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Article history: The Cux Zn1−x (x = 0.06, 0.08, 0.1) deposits were fabricated by a electrodeposition method. The structural
Received 12 November 2013 and electrical properties of the films were investigated by cyclic voltammetry (CV), X-ray diffraction
Received in revised form 17 January 2014 (XRD), Scanning electron micrograph (SEM), and DC resistivity measurements. Phase identification of
Accepted 20 January 2014
the samples was studied by the XRD patterns. XRD patterns shows the characteristics XRD peaks cor-
Available online 27 January 2014
responding to the, ˇ, and phases. The grain sizes of the samples were decreased whereas microstrain
increased with the increase in Cu2+ substitution. The SEM study reveals the fine particle nature of the
Keywords:
samples with increasing Cu content. DC resistivity indicates the metallic nature of the prepared sam-
Electrodeposition
Cu–Zn alloy ples. It has been found that the Cu ions have a critical influence on the resultant structure and resistivity
Electrical property properties of the Cu–Zn samples.
Shape memory alloys © 2014 Elsevier B.V. All rights reserved.
∗ Corresponding author at: Mustafa Kemal University, Faculty of Art and Science,
Electrodeposition was realized in a conventional glassy cell in
Department of Physics, 31000-Hatay, Turkey. Tel.: +90 326 245 58 66;
non stirred and non aerated conditions. The bath composition
fax: +90 326 245 58 67. and deposition parameters for the Cu–Zn deposits are reported in
E-mail address: ihkarahan@gmail.com (R. Özdemir). Table 1. All the chemicals used were of analytical grade. Double
0169-4332/$ – see front matter © 2014 Elsevier B.V. All rights reserved.
http://dx.doi.org/10.1016/j.apsusc.2014.01.119
İ.H. Karahan, R. Özdemir / Applied Surface Science 318 (2014) 100–104 101
Table 1
Electrolyte composition and deposition conditions for Zn1−x Cux films electrodeposited on aluminum substrate at pH 5.8 and 20 ◦ C for the duration of 1 h.
Sample CuSO4 .5H2 O (mol L−1 ) ZnSO4 .7H2 O (mol L−1 ) Na3 C6 H5 O7 (mol L−1 ) Current (mA)
The microstrain was obtained by using the relations [30] 3.1. Electrodeposition and properties of Zn, Cu, and Zn1−x Cux thin
films
ˇ × cos q
ε= (2)
4
To define the effect of electrolyte concentration on the Cu–Zn
where ˇ is the full-width at half maximum, is the wavelength of alloy deposition process cyclic voltammetry technique was used.
X-ray used (1.5400 Å), and is the diffraction angle. Fig. 1 shows voltammograms for the aluminum electrode in the
The resistivity measurements were carried out using the four Cu–Zn baths. From this figure, the influence of copper content
point probe method. For this purpose; the electrodes were attached on the potentiodynamic cathodic and anodic polarization parts
to the contact regions with silver paint. The ohmic behavior of of cyclic voltammograms curves can be seen. The potential was
the contacts in the studied temperature region was confirmed by scanned from 0.5 V to the cathodic direction up to −1.6 V and
the linear variations of the I–V characteristics which is indepen- ended at 0.5 V. It is apparent from Fig. 1 that the anodic part
dent from the reversal of the applied currents. The thermal voltage in the cyclic voltammograms consisted of one anodic current
effect was eliminated by taking the average of voltage readings peak for all the films. This shows that the alloy dissolution takes
with two reverse currents at each temperature. Each sample was place under one potential values. The anodic process, in general,
measured several times to make sure that the obtained data was shows an anodic dissolution peak A (A1 for 0.10 M, A2 for 0.08 M
reliable. The temperature-dependent conductivity measurements and A3 for 0.06 M CuSO4 solutions) at 0.1 V vs SCE. In solutions,
Fig. 3. (a) SEM images of Zn74 Cu26 alloy (0.06 M CuSO4 .7H2 O). (b) SEM images of Zn63 Cu37 alloy (0.08 M CuSO4 .7H2 O). (c) SEM images of Zn48 Cu52 alloy (0.10 M CuSO4 .7H2 O).
during the forward scan towards the negative direction, the peak was observed at 0.15 V. When the copper concentration was
cathodic current increased sharply when the deposition begins. increased to 0.08 M, the electroreduction peak shifted to −1.2 V
In addition, the increase in the current density at potentials more and the dissolution peak of the deposit showed an increase. When
negative than ∼−1.20 V can be attributed to a significant hydrogen the copper concentration was increased to 0.1 M, the reduction
evolution reaction (HER) in parallel to Cu–Zn electrodeposition. It peak was practically unaffected, but the dissolution peak increased
was observed that in presence of more copper ion the cathodic again.
current was increased. Cu–Zn electrodeposition in the presence It may be noted, in Fig. 1, that the deposition rate is affected in
of 0.06 M copper presents a reduction peak at −1.05 V versus cathodic region by the concentration of copper, since the cathodic
SCE. Upon reversal of the potential-sweep direction, a dissolution current density in this region increased when the concentration
İ.H. Karahan, R. Özdemir / Applied Surface Science 318 (2014) 100–104 103
of this complex in the bath increased (20 mA cm−2 , 0.06 M CuSO4 105
in the bath; 30 mA cm−2 , 0.08 M CuSO4 in the bath; 34 mA cm−2 , 100
0.08 M CuSO4 in the bath). In this region a primary bulk nucleation
95
and growth of copper occurred.
Grainsize (nm)
The cathodic current starts to increase and forms the cathodic 90
peak at a potential that depends on bath condition. 85
The reaction responsible for the cathodic peak is reaction (1): 80
2+ − 0 75
(1)Cu + 2e = Cu
70
Upon the sweep reversal, the cathodic current density gradually 65
decreases, until it crosses 0 and turns into anodic current. Further 60
sweep in the positive direction results in the anodic peak, which 20 30 40 50 60
corresponds to the reaction (1) in the reverse direction. The current Copper in Deposited CuZn (%)
density past the peak is 0, indicating the completion of oxidative
dissolution of metallic copper at the electrode surface. In the anodic Fig. 4. Grain size (D) with Cu content.
direction, however, the oxidation of copper starts from the surface
that already has copper deposited, resulting in a potential close to
the Cu/Cu2 equilibrium potential. Due to the difference in depo- Fig. 4 shows that the crystallite diameter decreased from
sition and dissolution potentials, a crossover occurs between the 100 to 66 nm with increase in Cu2+ substitutions, which is in
cathodic and anodic current traces [31] at the crossover poten- agreement with the results observed in the literature [35,36]. Fur-
tial Ex. The presence of the crossover is diagnostic for the nuclei ther, the substitution of Cu2+ in place of Zn2+ ion increased the
formation on the electrode [32]. crystalline size, due to the large size mismatch between Cu2+
The preferential crystal orientation of zinc electrodeposits and Zn2+ ions. Hence, in order to relax the volume strain the
depends on the experimental conditions [33,34], such as current crystallite size decreases with the increase in Cu2+ concentra-
density, bath composition, pH and temperature. Fig. 2 shows the tion. Other possible explanation to decrease of crystallite size is
X-ray diffraction patterns obtained for several Cu–Zn coatings elec- that the ionic radius of Cu is smaller than the ionic radius of
trodeposited at gradually increasing copper concentration. From Zn.
the XRD measurements in the electrodeposited samples ˛, ˇ, and The temperature dependent electrical resistivity measurements
phases were detected. When the deposit was formed in the pres- for all samples were carried out in the temperature range of
ence of 0.06 M Cu (Zn74 Cu26 ), a considerable decrease of the (1 1 0) 100–350 K and the variations of normalized resistivity of five sam-
peak was observed, as well as of the peaks associated with planes ples were plotted as a function of temperature in Fig. 5. There is a
(2 1 1), due to the change in orientation of the Cu–Zn crystallo- gradual linear drop in resistivity as the temperature is lowered from
graphic planes by the incorporation of copper. When the copper 320 K. The resistivity increased with the increase in Cu substitu-
content in solution was increased to 0.08 M (Zn63 Cu37 ) and 0.1 M, tion. The resistivity increased with the Cu substitution as it should
the peaks associated with plane (1 1 0) and (2 1 1) diminished fur- since increasing disorder, brought about by rising Zn concentra-
ther and (1 1 1) peak was appeared. When the copper content in tion, contributes to the increasing electron scattering and hence to
solution was increased to 0.1 M (Zn48 Cu52 ), a peak (3 1 1) then increasing resistivity.
appeared at a value of 2 = 88◦ . Electrical resistivity increases with increasing Cu content and
When Zn electrodeposited with other metals the morphol- more increase in these elements in the sample decreases the resis-
ogy of the deposits modifies because of their influence on the tivity [37,38]. Fig. 6 illustrates increase in electrical resistivity
growth of the initial nuclei [33]. Fig. 3 shows SEM micrographs of values for the alloys with increasing Cu concentrations in film. Fig. 6
deposits formed from the Zn74 Cu26 (Fig. 3(a) 0.06 M CuSO4 .7H2 O); shows the strong dependence of the resistivity on the composition
Zn63 Cu37 (Fig. 3(b) 0.08 M CuSO4 .7H2 O) and Zn48 Cu52 (Fig. 3(c) of thin films. This strong dependence on the composition can be
0.10 M CuSO4 .7H2 O) the acidic citrate–sulfate Zn–Cu solutions at understood qualitively by considering the densities of states. The
various copper concentrations. It is observed that the deposits density of states splits up into contributions from the components
are generally composed of fine grains. The metallic luster and the (Zn, Cu) of the alloy. The two contributions are well separated in
brightness of the deposit increased with increasing of the copper. energy.
In the presence of 0.06 M copper in the bath, the deposit being
compact and formed by small cubical crystallites. With a copper Zn63Cu37 Zn48Cu52 Zn74Cu26
concentration of 0.08 M, a deposit with even smaller grain size was
observed with slim rods (Fig. 3b), and at the 0.1 M copper grain size
1.00
was began to bigger non-coalesced globular crystallites and the film
Normalized Resisvity
Table 2
Grain size, micro strain values for Zn74 Cu26 , Zn63 Cu37 and Zn48 Cu52 alloys.
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