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Lecture Outline
Basics of Statistical Process Control Control Charts Control Charts for Attributes Control Charts for Variables Control Chart Patterns SPC with Excel and OM Tools Process Capability
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Sample
subset of items produced to use for inspection
Control Charts
process is within statistical control limits
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Process Variability
Random
inherent in a process depends on equipment and machinery, engineering, operator, and system of measurement natural occurrences
Non-Random
special causes identifiable and correctable include equipment out of adjustment, defective materials, changes in parts or materials, broken machinery or equipment, operator fatigue or poor work methods, or errors due to lack of training
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Grocery stores
waiting time to check out, frequency of out-of-stock items, quality of food items, cleanliness, customer complaints, checkout register errors
Airlines
flight delays, lost luggage & luggage handling, waiting time at ticket counters & check-in, agent & flight attendant courtesy, accurate flight information, cabin cleanliness & maintenance
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Catalogue-order companies
order accuracy, operator knowledge & courtesy, packaging, delivery time, phone order waiting time
Insurance companies
billing accuracy, timeliness of claims processing, agent availability & response time
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Examples
At beginning of process because of waste to begin production process with bad supplies Before a costly or irreversible point, after which product is difficult to rework or correct Before and after assembly or painting operations that might cover defects Before the outgoing final product or service is delivered
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Control Charts
A graph that monitors process quality Control limits
upper and lower bands of a control chart
Attributes chart
p-chart c-chart
Variables chart
mean (x bar chart) range (R-chart)
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Sample number
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Normal Distribution
Probabilities for Z= 2.00 and Z = 3.00
95% 99.74% -3 -2 -1 =0 1 2 3
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A Process Is in Control If
1. no sample points outside limits 2. most points near process average 3. about equal number of points above and below centerline 4. points appear randomly distributed
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c-chart
uses number of defects (non-conformities) in a sample
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p-Chart
UCL = p + zp LCL = p - zp
z p p = number of standard deviations from process average = sample proportion defective; estimates process mean = standard deviation of sample proportion p(1 - p)
p = n
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Construction of p-Chart
SAMPLE # NUMBER OF DEFECTIVES PROPORTION DEFECTIVE
1 2 3 : : 20
6 0 4 : : 18 200
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Construction of p-Chart
p=
total defectives total sample observations = 200 / 20(100) = 0.10 0.10(1 - 0.10) 100
p(1 - p) = 0.10 + 3 n
p(1 - p) = 0.10 - 3 n
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Construction of p-Chart
0.20 0.18 0.16 Proportion defective 0.14 0.12 0.10 0.08 0.06 0.04 0.02 2 LCL = 0.010 4 6 8 10 12 Sample number 14 16 18 20 p = 0.10 UCL = 0.190
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p-Chart in Excel
Click on Insert then Charts to construct control chart I4 + 3*SQRT(I4*(1-I4)/100) I4 - 3*SQRT(I4*(1-I4)/100)
c-Chart
UCL = c + zc LCL = c - zc
where c = number of defects per sample
c =
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c-Chart
Number of defects in 15 sample rooms
SAMPLE NUMBER OF DEFECTS
1 2 3
12 8 16
c=
: :
15
: :
15 190
12.67
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c-Chart
24 UCL = 23.35 21 18 15 12 9 6 3 LCL = 1.99
Number of defects
c = 12.67
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12
14
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Sample number
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We know = .08
Copyright 2011 John Wiley & Sons, Inc. 3-26
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LCL = x - A2R
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Sample Size n 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
Factor for X-chart A2 1.880 1.023 0.729 0.577 0.483 0.419 0.373 0.337 0.308 0.285 0.266 0.249 0.235 0.223 0.212 0.203 0.194 0.187 0.180 0.173 0.167 0.162 0.157 0.153 D3 0.000 0.000 0.000 0.000 0.000 0.076 0.136 0.184 0.223 0.256 0.283 0.307 0.328 0.347 0.363 0.378 0.391 0.404 0.415 0.425 0.435 0.443 0.452 0.459 D4 3.267 2.575 2.282 2.114 2.004 1.924 1.864 1.816 1.777 1.744 1.717 1.693 1.672 1.653 1.637 1.622 1.609 1.596 1.585 1.575 1.565 1.557 1.548 1.541
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5.10 5.08 5.06 5.04 5.02 5.00 4.98 4.96 4.94 4.92 | 1 | 2 | 3 | | | | 4 5 6 7 Sample number | 8 | 9 | 10 LCL = 4.94 = = 5.01 x UCL = 5.08
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R- Chart
UCL = D4R R= R k LCL = D3R
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R-Chart Example
OBSERVATIONS (SLIP- RING DIAMETER, CM) SAMPLE k 1 2 3 4 5 6 7 8 9 10 1 5.02 5.01 4.99 5.03 4.95 4.97 5.05 5.09 5.14 5.01 2 5.01 5.03 5.00 4.91 4.92 5.06 5.01 5.10 5.10 4.98 3 4.94 5.07 4.93 5.01 5.03 5.06 5.10 5.00 4.99 5.08 4 4.99 4.95 4.92 4.98 5.05 4.96 4.96 4.99 5.08 5.07 5 4.96 4.96 4.99 4.89 5.01 5.03 4.99 5.08 5.09 4.99 x 4.98 5.00 4.97 4.96 4.99 5.01 5.02 5.05 5.08 5.03 R 0.08 0.12 0.08 0.14 0.13 0.10 0.14 0.11 0.15 0.10
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R-Chart Example
_ UCL = D4R = 2.11(0.115) = 0.243 _ LCL = D3R = 0(0.115) = 0 Retrieve chart factors D3 and D4
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R-Chart Example
0.28 0.24 0.20 Range 0.16 0.12 0.08 0.04 0 LCL = 0 | | | 1 2 3 | | | | 4 5 6 7 Sample number | 8 | 9 | 10 R = 0.115 UCL = 0.243
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Pattern test
determines if observations within limits of a control chart display a nonrandom pattern
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Process average
Zone A LCL
| 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13
= 3 sigma = x - A2R
Sample number
Copyright 2011 John Wiley & Sons, Inc. 3-43
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Process Capability
Compare natural variability to design variability Natural variability What we measure with control charts Process mean = 8.80 oz, Std dev. = 0.12 oz Tolerances Design specifications reflecting product requirements Net weight = 9.0 oz 0.5 oz Tolerances are 0.5 oz
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Process Capability
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Process Capability
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Computing Cp
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Cpk = minimum
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Computing Cpk
Net weight specification = 9.0 oz 0.5 oz Process mean = 8.80 oz Process standard deviation = 0.12 oz
= x - lower specification limit , 3 = upper specification limit - x 3 8.80 - 8.50 9.50 - 8.80 , = 0.83 3(0.12) 3(0.12)
Cpk = minimum
= minimum
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=(D6-D7)/(6*D8)
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Copyright 2011 John Wiley & Sons, Inc. All rights reserved. Reproduction or translation of this work beyond that permitted in section 117 of the 1976 United States Copyright Act without express permission of the copyright owner is unlawful. Request for further information should be addressed to the Permission Department, John Wiley & Sons, Inc. The purchaser may make back-up copies for his/her own use only and not for distribution or resale. The Publisher assumes no responsibility for errors, omissions, or damages caused by the use of these programs or from the use of the information herein.
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