Professional Documents
Culture Documents
Over a 10 year working period which overlapped with academic studies as a Materials Engineer, I have
been able to improve my technical and management skills by obtaining several degrees and certificates,
some of which are in progress:
(i) Vemal Raja Manikam, M. Hamdi, Effects of Pre-Pack Thermal Aging on the Formation and
Evolution of IMC for Sn-Pb36-Ag2 and Sn-Ag3.8-Cu0.7 and its Correlation to Solder Joint
Strength, IMAPS 2008, Rhode Island, USA, Nov 2, 2008.
(ii) Vemal Raja Manikam, M. Hamdi, An Investigation Concerning the Diffusion Of Elements in Sn-
Ag3.8-Cu0.7 and Sn-Pb36-Ag2 on Electrolytic Ni-Au Pads during Pre-Pack Thermal Aging, EPTC
2008, Singapore, Dec 9, 2008.
Defining the relationship between IMC growth and reliability was a key foundation of this work. In
this work, 2 types of solder spheres on the BGA package were used; a Pb-solder (Sn-Pb36-Ag2)
and a Pb-free SAC solder (Sn-Ag3.8-Cu0.7). Figure CE 1.1 depicts the construction of the BGA
semiconductor package. The process in which this study was conducted is referred to as “thermal
pre-pack”, and is shown in Figure CE 1.2 under the outgoing inspections process. In this process
step, the semiconductor packages which have passed assembly and test and were heated in pre-pack
ovens at 3 different temperatures of 125°C, 150°C and 175°C to remove moisture before packing.
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Moisture needs to be removed before packing as sending these parts to customers with trapped
moisture in the encapsulation polymers can cause “pop-corn cracks”. This phenomenon happens
when trapped moisture inside the encapsulation polymers are subjected to heat at the customer’s
end during the surface mount soldering process, whereby the units will pop and crack, damaging
the delicate semiconductor dies.
material Inspections
and packing
Figure CE 1.2: Operations process flow depicting outgoing inspections as the focus process
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CE 1.1.1 Background: IMC growth model
It is generally accepted that with the transition from leaded solder alloys to lead-free solder alloys,
one major problem other than the high liquidus temperature (as compared to that of Pb-solder
alloys) is the formation of IMCs. Most lead-free solder alloys are susceptible to IMC formation
which leads to brittle failure modes, as compared to Pb-solders which display a much reduced
amount of solder IMC. The existence of a thin IMC layer due to the reaction between solder and the
underlying metal surface indicates that the solder/UBM (under-bump metallization) or
solder/substrate interface attains a good metallurgical bonding. However, excessive growth of IMC
may also have a deleterious effect on the mechanical reliability of the solder joint. IMC can be
formed even at room temperature. In addition, the joints in the electronic products often serve at a
high temperature relative to their melting point. Therefore, the IMC layer grows up continuously in
solid state which results in the brittle failure of the joint. In this work, both solders were attached to
a PCB with the following metallic configuration:
In most literature around the world, the key forecast method if a part will have excessive IMC
growth is based upon the Arrhenius temperature factor and time power law as shown in Equation
CE 1.1, whereby x is the IMC’s thickness (mm) at time, t(s) and x0 is the initial IMC layer’s
thickness. The IMC will be formed via inter-diffusion of inter-metallic elements within and around
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the solder when subjected to heat. The IMC’s real thicknesses are typically measured using a
surface profile equipment, whereby the average thickness is obtained using software algorithms
from several measurement points. Figure CE 1.4 depicts one of the measurements done on this
work under an optical microscope. The IMC build up can be clearly seen here.
CE 1.2 Defining the overall project scope, objectives and related engineering activities
As the project’s lead engineer, the key objective was to run a structured engineering analysis in the
production environment, taking into the following factors:
I was tasked with designing the DOE, key factors for the engineering study, obtaining the resources
for completing the project and drawing up the project plan. The resources covered equipment time
and people skills. The outcome of this project was tied directly to the manufacturing site’s “Zero
Defect” quality theme, i.e. no defects get into the customer’s site through proper control of thermal-
pre-pack processes. The work included some key steps as explained here:
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CE1.2.1 Estimating the required production time for building samples and performing the
pre-pack process.
CE1.2.2 Plan, assign and authorize tasks to team managers across production, equipment and
process teams’ in-line with the project’s plan.
CE1.2.3 Designing a structured process flow diagram for the study, followed by a DOE
which covered all factors and legs. Parallel work included failure mode discussions
and statistical analysis of failures. Figure CE 1.5 and 1.6 depict the DOE and
process flow diagram for this work.
CE1.2.4 Once all relevant information was obtained and completed from this study, a change
management session was put in place, whereby key stakeholders and the engineering
change management board reviewed the results and proposals to implement the
proposed process improvements.
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IMC growth study
Leaded
Lead free
The project was carried using a classic project management model, which encompassed the key
phases of initiation, planning, execution and finally monitoring/controlling.
In this stage, the team members were placed together to develop basic understanding of the
project. It was in this stage also that the material science fundamentals were explained to the
team. In essence this was held as a workshop. For example teams were introduced to the Sn-
Ag-Cu ternary phase diagram so that they could relate the changes in temperature to the
formation of varying IMC phases in the respective solders (Figure CE 1.7).
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Figure CE 1.7: Sn-Ag-Cu ternary phase diagram and varying phases of IMC formation
Here, it was crucial to establish a solid foundation with the team on the business case
justifications for carrying out this project and develop the team charter. In this phase also the
teams and key stakeholders proposed risks and assumptions which need to be considered in
the project plan and the draft FMEA (Failure modes and effects analysis).
In this phase, the overall project plan was developed based on the information gained from
the previous phases. Teams needed to be guided on their work package deliverables in
meeting the key deliverables. Checkpoints and highlight reports were also outlined in order
to meet the corporate communications strategy requirements. This helped develop a
foundation for the rest of the project.
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CE1.3.4 Execution Phase
In the execution phase, I oversaw the entire study using the 2 new solders, and 3 varying test
temperatures with time for tasks allocated using equipment setup and sample builds. Each
finding was documented in pre-agreed document standards from the planning stage. By
engaging the failure analysis team for microstructure studies, I was able to impart my
metallurgy knowledge and analyze the failures from each category using SEM (scanning
electron microscope) images. Some images are shown below, depicting varying failure
modes after cold-ball-pull tests on thermally aged units. These findings were documented in
corporate approved communication documents in order to develop a common reference
point for future work.
Once all deliverables were in place from the project, monitoring of the changes which were
approved from the change board. This monitoring phase was done by a junior engineer as
part of his Green Belt Six Sigma certification program. My task was to mentor the engineer
on the use of statistical analysis tools such as JMP and Minitab. These analysis were done in
accordance with the DMAIC methodology (Define, Measure, Analyze, Implement and
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Control). A benefits review was held at the end stage of the project closure to review the
original benefits suggested against those which can be realized at the moment or after
project closure. The project’s knowledge transfer to local site manufacturing teams was
done in this phase as well, so that the project team engineers could be used as consultation
teams instead. This was an official product handover and transfer phase for process
sustaining.
The project was successfully closed after main stakeholders and senior management
reviewed the findings and key financials. Risks and issues were also presented and
documented as follow-on-recommendations. It was also agreed that this project was to be
used by me to generate a Masters of Engineering thesis with University of Malaya entitled
“Effects of baking parameters on the structure and properties of leaded and lead free
solders” alongside 2 peer reviewed international conference proceedings.
CE 1.4 Summary
Through team work and the support from the senior management team, we were able to complete
the project and document the findings. Key improvements and suggestions were put in place in
order to improve the process:
The cold-ball-pull process was introduced in the manufacturing process as it was found that
it was more robust in detecting IMC brittle failures. This was part of the product description
quality agreement with Continental Germany for Freescale Malaysia.
Leaded solders were proven to be more robust after pre-pack thermal ageing. The Pb-free
solders were recommended to use much lower thermal ageing temperatures of 125ºC instead
of 175ºC, but with a much longer ageing time in order to meet the RoHs and WEEE Pb-free
directives.
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CE 2.0: Qualification of a novel Pb-free Zn-based soft solder silicon die attach for power
device applications (Infineon Technologies Malaysia)
The use of Pb-based solders is being limited by directives imposed by RoHS and WEEE as part of
the effort to reduce Pb-based elements in microelectronic parts. The Zn-based solder used in this
work (codename A335) was co-developed with Honeywell USA to meet silicon power
semiconductor device application requirements. It has a combination of Zn, Al, Ge and Ga
elements. The Zn-solder was to be used as a die attach interface in the power package, and therefore
needs to be able to withstand temperatures of up to approximately 250ºC, demonstrate reliable
performances and possess good electrical as well as thermal conductivities. The alloy used had a
high liquidus temperature (Table CE 2.1) which matched the needs of power semiconductor
devices up to operational temperatures of 250ºC (Table CE 2.2).
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Alloy Solidus Liquidus Tensile Young’s Elongation, Thermal Thermal Electrical
Temp Temp (MPa) Modulus % expansion, conductivity, resistivity,
(ºC) (ºC) (GPa) ppm/ºC W/mK (µΩ/cm)
Table CE 2.1: Zn-solder A335’s material properties for use on power devices
temperature, °C temperature, °C
Si microwave 150 200
Si digital logic 300 400
Si small signal 250 350
Si power 200 NA
Si DRAM 150 NA
SiC power 300 400
SiC digital logic 100 700
SiC small signal 400 NA
SiC power N-C MODSFET 600 NA
SiC DRAM 600 NA
Nitrides (n-type) NA 700
Nitrides microwave NA 700
The selection of 250ºC as the maximum operating temperature of the alloy was based on the
homologue temperature ratio (Equation CE 2.1), where the ratio between the solder alloy’s
melting point, Tm and operational temperature, To, both expressed in Kelvin (K), is called the
homologue temperature ratio, (Th) and is usually set as low as 0.67 to as high as 0.85. The value of
0.85 must not be exceeded to guarantee safe use of any die attach material.
To ( K )
Th
Tm ( K ) (Equation CE 2.1)
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The A335 alloy however faced several issues, including embrittlement due to CuZn IMC formation on the
Cu lead frame leading to die back and solder separation. Therefore it was my task as a metallurgist to advice
on the right lead frame surface combination for the solder to improve the solder’s wetting capabilities. The
solder was also depicting cracks after reflow and reliability tests. This was believed due to the excessive
intermetallic compound (IMC) formation between the Zn-based solder and the lead frame (Figure CE 2.1).
Figure CE 2.1: Associated issues for the A335 Zn solder alloy: (a) Excessive IMC growth;
(b) Die crack after reflow; (c) Solder to die back separation
CE 2.1.1 Engage the external support of Honeywell USA and gain commitment from the local
manufacturing and quality teams to proceed with the project. Here, a Business Case outline with the RoHS
and WEEE directives as the trigger points was written.
CE 2.1.2 Develop a hypothesis for the IMC growth phases and understand the risks each phase poses
towards the long term reliability of the technology when in the field. This was part of the corporate risk
management strategy to identify risks.
CE 2.1.3 Work with external vendors to obtain a new lead frame and die back metallurgy recipe in order to
control and inhibit excessive IMC growth within the solder.
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CE 2.1.4 Oversee beta test runs and subsequent engineering lot builds (assembly and electrical tests) in order
to gauge a clear understanding of this new technology being implemented under existing manufacturing
conditions (process and equipment)
CE 2.1.5 Advice and offer consultation to the failure analysis teams in terms of sample failure analysis
techniques.
CE 2.1.6 Update senior management and the Director of R&D on highlights during the course of the project.
This project was run across several phases, which I personally oversaw and will be explained
separately here:
To develop a solid foundation for the project, it was imperative that a detailed failure hypothesis
was presented. Firstly, key points related to the existing lead frame, die back metallurgy used for
the A335 solder and failure modes were analyzed:
The die back metallurgy structure was Ti/Ni/Ag with thicknesses of 0.2/0.3/2.0 microns
respectively
Using X-ray diffraction (XRD) and electron dispersive spectroscopy (EDS), 2 main phases
of intermetallic compounds (IMC) were identified in the solder; AgZn3 with the die back
surface and Cu5Zn8 with the lead frame’s bare Cu surface
Using nanoindentation techniques and references from key literature works in this area, the
team was able to document the hardness and Young’s modulus of these IMC phases:
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Table CE 2.3: Zn-solder IMC phases and related material properties
The hardness, H and E modulus values were obtained from the following equations used in
the nanoindentation technique which utilized a Berkovich indentation tip:
Pmax Pmax
H= = (Equation CE 2.2)
A 24.5hc2
1
1 1 vi2
E (1 v ) *
2
(Equation CE 2.3)
E Ei
The value of H was directly related to the force, Pmax and area of indentation, A. The
penetration contact depth, hc was calculated from Equation CE 2.4, whereby , the
geometrical constant for the Berkovich indenter had a value of 0.75. S, the stiffness of the
Zn solder was determined from the slope of the initial unloading by calculating the
maximum load and depth. The Young’s modulus of elasticity, E was identified as a function
of v which is the Poisson’s ratio of the Zn solder whilst E i and vi represented the Young’s
modulus of elasticity and Poisson’s ratio of the nanoindenter tip. The term E * is the reduced
Young’s modulus of elasticity of the Zn solder.
Pmax
hc hmax (Equation CE 2.4)
S
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1. Formation of AgZn and CuZn IMC with the associated die back and Cu substrate
during solder reflow. The CuZn IMC seemed rather thick due to the active and
vigorous inter-diffusion from the Cu substrate into the bulk solder. The Ag layer on
the die back at 2.0 microns also contributed to a thick layer of AgZn IMC.
2. The bulk solder had an E modulus of 29 GPa. There was a significant difference in
modulus between the IMC phases and the bulk solder. When the IMC got too thick,
the hard and brittle IMC could not compensate the internal stresses induced between
the silicon die and substrate as what solders normally do. The solder then became
more susceptible to cracking. It can be seen that the crack propagated from the
bottom of the die, i.e. the die-solder interface to the top of the die (Figure CE 2.1
(c)).
To address the issues, a project plan and team charter was drawn up and presented to the stakeholders to gain
approval. Resources in terms of people skills and equipment time for the engineering builds were committed
by the stakeholders. The external suppliers (Honeywell USA) were included as consultants on the project to
advice in terms of material and process deliverables.
In order to address the key conclusions in CE 2.2.1, the following tasks were put in place a work packages
and assigned to individuals who were committed as resources on the project:
To restrain the excessive formation of the Cu5Zn8 IMCs on the Cu substrate to the solder interface, a
specially engineered lead frame having a NiNiP diffusion barrier on the Cu was used. The diffusion
barrier had a thickness of 1.5 microns and was electroplated onto the Cu surface to act as a diffusion
barrier to avoid excessive diffusion of Cu into the bulk solder. A thin layer was then placed on to the
NiNiP barrier to help solder wettability. This would keep the thickness of the Cu5Zn8 IMC to a bare
minimum. My job was to outline the selected plating thickness and key coverage areas. Figure CE
2.2 depicts the new lead frame design.
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Figure CE 2.2: Lead frame design depicting the selective Cu flash on the NiNiP diffusion barrier to
promote solder wettability
The die back to solder AgZn3 IMC formation was controlled by changing the Ag thickness which
came into contact with the solder. The Ag thickness was reduced from 2.0 microns to 0.8 microns in
order to minimize the AgZn3 IMC formation. The device was also tested in order to verify that the
reduction in thickness did not affect the electrical properties when the device was turned on. This
change was managed with the wafer fab teams who helped direct and build test wafers using the
agreed metallurgy change.
To test the solution, several engineering builds were planned. The quantity of the builds were
discussed with the engineering and quality assurance teams, so that a common checkpoint could be
agreed upon in accordance with the product quality criteria delivery. My role was to chair these
meetings and align the quality expectations of all stakeholders to the product’s delivery. Random
verifications were done during the engineering builds. Through such measures, the performance of
the solder against its predecessor was compared, as shown in Figure CE 2.3.
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Figure CE 2.3: Comparison of changes: (a) Original structure with thick IMC; (b) Improved structure
with reduced IMC formation; (c) SAT scan depicting good bonding free of voids and cracks
As part of the project closure activities, my role was to present the overall findings and consolidated
data to the senior management team and the change management board. This was to introduce the
necessary materials changes to enable the solder solution to be implemented into the production
environment. Follow-on-recommendations were also offered and documented for New Product
Introduction (NPI) teams as a reference document. This was in-line with the corporate quality and
communications management strategies.
The wetting and behavior during die bonding of a Zn-based Pb-free solder were evaluated using a
newly designed lead frame and a change in the die back’s metallurgy after carefully understanding
the failure mechanisms. The results demonstrated that the use of a new lead frame having a NiNiP
Cu diffusion barrier provides a solution to obtain good solder wetting while restraining the negative
effects of CuZn IMC formation. The combined use of proper metal combinations on the lead frame
can provide a Pb-free Zn-based solder solution for die attach applications in power packages.
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CE 3.0: Development and qualification of nanoscale silver (Ag) sintering as a die attach
solution for power module applications (ON Semiconductor Malaysia)
This career episode is an overview of my work as a Staff Materials Science Engineer with ON
Semiconductor Malaysia. It is the most significant industrial work to date which applied direct
academic knowledge into process and equipment development. In this work capacity, I led a team
of 3 junior engineers who reported to me directly, as well as a team of quality and manufacturing
personnel who reported to me functionally. This job role required me to impart my knowledge
acquired from my Doctorate work to enable the development and qualification of nanoscale Ag as a
potential high temperature die attach (DA) solution for power modules. This technology would
require new process definitions, materials and related corporate documentation. The project was
part of the aligned view of Pb-free technology for power modules under the WEEE and RoHS
directives. I reported directly to a Sr. R&D Director in Malaysia and the VP of R&D in the USA. I
also reported functionally to a Program Manager in Malaysia who oversaw this development as part
of the need for the power module development program at ON Semiconductor. In a nutshell, this
was a feasibility study mandated by ON Semiconductor’s corporate R&D management team for
long term growth in the power module semiconductor business. Figure CE 3.1 depicts an example
of ON Semiconductor’s power module design, which points out the DA layer beneath the die.
Figure CE 3.1: Power modules and cross-sectional view depicting the DA layer
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CE 3.1 Project background: Ag sintering for enhanced DA applications in power modules
2
Table CE 3.1: Material transport mechanisms during sintering
Ds
p Dl
Db
Dl
Figure CE 3.2: Material transport paths during sintering and 2 particle fusion
When these particles are formulated into a paste for die attach purposes, the nanoparticles as well as
particles near the nano-range are susceptible to agglomeration and coagulation, which can lead to
in-effective sintering and densification conditions. For power device applications, if these
conditions are not met, the die attach layer would fail under extreme thermal conditions during
device field applications. Figure CE 3.3 depicts the coatings present on the nanoparticles and how
they are burnt off during sintering. This allows particle solid-state fusion without melting and
immediate densification to form the die attach interconnect layer.
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Figure CE 3.3: Solid-state fusion during sintering mechanism and actual DA sintered Ag
Sintering is able to yield high temperature materials which form a connection between 2 surfaces,
as shown in Figure CE 3.4. Sintered Ag has the highest operating temperature and melting point
amongst most of the existing high temperature solutions, i.e. it has an excellent homologue
temperature ratio. The ratio between the DA’s melting point, Tm and operational temperature, To,
both expressed in Kelvin (K), is called the homologue temperature ratio, (Th) and is usually set as
low as 0.67 to as high as 0.85. The value of 0.85 must not be exceeded to guarantee safe use of any
DA material, as shown in Equation CE 3.1. Table CE 3.2 illustrates several DA materials by
melting point and operations temperature.
To ( K )
Th
Tm ( K ) (Equation CE 3.1)
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Figure CE 3.4: Various high temperature die attach materials
Table CE 3.2: Comparison of available die attach materials for power modules
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My role on this project can be summarized in the following notes:
CE 3.1.1 Drawing up a task plan for the key tasks and deliverables of the project after consulting the
Program Manager.
CE 3.1.1 Aligning and agreeing upon key resources for the project’s different phases.
CE 3.1.2 Engaging key DA material global suppliers and equipment manufacturers for the project,
negotiating non-disclosure agreements and contracts for on-site evaluation of systems.
CE 3.1.3 Developing DOEs and test plans for the individual test groups, including matrices with variables
and input factors. These were aligned to key output factors and measurable across global sites associated for
each material global supplier or equipment manufacturer. Figure CE 3.5 illustrates one such test plan.
Figure CE 3.5: DOE and test plan for one of the material/equipment supplier matrices
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CE 3.3 Engineering activities
This project required me to provide material science consultation and knowledge on various phases
of the project:
CE 3.3.1 Development of failure criteria for post-sintered power modules using theoretical
knowledge
As mentioned before, this project was done to embrace my knowledge nanoscale sintering. These
journal publications were the benchmark on the work to develop a sound understanding of sintering
and its related challenges. This knowledge was also shared with the corporate management at ON
Semiconductor and the material/equipment suppliers through non-disclosure agreements. Failure
criteria related to electrical and thermal performances were identified using these academic
journals:
(i) Vemal Raja Manikam, Khairunisak Abdul Razak, Kuan Yew Cheong, Physical and
electrical attributes of sintered Ag80–Al20 high temperature die attach material with
different organic additives content, Journal of Materials Science: Materials in Electronics,
Vol. 24, Issue 2 , pp 720-733, June 2012.
(ii) Vemal Raja Manikam, Khairunisak Abdul Razak, Kuan Yew Cheong, Reliability of
sintered Ag80-Al20 die attach nanopaste for high temperature applications on SiC power
devices, Microelectronics Reliability, Vo. 53, Issue 3, pp 473–480, March 2013.
(iii) Vemal Raja Manikam, Khairunisak Abdul Razak, Kuan Yew Cheong, Sintering of
silver-aluminium nanopaste with varying aluminium weight percent for use as a high
temperature die attach material, IEEE Transactions on Components, Packaging and
Manufacturing Technology, Vol.2, No. 12, pp 1940-1948, 2012.
(vii) Vemal Raja Manikam, Khairunisak Abdul Razak, Kuan Yew Cheong, A novel silver–
aluminium high-temperature die attach nanopaste system: the effects of organic additives
content on post-sintered attributes, Journal of Materials Science: Materials in Electronics,
Vol. 24, Issue 8, pp 2678-2688, August 2013.
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CE 3.3.2 Assessing suitability of equipment parameters for evaluations
Part of this phase included assisting equipment and materials suppliers in Germany and Netherlands in
obtaining suitable process parameters which were aligned to the parts being built for ON Semiconductor.
The prototypes needed to be properly handled and due consideration was needed on the fragile silicon dies
being used. I traveled to Germany and Netherlands as part of this effort with my Sr. Director to align and set
ON Semiconductor’s quality expectations.
CE 3.3.3 Monitoring stage plan deliverables (alignment to Program & Corporate goals)
Monitoring the stage plans was key in this project. Each phase of the project had key deliverables which
needed to be fulfilled before the project could move forward into the next phase. Biweekly calls and
presentation sessions were held with the corporate management in the USA on this project. Figure CE 3.6
depicts one such sessions slide.
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CE 3.3.4 Controlling & delivering engineering builds and REL tests
In this phase, the engineering parts build was coordinated across Malaysia, Netherlands and
Germany. Parts were supplied from Malaysia, DA Ag sinter materials from Germany and the
equipment used was on site in the Netherlands. REL tests were done in association with Fraunhofer
Institute (IZM) in Nuremberg as this was a new technology. IZM acted as an external consultant on
this project.
Figure CE 3.7: ∆T and Rth monitoring of power modules to detect an increase in values
which means the DA layer failed
Project closure activities involved consolidation of all lessons learnt, and documentation of follow-
up-activities as part of the overall program effort. Recommendations, risks and issues were
presented to the R&D corporate team in order to review the technology for future use in mass
manufacturing conditions.
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PROFESSIONAL ENGINEER
Summary Statement
These are the competency Units and Elements. These elements must be addressed in the Summary Statement
(see Section C). If you are applying for assessment as a Professional Engineer, you will need to download this
page, complete it and lodge it with your application.
Paragraph in the
A brief summary of how you have applied the career episode(s)
Competency Element
element where the element
is addressed
PE1 KNOWLEDGE AND SKILL BASE
a) My PhD work on nanomaterials and polymeric CE1.1.1, CE 1.3.1,
PE1.1 Comprehensive, theory- materials chemistry and characterization helped drive CE, 1.3.4, CE 2.1,
based understanding of the key work on nanopaste applications. CE 2.2.1, CE 2.2.3,
underpinning natural and b) Knowledge of solder technology, material science CE 2.2.4, CE 3.1,
physical sciences and the basics and theoretical understanding of high CE 3.3.1
engineering fundamentals temperature materials behavior helped on multiple
applicable to the engineering package technology development.
discipline
PE1.2 Conceptual understanding a) Used statistical methods from tools such as JMP and CE1.2, CE 1.2.4, CE
of the mathematics, numerical Minitab to design key DOEs and analyze findings and 1.3.2, CE 1.3.5, CE
analysis, statistics and computer data for engineering understanding. 2.2.2, CE 3.1.3,
and information sciences which
underpin the engineering
discipline
a) Good understanding of key governing bodies needs CE 1.1.1, CE 1.2,
PE1.3 In-depth understanding of such as RoHS and WEEE for implementation at CE 2.1, CE 2.1.1,
specialist bodies of knowledge factory sites when qualifying new materials. This also CE 2.2.1, CE 3.0
within the engineering discipline included understanding key needs of factories.