Professional Documents
Culture Documents
KS~10G03LC
PINSTECH/NPD-121
J. I. AKHTER
K. A. SHOAIB
M. A. SHAIKH
M. AHMED
A. Q. MALIK
J.I. Akhter
K.A. Shoaib
M.A. Shaikh
M. Ahmed
A.Q. Malik
Description
ABSTRACT
INTRODUCTION
EXPERIMENTAL
2.1 Material
2.2 Samples
2.3 Welding
2-4 Etching
2.5 Microscopy
IMAGE FORMATION IN A SCANNING ELECTRON
MICROSCOPE (SEM)
3.1 Interaction of Electrons with Solid
3.2 Principle of SEM
ELECTRON PROBE MICROANALYSIS
4.1 Energy Dispersive System (EDS)
4.2 Wavelength Dispersive System (WDS)
RESULTS
DISCUSSION
REFERENCES
TABLES
FIGURES
ABSTRACT
C
stainless steel include N 3 6 ' M C, M,C- and intermetallic
2 g
phase to form.
2. EXPERIMENTAL
2.1 Material
2.2 Samples
2.3 Welding
2.4 Etching
2.5 Microscopy
nX = 2d SinO,
where n is the order of diffraction,
X is the wavelength of X-rays,
d is the interplanar spacing of the crystal and
0 is the Bragg angle.
5. RESULTS
6. DISCUSSION
REFERENCES
Staple Fe Cr Ni Mn Mo C N Si P S
304 67.91 19.0 9.3 2.0 - 0.08 0.03 1.00 0.0045 0.03
304L 68.56 19.0 10.0 2.0 - 0.03 0.03 1.00 0.0045 0.03
316 66.18 17.6 11.6 1.32 2.7 0.06 0.03 0.51 0.0015 0.002
316L 65.41 17.0 12.0 2.00 2.5 0.03 0.03 1.00 0.0045 0.03
- 15 -
Type of
Scanning Image Major tnformation
labia U I : Cr/Pa ratio, and Mi/Pa ratio (in brackets), for the steals investigated.
The values, other than those for parent natal, represent only those
spots or areas with high segregation.
E.M.E
W^ ELECTRON
L T
TRANSMITTED ELECTRONS
(a)
INCIDENT ELECTRONS
T7777777m777777777
AUGER ELECTRONS SECONDARY ELECTRONS
BACKSCATTERED
ELECTRONS
CONTINUUM
X-RAYS
FLUORESCENT CHARACTERISTIC
X-RAYS X-RAYS
(b)
20 30 40 50 60 70 80 90 Cr
Weight Percentage Chromium
Fig. 6. Iron-chromium equilibrium diagram showing composition of sigma phase.
1100
1000-
tu
a:
=>
5
IS
a.
UJ
10 10,000
TIME(h)
•
Printing Corporation of Pakistan Press, Islamabad