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Un-Ku Moon
Oregon State University Emerging
Electrical Engineering and Computer Science
ADCs
Still brewing…
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Presentation Content First Things First
Zero-crossing detector (comparator) based ADC I would like to acknowledge and thank my
VCO (noise-shaping quantizer) based ADC colleagues and graduate students who provided
Continuous-time input pipelined ADC much of the following material
Correlated level shifting (CLS) based ADC
Dr Rob Gregoire
Dr. Hoyoung Lee
Stochastic (mostly digital) ADC Dr. David Gubbins Dr. Nima Maghari
Asynchronous SAR ADC Ben Hershberg Dr. Tawfiq Musah
Yue Hu Dr. Skyler Weaver
Perhaps your favorite is missing…
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Comparator-Based Pipelined ADC Zero-Crossing-Based Circuits (ZCBC)
Sepke et al. ISSCC 2006 Brooks et al. ISSCC 2007
Φ2 Q Φ2 Φ2
CF CF
Φpcb I1 I2
VIN Φ1 Q1 I1 VIN Φ1 Φ2
Φ2 Q
CS VX CS VX
VO CL
Φ1 ΦPC Φ1
VO
Φpc
Φ2 Φ1 Φ2 Φ2 Φ1
Q2 ΦPC
Φ2 Φ2 CL
VCM
I2 Q1 Φpc Φpcb
DVRP VCM DVRP VCM ZCD
Q Q2 Q VX
VCM
VX VCM
VO
First/proof-of-concept
Fi t/ f f t realization
li ti off the
th CBSC Comparator
C t replaced
l d with
ith simple
i l zero-crossing
i detector
d t t (ZCD)
Comparator is a cascade of several gain stages Currents split to minimize switch nonlinearities
A fine charging phase minimizes overshoot 8bit ((6.4 ENOB)) 200MS/s p
pipelined
p ADC in 0.18µm
µ CMOS
10bit (52dB SNDR) 8MS/s pipelined ADC in 0.18µm
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Q2 I2 VOP
VINP CS
Φ2
Φ1 Φ2 Φ2
CL
ΦPC
Φ1 Φ2
ΦPC
VXP VRN
VCM VCM
VRP Q1
Φ1 VXN Φ2
ΦPC
Φ1 Φ2 Φ2 CL Q2
Chu et al.
VLSI 2010 VINN CS
Q2 I2 VON
VXN
(100 MS/s)
Φ2 Φ2
53-80 fJ/step VRP VRN
CF Q1
VXP
X
Coarse/fine charging with CMFB (not shown)
Comparator realized as self-biased
self biased differential amplifier
Second-order 2-level DSM in 0.18µm CMOS
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Hovin
H i ett al.
l JSSC Jan-1997
J 1997
Iwata et al. ISCAS 1998 & TCAS2 Jul-1999
Wismar et al al. ESSCIRC 2006
Kim et al. ISCAS 2006
Straayer et al. VLSI 2007 & JSSC Apr-2008
Apr 2008
Straayer et al. VLSI 2008 & JSSC Apr-2009
Park et al. ISSCC 2009
CBSC/ZCBC integrator:
More issues… Maghari et al. EL Jun-4-2009
Use of resistor current sources eliminates need for CMFB
New charging scheme reduces some errors & maximizes swing
Second-order 2-level DSM in 45nm digital CMOS
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Time Domain Signal Processing VCO Based ADC Resolution
fmax 8 f max f
resolution = log 2 ( − min )
f sample f sample
1LSB(2π)
KVCO ⋅ Vtuningrange
= log 2 ( )
f sample
fmin 2
The proponents make
1LSB(2π)
the case that time
domain signal resolution
Issues:
is independent
p of supply
pp y
Need wide/linear VCO tuning range for high resolution ADC
scaling and more robust
VCO based ADC linearity limited by nonlinear voltage-to-
to voltage noise
frequency conversion
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1
Y [ z] = {KVCO ⋅ TS ⋅ X [ z ] + (1 − z −1 ) E[ z ]}
2π
NTF = (1 − z −1 )
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VCO-Based Delta-Sigma (Higher Order) ADC Linear Voltage-to-Phase Quantization
Park et al. ISSCC 2009
Iwata et al. ISCAS 1998 & TCAS2 Jul-1999
Straayer et al. VLSI 2007 & JSSC Apr-2008
ϕ1 R
Vout Quantization error…
error
X
ϕ2 Stored on integrating
cap (not reset)
Continuous--Time Input Pipelined ADC
Continuous
VD
Effectively added to
the new input sample Gubbins et al.
Vout ϕ1 ϕ2 ϕ1 CICC 2008, CICC 2009, JSSC-2010
Æ First-order
noise-shaping
t (like the VCO)
Dout
LSB - e(n)
This opens paths to
t many possibilities…
Traditional Proposed
Stop Discharge Stop Discharge
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Problem Statement Conceptual Front-end Sampler
Interfacing to high performance ADC is not trivial
Many application notes written
Incorrect external circuitry leads to poor ADC results
Typical application circuit
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Filter Frequency Response Windowed Continuous-Time Input
• Prediction filter provides T/2 phase lead Gubbins et al. CICC 2009
– Filter does not affect ADC frequency response
Fs=26MHz 79
SNR(impulse sampling)
-14dB -40dB/dec
40dB/dec SNR(window sampling)
74 SNR(window residue sampling)
SNR [dB]
ADC 69
Gain
64
(dBs)
59
54
0 2 4 6 8 10 12 14
Input Frequency [MHz]
0.6V
Correlated Level Shifting (CLS) Based ADC Bias
“useful”
range
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3
LS
Bias Out
OP OUT
IN
OP
0.0V
=1/2
IN IN
IN IN
OUT
30dB opamp: ~5 bits, small swing
CLS: > 10 bits,
bits large swing 0 0
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CLS Step 2 CLS Step 3
Flip around, sample output Level shift
2VIN
1 + A/2
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CLS LS
CLS
Subtracts signal 36dB (gain)·(best gain+)
Opamp processes
error CDS
(gain)2
CDS
Best
Gain
30 dB opamp
DS
(gain)
Subtracts error
Opamp
O processes
signal
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Testing (Beyond) Rail-to-Rail Measured ENOB
VDD =0.9V
VREF=1.0V
Fs=20MHz
Fin=1, 10MHz
6.2mW (analog)
( g)
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Split-CLS Advantage
Hershberg et al. ISSCC 2010 & JSSC Dec-2010
ФA Vo VDD = 1V
ФS 150mV
Ф1 CCLS
Vx
Vi 450mV
A1 Stochastic ADC
ФA
1V 600mV
100 V
100mV (Mostly Digital and Hopefully Synthesizable ADC)
(+/-Vr,0) A2
Ф2 Ф1
ФS 450mV
Weaver et al. ASSCC 2008 & TCAS1 2010
VCMI 150mV
VCMO
Aeff = A1·A2 1 2
High gain using simple opamps, 20dB + 60dB
even in deep submicron (80dB)
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Fundamental Observation System Level Consideration: A Closer Look
Comparator offset defines flash ADC Apply ramp to comparators with random offsets
Offset is random Shift in reference shifts transfer function
Two Gaussian CDFs spaced 2σ sum to a line
Individual offsets are unknown
Offset distribution can be known 512
384
utput
256
Ou
Σ
128
0
-3 -2 -1 0 1 2 3 1024
Input (σ)
768
Output
–1σ
Input-referred offset
x512
Σ 512
ensity
Σ
Probability De
0.3 512
0.2 384 0
-3 -2 -1 0 1 2 3
Output
256
0.1 128 Input (σ)
0 +1σ x512 0
P
-3 -2 -1 0 1 2 3 -3 -2 -1 0 1 2 3
Input (σ)
Comparator Offset σ
()
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Power ( μW)
Area (m m )
2
0.5 1000
0.25 500
Power
0 0
384 768 1152 1536 1920
Comparators
6
5.5
NOB
5
EN
Nonlinearity reduction
4.5
Gaussian lookup table
4
384 768 1152 1536 1920
Comparators
192 x 20 x 2 = 7680 comparators
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Can We Fully Synthesize ADC? This Just Might Work…
Add digital-like analog blocks to digital library Entire ADC described in verilog/VHDL
Match supply
pp y pitch
p and library
y rules
Generate other files required by synthesis tool
module adc_block(in,out);
input in;
reg out;
endmodule
ADC Layout
verilog/VHDL
Desired synthesis
La o t LEF,
Layout, LEF Verilog,
Verilog etc
etc.
analog
block
Digital library
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QS
Asynchronous SAR ADC Dn-1
Ch ett al.
Chen l ISSCC 2006 Dn-2
D0
Yang et al. CICC 2009 & JSSC 2010
C.C. Liu et al. Binary search algorithm
N clock per N-b
VLSI 2009 & JSSC 2010, ISSCC 2010, VLSI 2010 Reduces both circuit complexity and power consumption
Charge redistribution for high accuracy
Relatively low speed operation
N clock periods needed for N-bit conversion
Power
Po er cons
consumed
med in high speed clock generator
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Asynchronous Clocking Metastability in Asynchronous SAR
Chen et al. ISSCC 2006 Yang et al. CICC 2009 & JSSC 2010
DO
Generate metastability information for each
Vin Vx
VREF
Capacitor
Network
SAR conversion
e.g. Look at how many cycles are completed for each
Async.
Async
QS CLK conversion
i (less
(l the
th full
f ll countt = metastability)
t t bilit )
Async Clock
When metastability occurs
Generator Async. Fill remaining
g bits with the opposite
pp polarity
p y of the last
CLK
resolved bit (all were reset to zero before conversion)
In other words, replace the unresolved bits (including
Next clock is generated from previous latch output
the metastabilityy one)) with “10…0” or “01…1”
No need for high-speed synchronous clock generator
Could minimize clock timing margin
This is my interpretation of Yang’s presentation
Delay decreased with submicron scaling
Contact the author for clarification!
Æ Low noise and low power…
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Emerging
ADCs
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