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03/21/15
Introduction
In a data-sheet, information like brief
description of terms, definitions, and testing
procedures currently used for commercial and
military specifications are available.
Electrical Characteristics
Provides the specified electrical-characteristic
limits of the device when tested under the
conditions
in
the
recommended
operating
conditions.
sometimes the electrical characteristics table is
called the dc section.
Live-Insertion Specifications
Provides information about the parameters
needed for true live insertion.
Parameters include Ioff, IOZPU, IOZPD, and BIAS
VCC for pre-charging purposes.
Timing Requirements
This section is similar to the recommended
operating conditions section.
This
section
addresses
the
timing
relationships between transitions of one or
more input signals that are necessary to
ensure device functionality and applies only
to sequential-logic
devices
structure of integrated
circuits (e.g., flip-flops,
latches, and registers).
Switching Characteristics
also known in the industry as the AC table.
Includes those parameters that specify how
fast the outputs will respond to signal
changes at the inputs under specified
conditions of supply voltage, temperature,
and load.
Noise Characteristics
Indicates a devices noise performance due to
power-rail and ground-rail bounce associated
with the high peak currents during dynamic
switching.
Operating Characteristics
The operating characteristics section of the
data sheet includes the parameter that
specifies the power-dissipation capacitance
(Cpd) in a CMOS device.
References
1. JESD88 JEDEC Dictionary of Terms for Solid State Technology, First
Edition, JEDEC Solid State Technology Association, Arlington, VA,
September 2001.
2. Semiconductor Group Packaging-Outlines Reference Guide, literature
number SSYU001, Texas Instruments.
3. JEP103A Suggested Product-Documentation Classifications and
Disclaimers, Electronic Industries Association, Arlington, VA, July
1996.
4. CMOS Power Consumption and Cpd Calculation, literature number
SCAA035, Texas Instruments.
5. Bus-Hold Circuit, literature number SCLA015, Texas Instruments.
6. JESD51-3 Low Effective Thermal Conductivity Test Board For
Leaded Surface Mount Packages, JEDEC Solid State Technology
Association, Arlington, VA, August 1996.
7. Thermal Characteristics of Standard Linear and Logic (SLL) Packages
and Devices, literature number SCZA005, Texas Instruments.
8. Logic in Live-Insertion Applications With a Focus on GTLP, literature
number SCEA026, Texas Instruments.
Thank You
Queries ???
Mail to: anoopmathew@ieee.org
03/21/15
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