FEEDER-2D60:

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Test Object - Device Settings
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Substation/Bay:
Substation: Borampalli Substation address: Borampalli
Bay: bay Bay address: bay address
. . .
Device:
Name/description: Multilin D60 Manufacturer: GE
Device type: Line Distance Protection Device address: device address
Serial/model number: serial no.
Additional info 1: Protected object name
Additional info 2: D60-N03-HLH-F8L-H6P-M6K-PXX-
UXX-WXX
. . .
Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 115.0 V V primary: 400.0 kV
I nom (secondary): 1.000 A I primary: 1.200 kA
. . .
Residual Voltage/Current Factors:
VLN / VN: 1.732 IN / I nom: 1.000
. . .
Limits:
V max: 500.0 V I max: 50.00 A
. . .
Debounce/Deglitch Filters:
Debounce time: 3.000 ms Deglitch time: 0.000 s
. . .
Overload Detection:
Suppression time: 50.00 ms

Test Object - Distance Settings

. . . .
System parameters:
Line length: 6.040 Line angle: 84.00
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:
. . . .
Tolerances:
Tol. T rel.: 3.000 %
Tol. T abs. +: 30.00 ms Tol. T abs. -: 30.00 ms
Tol. Z rel.: 5.000 % Tol. Z abs.: 20.00 m
. . . .
Grounding factor:
Z0/Z1 mag.: 3.290000 Z0/Z1 angle: -5.000000
Separate arc resistance: no

Zone Settings:
Label Type Fault loop Trip time Tol.T rel Tol.T abs+ Tol.T abs- Tol.Z rel. Tol.Z abs
Z1LL Tripping L-L 40.00 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 241.5 m
Z2LL Tripping L-L 340.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 362.5 m
Z3LL Tripping L-L 640.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 453.0 m
Z4LL Tripping L-L 1.240 s 3.000 % 30.00 ms 30.00 ms 5.000 % 782.0 m
Z1LN Tripping L-E 40.00 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 245.6 m
Z2LN Tripping L-E 340.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 368.6 m
Z3LN Tripping L-E 640.0 ms 3.000 % 30.00 ms 30.00 ms 5.000 % 460.7 m
Z4LN Tripping L-E 1.240 s 3.000 % 30.00 ms 30.00 ms 5.000 % 795.4 m
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Linked XRIO References

Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 1.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNOM V_nom 115.00 V RIO/Device/Nominal Values/V nom

Test Settings
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Test model:
Test model: constant test current ITest 2.000 A
Allow reduction of yes
ITest/VTest:
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Fault Inception:
Mode: random
DC-offset: no

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Times:
Prefault: 1.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception
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Other:
CB simulation: off Extended zones: not active
Switch off at zero yes
crossing:

Test Results

Shot Test: Fault Type L1-E

|Z| Phi t nom t act. Dev. ITest Result
3.536 45.73 40.00 ms 33.80 ms -15.5 % 2.000 A Passed
3.546 86.27 40.00 ms 35.80 ms -10.5 % 2.000 A Passed
6.149 83.67 340.0 ms 336.9 ms -0.9118 % 2.000 A Passed
8.497 84.66 640.0 ms 636.0 ms -0.625 % 2.000 A Passed
12.05 87.31 1.240 s 1.229 s -0.8629 % 2.000 A Passed
19.14 38.97 1.240 s 1.229 s -0.8952 % 2.000 A Passed
14.83 -33.09 40.00 ms 29.90 ms -25.25 % 2.000 A Passed
12.80 8.86 40.00 ms 32.60 ms -18.5 % 2.000 A Passed
10.32 -17.26 40.00 ms 28.20 ms -29.5 % 2.000 A Passed
13.80 26.82 340.0 ms 333.1 ms -2.029 % 2.000 A Passed
25.82 -13.88 340.0 ms 329.9 ms -2.971 % 1.752 A Passed
26.38 4.53 340.0 ms 330.5 ms -2.794 % 1.715 A Passed
15.11 67.33 1.240 s 1.231 s -0.6935 % 2.000 A Passed
28.96 -39.41 340.0 ms 333.5 ms -1.912 % 1.561 A Passed
30.41 20.01 1.240 s 633.0 ms -48.95 % 1.487 A Passed
36.16 23.83 1.240 s 1.230 s -0.8387 % 1.251 A Passed
15.30 107.28 1.240 s 1.235 s -0.4194 % 2.000 A Passed

Shot Test: Fault Type L2-E

|Z| Phi t nom t act. Dev. ITest Result
3.536 45.73 40.00 ms 30.60 ms -23.5 % 2.000 A Passed
3.546 86.27 40.00 ms 36.80 ms -8 % 2.000 A Passed
6.149 83.67 340.0 ms 333.9 ms -1.794 % 2.000 A Passed
8.497 84.66 640.0 ms 638.1 ms -0.2969 % 2.000 A Passed
12.05 87.31 1.240 s 1.228 s -1 % 2.000 A Passed
19.14 38.97 1.240 s 1.230 s -0.7823 % 2.000 A Passed
14.83 -33.09 40.00 ms 27.60 ms -31 % 2.000 A Passed
12.80 8.86 40.00 ms 30.80 ms -23 % 2.000 A Passed
10.32 -17.26 40.00 ms 25.50 ms -36.25 % 2.000 A Passed
13.80 26.82 340.0 ms 336.6 ms -1 % 2.000 A Passed
25.82 -13.88 340.0 ms 332.4 ms -2.235 % 1.752 A Passed
26.38 4.53 340.0 ms 335.9 ms -1.206 % 1.715 A Passed
15.11 67.33 1.240 s 1.232 s -0.6774 % 2.000 A Passed
28.96 -39.41 340.0 ms 332.1 ms -2.324 % 1.561 A Passed
30.41 20.01 1.240 s 632.2 ms -49.02 % 1.487 A Passed
36.16 23.83 1.240 s 1.232 s -0.629 % 1.251 A Passed
15.30 107.28 1.240 s 1.233 s -0.5484 % 2.000 A Passed

Shot Test: Fault Type L3-E

|Z| Phi t nom t act. Dev. ITest Result
3.536 45.73 40.00 ms 32.00 ms -20 % 2.000 A Passed
3.546 86.27 40.00 ms 36.60 ms -8.5 % 2.000 A Passed
6.149 83.67 340.0 ms 335.4 ms -1.353 % 2.000 A Passed
8.497 84.66 640.0 ms 638.8 ms -0.1875 % 2.000 A Passed
12.05 87.31 1.240 s 1.227 s -1.04 % 2.000 A Passed
19.14 38.97 1.240 s 1.234 s -0.4758 % 2.000 A Passed
14.83 -33.09 40.00 ms 26.50 ms -33.75 % 2.000 A Passed
12.80 8.86 40.00 ms 31.00 ms -22.5 % 2.000 A Passed
10.32 -17.26 40.00 ms 24.60 ms -38.5 % 2.000 A Passed
13.80 26.82 340.0 ms 336.2 ms -1.118 % 2.000 A Passed
25.82 -13.88 340.0 ms 328.5 ms -3.382 % 1.752 A Passed
26.38 4.53 340.0 ms 327.3 ms -3.735 % 1.715 A Passed
15.11 67.33 1.240 s 1.232 s -0.6048 % 2.000 A Passed
28.96 -39.41 340.0 ms 336.0 ms -1.176 % 1.561 A Passed
30.41 20.01 1.240 s 633.6 ms -48.9 % 1.487 A Passed
36.16 23.83 1.240 s 1.232 s -0.6371 % 1.251 A Passed
15.30 107.28 1.240 s 1.234 s -0.4435 % 2.000 A Passed
Shot Test: Fault Type L1-L2
|Z| Phi t nom t act. Dev. ITest Result
4.211 76.84 40.00 ms 44.90 ms 12.25 % 2.000 A Passed
2.010 70.88 40.00 ms 34.00 ms -15 % 2.000 A Passed
6.162 81.99 340.0 ms 334.6 ms -1.588 % 2.000 A Passed
8.030 85.30 640.0 ms 635.9 ms -0.6406 % 2.000 A Passed
11.51 82.22 1.240 s 1.232 s -0.629 % 2.000 A Passed
14.65 77.55 1.240 s 1.232 s -0.621 % 2.000 A Passed
18.34 48.85 1.240 s 1.233 s -0.5968 % 2.000 A Passed
6.227 26.72 40.00 ms 38.40 ms -4 % 2.000 A Passed
8.563 39.98 340.0 ms 334.5 ms -1.618 % 2.000 A Passed
10.65 44.77 640.0 ms 634.0 ms -0.9375 % 2.000 A Passed
4.143 -21.27 40.00 ms 31.50 ms -21.25 % 2.000 A Passed
11.58 54.28 1.240 s 1.230 s -0.7984 % 2.000 A Passed
14.33 60.00 1.240 s 1.234 s -0.5 % 2.000 A Passed
17.61 64.57 no trip no trip 2.000 A Passed
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Shot Test: Fault Type L2-L3

|Z| Phi t nom t act. Dev. ITest Result
4.211 76.84 40.00 ms 41.60 ms 4% 2.000 A Passed
2.010 70.88 40.00 ms 31.10 ms -22.25 % 2.000 A Passed
6.162 81.99 340.0 ms 333.7 ms -1.853 % 2.000 A Passed
8.030 85.30 640.0 ms 638.2 ms -0.2812 % 2.000 A Passed
11.51 82.22 1.240 s 1.233 s -0.5645 % 2.000 A Passed
14.65 77.55 1.240 s 1.236 s -0.3548 % 2.000 A Passed
18.34 48.85 1.240 s 1.233 s -0.5645 % 2.000 A Passed
6.227 26.72 40.00 ms 35.70 ms -10.75 % 2.000 A Passed
8.563 39.98 340.0 ms 336.4 ms -1.059 % 2.000 A Passed
10.65 44.77 640.0 ms 639.4 ms -0.09375 % 2.000 A Passed
4.143 -21.27 40.00 ms 35.80 ms -10.5 % 2.000 A Passed
11.58 54.28 1.240 s 1.230 s -0.8468 % 2.000 A Passed
14.33 60.00 1.240 s 1.232 s -0.6855 % 2.000 A Passed
17.61 64.57 no trip no trip 2.000 A Passed
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Shot Test: Fault Type L3-L1

|Z| Phi t nom t act. Dev. ITest Result
4.211 76.84 40.00 ms 40.70 ms 1.75 % 2.000 A Passed
2.010 70.88 40.00 ms 32.30 ms -19.25 % 2.000 A Passed
6.162 81.99 340.0 ms 336.7 ms -0.9706 % 2.000 A Passed
8.030 85.30 640.0 ms 637.3 ms -0.4219 % 2.000 A Passed
11.51 82.22 1.240 s 1.234 s -0.5161 % 2.000 A Passed
14.65 77.55 1.240 s 1.232 s -0.6048 % 2.000 A Passed
18.34 48.85 1.240 s 1.238 s -0.1371 % 2.000 A Passed
6.227 26.72 40.00 ms 38.10 ms -4.75 % 2.000 A Passed
8.563 39.98 340.0 ms 333.9 ms -1.794 % 2.000 A Passed
10.65 44.77 640.0 ms 637.6 ms -0.375 % 2.000 A Passed
4.143 -21.27 40.00 ms 28.70 ms -28.25 % 2.000 A Passed
11.58 54.28 1.240 s 1.230 s -0.8306 % 2.000 A Passed
14.33 60.00 1.240 s 1.229 s -0.8871 % 2.000 A Passed
17.61 64.57 no trip no trip 2.000 A Passed
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Shot Test: Fault Type L1-L2-L3

|Z| Phi t nom t act. Dev. ITest Result
4.211 76.84 40.00 ms 41.30 ms 3.25 % 2.000 A Passed
2.010 70.88 40.00 ms 34.30 ms -14.25 % 2.000 A Passed
6.162 81.99 340.0 ms 335.1 ms -1.441 % 2.000 A Passed
8.030 85.30 640.0 ms 635.6 ms -0.6875 % 2.000 A Passed
11.51 82.22 1.240 s 1.232 s -0.6452 % 2.000 A Passed
14.65 77.55 1.240 s 1.235 s -0.4194 % 2.000 A Passed
18.34 48.85 1.240 s 1.238 s -0.1371 % 2.000 A Passed
6.227 26.72 40.00 ms 37.60 ms -6 % 2.000 A Passed
8.563 39.98 340.0 ms 333.9 ms -1.794 % 2.000 A Passed
10.65 44.77 640.0 ms 634.8 ms -0.8125 % 2.000 A Passed
4.143 -21.27 40.00 ms 28.80 ms -28 % 2.000 A Passed
11.58 54.28 1.240 s 1.230 s -0.8065 % 2.000 A Passed
14.33 60.00 1.240 s 1.232 s -0.6371 % 2.000 A Passed
17.61 64.57 no trip no trip 2.000 A Passed
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Shot Details:
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Parameters:
Fault Type: L1-L2-L3
| Z |: 17.61 Phi: 64.57
R: 7.563 X: 15.91
ITest 2.000 A

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Results:
t act.: no trip Assessment: Passed
t nom: no trip Dev.:
t min: no trip t max: no trip

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Fault Quantities (natural):
VL1: 35.23 V 0.00
VL2: 35.23 V -120.00
VL3: 35.23 V 120.00
IL1: 2.000 A -64.57
IL2: 2.000 A -184.57
IL3: 2.000 A 55.43
VFault: 35.23 V 0.00
IFault: 2.000 A -64.57

Fault Postfault
 V/V

40
30
20
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0
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t/s
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VL1 VL2 VL3

I/A

2.0

1.0

0.0
0.0 1.0 2.0 3.0 4.0 5.0 6.0
t/s
-1.0

-2.0

-3.0
IL1 IL2 IL3

Trip
Start

0.0 1.0 2.0 3.0 4.0 5.0 6.0

t/s

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Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 6.000 s <none> n/a
C2 - C1 6.000 s n/a

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Test State:
Test
Passed.