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Date : 3/13/2017
Resolution : 256 x 192
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Instrument : 6490(LA)
Acc. Volt. : 15 kV
Magnification : x 5,000
Dwell Time : 0.1 msec.
Sweep Count : 10
10 µm IMG1 10 µm Ni K
10 µm Cu K 10 µm Sn L
3600
Acquisition Parameter
Instrument : 6490(LA)
3200 Acc. Voltage : 15.0 kV
Probe Current: 1.00000 nA
CuLa
1600
SnLr2,
CuKa
SnLb
NiLl
1200
CuKb
SnLa
NiKa
NiKb
SnLl
800
SnLr
400
0
0.00 1.00 2.00 3.00 4.00 5.00 6.00 7.00 8.00 9.00 10.00
keV
ZAF Method Standardless Quantitative Analysis
Fitting Coefficient : 0.8623
Element (keV) Mass% Error% Atom% Compound Mass% Cation K
Ni K 7.471 12.53 3.76 13.65 13.1630
Cu K 8.040 83.93 5.43 84.44 83.8932
Sn L 3.442 3.54 1.79 1.91 2.9438
Total 100.00 100.00
JED-2300 AnalysisStation