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General
TOFD
Huygens’ principle:
Incident
wave Diffracted
waves
All directions
Reflected FLAW
wave Low energy
Independent of
Diffracted incidence angle
waves
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Basic Setup
Signals received
•Lateral wave, subsurface
•Back-wall echo
•Mode converted (shear wave) echo
•Diffracted and reflected signals from defects
Transmitter Receiver
Lateral wave
Upper tip
Lower tip
Back-wall reflection
Data Visualization TOFD
White
+
Amplitude
A-scan
Time
- Black
Time
One A-scan picture is replaced by
one gray-coded line
Indication
Lateral Back-wall
wave
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Typical TOFD Image
Lateral Wave
Back-wall Echo
1 2
1
2
1 2 3 4
1
1
2
3
2
3
1
1
2 2
3
4
3
1
2 1
2
3
1
1
2 2
1
3
2
3 4
3
In the LW, we can see the wide beam effect on the crack.
1
1
2
2
3
3
1
2
Coupling status
Repeatable signal
Less operator intensive
Results in “real” units, i.e., mm, inch
Sensitive to grain noise
British
Standard BS7706
European EN583
ASTM E-2373-04
Technique description
Data Visualization
Results
Advantages
TOFD
PE 45 SW
PE 60 SW
The MS5800 system allows for
simultaneous acquisition and analysis of
TOFD and P/E
Technique Description
Data Visualization
Advantages
TOFD
Phased Array
Top
Side
End views
•Standard
output has
dual gate
strip chart
for each
channel,
plus
TOFD,
mapping
channels,
couplant
and
position Operator can detect above threshold defects, and size
to number of zones in real-time.
Leader in Array Technology
Technique advantages