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E-mail raghuveer.ausoori@gmail.com Cell(732) 421 2462 243 Buena Vista Avenue Sunnyvale CA - 94086, United States
Developed the prototype Entropy tool in C language as part of my MS Thesis Involved in moving the Entropy tool to C++ language with support for advanced features Used TetraMax to prove that the test vectors generated after the insertion of test hardware by the entropy tool is lesser than the test vectors required for a circuit with no test hardware
Virage Logic Corporation, Hampton, NJ July 2008 - January 2009 Co-op Engineer Develop a ow to verify power management circuitry and test the new characterization modeling ow Power Flow Verication Project Proved that a memory circuit with the power management circuitry is functional according to the specication using Verilog Modeled the memory circuit to create different behaviors detectable at the external outputs when the power management is activated and deactivated Used Verilog to create an automated ow to augment the existing design ow Characterization Modeling Project Involved in developing a design tool that creates a circuit model for characterizing memories of various sizes. Optimized a complex memory circuit into concise model circuit that can be simulated in minimal time without the loss of accuracy
Designed the 802.11 MAC Layer for the transmitter of a cognitive radio platform Designed the architecture of the hardware and implemented the design using VHDL Validated and tested the design using ModelSim
EDUCATION
Rutgers University, New Brunswick, NJ Master of Science, Computer Engineering, Oct 2009 Anna University, Chennai, TN, India Bachelor of Engineering, Electronics & Instrumentation Engg. (EIE), May 2006 GPA: 4.0/4.0 GPA: 3.5/4.0
PUBLICATIONS/PATENTS
M.S. Thesis: "Information Theoretic and Spectral Methods of Test Point, Partial-Scan, and Full-Scan Flip-Flop Insertion to Improve Integrated Circuit Testability", a new Design-for-Testability (DFT) algorithm to simultaneously insert full scan ip-ops, partial scan ip-ops and test points into sequential circuit to improve the circuit testability to nearly 100% stuck-at fault coverage and reduce test application time and test volume. U.S. Provisional Patent application number 61/109245 led on October 29, 2008 for the above-mentioned work at Rutgers University
HONORS
Awarded Teaching Assistantship for Data Structures and Algorithms in Spring 2009 and for Introductory VLSI Design in Fall 2007 by the ECE Department of Rutgers University Received the Academic Excellence award from Anna University for ranking #1 in the Electronics and Instrumentation Engineering Department during Fall 2003 Received Community Shield in India for continuous excellence in academia in the year 2006
SKILLS
Verilog, VHDL, Cadence design suite (NC-Verilog, Virtuoso Symbol & Layout Editor, Spectre), Synopsys design suite (VCS, Design Vision), Synplify, ModelSim, Xilinx ISE, ChipScope, TetraMAX, C, C++, PERL, Shell
DESIGN PROJECTS
Bluetooth System-on-Chip Developed a Bluetooth System-on-Chip for cashless and cardless billing applications Designed the 32-bit non-pipelined microprocessor with DFT hardware using Verilog Synthesized and simulated the design using the Synopsys Design suite and VCS simulator Tested the design for stuck-at fault coverage using Wavelet Automatic Test Pattern Generator Full custom layout of the datapath and memory was developed using Cadence layout tools Used the Silicon Ensemble tool for the automatic layout and routing of random logic blocks Performed Analog simulation of extracted circuits using Spectre for nal timing check Full Scan and Boundary Scan Hardware with JTAG controller were inserted to increase the fault coverage Test Point Insertion in Non-Scan BIST Modied the ISCAS '89 benchmark s5378 to insert BIST hardware Parsed the circuit using the RUTMOD circuit parser and modied the design using the C language Random patterns were generated using an LFSR and signature analysis was done using a MISR Simulated the circuit with the HOPE fault simulator Test points were inserted based on the undetected fault list to increase the fault coverage