1- [ns
so
Tc".=2S0C~
,..
1S00 (
l.lf-+-H-t-+-++-f-+-H-t-M--I-H--H-l
~~
1.2 f-+-H-t-+-++-H--H7'f-+-+--1-H--H-l
~I
0.9 f-++-t-+--H',+-+-++-t-+-+-+-+-+-++-l-l
0.8 f-++-t-7Jf-+-++-+-++-l-+-+-+-+-+-++-l-l
0.7. H--t-t---t-t-++-1-+--t-t---t-t-+-+-1-+-+-+--l
0.6 H--t-t---t-t-++-1-+--t-t---t-t-+-+-1-+-+-+--l III
100 VsoIV)
508
SGSP358
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r
----~90'1.
vi :
10'1, I
I
I
Vee I
3.3 I
~F
I
-Vo :
5 - 6059 td (off) If
Pulse width ~ 100 P.s S(-0008/1
Duty cycle ~ 2%
--,
Voo
I
I
I
SC-0311
Voo
1K.n.
1.8KD
:CJ: C.-!-~,--r:=:~--{
PW 1 1Kn
....
PW adjusted to obtain required VG
511
SGSP361 - SGSP362
THERMAL DATA
OFF
ON (*)
VGS (th) Gate threshold voltage Vos= VGS 10= 250 p,A 2 4 V
ENERGY TEST
DYNAMIC
SWITCHING
P'o,lW )
100
I"-
Zth:KRthJ-c
0= -.!.
80
'" I'"
I'\..
~
60
1 0 - 1 m l 1 1: '\..
0
'"I'"
20 I'"
tpls)
o
o 25 50 75 100
'"I"-
27 f--+-H-+++-+-t-+-H-+-Ht+-Jr.:'2~S';!:-[ -H
f-+-+-t-,--,,+-1r-+-+-t---Y-t7'f-+-::l.-'f--1 7V
V =2SV
4+' 4.IV
3V
v 'I_-=~
VGs(Vl
I-+-f--+-+--I- r- -+---t-t-+
I-t-+-t--t-l ROSton I
In)
Vos=20V t----'-7 IJ
--r--t----- -f--- ----- v~:::02-L~::-t--t-t----t----j 0.24
I-- - - - ~:::;:~ f-f-/,.-j
- -t-- - - - --r-+--+-+-----L--'-----'---t-+-+---1
Tp-5S0
( 0.20 I I,
25'[ ~-I-t-- 20V
'I
0_16 --
/ / 1o=18A
6 (1--- 125'[ 1-1-_
0.12
VGs =10V / I
/ / I
_v
-- ,,/ -f-
j----- 0.08
0.04
~ t
20 28 'DIAI o 20 40 60 80 100 'DIA) 20 30 a.(n(
1\ ~I--j-j-j-j-j7f-l-j-j-j---j-j---j-j
11K 1.0
1'--1--. iss
1\ 0.9
\
-
600
\ "I"-.. COSS 0.9--
't-.. Crss
l - t--,.....
r--
0.8
0.7
-50 50
H-++-Hc-1l o=llA
1.5 H-++-Hc-1VGs =10V
h
V,
TJ=1500[ 1/1~5O[
1.0 H-+-I-++-+-bR-+-I-++-++f+++- 101
0.5 H--H-++-++H-+-I-++-++f+++-
I
100 I1I1
VsoIV)
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r ----'-90 0
J.
vi :
10'/. I
I
I
Voo I
3.3 I
~F
I
-Vo :
Duty cycle ~ 2%
V(BRIOSS
vo-
1011
10 2200
1
3.3
Villi
10 _ / , , 1
/
/
pF / I
VF I /
VI_JL.. I /
"'-_ _ _--' L _ _ _ _ _ _
I
u
Pw
I S[-0317
5(-0316
1.8KO
:CJ: c.~,---I-L-..J
..
PW i
....
PW adjusted to obtain required VG
517
SGSP363 - SGSP367
THERMAL DATA
OFF
ON (*)
VGS (th) Gate threshold voltage Vos= VGS 10= 250 p,A 2 4 V
ENERGY TEST
DYNAMIC
SWITCHING
100
"'- I"'-
80
-"
Zth:XRthj_c 1"'-
S= iE. 60 1"'-
"'-1"'-
40
"'- \,
20
SGSP363-
SGSP367_
rm "'-
tpls)
o
o 25 50 75 100
''-
GC_om
~IA )
~V
VGS =10V Tcu.=25(
f'J 6V ".... t=90us
~ V/ 6.SV Vos=2SV
vz . . . s.SV
4--
!J~
~r-
VI
~V - 45-
4V-
SV
45V
I I
60
JV 0.2
-I-" -!--
/1
r
/
/
lolA) 16 24 32 40 lolA) 10 20 30 41 'O.(n(
1200
600
400
,
l
0.72 H-+-+-+--H--H-t-++-+-H-+-+-+-+-H 0.9 H-+-t-+--H--H-+-+-+-+-H-+-t-+-l-H
~~ I~
200
Crss 058 H-+-t-+-t-+-H-t-+-+-+-H-+-t-+-++-i
5 10 15 ZO z,; lO ]OJ <10 VOS IV) -50 50
HV,,=ov
'0 y
VGS; 10V H-+-t-+-+-+--/-,H-+-t-i 40
A
2.44 10=5A
T'IIII=25-( 150(
V1/ I
1.72 H-++-+-+-++-l--++++-I---i>+-t--+t-H 10
!
to
0.28 LL~-LL.L-'-LL:-':-'-'-'-:-:-:,-'--'--':-=-'
II
-50 50 100 TpC( VsolVI
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r.
----~90.'.
vi :
10,. I
I
I 90-'.1 --- - - - 90.'.
I I
3.3 I
~F
I
-Vo :
5 - 6059 Id (ott) It
Pulse width ::;; 100 p.,s 5C-0008/1
VIBRIDSS
2200 3.3 .-
I
jlF JlF '"
VI_::I"L I '"
IO<..-_
'" __
I
--.tL _____ -
u
I ~~
S[-0316
Pw
S(-0317
1.8KO
::CJ= Cot:,-C:=:J--{
PW i 1K.C1.
.....
PW adjusted to obtain required VG
6/6
-----------------
Gil
'1,,,
SCiS-1HOMSON - - - - - - - - - - - - - - - - -
~urc;IRl@!l;I\,!l;rc;'j)'IRl@li(i]urc;~
522
SGSP364
SGSP369
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
1/5
523
SGSP364 - SGSP369
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
IO{A )
J
0=0.5
100
6~ ~ y-t-
,, ,
lOps Zth:KRthJ_c
60 " I"
.~
==
- ~~c.,'o~
/ ,,
I
~OOps
msj
1 0 - 1 m ; R ~
/; =..!.e..
1:
60
40
"I"I"
10~
Oms
OOms
c~
20 ""'" I"
"
SGSPJ64 f-
SGSPJ69 f - o
1
tp{s) o 25 50 75 100 125 Teas,{OC)
'IA I I
V",10V/ ' / 5 V V6S =10V!J IIV
I
Tc~u=25(
~ I 1(. . =25-(
~ I
1/
Iv ....
4.5V
. 5V II
,,- V I
I
4.5V I
I
/ 4V
II
V II 4V I
V 20 40 60
1/
VoslVI 10 VDSIVI
-----------------------------~~~~~~?V~:9~---------------------------3-/5
525
SGSP364 - SGSP369
-~ tj::::tj::::t~::::~::::~I/~::::t_7-r-.y-/--tl--_-+-~-r---+---I Vos=400V
L
f---+----I----::7'i""::+--\-t--- -'I----~ 1.8 /'/
/,/
/
/ ~
1--1-- -t----b''l-tA-v+-+-t---t-+__t__+---I--l ~
2 / ---
1.4 H-il..-:----vi--V......,il--I---t_+__t__t--t--+--+--t--I I
V--r-- -r--(-- ---r--+--+--+-----i 1=1-- - - I - I - - - -- ~t____t__t___t_+__t__t____l
1--1-- - _..L --- ------r- - - - - I - -
/ --t--- t--
10~-L~~1-L-L~~-L~L-~~
.IAI o 5 10 15 IDIA) 14 42 Uln[}
500 1I't--f-+-+-+-H-+-+-H-+-+-+--"r-+-l
~ - -+--H-+-++-+--+-+-+-+-+-+-1 0.80 J.-++-t_++-+--+-H----t--I--t--+-t----P'fd--t--H 0.9 J.-+--H--+-+-++-I-+--H--+-+-+--+-+-+--H-i
\',ri
-_\,~ c,,, -I--
Vos(VI
~~;~:;l f++-t-+++++++-t-++-+-+-+-++H
IsoIAI ~H[~H~~a$~f-!-~+,.~
1-++-t--l-+--+-1 VG5 =10 V 1--+---H--I-t--+,4-+-I J.-++-t-t--+--+/--A--J.-+--H--I--H-T=-'",~.=L25"--c+'[-
2.0 1-++-1--+-+-+-110 =2.5A
IJ
1.5
1.0
0.5
-50 50 100 VsolVI
526
SGSP364 - SGSP369
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1'
vI ,,
10'1. I
I
I
Voo
3.3
~F
I
Pulse width :::;; 100 p's
Duty cycle :::;; 2%
S(-0008/1
5 - 6059
I I
td(offl tf
V _
D
VDD
----. I
I
IIL-_ _ _ ~ L. ________
SC0311
1:1
1.8Ka
:CJ: (_t7~.-C:::::J--l.
PW i lKn
.....
PW adjusted to obtain required V G
529
SGSP381 - SGSP382
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
GC-0571
lolA ~ 1
100
II I I ~
~0$'
T"I~
r-r- I 80 ,"-,"-
mmmHE
Zth=KRlhJ_c
I---
~~~a~
/'
10)15
100)15 r- 1O-
1 & =J.
1:
60 j"'-
"-,"'-
lms
" 40
"'-,"-
-f--
10ms -
-- 20
~~~~~~~t ocl
I lOOms
"-
'"
I
o
, 'VosiVI o 25 50 75 100 125 T,,,,loCI
iliA I
t----
_L_ ---
as
V =l"l 7' BV 7V _
lolA I
- - r-- - ( - - (--- --
rT",;~-55.~ / 25/
Tcase=2S0(
ilV V
--1
11/ 125(
JV/ / - --- t-- i//II
(--- ---- ~ / - --I----i----f-::, - - - - - - - - -
Vos=2SV {I;
//1/ ~
6V
~ _____ 1--_ _-+_7_V-+_+ +--+_-1 1.'1
fI- / V 20 I+--+--+-+-+--- I!J ---
~v 1/
r-iAV 5V
-1
I
I I
I I J
._- -
If'/ i-- (f
p[ 4V
Vos(Vl 24 VosrVJ
o
o
-+ ~
.1
- - r--
VliS{V)
Tcase=-S5
VGs =20V / ~.34A Vos=20V
VDS =3SV
-ttl,
L Vos=50V -------.ISI./
V 120
L'/
I 25(
100
V 1
/11 v 80 I 1
Il v IL
If 60
/10V II I
11 40 '--
_I-"""
/ II
~- v
30 20 40 60 80 lolA) 20 40 so Q.lnCl
120
o \
t"'-
1\ "t--+- c..
0
\ "- 0.9 1--I-+-+-+-I-++-++--H-*l--+-1-++-++-1
t'--- c...
-I'"- I'"-
o "r-.. t - t-- t--
t-- t -
~
10 20 30 40 VoslVI
J
J
0.51-++-+-+-+-+++-+-1H-++-H-I--I-++-1
I
1
v
-50 50 20 30 40 so Q.ln()
_4/_5_ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~m?1J~:~~~
532
SGSP381 . SGSP382
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r
----~90.'.
Vi :
10,. I
I
I
Voo I
3.3 I
~F
I
-Vo :
5- 6059 Id(oft) If
Pulse width ~ 100 its S(-0008/1
V _
D
voo
-----,
I
I
I
"-_ _ _---I L.. _______ ._
SC0311
Voo
lK.n.
1.8Kll
:CJ: C~:,--C::::J--L
PW ! lKfi
--
PW adjusted to obtain required VG
535
SGSP461 - SGSP462
THERMAL DATA
OFF
ON (*)
ENERGY TEST
DYNAMIC
SWITCHING
6=0.5
125
~~~~::; ~h=
100
I"l~
10~s
I 'VU~S
r-
"-
E
75 1"-
1ms
L'--
0~~'111111'6~0(0~m'E'-11 10msr--
50 L'--
"-
10
SGSP461
SGSP462
25
o
o 25 50 75
'" 1"-
I"
VGSIVI 1---'-""l!L.,
'--'--'-'--'---'---'-'I/"IITT
27 1-+--H1-++-+-t-++--H-+Ht-+'r.12~S.;i:-C-H
r~I-t- ~:::;:~,"r:-~+,j-FL~+I/h'-l+---t_-+-~I---t
VOS"80V I- j.L, '(.f
11-j /-if--t--t-I---t--t
v =2SV
lo=lBA
J
3 I
I
II
30 40 o.ln() 9 12 1S 18 21 24 27 VoslVI
25'( f--I--I--
fI
20V
0.16
If/-I-- -1-H-+-1-++-t----L+-+-l-I I lo=1BA
6 /I 125'( I--r-I- VGS =10V / 1
0.12 -
V 1
-
/ /
1/ -- ~~- -I ~~~
0.08
1.--'/ /" I
-I- I
0.04
26 lolAI o 20 40 60 80 100 lolA) 20 30 40 0.1,(1
4/6
538
SGSP461 - SGSP462
1\
UK
.......... ;.. 1.0
800 ~ 0.9
600
\
200
\
'-..
'" r---... -
Co.,
ern
l - t--
r--
0.6
0.7
0.9 r++-+-+-++-t-l-t-H+-H-++++-+1
-50 50
[/,V
TJ;1500[ V~5O[
1.0 r++-+-+-++--b1<++++-I-++-+-1--I---J--j
0.5 rt--H-t-H--t-l-+-H+H-+-+-+-+-+1
I
II
VsolVI
Switching times test circuit for resistive load Switching time waveforms for resistive load
____ ~90.1.
vi :
: ;10'.
.:- I
I
I
Voo I
3.3 I
pF
I
-Vo :
5 - 6 059 td(offl If
S(-0008/1
Pulse width ~ 100 p,s
Duty cycle ~ 2%
10M
Villi
10 _,.,,1
"
10 2200
~F
3.3
}JF
:
"" ,
v,_IL /"
" -_ _ _--1
\L _
u
I
5[-0316
Pw
5(-0317
1KA
1.8KO
~ C~~,~=:r--{
PW ! lKfl.
.....
PW adjusted to obtain required VG
_6/_6 _ _ _ _ _ _ _ _ _ _ _ _ _
540
~ ~~~~m~1J":~~lt --------------
1'='= SCiS-1HOMSON SGSP471
~.,L U0i]ooo@rnOJ~'ITOO@~O~ SGSP472
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
541
SGSP471 - SGSP472
THERMAL DATA
OFF
ON (*)
VGS (th) Gate threshold voltage Vos= VGS 10= 250 p,A 2 4 V
ENERGY TEST
DYNAMIC
SWITCHING
6=0.5
II 160
SGSP472
SGSP471
=
6=0.2
......-rrr .......
i.---
'--" I'\.
~
lOps Zth=KRthj_c 120
6=0.1 f-- '\
100ps- 10-1 f-&-o.O 5 s =..!..
1:
~
'\
lms 80
....,&-0.02 k"'_ '\
10ms- j,. 6=0.01 I' -ttJ
Iii IIIIIIIIH 40
"" '\
SINGLE PULSE
lOOms
SGSP471 DC
100 '-o--'-.LLJLLli.,-,-:---,S=GS,-,P4--,72..w..L'-"-;;--'---'-'~-:-" 2 1\\\\ 1111I1111 III I1111111111 o '\.
100 1 ~ 6 610' 2 4 6 8102 2 4 6 9VOS(V} 10 2 Iplsl o 40 80 120
Ge-016S -,
~IA I I
10V 8V r- I
~ WI
TQII::t2S-C
t,olOOps IV 7SV
1c... =-55-(-
1c. . =25-(-
V V"' . . . . Tc_=125-(
77
lO
l- V 7V 7V
f--
Vw 2SV
--,- I 'J
V. V 6.SV 6.5V III,
20
~y~ 6V
20~+--r-+~__+-~6V~~__~ III
/'; V'" S.5V S.5V It
t~~ SV /I
l'/
V
V",o4.SV
VoslVI VoslVl I 2
~r "
ROS{on)
ImILI t-- - - VOso2OV - bL'/V
-~I-- r-- sov-
t'2 I
Vos=25V t-- -- sov Z
68
17
ill
60 V / IO=loSA
-
1c. . =-55-
52
IV Tcaseo=ZSC
4/6
544
SGSP471 - SGSP472
1400 \ Tc..,ZS
fl1MHz
ul-++-+-'t-t-++-+-+-+-++-I-++-+-+-+-+-I
1800
\ I"-.... ~-
\ 1\
\ I\.
600
['...
.......
1"-....-
- Coss
Cno
0.9
0.8
H-+-+-+-t-+-H-++-+-N-++-+-+-I-H
H-+-+-+-t-+-H-++-++-IH-+-+"t-H-1
0.9 t--t-:.r-I-+-t-++-+-+-+-+-f-t-++-+-+-+-+-I
-50 100
10 40 "os IVI
1.5 I-++-+-+-+-++-IH-+-+--t-,~+-+-+-+-+-i V I
VGs=OV
II
-50 '0.5
I 1.5 VsolVI
Switching times test circuit for resistive load Switching time waveforms for resistive load
,,
I
Voo
3.3
~F
-vo :
5 - 6059 td (off) If
5C-0008/1
Pulse width :E;; 100 p,s
Duty cycle :E;; 2%
V(BRIOSS
10M
Voo 0 _",,1
1
"
10 2200 3.3 ,," ,
VI_T1.
}IF }IF
: / /
" -_ _ _---J
,L ____ - -
I
U 5[-0316
Pw
5[-0317
1:1
1.8KO
:CJ: (;--",---"-,---,
PW i
....
PW adjusted to obtain required VG
6/6
~ ~~~~m?v~:~~li --------------
546
ru SGS-1HOMSON
~1m [K(A]OOO@~[L~lJOO@[K!]O~
SGSP474
SGSP475
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
547
SGSP474 - SGSP475
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
-Q467
)
~
6-0.5
6=0.2
h-rrr fo- - t-
I-
160
r-""\.
f\-
~
Zth::'KRthJ-c 120
b=0.1 ~
~ S=~
JLJL
1:
80
" '\
0=0,02
..... v_
~ '\
\.L6=0.01 I.
SINGLE PULSE 11111111 II
40 1""-
I I UII I I Illi "- f\-
2 o
tpls} o 40 80 120
-Oll~
iliA I
V",10V J /5.5
IlIAI , V",10V IlIAI
Tcan =-55
V/ 4.5V v
1.1. ...,...- 5.5V
/V/v II
0 5V v
A'/ 4V J Vns =2SV
rv IJ
1#/" Tcasc=25(
t=80jJs
J.V
1o=250~A f-t+ll-bt-t+-t-++-t-j
f.1MHz
VGS ,OV
1OOOf-H\+----+--+--1---1 Tea e ,2S"C 1--1--
aoo~~-+--+--1--+--'---r-1--~ 0.9 f-t--H-t-+-++--t-+-N---+-H+1-t-t+i
0.8 f-+--H-t-+-t--Ht--++---t-t-'kt---H-t-++-1
0.7 f-+--H--t-+-t--Ht--++---t-t-t-+--Nrl-++-1
0.6 f-t+-+---+-H--Hr+-+-++--f-++-+--+,,'f--H
5 '0 '5 20 25 JO 35 40 Vo5(V) -50 -50 50
IL
2.0 ,so(I~ 2S 0 (
1.5
1.0 I
I1I1
-50 50 100 VsolVI
4/5
550
SGSP474 - SGSP475
Switching times test circuit for resistive load Switching time waveforms for resistive load
____ ~90.1.
vi :
:; .:-
10,. I
I
I
Voo I
3.3 I
~F
I
-Vo :
5-6059 td(off) If
Pulse width ~ 100 its S(-0008/l
Duty cycle ~ 2%
V _
D
2200 3.3
~F ~F VOO
---,
I
I
I -_ _ _--J
" L ______ __ .
SC-0311
SC0310
Voo
1.8Kll
:CJ:: Co+~,-C::::J--f
PW i lKn.
....
PW adjusted to obtain required VG
______________________________ ~~~~~~?v~:~~~~----------------------------5--/5
551
SGSP477
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
G~
times make this POWER MOS transistor ideal for INTERNAL SCHEMATIC
high speed switching applications. Typical appli- DIAGRAM
cations include robotics, laser diode drives, UPS,
SMPS and DCIDC converters, electric vehicle dri-
ves and a DC switch for telecommunications.
553
SGSP477
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
6-0.5
160
-
~
6=0.2 ,v -~
.....,..,."
120 '\.
~
Ith::XRthJ-c
6=0.1 r"'"
S =...!.
1~ 1:
'\
JUL 80
$=0,02
'\
V
~6;0.01 ~
'"
I
40
SINGLE PULSE I1111111 II f'\.
2 11111111111111 1111111111 o '\.
tp(s) o 40 80 120
10 (A)
GC-0062 ec-OOIS
lOlA )
lovl/f7v II
, :1 VJ
Tc-5S"c I - -
Tc:25C vos;;;: /I 6V
- Tc2&-C
/r:::::
~v
,.,-;;
6V
V Tc=25C
f--
Tc125-C I--
H.f
'f)
~ tp:::80)Jsec
VOS"25V
~V rJ
~r,.r 5V
I 5V
~ ............ r- r
,
~ ..-
e
4V
1I
VGS .. 4V
o ~ ~
/11
II/I
.4
o o
o VOS{Vl o VDS(V) o VGS(V)
/ ./
II 10=22 A
Tc=25C
r--- IZ /j-/
V :.0
/ / Vos" I~~~
IGOV
IV v/ Y
/ . /V
VOS"25V ./
'/ I
/
I
0~J--L~ _ _L-~-L~_ _L-~~
IO(AI o 'O(A) 0 2 40 60 80 Q(nCI
V
1600
VGS OV
"'-["-.. VOS"VGS ~ ,---
far MHz
10 "250pA /
[200 \ Tc-25OC
5 1"- 5
. . . .V
V
\ '" "- V
:,....-'"
800
\ "-
5
"', 5
IO=250}JA
~
\
,~
. . . . r-.-
-- Coo.
I"'"
5
5
"-
b-
5
0
40 vos(V)
/
-899
1/ IA)
[os mBllIiiI
+-
/ v
/
v
/ /
/
,,/
""V
/
VGs =10V
lo=10A I-- ,---
vos(V)
4/5
556
SGSP477
Switching times test circuit for resistive load Switching time waveforms for resistive load
:r
----~90'I,
vI ,,
10'1, I
t:L
-.J Uv; 3.3
Voo
I
I
~F
I
Pulse width ~ 100 Jls
Duty cycle ~ 2%
SC-0008/l
5 - 6059 td(offl If
VOD
----,
I
I
I
SC-0311
1.8KO
::CJ: :_.-l~.---r---'I---{
PW
...! lKfl.
557
r=-= SGS-THOMSON
~.,L ~OOO@~[L~lJOO@[t(!]o~ SGSP479
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
559
SGSP479
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
_2/_5 _ _ _ _ _ _ _ _ _ _ _ _ _
560
~ ~~~~m~v~:~~~ --------------
SGSP479
6-0.5
6=0.2
.-.-rrr I-
.- 160
-,
Zth="KRthJ_c "-"-
~
120
1~
5=0.0
I- S = J..e.
1:
&=002
JUL 80 "-
V
--tJ '\
!,.L6~0.01 I:
SINGLE PULSE IIIIIII IIIII 40 '\.
I\..
2 11111111I1111 111111111111 o '\.
10 2 10 1 tp(sl o 40 80 120
G(-Ol21
IlIAI I
VGs=lO~
I 6V
V,S~~
~ V
TCilSl=2S0(
.-::;--:V I TCilu=2S0(
~V II 12 f-+-+-+++++-+--+ +-I+++-+--+-+-f-+--H
/ 5V r-- 5V r-- f--
/. J
/ U
.... 4.5V
I
V 4V II 4V
V 1 V
60 2 J 4 5 6 1 8 9 VoslVI
V"IVI Vos/Vl
3/5
561
SGSP479
-- I
b=15A
T'IIM=2S 0 (
r---
I 0.4 I
I I
I I
11 10 blAI 10 20 30 lolAI 100 Ulne)
1\
1\ 0.4 H--H-+-+-+-+-1H-+-+-+-+-++-t-++-H 0.7 H--H-+-+-+-+-1-++-+-+-+-+-+-1-++-+-I
\1\..
1'.... ..... - C,
en 0.5 LL-'--'---'--.L...L-'-.J--'--'--'---'--.L...L-'-.J-L-'---'-'
10 60 VDslVI -50 50 100 -50 50 100
I
I
0.5 _ _
0.1 L....J.-'--"---L--"--L...L--'-~--L--"--L....J.--'-....J
-50 50 o 0.4 0.8 1.1 1.6 1.4 VsoIV)
100
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'J'
vi :
10',. I
I
I
Voo I
3.3 I
~F
I
-Vo :
Vo_
10M
10 ~
~
VOD ",'-
-----,
;I'" '"
'"
SC.0311"------J L ____ - - --.
Voo
lK.n.
1.8KO
:CJ: C....~,---I"-'--.-I
PW
....!
PW adjusted to obtain required VG
565
SGSP481 - SGSP482
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
6=0.5
125
10 2 - .... .....
'
100
I"
I"
: ==.j~
4 ~9#'
/
'"
10ps
100~s f-
10-1 75 ""I"
lO!
1',' lms
50 I"
r-
"
10 0
100 6610'
SGSP481
SGSP482
68
100ms
OCII
102
-
, 'VosIVJ tplsJ
25
o
0 25 50 75 100
"'"I" 125 T""I[J
Ci(~Ol81 GC-0186
I
V=1'1'1/ 8V
Gs
7V_
iliA I
T",,"-55'~ / 22
Tcue,,=2S0(
/J V /~ /' / 125C
JV/ / 1/11
!IJ / lO~~~+-+-+-7V+-4-4-~~
VDs ",25V
{II
///1 6V
III
~/ V ..- J/J
I#'
~/
if'
JY'/'. .
- 5V
4V
5V
o ~ ~
,J
If!
------------------------------~~~~~~~v~:~~~ ____________________________3__
/5
567
SGSP481 - SGSP482
l"'-
0\
1\ . . . . 1'-1- c...
0
\ "- 0,9 H-+-+-+-+-++-+-+-H-N-+-t-I-H-H
/'-. c...
0 ",.... l'"'- t--
-I'-- I'--
t-- r--
I-- ~ 1--_
20 30 40 VoslVI 50 '00
0,5 H--H+-H--H-HH-+-t-H-+++-H
Switching times test circuit for resistive load Switching time waveforms for resistive load
'f
----~90.J.
Vi :
10". I
I
I
VDD I
3.3 I
~F
-Yo :
Vo_
Voo
----,
,,
I
voo
1.8KO
:CJ: Cot:,-C:::J--l.
PW i lKIl.
.....
PW adjusted to obtain required VG
571
SGSP491 - SGSP492
THERMAL DATA
OFF
ON (*)
ENERGY TEST
DYNAMIC
SWITCHING
_2/_5 _ _ _ _ _ _ _ _ _ _ _ _ _
572
~ ~~~~mg1J~:J?n --------------
,SGSP49'! - SGSP492
V SD Forward on voltage V
Iso= 40 A VGs= 0
I 1.4
trr Reverse recovery
time
ISD= 40 A
di/dt = 25 Alp.s
VGs= 0 140 I ns
G(-0467
IO(AI I
6=0.5
- --;
160
,~# r-- '"\.
v '---, - 10~s
6=0.2
~~90;:;:'
-
....,..,;'I
100~s !:: f\-
Z'h=KR'hj.c 120
6=0.1 '\
, 1 s:o.;; 5 i S =..!.e.
1:
lms '\
, &-0.02
~ 80
'\
" 10ms
lOOms
=
-
'V _
~6=0.01 I'
-t;J
40
100
100 2
SGSP491
'SGSP492
46'101 2 468102
DC
,. 2
SINGLE PULSE
1111111111111
III
III
1111111
1111111111
II
o
o 40 80
"" '\.
120
I\.
160 T,..,('[)
""'
0
J V~ ~
f---
Tc1u =25(
)".....- V 7V 30 H-++'y!-=-:!:;Z5d-+-H-+-H-tIItIt+++-H
tp=300J,Js
V '/' ",...- t-- 61
/. ~ / ' --f---- ~
20 f-++++++-+-H-+-f-Ht+t+++-H
0
/~ ' / 6V
6V
frt-++++-H-+-i-t-H-+++-++"i,-+-+
~ :/""",...-V
20
~ ~V I.5V
~ IV
IV
M/f v;:.-:tsv
VoslVI 2 3 4 I 6 7 I V"IYI
VoslVl
-------------- ~ ~~~~m~1J~:~~Jl--------------3-/5
573
SGSP491 . SGSP492
-- ~
~=50A
1,. . =25-(
1 - - - I--
'I 20
I
I
10
20 30 ~IAI o 40 80 120 lolA) 20 40 60 10 100 1l(nC1
0
\\ (norm) {norm.!
240 0
\ VGS",Oy
f=1MHz - - t-- - - ~ t--
\ 1"'- -....... 1,. . ,.251>( io=2S0.uA
/
o \ \ r-.... c... /
150 0
o \
:"- ..........
l"- I--
-- 1.0S
/
/
0
0 "- ..........
-....-1---
r-.... c...
V
-- -- - -
I"-- c,... //
30 0
0
---...
- 0.81--+--+---+-11-+---+---+-1-+---1
- ---j--j----t---t-+--+---r-t--
0.9 S
0
20 30 40
4/5
574
SGSP491 - SGSP492
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90.1.
V ,
I ,
10,. I
I
I 901. --- - - - 90.,.
Voo I I
3.3 I
~F
I
-Vo :
I I
s- 6059 Id(offl If
Pulse width ~ 100 /J-s S(-0008/1
Duty cycle ~ 2%
V(BR)DSS
10M
10 _ .... / 1
Villi
....
10 2200
VF
3.3
JlF I /
/
/
/
,,
VI_Tl.. I /
S(-0316 " - - - - - - ' L - - - - - -
I
U
P.,
S(-0317
1.8KO
:CJ: Co+~,-t=::J--l.
PW : 1Kn.
....
PW adjusted to obtain required VG
5/5
575
SGSP574
SGSP575
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
577
SGSP574 - SGSP575
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
6=0.5
160
~
6=0.2 r--"\.
h-rTr I-
"-
~
Zth:"KRthj_c 120
6=0.1 i-"
~
S =...!..e.
= 1: "-
$=002 == JUL
,-
80
'\
..... v_
~6=0.01 I,' ~ ,"'-
IIIIIII II 40
~
'-:
jNGri Illr 111111111
10- 1 tp{sJ
o
o 40 80
'\
120
r-....
(;(0124
iliA I ,-,--,..---,---,--.---,---,-----l""''-,
Io!:~
iliA I
V".10V / /5.5 _.1 VGs =10V 6V I TU51:=-55
v/ 45V V
Ij;V V
jV/V 1111
~ 5V
1---
#-V 4V I V[Js=2SV
r vI- J
~/ TcIH =2S 0 (
t=80}Js
~V
". TC1u =2S 0 (
t=BO}Js ./#
10 20 30 40 50 60 90 VDs{VI 1 2 3 4 5 9 VGSIVI
VDs{VI
579
SGSP574 - SGSP575
V
/~
0.8 H-++-+-+-+-H-++-++-H-+-t-+-t--H 10,18A
/~
VDs =lSV
V~
~ ~ Vos ,80V
12 c---- 0.6 H-++-+-++-H-++-++-H-+-t-+-t-I'-t 200V
I'~ - - nov
10 -
--
---i -j_.t-::::t:T::'":i,,:;-S:::S'j::(=t~ H-++-+-+-+-H-++-++-Hl0V
0.41++++1++-1++-++-f-j;,1'5+4-t--H
"I- /.~
0.2 ++++-I++-+-+--t-++-1I++++-t--H I
I
10 12 14 16 18 ~IAI
10 20 30 lotAI 20 40 60 100 a InC)
(pF)
C , V(jS(th,--,-,-r-r"T-r",,'-'--'-r-r-~~~
(norm.l H--t-+-+-t-++-t-+-+-+-H-++++-I-+-i
1.4 1-+++-+-1++-+-+-+++-1-+++-+-1-+-+
(norm)
V1BRJDSS 19iE[IJilTI~ti~ffi
~
....... 1'-.,
1
~ 1.lH-+++H-+-++-t-++-11++++-1-+-+
, f .. 1MHz 1.11-++++N-+-+-+--t-++-1-++-+-+-1-+-+
VGS ,OV
- -
1000
800
\~
Tease =25-C
0.9 H--t-+-+-t-+-H-+-N--HH-+++-I-+-i
600
",,, 0.8 I-++++-t-+--H-+-+-+-Plrd--+-++-I-+-+
0.9~miEi
400
200 - f - - Cr55
5
.......
10
~s
15
-
20 25 30 35 40 VoS(V)
0.7 -++-++-H-+++-t-++-t-+-N-+-1-+-l
50
J
2.0 1--++-l-l--+++-1I++++-I+T-i+++-I lS0 0 ( !J 2S'(
1.51--++-+-1--+++-1+++++-++-1++-+-1
1.0 1++++-I+-biLt-+-++-1I++++t--H II
4/5
-50 50 100
" VsolVI
580
SGSP574 - SGSP575
Switching times test Circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1'
VI ,'
10'/. I
I
I
Voo
3.3
~F
I
Pulse width ~ 100 p..s
Duty cycle ~ 2%
5(-0008/1
5- 6059 td (ott) t t
Voo
-----,
I
I
I
SC-0311
Vee
I.SK/l
::CJ: C.:r:.
--C::J--{
PW 1 1KD.
....
PW adjusted to obtain required VG
581
SGSP577
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
583
SGSP577
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
584
SGSP577
6-0.5
160
.......
0=0.2 I-t"\.
I-r-rrr I-
"-
~
Zth='XRthj_c 120
6=0.1 I-
~5 S =...!.2.
1::
'\
.....&-0.02
JLJL 80
'V_
~6=001 i:iJ "-
"'\
SINGLE PULSE m IIIIIIIII~ 40
2 IIIII11111111 I 1111111111
tpis)
o
40 80
"
120
r\
-
lOY
~V -
II,
,
Tc--55C
Tc = 25C
VGS~
6V
I - -I - - Tc"25-C
)-4
'/
/~ ~ V Tc-12S-C '-- f-j fI
~v
6V Tc"25C
h tp z 80 sec
I-- 1----
VOS"25V
III
ld?' I ~
~v 5V
I .v r
,...-
~V
,
~ ......
~v
4V
1
I VGS"4V
I--
~~
/1/
IIJ)
~
o o
o o VDSIV)
v ; /
/ 10=22 A
Tc=25C V l-0
v / Vos" I~~~
ISOV
"7 l~v
/11 17
/jV
j
'VOS"25V
Ij
7
oL-~-L~ __L-~-L~__L-~~
rr
o IO(A) Q(nt)
V1BRlDSS
(norm)
V
00
'" ""-
Vas OV VDS=VGS
f1 MHz
ID~250}JA /'
00 \ Tc a 25C
5 5
/V
BOO
\
5
'" " ", 5;;;-
V V
/
\ \.. IO"250~A
,~
\
1'-.. .
......... ""'"'-
- Coo.
I"'"
- 5
i'--
~
5
0 0.65
-40
VDS(V)
e
vs temperature characteristics
G[-0899
RDSlon J
(norm I
1/ IDS~
(A)~ . . +
/
/ v
./
/ vV Tc=25C
V
... V
V VGs =10V
lo=10A f-- r-- II
II
Vos (V)
586
SGSP577
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'I'
VI '
aUv;
10'" I
I
I
Vee
~ 3.3
~F
I
Pulse width ~ 100 p,s
Duty cycle ~ 2%
S(-0008/1
5-6059 td(ott) If
Vi =10 V
Vo_
VDD
----,
I
I
I1It-_ _ _--J L ___ _____
SC0311
lKA
1.8KO
:CJ:: Ct+~,-C:::J--l.
PW
...i lKfl.
589
SGSP579
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
-2/-5--------------------------~~~~~~?v~:~~n _____________________________
590
SGSP579
-46 )
6-05 "
160 f-I"'.
102'sllilv''''''l_1111111111111 .=0.2
I-r-rrr i-'
I---
10l'~'II"<;IT'iI'W"MIII'~""~"'1'0P~S ~ S =..!..
lOOp' 1:
'\
.=0,02 JlfL 80
'\
'v ' i-i 6;0.01 I
iiJ
100~111'11r-....1'1~
I,'
100m SINGLE PULSE IIIII!I II 40 "\
DC ~
11111111111111 111111111
tpls)
o
o 40 80
'"
120 "160 T""loCJ
G(-0221
.IAI I
V(js=lO~ 6V
V6S"~
Y f/
Ttlse=2S0(
~~ I TCUt =2S 0 (
~V /
/ SV r-- sv r-- f--
/, ..... It
V
/ 4.5V
1
I
I' 4V f 4V
V' 3 V
2 3 4 5 9 Vc;sIVI
VDsIVI VoslVI
c- 1
I 0.4 -- I
L 1
1 , I - - - -I---H-+-++-H--t--+-H
.J
12 ~IAI 10 20 30 lolA) 40 80 100 (llnCl
\\
\\ 0.4 H-+-+-+-+-+--H-++-++-f++-+-+t-H 0.7
\1\..
r-.. (
ern
0.5
20 60Vos(VI -50 50 100 -50 50 100
I50~
soIAlmmEE B
-1---
I
0.5 _ _
0.1 '--'--'--"---'---'-----''---'--'---'----'---'--''---'----'--'
-50 50 100
o 0.4 0.8 1.2 1.6 VsolVI
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1'
V
I
10'" I
I
I
Voo
3.3
~F
I
Pulse width ~ 100 p.,s
Duty cycle ~ 2%
S(-0008/l
5- 6059 Id(off) If
Vo_
VOD
---,
I
I
I
"'-_ _ _--J L ___ _____
SC0311
Voo
MAINS
INPUT
1.8Kll
::CJ: :_07:,-C:::r--L
PW : 1Kfl.
....
PW adjusted to obtain required VG
593
!'=:-= SGS-THOMSON SGSP591
..~1m ~DOO@~[]J~lJOO@~D~ SGSP592
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS
595
SGSP591 - SGSP592
THERMAL DATA
OFF
ON (*)
ENERGY TEST
(single pulse)
DYNAMIC
SWITCHING
IDIA) )
6-0.5
I I
V~
-- -f
I111
!116~s = ,v
160
r----,
;-<::>",0(;:' 100)Js ~ ~
./ Z,o,KR'hJ-c 120
v ~ r~ I t '\
10.1 5=0.05 'r' 0 =-'f
m-- s '\
'\.. , 10ms =
&=0.02 '7
'/ _
f- - - .-Jl..Jl....
----/t.l.1
80
"\
i"""'F+ffi1lit'~~6=0.01 lLJ
100ms -
SINGLE PULSE
I,
mr- -rITnIIInm-IIII~II-mlHl 40
!"'-
"\
11111111.JJl.WIIUIL...L.L:I~IIIIIIILJ..llJJJJJ
DC
SGSP591
SGSP592 I111 W 2 L.LLll.llJlLLIIIII
1l.J..l.l.WL II o '\.
, 'VDS{V) 10. 5 10- 4 10- 3 10-2 10- 1 tp{s) o 40 80 120 160 T",,{OC)
65V
20 r--t-t-t-+-t-t---l-t--t-+Hf+---t--+-1I--+++l
5V
VoslVI
40 2 3 4 5 6 7 I VoslVI
VoslV)
597
SGSP591 - SGSP592
r--
ROSlon 1
(mo.l 1
I-- - I - -
VDS =20V
Vos=35V
-f---i i l
.f-- L _ Vos=50V
40
II I I
Tt . . =-55( / /
30
I
25C
~Gs=10V I
--
IY 125(
20V
~=50A
'IV Tr.M=2SOC
I-- --
f/ 20
I
II
10
20 lO 40 ~IAI o 40 80 120 lolAI 20 40 60 100 IllnC}
240 0
\ v(i5=ov
f=1MHz -- ./
\ 1"'- ......... TcIM =25( lo=2S0}JA
/
'\
o
0
0
\
\
"'- .........
r----..
r-.... c.
c".
-r--
-- I-- I--
1.0 5
/
/
/
..-
"\
--~
0
.........
'-- r--- V
r----.. c.u /V
0
0 -I-
- O.sl-i--+-+--I-+-+-+--f-+---i 0.9 5
0
0.9
50 -50
598
SGSP591 - SGSP592
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90.'.
Vi :
10,. I
I
,
Voo
3.3
~F
I
Pulse width ~ 100 p's
Duty cycle ~ 2%
S(-0008/1
s- 6059
I I
td(offl If
V(BRIOS5
vo -
'OM
Voo
'0 _ / , , 1
....
Voo
10 2200 3.3
....
/ "
}JF I
!IF
v,_T1. I
I /
....
I
"'--_ _ _---' L_
u
Pw
I 5C-0317
5C-0316
1.8KO
~ ~,.....r-,---"
:_...
PW
...i
PW adjusted to obtain required VG
601
STHV82
THERMAL DATA
OFF
ON
DYNAMIC
SWITCHING
G~
verters and lamp ballast. They are also used in high
voltage CTV EHT supplies, interfaces to thyristor
and power transistors operating from 380V and
440V A.C. supplies and resonant converters ope-
rating up to 500kHz.
s
605
STHV102
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
PtotlW
125
I'..
100
'" I'..
'" '""-
75
10~ ~~",li~'I'~'~'~"II~11 50
'"'" --+
:;::~
*
Hit 10ms
- 25 ~
I, INGLEP11Lrf:m
I'
10-1
(I ,lOOms
D( iii w'
10- 5
~I
10-410- 3
10 , '10' "103 ' 'VosIV) 25 50 75 100 125 Tcos.lC)
'
-459
lolA) lolA )
. / ~ Tv
VGS =10V /
/ / I
-
Tc=25(
tp=80"s
IV -
Vos=25V
Tc=25( I
V tp=80"s
1
1/ IL /"
# II J
5V r--
~ V
1/ J / Vos=25V
Tc=2S0(
J l/ Ii tp=80"s
'/. 4V
/
12 16 VosIV) VGSIV) lolA)
607
STHV102
HI.'---1---
-L_. I-~
10
T,=25C I
,.-f--- tp.80~s 2000 f=1MHz I VV
4 r-+- VGs=10V c-+--r----f--t-- ~G~;2050C-
V
1500 ~-I-I----- .._-=r'-....-.-.. V
r\-+--I--I--+--- - .... _.
1000 l\ (iss ~ _ . . __ __..
17
11-+- ,- f--f-I--+-+--f--+-- -, :
Vos=500V
lo=6A c---+-
11
'\ 110
1 II
'\ // _. VGs =10V J
I'\. VOS=VGS
/
1o=2A
)/
-
1o=250"A I-- - to 5 1.5 -- f--,
"- 0.. _ .. --
V
/
1 ./
V
0.9 -- I---
"- / -
T..... 7
:/ [...-1'
0.8
t\. 0.9 5
1o=2S0"A
. I--- 5
V [
t-... - r\. :
07
-50 ~o 100 " 150 TjloCJ
0.9
-50 so 100 -so
I
so 100
T(=25C
VGs=O
VV
10
V
VsoIV)
4/5
608
~ ~~~~m== --------------
STHV102
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1'
vI ,,
10',. 1
I
1
Voo
3.3
~F
I
Pulse width ~ 100 p,s
Duty cycle ~ 2%
SC-OOOS/l
s- 6059 td(otf) tf
1.8KO
::CJ:: C,-!-~,-C=::::::J--l
PW i lKfl
--
PW adjusted to obtain required VG
609
STLT20
STLT19
N - CHANNEL ENHANCEMENT MODE
LOW THRESHOLD POWER MaS TRANSISTORS
PRELIMINARY DATA
611
STL T20/FI - STLT19/FI
OFF
ON **
VGS (th) Gate threshold Vos= VGS 10= 250 IlA 1 2.5 V
voltage
DYNAMIC
SWITCHING
"
D.C. OPERATION
10msr--
Tc=2S0[ 30
20 \.
10 '\.
STLT19
I STLT20
20 40 60 80 100
"'\.
120 Tease ICI
, "10 2 2 'VosiVI
12 H-+++++-t-HH--H-+-1 Vos=2SV
H-t-t-+++++-f---1---1f--t-H TJ=2SoC
f--V.f-t-+-+-++++-H-+-+--I-I--H3V
613
STLT20/FI - STLT19/FI
300 I-r-\;;
/ Vos=48V
lo=15A -- -
t------t-+--I-H--1-+-+ -
1-\+++-PI....J::r---I,...-+-+-+-I[oss 1--1---.
/ TJ=25[
-
1/ [rss 1--+-1-
12 16 (o(A) 12 10 20 30 Vos(V)
2 1.15 1---+--+--+-1---+---+---+---1--1---1
.........
................... 1.5
/ '"
-""vI-"" /
.0
......... , 1.05 1--+---+--+-1---+-::"""'4--1-+----1
".,.-:. .......... v V
............
.8 .......
............
0.95 1:;;...-4~--+/-+---+----IVGS=O /
Vos=VGS lo=250pA 1.0 /
- I - - lo=250~A
Y VGs =5V
lo=75A - - - - -
6 0.85 1---+--+--+-11---+---+---+-1-+----1 /
,-+---+--+---I~+---+---+---Ir-
V
i
4 0.75 L..----'---'-.......L--'_-'---"--.......L--'_-'--...J O.S
-50 50 100 40 40 80 -80 -40 40 80 120 TJ([)
4/6
614
STLT20/FI - STL T19/FI
Switching times test circuit for resistive load Switching time waveforms for resistive load
Vi I----~/
~O.,. :~
I
Voo I
3.3 I
~F
I
-Vo :
5-6059 td (otf) If
Pulse width ~ 100 its S(-0008/l
Duty cycle ~ 2%
1.8Ma
ISOWATT DATA
6"0.5
.!1tr """
... I 111m
1111111
-0422/1
50
40
)
GC-0414
~ ~
jZth=KRthj-c
is:..!..
,
'JUl..
1:
30 ,
i-
6"0.05
.-t;j
~!!~OEC.~OP~ERAETIO~N"!'[!'IE'Oi
0 6"0.02 .........
ms 6"0.01 20
10 , ~ 100ms SINfiUI PUlSE ~
"",-
III 11111 II 10
STLT19FI III i"-
10-"0~0----:~---LJ...LLJ...JJ..,--ST-LT-20F-1LUulw
, 10'
jl
'VosIV)
III 1111111 o
a 25 50 75 100 125
t.....
Teos.loc
INTERNAL SCHEMATIC
DIAGRAM
617
STL T30 - STL T29
THERMAL DATA
OFF
ON
VGS (th) Gate threshold Vos= VGS 10= 250 itA 1 2.5 V
voltage
DYNAMIC
SWITCHING
-------------- ~ ~~~~m?lr~:9Jl-----------~-3-/3
619
STVHD90
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
PRELIMINARY DATA
621
STVHD90
THERMAL DATA
OFF
ON (*)
DYNAMIC
SWITCHING
GU-1621
Ptot lW)
14 0
--l 0f'''
III
120 -
---..
<:f.~S\O~.:x~ t', 10~s
100 _ _
'\.
" 10 0
'\.
100~ ~
I-~ F 0
I'\.
lms I'\.
~
Zth.:KRthJ_c
D,C OPERA TION ..... I'\.
....... "'" 10ms b = J..E.
1:'
0
'\.
'6,;005
'\.
LW-
lOOms
r-- ~:::~ JUL 0
I\:
14'+++llIIlI-----+S"{,INl',';'GlEn,;P",-,,UL.f';SErl-IlHlIitj
III K.
L.LWJillLJ...L.lIIlJJ.lJLlJIIIIIIIIWlllL-~--l2.I.J.illJ
0
I'\.
III W2
10-5 W2 w' tplsl I'\.
, VoslVI
50 100 TeaselC)
~
V Vos=25V ~""i25O[ 60
60 I-- l- 60
II I-- i~:2~~~['-..
/'/ 7V
'{f Tr125O[~ t> i.- F"'
8 VoslVI 20 40 60 80 lolAI
3/5
-----------------------------~~~~~~~~~:~~~~ --------------------------
623
STVHD90
32 46 64 10 20 30 40 VoslVI
40 60 120 160 lolAI 16
10 \ 1.06
f----t- lo=250~A
V 1.8
VGs =10V
lo=30A I
r\ 17
0.93 1.0 V 1.4
V
VOs=VGS \ V V
f----f---- lo=250~A
V
0.66
0.79
" 1"\
I\.
0.94
0_88 "
V 1.0
_vV
/17
0.6
-50 50 -50 -so 50 100
10 I
0 0.4 0.8 12 16 2.4 VsolVI
4/5
624
STVHD90
Switching times test circuit for resistive load Switching time waveforms for resistive load
~
____ ~90'1.
vi :
10'/. I
I
I
Vee I
3.3 I
~F
I
-Vo :
VD _
SC-031 0
t8Kll
:CJ: (_o+~,-C=:J--{
. PW ! lKn
...
PW adjusted to obtain required VG
625
STHI07N50
STHI07N50FI
HIGH INJECTION N-CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTORS (IGBT)
PRELIMINARY OAT A
TYPE Voss 10
STHI07N50 500 V 7A
STHI07N50FI 500 V 7A
OFF
ON (*)
DYNAMIC
SWITCHING
RESISTIVE LOAD
td (on) Turn-on delay time Voo= 400 V 10= 10 A 100 150 ns
tr Rise time Vg = 10V Rg = 100 n 700 1000 ns
td (off) Turn-off delay time 500 700 ns
tf Fall time 800 1500 ns
SWITCHING (continued)
INDUCTIVE LOAD
Voo= 12 V
td (off) Turn-off delay time Vos clamp = 350 V 10= 7 A 1 1.4 J1-S
tf Fall time VGs= 10 V Rg = 100 n 1.1 1.5 J1-s
L = 10 mH Tj = 100C
0=0.5
100
10' ',,.!"'
1)ls
~
5~s
,o~s
80 1"'-
"" "
Zth:KRthj_c
,oo~s
.
g'IMI~I~ s=-it
10 0
o.c "- 10-'
60
40
"'" ~
10-'
:
\ lOms
20
I"!"
'"
;--.-
10- 2 -IUJ o
6. 69 tpls) o 25 50 75 100 125 T""IO[)
10 0 10' 102 VoslVI
12
/ /
11/. /
I, V - 8V
TJ =25(' - -
VGs=10V-:::;~
/'
/
,/
25 0 ( . /
A
V":;OOO(
Iii V 7V / //
Iff V ...- L- I/v_VGs=15V
.6
// TJ =125(
lfi .....-:""
JV 6V JJ.V ~y
.",
1/ [2\'
1 ~""
'l/: I '"
1
4 VosIV)
12 16 lolA) o 10 15 20 25 lolA)
16
Vos=400V
lo=12A /~I-
- f--_ ........,,,
10:~.~~~MI
12
/
r=
V 0.96
"\ 1\
10-;
1--1= Tr 100 0[
1--+--+++f-HH Rg=100 ohm -
L=180~H
I - - __
/ 092
J
10 20 30 40 50 Ug (n[1
0.88
-50 50
INPUT
SIGNAL
~
Vd'mp
VOS
~
o ----
4/6
STHI07N50 - STHI07N50FI
Switching times test circuit for resistive load Switching time waveforms for resistive load
t
:r
----~90.1.
vI ,
,
10'. I
I
VDD I
2200 3.3 VDD
}IF }JF
I
I I
5(-0345 5-6059 td (ott) If
Pulse width ~ 100 p,s
Duty cycle ~ 2%
Clamped inductive load and RBSOA test circuit Clamped inductive waveforms
V _
D
VDD
~
I
I
IL.. _ _ _--J L ________ .
SC0311
SC032211
VDD
PW i
.....
)W adjusted to obtain required VG
Fig. 1
ISOWATT DATA
/ GC-0415
PtotlW)
6~0.5
1~'~
50
101 ,I' II "~
5~,
10~'
~ - i--' 40
,
Zth:KRthj-c
" ~
10-t~ i"""
o.c., I"
100p' S::-Jf f""'..
10 0, 30
6"0.0 JLfL r-....
~~~ i;j .........
20
10-1 '\
';J.of
~}r
',-
i'-,
it~~TI
~ 10 ........
o .........
10"2 ~,:----'--!,--'c,~,1L---L...l...L.LLL11L--'-,----'--'-,uljuu
I,ll
2
tpls)
o 25 50 75 100 125 Teos,
10 0 101 ' , '10 2 VosIV)
TYPE Voss 10
STHI10N50 500 V 10 A
STHI10N50FI 500 V 10 A
633
STHI10N50 - STHI10N50FI
OFF
ON (*)
DYNAMIC
SWITCHING
RESISTIVE LOAD
td (on) Turn-on delay time Voo= 400 V 10= 10 A 100 150 ns
tr Rise time Vg = 15 V Rg = 100 n 700 1000 ns
td (~ff) Turn-off delay time 500 700 ns
tf Fall time 800 1500 ns
SWITCHING (continued)
INDUCTIVE LOAD
td (011) Turn-off delay time VDS clamp = 350 V ID= 10 A 0.7 1.2 p's
Ips
101 I
, UII
100
1"-
:
'"."1"'-
5"s
60
1~~
100
O,L , III 60
: lms
"-
T,_25(
SI~GLE
\-'
m 0 "-
PULSE ' \
10ms "'-
10- 2
:
100 2 "'101 2
1111111
III
"'102 2
11111
'VosiVI
20
o
o 25 50 75 100
'""-
125
1"'-
Teas.loCi
16
VGs=15V 1-1 / / 12
VOS=25V
t,=~oo~s
TJ=25(
//
'/10QO(
II / 6V
/ 25(/
12 l /"
TJ =25(- r--- r---
/ A
I"/. / VGs=10V-::::;~ ~"'OOO(
/lV 7V V _I // 0
VII V i--"
j/V Tj"125( /- 1/ /~VGs=15V
h ,. /'.'"
JV 6V ,,'I
..IV":
Iv
I&( I !>V
I 4~i"
,
1/
4 VoslVI 12 16 lolAI 10 ,15 20 25 lolAI
____________________________ ~~~~~~~~:~~---------------------------3-/6
635
STHI10N50 - STHI10N50FI
1:~.EHI.1
12
V 0.96 ['-.,. TI=1000[
V Rg=100 ohm
L-180 ~H f+tH-+-I-+tttHl
/ 0.92 ~ 10-; _ _
J
1/ 10-2 II
0.88
10 20 30 40 50 o.g InO -50 50 100 2 4 6 8101 2 4 G 8102 2 4Vos(Vl
r-"t,;;1t 25[
-I-"
50011--+---,-,-+-+-+-+-+-"---:-'---+--1
= t f1t 25[
... J---11
...1'
I--+-+-+-+-+-+--+- Rg=100 r- .A<J...... +-"' tdloffl 25[
VGs =10V
10 lolAi
50 0
20
:::.n40 60 80 100 Rglll)
4/6
636
STHI10N50 - STHI10N50FI
Switching times test circuit for resistive load SWitching time waveforms for resistive load
~
. ____ ~90./i
Vi :
101. I
I
P" I
ro 2200 3.3 VOO I
ViLJL }JF }JF I
-VO :
Clamped inductive load and RBSOA test circuit Clamped inductive waveforms
VDD
----,
I
I
I
SC-0311
SC-0322/1
::CJ: (;~,-r-I---{
PW ! lKn
.....
PW adjusted to obtain required VG
Fig. 1
ISOWATT DATA
"- I~s
6.0.5
, 50
i'. " I" rllll II ~
kl-'
5~s
lOvs
~ -
, I---: 40
~
Zlh=KRth;-C
"- ,oo~
10~ _
i'-
_
'\
Ims
Hr
6.0.0
"..
s=-Jt
JL.rL 30
l"-
i'....
"-
0[1\ 10ms
6.0.1'
1--"'11
AYI'
-tJ 20
........
...... i'.
t'--
1tm[~~ln
lL 10
"-
10-2
10 4 10 3 10 2 10' 10 tplsl
o
o 25 50 75 100 125
"
Teas.loe
,~
METALLIZATION: SCHEMATIC DIAGRAM
Top AI
Back Au I Cr I Ni I Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 47 x 51 mils
Voss ROS (on) 10*
Gate 15 x 18 mils
RECOMMENDED WIRE BONDING: 50 V 0.04 n 30A
S6urce AI - max 20 mils
Gate AI - max 5 mils N-channel enhancement mode POWER MaS field
effect transistor. Easy drive and very fast switching
times make this POWER MaS ideal for high speed
switching applications.
Die geometry
MC-0075
SOURCE
GATE
Drain on backside
639
BUZ11 CHIP
NOTES: 1 - Due to 'probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 P.s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
_2/_2__________________________ ~~~~~~~~:~~-----------------------------
640
BUZ11A CHIP
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR IN DIE FORM
Die geometry
SOURCE
GATE
Drain on backside
641
BUZ11A CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni~
ques: pulse width < 300 itS, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
2/2
642
BUZ21 CHIP
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR IN DIE FORM
G~
METALLIZATION: SCHEMATIC DIAGRAM
Top AI
Back Au/Cr/Nil Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 40 x 34 mils ID *
Gate 15 x 19 mils
VDSS RDS (on)
RECOMMENDED WIRE BONDING: 100 V 0.1 n 19 A
Source AI - max 15 mils
Gate AI - max 7 mils N-channel enhancement mode POWER MaS field
effect transistor. Easy drive and very fast switching
times make this POWER MaS ideal for high speed
switching applications.
Die geometry
MC-0074
Il!II SOURCE
GATE
Drain on backside
643
BUZ21 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 p,s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
Die geometry
MC-0074
SOURCE
GATE
Drain on backside
645
BUZ32 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width <300 P.s, duty cycle <2%
2 - For detailed device characteristics please refer to the discrete device datasheet
G~
SCHEMATIC DIAGRAM
METALLIZATION:
Top AI
Back Au/CrlNi/ Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 28 x 30 mils
Voss ROS (on) 10 *
Gate 16 x 18 mils
RECOMMENDED WIRE BONDING: 50 V 0.1 n 14 A
Source AI - max 10 mils
Gate AI - max 5 mils N-channel enhancement mode POWER MOS field
effect transistor. Easy drive and very fast switching
times make this POWER MOS ideal for high speed
switching applications.
Die geometry
SOURCE
GATE
Drain on backside
647
BUZ71 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 /Ls, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
,~
SCHEMATIC DIAGRAM
METALLIZATION:
Top AI
Back Au/Cr/Ni/Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 56 x 43 mils ID *
VDSS RDS (on)
Gate 18x18 mils
RECOMMENDED WIRE BONDING: 60 V 0.055 (2 40A
Source AI - max 20 mils
Gate AI - max 7 mils N-channel enhancement mode POWER MOS field
effect transistor. Easy drive and very fast switching
times make this POWER MOS ideal for high speed
switching applications.
Die geometry
SOURCE
GATE
Drain on backside
649
IRF151 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 p,s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
_2/_2___________________________ ~~~~~~~V~:~~~~-----------------------------
650
IRF520 CHIP
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR IN DIE FORM
,~
METALLIZATION: SCHEMATIC DIAGRAM
Top AI
Back Au I Cr I Ni I Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 28 x 30 mils
Voss Ros (on) ID *
Gate 16x18 mils
RECOMMENDED WIRE BONDING: 100 V 0.27 n 9.2A
Source AI - max 10 mils
Gate AI - max 5 mils N-channel enhancement mode POWER MOS field
effect transistor. Easy drive and very fast switching
times make this POWER MOS ideal for high speed
switching applications.
Dif] geometry
M[-0071
SOURCE
GATE
Drain on backside
651
IRF520 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 p,s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
_2/_2 _ _ _ _ _ _ _ _ _ _ _ _ _ ~ ~~~~mgr~:~~Jl--------------
652
IRF540 CHIP
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR IN DIE FORM
Die geometry
MC-0075
SOURCE
GATE
Drain on backside
653
IRF540 CHIP
I RDS(oo)
Static drain-source
on resistance
VGs= 10 V 10=1 A 77 mO
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 p,s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
_2/_2__________________________ ~~~~~~~vT:~~~----------------------------
654
IRF620 CHIP
N ~ CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR IN DIE FORM
,~
METALLIZATION: SCHEMATIC DIAGRAM
Top AI
Back Au/Cr/Nil Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 19 x 27 mils
Voss Ros (on) 10 *
Gate 30 x 20 mils
RECOMMENDED WIRE BONDING: 200 V 0.8 n 5A
Source AI - max 7 mils
Gate AI - max 7 mils N-channel enhancement mode POWER MOS field
effect transistor. Easy drive and very fast switching
times make this POWER MOS ideal for high speed
switching applications.
Die geometry
SOURCE
GATE
Drain on backside
655
IRF620 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 p,s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
Die geometry
MC-0071
IIlI SOURCE
GATE
Drain on backside
657
IRF720 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 J.ts, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
2/2
-----------'-------
Gil SGS-mOMSON
'J, '" IKltlU((;ffil@!l;IL!l;((;'jj'ffil@It(I]U~ ---------------
658
IRF730 CHIP
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR IN DIE FORM
,~
METALLIZATION: SCHEMATIC DIAGRAM
Top AI
Back Au/CriNi/Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 30 x 24 mils
Voss Ros (on) I0
Gate 20 x 16 mils
RECOMMENDED WIRE BONDING: 400 V 1 n 5.5 A
Source AI - max 10 mils
Gate AI - max 7 mils N-channel enhancement mode POWER MaS field
effect transistor. Easy drive and very fast switching
times make this POWER MaS ideal for high speed
switching applications.
Die geometry
Me-D072
SOURCE
GATE
Drain on backside
659
IRF730 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 p,s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
Die geometry
-0073
l1li SOURCE
GATE
Drain on backside
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width <300 ""s, duty cycle <2%
2 - For detailed device characteristics please refer to the discrete device datasheet
Die geometry
SOURCE
GATE
Drain on backside
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 /Ls, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
_2/_2__________________________ ~~~~~~~~:~~----------------------------
SGSP301 CHIP
N - CHANNEL ENHANCEMENT MODE
POWER MaS TRANSISTOR IN DIE FORM
Die geometry
SOURCE
GATE
Drain on backside
665
SGSP301 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 P.s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
Die geometry
MC-0079
SOURCE
GATE
Drain on backside
667
SGSP341 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 p,s, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
_2/_2 _ _ _ _ _ _ _ _ _ _ _ _ _
668
~ ~~~~m~1J~:~~~~ --------------
~ SGS-THOMSON
II.., L U0ll0OO@~DJ~u[fJ@[KDO~ SGSP358 CHIP
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR IN DIE FORM
,~
METALLIZATION: SCHEMATIC DIAGRAM
Top AI
Back Au/Cr/Nil Au
BACKSIDE THICKNESS: 6100 A
DIE THICKNESS: 16 2 mils
5
PASSIVATION: P-Vapox
BONDING PAD SIZE:
Source 15 x 15 mils
Voss Ros (on) I0 *
Gate 17x19 mils
RECOMMENDED WIRE BONDING: 50 V 0.30 7A
Source Au - max 5 mils
Gate Au - max 2 mils N-channel enhancement mode POWER MOS field
effect transistor. Easy drive and very fast switching
times make this POWER MOS ideal for high speed
switching applications.
Die geometry
SOURCE
GATE
Drain on backside
669
SGS358 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width <300 p,s, duty cycle <2%
2 - For detailed device characteristics please refer to the discrete device datasheet
Die geometry
SOURCE
GATE
Drain on backside
671
SGSP477 CHIP
NOTES: 1 - Due to probe testing limitations dc parameters only are tested. They are measured using pulse techni-
ques: pulse width < 300 /Ls, duty cycle < 2%
2 - For detailed device characteristics please refer to the discrete device datasheet
2/2
---------------.
ml SGS-1HOMSON
'], '" IR:j]n~ffil[l;IL[l;~'jj'ffil[RI]U~~ ---------------
fl7?
PACKAGES
673
50T-82
MINIATURE PACKAGE
WITH SAME PINOUT
AS TO-220 IDEAL FOR
MOUNTING WITH CLIPS
MECHANICAL DATA
A
DIMENSIONS
mm inches
min max min max
B A 7.4 7.8 0.295 0.307
B 10.5 10.8 0.413 0.425
C 2.4 2.7 0.094 0.106
0 0.7 0.9 0.027 0.035
H E 2.2 !}tp. 0.087 typo
F 0.49 0.75 0.019 1 0.029
G 4.4 typo 0.173 typo
H 2.54 !1'P. 0.100 typo
L 15.7 typo 0.618 typo
M 1.2 typo 0.047 typo
o
M
F PC-0303
LEAD FORMED
SOT-82 FOR SURFACE
MOUNTING ASSEMBLY
MECHANICAL DATA
c DIMENSIONS
mm inches
min max min max
A 7.4 7.8 0.295 0.307
B 10.5 10.8 0.413 0.425
C 2.4 2.7 0.094 0.106
L
0 0.7 0.9 0.027 0.035
E 2.2 typo 0.087 typo
F 0.45 0.65 0.017 J 0.026
G 4.4 typo 0.173 typo
H 3.8 typo 0.149 typo
I 1.8 typo 0.070 typo
L 0.1 typo 0.004 typo
PC-0276
M 3.8 4.2 0.149 0.165
N 2 typo 0.078 typo
0 6 typo 0.236 typo
Oi 45 45
P 8.5 typo 0.334 typo
Q 6.7 typo 0.263 typo
R 3.5 typ .. 0.137 typo
S 1.2 typo 0.047 typo
T 1 typo 0.039 typo
U 4.5 typo 0.177 typo
----------------------------~~~~~~~v~:9~
676
----------------------------
TO-220
MECHANICAL DATA
A
DIMENSIONS
M
mm inches
min max min max
A 10 10.4 0.393 0.409
B 15.2 15.9 0.598 0.626
C 12.7 13.7 0.500 0.539
D 6.2 6.6 0.244 0.260
E 4.4 4.6 0.173 0.181
F 3.5 5.5 0.137 0.216
G 2.65 2.95 0.104 0.116
H 17.6 typo 0.692 typo
L 1.14 1.7 0.044 0.067
M 3.75 3.85 0.147 O~ 151
N 1.23 1.32 0.048 0.051
P 0.41 0.64 0.016 0.025
R 2.4 2.72 0.094 0.107
S 4.95 5.15 0.194 0.203
T 2.4 2.7 0.094 0.106
U 0.61 0.94 0.024 0.037
pin 1: GATE - pin 2: DRAIN - pin 3: SOURCE
MECHANICAL DATA
A
DIMENSIONS
mm inches
min max min max
A 9.8 10.6 0.386 0.417
B 15.7 16.5 0.618 0.649
C 12.7 14.1 0.500 0.555
D 4.18 4.82 0.164 0.189
E 2.3 2.9 0.090 0.114
G 3 3.8 0.118 0.149
H 3 3.2 0.118 0.126
L 9 9.4 0.354 0.370
M - 6.35 - 0.250
N 0.63 1 0.024 0.039
P 2.29 2.79 0.090 0.109
R 4.83 5.33 0.190 0.209
S 0.33 0.66 0.013 0.026
T 2.28 2.9 0.089 0.114
pin 1: GATE - pin 2: DRAIN - pin 3: SOURCE
~7R
TO-218 (SOT-93)
MECHANICAL DATA
A B DIMENSIONS
mm inches
min max min max
A 14.7 15.2 0.578 0.598
B 4.7 4.9 0.185 0.193
C 1.9 2.1 0.075 0.082
D 1.1 1.3 0.043 0.051
E 10.8 11.1 0.425 0.437
F 2.5 typ 0.098 typ
G 0.5 0.78 0.019 0.030
H 18 ty~ 0.708 ty~
L 3.95 4.15 0.155 0.163
M 4 4.1 0.157 0.161
G N - 16.2 - 0.637
P 31 typ 1.220 typ
PC-02S?
R - 12.2 - 0.480
pin 1: GATE - pin 2: DRAIN - pin 3: SOURCE
MECHANICAL DATA
A
DIMENSIONS
mm inches
min max ' min max
A 15.8 16.2 0.622 0.637
8 5.35 5.65 0.210 0.222
C 3.3 3.8 0.130 0.149
D 1.05 1.25 0.041 0.049
E 10.8 11.2 0.425 0.441
F 2.9 3.1 0.114 0.122
G 0.45 1 0.017 0.039
H 20.25 20.75 0.797 0.817
L 4.85 5.25 0.190 0.206
M 3.5 3.7 0.137 0.145
W
N 20.8 21.2 0.818 0.834
G
P 40.5 42.5 1.594 1.673
PC-02BB R 19.1 19.9 0.752 0.783
S 22.8 23.6 0.897 0.929
T 2.1 2.3 0.082 0.090
U 4.6 typo 0.181 typo
W 1.88 2.08 0.074 0.081
pin 1: GATE pin 2: DRAIN - pin 3: SOURCE
680
TO-3
MECHANICAL DATA
G H
DIMENSIONS
-- I-L
min
mm
max min
inches
max
A 25 26 0.984 1.023
B 38.5 39.3 1.515 1.547
C 30 30.3 1.181 1.193
rN r D 16.5 17.2 0.649 0.677
t E 10.7 11.1 0.421 0.437
I L
M
G
H
11
8.32
1.5
19
13.1
8.92
1.65
20
0.433
0.327
0.059
0.748
0.515
0.351
0.065
0.787
N 0.97 1.15 0.038 0.045
P 4 4.09 0.157 0.161
pin 1: GATE - pin 2: DRAIN - pin 3: SOURCE
681
TO-240
4000V DC
FULLY ISOLATED
INDUSTRY STANDARD MODULE
MEETS UL AND VDE
SAFETY STANDARDS
MECHANICAL DATA
F~
DIMENSIONS
mm inches
min max min max
A 91.5 92.5 3.602 3.641
B 79.75 80.25 3.140 3.160
C 19.5 20.55 0.767 0.809
0 29.00 31.00 1.141 1.220
E 28.8 30 1.134 1.181
F 8.5 typo 0.334 typo
G 24.4 typo 0.960 typo
H 19.5 20.5 0.767 I 0.807
L 6.2 typo 0.244 typo
M 8.95 11.05 0.352 0.435
PC-0296 N 0.78 0.84 0.030 0.033
P 2.72 2.87 0.107 0.113
R 14 - 0.551 -
S M5
----------------------------~~~~~~~~:~~~~ -----------------------------
DICE FORM
Wafer pack
Suffix 01: wafer tested and inked
Suffix 03: wafer tested, inked and
scribed at 70%
Circle pack
Suffix 04: wafer tested inked and
scribed at 100%
~ SCiS1HOMSON _ _ _ _ _ _ _ _ _ __
- - - - - - - - - - - - - . ..,,,. [iljJO(f;rnl@[gu'[g(f;'ii'rnl@~O(f;~ 685
ST SALES OFFICES
IlJl:
1,/", LlTOSTAMPA IDONEA - CATANIA