IS 7098 ( Part 3 ) : 1993

( Reaffirmed 1998 )

hdiurz

Standard

CROSS-LINKED POLYETHYLENE INSULATED THERMOPLASTIC SHEATHED CABLESSPECIFICATION. PART FOR WORKING VOLTAGES FROM 66 kV UP TO AND INCLUDING 220 kV 3
(First Reprint SEPTEMBER 1996 ) UDC 6213152218 : 678073

BIS 1993

BUREAU
MANAK

OF
BHAVAN,

INDIAN
9 BAHADUR

STANDARDS
SHAH 110002 Prim Groap 7 iAFAR MARG

NEW DELHI April 1993

Power Cables

Sectional

Committee,

ETD

FOREWORD This Indian Standard ( Part 3 1 was adopted by the Bureau of Indian Standards, after the draft finalized by the Power Cables Sectional Committee had been approved by the Electrotechnical Division Council. Other two parts of this series of Indian Standards cover thermoplastic sheathed cables of following voltage grades: Part Part 1 2 For working .For working voltages voltages up to and including 1 100 V 33 kV crosslinked polyethylene insulated

from 33 kV up to and including

For the purpose of deciding whether a particular requirement of this standard is complied with, the final value, observed or calculated, expressing the result of a test, shall be rounded off in accordance with IS 2 : 1960 Rules for rounding off numerical values (revised). The number of significant places retained in the rounded off value should be the same as that of the specified value in this standard.

IS 7098 ( PM 3 ) : 1993

Indian Standard

CROSS-LINKED POLYETHYLENE INSULATED THERMOPLASTIC SHEATHED CABLESSPECIFICATION PART FOR WORKING VOLTAGES FROM 66 kV UP TO AND INCLUDING 220 kV 3
SECTION 1 SCOPE 1.1 This standard ( Part 3 ) covers the requirements of single core, cross-linked polyethylene insulated, unarmoured or armoured ( with or without lead alloy sheath ) and thermoplastic outer sheathed cables for 3 phase ac earthed system for electric supply for the voltage grades given in Table I. Table 1 Voltage Grades
System Voltage U(kV) (1) 66 110 132 220 Rated Voltage Uo/U (kV ) (2) 38166 64/l IO 761132 I27/220 Highest System Voltage Um( kV) (3) 72.5 123 I45 245

GENERAL

3.3 Acceptance

Tests

Tests carried out on samples taken from a lot for the purpose of acceptance of the lot. 3.4 Optional Tests Special tests to be cnrried.out, when required, the purchaser and agreement between supplier. 3.5 Earthed System electrical system in which the neutral point mid-point connection is earthed in such a manner that even under fault conditions, the maximum voltage that can occur between any conductor and earth does not exceed 80 percent of nominal system voltage.
or a

by the

An

3.6 Longitudinally Cables to propagation

Watertight

Cables

meet the requirements to prevent the of water along the length of cable.

1.2 Cables covered under this standard are suitable for use where the combined ambient temperature and temperature rise due to load result in conductor temperature not exceeding 90C under normal operation and 250C under short circuit operation. 2 REFERENCES 2.1 Indian Standards listed in Annex necessary adjuncts to this standard. 3 TERMINOLOGY 3.0 For the purpose of this standard the following definitions in addition to those given in IS 1885 ( Part 32 ) : 1971 shall apply. 3.1 Routine Test Tests carried out by the manufacturer on finished cable lengths to demonstrate integrity the cable. 3.2 Type Tests Tests required to be type of cable on a order to demonstrate characteristics to meet NOTE - These tests made before supply on a general commercial basis in satisfactory performance the intended application. all of A are

3.7 Radially Watertight Cable Cables to meet radial propagation the requirements of water. 2 to prevent the

SECTION 4 CONDUCTOR

MATERIALS

4.1 The conductors shall be composed of plain copper wires complying with IS 8130 : 1984. 5 INSULATION The insulation shall ethylene conforming Table 2. 6 SCREENING The screenirig following: shall consist of one or more tape; compound; strip or of the be of cross-linked polyto requirements of the

a) Non-metallic b) Non-metallic and

C)

semi-conducting semi-conducting metallic

Non-magnetic sheath.

tape, wire,

are of such a nature that after they have been made, they need not be repeated unless changes ale made in the cable materials or design which might change the performance characteristics.

NOTE -The semi-conducling tape and the semiconducting compound shall be suitable for the operating temperature of the cable and compatlbiewith the insulating material.

IS 7098 ( Part 3 ) : 1993 Table 2 Properties of XLPE insulation ( Clause 5 )

SI No. Property

Requirement 125 N/sq mm ( Min )

i) Tensile strength before ageing ii) iii) Elongation at break before ageing

ZOO% Min ) (

Ageing in air oven a) Treatment

: Temperature
Duration

135zt3C I68 h *25% ( Max ) *250/ ( Max )

b) Var-iation from corrcspondinp values before agcing: Tensile strength Elongation at break = iv) Hot set a) Treatment

: Temperature
1 in;e under- load Mechanical stress

200 + 3C 15 Minutes 20 N/cm 175;., ( MUX )

b) Elongation c) Permanenl v) Shrinkage a) Treatment b) Shrinkage

under load elongation after cooling

IS% ( MUX )

: Terrpxature
Duration

130*3c 6h 4% ( Max )

7 MOISTURE

BARRIER

7.3 Water Blocking Tape/Powder This shall be synthetic non-woven rape/synthetic powder with suitable water swellable absorbent. The tape/powder can be either non-conducting or semi-conducting. 8 INNER be of Lead Alloy E given in Table 3. SHEATH

7.1 Laminated Tape This shall be a plastic coated non-ferrous metal tape longitudinally applied and suitably sealed. 7.2 Lead Alloy Sheath The metallic sheath shall conforming to requirements

8.1 The inner sheath shall be of PVC compound or thermoplastic polyethylene compound. 8.2 The PVC compound ST2 of IS 5831 : 1981. shall conform to Type

NOTE - For special applications other lead alloys may be used as agreed to between the purchaser and the manufacturer.

Table 3 Composition of Lead Alloy E Sheath (

Antimony c --Min *--_ Max Tin C---h--_Y Mi?l Max Tellurium Max Silver MUX

7.2 )
Copper Bismuth Max Zinc MC7.X Total Lead Other Elements *---, c --Min Max

MC7X

(1) 015 NOTES

(2) 025

(3) 034

(4) 045

(5) 0005

(6) 0005

(7) 006

(8) 005

(9) 0.002

(10) 00 I

( II ) Remainder

I Values are in percentage by weight. 2 Description of material - 04 percent Tin, 02 percent Antimony.

IS 7098 ( Part 3 ) : 1993 8.3 The thermoplastic polyethylene shall conform to following properties:
a) Tensile compound
NOTE - Semi-conducting barrier tape/tapes with suitable overlap may be applied brtween the conductor and extruded conductor screening. Such b:trrier tape/ tapes when used shall be compatible with the insulating material and suitable for the operating temperature of the cable. 12.2 The minimum

strength ageing ( Min )

-before

before

125 N/mm2

b) Elongation

at break ( Min) ageing 300/ 300;

ductor

screening

thickness of extruded shall be 08 mm.

con-

-After ageing in air oven at 1 IOf2C for 14 days c) Hot-deformation test 115f2C for 6 hours -MUX d) Carbon 9 ARMOUR 9.1 The armour metallic wires. shall be of depth of indentation black content

13 INSULATION 13.1 The insulation shall be extruded Crosslinked Polyethylene ( XLPE ) satisfying the requirements of Table 2. 13.2 The average thickness of insulation shall not less than the nominal value ( ti ) specified Table 5. be in

50% 2.5&O-5%

non-magnetic

9.2 The requirements of non-magnetic material shall be as agreed to between the purchaser and the supplier. 10 OUTER SHEATH

13.3 The smallest of the measured values of thickness of insulation shall not fall below the nominal value ( ti ) specified in Table 5 by more than 0.1 11. Table 5 Nominal Thickness
Voltage Grade uo/u ( kV ) 38166 64/l IO 76/132 1271220

of XLPE Insulation
Nominal Insulation Thickness. mm II 16 18 27 --

10.1 The outer sheath may be of PVC compound or thermorilastic polyethylene compound. 10.2 The PVC compound ST2 of IS 583 I : 1984. 10.3 The thermoplastic shall conform to 8.3. SECTION 11 CONDUCTOR 11.1 The conductor shall be of stranded circular compacted construction complying with the requirements of Class 2 of IS 8 I30 : 1984.
NOTE - Where permissible.

shall conform

to Type

polyethylene

compound I4 INSULATION SCREEMNG

CONSTRUCTION

14.1 The insulation screening shall consist parts, namely, metallic and non-metallic. 14.2 Non-metallic Part

of two

necessary, segmental construction

is

14.2.1 The non-metallic part shall consist of a layer of semi-conducting compound extruded directly over the insulation.
NOTE - Conductor insulation screening operation. screening. shall be insulation ehtrudcd in and one

11.2 The smallest nominal conductor cross-section for each voltage grade shall be as per Table 4. Table 4 Nominal Cross-Section
Voltage Grade UoiU ( kV )

of Conductor

14.2.2 The minimum thickness of insulation screening shall be 08 mm.

extruded

Smallest Nominal Cross-Section of Conductor ( sq. nln )

(I!
38/66 6b/110 761132 I271220

(2)
95 IS0 185 400

14.2.3 Semi-conducting tape/tapes with suitable overlap may be applied over the extruded insulation screening. Such barrier tape/tapes when used shall be compatible with the insulating material and suitable for the operating temperature of the cable. 14.3 Metallic Part

12 CONDUCTOR

SCREENING of a over 14.3.1 The metallic part of the screening sha]~ consist of Copper wires/Copper tape( s ) helically applied over the lead alloy sheath or non-metal& screening. 3

12.1 The conductor screening shall consist layer of semi-conducting compound extruded the conductor.

IS 7098 ( Part 3 ) : 1993 14.3.2 The diameter of copper wire in the screening shall not be less than 08 mm. The perpendicular gap between two adjacent wires shall not be more than 40 mm. The nominal thickness of copper tape shall be not less than 01 mm. The minimum thickness shall not fall below the nominal value by more than 10%. 14.3.3 A binder tape of copper shall be applied over the wire screen. The nominal thickness of the tape shall be not less than 01 mm. The minimum thickness shall not fall below the nominal value by more than 10%.
NOTE - Where Lfad Alloy Sheath is provided over the non-metallic part of the insulation screening as moisture barrier, it shall form the metallic part of the screening.

16 INNER

SHEATH inner barrier

16.1 For armoured cables the extruded sheath shall be applied over the moisture or the metallic screen.

16.2 The thickness of inner sheath at any point shall not be less than the minimum value specified in Table 7. Table 7 Thickness of Inner Sheath
)Calculated Diameter Under Inner Sheath mm ~_--_-_-h_-____ Over Up to and including 40 45 50 55 60 65 10 75 80 85 90 95 100 105 II0 II5 Minimum Thickness of .Inner Sheath mm

15 MOtSTURE 15.1 The Moisture given below:

BARRIER Barrie; shall be provided shall longitudinas be

0.9 I0 11 I.2 I2 1.3 I4 IS 16 16 I.7 I.8 I9 20 20 21 22

40 45 50 55 60 65 70 75

a) Water blocking tape/powder suitably applied; and b). Laminate tape shall be applied ally with overlap and sealed; OR Metallic sheath of lead applied by extrusion. 15.2 Metallic 15.2.1 sheath Sheath alloy

E shall

be

80 85 90 95 100 105 110 115 IFictitious

This shall consist of extruded of lead alloy E as per 7.2. not

metallic

152.2 Thickness of sheath shall the value specified in Table 6. Table 6 Thickness of Metallic

fall below

diameter calculated as described in Annex B.

Sheath
of

Xalculated Diameter Under Metallic Sheath mm (_-___-,h-----_ -Up to and Over Including 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 IFictitious 40 4s 45 55 60 65 70 75 80 85 90 95 100 IO5 110 115

Minimum Thickness Metallic Sheath mm

17 ARMOUR 17.1 Armour, when specified, shall consist of non-magnetic metallic wires helically applied over the inner sheath. 17.2 The dimensions of armour specified in Table 8. Table 8 Dimensions
%XcuIated Diameter Under Armour mm r_ _--h__---~ Above Up to and Including 40 55 70 IFictitious 40 55 70 -

19 20 21 22 23 24 25 26 27 28 28 29 30 31 32 33

wires shall

be as

of Armour Round Wires

Nominal Diameter Round Wire mm of

20 2:so 315 400

diameter calculated as described in Annex B.

diameter calculated as described in Annex B.

IS 7098 ( Part 3 ) : 1993

17.3 The armour wires shall be applied as closely as possible. 17.4 The direction of lay of armour 18.3.2 Rrmoured Cables

shall be left

hand. 17.5 Joints in the armour wires shall be made by welding and surface irregularities shall be removed. A joint in any wire shall be at least 300 mm from the nearest joint in any other armour wire in the completed cable.
18 OUTER 18.1 The SHEATH

The thickness of outer sheath at any point for armoured cables shall not be less than the minimum value specified in col 5 of Table 9.
18.4 The outer sheath shall be coated suitable conducting material. Table 9 Thickness of Outer Shcrth ( Clauses 18.3.1 and 18.3.2 )
KZakulatcd Diameter UnEb;allfer Thicknem of Outer Sheath for Unarmoured Cables Minimum of Outer Sheath for Armoured Cable mm

with

extrusion.

duter sheath shall It shall be applied:

be

applied

by

a) over the moisture barrier or metallic screen unarmoured cables. and b) over the armour for armoured cables.
NOTE - A binder outer sheath. tape may be applied under the

c_---__*__-__
Nominal mm -__-*--.__ Above Up IO and Including (1) (2) 40 45 50 55
IllIll

Minimum mm

(31 24 26 28 30 3.2 34 36 38 40

0) 172 188 201 220 236 252 268 284 30

(5) 172 188 204 220 236 252 268 284 30

B.

18.2 The colour of outer sheath shall be Black. 18.3 Thicknrss of Outer Sheath 18.3.1 Unarmoured Cables The thickness of outer sheath of unarmoured cables determined by taking the average of a number of measurements shall not be less than the nominal value specified in col 3 of Table 9 and the smallest of the measured values shall be not less than the minimum value speci,fied in col 4 of Table 9.
SECTION 19 CLASSIFICATION 19.1 Type Tests OF TESTS 4

_
40 45 50

ii
65 70

60
65 70 75

75
l)Fictilious

diameter calculated as described in Annex

TESTS

The following shall constitute the type tests:

Tesr Rcf of Requiremenrs

Kcl Part I Part 5 Part 6

.for

Test Merhod

a) Tests on conductor: i) Annealing test ( for copper ) ii) Resistance test b) Physical test on insulation: i) Test for thickness and dimensions of insulation ii) Tensile strength and elongation at break iii) Thermal ageing in air oven iv) Hot set test v) Shrinkage test vi) Void and contaminants test c) Resistivity test for semi-conducting layers d) Test for concentric metallic screen: i) Test for concentric copper wire ii) Test for concentric copper tape
)Reference

IS 8130 : 1984 IS 8130 : 1984 Tables 5, 19, I6 Table Table Table Table Under 20.2.4 2 2 2 2 consideration

Part 7 Part I I Part 30 Part I2 20. I Annex C 20.3 20.4

20.4, Note 28.4

to various parts of IS 10810 set ies. relevant clauses of this standard. 5

IS 7098 ( Part 3 ) : 1993 Test e) Thickness of metallic sheath material: 20.6 and elongation at break Under Under consideration consideration Part 36 Part 37 Part 3 Part 42 Ref of Requirements 70.5 Ref for Test Method ) Part 34

f) Tests for armouring i) Dimensions ii) Tensile strength test test

iii) Wrapping iv) Resistivity 8) Physical

Under consideration

tests for outer sheath: of thickness Table 9 Part 6

1) Measurement 2) PVC sheath i) Tensile ii) Thermal

strength

and elongation

at break

IS 5831 : 1984 IS 5831 : 1984 IS 5831 : 1984 IS 5831 : 1984

Part 7 Part 11 Part 10 Part 14

ageing in air oven

iii) Loss of mass iv) Heat shock test v) Hot deformation vi) Shrinkage vii) Thermal 3) PE sheath test stability test

IS 5831 : 1984 IS 5831 : 1984 IS 5831 : 1984

Part 15 Part 12 IS 5831 : 1984

i) Carbon

black content at

Nominal 25% f 8.3 8.3 20 7 20.8.3 cable sample 20-9.1.

value: 05%

Part 32 Part 7 Part 15 Part 53

ii) Tensile strength and elongation break before and after ageing iii) Hot-deformation

h) Flammability
sheathed

test ( for PVC outer cables only ) test

j)

Water tightness

20.8 20.9 Part 7 20.2 20.11 20.12, 20.18 Part 48 20.13 20.14 20.15

k) i) Thermal

ageing on complete

ii) Tensile strength and elongation at break for insulation and outer sheath iii) Resistivity test for semi-conducting layer m) Bending test followed by P.D. test

Table 2 and IS 5831 : 1984 20.2 20.1 I.1 20.12, 20.18

n) Dielectric power factor and capacitance measurement at ambient temperature p) Dielectric power factor measurement elevated temperature cl) Load cycle test followed measurement r$ Impulse
NOTES 1 Before commencement

at

20.13 20.14.1

by P.D. by HV test

withstand

test followed

20.15.1

of the electrical type tests from n to q compliance

of 19.5 shalt be ensured.

2 After completion of electrical type tests from II to r, the sheath and any armouring or tapes shall be removed from the sample for physical inspection of the shield and the insulation screen. The observation should not reveal broken wilrs/tape in the shie!d and no damages shall have occurred on the insulalion screen causing discontinuity.

IReference to various parts of IS IO810series, releyant clauses of this standard. 6

IS 7098 ( Part 3 ) : 1993 19.1.1 The tests from (n) to (r) shall be performed successively on the same test sample of complete cable not less than 10 metres in length between the cable accessories. 19.1.2 Special Provision (q) may be carried out on 20 METHOD OF TESTS Test for Iasulation and determin-

20.1 Void and Contaminants

20.1.1 Preparation of test sample ation of voids and contaminates.

Tests at ( p ) and different samples.

19.2 Acceptance Tests 19.2.1 The following tests: a) Conductor shall constitute rest of insulation test sheath acceptance

resistance

Five centimetres of the sample shall be cut helically or in some other convenient manner to produce thin samples of the insulation. Wafers ( or the turns of the helix ) shall be approximetely 06 mm thick. The cutting blade shall be sharp and shall produce a sample with very smooth cut surfaces. The sample shall be kept clean and shall be handled carefully lo prevent scratching the sample surface. The entire specimen shall be viewed by transmitted light for determination of voids, contaminants and translucent materials in the insulation. A contaminant is any solid or liquid material which is opaque or not homogenous cross linked polyethylene insulation, including opaque or discoloured, translucent material of more than 0127 mm in its radial vector projection. The entire area of 20 consecutive wafers ( or equivalent turns of the helical sample ) shall be examined with a minimum of I5 power magnification, including any areas which appear suspect during the above examination by transmitting light. A tabulation of numbers and sizes shall be made with a minimum of I5 power magnification of: i) All voids, 5 pm in greatest dimensions and larger ii) All contaminants, 5 pm in greatest dimensions and larger iii) Discoloured, translucent material than 5 pm. This tabulation recorded and reported. of more shall be the by on 40

b) Annealing test c) Test for dimensions e) Void and contaminants f) Test for thickness g) Test for thickness

d) Hot set test for insulation of metallic

of outer sheath

h) Partial discharge test j) High voltage test ( as per 20.17 ) k) Measurement of capacitance ( as per 20.18 ) NOTE - Partial discharge test shall be carried out on full drum length. 19.3 Routine Test 19.3.1 The following routine test: a) Conductor b) Partial shall be test carried out as

resistance test

discharge test

c) High voltage 19.4 Optional Test

Cold impact test shall constitute 19.5 Check on Insulation-Thickness Electrical Type Tests

the optional

test.

Before the

and largest translucent material shall be marked encircling and must be subsequently measured a micrometer microscope of minimum of power magnification.

The largest void, the largest contaminant

The average value of the insulation thickness shall be measured at both ends of the sample ( as per Part 6 of 1s 10810 ). If the average of the two measurements of the insulation thickness is: -not more thau 10% over the declared nommal value for the cable, the test voltages as specified in relevant clauses of this specification shall be used. -more than IO/, but not more than IS% over the declared nominal value for the cable, the test voltages as specified in relevant clauses of this specification shall be increased to give an electrical field stress at the conductor screen, which will be the ssme value as with nominal insulatiou thickness and specified test voltage. -more than 15/, over the declared nominal value for the cables another test sample shall be chosen. 7

The number of voids, contaminants and translucents per unit length of insulation shall be calculated from the tabulation. 20.1.2 The insulation be free from: of the completed cable shall

a) Any void larger than 76 pm.

The number of voids larger than 5 I-Lrnshall not exceed 2 per cubic cm of insulation. ( opaque material or b) Any contaminants material that is not homogenous with insulation ) larger than 127 I*m in its greatest dimensions. The number of contaminants of sizes between 5 pm and 127 ym shall not exceed 1 per cubic cm of insulation. 4 Any translucent material that is larger than 127 mm in its radial vector projection.

IS 7098 ( Part 3 ) : 1993 20.2 Hesistivity Test for Semi-conducting Layer 20.8.2 Radial Watt-r Tightness Test

20.2.1 The resistivity test for extruded semiconducting layers applied over the conductor and over the insulation shall be determined by measurements on test pieces taken from the core. 20.2.2 The procedure for measurement in accordance with Annex C. shall be

Under consideration. 20.8.3 There shall be no water leak from the ends of the sample. 20.Y Thermal Ageing Tests on Complete Cable This test shall be carried out to check that the insulation, non-metallic sheath and extruded semiconducting layers over the conductor and insulation are not liable to deteriorate in operation due to contatit with their components in the cable. Three pieces of complete cable about 200 mm long shall be suspended vertically and substantially in the cenlre of the oven at least 20 mm away from each other and shall not occupy more than The pieces 2 percent of the volume of the oven. of cable shall be kept in the oven at the temperature of IO i 2C above the rated maximum normal operating conductor temperature of the cable for a duration of 168 h. The rest pieces of insulation and sheath aged pieces of cable shall. be prepared jected to tensile strength and elongation from the and subat break.

20.2.3 The measurements shall be made at a temperature within + 2C of the rated maximum normal operating conductor temperature. 20.2.4 The following:
ii)

resistivity

shall

not

exceed

the

i) Conductor screen: Core screen:

I 000 ohm-metre 500 ohm-metre

20.3 Test for Concentric Copper Wire On a test piece with a length of at least I metre, all layers over the copper wire shall be removed. Copper wires numbering IO% or 5 whichever is more, shall bc straightened, and the electrical resistance measured as per relevant test method. While measuring the resistance of the concentric copper wires, all the wires are connected together at both ends of the test piece. 20.4 Test of Concentric Screen of Copper Tape On a test piece with a length at least I metre, all layers over the screen including sheath. are removed. All parts of the screen are unwound and straightened. The electrical resistance of the tape shall be measured.
NOTE - The rzsistivity of the copper wire/tape at 20C shall not exceed 01786 ohm mm Per mctre cable length.

The resistivity of the extruded semi-conducting layers shall be determined on the test pieces from accordance with the aged cable sample in Annex C. 20.9.1 The test results for tensile strength and elongation at break shall comply with the values of insulation and sheath after ageing as given in Table 2 for insulation and IS 5831 : 1984 for PVC outer sheath and 8.3 for thermoplastic polyethylene outer sheath. The resistivity .of semi-conducting measured as per Annex B shall following values: i) Conductor screen: screen: screen layers not exceed the

20.5 Measurement

of Thickness

of Metallic Sheath

I 000 ohm m 500 ohm m

This test shall be applicable if the cable has a metallic sheath [ as per 10810 ( Part 34) : 19841. Minimum thickness shall not fail below the specified value in Table 6. 20.6 Dimensions of Armour not

ii) Insulation

20.10 Partial Discharge Test The partial discharge test shall be carried out in accordance with IS IO810 ( Part 46 ) : 1984, except for the test voltages and durations. The test voltage shall be gradually increased to 175 times the rated voltage, maintained for IO seconds and then slowly reduced to 15 times the rated voltage and Partial Discharge magnitude measured. The maximum level of the Partial Discharge magnitude at I5 CJo shall not exceed 5 pC for type test and IO pC for routine test. 20.11 Bending Test

The dimensions of non-magnetic armour shall be less than the specified nominal values. 20.7 Flammability Test

Period of burning after removal of the flame shall not exceed 60 seconds and the unaffected ( uncharred ) portion from the lower edge of the top clamp shall be at least 50 mm. 20.8 Water Tightness Test 20.8.1 Longitudinal Water Tightness out Test in

This test shall Annex D.

be carried

as specified

The bending test shall be carried IS 10810 ( Part 50 ) : 1984. 8

out

as

per

IS 7098 ( Part 3 ) : 1993 The diameter greater than: of the test cylinder shall not be The cycle of heating and cooling shall be carried out 20 times at least 5 cycles per week. During the entire period of test a voltage of 2 UO shall be applied to the sample. 20.14.1 There shall be no breakdown during the test and after the final cycle, the sample shall be subjected to and shall comply with the requirements of partial discharge test in accordance with 20.10. 20.15 impulse Voltage Test Voltage Test Followed by High

i) 25 ( d + D ) + 5% for cables with lead sheath or with longitudinally applied metal foil; and ii) 20 ( d + D ) + 5% for others. where D = measured external cable in mm, and d = measured diameter in mm. diameter of the of the

conductor

20.11.1 On completion of this test. the cable shall be subjected to the Partial Discharge test as in 20.10 and shall comply with the requirements specified therein. 20.12 Dielectric Power Factor and Capacitance Measurements This test shall be carried out as per IS 10810 ( Part 48 ) : 1984 at rated voltage and at ambient temperature. The power factor at rated voltage IO x 10-4. shall not exceed

The cable shall withstand without failure IO positive and IO negative voltage impulses at conductor temperature not less tha.n IOC and more than 15C above the maximum rated temperature of the conductor of the appropriate value specified below: Rated Voltage Uo/U ( kV) 38166 64/l 10 761 I32 1271220 Impulse Test Voltage (kV) 325 550 650 1 050

20.12.1 The capacitance of the test sample shall be measured between conductor and metallic screen and shall not exceed the nominal value declared by the manufacturer by more than 8 percent. 20.13 Dielectric Power Factor Measurement at Elevated Temperature The sample shall be heated by passing current through the conductor until the conductor reaches a steady temperature not less than 10C and not greater than 15C above the maximum rated temperature of the conductor in normal operation. The dielectric power factor shall be measured as per IS 10810 ( Part 48 ) : 1984 at rated voltage The measured at the temperature specified above. value of dielectric power factor shall not exceed IO x 10-4. 20.14 Load Measurement The sample in 20.11. Cycle Test Followed b) P.D.

20.151 After the impulse test, the cable sample shall be subjected to power frequency AC voltage test as per Part 45 of IS I08 IO at 25 times the rated voltage for I5 minutes at room temperature and no breakdown of the insulation shall occur. 20.16 Test for Dimensions of Insulation Following 20.16.1 tests shall be carried Inrulation Thickness be not out.

The average thickness of insulation shall less than the specified nominal value ( ti). 20.16.2 Test for Eccentricity of the insulation tmaxtmax fmin

The eccentricity as follows:

4

shall be checked

room in a U bend

shall be laid on the floor of the test having the diameter specified

Eccentricity

x 100 of insulation. 15%.

The sample shall be heated by passing current through the conductor so that the conductor reaches a steady temperature not less than 10C and not more than 15C above the maximum rated temperature of the in&lation in normal operation. The heating current not less than the rated current shall be applied for at least 8 hours and shall be followed by at least 16 h of natural cooling. The conductor shall attain the specified temperature for the last two hours of each heating cycle. 9

where t stands The % eccentricity 20.16.3

for the thickness

shall not be more than

Test for Ovality of the core

m; -

The ovality follows: %

Ovality

shall
dc,r,

be
ml

checked

as

Aore

100

core ma*

where d stands The % ovality

for the diameter

of the core.

shall not be more than 5%.

IS 7098 ( Part 3 ) : 1993 20.17 High Voltage Acceptance Tests ) Test (as Routine and test the voltage shall be 3 times rated 4 hours. 20.18 Measurement of Capacitance Capacitance shall be measured between conductor and metallic screen. The measured value shall not exceed the nominal value declared by the manufacturer by more than 8%. voltage for

The cable shall withstand without any failure the power frequency AC voltage of 25 times the rated voltage for 30 minutes between conductor and metallic screen at the room temperature, test. For acceptance when it is under routine

ANNEX A ( Clause 2.1 )

LIST OF REFERRED IS No. Title INDIAN STANDARDS Title Loss of mass test Thermal ageing in air Shrinkage test Heat shock test Hot deformation Hot set test Carbon content polyethylene test test for of

IS No. Part 10 Part II Part Part 12 14

1885 Electrotechnical vocabulary: conductors ( Part 32) : 1971 Part 32 Cables, and accessories for electricity SUPPlY PVC insulation and sheath of 5831 : 1984 electric cables Conductors for 8130: 1984 insulated electric cables and flexible cords Methods of test for cables: 10810 Part I Part 3 Part 5 Part 6 Annealing test for wires used in conductors Wrapping test for aluminium wires Conductor resistance test TI$ckness for . thermoplastic elastomeric insulation and sheath Tensile strength and elongation at break of thermoplastic and elastomeric insulation and sheath

Part 15 Part 30 Part 32 Part 34 Part 36 Part 37

Measurement of thickness metallic sheath Dimensions material of armouring

Tensile strength and elongation at break of armouring materials Resistivity wires and tance test strips ) Flammability test of armour strips and conducof armour (, wires/ test

Part 42

Part 7

Part 53

( Clauses

ANNEX B 15.2.2, 16.2, 17 2 and 18.4 )

OF

FICTITIOUS CALCULATlON METHOD FOR DETERMINATION DtMENSlONS OF PROTECTIVE COVERINGS B-l GENERAL B-l.1 The thickness of cable covering such as sheaths and armour, has been related to cable diameters by means of step tables. This sometimes causes problems. The calculated diameters are not necessarily the same as the actual values ac!lieved in the production. In border line cases, queries can arise, if the thickness of a covering does not correspond to the actual diameter because the calculated diameter is slightly different. Variation in conductor dimensions between manufacturers cause difference in calculated diameters and may, therefore, lead to variation in the thickness of covering used on the same basic design of cable.

B-l.2 To minimize these difficulties, the fictitious calculation method was invented. The idea is to ignore the shape and degree of compactness of conductors and to calculate fictitious diameters from formulae based on the cross-sectional area of conductors and insulation thickness. Thicknesses of sheath and other coverings are then related to fictitious diameters by tables. The method of calculating fictitious diameters is precisely specified and there is no ambiguity about the thicknesses of covering to be used, which are independent of differences in manufacturing practices. This standardizes cable designs, thicknesses being precalculated and specified for each size of cable. 10

IS 7098 ( Part 3 ) : 1993 B-l.3 Tile Fictitious calculation is nsed only to determine dimensions of sheaths and cable coverings. It is not a replacement for the calculation of normal diameters required for practical purposes, which should be calcul;lted separately. B-2 METHOD B-2.1 The following fictitious method of calculating thicknesses of various coverings in a cable has been adopted to ensure that any difference which can arise in independent calculations, for example, due to the assumption of unavoidable conductor dimensions the and differences between calculation and actual achieved diameters, arc eliminated. B-2.2 Holding strips and counter-helix are not taken into account in this calculation method unless their thickness is greater than 03 mm. B-2.3 The cslculated value of fictitious diameter at each stage shall be rounded off to one significant place of decimal, that is, 01 mm, before proceeding to next step. The rounding off shall be done In accordance with IS 2 : 1960. B-3 CALCULATIONS B-3.1 Conductor The fictitious diameter (do ) of a conductor for each cross sectional area shall be taken from Table IO irrespective of shape or compactness of conductor. Table 10 Fictitious
d,.
mm
1 I0

B-3.4 Copper Screen The increase in fictitious diameter screen ( II- ) is given in Table 1I. Table
Nominnl CrossSectional Area of Copper Screen mm1 I5 25 ;t 10 I6 25 35

due

to copper

11 Increase in Diameter Due to Copper Screen

Increase in Diameter Nominal Cross Sectional Area of Copper Screen mm* 50 70 95 I20 IS0 I85 240 300 lrxrease in Diameter

mm I.7 20

11 12 14

40 50 60

If the cross-section of the copper screen lies between two of the values given in the table above, then the increase in diameter is that given in the table above, then the increase in diameter is that given for the higher of the two crosssections.
Area

of copper i) Concentric Copper

screen copper

shall wire:

be

calculated

as

under:

screen area = 4

sq mm

where. n is the number of copper wires and ti is the nominal diameter of :ach wire in mm. ii) Copper Copper tapes: screen area = II W T sq mm tape(s), of copper

Diameter of Conductor ((1~ )

Nominal CrossSectional Area of Conductor mm2 630 800 d,

Nominal CrossSectional Area of Conductor mm

J5

mm 283 31.9 357 39 451 50 3 564

120 150 185 240 300 400 500

12.4

where N is the number of copper CYis the nominal width in mm, T is the nominal tape in mm.
NOTE An Increa)e

tape

133
153 17.5 195 22.6 25.2

I 000 I 200 I 600

2 000 2 500

thickness
in

of each copper

fictitious dlam:(er of ccve as per A-3.3 and A-3.4 or both, as the case m.iy b:, depending upon whethe!mernllic part of rnsu!ation screen of cable has mztai sheath/copp:r screen or both.

DC shall be taken into account

DSC = DC + 2 tm + IL ( mm )

B-3.2

Cores diameter
do -t

B-3.5 Inner Sheath

DC (mm)

The fictitious given by:

of

a core is

The fictitious is given by: where sheath

diameter

over the inner

sheath ( Ds)

DC =

2ri + 30 ( mm) of msulation

semi-conducting

DS = SC

. where li is the nominal thickness (mm). NO i E - 30 mm is allowed for

lay:rs.

t 2 IS ( mm ) f~ is the minimum in mm.

thickness

of inner

B-3.6 Armour The fictitious given by: diameter over the armour
tlllll )

DA )

is

B-3.3 Metal Sheath The increase in fictitious diameter sheath shall bc twice the minimum metal sheath ( till). due to metal thickness of

DA =

Ds -i- 2 JA (

where d,&is the nominal wire in mm. 11

diameter

of armour

IS 7098 ( Part 3 ) : 1993

ANNEX C ( Cluuse 20.2.2 1

METHOD OF MEASURING RESISTIVITY from 150 mm OF SEMI-CONDUCTING SCREEN

C-l Test pieces shall be prepared lengths of completed cable.

C-2 The conductor screen test piece shall be prepared by cutting a sample of core in half longitudinally and removing the conductor ( Fig. I ). The insulation screen test pieces shall be prepared by removing all the coverings from a sample of core ( Fig. I ). C-3 The resistivity procedure for determining the specific of the screens shall be as follows. silver painted electrodes A, B, C and shall be applied to the semi-conductThe two potential electrodes, B and each placed at least 25 mm beyond electrodes.

C-3.4 After the electrical measurements, the diameter over the conductor screen and insulation and the thickness of the conductor screen and insulation screen shall be measured optically each being the average of six measurements. C-3.5 The volume then be calculated i) Conductor where R = resistance D = diameter metres, in ohms, over the conductor screen in resistivity in ohm-metres as follows: Screen = Rxr(D-T)xT 2L shall

C-3.1 Four D ( Fig. 1 ) ing surfaces. C shall be the potential

C-3.2 Connections shall be made to the electrodes by means of suitable clips. In making connections to the conductor screen electrodes it shall be ensured that the clips are insulated from the insulation screen on the outer surface of the test sample. C-3.3 The assembly shall be placed in an oven preheated to 90 rt 2C and after an interval of 30 minutes, the resistance between the electrodes shall be measured by means of a circuit, the power of which shall not exceed 100 milliwatts.

T = average thickness of screen in metres, and L = distance between potential electrodes in metres. Ra( DfT) x T ii) Insulation Screen = L where R = resistance in ohms, D = diameter over the insulation in metres, T = average thickness of screen in metres, and L = distance between potential electrodes in metres.

ANNEX D ( Clause 20.8.1 )

METHOD
D-l GENERAL

FOR

TEST

FOR

LONGITUDINAL

WATER

TIGHTNESS

D-l.1 This test is intended to be applicable to cables which are designed and constructed to meet the requirement of preventing the longitudinal propagation of water along the cable in case of accidental damages to the outer sheath of the cable.

theysemi-conducting layer over the insulation is exposed for testing the longitudinal water tightness of the cable. D-2.2 Suitable arrangements shall be made Fig. 2 for allowing the relevant interstices exposed to water pressure of 1 m height. as in to be

D-2 TEST

SAMPLE

D-2.1 A six metre long piece of a complete cable is subjected to bending test as per 20.11. Three metres of this cable is cut for water tightness test. All coverings over the moisture barrier shall be removed. This test piece is straightened and placed horizontally. An annular ring of 50 mm width is cut in the middle of the sample so that

D-2.3 The assembly for maintaining the water pressure shall be suitably mounted on the outer sheath without causing any mechanical stress on it. Normal tap water at ambient temperature shall be used in the pressure head. The conductor ends shall be fitted with connections for circulation of suitable current through the conductor. Arrangements for the temperature measurements at the conductor shall be made. 12

IS 7098 ( Part 3 ) : 1993 D-3 TEST PROCEDURE

The test assembly as shown in Fig. 2 shall be filled with normal tap water at ambient temperature and kept for a period of 24 h. The cable shall then be subjected to heating cycles. The heating period shall be 8 h followed by 15 h

of natural cooling. During heating period suitable current shall be passed through the conductor, so that the conductor temperature raised to a value between 95C and 105C. Thai specified conductor temperature shall be attained durmg first two hours of the heating period.

B, C = potential electrodes A, D = current electrodes All dimerkiom in millimetres.

FIG. 1 PREPARATION SAMPLE FOR MEASUREMENT OF THE VOLUME RESISTIVITY OF OF CONDUCTOR AND INSULATION SCREENS

THE

5
-1 All dimensions in millimetres. I-

FIG.2

ARRANGEMENT FOR WATER-TIGHTNESS Tes-r

13

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of Indian

Standards

BIS is a statutory institution established under the Burcnu harmonious development of the activities of standardization, and attending to connected matters in the country.
Copyright

of Indian

Smndards Act, 2986 to promote marking and quality certification of goods

BIS has the copyright of all its publications. No part of these publications may be reproduced in any form without the prior permission in writing of BIS. This does not preclude the free use, in the course of implementing the standard, of necessary details, such as symbols and sizes, type or grade designations. Enquiries relating to copyright be addressed to the Director (Publications), BIS.
Review of Indian Standards

Amendments are issued to standards as the need arises on the basis of comments. Standards are also reviewed periodically; a standard along with amendments is reaffirmed when such review indicates that no changes are needed, if the review indicates that changes are needed, it is taken up for revision. Users of Indian Standards should ascertain that they are in possession of the latest amendments or edition by referring to the latest issue of BIS Handbook and Standards Monthly Additions. This Indian Standard has been developed from Dot : No. ETD 9 ( 2872 )

Amendments

Issued

Since Publication

Amend No.

Date of Issue

Text Affected

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Printed at Dee Kay Printers, New Delhi, India

AMENDMENT

No.

1 JULY 2001

TO IS 709S ( Part 3 ) :1993 CROSS-LINKED POLYETHYLENE INSULATED THERMOPLASTIC SHEATHED CABLES

PART 3 FOR WORKING VOLTAGES FROM 66 kV UPTO AND INCLUDING 220 kV

(Page

1, clause 1.1, line 4 ) Substitute following for the existing line:

without metallic sheath and thermoplastic. (Page 1, clause 6 ) -Insert the following after (c}

d) Copper woven fabric tape. ( Page 2, clause 7.2) Substitute the following for the existing 7.2 Metallic Sheath sheath.

7.2.1 The metallic sheath shall be either lead alloy sheath-or aluminium 7.2.2 Composition 7.2.3 Composition Aluminium (Page of lead alloy E sheath shall be as per Table 3. of aluminium for sheathing

for sheathing shall have minimum,99.690 2, Table 3, clause reference) ) Substituk %bsiNte

by weight of aluminum. 7.2.2 for 7.2.

(Page 2, Table3,CO13

0.35 for 0-34. Substitute the following

Lead hfin (11)

( Page 2, Table 3, CO1 10 and 11 ) existing: Total OC other u emertts

Max (lo) 0.01

for the

(Page 3, clause 10.1, line 1 ) Substitu@ shllfor

Remainder may.

Group

Amend No. 1 to IS 7098 ( Part 3 ) :1993 (Page 3, clause 14.3.1) Substitute the following for the existing clausti 14.3.1 The metallic part of the aaeening shall consist of either copper wires/copper tape(s) helically applied over non-metallic screening or an extruded metallic sheath of aluminium or lead alloy. The metallic sheath applied over the non-metallic patt of the insulation screen shall form the metallic part of the scmerting.
NOl13 For enhancing short-circuit cur-rent carrying capacity of screen, additional QLP ~r~/@Pe (s) an k applied overhder kd alloy sheath with a suitable separator.

(Page

4, c&ruse1433,

Note, /ine3 ) Substitute

may~or shall.

(Page 4, clause 15.1) Substitute the following for the existing clause: 15.1 The moistwe or 15.1.3. barrier shall be provided as given in 15.1.1 or 15.1.2

15.1.1 Water blocking tape/powder shall be suitably applied and kaminste tape shall be applied longhdinsl]y with overlap and sealed. 15.1.2 Metallic sheath of lead alloy E as per 7.2 shall be applied by extrusion. thickness of sheath ahali not fall below the values specified in Table 6. 15.1.3 Alternative to above, moisture barriers ahsll be provided by Aluminium sheath either smooth or corrugated. (Page 4, clause 15.2.1) Substitute the following for the existing clause: 15.2.1 Metallic sheath shall consist of either extmded lead alloy E Sheath as per 7.2.2 or Aluminium Sheath smooth or corrugated as per 7.2.3. (Page 4, clause 15.2.2) Substitute the following for the existing clause 15.2.2 Thickness of lead alloy sheath shall not fall below the value speeified in Table6A. Thickness of aluminium sheath shall not fall below the value specified in Table 6B.
NOIE Afuminium sheath can be either smooth or Corrugated.From flexibility and thermsl expansion point of view corrugated Amtinium sheath is recommended. Smooth aluminium sheath is not recommended for abtea of atcufated dmmeter under ttretsllic sheath cxaeding 50 mm.

(Page 4,Tabk6&CO12,

row3 ) Substitute

50 for 45.

Amend No. 1 to IS 7098 ( Part 3 ) :1993 ( Page 4, Table 6, Tide) Substitute the following for the existing title: Table 6A Thickness of Lead Ailoy Sheath. (Page 4, Table6 ) Insefi the following new Table 6B after Table 6: Table 6B Thickness
Calculated Diameter under Metattic SheatlI mm Over

of Aiuminium

Sheath

Minimum l%ickness of Metattic Sheath mm Smooth (3) 1.9 corrugated (4) 0.6 0.6 0.6 0.6 0.8 0.8 0.9 Lo

Up to and including

(1) 40 45 50 55 65 80 10S

(2) 40
45 50 55 65 80 10s 120

2.2 2.4

( Page 4, clause dimensions.

17.2, line 1 ) Substitute

nomimi

diameter

for

(Page 4, Tabh 8, Tule ) [ Page 5,dause a) over the moisttm (Page

Substitute Diameter {or Dimensions.

18.1( a)] Substitute the foiiowing for the existing barrier or metsiiic screen for unarmored cables, and

5, clause 1-8.4) Substitute the foiiowing for the existing ciauscx material when

18.4 The outer sheath shaii be coated with a suitabie conducting required. [ Page 5, clause 19.l(tt)(i),CO12 Tabies 5,19,16. [ Page 6, clause 19.l(f)(i), for Dimensions. ] Substitute Substitute

Tabie 5 and 20.16 $or Diameter of armour wire

coi 1 ]

Amend No. 1 to IS 7098 ( Part 3 ) :1993 [ Page 6, clause 19.l(g)(3)

the existing 3)
0

(i), (ii) and (iii)]

Nominal value 2.5 * 0.5%
8.3 8.3 8.3 8.3

Substitute

the following
Part 32

for

PE sheath

Carbon black content Tensile strength Elongation at break Before ageing After ageing Hot deformation

ii)
iii)

Part 7
Part 7

Part 7 Part 15

iv)

[ Page6, j)
i)
ii)

clause 19.1(j) ] Substitute

the following

for the existing:

Water tightness test Longitudinal water

tightness test Radial water tightness test

20.8.1 and 20.8.3

Un&r consideration

Annex D
Under cmsideration

[ Page 6, clause 19.l(k)(ii),CO12

IS 5831: (Page 20.2. 19S4.

] Substitute

20.9.1

for Table 2 and

6, clause 19.1(k)

(iii),CO12 J Substitute (iii),CO13 ] Substitute

20.9.1 and Annex C /r

[ Page 6, clause 19.1(k) 20.2. (Page 6, clause 19.l,Nofe (Page

20.2.2 and Annex C for

1 ) Substitute m to rfor n to q.

6, clause 19.l,ZVore 2, line 1 ) Substitute m to r ~or n to r.

(Page 7, clause 19.1.1, line 1 ) Substitute m to r for n to r. (Page 7, clause 19.1.2, line 1 ) Substitute n and q for p and q. ( Page 7, clause 19.4) Substitute 19.4 Optional Test
the following for the existing clause:

a) Cold Impact Test b) Voltage Teat (spark teat on outer sheath without semi-conducting 4 coating)

Amend No. 1 to IS 7098 ( Part 3 ) :1993 A spark test shall be carried out by earthing the metallic sheath or concentric wires or tapes for an ac test and connecting them to the negative pole in the case of a dc supply. The voltage shall be 6 kV ac per millimeter nominal thickness or 9 kV dc per millimeter nominal thickness of the extmded oversheath subject to maximum values of 15 kV and 25 kV respectively. The dwell time of the cable in the region of test shall have sufficient duration to detect any defect. (Page (Page 7, clause 19.5, para 3, line 6 ) Substitute same @ ssme. 7, clause 19.S ) Insert the following Note at the end of the clause

NCITE The declared nominal value of the insulation thickness in context whh t9.5 shall mean the value declared by the. manufacturer to the purchaser.

( Page 7, clause 20.1.1, para 4, line 5 ) Substitute mm. [ Page 7, clause 20.1.1, 50 ~m jbr5 pm. (Page 7, clause 20.1.2 ) para 6, S/ No.(i),

1.27 mm @r 0.127 -Substitute

(ii) and (iii)]

Delete this clause.

(Page 8, clause 20.4, Note, line 2 ) Substitute 0.017 86 for 0.178 6. ( Page 8, clause 20.5, last line) Substitute either in Table 6A or Table
6B for in Table 6.

(Page8, clause 20.6) Substitute the following for the existing clause 20.6 Diameter of Armour

The diameter of non-magnetic armour wires shall not be less than the specitied nomiml values given in Table 8. ( Page 8, clasue 20.8.1, heading ) Substitute the following title for the existing. C Water Tig}rzness Test (Not Applicable Cabks). (Page8, c&me 20.9.l,para 2, lhe2) for corrugated Substitute Aluminium Sheathed

Annex Clor Annex B. fJo for the

( Page 8, clause 20.10, para 2, lines 2 and 4 ) Substitute rated vokage. 5

Amend No. 1 to IS 7098 ( Part 3 ) :1993 [ Page 9, clause 20.ll,(i) ] Substitute and laminated tape for metal foil. metallic sheath for lead sheath Uo for rated voltage.

(Page 9, clause 20.12, lines 2 and 4) Substitute (Page9, clause 20.13,para

Z line2 ) Substitute Uo for rated voltage.

(Page 9, clause 20.15) Insert the following at the end of the clausti
The impulse wave form shall have a virtual front time between 1 pa and 5 ps and a nominal time to half the peak value between 40 ps and 60 W. In other respects, the impulse pulse shall be in accordance with IS 2071.

( Page 10, clause 20.17, I& voltage. (Page-n,

3 and 6 ) Substitute

Uo for rated

Table 10, cof 4, row6) Substitute

50.5 for 50.3. B-3.3 and B-3.4 for

( Page 11, clause B-3.4, Note, line 2 ) Substitute A-33 and A-3.4. (Page

11, clause B-3.5 ) Substitute D= ~o~ .SSC.

(Page 13, clause D-3, fine 4) Insert 3 before the words heating cycles. (Page 13, clause D-3, line 5 ) Substitute (Page 13, clause D-3, line 11) Substitute (Page 13, Fig. 2) 16 h for 15 h. last for first.

Insert the following above the caption of the figure

The minimum imer diameter of the water tube shall be 10 mm.

(ETD9)

Reprography Unit BIS, New Delhi, India