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Advanced Distance:

Test Object - Device Settings

Substation/Bay:
Substation: P? 3BA Substation address:
Bay: Tu 630-3A Bay address:

Device:
Name/description: P? 3BA /Tu 630-3A Manufacturer:
Device type: 7SA610 Device address:
Serial/model number:
Additional info 1:
Additional info 2:

Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 100.0 V V primary: 100.0 V
I nom (secondary): 5.000 A I primary: 5.000 A

Residual Voltage/Current Factors:


VLN / VN: 1.732 IN / I nom: 1.000

Limits:
V max: 120.0 V I max: 10.00 A

Debounce/Deglitch Filters:
Debounce time: 5.000 ms Deglitch time: 0.000 s

Overload Detection:
Suppression time: 50.00 ms

Test Object - Other RIO Functions


CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

Test Object - Distance Settings


System parameters:
Line length: 1.000 Ω Line angle: 85.00 °
PT connection: at line CT starpoint: Dir. busbar
Impedance correction no
1A/I nom:
Impedances in primary no
values:

Tolerances:
Tol. T rel.: 1.000 %
Tol. T abs. +: 100.0 ms Tol. T abs. -: 100.0 ms
Tol. Z rel.: 5.000 % Tol. Z abs.: 100.0 mΩ
Grounding factor:
RE/RL: 1.000000 XE/XL: 1.000000
Separate arc no
resistance:

Zone Settings:
Tol.T
Label Type Fault loop Trip time Tol.T rel Tol.T abs- Tol.Z rel. Tol.Z abs
abs+
Z1 Tripping L-L 500.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z1 Tripping L-E 500.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-L 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-E 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-L 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-E 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω

Linked XRIO References


Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INOM In 5.00 A RIO/Device/Nominal Values/In
RIO.DEVICE.NOMINALVALUES.VNOM V_nom 100.00 V RIO/Device/Nominal Values/V nom

Comment

Test Module
Name: OMICRON Advanced Distance Version: 3.20
Test Start: 03-Aug-2018 23:11:20 Test End: 03-Aug-2018 23:11:21
User Name: Manager:
Company:

Test Settings
Test model:
Test model: constant test current ITest 10.00 A
Allow reduction of no kS = kL: no
ITest/VTest:
ZS mag.: 0.000 Ω ZS angle: 0.00 °
kS mag.: 1.000 kS angle: 0.00 °

Fault Inception:
Mode: random
DC-offset: no

Times:
Prefault: 1.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception

Other:
Extended zones: not active Switch off at zero yes
crossing:
Load current enabled: no Load current:: n/a

Search Settings:
Search res. rel.: 1.000 % Search res. abs.: 50.00 mΩ
Ignore nominal no
characteristics:
Search interval: 200.0 mΩ

Auxiliary Binary Outputs:


Fault inception
Name Slope Trip Delay time Slope
Delay time
Ext. zones active n/a Open n/a Open

Test Results
Shot Test: Fault Type L1-E
|Z| Phi % % of t nom t act. Dev. ITest Result
2.671 Ω 116.04 ° n/a 500.0 ms 476.2 ms -4.759 % 10.00 A Passed
2.291 Ω 80.00 ° n/a 500.0 ms 531.9 ms 6.375 % 10.00 A Passed
1.661 Ω -10.00 ° n/a 500.0 ms 530.0 ms 5.997 % 10.00 A Passed
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω

Shot Test: Fault Type L2-E


|Z| Phi % % of t nom t act. Dev. ITest Result
2.418 Ω 96.97 ° n/a 500.0 ms 438.5 ms -12.31 % 10.00 A Passed
2.819 Ω 63.58 ° n/a 500.0 ms 543.5 ms 8.709 % 10.00 A Passed
830.7 mΩ 30.00 ° n/a 500.0 ms 569.4 ms 13.88 % 10.00 A Passed
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω

Shot Test: Fault Type L3-E


|Z| Phi % % of t nom t act. Dev. ITest Result
2.363 Ω 90.00 ° n/a 500.0 ms 544.2 ms 8.831 % 10.00 A Passed
3.252 Ω 67.93 ° n/a 500.0 ms 526.2 ms 5.246 % 10.00 A Passed
1.663 Ω -14.17 ° n/a 500.0 ms 451.4 ms -9.724 % 10.00 A Passed
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω

Shot Test: Fault Type L1-L2


|Z| Phi % % of t nom t act. Dev. ITest Result
2.128 Ω 106.91 ° n/a 500.0 ms 522.8 ms 4.567 % 10.00 A Passed
3.000 Ω 87.83 ° n/a 500.0 ms 552.0 ms 10.4 % 10.00 A Passed
4.000 Ω 51.60 ° n/a 500.0 ms 1.005 s 101 % 10.00 A Passed
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω
Shot Test: Fault Type L2-L3
|Z| Phi % % of t nom t act. Dev. ITest Result
2.623 Ω 104.38 ° n/a 500.0 ms 411.0 ms -17.81 % 10.00 A Passed
2.699 Ω 70.00 ° n/a 500.0 ms 568.0 ms 13.59 % 10.00 A Passed
1.366 Ω 35.84 ° n/a 500.0 ms 576.2 ms 15.23 % 10.00 A Passed
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω

Shot Test: Fault Type L3-L1


|Z| Phi % % of t nom t act. Dev. ITest Result
2.265 Ω 100.00 ° n/a 500.0 ms 444.5 ms -11.1 % 10.00 A Passed
2.701 Ω 62.71 ° n/a 500.0 ms 586.7 ms 17.34 % 10.00 A Passed
1.701 Ω 36.43 ° n/a 500.0 ms 580.5 ms 16.1 % 10.00 A Passed
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω

Shot Test: Fault Type L1-L2-L3


|Z| Phi % % of t nom t act. Dev. ITest Result
2.629 Ω 100.00 ° n/a 500.0 ms 568.0 ms 13.6 % 10.00 A Passed
578.5 mΩ 60.00 ° n/a 500.0 ms 562.8 ms 12.56 % 10.00 A Passed
1.649 Ω -10.00 ° n/a 500.0 ms 418.7 ms -16.27 % 10.00 A Passed
X/Ω

3.0

2.0

1.0

0.0

-1.0

-2.0

-3.0

-4 -3 -2 -1 0 1 2 3
R/Ω

Shot Details:
Parameters:
Fault Type: L1-L2-L3
| Z |: 1.649 Ω Phi: -10.00 °
R: 1.623 Ω X: -286.3 mΩ
%: n/a % of:
ITest 10.00 A

Results:
t act.: 418.7 ms Assessment: Passed
t nom: 500.0 ms Dev.: -16.27 %
t min: 400.0 ms t max: 600.0 ms

Fault Quantities (natural): Fault Quantities (symmetrical):


VL1: 16.48 V 0.00 ° V0: 0.000 V n/a
VL2: 16.48 V -120.00 ° V1: 16.48 V 0.00 °
VL3: 16.48 V 120.00 ° V2: 0.000 V n/a
IL1: 10.00 A 10.00 ° I0: 0.000 A n/a
IL2: 10.00 A -110.00 ° I1: 10.00 A 10.00 °
IL3: 10.00 A 130.00 ° I2: 0.000 A n/a
VFault: 16.48 V 0.00 °
IFault: 10.00 A 10.00 °

Fault Trip
Postfault

V/V

60
40
20 t/s
-0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8
0
-20
-40
-60
-80

VL1 VL2 VL3

I/A
12.5
10.0
7.5
5.0
t/s
2.5 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8
0.0
-2.5
-5.0
-7.5
-10.0
-12.5
-15.0
IL1 IL2 IL3
Fault Trip
Postfault

Trip
Start

-0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8


t/s

Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 418.7 ms <none> n/a
C2 - C1 418.7 ms n/a

Test State:
Test passed
Test performed offline: Test results are simulated!

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