Nanonics produces AFM/SPM systems with unique design for overcoming

limitations of standard SPM system. Nanonics offers unique capabilities

for integrated microscope of combining SPM with optical microscopy,
analytical devices (e.g. Raman) and multiprobe operation.
Nanonics opened the door and pioneered many new fields in SPM that
became a standard in this market. The following are examples:

MultiProbe SPM systems

AFM/Raman and TERS
Near-field Scanning Optical Microscopy (NSOM and sSNOM)
Ultimate BioAFM Hydra with Tuning Fork feedback
Fountain Pen Nanolithography
SPM/FIB/SEM Integra ration

The Next Evolution In AFM

Nanonics covers a wide range of the Nanoscience and Nanotechnology

spectrum:

SPM various modes

Online AFM/Raman
TERS
Near-field and Far-field microscopy combined with SPM (NSOM and Apertureless)
Photonics
Plasmonics
BioSPM
Nanolithography
Multiprobe imaging and nanomanipulation,
Nano-Electrical/Thermal,
Low temperature SPM and integration with FIB/SEM.

Visit our website for more information or to get a quote:

www.nanonics.co.il

The Next Evolution In AFM

Nanonics SPM Products

MultiView 1000TM

MultiView 2000TM

MultiView 4000TM
(One Probe)

Optometronics MultiView 4000TM

(One Probe-Two Nanoaligners) (Two Probe-Two Nanoaligners)

MultiView 4000TM

Raman Integration
Packages

AFM/SEM/FIB
Integrations

MultiView 4000TM
(Four Probe)

MultiView 4000 HydraTM

(Two Probe)

CryoView 2000TM

NanoToolKitTM

The Next Evolution In AFM

Unique SPM Design for Free Optical Axis

3D FlatScanTM Scanner Stage

>20 mm clear optical axis

7 mm thin scanner
mms of rough scanning and up to 100
micron of fine scanning in X, Y and Z
directions
Allows for Tip and Sample scanning modes

Transparent Glass Probe

Nanonics NanoToolKitTM:

Optically Friendly AFM Probes

Normal Force NSOM Probes
Coaxial Electrical Probes
Two Wire Thermal Probes
Chemical Writing Probes
TERS Probes

All MultiView Systems Are

Compatible With All Conventional
Probes Available
The Next Evolution In AFM

NSOM/SNOM
Near Field Scanning Optical Microscopy
A line of instruments that provides the highest
resolution optical information simultaneously
with high resolution SPM topography.
Tapered optical fiber probe functions as the
main probe in the SPM
light can be either transmitted or collected so that a
variety of NSOM modes can be operated including
collection, reflection, and transmission modes.

Nanonics provides systems with different

feedback mechanisms
Probe shape and geometry are customizable
depending on the customer needs.
More info can be found at http://
www.nanonics.co.il/products/nsom-spm-systems
/multiview-1000-system.html
or http://
www.nanonics.co.il/products/nsom-spm-systems
/multiview-2000-system.html

The Next Evolution In AFM

Raman characterization: AFM-Raman and

TERS (tip enhanced Raman characterization)
Technology that provides high resolution
chemical information through Raman spectra
on your material simultaneously with high
resolution topographic information.
AFM/confocal Raman microscopy system
Tip enhanced Raman spectroscopy (TERS)
system for higher resolution
In TERS, the SPM tip functions as an antenna to
focus the light right beneath the tip and collect
highly localized Raman spectra.

More info can be found at

http://www.nanonics.co.il/products/nsom-spm
-systems/multiview-1000-system.html
or http://
www.nanonics.co.il/products/nsom-spm-syste
ms/multiview-2000-system.html

The Next Evolution In AFM

Multiple probe SPM

A revolutionary technology that refers to the ability to
simultaneously and independently operatetwoor
evenfour probes
provides maximum flexibility and sophistication in your
characterization needs.

Probes can be any combination of scanning probe, near

field optical, thermal, electrical and nanolithography
probes.
Unique experiments
one probe manipulating or pumping a sample optically,
electrically or thermally , while the other probe(s)interrogate
the sample in various modes simultaneously
Nanomanipulation
Electrical and thermal transport

More info can be found at

http://www.nanonics.co.il/products/nsom-spmsystems/multiprobe-imaging-multiview-4000.html

The Next Evolution In AFM

Low Temperature/Cryogenic
Multiple Probe SPM
A system that performs all of the standard
SPM/optical measurements but now at
temperatures down to 10K
Very fast cooling that does not require an immersion
cryostat.

Applications include:
Photoconductivity
Electrical transport
Thermal transport
Electrical probe station

For dynamics and transport of 2D materials such

as graphene and MoS2
More info can be found at: http://
www.nanonics.co.il/products/nsom-spm-systems/
low-temperature-multiprobe.html

The Next Evolution In AFM

Combined AFM/SEM/FIB
The first triple beam AFM, SEM & FIB with the
ability to integrate AFM/NSOM with SEM and
FIB technology
the ultimate 3D nanoscale characterization
capability
Incorporates revolutionary innovation in this
instrument and AFM probe design
open architecture that provides open access to the
SEM/FIB beams without any obstruction or
interference to the injectors, detectors, or beam
lines.

More info can be found at

http://www.nanonics.co.il/products/nsom-spmsystems/combined-afm-fib-and-afm-sem.html

The Next Evolution In AFM