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Substation/Bay:
Substation: P? 3BA Substation address:
Bay: Tu 630-3A Bay address:
Device:
Name/description: P? 3BA /Tu 630-3A Manufacturer:
Device type: 7SA610 Device address:
Serial/model number:
Additional info 1:
Additional info 2:
Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 100.0 V V primary: 100.0 V
I nom (secondary): 5.000 A I primary: 5.000 A
Limits:
V max: 120.0 V I max: 10.00 A
Debounce/Deglitch Filters:
Debounce time: 5.000 ms Deglitch time: 0.000 s
Overload Detection:
Suppression time: 50.00 ms
Tolerances:
Tol. T rel.: 1.000 %
Tol. T abs. +: 100.0 ms Tol. T abs. -: 100.0 ms
Tol. Z rel.: 5.000 % Tol. Z abs.: 100.0 mΩ
Grounding factor:
RE/RL: 1.000000 XE/XL: 1.000000
Separate arc no
resistance:
Zone Settings:
Tol.T
Label Type Fault loop Trip time Tol.T rel Tol.T abs- Tol.Z rel. Tol.Z abs
abs+
Z1 Tripping L-L 500.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z1 Tripping L-E 500.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-L 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-E 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-L 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
ZA Starting L-E 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
X/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
Comment
Test Module
Name: OMICRON Advanced Distance Version: 3.20
Test Start: 03-Aug-2018 23:11:20 Test End: 03-Aug-2018 23:11:21
User Name: Manager:
Company:
Test Settings
Test model:
Test model: constant test current ITest 10.00 A
Allow reduction of no kS = kL: no
ITest/VTest:
ZS mag.: 0.000 Ω ZS angle: 0.00 °
kS mag.: 1.000 kS angle: 0.00 °
Fault Inception:
Mode: random
DC-offset: no
Times:
Prefault: 1.000 s Max. fault: 6.000 s
Postfault: 500.0 ms Time reference: fault inception
Other:
Extended zones: not active Switch off at zero yes
crossing:
Load current enabled: no Load current:: n/a
Search Settings:
Search res. rel.: 1.000 % Search res. abs.: 50.00 mΩ
Ignore nominal no
characteristics:
Search interval: 200.0 mΩ
Test Results
Shot Test: Fault Type L1-E
|Z| Phi % % of t nom t act. Dev. ITest Result
2.671 Ω 116.04 ° n/a 500.0 ms 476.2 ms -4.759 % 10.00 A Passed
2.291 Ω 80.00 ° n/a 500.0 ms 531.9 ms 6.375 % 10.00 A Passed
1.661 Ω -10.00 ° n/a 500.0 ms 530.0 ms 5.997 % 10.00 A Passed
X/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
Shot Test: Fault Type L2-L3
|Z| Phi % % of t nom t act. Dev. ITest Result
2.623 Ω 104.38 ° n/a 500.0 ms 411.0 ms -17.81 % 10.00 A Passed
2.699 Ω 70.00 ° n/a 500.0 ms 568.0 ms 13.59 % 10.00 A Passed
1.366 Ω 35.84 ° n/a 500.0 ms 576.2 ms 15.23 % 10.00 A Passed
X/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
3.0
2.0
1.0
0.0
-1.0
-2.0
-3.0
-4 -3 -2 -1 0 1 2 3
R/Ω
Shot Details:
Parameters:
Fault Type: L1-L2-L3
| Z |: 1.649 Ω Phi: -10.00 °
R: 1.623 Ω X: -286.3 mΩ
%: n/a % of:
ITest 10.00 A
Results:
t act.: 418.7 ms Assessment: Passed
t nom: 500.0 ms Dev.: -16.27 %
t min: 400.0 ms t max: 600.0 ms
Fault Trip
Postfault
V/V
60
40
20 t/s
-0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8
0
-20
-40
-60
-80
I/A
12.5
10.0
7.5
5.0
t/s
2.5 -0.8 -0.6 -0.4 -0.2 0.0 0.2 0.4 0.6 0.8
0.0
-2.5
-5.0
-7.5
-10.0
-12.5
-15.0
IL1 IL2 IL3
Fault Trip
Postfault
Trip
Start
Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 418.7 ms <none> n/a
C2 - C1 418.7 ms n/a
Test State:
Test passed
Test performed offline: Test results are simulated!