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Protection Testing Week 2017, Hong Kong

Day 4 Protection, Automation and Measurement


in Smart Substations
Naibo Ji (Mr.) 吉乃博
Florian Fink (Mr.)
Royal Plaza Hotel, Hong Kong
© OMICRON
1915 May 2017
May 2017
Goal for Day 4

> Understand the basic knowledge about IEC 61850


> Gain the experience of using GOOSE, Client/Server and Sampled Values.
> Understand the challenges and solutions for Substation Commission and
Maintenance.

> Understand the measurement and calibration techniques for the


measurement components in the smart substations, including energy meter,
power quality devices, merging units, current transformers and voltage
transformers.

© OMICRON Slide 2
Safety Instruction

> The CMC test set can output life-hazardous voltages and
currents.
> Throughout the presentation and user manuals, this symbol
indicates special safety-relevant notes/directions linked to the
possibility of touching live voltages and/or currents. Please
thoroughly read and follow those directions to avoid life
hazardous situations.
> This symbol indicates potential hazards by electrical
voltages/currents caused by, for example, wrong connections,
short-circuits, technically inadequate or faulty equipment or by
disregarding the safety notes which written on the user manuals.

> Note: before you use your CMC devices, please read through
the Section Safety Instructions on the CMC user manual!

© OMICRON Slide 3
Agenda

> Essentials of IEC 61850


> Introduction on IEC 61850
> Works with GOOSE and Client/Server
> Works with SV

> Measurement in Smart Substations


> Meter calibration in Smart Substations
> Other measurement devices
> VT/CT calibration
> Merging Unit calibration

© OMICRON Slide 4
Essentials of IEC 61850

1915 May 2017


May 2017
Slide 5
Smart Grid

> Smart grid, smart substations


> Smart ‘brains’
> Smart ‘hands’

> Smart ‘hands’

> Self-healing distribution networks, recloser

> Smart substations with IEC 61850

> Smart metering

© OMICRON Slide 6
Background and Essentials

1915 May 2017


May 2017
Slide 7
IEC 61850 Topic
IEC 61850 Vision

© OMICRON Slide 8
IEC 61850 Topic
IEC 61850 Scope

That‘s not just another protocol... It defines:


> What and how to communicate
> Standard Object Models
> Standard Configuration Language
> Specification of Conformance Testing

New title edition 2:


Communication networks and systems for power utility automation

Old title:
Communication networks and systems in substations.
IEC 61850 Topic
IEC 61850 Goals
IEC 61850 Topic
Interoperability or Interchangeability?

> Interoperability
> Devices can "understand" each other
> Devices can perform combined functionality with each other

> Users Expect Interchangeability


> Simply replace one IED by the other
> Restricted by Features and Implementation
> Explicitly beyond the Scope of IEC 61850
(Part 1, 4. Objectives)

© OMICRON Slide 11
IEC 61850 Topic
Fundamental Aspects

> Data Model (standardized power system)


> Services (exchange of information)
> Communication protocols (platform)
> Configuration (tools)

© OMICRON Slide 12
IEC 61850 Topic
Modeling Approach
(ACSI)

© OMICRON Slide 13
IEC 61850 Topic
Modeling Overview

© OMICRON Slide 14
IEC 61850 Topic
Object Oriented Approach

> LN Classes (Types)


> LN Instances

> Addressing: Object References (path names) instead of Point Numbers

© OMICRON Slide 15
IEC 61850 Topic
Protection and IEC 61850
FUNCTIONS ANSI IEC 61850
ANSI / IEC Symbols
Autoreclose 79 RREC
> IEEE (ANSI) C37-2 Breaker Failure 50BF RBRF
> IEC 60617 Directional Overcurrent 67P PTOC
> IEC 61850 Distance 21 PDIS
Instantaneous Overcurrent 50 PTOC
Line Differential 87L PDIF
Reverse Power 32R PDOP
Out of Step Trip (Pole Slip) 78 PPAM
Over frequency 81O PTOF
Overvoltage 59 PTOV
Time Overcurrent (IDMT) 51 PTOC
Transformer Differential 87T PDIF
Voltage Dependent Overcurrent 51V PVOC

© OMICRON Slide 16
IEC 61850 Topic
IEC 61850 Standard Overview: Main Parts Edition 1

Ed2.0

Ed2.0

Ed2.0
Ed2.0
Ed2.0 Ed2.0

Ed2.0
Ed2.0

Ed2.0

Ed2.0
Ed2.0

Ed2.0
>1800 pages! www.iec.ch >2000 EUR
IEC 61850 Topic
Extension / Work in Progress
> New document Structure:
> IEC 61850-7-4 – LN Substations (IEC 61850-7-400)
> IEC 61850-7-410 – LN Hydro Power Plants
> IEC 61850-7-420 – LN DER

> IEC 61850-7-5xx: Application guideline on How to Use the LN


> IEC 61850-8-2: Specific communication service mapping (SCSM) - Mappings
to web-services
> IEC 61850-80-xx: Technical Specification - Guidelines
> 80-1: mapping IEC 61850 to IEC 60870-5-101/104
> IEC 61850-90-xx Technical Report – Guidelines
> 90-1: substation to substation
> 90-2: substation to control center
> 90-3: conditioning monitoring
> 90-4: network engineering guidelines
> 90-5: transmit of synchrophasor information according to IEEE C37.118
> 90-6 Use of IEC 61850 for Distribution Automation
> 90-7 Object Models for PV, Storage … inverters, …
> 90-8 Object Models for Electrical Transportation
> 90-9 Object Models for Batteries

© OMICRON
Academy
IEC 61850 Topic
Edition 2 Main changes

> Logical nodes has extended from 90+ to 170+


> SCL Part- two new SCL files (iid, sed)
> IED configuration & Engineering tools relationship- how to work together,
clarification on the function of each
> Conformance test – new added or amended part
> for Client tools
> for SV test
> Goose delay test
> Engineering tools test(IED configuration and system integrator tools)

> To vendors: Compatibility challenges


> update the data models.
> Client tools update
> Engineering tools update (to support iid, sed file)
> new conformance test certificate

© OMICRON Slide 19
IEC 61850 Topic
Test support in IEC 61850

> Test mode of a logical node


> Mod = TEST
> Mod = TEST-BLOCKED

> Control service parameter Test


> Quality attribute q.test
> “Test” and “Simulate” flags for GOOSE and Sampled values

 Some features have been added in Ed 2


 The description of the behavior when using the different features has been
improved

2010-11-08
IEC 61850 Topic
Glossary

> ACSI – Abstract Communication Service Interface


> GOOSE – Generic Object Oriented Substation Event
> SV – Sampled Values
> 9-2LE – 9-2 light edition regulated by UCA user group
> C/S – Client and Server communication
> IED – Intelligent Electronic Device
> SCL – Substation Configuration Language
> MU – Merging Unit
> PPS – Pulse Per Second
> PTP – Precision Time Protocol, or IEEE 1588 / IEC 61850-9-3

© OMICRON Slide 21
IEC 61850 Topic
Key Concepts

> Communication is the platform, Protection/Automation/Control is the core.


> GOOSE replaces Binary Input / Output, SV replaces Current / Voltage
> Communication:
> Real Time services for GOOSE and SV
> Client / Server services for control and report

> Time Synchronization is very important (see notes from Day 1)


> IED with GOOSE, SV, Client/Server need to be tested properly
> Smart Substation with IEC 61850 need to consider the maintenance test at
the beginning.
> Monitoring IEC 61850 substation is equally important to the implementation.

© OMICRON Slide 22
GOOSE and Sampled Values

1915 May 2017


May 2017
Slide 23
IEC 61850 Topic
Information Exchange

> The services are described in an abstract form. Abstract in a sense that it
focuses on the description of what the services provide. It doesn't describe
how these services are coded to a real communication network. Thus, they
are referred to as
> ACSI – Abstract Communication Service Interface

IEC 61850-7-2 defines following


basic categories of services:
1.Sampled Values exchange for
CTs and VTs; GOOSE
2.Fast exchange of IO data for
protection and control (GOOSE);
3.Control and trip signals;
4.Engineering and configuration;
5.Monitoring and supervision;
6.Control-center communication.

© OMICRON Slide 24
IEC 61850 Topic
Wiring: Copper versus GOOSE

> GOOSE
> fast inter-device communication
> replaces hard-wired connections

> Applications:
> Interlocking
> Reverse busbar blocking
> Trip signals.

© OMICRON Slide 25
IEC 61850 Topic
Publishing & Subscribing process

> Publishing:
> Multicast message
> Unconfirmed
> Repetition strategy

> Subscribing

© OMICRON Slide 26
IEC 61850 Topic
Multicasting

> Unconfirmed
> No Overhead for Confirmation
> Simple, Efficient

> Published without Addressing a Receiver


> Destination MAC Address = Multicast Address
> Subscribers Decide Which GOOSE to Use

> Grouping / Filtering by MAC Addresses


> Defined Multicast Address Range (Part 8-1)
> Ethernet Chips can Filter on MAC Addresses

© OMICRON Slide 27
IEC 61850 Topic
Repetition Strategy

© OMICRON Slide 28
IEC 61850 Topic
Repetition Strategy

> When a change of one data-set member is detected, the data-set values are
encoded in a GOOSE message and transmitted as multicast. Following a data
change, fast repetitions take place typically with an initial interval of a few
milliseconds. The retransmission time is gradually increased until a maximum
repetition interval is reached. Typically, maximum intervals of 100 ms to a few
seconds are used (IEC 61850-8-1 specifies a limit of 60 s). The messages are
then retransmitted with this time interval unless another data change occurs.

> Every GOOSE message carries some parameters that are used in this process:
> Status Number: is incremented at every data change;
> Sequence Number: set to zero at every data change and incremented at every
retransmission;
> Time Allowed to Live: informs the subscribers of the maximum time to wait for the
next retransmission. If a new message is not received within this time interval, the
receiver shall assume that the communication is lost (built in "wire-break"
supervision). Retransmission must take place within this interval. Messages are
retransmitted typically at half of this time (suggested by the standard).

© OMICRON Slide 29
IEC 61850 Topic
Fast Track for GOOSE

> Priority Tagging


> Priority is part of VLAN Tag... to be seen later!

© OMICRON Slide 30
IEC 61850 Topic
Sampled Values - Basic Concepts

> transmission of sampled measured values from instrument transformers


> publisher/subscriber
> multicast messages
> IEC 61850-9-2
> sensor technology is out-of-scope
> focus on the protocol

© OMICRON Slide 31
IEC 61850 Topic
Implementation Guideline

> IEC 61850-9-2


> many parameters: sampling frequency, data-set structure, etc.
> only one profile can be implemented

> Implementation Guideline:


> defines a profile of IEC 61850-9-2
> facilitate implementations

© OMICRON Slide 32
IEC 61850 Topic
Implementation Guideline

> Nickname: 9-2LE (Light Edition)


> Valid for Protection and Metering
> minimum number of parameters
> low requirements on resources

> Merging Unit with:


> 4 Voltages + 4 Currents (3 Phases, 1Neutral)
> 80 samples/cycle (Prot. & Meter.)
> 256 samples/cycle (PQ)

> 1PPS (pulse-per-second) signal for time synchronization


50Hz  4000 samples/s

counter

© OMICRON Slide 33
IEC 61850 Topic
New IEC 61869-9

Samples per Packet


Sampling Frequency
Packet Frequency
4000Hz (80SPC @ 50Hz) 1 4000Hz
4800Hz (80SPC @ 60Hz) 1 4800Hz
12800Hz (256SPC @ 50Hz) 8 1600Hz
9-2LE
15360Hz (256SPC @ 60Hz) 8 1920Hz
4800Hz 2 2400Hz
New preferred
14400Hz 6 2400Hz
5760Hz 1 5760Hz 96SPC @ 60Hz

Slide 34
IEC 61850 Topic
OMICRON's Layering

Test Modules

Binary Inputs Binary Outputs


Mappings
GOOSE GOOSE
Subscriptions Simulations

Network

© OMICRON Slide 35
Communication

1915 May 2017


May 2017
IEC 61850 Topic
Communication Methods

Client / Server services Real-Time services

> Control center ↔ field devices > Fast inter-device communication and
(SCADA) transmission of sampled values
> Reports, control, etc. > GOOSE and Sampled Values
> Non-time-critical > Time-critical
> One-to-one connection > One-to-many connection
(Two-Party-Application-Association) (Multicast-Application-Association)

Publisher.
Subscriber
Client Server

© OMICRON
IEC 61850 Topic
Control Cases

> Direct control with normal security (direct-operate)


> Select-before-operate with normal security
> Direct control with enhanced security (direct-operate)
> Select-before-operate with enhanced security

© OMICRON
IEC 61850 Topic
Client/Server Traffic - Unicast

Server Client
?
(Relay) (Station Control)
Testing PC is not
Tool involved in
unicast
communication

AP-PTC 2014
Singapore
IEC 61850 Topic
Client/Server Traffic - Sniffing

Server Client
(Relay) (Station Control)
Testing Mirror Port
Tool

AP-PTC 2014
Singapore
IEC 61850 Topic
Analysis on ACSI Level

Control with SBO


IEC 61850-7-2

AP-PTC 2014
Singapore
IEC 61850 Topic
Communication Methods

Client / Server services Real-Time services (Multicast)

> Control center ↔ field devices > Fast inter-device communication and
(SCADA) transmission of sampled values
> Reports, control, etc. > GOOSE and Sampled Values
> Non-time-critical > Time-critical
> One-to-one connection > One-to-many connection
(Two-Party-Application-Association) (Multicast-Application-Association)

Publisher
Client Server
Subscriber

© OMICRON
IEC 61850 Topic
Publishing & Subscribing process

OMICRONenergy – Publisher
Noble JI – Subscriber
Group Emails – GOOSE
Sending group email –Multicasting

© OMICRON
Academy
IEC 61850 Topic
GOOSE Sniffing

Publisher
(Relay)
Testing
Tool
All devices see
multicast
communication Subscriber
(Relay)
AP-PTC 2014
Singapore
Time Synchronization

1915 May 2017


May 2017
Slide 45
IEC 61850 Topic
IEEE 1588 Std C37.238

> "Power Profile"


> Published July 2011
IEC 61850 Topic
Redundancy

> Not covered in the IEC 61850 standard itself


> Technical report IEC 61850-90-4
> Network engineering guidelines
> Refers to IEC 62439-3

> PRP
> Parallel redundancy protocol

> HSR
> High availability seamless redundancy
IEC 61850 Topic
PRP principle

source

DANP SAN
DANP DANP Doubly Attached Node SAN Singly Attached Node
using PRP

switch switch

LAN A LAN B
switch switch switch switch

SAN DANP DANP DANP DANP DANP SAN SAN

destinations destinations
IEC 61850 Topic
HSR principle

Sender

HSR HSR HSR HSR


Node Node Node Node

!! !!

> Treatment of Duplicates


IEC 61850 Topic
Time related solutions

> Please refer to Slide 75 - 97 of the Day 1 note

© OMICRON Slide 50
IEC 61850 Tests

1915 May 2017


May 2017
Slide 51
IEC 61850 Topic
OMICRON Solution Overview

© OMICRON Slide 52
IEC 61850 Topic
Topic IEC 61850 Testing

Slide 53
IEC 61850 Topic
Solution: Test Mode

> Every Logical Node like PROTECTION.PDIS1


> Every Logical Device like PROTECTION
> Not just a „Test-Mode“ but:
> On; On/ Blocked; Test; Test/ Blocked; Off

Slide 54
Dependencies

Slide 55
IEC 61850 Topic
Isolation and test of an equipment

Sim
TEST Pxxx LPHD

PTRC
TestSet
Protection IED
Samples (Sim=FALSE) Samples (Sim=TRUE)

TCTR
TCTR
TCTR TEST-BLOCKED
TVTR
TVTR XCBR
TVTR
XCBR.Pos.opOk
Merging Unit Breaker
XCBR.Pos.tOpOk

2010-11-08
IEC 61850 Topic
Test bit and Test Mode

> Example 1:
Control Service
IED Output to process
Test = FALSE Beh = ON processed
Beh = TEST not processed
GOOSE data
q.test = FALSE

> Example 2:

Control Service
IED Output to process
Test = TRUE Beh = TEST processed
Beh = TEST-BLOCKED not processed
GOOSE data (only internally in the IED)
q.test = TRUE

© OMICRON
Academy
IEC 61850 Topic
Simulation Indication with GOOSE and SV

> How to distinguish between “real” signals and simulated one?


> Sets the entire IED (“physical device”) in simulation mode LPHD.Sim = True

GoID=1 GoID=1
Simulation = FALSE Simulation = TRUE

Subscribe GoID=1

LPHD.Sim = FALSE
LPHD.Sim = TRUE

IED

Slide 58
IEC 61850 Topic
C/S Testing- Why?

> Does my SCADA communication


work?

> Set the IED to mode


(test test/blocked off on on/blocked)

> Are the Reports to SCADA system


issued? IED 1 IED 2

> Embedded into protection testing


template! Preparation of the test &
Assesment.

> What is happening in the data model


Merging unit
001
Breaker
of the IED? 0
IED

Circuit
breaker
x

Slide 59
IEC 61850 Topic
Inside the IED- Every Information is Available

Slide 60
IEC 61850 Topic
Technical Realization in TU 3.10 (2016-06)

> IEC 61850 C/S comes with a lot of new use cases

> Test Universe communicates directly with the IED

IEC Network

IEC communication

Slide 61
IEC 61850 Topic
C/S Testing

• Set Test Mode and Behavior


• Enable/Disable Reports

• Report notifications
• Read values

Slide 62
The C/S Module in Detail

• Set Test Mode and Behavior


• Enable Reports

• Voltages & Currents

• Report notifications
• Read values

• Set Test Mode and Behavior


• Disable Reports
Slide 63
IEC 61850 Topic
C/S Module – an OCC style testing

Set IED

Assess the values


Output  (Assessment View)
State 1
C/S Response
Trigger the stop
Output  condition
State 2
C/S Response

Output 
State n
C/S Response

Reset IED

Slide 64
Standardized Test Sequencer

Standardized Procedures for


Future Maintenance!

Slide 65
Assesment and View in C/S Monitor

Slide 66
Monitoring your IEC 61850 substation

1915 May 2017


May 2017
Slide 67
IEC 61850 Topic
Questions

> How good is your knowledge on your IEC 61850 substations?


> How confidence is your team in handling your IEC 61850 substations?
> If a relay failed, how could you guarantee that the new relay is working in
the same way as the previous one?
> ...

© OMICRON Page 68
Modern methods for commissioning hybrid substations
using IEC 61850 and conventional signals
> SCL verification
Actual Traffic

Comparison?

Actual Traffic
==

SCL
Comparison?
==


Comparison?
==
!
© OMICRON Page 69
IEC 61850 Topic
Substation integrated tests (SCL and Interoperability)

> System Verification


> Found and Verified
> Found with Differences, Not Found, Orphans

© OMICRON Page 70
IEC 61850 Topic
Propagation time measurement
IEC 61850 Topic
Ethernet packet interference
IEC 61850 Topic
Influence of interfering traffic

Ping (ICMP) traffic to interfere with Sampled Values

Packet Probability
Packet
Packet size duration for
frequency
@ 100Mbit/s interference
500 bytes
40 µs 1000 s-1 4%
(4000 bits)
1538 bytes
123 µs 885 s-1 10.9 %
(12304 bits)

Occupied bandwidth ≡ probability for interference


Only Sampled Values – no interferences

Baseline for following measurements: 26µs


500 bytes packets interfering

40µs + 26µs

9592 = 96%
1538 bytes packets interfering

123µs + 26µs

8894 = 89%
IEC 61850 Topic
FAT or SAT scenarios in local substations

Page 77
IEC 61850 Topic
Troubleshooting

Page 78
IEC 61850 Topic
On-line Observation of actual values

> Observe actual values and graphs of recent history


> Check the configuration
> Observe GOOSE and SV data and statistics live

Page 79
IEC 61850 Topic
Recording
> Record all signals of the signal pool and derived quantities
> Define powerful trigger conditions
> Store recordings on the internal disc or external storage
devices (USB)
> Access your recordings via the DANEO Control SW or
through the Web Interface

Trigger conditions

Page 80
IEC 61850 Topic
Analysis

> Analyze signals in an aggregated time-aligned presentation


> Check the network traffic and related messages (e.g. GOOSE details of a
binary signal) in context
> Analyze additional hidden circumstances on the network:
> Ethernet packets occurred in a time span
> Bandwidth usage
> Propagation time of certain kind of messages
> Export data in COMTRADE or PCAP format for further analysis

Page 81
IEC 61850 Topic
PTP Sniffer

Page 82
IEC 61850 Topic
SV statistics analysis

© OMICRON Page 83
IEC 61850 Topic
Supervision - Event list
IEC 61850 Topic
Event Detect Criteria & Action

© OMICRON Page 85
IEC 61850 Topic
OMICRON Solution Overview

© OMICRON Slide 86
Measurement in Smart Substations

1915 May 2017


May 2017
Slide 87
Measurement Technology

1915 May 2017


May 2017
Slide 88
Measurement Devices

> Energy Meter


> Transducer
> Power Quality Instruments (PQI or PQ meter)
> Phasor Measurement Unit (PMU) or Synchrophasor
> (Relay)

© OMICRON Slide 89
Calibration Requirement

> Accuracy
> 4 time more accuracy than spec
> 0.2% accuracy test equipment can calibrate
1% measurement devices.

> Traceability
> Quoted from CMC 256plus Test Report:

Hong Kong
Service Centre

Your CMCs

© OMICRON Slide 90
Measurement Functions at Relays
CMC 356
> Measurement accuracy 1%

Relay

© OMICRON Slide 91
Measurement Functions at Meters

> Energy meters accuracy level: Class 0.5, 1 and 2 (0.5%, 1% and 2%).

CMC 356

© OMICRON Slide 92
Measurement Functions at Meters

> Energy meters accuracy level: Class 0.1, 0.2

CMC 256plus

© OMICRON Slide 93
Measurement Functions at Meters

> Energy meters accuracy level: Class 0.1, 0.2

© OMICRON Slide 94
Sweet in actions

© OMICRON Slide 95
Measurement Functions at Meters

> Energy meters accuracy level: Class 0.1, 0.2

CMC 430
8.7kg

© OMICRON Slide 96
Energy Meter in Smart Substations

1915 May 2017


May 2017
Slide 97
Theory: Calculations

> Example: Energy Meter has the following specs

Parameter Value
Voltage (L-L) 400V
Current 5A
Power Factor 0.92
Meter Constant 10000 Pulse\kWh
Time 8 hours

3 . . 3,186.97
3,186.97 8 25,495
254,950

© OMICRON Slide 98
Theory: Smart Meter

> How to be Smart?


> Advanced Metering Infrastructures (AMI) – communication & sys. integrations
> Bi-directional meters

> 3-phase Energy Meters connections:


Connection Type No. of CTs No. of VTs
3-wire 2 2
3 2
4-wire
3 3

© OMICRON Slide 99
Theory: Connections

> 3-phase, 4 wire meter


connection 3 x CTs, 3 x VTs
> 3 cos or
> 3 cos

© OMICRON Slide 100


Theory: Connections

> 3-phase, 3 wire meter connection


> 2 x CTs, 2 x VTs
>
> cos 30°
> cos 30°
> cos 30° cos 30° cos sin 30° sin
> cos 30° cos 30° cos sin 30° sin
>
>
> cos 30° cos sin 30° sin cos 30° cos sin 30° sin
> 3 cos or
> 3 cos

© OMICRON Slide 101


Module: Meter

© OMICRON Slide 102


Test on Energy Meters

> Load Test


> Mechanism Test
> Injection Test
> No-Load Test
> Creep Test

© OMICRON Slide 103


Test on Energy Meters

Load Test
> Injection of Voltage and Current for some time then detect the number of
pulses, which lead to check the overall operation of the meter.
> Result: meter error (measurement unit )

Mechanism Test
> Injection of Nominal Voltage and Nominal Current then check for a specific
amount of energy to be measured
> Total meter error = counting unit error + measurement unit error

© OMICRON Slide 104


Test on Energy Meters

No-Load Test
> Injection of 115% of Nominal Voltage and zero Current
> Result : determine if the meter has started or not
> "definite no motion" or "one pulse tolerated"
Creep Test
> Inject of 0.5% of the Nominal Current with the Nominal Voltage and the
meter should start counting.
> Result : determine if the meter has started or not
Injection Test
> Inject a known amount of energy into the meter for a defined period of time
and then to check the reading of the meter.
> Checking only, no assessment or reporting

© OMICRON Slide 105


Test Object

© OMICRON Slide 106


Hardware Connection

© OMICRON Slide 107


Meter Testing Accessories

Scanning heads

SEM 1 SEM 2 SEM 3


(OSH 256) (TK 326) (SH 2015)

LEMO Adapter Cable

© OMICRON Slide 108


Alternative “Hardware” Connection

© OMICRON Slide 109


Meter Constant and Class

© OMICRON Slide 110


Energy Directions

© OMICRON Slide 111


Measurement Setup

© OMICRON Slide 112


Load Test with the Test Object

> Load test without a reference meter

> Load test with a reference meter

> Load test with a correction table


> 1. Test CMC with a reference meter
> 2. Export the parameters of CMC as the correction table
> 3. Import the correction table for the calibrations on the object meters.

© OMICRON Slide 113


Test Sequence

© OMICRON Slide 114


Test Sequence (with a Reference Meter)

Classic: about 70 years old


© OMICRON Slide 115
Test Points

© OMICRON Slide 116


Reporting

© OMICRON Slide 117


Power Quality Instrument

1915 May 2017


May 2017
Slide 118
About Power Quality in Smart Grid

> Power Quality ~ Consumer / utilities customers


> Harmonics and Voltage sag/swell
> PQ meter installed at customer site
> Power Quality ~ Smart Grid with DER
> Harmonics and Voltage sag/swell

> Frequency disturbances


> Flickers
> Interharmonics

> PQ meter installed at the important points of the Smart Grid.

© OMICRON Slide 119


IEC Standards

> IEC 61000-4-30, 4-15, 4-7


> IEC 62586 Power quality measurement in power supply systems, Published
on (2013-12-12)

IEC 62586-1, - Part 1: Power quality instruments (PQI).


> It is a product standard that refers to IEC 61000-4-30, IEC 61000-4-7,
IEC 61000-4-15
> Complements basic EMC standards with environmental, safety, performance
requirements

IEC 62586-2 Part 2: Functional tests and uncertainty requirements.


> It is a standard specifying functional and uncertainty tests intended to verify the
compliance of a product to class A and class S measurement methods defined in
IEC 61000-4-30
> IEC 62586-2 is complementing IEC 61000-4-30

© OMICRON Slide 120


PQ phenomena acc. to IEC 61000-4-..

© OMICRON Slide 121


PQ Signal Generator: Phenomena

Frequency Magnitude of Voltage

Flicker Voltage dip

© OMICRON Slide 122


PQ Signal Generator: Phenomena

Voltage swell Voltage interruption

Transient dip Voltage unbalance

© OMICRON Slide 123


PQ Signal Generator: Phenomena

Harmonics Interharmonics

Rapid voltage variation

© OMICRON Slide 124


How CMC generate accurate signals

© OMICRON Slide 125


OMICRON’s Solution

© OMICRON Slide 126


Example: Tests according to IEC 61000-4-30:2008

> Table 2 of IEC 61000-4-30:2008

© OMICRON Slide 127


Type Tests for IEC61000-4 Series

> Testing State 2 of IEC 61000-4-30 for steady-state uncertainty verification

© OMICRON Slide 128


Power Quality Signal Generator: Multi-incident

> E.g. Testing State 2 (230V 50Hz)


> Output signals will be:

© OMICRON Slide 129


Voltage and Current Harmonics (Signal Generation)

© OMICRON Slide 130


Voltage and Current Harmonics (Signal Measurement)

© OMICRON Slide 131


Example: Harmonic Analysis (temporary monitoring)

© OMICRON Slide 132


Example: Setup a temporary signal monitoring

© OMICRON Slide 133


Example: Setup a temporary signal monitoring

> Transformer Inrush current captured

© OMICRON Slide 134


Example: Setup a temporary signal monitoring

© OMICRON Slide 135


Measurement in 21st century

> Bi-directional metering measurement is essential for the smart substations


> Power quality instrument are installed in the smart grid in the fastest trends.
> Challenges on complex measurement and calibration requirement
> Demanding calibration tasks are more than ever.

> Solution: ultra-portable (for on-site jobs), standardized (OCC concept),


accurate signal source as reference (no need for heavy external reference)
> Hybrid solution for both conventional devices and IEC 61850 ones.
> Wait!
> In normal operations, where are those signals come from?
> Are those signal accurate?

© OMICRON Slide 136


Current Transformer

1915 May 2017


May 2017
Slide 137
Current Transformer Right-hand Rule

Flux

Primary
Current

Secondary
Current

© OMICRON Slide 138


Modeling of Real Current Transformer
Ip I’p Is 3
P1 RCT S1
IL Iext
Np Ns Vcore
VRCT
IE
RH Lm
1 ZB
Reddy
2

P2 S2

The 3 parts of the CT model:


Is Iext
1> Winding Ratio
2> Core (Represented by the excitation curve) I’p

3> Winding Resistance

© OMICRON Slide 139


Modeling of Real Current Transformer

> Iext = Excitation Current


> IP = Primary Current
> IS = Secondary Current
> RH = Hysteresis losses
> LM = Main inductivity of the core
> Reddy = Eddy losses of the core
> NP, NS = Amount of turns of the ideal core
> Vcore = Secondary core voltage
> RCT = secondary winding resistance
> ZB = Connected burden

© OMICRON Slide 140


International Standards for CTs

> IEC 60044-1:1996 Instrument transformers - Part 1: Current transformer


> IEC 60044-6:1992 Instrument transformers - Part 6: Requirements for
protective current transformers for transient performance

> IEC 61869-2 Instrument transformers – Part 2: Additional requirements for


current transformers
> IEC 61869 is the successor of IEC 60044-1 and IEC 60044-6

> IEEE C57.13TM Standard Requirements for Instrument Transformers

© OMICRON Slide 141


Metering CT requirements

Security
εc Factor (FS)
,

0.2FS5
Core saturates
too late

OK Failed

! Beware of underburden a metering CT!

Slide 142
Protection CT requirements

Accuracy Limiting
Factor (ALF)
εc
,

Failed OK

5P10

Core saturates
too early

! Beware of underburden a protection CT!

Slide 143
Knee Point Definition

> Kneepoint estimation:


V*
Saturation 1
∗ ∗ ∗
+10 % 1.3
1
+50 % ∗ ∗
Linear part 1.3

I*
(*): Different excitation curves:
> IEC 600 44-1: VCT, rms, Irms
> IEC 600 44-6: VC, rms, Ipeak

Slide 144
Class M

applies for 25% - applies for 50% -


100% of rated 100% of rated
burden burden

Classes 0.1 – 0.2 – 0.2S – 0.5 – 0.5S – 1 – 3 – 5


(at nominal current)
Excerpt from the standard for classes 0.1 – 0.2 – 0.5 – 1:

Accuracy Current ratio error at percent Phase error at percent of


Class of nominal current nominal current

5 20 100 120 5 20 100 120

0,1 0,4 0,2 0,1 0,1 15 8 5 5

0,2 0,75 0,35 0,2 0,2 30 15 10 10

0,5 1,5 0,75 0,5 0,5 90 45 30 30

1,0 3 1,5 1 1 180 90 60 60

Slide 145
Tolerances for class P and PR
@ rated Ip @ accuracy limit
Accuracy Current error Phase displacement Composite error %
class % Minutes Centi-radians
5P ±1 ± 60 ± 1.8 5
10P ±3 - - 10

Tolerances for class TPX, TPY and TPZ


Accuracy @ rated Ip @ accuracy limit
class Current Phase displacement Peak instantaneous
error % Minutes Centi-radians error %

TPX ± 0.5 ± 30 ± 0.9 ̂ 10


TPY ±1 ± 60 ± 1.8 ̂ 10
TPZ ±1 180 ± 18 5.3 ± 0.6 ̂ 10

Slide 146
Methods - Primary nominal current injection

Mobility > Approx. 2 tons of equipment

> High accuracy


Accuracy
> Error-prone due to complicated wiring

Safety > Dangerously high voltages and currents

> Requires several people to set-up and


Handling
conduct test

© OMICRON Slide 147


Methods - Primary current injection

Mobility > More than 30 kg / 66 lbs (not including additional equipment)

> Not sufficient for high-accuracy metering CTs


Accuracy > Sensitive to transient distortion from life signals (due to 50 Hz test signals)
> Saturation not reached in many cases (especially TP cores)
Safety > Typical current: 500 A to 800 A

> Re-wiring required for each test


Handling
> Test results must be assessed manually

© OMICRON Slide 148


Methods - Secondary voltage injection

Secondary voltage injection

Mobility > More than 30 kg / 66 lbs (not including additional equipment)

> Not sufficient for high-accuracy metering CTs


Accuracy > Sensitive to transient distortion from life signals (due to 50 Hz test signals)
> Knee points above 2 kV cannot be tested

Safety > Voltages for saturation tests: 2,000 V or more

> Re-wiring required for each test


Handling
> Test results must be assessed manually

© OMICRON Slide 149


Methods - CT Analyzer

CT Analyzer
> Less than 8 kg / 17.4 lbs
Mobility
> Ideal for handling on site

> Measurement of class 0.1 metering CTs


Accuracy > Highly accurate even if active lines are close to the test object
> Knee points of up to 35 kV can be tested

Safety > Maximum output voltage of 120 V

> One-step test determining all parameters (< 1 min)


Handling
> Autom. assessment to standard and integrated report functionality

© OMICRON Slide 150


Burden

Burden  Z  I sn2
Vmeas
Z
I meas

Slide 151
Residual Magnetism

res
Residual Magnetism: K res  ΨS
S
Ψr ΨS: Flux at

Remanence Factor: K r  r Kneepoint
S

HS
Slide 152
Resistance measurement

VC t     0

Slide 153
Resistance

235  Tref .
Rref .  Rmeas.  (IEC 60076-1)
235  Tmeas.
Change Temperature under
“Main -> Settings ->
Temperature”

Slide 154
Demagnetization

Requirement for Excitation and Ratio measurement:


Core MUST NOT be remanent before the measurement!

Therefore the core must the demagnetized before those measurements:


Automatic

Slide 155
Excitation measurement

P1 RCT S1
IExt
IL
Vcore
VRCT
IE AC source with
RH Lm
Reddy variable
frequency

Np Ns
P2 S2

H
Slide 156
Variable voltage vs. variable frequency

BR

VC  4.44  n  B  f  A
Flux density B [T]

HC ˆ
V
 Bˆ  C
n  2f  A
 VC  B  or f  B 
Magnetic Force H [A/m]

E.g. B of 120V@0.1Hz = B of 60kV@50Hz

Slide 157
Excitation test card

Slide 158
Voltage Transformers

1915 May 2017


May 2017
Slide 159
Equivalent circuit of a VT
X5” R5”

X2” R2”

RP” XP” X1 R1

Vp VS2
Vp’ VS1
Xm Rm

© OMICRON Slide 160


Grading capacitances

HV
a) Primary  b)
winding
HV

Secondary 
winding 14 15 16 17 18
Core

13 12 11 10 9 8

1 2 3 4 5 6 7

© OMICRON Slide 161


Equivalent circuit of a VT

> Grading capacitances

© OMICRON Slide 162


Voltage ratio error and phase displacement
IP´´=Iexc+IB1+IB2
X2” R2”
IP´´=Iexc+IB2
IP´´=Iexc+IB1
RP” XP” X1 R1

Iexc

Xm Rm
IB1 IB2

Voltage ratio error and phase displacement has to be measured under


different load conditions

1: For each winding

2: For each winding while the other winding is loaded

© OMICRON Slide 163


International Standards for VTs

− IEC 61869-3 (successor of IEC 60044-2) for inductive VTs


− IEC 61869-5 (successor of IEC 60044-5) for capacitive VTs (CVTs)
− IEEE C57.13 (inductive metering VTs)
− IEEE C93.1 (capacitive metering and protection VTs)

© OMICRON Slide 164


Accuracy classes for M and P windings (IEC)

Phase displacement
M Class % ratio error
Minutes Centiradians
0.1 (only inductive VTs) 0.1 5 0.15
0.2 0.2 10 0.3
0.5 0.5 20 0.6
1.0 1.0 40 1.2
3.0 3.0 Not specified Not specified

% ratio error Phase displacement at % of rated voltage


P Class at % of rated voltage Minutes Centiradians
2 5 100 Fv*100 2 5 100 Fv*100 2 5 100 Fv*100
3P 6 3 3 3 240 120 120 120 7 3.5 3.5 3.5
6P 12 6 6 6 480 240 240 240 14 7 7 7

*Fv= voltage factor, e.g. 1.2, 1.5, 1.9

© OMICRON Slide 165


Accuracy requirements

ε in %
only M class (here 0.2)

0.2
0
-0.2

-3

-6

2 5 80 100 120 VF*100 U/Unom in %

© OMICRON Slide 166


Accuracy requirements

ε in %

only P class (here 3P)


6

0,2
0
-0,2

-3

-6

2 5 80 100 120 VF*100 U/Unom in %

© OMICRON Slide 167


Accuracy requirements

ε in %

6 M and P class (here 0.2 3P)

0.2
0
-0.2

-3

-6

2 5 80 100 120 VF*100 U/Unom in %

© OMICRON Slide 168


Burdening

Load of winding under test (Does not apply for da-dn)


0% or 25 %
100 %
depending on class
Load of all other
windings (da-dn is
0% ε1 ε2
loaded with 0 %) 100 % ε3 ε4

Load of da-dn winding under test


25 % 100 %
Load of all other
windings 0% ε1 ε2

Understand the accuracy differences at different burdens is also important!

© OMICRON Slide 169


Short circuit impedance test

© OMICRON Slide 170


Winding resistance test

© OMICRON Slide 171


Excitation test

© OMICRON Slide 172


Ratio test on inductive VTs

© OMICRON Slide 173


Simulation of VT performance via the model

© OMICRON Slide 174


Ratio test on capacitive VT (1)
a) Overall Ratio @ low excitation
U

C1

LCOMP LS,PRIM RS,PRIM L‘S,SEC1 R‘S,SEC1


V
u

C2
LM RFE V2,1

X
x/n

Same operating point

Same voltage
b) Auxiliary setup @ low excitation
U

C1

LCOMP LS,PRIM RS,PRIM L‘S,SEC1 R‘S,SEC1


V
u

C2
LM V2,2=
RFE
V2,1

X
x/n

© OMICRON Slide 175


Ratio test on capacitive VT (2)
a) Auxiliary setup @ high excitation
U

C1

LCOMP LS,PRIM RS,PRIM L‘S,SEC1 R‘S,SEC1


V1,3
u

C2
LM RFE V2,3

X
x/n

b) Overall Ratio @ high excitation (calculated)


U

C1

LCOMP LS,PRIM RS,PRIM L‘S,SEC1 R‘S,SEC1


VP
u

C2
LM VS =
RFE
V2,3

X
x/n
© OMICRON Slide 176
Energy Meter, CT and VT calibration

> Measurement are from primary to secondary, including CT/VT and


measurement devices (meters)
> Each component has a certain impact to the integrated measurement
accuracy.

> It is not only about the cost or income!


> It is about the integrity of our systems and grids!

© OMICRON Slide 177


IEC 61850 Topic
Merging Unit and Sampled Values

1915 May 2017


May 2017
Slide 178
IEC 61850 Topic
Different Configuration of Merging Unit (MU)

from ABB report


© OMICRON Slide 179
IEC 61850 Topic
A Pilot Project near us
‘Empty’ Panel with almost everything digitalized

Photo by Noble Photo by Noble

© OMICRON Slide 180


IEC 61850 Topic
A Pilot Project near us

© OMICRON Slide 181


IEC 61850 Topic
MU test

ProSecCo
2015-11-10 Slide 182
IEC 61850 Topic
Propagation time measurement

Slide 183
IEC 61850 Topic
Primary Injection

Primary values Sampled Values

Non  Merging Unit
conventional 
Sensors 010111001

© OMICRON Slide 184


IEC 61850 Topic
Automatic MU and Channel detection

Primary values Sampled Values

Non  Merging Unit
conventional 
Sensors 010111001

Network

Ethernet Cable
101101

MU
101101

MU
800 A 101101

MU
101101

MU
101101
MU MU

MU
101101 101101

© OMICRON Slide 185


IEC 61850 Topic
Closing the Testing Loop

Reading the sampled values back on the


Ethernet port

Injection of a sinusoidal test


signal for e.g. ratio test.
Special waveforms to identify
the MU and injected channel

© OMICRON Slide 186


IEC 61850 Topic
MU for Conventional CTs & PTs
Sampled Values & 
Analog Values 
010111001

Secondary 
values

Compare
010111001
Sampled 
010111001
Values

Merging Unit
© OMICRON Slide 187
IEC 61850 Topic
OMICRON Solution Overview

© OMICRON Slide 188


End of Training

Q&A

© OMICRON Slide 189

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